Diode constant-current aging equipment and testing method thereof

Abstract

The invention discloses diode constant-current aging equipment, which comprises a test auxiliary box and a test main box, the test main box is located at one side of the test auxiliary box, a side box plate is arranged between the test main box and the test auxiliary box, the test main box is provided with a control box, the test main box and the test auxiliary box are respectively provided with a power box and a test cabinet, and the test auxiliary box is provided with a power supply box and a test cabinet. The power box and the test cabinet are controlled by a control box, and a control panel is arranged in the test cabinet. Through cooperative use of the test seat, the test cabinet, the front exhaust fan, the fixing seat and other parts, a diode to be tested is placed in the test cabinet for testing, meanwhile, through the front exhaust fan and the fixing seat at the bottom, heat dissipation during working is carried out, test use is facilitated, the advantages of being stable in test and convenient for large-scale test are achieved, and the test efficiency is improved. The problems of low test efficiency and inconvenience in timely adjustment when problems occur due to the limitation of accidental design and related process technologies in the existing diode aging test are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of aging test equipment, and in particular to a diode constant current aging device and a testing method thereof. Background Art

[0002] A diode constant-current aging tester is a crucial device used to test the performance and reliability of semiconductor diodes under constant current conditions. Its core function is to perform long-term aging tests on diodes using a constant current to assess their stability and lifespan in real-world environments. As a crucial component of semiconductor devices, diodes are widely used in electronic equipment, automotive electronics, industrial control, and other fields. With the continuous advancement of electronic technology, the performance and reliability requirements for diodes are becoming increasingly stringent. This is especially true in complex environments such as high temperature, high humidity, and high vibration, where diode performance can be significantly affected.

[0003] However, the existing diode constant current aging equipment still has some technical bottlenecks in practical applications. The existing diode aging test is limited by the design and related process technology, resulting in low test efficiency and inconvenience in timely adjustment when problems occur. To address the above problems, we propose a new type of diode constant current aging equipment and its testing method to solve the above problems. Summary of the Invention

[0004] The purpose of the present invention is to overcome the shortcomings of existing diode aging tests, which are limited by accidental design and related process technologies, resulting in low test efficiency and difficulty in timely adjustment when problems arise, and to propose a diode constant current aging device and a testing method thereof.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions: A diode constant current aging device includes a test sub-box and a test main box. The test main box is located on one side of the test sub-box. A side box plate is provided between the test main box and the test sub-box. A control box is provided on the test main box. Both the test main box and the test sub-box are provided with a power box and a test cabinet. The power box and the test cabinet are controlled by the control box. A control panel is provided in the test cabinet. A test socket is provided on the test cabinet. The test socket is controlled by the control panel.

[0006] Preferably, a fixing frame is provided in the main test box, a rear door is provided on the back of the fixing frame, and a ventilation fan is provided on the top of the fixing frame.

[0007] Preferably, the control box top is provided with a signal light, the control box is provided with a transformer box, the control box surface is provided with a control button, the control button bottom is provided with a control computer, the test main box and the test auxiliary box are controlled and started through the control button, and the test result is displayed on the control computer.

[0008] Preferably, the test cabinet is provided with a cabinet body, the control panel is located in the cabinet body, the test seat is located at the top of the cabinet body, the front exhaust fan and the fixing seat are located at the bottom of the test seat, the front exhaust fan and the fixing seat are located in front of the test cabinet, the tail exhaust fan is arranged on the back of the cabinet body, the upper guard plate is arranged between the front exhaust fan and the fixing seat and the test seat, the cabinet body is provided with a storage box, and the front exhaust fan and the fixing seat are arranged in the cabinet body.

[0009] Preferably, one end of the storage box is provided with a front panel, and the front exhaust fan and the fixing seat are arranged in the front panel.

[0010] Preferably, the face plate gasket is arranged between the storage box and the front panel, the bottom guard plate is arranged at the bottom of the storage box, the bottom plate is arranged at the bottom of the cabinet body, and the bottom guard plate is arranged at the top of the bottom plate.

[0011] Preferably, one end of the control panel is electrically connected with a signal acquisition plate, one end of the signal acquisition plate is connected with a signal transmission seat, and the signal transmission seat and the test seat are electrically connected.

[0012] A test method of a diode constant current aging equipment Step 1: place the to-be-tested diode on the test seat of the test cabinet, and then place the installed test cabinet in the test main box and the test auxiliary box; Step 2: electrically connect the control panel on the test cabinet with the power supply box and the test cabinet, and then connect the diode constant current aging equipment to an external power supply; Step 3: set parameters through the control computer on the control box, and transmit the signals to the transformer box and the power supply box to input power supply of the to-be-tested diode; Step 4: press the control button on the surface of the control box to start the aging equipment, control the test current input of the to-be-tested diode on the test seat through the control box, and control the test time; Step 5: when the test seat works, the front exhaust fan and the fixing seat on the surface of the test cabinet perform heat dissipation from the bottom to ensure that the temperature of the diode in the test seat is normal, and the tail exhaust fan on the back of the cabinet body cooperates with the front exhaust fan to perform heat dissipation through a circulating air duct; Step 6: when the constant current aging test is performed, the air exchange fan at the top of the test main box and the test auxiliary box works to circulate and dissipate heat inside. Seventh step: the test data of the test seat is transmitted to the signal acquisition board through the signal transmission seat, and is transmitted to the control computer of the control box through the matched transmission line, and data analysis and processing are carried out; Eighth step: when an abnormality occurs in the test process, the signal light at the top of the control box will flash to show the warning, and the power supply of the control power supply box is disconnected to avoid damage to the aging equipment.

[0013] Compared with the prior art, the beneficial effects of the present application are: 1. By cooperating the test seat, the test cabinet, the front exhaust fan and the fixing seat, the to-be-tested diode is placed in the test cabinet for testing, and the front exhaust fan and the fixing seat at the bottom are used for heat dissipation during work, so that the testing is convenient to use; 2. By cooperating the test main box, the test auxiliary box and the test cabinet, the diode can be tested by constant current quickly and in large quantities, and the test results are displayed on the control computer; 3. By cooperating the signal light, the control button and the power supply box, when the test equipment has a condition, the response can be made immediately to avoid causing greater loss; In summary, by cooperating the test seat, the test cabinet, the front exhaust fan and the fixing seat, the to-be-tested diode is placed in the test cabinet for testing, and the front exhaust fan and the fixing seat at the bottom are used for heat dissipation during work, so that the testing is convenient to use, has the advantages of stable testing and being convenient for large-scale testing, avoids the existing diode aging test, and has the problems of low test efficiency and inconvenient timely adjustment due to the limitation of occasional design and related process technology. DETAILED DESCRIPTION

[0014] Figure 1 It is a whole schematic view of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 2 It is an assembly schematic view of a test main box and a test auxiliary box of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 3 It is an assembly schematic view of a test main box of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 4 It is an assembly schematic view of a test auxiliary box of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 5 It is a test cabinet schematic view of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 6 It is a test cabinet schematic view and a connection component schematic view of a diode constant current aging equipment and a testing method thereof according to the present application; Figure 7This is a schematic diagram of the test cabinet assembly of a diode constant current aging device and a test method thereof proposed by the present invention.

[0015] In the figure: 10, test auxiliary box; 11, side box plate; 20. Test main box; 21. Ventilation fan; 22. Rear door; 23. Fixing bracket; 30. Control box; 31. Signal light; 32. Transformer box; 33. Control button; 34. Control computer; 35. Power supply box; 40. Test cabinet; 41. Tail exhaust fan; 42. Signal transmission socket; 43. Test socket; 44. Cabinet; 441. Bottom plate; 442. Upper guard plate; 443. Front panel; 444. Storage box; 445. Panel pad; 446. Bottom guard plate; 45. Front exhaust fan and fixing seat; 46. Control board; 47. Signal acquisition board. DETAILED DESCRIPTION

[0016] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the embodiments of the specification.

[0017] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0018] Secondly, the term "one embodiment" or "embodiment" herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in various places throughout this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive of other embodiments.

[0019] Unless otherwise specified, the raw materials used in the examples were purchased commercially.

[0020] like Figures 1-7 As shown, a diode constant current aging device disclosed in the present application includes a test sub-box 10 and a test main box 20. The test main box 20 is located on one side of the test sub-box 10. A side box panel 11 is provided between the test main box 20 and the test sub-box 10. A control box 30 is provided on the test main box 20. Both the test main box 20 and the test sub-box 10 are provided with a power box 35 and a test cabinet 40. The power box 35 and the test cabinet 40 are controlled by the control box 30. A control board 46 is provided in the test cabinet 40. A test socket 43 is provided on the test cabinet 40. The test socket 43 is controlled by the control board 46.

[0021] In the above embodiment, a fixing frame 23 is provided in the test main box 20 , a rear door 22 is provided on the back of the fixing frame 23 , and a ventilation fan 21 is provided on the top of the fixing frame 23 .

[0022] Among them, a signal light 31 is provided on the top of the control box 30, a transformer box 32 is provided inside the control box 30, a control button 33 is provided on the surface of the control box 30, and a control computer 34 is provided at the bottom of the control button 33. The test main box 20 and the test sub-box 10 are controlled and started by the control button 33, and the test results are displayed on the control computer 34.

[0023] like Figures 5-7 As shown, in a preferred embodiment, a cabinet body 44 is provided on the test cabinet 40, a control panel 46 is located inside the cabinet body 44, a test seat 43 is located at the top of the cabinet body 44, a front exhaust fan and a fixing seat 45 are provided at the bottom of the test seat 43, the front exhaust fan and the fixing seat 45 are located in front of the test cabinet 40, a tail exhaust fan 41 is provided on the back of the cabinet body 44, an upper guard plate 442 is provided between the front exhaust fan and the fixing seat 45 and the test seat 43, a storage box 444 is provided in the cabinet body 44, and the front exhaust fan and the fixing seat 45 are installed in the cabinet body 44.

[0024] In the above embodiment, a front panel 443 is provided at one end of the storage box 444, the front exhaust fan and the fixing seat 45 are correspondingly installed in the front panel 443, a panel pad 445 is installed between the storage box 444 and the front panel 443, a bottom guard plate 446 is provided at the bottom of the storage box 444, a bottom plate 441 is provided at the bottom of the cabinet 44, the bottom guard plate 446 is installed on the top of the bottom plate 441, one end of the control board 46 is electrically connected to the signal acquisition board 47, one end of the signal acquisition board 47 is connected to the signal transmission seat 42, and the signal transmission seat 42 is electrically connected to the test seat 43.

[0025] A test method for diode constant current aging equipment: Step 1: Place the diode to be tested on the test socket 43 of the test cabinet 40, and then place the installed test cabinet 40 into the test main box 20 and the test sub-box 10; Step 2: Electrically connect the control panel 46 on the test cabinet 40 to the power box 35 and the test cabinet 40, and then connect the diode constant current aging equipment to the external power supply. Step 3: Set parameters through the control computer 34 on the control box 30, and transmit signals to the transformer box 32 and the power supply box 35 to input power to the diode under test; Step 4: Press the control button 33 on the surface of the control box 30 to start the aging equipment, and control the test current input and test time of the diode to be tested on the test socket 43 through the control box 30; Fifth step: when the test seat 43 is working, the front exhaust fan on the surface of the test cabinet 40 and the fixing seat 45 radiate heat from the bottom to the test seat 43, so as to ensure the normal temperature of the diode in the test seat 43, and the tail exhaust fan 41 on the back of the cabinet 44 cooperates with the front exhaust fan to circulate air in the air duct, so as to radiate heat to the test cabinet 40; Sixth step: when the constant current aging test is performed, the air exchange fan 21 on the top of the test main box 20 and the test auxiliary box 10 works to circulate and radiate heat to the internal air flow; Seventh step: the test data of the test seat 43 is transmitted to the signal acquisition board 47 through the signal transmission seat 42, and is transmitted to the control computer 34 of the control box 30 through the matched transmission line, so as to analyze and process the data. Eighth step: when the abnormality occurs in the test process, the signal lamp 31 on the top of the control box 30 flashes to show the warning, and the power supply of the control power supply box 35 is disconnected, so as to avoid the damage of the aging equipment.

[0026] It should be noted that the above shows and describes the basic principles, main features and advantages of the present application. It should be understood by those skilled in the art that the present application is not limited to the above examples, and the above examples and descriptions in the specification are only to illustrate the principles of the present application. Without departing from the spirit and scope of the present application, various changes and improvements can be made to the present application, and these changes and improvements all fall within the scope of the present application. The scope of protection of the present application is defined by the appended claims and their equivalents.

Claims

1. A diode constant current aging device, comprising a test sub-box (10) and a test main box (20), characterized in that: The test main box (20) is located on one side of the test auxiliary box (10), and a side box plate (11) is provided between the test main box (20) and the test auxiliary box (10). The test main box (20) is provided with a control box (30), and the test main box (20) and the test auxiliary box (10) are both provided with a power box (35) and a test cabinet (40). The power box (35) and the test cabinet (40) are controlled by the control box (30). A control panel (46) is provided in the test cabinet (40), and a test socket (43) is provided on the test cabinet (40). The test socket (43) is controlled by the control panel (46).

2. A diode constant current aging device according to claim 1, characterized in that: A fixing frame (23) is provided in the test main box (20), a rear door (22) is provided on the back of the fixing frame (23), and a ventilation fan (21) is provided on the top of the fixing frame (23).

3. A diode constant current aging device according to claim 1, characterized in that: The control box (30) is provided with a signal light (31) on the top, a transformer box (32) is provided inside the control box (30), a control button (33) is provided on the surface of the control box (30), and a control computer (34) is provided at the bottom of the control button (33). The test main box (20) and the test auxiliary box (10) are controlled and started by the control button (33), and the test results are displayed on the control computer (34).

4. A diode constant current aging device according to claim 1, characterized in that: The test cabinet (40) is provided with a cabinet body (44), the control panel (46) is located inside the cabinet body (44), the test seat (43) is located on the top of the cabinet body (44), the bottom of the test seat (43) is provided with a front exhaust fan and a fixing seat (45), the front exhaust fan and the fixing seat (45) are located in front of the test cabinet (40), the back of the cabinet body (44) is provided with a tail exhaust fan (41), an upper guard plate (442) is provided between the front exhaust fan and the fixing seat (45) and the test seat (43), a storage box (444) is provided in the cabinet body (44), and the front exhaust fan and the fixing seat (45) are installed in the cabinet body (44).

5. A diode constant current aging device according to claim 4, characterized in that: One end of the storage box (444) is provided with a front panel (443), and the front exhaust fan and the fixing seat (45) are correspondingly installed in the front panel (443).

6. A diode constant current aging device according to claim 5, characterized in that: A panel pad (445) is installed between the storage box (444) and the front panel (443), a bottom guard plate (446) is provided at the bottom of the storage box (444), a bottom plate (441) is provided at the bottom of the cabinet (44), and the bottom guard plate (446) is installed on top of the bottom plate (441).

7. A diode constant current aging device according to claim 6, characterized in that: One end of the control board (46) is electrically connected to a signal acquisition board (47), one end of the signal acquisition board (47) is connected to a signal transmission seat (42), and the signal transmission seat (42) is electrically connected to the test seat (43).

8. A diode constant current aging device and its test method, Its characteristics are; Step 1: Place the diode to be tested on the test seat (43) of the test cabinet (40), and then place the installed test cabinet (40) into the test main box (20) and the test auxiliary box (10); Step 2: Electrically connect the control panel (46) on the test cabinet (40) to the power box (35) and the test cabinet (40), and then connect the diode constant current aging equipment to the external power supply. Step 3: Set parameters through the control computer (34) on the control box (30) and transmit signals to the transformer box (32) and the power supply box (35) to input power to the diode to be tested; Step 4: Press the control button (33) on the surface of the control box (30) to start the aging equipment, and control the test current input and test time of the diode to be tested on the test socket (43) through the control box (30); Step 5: When the test seat (43) is working, the front exhaust fan and the fixing seat (45) on the surface of the test cabinet (40) dissipate heat from the bottom of the test seat (43) to ensure that the temperature of the diode in the test seat (43) is normal. At the same time, the rear exhaust fan (41) on the back of the cabinet (44) cooperates with the front exhaust fan to form a circulating air duct to dissipate heat for the test cabinet (40); Step 6: When performing the constant current aging test, the ventilation fans (21) on the top of the test main box (20) and the test auxiliary box (10) are operated to circulate the internal air flow and dissipate heat; Step 7: The test data of the test socket (43) is transmitted to the signal acquisition board (47) through the signal transmission socket (42), and is transmitted to the control computer (34) of the control box (30) through the supporting transmission line for data analysis and processing; Step 8: When an abnormality occurs during the test, the signal light (31) on the top of the control box (30) will flash to give a warning, and the power supply of the power box (35) will be disconnected to avoid damage to the aging equipment.

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