Modular testing device for cognitive impairment testing

Abstract

The present application relates to the field of disease testing equipment, a modular testing equipment for cognitive impairment testing, comprising a testing round table, the tabletop of the testing round table has a plurality of annular array arranged testing sites, each testing site is detachably provided with a physical testing equipment; a baffle, the baffle is surrounded in the outer periphery of the testing round table, the baffle has an operation window higher than the height of the tabletop of the testing round table, each operation window is provided with a through transmission sensor. The modular testing equipment can change the traditional touch test into physical test, and the tested object can be modularized, and the test object can be quickly changed for different cognitive impairment groups.

Description

Technical Field

[0001] This invention relates to the field of disease testing equipment, and in particular to a modular testing device for testing cognitive impairment. Background Technology

[0002] People with cognitive impairments have varying abilities to perceive things, which generally manifest as cognitive deficits, memory loss, and other different conditions. Testing is typically conducted using touch-screen devices. For example, a computer's built-in program outputs a test screen to a touch-screen device, allowing the user to control the test via touch.

[0003] People with cognitive impairment are generally elderly, and the elderly are not very receptive to touch-screen controls. Another major problem is that the objects used for testing cognitive impairment need to be changed for different groups of people. For example, some people have cognitive impairments with numbers, while others have cognitive impairments with language comprehension. Since the direction of cognitive impairment varies among people with cognitive impairment, there is a certain demand for physical testing equipment that combines device testing and multi-module replacement in the field of cognitive impairment testing. Summary of the Invention

[0004] To address the aforementioned issues, this invention proposes a modular testing device for cognitive impairment testing. This device can transform traditional touch-based testing into physical testing and can also modularize the objects to be tested, allowing for quick changes to the test items for different cognitive impairment groups.

[0005] To achieve the above objectives, the technical solution adopted by the present invention is as follows:

[0006] A modular testing device for cognitive impairment testing, comprising:

[0007] A test round table with multiple test positions arranged in a circular array on its tabletop, each of which can be detachably fitted with physical test equipment;

[0008] A baffle surrounds the outer perimeter of the test round table, and the baffle has an operating window that is higher than the height of the test round table's tabletop, with a through-beam sensor at each of the operating windows;

[0009] The desktop has a groove corresponding to the test position. A connection box is provided on the first side wall of the groove. A first electrical contact spring is provided on the second side wall of the groove opposite to the first side wall. A second electrical contact spring is provided on the side of the lower part of the physical test device. After the physical test device is inserted into the groove, the first electrical contact spring and the second electrical contact spring are electrically connected.

[0010] The physical testing equipment includes a test stand and a detachable photoelectric testing module. The shape of the test stand matches the shape of the groove. The top surface of the test stand has a mounting slot, and the interior of the mounting slot has a turntable. The interior of the test stand also has a second servo motor. The power output end of the second servo motor is connected to the lower end of the drive shaft, and the upper end of the drive shaft is connected to the center of the bottom of the turntable. The second servo motor can drive the turntable to rotate.

[0011] Preferably, the connecting box is connected to the sidewall of the groove via a rotating shaft.

[0012] Preferably, there are four photoelectric testing modules. Each photoelectric testing module includes a mounting plate and a plug-in post. The plug-in post is a quarter-cylinder shape, and the mounting plate is a quarter-disc shape. The four photoelectric testing modules can be spliced ​​into a combination. The bottom of the combination is a columnar structure and the top is a disc-shaped structure. The top surface of the mounting plate has an object mounting structure for mounting physical models.

[0013] The assembly formed by combining the four photoelectric testing modules can be inserted into the turntable.

[0014] Preferably, the test holder has a light generator and 8,000 photosensitive devices inside the mounting slot, and the photosensitive devices and the light generator are arranged in an array with the axis of the turntable as the center; and the light generator and the 8,000 photosensitive devices are in the same plane;

[0015] The light emitted by the light generator is horizontal and directed toward the third photosensitive device.

[0016] Preferably, the photoelectric testing module has an internal optical path and / or optical lenses;

[0017] When the photoelectric testing module is inserted into the turntable, the optical path, optical lens, light generator, and photosensitive device are on the same plane; the light emitted by the light generator can be emitted to one or more of the photosensitive devices after passing through the optical path and optical lens.

[0018] Furthermore, after the photoelectric testing modules are spliced ​​together, the optical paths of the four photoelectric testing modules are interconnected.

[0019] Preferably, the photoelectric testing module includes

[0020] The first optoelectronic testing module, and the first optical path with a cross shape inside the first optoelectronic testing module;

[0021] The second photoelectric testing module has a "T"-shaped second optical path inside. The second photoelectric testing module also includes a first optical lens, which is a transparent lens. The first optical lens is located at the junction of the second optical path, and the surface of the first optical lens passes through the axis of the turntable.

[0022] The third optoelectronic testing module has a cross-shaped third optical path inside. The third optoelectronic testing module also includes a second optical lens, which is a transparent lens. The third optical lens is set at the junction of the third optical path, and the second optical lens is set vertically with one side of its surface facing the axis of the turntable.

[0023] The fourth optoelectronic testing module includes an "L"-shaped fourth optical path inside the third optoelectronic testing module. Inside the fourth optoelectronic testing module, there is also a third optical lens, which is a reflector. The third optical lens is set at the corner of the fourth optical path and is vertically set with its reflective surface facing the axis of the turntable.

[0024] Preferably, each of the photoelectric testing modules has resistors with different resistance values ​​inside. After the four photoelectric testing modules are combined, two adjacent photoelectric testing modules are connected to each other through built-in contact pairs, so that the resistors of the four photoelectric testing modules form a ring electrical connection.

[0025] The assembly has four outer ring contacts on its exterior, and the test socket has four inner ring contacts on the inner wall of the mounting slot. When the assembly rotates, the four outer contacts of the assembly and the four contacts of the test socket are interconnected to form an external contact pair. The test socket has a power supply and a load test terminal inside. The positive and negative terminals of the power supply are electrically connected to two opposing inner ring contacts, and the two measuring terminals of the load test terminal are electrically connected to the other two opposing inner ring contacts, so that the internal resistance of the photoelectric test module forms a bridge circuit with the power supply and the load test terminal.

[0026] The beneficial effects of using this invention are:

[0027] The modular testing device for cognitive impairment proposed in this invention uses a combination of a testing round table, a testing stand, and a photoelectric testing module. The testing stand and the photoelectric testing module can be modularized. The testing stand and the photoelectric testing module can be installed on the testing round table as needed. The photoelectric testing module can also be used to install physical models required for testing. The modularization of the entire device makes it very convenient to replace components.

[0028] The photoelectric testing module proposed in this invention can be configured with corresponding internal structures as needed and matched with corresponding external testing components, which can very easily test the final results of cognitive impairment tests. Attached Figure Description

[0029] Figure 1 This is a top view of a modular testing device used for cognitive impairment testing.

[0030] Figure 2 for Figure 1 A schematic diagram showing the connection between the middle connector box and the test socket.

[0031] Figure 3 for Figure 1 A diagram showing the middle connector box not placed in the test socket.

[0032] Figure 4 for Figure 1 A schematic diagram of the middle baffle.

[0033] Figure 5 This is a top view of the test stand.

[0034] Figure 6 This is a schematic diagram of the internal structure of the test socket.

[0035] Figure 7 This is a schematic diagram of the overall optoelectronic testing module.

[0036] Figure 8 This is a schematic diagram of the lower end face of the plug-in post.

[0037] Figure 9 This is a schematic diagram of the photoelectric testing module in the first embodiment.

[0038] Figure 10 This is a schematic diagram of one state after the four photoelectric test modules are spliced ​​together in the first embodiment.

[0039] Figure 11 This is a schematic diagram of the second state after the four photoelectric test modules in the first embodiment are spliced ​​together.

[0040] Figure 12 This is a state diagram of the four photoelectric test modules spliced ​​together in the second embodiment.

[0041] Figure 13 This is a diagram showing the docking status of the built-in contact pairs after the four photoelectric test modules are spliced ​​together in the second embodiment.

[0042] Figure 14 This is a schematic diagram of the test principle after the four photoelectric test modules are spliced ​​together in the second embodiment.

[0043] Figure 15 This is a control module diagram of a modular testing device used for cognitive impairment testing.

[0044] The reference numerals in the figures include:

[0045] 10-Test round table, 11-Connector box, 111-Elastic pad, 12-First electrical contact spring, 13-Rotating shaft, 14-First servo motor;

[0046] 20-Baffle, 21-Through-beam sensor, 22-Operation window;

[0047] 30 - Change window;

[0048] 40-Test holder, 41-Second electrical contact spring, 42-Photoelectric test module mounting position, 43-Light generator, 44-Second servo motor, 45-Drive shaft, 46-Turntable, 47-Mounting slot, 48-Photosensitive device;

[0049] 50-Photoelectric test module, 51-Mounting plate, 511-Object mounting structure, 52-Plug-in post, 521-Chamfer, 53-Optical path, 54-Optical lens, 55-External contact pair, 56-Internal contact pair;

[0050] 60 - Control the computer;

[0051] in:

[0052] 48 - Photosensitive devices include: 48A - First photosensitive device, 48B - Second photosensitive device, 48C - Third photosensitive device, 48D - Fourth photosensitive device, 48E - Fifth photosensitive device, 48F - Sixth photosensitive device, and 48G - Seventh photosensitive device;

[0053] 52-The plug-in pins include: 52A-first plug-in pin, 52B-second plug-in pin, 52C-third plug-in pin, and 52D-fourth plug-in pin;

[0054] 53 - Optical paths include: 53A - First optical path, 53B - Second optical path, 53C - Third optical path, and 53D - Fourth optical path;

[0055] 54 - Optical lenses include: 54A - First optical lens, 54B - Second optical lens, and 54C - Third optical lens. Detailed Implementation

[0056] To make the objectives, technical solutions, and advantages of this technical solution clearer, the following detailed description, in conjunction with specific embodiments, further illustrates this technical solution. It should be understood that these descriptions are merely exemplary and not intended to limit the scope of this technical solution.

[0057] To address the issue of touchscreen operation in existing cognitive impairment testing devices, and to simultaneously automate the detection of test results, such as... Figure 1As shown, this embodiment proposes a modular testing device for cognitive impairment testing. The testing device has a central testing round table 10, on which four solid mounting positions are arranged in a circular array. Each mounting position has a groove, and a connecting box 11 is provided on the side of the groove near the edge of the testing round table 10. Two first electrical contact springs 12 are provided on the inner side of the groove near the center of the testing round table 10. A baffle 20 is also provided on the outside of the testing round table 10, with three testing positions and a replacement window 30. The testing positions are for personnel testing, and the replacement window 30 is for maintenance and replacement of the testing base 40 and the photoelectric testing module 50. A through-beam sensor 21 is provided at each of the three testing positions.

[0058] like Figure 2 As shown, a connecting box 11 is located on one side of the test table 10 and connected to the top surface of the test table 10 via a pivot 13, allowing the connecting box 11 to rotate along the pivot 13. When the test base 40 is installed in the connecting box 11, flipping the connecting box 11 allows the test base 40 to enter the groove. At this time, the two second electrical contact springs 41 at the tail of the test base 40 contact the two first electrical contact springs 12 to achieve circuit conduction. An elastic pad 111 is provided inside the connecting box 11 at the bottom of the box. The elastic pad 111 provides elastic support for the test base 40, maintaining contact between the two second electrical contact springs 41 and the two first electrical contact springs 12.

[0059] like Figure 3 As shown, in this embodiment, the rotating shaft 13 is a damping shaft. In another embodiment, the rotating shaft 13 can also be connected to a torsion spring. After the test seat 40 is removed, the connecting box 11 remains in an upward angled position to facilitate the installation of the lower test seat 40. Using the connecting box 11 can prevent the test seat 40 from being installed incorrectly and also helps the elastic pad 111 to apply pressure to the test seat 40.

[0060] like Figure 4 As shown, the baffle 20 has an operating window 22, which is only large enough for an arm to pass through. A through-beam sensor 21 is positioned above the operating window 22 to detect whether an object or an arm passes through it, preventing potential hazards. A first servo motor 14 is positioned below the test table 10. The power end of the first servo motor 14 is connected to the test table 10, and the first servo motor 14 can drive the test table 10 to rotate in a step-like manner.

[0061] Before the first servo motor 14 drives the test table 10 to rotate, the through-beam sensor 21 detects if an object or arm passes through the operating window 22. If so, the first servo motor 14 will not output power, and the test table 10 will not rotate. The first servo motor 14 driving the test table 10 can be used in two ways. For example, three test positions can be formed on the test table 10, each with three testers, allowing all three to complete the test simultaneously. Alternatively, four physical mounting positions can be formed on the test table 10, each with a different test mount 40 and photoelectric test module 50. After one tester completes the initial difficulty test, based on the initial difficulty test result, the first servo motor 14 can drive the test table 10 to rotate to the second physical mounting position to perform the second difficulty test.

[0062] like Figure 5 As shown, two second electrical contact springs 41 are provided on the back of the test base 40, and a photoelectric test module mounting position 42 is provided on the top surface of the test base 40. The photoelectric test module mounting position 42 can be used to install a modular photoelectric test module 50. The test base 40 and the photoelectric test module 50 form a group, which facilitates the overall replacement and the individual replacement of each module.

[0063] like Figure 6 As shown, the physical testing equipment includes a test stand 40 and a detachable photoelectric testing module 50. The shape of the test stand 40 matches the shape of the groove. The top surface of the test stand 40 has a mounting groove 47. The interior of the mounting groove 47 has a turntable 46. The interior of the test stand 40 also has a second servo motor 44. The power output end of the second servo motor 44 is connected to the lower end of the drive shaft 45. The upper end of the drive shaft 45 is connected to the center of the bottom of the turntable 46. The second servo motor 44 can drive the turntable 46 to rotate.

[0064] like Figure 7 As shown, there are four photoelectric testing modules 50. Each photoelectric testing module 50 includes a mounting plate 51 and a plug-in post 52. The plug-in post 52 is a quarter-cylinder shape, and the mounting plate 51 is a quarter-disc shape. The four photoelectric testing modules 50 can be assembled into a combination. The bottom of the combination is a cylindrical structure, and the top is a disc-shaped structure. The top surface of the mounting plate 51 has an object mounting structure 511 for mounting a physical model. The combination formed by the four photoelectric testing modules 50 can be inserted into the turntable 46. In this embodiment, the object mounting structure 511 is a threaded hole for easy installation and disassembly.

[0065] Combination Figure 7 and Figure 8As shown, the plug-in post 52 is a quarter-cylinder shape, and a chamfer 521 is provided at the transition between the bottom surface and the outer curved surface of the plug-in post 52. The function of the chamfer 521 is to facilitate the insertion of the combined body formed by the four photoelectric test modules 50 into the turntable 46. The chamfer 521 also serves as a guide.

[0066] The structure of the photoelectric test module 50 is described in detail below through two embodiments. The structure and usage of the photoelectric test module 50 can be described in detail according to the following two embodiments. The photoelectric test module 50 can be set up by oneself.

[0067] Example 1

[0068] like Figure 9 As shown, in this embodiment, the photoelectric testing module 50 needs to have an optical path 53 and an optical lens 54 opened on the insertion post 52, and a corresponding light generator 43 and a photosensitive device 48 are installed on the inner annular surface of the groove of the test base 40. When the photoelectric testing module 50 is inserted into the turntable 46, the optical path 53, the optical lens 54, the light generator 43 and the photosensitive device 48 are on the same plane; the light emitted by the light generator 43 can be emitted to one or more photosensitive devices 48 after passing through the optical path 53 and the optical lens 54; and after the photoelectric testing modules 50 are spliced, the optical paths 53 of the four photoelectric testing modules 50 are interconnected.

[0069] In the arrangement of photosensitive device 48 and light generator 43, there is one light generator 43 and seven photosensitive devices 48. The photosensitive devices 48 and light generator 43 are arranged in a circular array, that is, the light generator 43, and the first photosensitive device 48A, the second photosensitive device 48B, the third photosensitive device 48C, the fourth photosensitive device 48D, the fifth photosensitive device 48E, the sixth photosensitive device 48F and the seventh photosensitive device 48G are arranged counterclockwise from the position of the light generator 43.

[0070] like Figure 10 As shown, in this embodiment, four photoelectric test modules 50 are spliced ​​together. Each of the four photoelectric test modules 50 has a plug-in post 52.

[0071] Preferably, the photoelectric testing module 50 includes a first photoelectric testing module 50, with a cross-shaped first optical path 53A inside the first photoelectric testing module 50; a second photoelectric testing module 50, with a T-shaped second optical path 53B inside the second photoelectric testing module 50, and also includes a first optical lens 54A, which is a transparent lens, and the first optical lens 54A is located at the junction of the second optical path 53B, with the surface of the first optical lens 54A passing through the axis of the turntable 46; and a third photoelectric testing module 50, with a cross-shaped third optical path 53C inside the third photoelectric testing module 50. The third photoelectric testing module 50 also includes a second optical lens 54B, which is a transparent lens. The second optical lens 54B is located at the junction of the third optical path 53C, and is vertically arranged with one side of its surface facing the axis of the turntable 46. The fourth photoelectric testing module 50 has an "L"-shaped fourth optical path 53D inside the third photoelectric testing module 50. The fourth photoelectric testing module 50 also includes a third optical lens 54C, which is a reflector. The third optical lens 54C is located at the corner of the fourth optical path 53D, and is vertically arranged with its reflective surface facing the axis of the turntable 46.

[0072] like Figure 10 As shown, when the physical model is assembled in the required order, the first insertion post 52A, the second insertion post 52B, the third insertion post 52C, and the fourth insertion post 52D, when assembled in a counter-clockwise order, form a cylindrical structure. Furthermore, the first optical path 53A, the second optical path 53B, the third optical path 53C, and the fourth optical path 53D within the first insertion post 52A, the second insertion post 52B, the third insertion post 52C, and the fourth insertion post 52D are sequentially connected. For example... Figure 10 As shown, after the plug-in pins 52 are assembled together, the light emitted by the light generator 43 passes through the first optical path 53A and enters the second optical path 53B. Due to the effect of the first optical lens 54A set in the second optical path 53B, the light is partially refracted after passing through the first optical lens 54A and then passes through the second optical path 53B to the second photosensitive device 48B, triggering the second photosensitive device 48B.

[0073] While the light generator 43 continues to emit light, the turntable 46 is driven to rotate by the second servo motor 44. After the turntable 46 rotates 90° clockwise, the light generator 43 is aligned with the second optical path 53B. The light emitted by the light generator 43 passes through the second optical path 53B and is refracted by the first optical lens 54A before being directed towards the sixth photosensitive device 48F, which is then triggered.

[0074] While the light generator 43 continues to emit light, the turntable 46 is driven to rotate by the second servo motor 44. After rotating the turntable 46 90° clockwise, the light generator 43 is positioned opposite the third optical path 53C. The light emitted from the light generator 43 passes through the second optical path 53B and enters the second optical lens 54B. Part of the light passes through the second optical lens 54B, and part is reflected. The reflected portion triggers the first photosensitive device 48A. The light passing through the second optical lens 54B enters the fourth light path, is reflected by the third optical lens 54C, and returns to the first optical path 53A. Finally, it exits from the first optical path 53A and triggers the fifth photosensitive device 48E. At this moment, both the first photosensitive device 48A and the fifth photosensitive device 48E are triggered simultaneously.

[0075] After the second servo motor 44 drives the turntable 46 to rotate once, it obtains three step rotation commands and the corresponding trigger results of the three sets of photosensitive devices 48. This allows it to be determined that the four photoelectric test modules 50 are arranged in the correct order.

[0076] like Figure 11 As shown, if the user mistakenly assembles the second photoelectric test module 50 and the third photoelectric test module 50, that is, swaps their positions, the light emitted by the light generator 43 enters the first optical path 53A and then the third optical path 53C. Part of the light passes through the second optical lens 54B, and part of the light is reflected and enters the second optical path 53B. After being reflected by the first optical lens 54A, it exits through the second optical path 53B. At this time, the third photosensitive device 48C and the fourth photosensitive device 48D are triggered.

[0077] While the light generator 43 continues to emit light, the turntable 46 is driven to rotate by the second servo motor 44. After the turntable 46 rotates 90° clockwise, the light generator 43 is aligned with the third optical path 53C. The light emitted by the light generator 43 passes through the third optical path 53C and is refracted by the first optical lens 54A before being directed towards the first photosensitive device 48A, which then triggers the first photosensitive device 48A.

[0078] While the light generator 43 continues to emit light, the turntable 46 is driven to rotate by the second servo motor 44. After rotating the turntable 46 90° clockwise, the light generator 43 is positioned opposite the second optical path 53B. Light entering the second optical path 53B passes through the first optical lens 54A, then enters the fourth optical path 53D, passes through the third optical lens 54C, and enters the first optical path 53A again, striking the first photosensitive device 48A, which is then triggered. Simultaneously, light reflected from the first optical lens 54A enters the third optical path 53C and is emitted to the second optical lens 54B. Some of this light is reflected by the second optical lens 54B and enters the first optical path 53A before exiting, triggering the fourth photosensitive device 48D. Some light passes through the second optical lens 54B and exits, striking the sixth photosensitive device 48E, which is then triggered. At this moment, the first photosensitive device 48A, the fourth photosensitive device 48D, and the sixth photosensitive device 48E are triggered simultaneously.

[0079] After the second servo motor 44 drives the turntable 46 to rotate one revolution, it obtains three step rotation commands and the corresponding trigger results of the three sets of photosensitive devices 48. It can then be determined that two of the four photoelectric test modules 50 are in the correct order, while the second plug-in post 52B and the third plug-in post 52C are in the wrong position.

[0080] The testing method for splicing errors of other types of plug pins 52 is similar and will not be repeated here.

[0081] With the cooperation of the light generator 43, photosensitive device 48 and photoelectric test module 50, it is possible to quickly determine whether the position and order of the photoelectric test module 50 are correct.

[0082] Example 2

[0083] Each photoelectric test module 50 has resistors with different resistance values ​​inside. After the four photoelectric test modules 50 are combined, two adjacent photoelectric test modules 50 are connected to each other through built-in contact pairs 56, so that the resistors inside the four photoelectric test modules 50 form a ring electrical connection. The outside of the assembly has four outer ring contacts, and the inner wall of the test base 40 corresponding to the mounting groove 47 has four inner ring contacts. When the assembly rotates, the four outer contacts of the assembly and the four contacts of the test base 40 conduct to each other to form an external contact pair 55. The inside of the test base 40 has a loading power supply and a load test terminal. The positive and negative terminals of the loading power supply are electrically connected to two opposing inner ring contacts, and the two measuring terminals of the load test terminal are electrically connected to the other two opposing inner ring contacts, so that the internal resistance of the photoelectric test module 50 forms a bridge circuit with the loading power supply and the load test terminal.

[0084] At this point, the user correctly assembles the photoelectric test module 50 into a bridge circuit, and the voltage value measured at the load test terminal is a set of data. If the photoelectric test module 50 is assembled in the wrong order, other voltage values ​​can be measured at the load test terminal. This method can also quickly determine whether the photoelectric test module 50 is assembled correctly.

[0085] like Figure 15 As shown, this modular testing equipment also includes a control computer 60. The control computer 60 is electrically connected to the first servo motor 14, the second servo motor 44, the through-beam sensor 21, and the photoelectric testing module 50. The control computer 60 uses its built-in program system to control the first servo motor 14 and the second servo motor 44 to perform corresponding actions and to acquire the detection results from the through-beam sensor 21 and the photoelectric testing module 50. The control computer 60 can also input detailed patient information (including but not limited to: name, age, condition, past medical history, family medical history, lifestyle habits, etc.) into the system. The system will conduct in-depth analysis and comprehensive evaluation of this information to form a personalized rehabilitation plan. Staff will use the generated plan to guide the patient through rehabilitation training. During the training, the system will simultaneously upload data and information about the rehabilitation process based on the patient's performance and feedback, allowing the system to analyze the patient's rehabilitation progress and effects in real time. The system will optimize and adjust the rehabilitation plan based on the level of each completed training session and the patient's feedback and performance. In this way, the system can continuously provide patients with the best rehabilitation plan, helping them recover their health faster and improve their quality of life.

[0086] The above content is only a preferred embodiment of the present invention. For those skilled in the art, many changes can be made in the specific implementation and application scope based on the ideas of the present invention. As long as these changes do not depart from the concept of the present invention, they all fall within the protection scope of the present invention.

Claims

1. A modular testing device for cognitive impairment testing, characterized in that: include: A test round table with multiple test positions arranged in a circular array on its tabletop, each of which can be detachably fitted with physical test equipment; A baffle surrounds the outer perimeter of the test round table, and the baffle has an operating window that is higher than the height of the test round table's tabletop, with a through-beam sensor at each of the operating windows; The desktop has a groove corresponding to the test position. A connection box is provided on the first side wall of the groove. A first electrical contact spring is provided on the second side wall of the groove opposite to the first side wall. A second electrical contact spring is provided on the side of the lower part of the physical test device. After the physical test device is inserted into the groove, the first electrical contact spring and the second electrical contact spring are electrically connected. The physical testing equipment includes a test stand and a detachable photoelectric testing module. The shape of the test stand matches the shape of the groove. The top surface of the test stand has a mounting groove, and the interior of the mounting groove has a turntable. The interior of the test stand also has a second servo motor. The power output end of the second servo motor is connected to the lower end of the drive shaft, and the upper end of the drive shaft is connected to the center of the bottom of the turntable. The second servo motor can drive the turntable to rotate. There are four photoelectric testing modules. Each photoelectric testing module includes a mounting plate and a plug-in post. The plug-in post is a quarter-cylinder shape, and the mounting plate is a quarter-circular disc. The four photoelectric testing modules can be assembled into a combination. The bottom of the combination is a columnar structure and the top is a disc-shaped structure. The top surface of the mounting plate has an object mounting structure for mounting physical models. The assembly formed by combining the four photoelectric testing modules can be inserted into the turntable. The photoelectric testing module includes: The first optoelectronic testing module, and the first optical path with a cross shape inside the first optoelectronic testing module; The second photoelectric testing module has a "T"-shaped second optical path inside. The second photoelectric testing module also includes a first optical lens, which is a transparent lens. The first optical lens is located at the junction of the second optical path, and the surface of the first optical lens passes through the axis of the turntable. The third optoelectronic testing module has a cross-shaped third optical path inside. The third optoelectronic testing module also includes a second optical lens, which is a transparent lens. The second optical lens is set at the junction of the third optical path, and the second optical lens is set vertically with one side of its surface facing the axis of the turntable. The fourth optoelectronic testing module has an "L"-shaped fourth optical path inside. The fourth optoelectronic testing module also includes a third optical lens, which is a reflector. The third optical lens is set at the corner of the fourth optical path and is vertically set with its reflective surface facing the axis of the turntable.

2. The modular testing device for cognitive impairment testing according to claim 1, characterized in that: The connecting box is connected to the side wall of the groove via a rotating shaft.

3. The modular testing device for cognitive impairment testing according to claim 1, characterized in that: The test stand has a light generator and several photosensitive devices inside the mounting slot. The photosensitive devices and the light generator are arranged in an array with the axis of the turntable as the center; and the light generator and several photosensitive devices are in the same plane. The light emitted by the light generator is horizontal and directed toward the third photosensitive device.

4. The modular testing device for cognitive impairment testing according to claim 3, characterized in that: The photoelectric testing module has an internal optical path and / or optical lenses; When the photoelectric testing module is inserted into the turntable, the optical path, optical lens, light generator, and photosensitive device are on the same plane; the light emitted by the light generator can be emitted to one or more of the photosensitive devices after passing through the optical path and optical lens. Furthermore, after the photoelectric testing modules are spliced ​​together, the optical paths of the four photoelectric testing modules are interconnected.

5. The modular testing device for cognitive impairment testing according to claim 1, characterized in that: Each of the photoelectric testing modules has resistors with different resistance values ​​inside. When the four photoelectric testing modules are combined, two adjacent photoelectric testing modules are connected to each other through built-in contact pairs, so that the resistors of the four photoelectric testing modules form a ring electrical connection. The assembly has four outer ring contacts on its exterior, and the test socket has four inner ring contacts on the inner wall of the mounting slot. When the assembly rotates, the four outer contacts of the assembly and the four contacts of the test socket are interconnected to form an external contact pair. The test socket has a power supply and a load test terminal inside. The positive and negative terminals of the power supply are electrically connected to two opposing inner ring contacts, and the two measuring terminals of the load test terminal are electrically connected to the other two opposing inner ring contacts, so that the internal resistance of the photoelectric test module forms a bridge circuit with the power supply and the load test terminal.

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