Development method and device for electron beam powder bed lap joint process parameters

Abstract

The invention discloses an electron beam powder bed lap joint process parameter development method and device, and belongs to the technical field of electron beam selective melting. Comprising the following steps: performing partition segmentation on a forming section printed by an electron beam powder bed to obtain a plurality of adjacent partitions, and determining key process parameter types of lap joint areas between the adjacent partitions; wherein the key process parameter type comprises a lap joint distance and a random offset distance; based on existing typical line length filling parameters, designing an orthogonal test of a lap joint distance and a random offset distance, printing a test block, carrying out visual inspection and metallographic dissection, and determining a candidate parameter interval by taking no hole defect as a target; and obtaining candidate parameter intervals corresponding to the plurality of different typical line lengths, and determining the optimal value of the key process parameter type in the plurality of different candidate parameter intervals. The metallurgical quality effect of the lap joint area in the filling process can be guaranteed, and the metallurgical quality and consistency of the filling area can be improved.

Description

Technical Field

[0001] The present application belongs to the technical field of electron beam selective melting and forming, and specifically relates to a method and device for developing process parameters of an electron beam powder bed overlap. Background Art

[0002] Electron beam selective melting (EBSM) is an advanced additive manufacturing technology that uses an electron beam as a heat source to locally melt and deposit metal powder, achieving near-net-shape three-dimensional components. During the forming process, factors such as the electron beam energy, scanning speed, and scanning strategy have a significant impact on the quality and performance of the component. Therefore, before using EBSM technology to print parts, it is necessary to develop its process parameters and obtain a parameter package for the additive manufacturing process to achieve the technical goals of improving metallurgical quality and reducing the number and size of internal defects.

[0003] When using EBSM to print parts with large cross-sections and complex shapes, the corresponding electron beam fill line length will also vary significantly, and the corresponding heat dissipation conditions in different areas will also vary significantly. Based on this, if fixed fill parameters are used during printing, the build quality of different areas will also vary.

[0004] Therefore, it is necessary to develop the process parameters of electron beam powder bed overlapping based on the purpose of improving the internal metallurgical quality of electron beam selective melting and improving thermal uniformity. Summary of the Invention

[0005] The purpose of this application is to provide a method and device for developing electron beam powder bed overlapping process parameters. By introducing two conceptual parameters, "overlap distance" and "random offset distance", the metallurgical quality effect of the overlapping area during the filling process is guaranteed, and the problem of fixed overlapping position is solved, so that the heat distribution in the overlapping area is uniform, further improving the metallurgical quality and consistency of the filling area.

[0006] In a first aspect, to achieve the above-mentioned objectives, the present application provides a method for developing process parameters for electron beam powder bed lamination, comprising the following steps: Partitioning the formed cross-section of the powder bed printed by the beamlet to obtain multiple adjacent partitions and determining the key process parameter types of the overlapping areas between the adjacent partitions; wherein the key process parameter types include overlap distance and random offset distance; Based on the existing typical line length filling parameters, an orthogonal test of overlap distance and random offset distance was designed. Test blocks were printed and visually inspected and metallographically dissected. With the goal of eliminating void defects, candidate parameter ranges were determined. A plurality of candidate parameter intervals corresponding to different typical line lengths are obtained, and optimal values ​​of key process parameter types are determined in the plurality of different candidate parameter intervals.

[0007] Furthermore, the partition segmentation method is horizontal stripe segmentation, which divides the formed cross section into multiple adjacent partitions, and fills and scans each adjacent partition in turn.

[0008] Furthermore, the difference in filling line lengths between adjacent partitions is less than or equal to a preset threshold, and the preset threshold is determined based on existing typical line length filling parameters.

[0009] Furthermore, the orthogonal test includes: an orthogonal test with a typical line length of 3 mm, an orthogonal test with a typical line length of 7 mm, an orthogonal test with a typical line length of 15 mm, an orthogonal test with a typical line length of 30 mm, an orthogonal test with a typical line length of 45 mm, and an orthogonal test with a typical line length of the maximum available line length.

[0010] Furthermore, the visual inspection criteria include: no bulging and / or warping in the overlapping area of ​​the top surface of the test block.

[0011] Furthermore, the judgment criteria of metallographic anatomy include: the metallographic image of the overlapping area of ​​the test block has no pores or crack defects, and the hole size in the overlapping area is ≤25μm.

[0012] Furthermore, the optimal values ​​of key process parameter types are obtained for electron beam powder bed printing of all typical line lengths.

[0013] In a second aspect, the present application provides a device for developing electron beam powder bed lamination process parameters, comprising: a key process parameter type acquisition module, a candidate parameter interval acquisition module, and a parameter optimal value development module; A key process parameter type acquisition module is used to partition the formed cross-section of the electron beam powder bed printing, obtain multiple adjacent partitions, and determine the key process parameter types of the overlapping areas between adjacent partitions; wherein the key process parameter types include overlap distance and random offset distance; The candidate parameter range acquisition module is used to design orthogonal experiments for overlap distance and random offset distance based on existing typical line length filling parameters, print test blocks, and conduct visual inspection and metallographic dissection to determine the candidate parameter range with the goal of eliminating void defects. The parameter optimal value development module is used to obtain candidate parameter intervals corresponding to multiple different typical line lengths and determine the optimal values ​​of key process parameter types in multiple different candidate parameter intervals.

[0014] In summary, this application has the following advantages: The application divides the cross section into multiple adjacent sub-zones, effectively reducing the fluctuation range of the filling line length in each sub-zone. This can make the heat dissipation conditions in the same sub-zone more uniform, avoiding the problem of inconsistent forming quality caused by large differences in filling line length and different heat dissipation conditions. At the same time, the overlap distance and random offset distance are determined as key process parameters, which specifically solve the problem of uneven heat distribution when overlapping adjacent sub-zones, making the metallurgical quality of the entire forming cross section more stable. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 The flowchart of the development method of the electron beam powder bed overlap process parameters provided by the embodiment of the application.

[0016] Figure 2 The conceptual diagram of the development method of the electron beam powder bed overlap process parameters provided by the embodiment of the application, wherein, Figure 2 (a) is a position diagram of the overlap distance and the random offset distance, Figure 2 (b) is a sub-zone overlap diagram.

[0017] Figure 3 The process parameter orthogonal test result diagram of 15mm typical line length, wherein, Figure 3 (a) is the corresponding D-X scatter plot, Figure 3 (b) is the corresponding XZ plane metallographic dissection morphology.

[0018] Figure 4 The process parameter orthogonal test result diagram of serial numbers 9-12 in Table 2, wherein, Figure 4 (a) is the corresponding D-X scatter plot, Figure 4 (b) is the corresponding XZ plane metallographic dissection morphology.

[0019] Figure 5 The process parameter orthogonal test result diagram of serial numbers 17-20 in Table 2, wherein, Figure 5 (a) is the corresponding D-X scatter plot, Figure 5 (b) is the corresponding XZ plane metallographic dissection morphology.

[0020] Figure 6 The process parameter orthogonal test result diagram of serial numbers 13-16 in Table 2, wherein, Figure 6 (a) is the corresponding D-X scatter plot, Figure 6 (b) is the corresponding XZ plane metallographic dissection morphology.

[0021] Figure 7 The process parameter orthogonal test result diagram of serial numbers 5-8 in Table 2, wherein, Figure 7 (a) is the corresponding D-X scatter plot, Figure 7(b) is the corresponding XZ surface metallographic morphology.

[0022] Figure 8 The orthogonal test results of process parameters No. 1-4 in Table 2 are shown, where: Figure 8 (a) is the corresponding DX scatter plot, Figure 8 (b) is the corresponding XZ surface metallographic morphology. DETAILED DESCRIPTION

[0023] The principles and features of the present invention are described below in conjunction with the examples. The examples are only used to explain the present invention and are not intended to limit the scope of the present invention. Where specific conditions are not specified in the examples, they are carried out according to conventional conditions or conditions recommended by the manufacturer. Where the manufacturer of the reagents or instruments is not specified, they are all conventional products that can be purchased commercially.

[0024] Electron beam selective melting (EBM) technology doesn't employ a strip-segmented zoning approach, resulting in electron beam scan line lengths fluctuating over a wide span range of 1mm to 100mm. While this scanning approach can reduce the number of joints, improving printing stability, and its longer scan lines allow for faster scanning speeds, boosting build efficiency, it also presents challenges with heat accumulation and increased cooling rate variations across different line lengths. This can lead to defects such as interlayer incomplete fusion, pores, and unmelted particles if cladding parameters (such as energy density EA, scanning beam current I, scanning speed v, scanning spacing d, and layer thickness) are improperly set, resulting in reduced mechanical properties of the finished part. Therefore, different scanning strategies must be applied for different scan line lengths to compensate for the varying thermal effects of adjacent scan lines. Furthermore, when the cross-section of a part is large and its shape is complex, the length of the electron beam fill line and the heat dissipation conditions in different areas can vary significantly. In this case, using fixed fill parameters can lead to varying build quality across different areas, making it impossible to guarantee uniform part quality. At the same time, due to the limitation of the filling beam, the filling line length has a limit, which makes it unable to meet the needs of actual parts. Therefore, it is necessary to divide the printing area and then scan and fill in each area to obtain a complete molded part.

[0025] Therefore, in order to improve the internal metallurgical quality of parts formed by electron beam selective melting technology and to improve the consistency of the entire process, this application proposes a new concept, including: partitioning the cross section of the formed part, with overlapping areas between adjacent partitions (i.e., the overlapping parts between adjacent partitions), and the width of the overlapping areas can be used to ensure the metallurgical quality of the overlapping areas during the filling process. At the same time, the concept of "random offset distance of the dividing line" is introduced to solve the problem of fixed overlapping positions, so that the heat distribution in the overlapping areas is uniform, further improving the metallurgical quality and consistency of the filling area, and providing technical support for improving the reliability of electron beam selective melting formed components.

[0026] Based on this, this application provides a method for developing electron beam powder bed lamination process parameters, the process of which is as follows: Figure 1 The development method of this application is suitable for electron beam selective melting of parts with large cross-sections and complex shapes, solving the problems of uneven heat dissipation and fluctuating forming quality caused by differences in fill line length.

[0027] Specifically, the following steps are included: S1. Partition and segment the formed cross-section of the electron beam powder bed printing to obtain multiple adjacent partitions, and determine the key process parameter types of the overlapping areas between adjacent partitions; wherein the key process parameter types include overlap distance and random offset distance.

[0028] In the above solution, zoning can reduce differences in fill line lengths, ensuring more even heat dissipation across regions. The overlap distance and random offset distance parameters address uneven heat distribution in the overlap area, thereby ensuring overall metallurgical quality. By defining the key parameter types, it is easier to optimize parameters for different cross-sectional shapes and sizes, making the process more suitable for printing complex parts.

[0029] In a specific embodiment, Figure 2 As shown, the partition segmentation method is horizontal stripe segmentation, which divides the formed cross section into multiple adjacent partitions, and fills and scans each adjacent partition in turn.

[0030] In the above scheme, horizontal stripe segmentation is to divide the formed cross-section into partitions like "zebra crossings" with horizontal lines. The specific method is to divide the larger formed cross-section into multiple long strips of equal or similar width along the horizontal direction (such as from left to right or from right to left). Each area is a partition, which can make the originally different lengths of filling lines more regular in each partition. During the printing process, the electron beam will scan these partitions one by one in sequence. For example, start from the first horizontal partition at the top, scan the filling line back and forth along the length of the partition, and after completing this partition, move to the next adjacent horizontal partition and scan the filling line in the same order. Until all partitions are scanned and filled, this can make the length of the filling line in each partition more uniform, reducing the heat dissipation and forming quality differences in different areas.

[0031] In a specific implementation, the difference in the lengths of the filling lines of adjacent partitions is less than or equal to a preset threshold, and the preset threshold is determined based on an existing typical line length filling parameter.

[0032] In the 3D printing process, the fill line length refers to the length of the line scanned by the electron beam on the powder material. When the cross-section of the object to be printed is large and complex, the fill lines in various places are of different lengths. For example, the lines in some places are very long and in some places are very short. Since the energy of the electron beam is limited, if the fill line is too long, it may cause insufficient energy when the electron beam is scanned, resulting in uneven melting of the material and poor printing quality. Therefore, the difference in the length of the fill lines of adjacent partitions is limited to ≤ a preset threshold. The preset threshold in this application is a maximum allowable length of a fill line determined in advance based on factors such as the energy of the electron beam and material properties. For example, it may be stipulated that the maximum length of the fill line cannot exceed 45mm based on the performance of the equipment. In this case, 45mm is the preset threshold. If the length exceeds this, the printing quality may not be guaranteed.

[0033] In this application, the overlap distance D is the overlapping width set when adjacent partitions are scanned and filled to ensure the metallurgical quality of the overlap area. Physical overlap can ensure that the materials of adjacent partitions are fully fused, avoiding defects such as splicing gaps and unfused materials, which directly affect the bonding strength and density of the overlap area. The random offset distance X is the random offset of the dividing line on the overlap position of the partition, that is, the overlap position of adjacent partitions is not fixed at the same position, but varies randomly within a certain range. By breaking the regularity of the fixed overlap position, the heat distribution in the overlap area is made more uniform, avoiding local overheating, uneven material properties or deterioration of the powder bed state (such as bulging and warping) caused by repeated heating of the fixed position. This application introduces the two concepts of overlap distance and random offset distance, which can solve the metallurgical quality problem of the overlap area. The overlap distance can ensure the physical connection strength of the overlap area from the perspective of "spatial overlap", and the random offset distance can avoid the heat accumulation defect of the fixed position from the perspective of "heat distribution uniformity". It is the key to improving quality consistency, and both are indispensable. For example, if only the overlap width is set without random offset, repeated heating at a fixed position may cause local over-melting or air holes. If only random offset is set without sufficient overlap distance, insufficient overlap may result in a loose joint in the overlap area.

[0034] Among them, such as Figure 2 As shown, assuming that the random offset distance X is 0, then the partition center line ( Figure 2 The red line in (a) is in the middle, so the center line of the overlap area (blue bar) should coincide with the red line. Figure 2 In (b), the overlapping area moves upward with the random offset distance X (from the Nth layer to the N+3th layer, the overlapping distance remains unchanged, but as the upward random offset distance X increases, the overlapping area also moves upward).

[0035] S2. Based on the existing typical line length filling parameters, design orthogonal experiments on overlap distance and random offset distance. Print test blocks and conduct visual inspection and metallographic dissection. With the goal of eliminating void defects, determine the candidate parameter range.

[0036] In this approach, orthogonal experiments were designed based on established typical line length fill parameters. This systematically covers combinations of overlap distances and random offset distances, avoiding blind parameter selection. Visual inspection and metallographic dissection verified the quality of the test blocks at both the surface and internal microscopic levels, ensuring parameter reliability with the goal of eliminating voids. This experiment quickly identified candidate parameter ranges, providing a precise range for subsequent optimization, reducing trial-and-error costs and improving process development efficiency.

[0037] In a specific embodiment, the orthogonal test includes: an orthogonal test with a typical line length of 3 mm, an orthogonal test with a typical line length of 7 mm, an orthogonal test with a typical line length of 15 mm, an orthogonal test with a typical line length of 30 mm, an orthogonal test with a typical line length of 45 mm, and an orthogonal test with a typical line length of the maximum available line length.

[0038] The method for determining the maximum available line length is as follows: when the filling beam exceeds the upper limit of the equipment focus, the minimum line length that cannot form a defect-free process window is determined as the maximum available line length.

[0039] In a specific embodiment, the visual inspection criteria include: no bulging and / or warping in the overlapped area of ​​the test block top surface. The metallographic anatomy criteria include: no pores or cracks in the metallographic image of the overlapped area of ​​the test block, and the hole size in the overlapped area is ≤25 μm.

[0040] With the goal of eliminating void defects, test blocks were inspected through rigorous testing methods such as visual inspection and metallographic dissection to ensure the scientific and reliable nature of parameter development. Visual inspection can directly detect surface defects, while metallographic dissection can deeply analyze the internal microstructure and verify the validity of parameters from multiple levels. The orthogonal experimental design method is highly systematic and can comprehensively examine the impact of the two key parameters, overlap distance and random offset distance, and their interaction on forming quality. This avoids blind parameter selection and ensures that the optimal parameters ultimately determined are supported by solid experimental data. They can function stably in actual production and ensure the forming quality of parts.

[0041] S3. Obtain candidate parameter intervals corresponding to multiple different typical line lengths, and determine optimal values ​​of key process parameter types in the multiple different candidate parameter intervals.

[0042] Orthogonal experiments are designed based on existing typical line length filling parameters. This approach not only makes full use of existing process knowledge, but also covers a variety of possible process scenarios through systematic parameter combination testing. By analyzing and optimizing the candidate parameter intervals corresponding to different typical line lengths, the optimal process parameters ultimately determined can be applied to a variety of different typical line lengths, greatly improving the applicability of the process. When faced with parts of different sizes and shapes, there is no need to redevelop completely new process parameters. Only appropriate adjustments based on the determined optimal parameters are required to meet production needs, enhancing process flexibility.

[0043] In a specific embodiment, the optimal values ​​of key process parameter types are applied to electron beam powder bed printing for all typical line lengths.

[0044] By optimizing the overlap process parameters, defects caused by improper parameters during the forming process are reduced, part scrap and rework rates are lowered, and production efficiency is improved. Furthermore, because the determined optimal parameters are applicable to a variety of typical line lengths, the time and cost of process parameter development are reduced, improving the economic efficiency of production. Furthermore, the advantage of long scan lines, which allow for greater scanning speeds and thus improved forming efficiency, is further protected and optimized in this method, allowing the entire electron beam powder bed printing process to maintain high production efficiency while improving forming quality.

[0045] In a second aspect, based on a general inventive concept, the present application further provides a device for developing process parameters of an electron beam powder bed lamination process, comprising: a key process parameter type acquisition module, a candidate parameter interval acquisition module, and a parameter optimal value development module; A key process parameter type acquisition module is used to partition the formed cross-section of the electron beam powder bed printing, obtain multiple adjacent partitions, and determine the key process parameter types of the overlapping areas between adjacent partitions; wherein the key process parameter types include overlap distance and random offset distance; The candidate parameter range acquisition module is used to design orthogonal experiments for overlap distance and random offset distance based on existing typical line length filling parameters, print test blocks, and conduct visual inspection and metallographic dissection to determine the candidate parameter range with the goal of eliminating void defects. The parameter optimal value development module is used to obtain candidate parameter intervals corresponding to multiple different typical line lengths and determine the optimal values ​​of key process parameter types in multiple different candidate parameter intervals.

[0046] The above technical solutions of the present application are described in detail below with reference to specific embodiments.

[0047] Example 1 This embodiment provides a method for developing process parameters for electron beam powder bed lap jointing, taking the development of process parameters for electron beam selective melting of titanium alloy TC4 powder as an example, including the following steps: (1) The known filling process parameters for a typical scanning line length of 15 mm were obtained, including a powder layer thickness of 10 μm, a scanning line spacing of 100 μm, an acceleration voltage of 60 kV, a scanning beam current of 10 mA, and a scanning speed of 2 mm / s.

[0048] (2) The forming cross section of the electron beam powder bed printing is partitioned by horizontal stripe segmentation to obtain multiple adjacent partitions, and the key process parameters of the overlapping areas between adjacent partitions are determined as the overlap distance D and the random offset distance X, both in mm.

[0049] (3) Take the filling process parameters with a typical scan line length of 15 mm as the benchmark parameters, design an orthogonal test of the lap distance and random offset distance, a total of 24 combinations, as shown in Table 1. The lap distance and random offset distance in Table 1 are given by the orthogonal method (or test method, artificially given initial value), and the test block of 30 mm*30 mm*10 mm (i.e. 30 mm is divided into two 15 mm line lengths for lap) is printed to evaluate the surface quality, warping and metallurgical quality. According to these parameter combinations, the test block is printed, and the size of the test block is 30 mm*30 mm*10 mm (X*Y*Z).

[0050] Table 1

[0051] (4) Visually inspect the top surface lap area of the printed test block, and then dissect and observe the batch of test blocks, and the observation surface for dissection observation is the XZ surface, as shown in Figure 3 (b). The hole size and nature of the observation surface are distinguished, and a D-X scatter plot of the lap distance and random offset distance is made, as shown in Figure 3 (a).

[0052] From Figure 3 It can be seen that when the lap distance D≤1, the lap area of the top surface of the test block has a bulge phenomenon, and when D≥1.5 mm, the lap area of the top surface of the test block is relatively flat, and no hole >25 μm is found in the XZ dissection surface of the lap area. The lap process parameter interval is preliminarily determined: the lap distance D is 2 mm-3 mm and the random offset distance X is 6 mm-10 mm.

[0053] (5) In order to select the optimal value from the preliminarily determined lap process parameter interval, design an orthogonal test of other typical scan line lengths, for example, a line length of 60 mm, and the parameter combinations of the orthogonal test are shown in Table 2.

[0054] Through the test, it is found that the maximum line length of electron beam selective fusion forming is 50 mm, that is, when the single direction length exceeds 50 mm, the section needs to be divided into zones (not more than no need to be divided) and lapped. The lap line length in Table 2 refers to a series of typical line lengths, for example, 30 / 30 means that on a single direction length of 60 mm section, the division can be 30 mm line length and 30 mm line length lap, or 10 mm line length and 50 mm line length lap (10 / 50). Finally, a random offset distance X and a lap distance D suitable for different line length combinations are found.

[0055] Table 2

[0056] After the test block is printed, the overlap area on the top surface of the test block is visually inspected, and then the batch of test blocks is dissected and observed. The observation surface of the dissected observation is the XZ surface, such as Figures 4-8 The hole sizes and properties of the observation surface are distinguished, and a DX scatter plot of the overlap distance and random offset distance is made, as shown in Figures 4-8 shown.

[0057] Depend on Figures 4-8 It can be seen that for the overlap areas between different wire lengths, when the random offset distance X of the dividing line is 10 mm and the overlap distance D is 3 mm, no void defects are found in the XZ dissection plane of the overlap area. This confirms that the overlap process parameters for electron beam selective melting of titanium alloy TC4 powder include a random offset distance of 10 mm and an overlap distance of 3 mm.

[0058] Although the specific embodiments of the present application have been described in detail, this should not be construed as limiting the scope of protection of the present application. Within the scope described in the claims, various modifications and variations that can be made by those skilled in the art without creative work still fall within the scope of protection of the present application.

Claims

1. A method for developing process parameters for electron beam powder bed lamination, characterized in that: The following steps are involved: Partitioning a formed cross-section of an electron beam powder bed printing process to obtain a plurality of adjacent partitions, and determining key process parameter types of overlapping regions between adjacent partitions; wherein the key process parameter types include overlapping distance and random offset distance; Based on existing typical line length filling parameters, an orthogonal test of the overlap distance and the random offset distance was designed. Test blocks were printed and visually inspected and metallographically dissected. With the goal of eliminating void defects, candidate parameter ranges were determined. The candidate parameter intervals corresponding to a plurality of different typical line lengths are obtained, and the optimal value of the key process parameter type is determined in the plurality of different candidate parameter intervals.

2. The development method according to claim 1, characterized in that: The partition segmentation method is horizontal stripe segmentation, which divides the formed cross section into multiple adjacent partitions, and fills and scans each of the adjacent partitions in sequence.

3. The development method according to claim 2, characterized in that: The difference in filling line lengths between adjacent partitions is less than or equal to a preset threshold, and the preset threshold is determined based on the existing typical line length filling parameter.

4. The development method according to claim 1, characterized in that: The orthogonal tests include: an orthogonal test with a typical line length of 3 mm, an orthogonal test with a typical line length of 7 mm, an orthogonal test with a typical line length of 15 mm, an orthogonal test with a typical line length of 30 mm, an orthogonal test with a typical line length of 45 mm, and an orthogonal test with a typical line length of the maximum available line length.

5. The development method according to claim 1, characterized in that: The judgment criteria of the visual inspection include: there is no bulging and / or warping in the overlapping area on the top surface of the test block.

6. The development method according to claim 1, characterized in that: The judgment criteria of the metallographic anatomy include: the metallographic image of the overlapped area of ​​the test block has no pores or crack defects, and the hole size of the overlapped area is ≤25 μm.

7. The development method according to claim 1, characterized in that: The optimal values ​​for the described types of key process parameters apply to electron beam powder bed printing for all typical line lengths.

8. A device for developing process parameters for electron beam powder bed lamination, characterized in that: include: Key process parameter type acquisition module, candidate parameter range acquisition module and parameter optimal value development module; The key process parameter type acquisition module is used to partition the formed cross-section of the electron beam powder bed printing, obtain multiple adjacent partitions, and determine the key process parameter types of the overlapping areas between the adjacent partitions; wherein the key process parameter types include overlap distance and random offset distance; The candidate parameter interval acquisition module is used to design an orthogonal test of the overlap distance and the random offset distance based on existing typical line length filling parameters, print a test block and perform visual inspection and metallographic dissection to determine the candidate parameter interval with the goal of eliminating void defects; The parameter optimal value development module is used to obtain the candidate parameter intervals corresponding to multiple different typical line lengths, and determine the optimal value of the key process parameter type in the multiple different candidate parameter intervals.

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