Detection device

Abstract

The invention relates to the technical field of PCB (Printed Circuit Board) testing, and discloses detection equipment, which comprises at least one group of testing components, and each group of testing components comprises two testing heads; the test head comprises: a turntable; the first bracket is fixedly connected with the turntable; the second bracket is connected with the turntable; the at least two probe assemblies are connected with the first support and the second support respectively, and the projections of the probe assemblies are located in the edge area of the projection of the rotary table in the axis direction of the rotary table. According to the detection equipment provided by the invention, the probe assemblies are arranged in the edge area of the turntable, so that when the two test heads are arranged in an attached manner, the turntable is rotated to enable the probe assembly on one test head to have a minimum test distance with the probe assembly on the other test head; the minimum test distance is smaller than the minimum test distance when the probe assembly is arranged in the middle of the rotating disc in the prior art, the adaptability of the detection equipment to the contacts on the PCB is improved, and the test precision is improved.

Description

Technical Field

[0001] This invention relates to the field of PCB board testing technology, and more specifically to a testing device. Background Technology

[0002] The test head used for PCB insertion loss testing is a precision testing tool suitable for testing various PCB circuit boards, especially for high-frequency PCBs, where it can effectively measure insertion loss. Test heads are usually used in pairs; however, when two test heads are placed close together, the probes are located in the central area of ​​the test head body, resulting in a relatively large minimum test distance (minimum test distance of 110mm) between the probes of one test head and the probes of the other. This leads to poor compatibility with contacts on the PCB circuit board, resulting in lower testing accuracy. Summary of the Invention

[0003] In view of this, the present invention provides a testing device to solve the problem that the minimum testing distance between the probes on one test head and the probes on another test head is large, resulting in poor adaptability to the contacts on the PCB board and thus poor testing accuracy.

[0004] This invention provides a detection device, comprising:

[0005] At least one set of test components, each set of test components including two test heads;

[0006] The test head includes:

[0007] A turntable, suitable for rotating around its own axis;

[0008] The first support is fixedly connected to the first main plane of the turntable;

[0009] The second bracket is connected to the turntable, and at least a portion of the second bracket is located on the side of the turntable facing the first bracket;

[0010] At least two probe assemblies are connected to the first support and the second support respectively, and the projection of the probe assemblies is located in the edge region of the turntable projection along the axis of the turntable.

[0011] Beneficial effects: By setting the probe assembly in the edge area of ​​the turntable, when the two test heads are placed close together, rotating the turntable ensures that there is a minimum test distance between the probe assembly on one test head and the probe assembly on the other test head. This minimum test distance is less than the minimum test distance (110mm) when the probe assembly is set in the middle of the turntable in related technologies. This helps to improve the adaptability of the testing equipment to the contacts on the PCB board and improve the test accuracy.

[0012] In one alternative embodiment, the second bracket is movably fixedly connected to the turntable and has a first state close to the first bracket and a second state far away from the first bracket; corresponding to the movement path of the probe assembly connected to the second bracket, a local area of ​​the circumferential surface of the turntable is recessed to form a first flat surface.

[0013] Beneficial effects: By moving the second support closer to or further away from the first support, the spacing between the probe assembly located on the first support and the probe assembly located on the second support can be changed, thereby expanding the position adjustment range of the probe assembly and improving the applicability of the detection equipment.

[0014] In one optional embodiment, the second support includes a long rod extending along the axis of the turntable. The turntable has a clearance hole corresponding to the movement path of the long rod, so that one end of the long rod passes through the clearance hole and is located on the side of the turntable away from the first support. A driving device is fixedly connected to the second main plane of the turntable. The driving device is connected to the long rod to drive the second support to switch between a first state and a second state.

[0015] In one optional embodiment, a first guide rail is fixedly connected to the first main plane and / or the second main plane, a first slider is slidably disposed on the first guide rail, and the sliding direction of the first slider is parallel to the moving direction of the long rod. A connecting plate is fixedly connected to the side of the long rod, and the connecting plate is fixedly connected to the first slider.

[0016] Beneficial effects: The long rod is fixedly connected to the first slider through the connecting plate, so as to facilitate sliding cooperation with the first guide rail, thereby improving the movement stability of the long rod when moving away from or towards the first support.

[0017] In one alternative embodiment, a limiting component is provided on the turntable, the limiting component including a limiting block adapted to abut against the connecting plate and / or the long rod to limit the displacement of the long rod along its direction of movement.

[0018] In one optional embodiment, the limiting assembly further includes a support base fixedly connected to the turntable, and an adjusting bolt rotatably disposed on the support base. The adjusting bolt is threadedly connected to the limiting block to adjust the gap between the limiting block and the support base.

[0019] Beneficial effect: By setting adjusting bolts to adjust the relative position of the limit block and the turntable, the degree to which the limit block restricts the movement range of the long rod can be adjusted.

[0020] In one alternative embodiment, a first displacement sensor is provided on the long rod, the first displacement sensor being adapted to detect the amount of displacement of the long rod.

[0021] Beneficial effect: By setting the first displacement sensor on the long rod, the displacement of the second support can be detected in real time.

[0022] In one alternative embodiment, the second support also includes a short rod fixedly connected to the long rod, the short rod being located on the side of the turntable facing the first support and connected to the probe assembly, and a counterweight being fixedly connected to the side of the long rod away from the short rod.

[0023] Beneficial effect: By fixing a counterweight block to the side of the long rod away from the short rod, the stability of the long rod supporting and fixing the short rod is improved.

[0024] In one optional embodiment, the probe assembly includes a fixing block, a probe, and a probe holder. The fixing block is fixedly connected to a first support or a second support, and the probe holder is fixedly connected to the probe and slidably disposed on the first support or the second support. In the same probe assembly, a first spring is connected between the fixing block and the probe holder, and the first spring is in a compressed state.

[0025] Beneficial effects: The first spring connects the fixing block and the probe holder, and the first spring is in a compressed state, so that the probe can fully contact the test piece under the elastic force, while the probe can retract a certain distance when subjected to a large reaction force, so as to avoid rigid contact between the probe and the test piece and avoid damage to the probe and / or the test piece.

[0026] In one alternative embodiment, the probe assembly further includes an adjustment plate and a tension spring. One end of the tension spring is connected to the probe seat, and the other end is connected to the adjustment plate. The adjustment plate has a slotted hole that mates with a fastening bolt, which is adapted to fix the adjustment plate to the fixing block.

[0027] Beneficial effect: By adjusting the relative position of the fastening bolt and the strip hole, the initial position of the probe seat on the first or second bracket can be adjusted. Attached Figure Description

[0028] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0029] Figure 1 This is a front view of the test head of the present invention;

[0030] Figure 2 This is a side view of the test head of the present invention;

[0031] Figure 3 This is a bottom view of the test head of the present invention;

[0032] Figure 4 This is a three-dimensional schematic diagram of the test head of the present invention;

[0033] Figure 5 This is a three-dimensional schematic diagram of the test head of the present invention without the shielding cover. Figure 1 ;

[0034] Figure 6 This is a three-dimensional schematic diagram of the test head of the present invention without the shielding cover. Figure 2 ;

[0035] Figure 7 This is a schematic diagram showing the maximum spacing between the two probe components of the test head of the present invention;

[0036] Figure 8 This is a schematic diagram showing the minimum spacing between the two probe components of the test head of the present invention;

[0037] Figure 9 This is a three-dimensional schematic diagram of the test head of the present invention without the shielding cover. Figure 3 ;

[0038] Figure 10 for Figure 9 A magnified view of a section at point A in the middle;

[0039] Figure 11 This is a three-dimensional schematic diagram of the long rod of the present invention.

[0040] Explanation of reference numerals in the attached figures:

[0041] 1. Turntable; 101. First main plane; 102. Second main plane; 103. First straight surface; 104. Clearance hole; 2. First bracket; 3. Second bracket; 301. Long rod; 302. Short rod; 303. Fixing rod; 4. Probe assembly; 401. Fixing block; 402. Probe seat; 403. Sliding rod; 404. First spring; 405. Probe; 406. Adjusting plate; 407. Tension spring; 408. Fastening bolt; 409. Strip hole; 410. Flat head screw; 411. Sleeve; 412. Shorting block; 413. Shorting fixing plate; 414. Second spring; 415. 5. Spring sheet; 6. Drive device; 7. First guide rail; 8. First slider; 9. Connecting plate; 10. First displacement sensor; 11. Limiting assembly; 12. Limiting block; 13. Adjusting bolt; 14. Support base; 15. Counterweight; 16. Shielding cover; 17. Shielding plate; 18. Second guide rail; 19. Second slider; 20. Limiting plate; 21. Limiting groove; 22. First limiting bolt; 23. Second limiting bolt; 24. Sensor bracket; 25. Support column; 26. Fixing plate; 27. Second flat surface; 28. Test head; 29. ​​Second displacement sensor; 20. Support rod. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0043] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0044] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0045] In addition, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0046] The following combination Figures 1 to 11 The following describes embodiments of the present invention.

[0047] According to an embodiment of the present invention, a detection device is provided, comprising:

[0048] At least one set of test components, each set of test components including two test heads 23;

[0049] Test head 23 includes:

[0050] Turntable 1 is suitable for rotating around its own axis;

[0051] The first bracket 2 is fixedly connected to the first main plane 101 of the turntable 1;

[0052] The second support 3 is connected to the turntable 1, and at least a portion of the second support 3 is located on the side of the turntable 1 facing the first support 2;

[0053] At least two probe assemblies 4 are connected to the first support 2 and the second support 3 respectively, and the projection of the probe assembly 4 is located in the edge area of ​​the projection of the turntable 1 along the axial direction of the turntable 1.

[0054] The testing device provided in this embodiment, by setting the probe assembly 4 in the edge area of ​​the turntable 1, ensures that when the two test heads 23 are placed close together, rotating the turntable 1 allows for a minimum testing distance between the probe assembly 4 on one test head 23 and the probe assembly 4 on the other test head 23. This minimum testing distance is less than the minimum testing distance (110mm) when the probe assembly 4 is set in the middle of the turntable in related technologies. This is beneficial for improving the adaptability of the testing device to the contacts on the PCB board and improving the testing accuracy.

[0055] Specifically, the testing equipment also includes at least one support rod 25, each support rod 25 is provided with a set of test components, and test heads 23 are slidably disposed on the support rod 25, so that two test heads 23 in the same group have a close state (approaching each other) and a far state (moving away from each other) along the radial direction of the turntable 1. The two test heads 23 in the same group approach or move away from each other along the length direction of the support rod 25 to adjust the test distance between the probe components 4 located on the two test heads 23 within the same group.

[0056] The first main plane 101 is one end face of the turntable 1. Along the axial direction of the turntable 1, the projection of the probe assembly 4 is located in the edge area of ​​the projection of the turntable 1. Thus, for two test heads 23 in the same group that are close to each other until they are touching, by rotating the turntable 1, at least one probe assembly 4 on one test head 23 is brought closer to at least one probe assembly 4 on the other test head 23. At this time, the minimum test distance of the detection device is reached. This minimum test distance is less than the minimum test distance (110mm) when the probe assembly 4 is placed in the middle of the turntable 1 in the related art, thereby improving the adaptability of the detection device to the contacts on the PCB board and improving the test accuracy. When the two test heads 23 are moved away from each other to the maximum distance on the support rod 25, by rotating the turntable 1, at least one probe assembly 4 on one test head 23 is moved away from at least one probe assembly 4 on the other test head 23. At this time, the maximum test distance of the detection device is reached. This maximum test distance is greater than the maximum test distance when the probe assembly 4 is placed in the middle of the turntable 1 in the related art. The detection device provided in this embodiment has a larger distance adjustment range by setting the probe assembly 4 on the edge of the turntable 1, compared with the related art in which the probe assembly 4 is set in the middle of the turntable 1.

[0057] When the midpoint of the line connecting the probe assembly 4 on the first support 2 and the probe assembly 4 on the second support 3 on the same test head 23 is needed as the test distance reference point, the aforementioned line deviates from the axis of the turntable 1. Therefore, when two test heads 23 in the same group are placed close together, rotating the turntable 1 brings the test distance reference point on one test head 23 closer to the test distance reference point on the other test head 23. This results in the minimum test distance of the detection device, which is less than the minimum test distance (110mm) when the probe assembly 4 is placed in the center of the turntable 1 in the related art. Furthermore, when two test heads 23 in the same group are far apart on the support rod 25 and have the greatest distance, rotating the turntable 1 moves the test distance reference point on one test head 23 further away from the test distance reference point on the other test head 23. This results in the maximum test distance of the detection device, which is greater than the maximum test distance when the probe assembly 4 is placed in the center of the turntable 1 in the related art.

[0058] In some embodiments, combined with Figures 1 to 11 As shown, the second bracket 3 is movably fixedly connected to the turntable 1, and has a first state close to the first bracket 2 and a second state far away from the first bracket 2; corresponding to the moving path of the probe assembly 4 connected to the second bracket 3, a local area of ​​the circumferential surface of the turntable 1 is recessed to form a first flat surface 103.

[0059] The detection device provided in this embodiment changes the spacing between the probe assembly 4 located on the first support 2 and the probe assembly 4 located on the second support 3 by moving the second support 3 closer to or further away from the first support 2, thereby expanding the position adjustment range of the probe assembly 4 and improving the applicability of the detection device.

[0060] Specifically, taking a dual-needle test head as an example, a probe assembly 4 is connected to the first bracket 2 and a probe assembly 4 is connected to the second bracket 3. When multiple circuits to be tested are arranged in parallel and perpendicular to the length direction of the support rod 25, the midpoint of the line connecting the two probe assemblies 4 on the same test head 23 is used as the reference point for the test distance. Along the axial direction of the turntable 1, the projected edge of the probe assembly 4 is flush with the first flat surface 103. By rotating the turntable 1, the first flat surfaces 103 of the two turntables 1 in the same group are brought close to each other and parallel to each other. The two test heads 23 are further moved in the direction of bringing them closer together until the two first flat surfaces 103 contact each other. At this time, the distance between the two test distance reference points located on the two test heads 23 is further reduced. Compared with the minimum test distance of 110mm in the related technology, the detection device provided in this embodiment can achieve a minimum test distance of 40mm.

[0061] In some embodiments, combined with Figures 1 to 11As shown, the second support 3 includes a long rod 301, which extends along the axis of the turntable 1. The turntable 1 has a clearance hole 104 corresponding to the moving path of the long rod 301, so that one end of the long rod 301 passes through the clearance hole 104 and is located on the side of the turntable 1 away from the first support 2. The second main plane 102 of the turntable 1 is fixedly connected to a driving device 5, which is connected to the long rod 301 to drive the second support 3 to switch between the first state and the second state.

[0062] Specifically, the clearance hole 104 passes through the turntable 1 to allow the long rod 301 to pass through, so that the two ends of the long rod 301 are located on both sides of the turntable 1, and makes way for the long rod 301 to move in the direction of approaching or moving away from the first support 2 under the drive of the drive device 5.

[0063] The main body of the drive device 5 is fixedly connected to the second main plane 102. In one feasible implementation, the output shaft of the drive device 5 rotates around its own axis and passes through the long rod 301 in a threaded manner. At this time, the side wall of the clearance hole 104 slides in contact with the long rod 301 to limit the rotation of the long rod 301 around the output shaft of the drive device 5. Thus, when the output shaft of the drive device 5 rotates, the long rod 301 moves in the direction of approaching or moving away from the first bracket 2 under the action of the thread. In this embodiment, the drive device 5 uses a micro motor to drive the long rod 301 to move in a threaded manner, thereby driving the second bracket 3 to switch between the first state and the second state, realizing the spacing adjustment between the second bracket 3 and the first bracket 2 within the range of 0.2mm-6mm, which is beneficial for inspecting more types of PCB circuit boards.

[0064] As an additional implementation, the output end of the drive device 5 is fixedly connected to the long rod 301. The drive device 5 includes a motor, pneumatic actuator, or hydraulic actuator for outputting linear displacement, so that the long rod 301 moves along the direction of approaching or moving away from the first support 2 with the output end of the drive device 5.

[0065] In some embodiments, combined with Figures 1 to 11 As shown, a first guide rail 6 is fixedly connected to the first main plane 101 and / or the second main plane 102. A first slider 7 is slidably disposed on the first guide rail 6, and the sliding direction of the first slider 7 is parallel to the moving direction of the long rod 301. A connecting plate 8 is fixedly connected to the side of the long rod 301, and the connecting plate 8 is fixedly connected to the first slider 7.

[0066] The detection device provided in this embodiment has a long rod 301 fixedly connected to the first slider 7 via a connecting plate 8, so as to facilitate sliding cooperation with the first guide rail 6, thereby improving the movement stability of the long rod 301 as it moves away from or towards the first support 2.

[0067] Specifically, the length direction of the first guide rail 6 is parallel to the moving direction of the long rod 301. Second limiting bolts 19 are provided on the first main plane 101 and / or the second main plane 102 at both ends of the first guide rail 6 along its length direction. The second limiting bolts 19 are adapted to abut against the first slider 7 when it moves to the limit position on the first guide rail 6, thereby preventing the first slider 7 from sliding off the first guide rail 6.

[0068] In some embodiments, combined with Figures 1 to 11 As shown, a limit component 10 is provided on the turntable 1. The limit component 10 includes a limit block 1001, which is adapted to abut against the connecting plate 8 and / or the long rod 301 to limit the displacement of the long rod 301 along its moving direction.

[0069] Specifically, when the limiting block 1001 is disposed on the side of the long rod 301 facing the first bracket 2, the limiting block 1001 is adapted to limit the minimum gap between the long rod 301 and the first bracket 2. Additionally, when the limiting block 1001 is disposed on the side of the long rod 301 away from the first bracket 2, the limiting block 1001 is adapted to limit the maximum gap between the long rod 301 and the first bracket 2.

[0070] In some embodiments, combined with Figures 1 to 11 As shown, the limiting assembly 10 also includes a support base 1003 fixedly connected to the turntable 1, and an adjusting bolt 1002 rotatably disposed on the support base 1003. The adjusting bolt 1002 is threadedly connected to the limiting block 1001 to adjust the interval between the limiting block 1001 and the support base 1003.

[0071] The detection device provided in this embodiment adjusts the relative position of the limiting block 1001 and the turntable 1 by setting the adjusting bolt 1002, thereby adjusting the degree of restriction of the moving range of the long rod 301 by the limiting block 1001.

[0072] Specifically, the adjusting bolt 1002 is threaded through the limiting block 1001. The limiting block 1001 is slidably engaged with the first main plane 101 or the second main plane 102. By rotating the adjusting bolt 1002, the interval between the limiting block 1001 and the support base 1003 is adjusted, thereby changing the relative position between the limiting block 1001 and the first guide rail 6, and thus adjusting the maximum or minimum interval between the long rod 301 and the first bracket 2 during the movement.

[0073] The limiting block 1001 has a limiting groove 17. The limiting groove 17 extends through the limiting block 1001 along the axis of the turntable 1. The limiting groove 17 is elongated, and its length direction is parallel to the length direction of the first guide rail 6. At least one first limiting bolt 18 is provided on the first main plane 101 of the turntable 1 corresponding to the position of the limiting groove 17. The first limiting bolt 18 is adapted to abut against the inner wall of the limiting groove 17 to limit the movement distance of the limiting block 1001. As a feasible implementation, two first limiting bolts 18 are spaced apart. The line connecting the two first limiting bolts 18 is parallel to the length direction of the limiting groove 17, and the length of the area containing the two first limiting bolts 18 is less than the length of the limiting groove 17.

[0074] In some embodiments, combined with Figures 1 to 11 As shown, a first displacement sensor 9 is provided on the long rod 301, which is suitable for detecting the displacement of the long rod 301.

[0075] The detection device provided in this embodiment uses a first displacement sensor 9 on a long rod 301 to detect the displacement of the second support 3 in real time.

[0076] Specifically, a fixed disk 22 is spaced apart on the side of the turntable 1 away from the probe assembly 4. At least one support column 21 is provided between the turntable 1 and the fixed disk 22, with one end of the support column 21 fixedly connected to the turntable 1 and the other end fixedly connected to the fixed disk 22. A second displacement sensor 24 is connected to the side of the fixed disk 22 facing the turntable 1 to detect the displacement of the fixed disk 22. A first displacement sensor 9 is disposed between the turntable 1 and the fixed disk 22 and connected to a long rod 301 to detect the displacement of the second support 3. Additionally, a sensor bracket 20 connects the first displacement sensor 9 and the long rod 301, with the long rod 301 connected to the first displacement sensor 9 via the sensor bracket 20.

[0077] The circumferential surface of the fixed plate 22 corresponds to the first flat surface 103 of the turntable 1, and the recess forms the second flat surface 221. The test head 23 also includes a shielding plate 13 that is fixedly connected to the first flat surface 103 and the second flat surface 221 at the same time, and a shielding cover 12 that is fixedly connected to the arc-shaped area of ​​the turntable 1 and the fixed plate 22 at the same time. The shielding cover 12 and the shielding plate 13 are suitable for enclosing the space between the fixed plate 22 and the turntable 1.

[0078] In some embodiments, combined with Figures 1 to 11 As shown, the second support 3 also includes a short rod 302 fixedly connected to the long rod 301. The short rod 302 is located on the side of the turntable 1 facing the first support 2, and the short rod 302 is connected to the probe assembly 4. A counterweight 11 is fixedly connected to the side of the long rod 301 away from the short rod 302.

[0079] The testing device provided in this embodiment improves the stability of the long rod 301 in supporting and fixing the short rod 302 by fixing a counterweight block 11 to the side of the long rod 301 away from the short rod 302.

[0080] Specifically, a fixing rod 303 is fixedly connected between the long rod 301 and the short rod 302. The short rod 302 is positioned close to the first support 2, and the long rod 301 supports and fixes the short rod 302 via the fixing rod 303, causing the short rod 302 to move closer to or away from the first support 2. By setting the fixing rod 303, the long rod 301 can be positioned away from the first support 2, thereby reserving sufficient space for the first guide rail 6 and the limiting assembly 10. Preferably, multiple probe assemblies 4 are positioned on the same side of the short rod 302 and the first support 2.

[0081] In some embodiments, combined with Figures 1 to 11 As shown, the probe assembly 4 includes a fixing block 401, a probe 405, and a probe seat 402. The fixing block 401 is fixedly connected to the first support 2 or the second support 3. The probe seat 402 is fixedly connected to the probe 405 and is slidably disposed on the first support 2 or the second support 3. In the same probe assembly 4, a first spring 404 is connected between the fixing block 401 and the probe seat 402. The first spring 404 is in a compressed state.

[0082] The detection device provided in this embodiment connects the fixing block 401 and the probe seat 402 through the first spring 404. The first spring 404 is in a compressed state so that the probe 405 can fully contact the workpiece under the elastic force, while the probe 405 can retract a certain distance when subjected to a large reaction force, so as to avoid rigid contact between the probe 405 and the workpiece and avoid damage to the probe 405 and / or the workpiece.

[0083] Specifically, a second guide rail 14 is provided on both the first bracket 2 and the short rod 302. A second slider 15 is slidably mounted on the second guide rail 14. The probe seat 402 is fixedly connected to the second slider 15 to facilitate sliding on the second guide rail 14 via the second slider 15. A limit plate 16 is fixedly connected to the end of the first bracket 2 and the short rod 302 away from the turntable 1, and / or the end of the second guide rail 14 away from the turntable 1, to prevent the second slider 15 from sliding off the second guide rail 14. A fixing block 401 is positioned on the side of the second guide rail 14 facing the turntable 1. A sliding rod 403 passes through the first spring 404. The fixing block 401 has a through hole corresponding to the sliding rod 403. A sleeve 411 is fixedly connected to the end of the fixing block 401 facing the turntable 1 corresponding to the through hole. The axis of the sleeve 411 is parallel to the axis of the through hole. The sliding rod 403 passes through the through hole and the sleeve 411 in sequence. A flat-head screw 410 is fixedly connected to the end of the sliding rod 403 facing the turntable 1. The end face of the flat-head screw 410 away from the turntable 1 is adapted to abut against the end face of the sleeve 411 facing the turntable 1, thereby limiting the maximum distance between the probe seat 402 and the fixing block 401 when the first spring 404 is in a compressed state. Additionally, the flat-head screw 410 is threadedly connected to the sliding rod 403. By rotating the sliding rod 403, the overall length of the flat-head screw 410 and the sliding rod 403 can be adjusted, thereby adjusting the maximum distance between the probe seat 402 and the fixing block 401.

[0084] In some embodiments, combined with Figures 1 to 11 As shown, the probe assembly 4 also includes an adjustment plate 406 and a tension spring 407. One end of the tension spring 407 is connected to the probe seat 402, and the other end is connected to the adjustment plate 406. The adjustment plate 406 has a strip hole 409 that cooperates with the fastening bolt 408. The fastening bolt 408 is suitable for fixing the adjustment plate 406 to the fixing block 401.

[0085] The detection device provided in this embodiment adjusts the relative position of the fastening bolt 408 and the strip hole 409 to adjust the initial position of the probe seat 402 on the first bracket 2 or the second bracket 3.

[0086] Specifically, the length direction of the strip hole 409 is parallel to the axial direction of the turntable 1, and the strip hole 409 includes oblong holes, rectangular holes, and elliptical holes. The adjusting plate 406 is connected to the probe seat 402 via a tension spring 407. By loosening the fastening bolt 408, the relative position of the adjusting plate 406 and the fixing block 401 is moved, and the fastening bolt 408 is tightened to adjust the initial position of the probe seat 402 via the tension spring 407.

[0087] The probe 405 is installed at an angle in a mounting groove at the end of the probe holder 402 away from the turntable 1. At least one probe holder 402 on each test head 23 is fixedly connected to a shorting fixing plate 413, which is fixedly connected to the end of the probe holder 402 away from the turntable 1. The shorting fixing plate 413 is connected to a spring plate 415 via at least one second spring 414, and a shorting block 412 is fixedly connected to the spring plate 415. The shorting block 412 is supported by the spring plate 415 in the needle area near the probe 405.

[0088] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Although embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and all such modifications and variations fall within the scope defined by the present invention.

Claims

1. A testing device, characterized in that, include: At least one set of test components, each set of test components including two test heads (23); The test head (23) includes: Turntable (1) is adapted to rotate around its own axis; The first bracket (2) is fixedly connected to the first main plane (101) of the turntable (1); The second support (3) is connected to the turntable (1), and at least a portion of the second support (3) is located on the side of the turntable (1) facing the first support (2); At least two probe assemblies (4) are connected to the first bracket (2) and the second bracket (3) respectively, and the projection of the probe assembly (4) is located in the edge region of the projection of the turntable (1) along the axial direction of the turntable (1).

2. The detection device according to claim 1, characterized in that, The second bracket (3) is movably fixedly connected to the turntable (1) and has a first state close to the first bracket (2) and a second state far away from the first bracket (2); corresponding to the moving path of the probe assembly (4) connected to the second bracket (3), a local area of ​​the circumferential surface of the turntable (1) is recessed to form a first flat surface (103).

3. The detection device according to claim 2, characterized in that, The second support (3) includes a long rod (301) that extends along the axis of the turntable (1). The turntable (1) has a clearance hole (104) corresponding to the moving path of the long rod (301) so that one end of the long rod (301) passes through the clearance hole (104) and is located on the side of the turntable (1) away from the first support (2). A driving device (5) is fixedly connected to the second main plane (102) of the turntable (1). The driving device (5) is connected to the long rod (301) to drive the second support (3) to switch between the first state and the second state.

4. The detection device according to claim 3, characterized in that, A first guide rail (6) is fixedly connected to the first main plane (101) and / or the second main plane (102). A first slider (7) is slidably arranged on the first guide rail (6), and the sliding direction of the first slider (7) is parallel to the moving direction of the long rod (301). A connecting plate (8) is fixedly connected to the side of the long rod (301), and the connecting plate (8) is fixedly connected to the first slider (7).

5. The detection device according to claim 4, characterized in that, The turntable (1) is provided with a limiting component (10), the limiting component (10) includes a limiting block (1001), the limiting block (1001) is adapted to abut against the connecting plate (8) and / or the long rod (301) to limit the displacement of the long rod (301) along its moving direction.

6. The detection device according to claim 5, characterized in that, The limiting component (10) further includes a support base (1003) fixedly connected to the turntable (1) and an adjusting bolt (1002) rotatably disposed on the support base (1003). The adjusting bolt (1002) is threadedly connected to the limiting block (1001) to adjust the interval between the limiting block (1001) and the support base (1003).

7. The detection device according to claim 3, characterized in that, A first displacement sensor (9) is provided on the long rod (301), and the first displacement sensor (9) is adapted to detect the displacement of the long rod (301).

8. The detection device according to claim 3, characterized in that, The second bracket (3) also includes a short rod (302) fixedly connected to the long rod (301). The short rod (302) is located on the side of the turntable (1) facing the first bracket (2), and the short rod (302) is connected to the probe assembly (4). A counterweight (11) is fixedly connected to the side of the long rod (301) away from the short rod (302).

9. The testing equipment according to any one of claims 1 to 8, characterized in that, The probe assembly (4) includes a fixing block (401), a probe (405), and a probe holder (402). The fixing block (401) is fixedly connected to the first support (2) or the second support (3). The probe holder (402) is fixedly connected to the probe (405) and is slidably disposed on the first support (2) or the second support (3). In the same probe assembly (4), a first spring (404) is connected between the fixing block (401) and the probe holder (402). The first spring (404) is in a compressed state.

10. The detection device according to claim 9, characterized in that, The probe assembly (4) further includes an adjusting plate (406) and a tension spring (407). One end of the tension spring (407) is connected to the probe seat (402), and the other end is connected to the adjusting plate (406). The adjusting plate (406) has a strip hole (409) that mates with a fastening bolt (408). The fastening bolt (408) is adapted to fix the adjusting plate (406) on the fixing block (401).

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