Boost device, correction value detection information generation device, temperature estimation device, internal resistance estimation device, boost method, correction value detection information generation method, and program

Abstract

A step-up device is provided with a control unit (3) that performs feedback control on the basis of a correction inductor current value and a voltage value between input terminals and output terminals of a step-up chopper circuit (2). The switching element is driven so as to approach a predetermined control target value and so as to coincide with a phase amount obtained by dividing the phase difference of the respective drive phases of the booster circuits driven at the same switching cycle by 360 DEG by the number of booster circuits. The corrected inductor current value is obtained by applying a current correction value to a sample current value obtained by sampling a measured inductor current value at a constant sampling interval. The current correction value corrects a difference between an average value of a sample current value, which is a difference generated according to the number of booster circuits (13A, 13B), and an average value of an actual inductor current value, which is a true value of a current flowing through the inductor.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to a voltage boosting device, an information generation device for correction value detection, a temperature estimation device, an internal resistance estimation device, a voltage boosting method, an information generation method for correction value detection, and a program.

[0002] This application claims priority based on Japanese Patent Application No. 2023-065808 filed on April 13, 2023, and the content thereof is hereby incorporated by reference. BACKGROUND

[0003] Figure 15 is a block diagram indicating an example of a voltage boosting device 200 called a so-called voltage booster. The voltage boosting device 200 is connected with an electric accumulator at input terminals 201-1, 201-2, for example, and outputs a voltage value V2 boosted from a voltage value V1 supplied from the electric accumulator from output terminals 210-1, 210-2. The mechanism of the voltage boosting performed by the voltage boosting device 200 is as follows.

[0004] When the switching element 203 is made to be on, a current flows in a path via the input terminal 201-1, the inductor 202, the switching element 203 to the input terminal 201-2 by the voltage value V1 supplied to the input terminals 201-1, 201-2. As the current flowing in this path increases, energy is accumulated in the inductor 202. When the switching element 203 is made to be off after the energy is accumulated in the inductor 202, the path of the current is switched to a path via a load connected between the input terminal 201-1, the inductor 202, the diode 204, the output terminals 210-1, 210-2 to the input terminal 201-2. In this case, the inductor 202 releases the energy, and thus a voltage value V2 higher than the voltage value V1 between the input terminals 201-1, 201-2 is generated between the output terminals 210-1, 210-2.

[0005] In such a voltage boosting device 200, feedback control that determines the timing of the on and off of the switching element 203 is performed, for example, so that the voltage value V2 between the output terminals 210-1, 210-2 becomes a target voltage value. In order to improve the responsiveness of this feedback control, the current value of the current flowing in the inductor 202 is detected by a sensor circuit 206, for example. In order to remove noise present in the circuit of the voltage boosting device 200, the analog data of the current value detected by the sensor circuit 206 is low-pass filtered by a filter circuit 207 after being supplied to an AD (Analog-to-Digital) conversion section 221 of a control section 220.

[0006] The AD conversion unit 221 samples the filtered analog current data at a constant sampling interval, converts it into digital data, and outputs it to the control signal generation unit 222. Based on the digital current data and the target voltage value, the control signal generation unit 222 calculates the timing for turning on and off the switching element 203 to make the voltage value V2 approach the target voltage value.

[0007] Existing technical documents

[0008] Patent documents

[0009] Patent Document 1: Japanese Re-publication No. WO2018 / 070012 Summary of the Invention

[0010] The problem that the invention aims to solve

[0011] Figure 16 This is a graph showing the changes in various current values ​​observed in inductor 202. Figure 16 In the diagram, the vertical axis represents the current value in units of [A], and the horizontal axis represents the elapsed time in units of "μs (microseconds)". Ts is the switching cycle. The current value on the vertical axis increases upwards, and the elapsed time on the horizontal axis increases to the right.

[0012] Graph 231 shows the change in the actual current value flowing through inductor 202, which cannot be directly measured. Graph 232 shows the change in the current value detected by sensor circuit 206. Graph 233 shows the change in the current value after filtering by filter circuit 207. Graph 234 shows the change in the current value after sampling graph 233 by AD converter 221. It should be noted that, as... Figure 16 As shown, the sampling timing of the AD converter 221 is the times of "sampling t1", "sampling t2", "sampling t3", and "sampling t4". The current value at the intersection of this time and curve 233 becomes the current value of curve 234. At the times of "sampling t1", "sampling t2", "sampling t3", and "sampling t4", the time between adjacent times is constant, and this interval becomes the sampling interval of the AD converter 221.

[0013] like Figure 15 As shown in the boost device 200, in the case of a single-phase boost chopper where there is only one set of inductor 202 and switching element 203, the average value of the curve 231 representing the change in the actual current value flowing through the inductor 202 (hereinafter referred to as the actual current average value) and the average value of the curve 234 representing the change in the current value output by the AD conversion unit 221 (hereinafter referred to as the sample current average value) are both the values ​​shown by reference numeral 235.

[0014] On the contrary, for example, a boost chopper having a plurality of phases in which a plurality of combinations of inductors and switching elements exist is known as disclosed in Patent Literature 1. In the case of such a multi-phased boost chopper, the shape of the waveform of the current flowing through the inductor of each phase becomes a complicated shape, and the actual current average value and the sample current average value do not coincide with each other except in a particular case. Therefore, the current value flowing through the inductor cannot be obtained with high precision, and thus there is a problem in that good performance cannot be obtained in terms of responsiveness, convergence, and the like of feedback control.

[0015] The difference between the actual current average value and the sample current average value varies depending on the so-called operating point of operation, and more specifically, depending on the waveform of the current flowing through the inductor. Therefore, it is difficult to compensate for this difference by a simple method such as offset correction in which a constant value is added for correction. For example, as a method of solving the above problem, there is a method in which a current measurement circuit having a large time constant and a slow response is used instead of the high-speed sensor circuit 206 and the filter circuit 207 provided for each phase for control. If this method is used, the change in the graph 233 indicating the change in the current value after the filtering process by the filter circuit 207 becomes gentle, and the difference between the actual current average value and the sample current average value can be reduced. However, in the current measurement circuit having a large time constant and a slow response, there is another problem in that it cannot follow the speed required in feedback control.

[0016] The present disclosure was completed in view of the above circumstances, and aims to provide a boost device, a correction value detection information generation device, a temperature estimation device, an internal resistance estimation device, a boost method, a correction value detection information generation method, and a program in which, in a multi-phased boost chopper circuit, while a current measurement circuit capable of following the speed required in feedback control is used, feedback control with good controllability can be performed.

[0017] Means for solving the problem

[0018] To address the aforementioned issues, one embodiment of the present disclosure provides a boost device comprising: a multiphase boost chopper circuit formed by multiple boost circuits each having an inductor and a switching element, and a smoothing capacitor; multiple current measurement circuits that measure the current flowing through each of the inductors to obtain a measured inductor current value; and a control unit that drives the switching element in a manner close to a predetermined control target value and consistent with a phase quantity obtained by dividing the phase difference 360° between the driving phases of the boost circuits driven in the same switching cycle by the number of boost circuits, based on feedback control of the corrected inductor current value and the voltage values ​​between the input and output terminals of the boost chopper circuits. The corrected inductor current value is obtained by applying a current correction value relative to a sample current value obtained by sampling the measured inductor current value at a constant sampling interval. The current correction value corrects for the difference arising from the number of boost circuits, i.e., the difference between the average value of the sample current values ​​and the average value of the actual inductor current values, which is the true value of the current flowing through the inductors.

[0019] Invention Effects

[0020] According to the various embodiments of this disclosure, in a multiphase boost chopper circuit, good controllability feedback control can be performed while using a current measurement circuit capable of following the speed required in feedback control. Attached Figure Description

[0021] Figure 1 This is a circuit diagram and a summary block diagram of the functional parts of the boost device according to this embodiment.

[0022] Figure 2 This is a graph showing the changes in various current values ​​observed in the reactor of the boost device in this embodiment.

[0023] Figure 3 This diagram shows an example of the calibration table data stored in the storage unit of the boost device in this embodiment.

[0024] Figure 4 This is a schematic block diagram showing the structure of the information generation device for correction value detection in this embodiment.

[0025] Figure 5 This is a flowchart illustrating the processing flow of the information generation device for calibration value detection in this embodiment.

[0026] Figure 6 This is a diagram (first example) showing an example of a boost chopper circuit model determined in the actual current estimation unit of the correction value detection information generation device in this embodiment.

[0027] Figure 7 is a diagram showing an example of a boost chopper circuit model formula determined in the actual current estimation section included in the correction value detection information generation device of the present embodiment.

[0028] Figure 8 is a diagram showing a process in which the actual current estimation section included in the correction value detection information generation device of the present embodiment calculates an estimated actual reactor current value.

[0029] Figure 9 is a circuit diagram showing an example of a current measurement circuit included in the boost device of the present embodiment.

[0030] Figure 10 is a diagram showing a functional block diagram of the control signal generation section included in the boost device of the present embodiment and a block line diagram showing feedback control performed by the control signal generation section.

[0031] Figure 11 is a diagram showing an example of correction using a current correction value based on the control signal generation section included in the boost device of the present embodiment.

[0032] Figure 12 is a diagram showing an example of a boost chopper circuit model formula determined in the actual current estimation section included in the correction value detection information generation device of another structure example of the present embodiment.

[0033] Figure 13 is a diagram showing an example of a use mode of a temperature estimation device used in connection with the boost device of the present embodiment.

[0034] Figure 14 is a diagram showing an example of a use mode of an internal resistance estimation device used in connection with the boost device of the present embodiment.

[0035] Figure 15 is a diagram showing the overall structure of a boost device generally called a boost chopper.

[0036] Figure 16 is a diagram showing a curve graph showing changes in various current values observed in an inductor of a boost device generally called a boost chopper. DETAILED DESCRIPTION

[0037] Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. Note that the same reference signs are used for the same or corresponding structures in each drawing, and the description will be appropriately omitted.

[0038] Figure 1 is a diagram showing a circuit diagram of the boost device 1 of the present embodiment and a functional block diagram showing an outline of the functional sections. Figure 2is a graph showing graphs 24 to 27 that show changes in various current values observed in the reactor 12A of the voltage-boosting device 1 of the present embodiment. Figure 3 is a graph showing an example of the correction table group data 7A stored in the storage section 6 of the voltage-boosting device 1 of the present embodiment. Figure 4 is a schematic block diagram showing the structure of the correction value detection information generation device 40 of the present embodiment. Figure 5 is a flowchart showing the processing flow of the correction value detection information generation device 40 of the present embodiment. Figure 6 、 Figure 7 is a graph showing an example of the voltage-boosting chopper circuit model formula determined in the actual current estimation section 41 included in the correction value detection information generation device 40 of the present embodiment. Figure 8 is a graph showing the process in which the actual current estimation section 41 included in the correction value detection information generation device 40 of the present embodiment calculates the estimated actual reactor current value. Figure 9 is a circuit diagram showing an example of the current measurement circuit 16A, 16B included in the voltage-boosting device 1 of the present embodiment. Figure 10 is a graph showing a schematic block diagram of the control signal generation section 5 included in the voltage-boosting device 1 of the present embodiment and a block line graph showing the feedback control performed by the control signal generation section 5. Figure 11 is a graph showing an example of the correction using the current correction value of the control signal generation section 5 included in the voltage-boosting device 1 of the present embodiment. Figure 12 is a graph showing an example of the voltage-boosting chopper circuit model formula determined in the actual current estimation section 41 included in the correction value detection information generation device 40 of the other structure example of the present embodiment. Figure 13 is a graph showing an example of the usage mode of the temperature estimation device 110 used in connection with the voltage-boosting device 1 of the present embodiment. Figure 14 is a graph showing an example of the usage mode of the internal resistance estimation device 120 used in connection with the voltage-boosting device 1 of the present embodiment.

[0039] (Overall structure of voltage-boosting device)

[0040] As shown in Figure 1 , the voltage-boosting device 1 includes a portion of a circuit and a portion of a functional section that controls the circuit. In the voltage-boosting device 1, the portion of the circuit includes the input terminal 10, the capacitor 11, the voltage-boosting circuits 13A, 13B, the current measurement circuits 16A, 16B, the smoothing capacitor 19, and the output terminal 20. In addition, in the voltage-boosting device 1, the portion of the functional section that controls the circuit includes the control section 3 and the storage section 6. Note that, in the present embodiment, the portion of the circuit and the portion of the functional section are separated from each other. Figure 1 In the present embodiment, the wirings within the portion of the circuit and the portion of the functional section of the voltage-boosting device 1 are represented by solid lines, and the wirings between the portion of the circuit and the portion of the functional section are represented by dashed lines.

[0041] The input terminal 10 has a pair of input terminals 10-1, 10-2. The input terminal 10 is connected to, for example, an electric power storage device. Hereinafter, the voltage value between the input terminals 10 is referred to as a voltage value VI. The output terminal 20 has a pair of output terminals 20-1, 20-2. The output terminal 20 is connected to, for example, a load. Hereinafter, the voltage value between the output terminals 20 is referred to as a voltage value V2.

[0042] The step-up circuit 13A has the reactor 12A, the switching elements 14A-U, 14A-L, and the freewheeling diodes 15A-U, 15A-L. The step-up circuit 13B has the reactor 12B, the switching elements 14B-U, 14B-L, and the freewheeling diodes 15B-U, 15B-L.

[0043] The reactor 12A and the reactor 12B are elements that realize the property of inductance, and are a kind of inductor. The reactor 12A and the reactor 12B are magnetically coupled to each other, and form a magnetically coupled reactor 12 that exists across the step-up circuit 13A and the step-up circuit 13B. By magnetically coupling the reactor 12A and the reactor 12B, the effect of mutual inductance can be obtained, and thus the size of the reactors 12A, 12B can be reduced. One end of the reactor 12A is connected to the input terminal 10-1, and the other end is connected to the switching elements 14A-U, 14A-L. One end of the reactor 12B is connected to the input terminal 10-1, and the other end is connected to the switching elements 14B-U, 14B-L.

[0044] The switching elements 14A-U, 14A-L, 14B-U, 14B-L are, for example, IGBTs (Insulated Gate Bipolar Transistors). The collector terminals of the switching elements 14A-U, 14B-U that are the upper arms are connected to the output terminal 20-1. The emitter terminals of the switching elements 14A-L, 14B-L that are the lower arms are connected to the input terminal 10-2 and the output terminal 20-2. The emitter terminals of the switching elements 14A-U, 14B-U of the upper arms are each connected to the collector terminal of the switching element 14A-L, 14B-L of the lower arm corresponding thereto, and to the other end of the reactor 12A, 12B corresponding thereto.

[0045] The switching elements 14A-L, 14B-L of the lower arm mainly function to step up the voltage value V1 between the input terminals 10 to the voltage value V2 in a state in which the electric power supplied from the electric accumulator connected to the input terminals 10 to the load connected to the output terminals 20 is consumed by the motoring of the load in the direction of the current flowing through the reactors 12A, 12B from one end connected to the input terminals 10 to the other end. In contrast to this, the switching elements 14A-U, 14B-U of the upper arm mainly function to step down the voltage value V2 between the output terminals 20 to the voltage value V1 in a state in which the electric power returned from the load connected to the output terminals 20 is regenerated to the electric accumulator connected to the input terminals 10 in the direction of the current flowing through the reactors 12A, 12B opposite to the motoring.

[0046] The free-wheel diodes 15A-U, 15A-L, 15B-U, 15B-L are connected to the respective switching elements 14A-U, 14A-L, 14B-U, 14B-L so that the cathode terminals are connected to the collector terminals and the anode terminals are connected to the emitter terminals.

[0047] The current measuring circuit 16A has the sensor circuit 17A and the filter circuit 18A, and measures the current value. The sensor circuit 17A is inserted into the wiring connected between the connection point connecting the emitter terminal of the switching element 14A-U and the collector terminal of the switching element 14A-L and the other end of the reactor 12A, and detects the current value of the current flowing through the wiring. The current measuring circuit 16B has the sensor circuit 17B and the filter circuit 18B, and measures the current value. The sensor circuit 17B is inserted into the wiring connected between the connection point connecting the emitter terminal of the switching element 14B-U and the collector terminal of the switching element 14B-L and the other end of the reactor 12B, and detects the current value of the current flowing through the wiring.

[0048] The current value detected by each of the sensor circuits 17A, 17B is analog data of a continuous value, and noise is superimposed thereon. The filter circuits 18A, 18B are, for example, low-pass filters, and are connected to the respective sensor circuits 17A, 17B. The filter circuits 18A, 18B filter the analog data of the current value output from the respective sensor circuits 17A, 17B connected thereto, and remove the noise superimposed on the analog data.

[0049] Hereinafter, the current value detected and output by the sensor circuits 17A, 17B will be referred to as a sensor reactor current value, and the current value output after being filtered by the filter circuits 18A, 18B will be referred to as a measured reactor current value. In contrast to this, the current value of the actual current flowing through the reactors 12A, 12B, i.e., the true value of the current flowing through the reactors 12A, 12B, which cannot be directly measured, will be referred to as an actual reactor current value.

[0050] In the voltage boosting device 1, the voltage boosting circuit 13A and the voltage boosting circuit 13B are connected in parallel with respect to the output terminal 20, and a so-called two-phase voltage boosting chopper circuit 2 is formed by the input terminal 10, the capacitor 11, the voltage boosting circuits 13A, 13B, the smoothing capacitor 19, and the output terminal 20. Hereinafter, the voltage boosting circuit 13A will also be referred to as the A phase, and the voltage boosting circuit 13B will also be referred to as the B phase. The control section 3 performs interleaved control so that the phase difference between the drive phase of the voltage boosting circuit 13A and the drive phase of the voltage boosting circuit 13B becomes 360° / the number of phases. In the case of the voltage boosting device 1, since it is two-phase, interleaved control is performed in such a manner that the phase difference becomes 360° / 2 = 180°. By multiphasing, load dispersion is performed, and by interleaved control, it is possible to downsize the smoothing capacitor 19.

[0051] The control section 3 is provided with an AD conversion section 4A for the A phase, an AD conversion section 4B for the B phase, and a control signal generation section 5. The AD conversion section 4A is connected to the filter circuit 18A. The AD conversion section 4B is connected to the filter circuit 18B. The AD conversion sections 4A, 4B respectively sample and convert the analog data of the measured reactor current value output from the filter circuits 18A, 18B connected thereto into digital data at a predetermined constant sampling interval. Hereinafter, the measured reactor current value converted into digital data by the AD conversion sections 4A, 4B will be referred to as a sample current value.

[0052] Here, the voltage boosting device 1 will be specifically described as an example in order to describe the problem occurring in the above-described voltage boosting chopper circuit having a plurality of phases. Figure 2 is a graph showing the change in the current value of the current flowing in the reactor 12A of the A phase in the voltage boosting device 1, that is, the actual reactor current value, the sensor reactor current value output from the sensor circuit 17A, the measured reactor current value output from the filter circuit 18A, and the sample current value output from the AD conversion section 4A. In Figure 2 In the graph, the vertical axis is the axis of the current value represented by the unit [A], and the horizontal axis is the axis of the elapsed time represented by the unit "μs".

[0053] The graph 24 is a graph showing the change in the actual reactor current value. The graph 25 is a graph showing the change in the sensor reactor current value. The graph 26 is a graph showing the change in the measured reactor current value. The graph 27 is a graph showing the change in the sample current value. In Figure 2 In the graph, Ts is the switching period, and Figure 2In this circuit, the period from 0 to Ts [μs] constitutes one switching cycle, and the period from Ts to 2Ts [μs] constitutes the next switching cycle. The sampling interval of the AD conversion unit 4A is half of the switching cycle Ts, i.e., Ts / 2. The sampling timing is determined by offsetting the start time, mid time, and end time of the switching cycle Ts by Tsample [μs]. Here, the mid time is the time obtained by adding half of the switching cycle Ts to the start time. More specifically, Figure 2 The four times indicated by reference numeral 31 (0.5Ts-Tsample[μs]), reference numeral 32 (Ts-Tsample[μs]), reference numeral 33 (1.5Ts-Tsample[μs]), and reference numeral 34 (2Ts-Tsample[μs]) are called the sampling timings.

[0054] Since the phase difference between the driving phase of boost circuit 13A and the driving phase of boost circuit 13B is 180°, the switching period Ts shifts by half a cycle in phases A and B. Therefore, when reactors 12A and 12B are identical, current measuring circuits 16A and 16B are identical, and AD converters 4A and 4B are identical, the changes in the actual reactor current value, sensor reactor current value, measured reactor current value, and sample current value in phase B become... Figure 2 The changes in phase A after time 0.5T [μs] are represented as changes after time 0 [μs].

[0055] like Figure 2 As shown, in one switching cycle Ts, curve 24, representing the change in the actual reactor current value, is point-symmetric in the first and second half of the cycle. Therefore, the average value of curve 24 is 0A. In contrast, in the case of curve 27, representing the change in the sample current value, except where the voltage value V2 is twice the voltage value V1, the average value is not 0A, as indicated by reference numeral 29, resulting in a difference between the average value of the actual reactor current and the average value of the sample current.

[0056] To compensate for this difference, such as Figure 1 As shown, the storage unit 6 of the boost device 1 pre-stores calibration table data 7A for phase A and calibration table data 7B for phase B. Calibration table data 7A contains... Figure 3 The data shown are from multiple calibration tables 7A-1, 7A-2, 7A-3, ... Calibration tables 7A-1, 7A-2, 7A-3, ... are all tables of the same format, generated according to different voltage values ​​V2. Here, as an example, the format of calibration table 7A-1 will be explained.

[0057] like Figure 3 As shown, correction table 7A-1 is, for example, a table for voltage value V2 = 600V. In the upper left item, the voltage value V2 = 600V is written as an index so that it can be retrieved based on the voltage value V2. Correction table 7A-1 is a matrix-form table with power value P items horizontally and voltage value V1 items vertically. The horizontal power value P items have multiple power value sub-items expressed in units of [kW], and the vertical voltage value V1 items have multiple voltage value sub-items expressed in units of [V]. Current correction values ​​are written into the elements of the matrix determined by the power value sub-items and voltage value sub-items. For example, in the elements of the matrix determined by the power value "30kW" of the horizontal power value P sub-item and the voltage value "385V" of the vertical voltage value V1 sub-item, the current correction value "1.2" for the case of power value P = 30kW, voltage value V1 = 385V, and voltage value V2 = 600V is written.

[0058] In the calibration table group data 7A used for each phase A and the calibration table group data 7B used for each phase B, the calibration tables 7A-1, 7A-2, 7A-3, ... contained therein have the same table format as the calibration tables 7A-1, 7A-2, 7A-3, ...

[0059] return Figure 1 The boost converter 1 includes a first voltage measuring circuit for measuring the voltage value V1 between input terminals 10 (not shown) and a second voltage measuring circuit for measuring the voltage value V2 between output terminals 20. The first and second voltage measuring circuits are connected to a control signal generation unit 5. The control signal generation unit 5 acquires the voltage value V1 measured by the first voltage measuring circuit, the voltage value V2 measured by the second voltage measuring circuit, and the sample current values ​​of phase A and phase B output by the AD conversion units 4A and 4B.

[0060] The control signal generation unit 5 also acquires the target voltage value tr-V2, which is the target value of voltage value V2, provided from the outside, the power value P supplied by the battery connected to the input terminal 10, and the switching cycle Ts. Here, "provided from the outside" may be, for example, data or information supplied through user input operations, or data or information stored in an external storage device.

[0061] The target voltage value tr-V2 and the switching period Ts are predetermined constant values. The power value P is a known constant value obtained as information representing the performance of the energy storage device connected to the input terminal 10. Based on the acquired voltage values ​​V1 and V2 and the acquired power value P, the control signal generation unit 5 detects the current correction value for phase A and the current correction value for phase B according to the correction table data 7A and correction table data 7B stored in the storage unit 6.

[0062] The control signal generating section 5 adds the detected current correction value of the A phase to the acquired sample current value of the A phase to obtain a sum value as the corrected reactor current value of the A phase. The control signal generating section 5 adds the detected current correction value of the B phase to the acquired sample current value of the B phase to obtain a sum value as the corrected reactor current value of the B phase.

[0063] The control signal generating section 5 drives with the switching period Ts based on the acquired voltage values V1, V2, the corrected reactor current values of the A phase and the B phase, the target voltage value tr-V2, and the switching period Ts, and calculates the timings of turning on and off of the respective switching elements 14A-U, 14A-L, 14B-U, 14B-L so as to make the voltage value V2 approach the target voltage value tr-V2. The control signal generating section 5 outputs the control signals indicating the calculated timings of turning on and off of the respective switching elements 14A-U, 14A-L, 14B-U, 14B-L to the gate terminals of the respective switching elements 14A-U, 14A-L, 14B-U, 14B-L, respectively.

[0064] (Overall structure of correction value detection information generating device)

[0065] Figure 4 is a block diagram showing the structure of a correction value detection information generating device 40 that generates information for detecting the correction table group data 7A, 7B, i.e., the current correction values, stored in the storage section 6 of the voltage boosting device 1, i.e., correction value detection information. The correction value detection information generating device 40 is provided with an actual current estimating section 41, a measured current estimating section 42, a sample current estimating section 43, and an information generating section 44.

[0066] The actual current estimating section 41 acquires, for example, a reactor characteristic value of the reactor 12A, 12B of the voltage boosting device 1 provided from the outside. Here, the reactor characteristic value is, for example, a value represented by both of the inductance value L and the coupling coefficient k of the reactor 12A, 12B represented in units of μH. The inductance value of the reactor 12A, 12B varies depending on the power value P. However, here, the reactor 12A and the reactor 12B are the same reactor. Therefore, the variation of the inductance value corresponding to the power value P in the reactor 12A and the reactor 12B is also the same. Therefore, the actual current estimating section 41 acquires, for example, a reactor characteristic value in which a plurality of power values P and a plurality of inductance values L corresponding to the respective power values P, i.e., the inductance values common to the reactor 12A and the reactor 12B are associated in a form.

[0067] The actual current estimation section 41 acquires a switching period Ts of the voltage boosting device 1 supplied from the outside. The switching period Ts is a value indicated by a unit [μs]. The actual current estimation section 41 acquires a plurality of parameters supplied from the outside. The parameters are generated by combining three values each of which is selected from a plurality of voltage values V1, a plurality of voltage values V2, and a plurality of power values P determined from an arbitrary numerical range at an arbitrary numerical interval, respectively. The plurality of parameters are generated in a manner in which the combinations of V1, V2, and P do not repeat among all the parameters. The numerical values of the voltage values V1 and V2 included in the parameters are values indicated by a unit [V], and the power value P is a value indicated by a unit [kW]. Note that the actual current estimation section 41 can also generate the parameters by itself.

[0068] The actual current estimation section 41 calculates, for each parameter, an estimated value of the actual reactor current value of each of the reactors 12A and 12B, i.e., an estimated actual reactor current value, on the basis of the acquired reactor characteristic value, the switching period Ts, the plurality of parameters, and a voltage boosting chopper circuit model formula modeling a voltage boosting chopper circuit 2 determined in advance.

[0069] The measured current estimation section 42 acquires a current measurement circuit time constant supplied from the outside. Here, the current measurement circuit time constant refers to the time constant of each of the sensor circuits 17A and 17B and the time constant of each of the filter circuits 18A and 18B included in the current measurement circuits 16A and 16B. The time constant is a value indicated by a unit [s (second)].

[0070] The measured current estimation section 42 calculates, for each parameter, an estimated measured reactor current value of the A phase and an estimated measured reactor current value of the B phase on the basis of the acquired current measurement circuit time constant and a current measurement circuit model formula modeling the current measurement circuits 16A and 16B, from the estimated actual reactor current values of the A phase and the B phase calculated by the actual current estimation section 41.

[0071] The sample current estimation section 43 acquires a detection timing and the switching period Ts supplied from the outside. Here, the detection timing is, for example, a value indicated by a unit "μs", and the maximum value of the absolute value is a positive value or a negative value that is less than half of the switching period Ts, or can be 0. The value indicated by the detection timing is determined in advance in a manner in which the sampling timing of the processing of sampling performed by the sample current estimation section 43 coincides with the sampling timing of each of the AD conversion sections 4A and 4B of the voltage boosting device 1. Here, it is assumed that the sampling timings of the AD conversion sections 4A and 4B of the voltage boosting device 1 are the same. Therefore, the sample current estimation section 43 acquires one detection timing common to the A phase and the B phase supplied from the outside.

[0072] The sample current estimation section 43, based on the acquired detection timing and the switching period Ts, sets, as the sampling timings, the times calculated by adding the detection timing to the start timing, the center timing, and the end timing of each switching period Ts, respectively. The sample current estimation section 43, in accordance with the calculated sampling timings, samples the estimated measurement reactor current values of the A phase and the B phase calculated by the measurement current estimation section 42, respectively, and extracts, for each parameter, the estimated value of the sample current value corresponding to the reactor 12A, that is, the estimated sample current value of the A phase, and the estimated value of the sample current value corresponding to the reactor 12B, that is, the estimated sample current value of the B phase.

[0073] The information generation section 44, based on the estimated actual reactor current value of each parameter of the A phase calculated by the actual current estimation section 41 and the estimated sample current value of each parameter of the A phase extracted by the sample current estimation section 43, calculates, for each parameter, the current correction value of the A phase. The information generation section 44, based on the estimated actual reactor current value of each parameter of the B phase calculated by the actual current estimation section 41 and the estimated sample current value of each parameter of the B phase extracted by the sample current estimation section 43, calculates, for each parameter, the current correction value of the B phase. The information generation section 44 generates the correction table group data 7A in accordance with the calculated current correction value of each parameter of the A phase, and generates the correction table group data 7B in accordance with the calculated current correction value of each parameter of the B phase.

[0074] (Processing of the information generation apparatus for correction value detection)

[0075] Figure 5 is a flowchart showing the processing flow of the information generation apparatus for correction value detection 40. The actual current estimation section 41 acquires the reactor characteristic value provided from the outside, the switching period Ts, and the plurality of parameters. The measurement current estimation section 42 acquires the current measurement circuit time constant, that is, the time constant of the sensor circuit 17A, 17B and the time constant of the filter circuit 18A, 18B provided from the outside. The sample current estimation section 43 acquires the detection timing and the switching period Ts provided from the outside. The sample current estimation section 43 calculates the sampling timing common to the A phase and the B phase based on the acquired detection timing and the switching period Ts (S1).

[0076] (Boost chopper circuit model expression)

[0077] The boost chopper circuit model expression, which models the boost chopper circuit 2 in advance in the actual current estimation section 41, will be described. The boost chopper circuit model expression is, specifically, an expression shown in the following formula (1), the formulas (2) to (5) shown in the following formula (2) to (5), Figure 6 Figure 7 , a program language form of the formulas, and the formulas (6) to (10) shown in the following formula (6) to (10).

[0078] [Mathematical formula 1]

[0079] ​

[0080] Formula (1) is a formula for calculating the on-duty of the switching elements 14A-L, 14B-L of the lower arm. In Formula (1), V1 and V2 are the voltage value V1 and the voltage value V2 included in the parameters acquired by the actual current estimation section 41.

[0081] Figure 6 is the current value I of the current flowing through the reactor 12A of phase A that indicates each combination of the state in which the switching elements 14A-L, 14B-L of the lower arm are turned on and off. LA the differential dI LA / dt of Formulae (2) to (5). Note that Formulae (2) to (5) are formulas in the case where the inductance values of the reactors 12A, 12B are the same "L". In Formulae (2) to (5), M is the mutual inductance value, which is a value calculated using the inductance value L and the coupling coefficient k included in the reactor characteristic value as M = k x L.

[0082] As shown in Figure 6 , hereinafter, each combination of the state in which the switching elements 14A-L, 14B-L of the lower arm are turned on and off is also referred to as a mode. "Mode 1" is a mode in which the switching element 14A-L is turned on and the switching element 14B-L is turned off. "Mode 2" is a mode in which the switching element 14A-L is turned off and the switching element 14B-L is turned on. "Mode 3" is a mode in which both of the switching elements 14A-L, 14B-L are turned off. "Mode 4" is a mode in which both of the switching elements 14A-L, 14B-L are turned on.

[0083] The dI LA / dt of the current value I LA indicates the rate of increase of the current value I LA . Therefore, Figure 6 Formulae (2) to (5) shown in Figure 6 are formulas that indicate the rate of increase of the current value I LA in each of Mode 1 to Mode 4. In Figure 6 , the differential dI LB / dt of the current value I LB of the current flowing in the reactor 12B of phase B is not shown, but the formulas of the states of Mode 1 and Mode 2 of dI LB / dt are opposite to those of phase A. That is, in the case of Mode 1, dI LB / dt is indicated by the right side of Formula (3), and in the case of Mode 2, dI LB / dt is indicated by the right side of Formula (2). Mode 3 and Mode 4 are the same as those of phase A, and dI LA / dt = dILB / dt.

[0084] One switching cycle Ts is divided into four intervals. The time of each boundary of the four intervals becomes the switching timing of the state switching of the turn-on and turn-off of the switching elements 14A-L, 14B-L of the lower arm. In Figure 7 In FIG. 7, the step of calculating the time length of each of the four intervals divided based on the "duty" calculated by the equation (1), that is, the turn-on duty of the switching elements 14A-L, 14B-L of the lower arm, and the step of indicating which mode of Mode1 to Mode4 is allocated to each of the four intervals are shown.

[0085] Hereinafter, each of the intervals when the switching cycle Ts is divided into four intervals is referred to as Area (1), Area (2), Area (3), Area (4) in the order of time series. In addition, the time length of each of Area (1), Area (2), Area (3), Area (4) is indicated by the variables T(1), T(2), T(3), T(4). In addition, the mode allocated to each of Area (1), Area (2), Area (3), Area (4) is indicated by the variables Mode(1), Mode(2), Mode(3), Mode(4).

[0086] As shown by the reference numeral 51, in the case of "duty > 0.5", the time length substituted into the variables T(1), T(2), T(3), T(4) corresponding to Area (1), Area (2), Area (3), Area (4) is calculated by the four equations shown by the reference numeral 52. By the four equations shown by the reference numeral 53, 1, 4, 2, 4, that is, Mode1, Mode4, Mode2, Mode4 is allocated to the variables Mode(1), Mode(2), Mode(3), Mode(4) corresponding to Area (1), Area (2), Area (3), Area (4), respectively.

[0087] On the other hand, as shown by the reference numeral 54, in the case of "duty < 0.5", the time length substituted into the variables T(1), T(2), T(3), T(4) corresponding to Area (1), Area (2), Area (3), Area (4) is calculated by the four equations shown by the reference numeral 55. By the four equations shown by the reference numeral 56, 1, 3, 2, 3, that is, Mode1, Mode3, Mode2, Mode3 is allocated to the variables Mode(1), Mode(2), Mode(3), Mode(4) corresponding to Area (1), Area (2), Area (3), Area (4), respectively.

[0088] Note that, although in Figure 7not shown, but in the case of "duty = 0.5", in the case where the switching elements 14A-L are turned on, the switching elements 14B-L are turned off, in the case where the switching elements 14A-L are turned off, the switching elements 14B-L are turned on, neither the switching elements 14A-L nor the switching elements 14B-L are turned on or off. Therefore, it is possible to adopt Figure 7 the step of "duty > 0.5", or the step of "duty < 0.5". In either case, T(2), T(4) become "0", as a result, either of Mode 1 or Mode 2 is performed by the switching elements 14A-L, 14B-L.

[0089] The following equation (6) is a formula for calculating the average value of the current flowing through each of the reactors 12A, 12B, that is, the current average value I ave In the equation (6), P and V1 are the power value P and the voltage value V1 included in the parameters acquired by the actual current estimation section 41, respectively. P / V1 on the right side of the equation (6) is a formula for calculating the current value of the current supplied from the input terminal 10-1 of the voltage-boosting device 1. P / V1 is 0.5 times because, in an ideal state, the current supplied from the input terminal 10-1 is equally distributed to the two reactors 12A, 12B. In the equation (6), it is finally set to 1000 times because the calculated current average value I ave is set to a value expressed in units of [A] since the power value P is expressed in units of "kW".

[0090] [Equation 2]

[0091]

[0092] The following equations (7) to (10) are formulas for calculating the current values I end（1） , I end（2） , I end（3） , I end（4） flowing through each of the reactors 12A, 12B at the end time of the region (1), the region (2), and the region (4), respectively.

[0093] [Equation 3]

[0094]

[0095] [Equation 4]

[0096]

[0097] [Equation 5]

[0098]

[0099] [Equation 6]

[0100]

[0101] The operator Im (Mode (X)) shown in the formulas (7) to (10) (where X = any one of 1, 2, 3, 4) is an operator that means the current increase rate of the current flowing through the reactor 12A, 12B in the mode shown by Mode (X). For example, in the case where the operations of the formulas (7) to (10) are performed for the A phase, in the case of Im (Mode (3)) and Mode (3) = 2, this Im (Mode (3)) indicates the current increase rate of Mode 2 of the A phase, that is, Figure 6 the formula (3).

[0102] Next, the processing performed by the actual current estimation section 41 using the above-mentioned step-up chopper circuit model formula will be described with reference to Figure 8 Figure 8 The graph 60 shown in the drawing is a graph represented by data in which the estimated actual reactor current values calculated by the actual current estimation section 41 in the case where the "duty" calculated by the formula (1) is a value larger than 0.5 are arranged in time series. Note that, in the drawing, the horizontal axis is elapsed time represented by unit [μs], and the vertical axis is current value represented by unit [A]. The current value of the vertical axis becomes larger toward the upper side, and the elapsed time of the horizontal axis becomes larger toward the right side. Figure 8

[0103] The actual current estimation section 41 selects any one of the plurality of parameters acquired in the processing of S1. The actual current estimation section 41 calculates the "duty" by the formula (1) based on the voltage values V1, V2 included in the selected parameter. Here, the actual current estimation section 41 calculates the duty of a value larger than 0.5 (S2). The actual current estimation section 41 selects the inductance value L corresponding to the power value P included in the selected parameter from among the acquired reactor characteristic values. The actual current estimation section 41 reads out the coupling coefficient k from the acquired reactor characteristic values. The actual current estimation section 41 multiplies the selected inductance value L and the coupling coefficient k to calculate the mutual inductance value M (S3). The actual current estimation section 41 calculates the current average value I ave (S4) based on the voltage value V1 and the power value P included in the selected parameter by the formula (6). Note that the processing of S2, S3, S4 can also be performed in any order.

[0104] Here, as described above, the "duty" calculated by the actual current estimation section 41 becomes a value larger than 0.5. Therefore, the actual current estimation section 41 calculates the time length of each of the regions (1) to (4) by the four formulas shown by the reference numeral 52, and substitutes into the variables T (1) to T (4). Thus, as Figure 7 Figure 8 ​​​As shown, the width of each interval (1) to (4) along the horizontal axis is determined by dividing a switching cycle Ts into four intervals. The actual current estimation unit 41 uses... Figure 7 The four formulas shown in the attached figure 53 assign Mode1, Mode4, Mode2, and Mode4 (S5) to regions (1) to (4) respectively.

[0105] Assuming that at the beginning of region (1), Mode1, i.e., switching element 14A-L is turned on and switching element 14B-L is turned off, the actual current estimation unit 41 substitutes the selected inductance value L, the calculated mutual inductance value M, and the voltage values ​​V1 and V2 into the values ​​corresponding to Mode1. Figure 6 The current increase rate is calculated using equation (2). The actual current estimation unit 41 calculates the average current I. ave Substituting the calculated current increase rate and the time length shown by variable T (1) into equation (7), the current value I of reactor 12A at the end of region (1) is calculated. end（1） .

[0106] At the beginning of region (2), the actual current estimation unit 41 is set to Mode 4, that is, both switching elements 14A-L and 14B-L are turned on, corresponding to Mode 4. Figure 6 Substituting the selected inductance value L, the calculated mutual inductance value M, and the voltage value V1 into equation (5), the current increase rate is calculated. The actual current estimation unit 41 calculates the current value I of the reactor 12A. end（1） Substituting the calculated current increase rate and the time length shown by variable T (2) into equation (8), the current value I of reactor 12A at the end of region (2) is calculated. end（2） .

[0107] Assuming that at the beginning of region (3), Mode2, i.e., switching element 14A-L is off and switching element 14B-L is on, the actual current estimation unit 41 substitutes the selected inductance value L, the calculated mutual inductance value M, and the voltage values ​​V1 and V2 into the values ​​corresponding to Mode2. Figure 6 The current increase rate is calculated using equation (3). The actual current estimation unit 41 calculates the current value I of the reactor 12A. end（2） Substituting the calculated current increase rate and the time length shown by variable T (3) into equation (9), the current value I of reactor 12A at the end of region (3) is calculated. end（3） .

[0108] Assuming that Mode 4 is re-established at the beginning of region (4), the actual current estimation unit 41 substitutes the selected inductance value L, the calculated mutual inductance value M, and the voltage value V1 into the value corresponding to Mode 4. Figure 6the current increase rate is calculated from the formula (5). The actual current estimation section 41 calculates the current value I end（3） of the reactor 12A at the end time of the region (4) by substituting the calculated current increase rate, the time length T (4) into the formula (10). end（4） (S6).

[0109] The actual current estimation section 41 sets the current value of the reactor 12A at the start time of the region (1) as the current value I end（4） . The actual current estimation section 41 sets the first value of the interval of the region (1) as the current value I end（4） , and sets the last value as the current value I end（1） As shown in FIG. 6, the actual current estimation section 41 interpolates between the two values with a straight line (hereinafter, the line segment shown by the reference numeral 61 is referred to as the line segment 61). Figure 8

[0110] The actual current estimation section 41 sets the first value of the interval of the region (2) as the current value I end（1） , and sets the last value as the current value I end（2） As shown in FIG. 6, the actual current estimation section 41 interpolates between the two values with a straight line (hereinafter, the line segment shown by the reference numeral 62 is referred to as the line segment 62). The actual current estimation section 41 sets the first value of the interval of the region (3) as the current value I end（2） , and sets the last value as the current value I end（3） As shown in FIG. 6, the actual current estimation section 41 interpolates between the two values with a straight line (hereinafter, the line segment shown by the reference numeral 63 is referred to as the line segment 63). The actual current estimation section 41 sets the first value of the interval of the region (4) as the current value I end（3） , and sets the last value as the current value I end（4） As shown in FIG. 6, the actual current estimation section 41 interpolates between the two values with a straight line (hereinafter, the line segment shown by the reference numeral 64 is referred to as the line segment 64).

[0111] Thus, the changes represented by the line segments 61, 62, 63, 64 represent the changes in the current value flowing through the reactor 12A in one switching period Ts, and the changes are repeated every switching period Ts. The actual current estimation section 41 selects the current values from the line segments 61, 62, 63, 64 which are repeated in the plurality of switching periods Ts at a time interval at which the changes represented by the line segments 61, 62, 63, 64 can be reproduced, and regards the selected current values as the estimated actual reactor current values corresponding to the reactor 12A of phase A, respectively. Note that the time interval at which the changes represented by the line segments 61, 62, 63, 64 in the actual current estimation section 41 can be reproduced is a time interval which is sufficiently shorter than the sampling interval in the sampling performed by the sample current estimation section 43. ​

[0112] The actual current estimation unit 41 calculates the estimated actual reactor current value for the reactor 12B of the B phase by the same procedure as that for calculating the estimated actual reactor current value for the reactor 12A of the A phase described above.

[0113] However, in this case, since the inductance values L of both the reactor 12A and the reactor 12B are the same, the change in the estimated actual reactor current value corresponding to the reactor 12B of the B phase becomes a change in which the graph 60 indicating the change in the estimated actual reactor current value corresponding to the reactor 12B of the A phase is shifted by an amount of the switching period Ts / 2. Therefore, the change in the estimated actual reactor current value corresponding to the reactor 12B of the B phase becomes a change in which the change in the line segment 63 is indicated in the region (1), the change in the line segment 64 is indicated in the region (2), the change in the line segment 61 is indicated in the region (3), and the change in the line segment 62 is indicated in the region (4). Therefore, the actual current estimation unit 41 does not perform the operations of the equations (7) to (10), and the I end（3） is set to I end（1） is set to I end（4） is set to I end（2） is set to I end（1） is set to I end（3） is set to I end（2） is set to I end（4） The estimated actual reactor current value for the reactor 12B of the B phase can be calculated.

[0114] The actual current estimation unit 41 outputs, to the measured current estimation unit 42, data in which the estimated actual reactor current values of the A phase for a prescribed length of time are arranged in chronological order and data in which the estimated actual reactor current values of the B phase for a prescribed length of time are arranged in chronological order. The actual current estimation unit 41 outputs, in association with each other, data in which the estimated actual reactor current values of the A phase for a prescribed length of time are arranged in chronological order, data in which the estimated actual reactor current values of the B phase for a prescribed length of time are arranged in chronological order, and the selected parameters to the information generation unit 44. Here, the prescribed length of time is, for example, a length of time that is m times the switching period Ts, m is a natural number, and at least m is a value of m > 1 (S7).

[0115] (Current measurement circuit model equation)

[0116] The current measurement circuit model equation determined in advance in the measured current estimation unit 42 will be described. The internal circuit of the sensor circuit 17A, 17B and the internal circuit of the filter circuit 18A, 18B included in the current measurement circuit 16A, 16B can each be approximated as an RC (Resistor-Capacitor) circuit 70 including a resistor 71 and a capacitor 72 as shown in FIG. 6. Figure 9 The internal circuit of the sensor circuit 17A, 17B and the internal circuit of the filter circuit 18A, 18B included in the current measurement circuit 16A, 16B can each be approximated as an RC (Resistor-Capacitor) circuit 70 including a resistor 71 and a capacitor 72 as shown in FIG. 6.Figure 9 The RC circuit 70 shown is a first-order lag system, and a transfer function representing the relationship between an input voltage V in (s) and an output voltage V out (s) is shown in the following equation (11).

[0117] [Equation 7]

[0118]

[0119] In equation (11), R is the resistance value of the resistor 71, C is the electrostatic capacitance of the capacitor 72, and CR is the time constant of the RC circuit 70. If the transfer function of equation (11) is solved, and is set to an equation at a discrete time, i.e., time n, in relation to a current value i, it becomes the following equation (12).

[0120] [Equation 8]

[0121]

[0122] In equation (8), i in [n] is the input current value at time n. i out [n], i out [n-1] are the output current values at time n and time n-1, respectively. τ is the time constant, i.e., CR. Δt is the length of time that represents the time interval of the discrete times.

[0123] The measured current estimation section 42 acquires data in which the estimated actual reactor current value of phase A output from the actual current estimation section 41 is arranged in time series, and data in which the estimated actual reactor current value of phase B is arranged in time series. The measured current estimation section 42 substitutes the data in which the estimated actual reactor current value of phase A is arranged in time series into equation (12) to which the time constant of the sensor circuit 17A is applied, and acquires data in which the estimated value of the sensor reactor current value output from the sensor circuit 17A, i.e., the estimated sensor reactor current value of phase A, is arranged in time series (S8). The measured current estimation section 42 substitutes the data in which the estimated sensor reactor current value of phase A is arranged in time series into equation (12) to which the time constant of the filter circuit 18A is applied, and acquires data in which the estimated value of the measured reactor current value output from the filter circuit 18A, i.e., the estimated measured reactor current value of phase A, is arranged in time series (S9).

[0124] The measurement current estimation unit 42 also performs the process of S8, which applies the time constant of the sensor circuit 17B, and the process of S9, which applies the time constant of the filter circuit 18B, on the data of the estimated actual reactor current value of phase B arranged in time series, and acquires data of the estimated measurement reactor current value of phase B arranged in time series. The measurement current estimation unit 42 outputs the data of the estimated measurement reactor current value of phase A arranged in time series and the data of the estimated measurement reactor current value of phase B arranged in time series to the sample current estimation unit 43.

[0125] The sample current estimation unit 43 acquires the data of the estimated measurement reactor current value of phase A arranged in time series and the data of the estimated measurement reactor current value of phase B arranged in time series output from the measurement current estimation unit 42. The sample current estimation unit 43 samples the acquired data of the estimated measurement reactor current value of phase A arranged in time series and the data of the estimated measurement reactor current value of phase B arranged in time series at the sampling timing calculated in the process of S1. The sample current estimation unit 43 extracts the estimated sample current value of phase A in time series order from the data of the estimated measurement reactor current value of phase A arranged in time series and the estimated sample current value of phase B in time series order from the data of the estimated measurement reactor current value of phase B arranged in time series by the sampling. The sample current estimation unit 43 outputs the extracted data of the estimated sample current value of phase A arranged in time series and the data of the estimated sample current value of phase B arranged in time series to the information generation unit 44 (S10).

[0126] The information generation unit 44 acquires the data of the estimated actual reactor current value of phase A arranged in time series, the data of the estimated actual reactor current value of phase B arranged in time series, and the data in which the parameters are associated, which are output from the actual current estimation unit 41. The information generation unit 44 acquires the data of the estimated sample current value of phase A arranged in time series and the data of the estimated sample current value of phase B arranged in time series, which are output from the sample current estimation unit 43.

[0127] The information generation unit 44 calculates the average value of the estimated actual reactor current value of phase A from the data of the estimated actual reactor current value of phase A arranged in time series. The information generation unit 44 calculates the average value of the estimated sample current value of phase A from the data of the estimated sample current value of phase A arranged in time series. The information generation unit 44 subtracts the average value of the estimated sample current value of phase A from the average value of the estimated actual reactor current value of phase A, and regards the subtraction value as the current correction value of phase A corresponding to the acquired parameter. The information generation unit 44 performs the same process on the data of the estimated actual reactor current value of phase B arranged in time series and the data of the estimated sample current value of phase B arranged in time series as the process performed on phase A, and calculates the current correction value of phase B corresponding to the acquired parameter.

[0128] Note that, here, since the inductance values L of the A phase and the B phase are the same, the data in which the estimated actual reactor current values of the A phase are arranged in time series is offset by data of a half period of the switching period Ts to become the data in which the estimated actual reactor current values of the B phase are arranged in time series. Therefore, if the time length of the interval in which the average value is calculated is a natural number times the switching period Ts, the average value of the estimated actual reactor current values of the A phase is the same as the average value of the estimated actual reactor current values of the B phase. In this case, the information generating section 44 can not calculate the average value of the estimated actual reactor current values of the B phase, but can set the calculated average value of the estimated actual reactor current values of the A phase as the average value of the estimated actual reactor current values of the B phase.

[0129] The information generating section 44 records the current correction values of the A phase and the current correction values of the B phase corresponding to the parameters in association with each other in an area inside. The information generating section 44 outputs a process continuation instruction signal to the actual current estimating section 41 (Sll).

[0130] The actual current estimating section 41, when receiving the process continuation instruction signal from the information generating section 44, selects any one of the parameters that have not been selected, and starts the process after S2 again (loop LIs~Lie). The actual current estimating section 41, when receiving the process continuation instruction signal from the information generating section 44, outputs a process end notification signal to the information generating section 44 in the case where the process of S2 has been performed for all the parameters. Thus, the repeated process of the loop LIs~Lie ends.

[0131] The information generating section 44, when receiving the process end notification signal from the actual current estimating section 41, generates the correction table 7A-1, 7A-2, 7A-3,... for each parameter from the plurality of parameters stored in the storage area inside and the current correction values of the A phase corresponding to the respective parameters, and generates the correction table group data 7A that summarizes the generated correction tables 7A-1, 7A-2, 7A-3,.... Similarly, the information generating section 44 generates the correction table group data 7B from the plurality of parameters stored in the storage area inside and the current correction values of the B phase corresponding to the respective parameters (S12). Thus, the process of the correction value detection information generating apparatus 40 ends.

[0132] (Case where the current measurement circuit time constants of the A phase and the B phase are the same)

[0133] In the above-described Figure 5In the processing of the A phase, the inductance value L of the A phase and the B phase is the same. Therefore, there is a relationship in which the data in which the estimated actual reactor current value of the A phase is arranged in time series is offset by half of the switching period Ts after the data of the B phase. The time constant of the sensor circuit 17A and the sensor circuit 17B of the A phase and the B phase is the same, and the time constant of the filter circuit 18A and the filter circuit 18B is the same, in addition to the condition that the inductance value L of the A phase and the B phase is the same. In the above example, the sampling timing is the same in the A phase and the B phase. Therefore, if the time constant of the sensor circuit 17A and the sensor circuit 17B is made the same, and the time constant of the filter circuit 18A and the filter circuit 18B is made the same, the data in which the estimated sample current value of the A phase is arranged in time series also becomes the data in which the estimated sample current value of the B phase is arranged in time series by an amount of offset by half of the switching period Ts.

[0134] In this case, the average of the estimated actual reactor current value of the A phase is the same as the average of the estimated actual reactor current value of the B phase, and the average of the estimated sample current value of the A phase is the same as the average of the estimated sample current value of the B phase. Therefore, the current correction value of the A phase and the current correction value of the B phase of each parameter are the same, and the correction table group data 7A and the correction table group data 7B become the same data. Therefore, the information generation section 44 can also generate the correction table group data 7A, and generate data obtained by copying the generated correction table group data 7A as the correction table group data 7B. In addition, in the case where the correction table group data 7A and the correction table group data 7B become the same data like this, it is also possible to store only the correction table group data 7A generated by the information generation section 44 in the storage section 6 of the voltage boosting device 1, and the control signal generation section 5 refers to the correction table group data 7A stored in the storage section 6 in the case of processing of the A phase and in the case of processing of the B phase.

[0135] (Regarding the control signal generation section)

[0136] Figure 10 is a diagram that shows the internal structure of the control signal generation section 5 provided in the control section 3 of the voltage boosting device 1, and shows the flow of the processing of the control signal generation section 5 as a block line diagram. It is assumed that the correction table group data 7A, 7B generated by the correction value detection information generation device 40 is stored in the storage section 6, and the control signal generation section 5 refers to the correction table group data 7A, 7B stored in the storage section 6. Figure 10 The internal structure and the processing of the control signal generation section 5 will be described.

[0137] (Internal structure of the control signal generation section)

[0138] The control signal generating section 5 has a voltage control section 81, a current control section 82, a duty ratio operation section 83, and a pulse generating section 84. The voltage control section 81 is, for example, an AVR (Automatic Voltage Regulator) and includes a summing point 91, a voltage PI (Proportional-Integral) block 92, and a multiplication block 93. The voltage control section 81 calculates a target value of a current value I1 flowing through the magnetic coupled reactor 12, i.e., a target current value tr-I1, from a target value of a voltage value V2 between the output terminals 20, i.e., a target voltage value tr-V2.

[0139] The current control section 82 is, for example, an ACR (Automatic Current Regulator) and has a 0.5 times block 94, current value correction blocks 95A, 95B, summing points 96A, 96B, and current PI blocks 97A, 97B. The current control section 82 calculates a target value of a voltage V LA between both terminals of the reactor 12A, i.e., a target voltage value tr-V LA , and a target value of a voltage V LB between both terminals of the reactor 12B, i.e., a target voltage value tr-V LB , from the target current value tr-I1.

[0140] The duty ratio operation section 83 has division blocks 98A, 98B, and summing points 99A, 99B. The duty ratio operation section 83 calculates the turn-on duty ratios of the switching elements 14A-U, 14B-U of the upper arms from the target voltage values tr-V LA , tr-V LB . The pulse generating section 84 generates control signals to be output to the gate terminals of the switching elements 14A-U, 14A-L, 14B-U, 14B-L, respectively, from the turn-on duty ratios of the switching elements 14A-U, 14B-U of the upper arms.

[0141] As described above, the voltage value V1 and the voltage value V2 are supplied to the control signal generating section 5 as feedback information from a first voltage measurement circuit, not shown, which measures the voltage value V1 between the input terminals 10 and a second voltage measurement circuit, not shown, which measures the voltage value V2 between the output terminals 20. Hereinafter, the voltage value V1 and the voltage value V2 as feedback information are referred to as a voltage value fb-V1 and a voltage value fb-V2, respectively. The sample current values of the A phase and the B phase are supplied to the control signal generating section 5 as feedback information from the AD conversion sections 4A, 4B, respectively. Hereinafter, the sample current values of the A phase and the B phase as feedback information are referred to as a sample current value fb-I LA , and a sample current value fb-I LB .

[0142] The control signal generating section 5 further has a function section (hereinafter referred to as a boost ratio calculating section) that calculates a boost ratio, and a function section (hereinafter referred to as a reverse boost ratio calculating section) that calculates a reverse boost ratio. The boost ratio calculating section acquires the voltage value fb-V2 and the voltage value fb-Vl supplied as feedback information, and calculates the ratio of the acquired voltage value fb-V2 to the voltage value fb-Vl, that is, the boost ratio fb-V2 / fb-Vl. The reverse boost ratio calculating section acquires the voltage value fb-Vl and the voltage value fb-V2 supplied as feedback information, and calculates the ratio of the acquired voltage value fb-Vl to the voltage value fb-V2, that is, the reverse boost ratio fb-Vl / fb-V2.

[0143] (Process of the voltage control section of the control signal generating section)

[0144] In the voltage control section 81, the summing point 91 acquires the target voltage value tr-V2 supplied from the outside and the voltage value fb-V2 supplied as feedback information. The summing point 91 outputs a subtraction value obtained by subtracting the voltage value fb-V2 from the target voltage value tr-V2. The voltage PI block 92 acquires the subtraction value output from the summing point 91, performs PI control related to a voltage using parameters determined in advance for PI control, and calculates and outputs a target value of the current value I2 between the output terminals 20, that is, a target current value tr-I2. The multiplication block 93 multiplies the target current value tr-I2 output from the voltage PI block 92 by the boost ratio fb-V2 / fb-Vl output from the boost calculating section, and calculates and outputs a target value of the current value II flowing through the magnetic coupled reactor 12, that is, a target current value tr-II.

[0145] (Process of the current control section of the control signal generating section)

[0146] In the current control section 82, the 0.5 times block 94 calculates target current values of the currents supplied to the reactors 12A and 12B of the A phase and the B phase, respectively. That is, the 0.5 times block 94 acquires the target current value tr-II output from the multiplication block 93, multiplies the acquired target current value tr-II by 0.5, and calculates and outputs the target current value (tr-II) / 2 of each of the A phase and the B phase.

[0147] The following describes the process performed on the A phase in the current control section 82. The current value correction block 95A receives the sample current value fb-I LA, the voltage value fb-V2, and the power value P supplied from the outside. The current value correction block 95A selects the correction table corresponding to the voltage value fb-V2 from among the correction tables 7A-1, 7A-2, 7A-3,... included in the correction table group data 7A stored in the storage section 6. The current value correction block 95A detects, in the correction table corresponding to the voltage value fb-V2 selected, the value of the element in which the power value in the horizontal direction coincides with the acquired power value P and the voltage value in the vertical direction coincides with the voltage value fb-V1 as the current correction value. The current value correction block 95A adds the sample current value fb-I LA , the voltage value fb-V2, and the correction reactor current value C-I LA output by the current value correction block 95A, and outputs the addition value as the corrected current value C-I LA .

[0148] The addition point 96A adds the target current value (tr-I1) / 2 output by the block 94 and the corrected reactor current value C-I LA output by the current value correction block 95A. The addition point 96A outputs the subtraction value obtained by subtracting the corrected reactor current value C-I LA from the target current value (tr-I1) / 2. The current PI block 97A acquires the subtraction value output by the addition point 96A, performs the PI control related to the current with the parameters determined in advance for the PI control, and outputs the target value of the voltage V LA between the both terminals of the reactor 12A, i.e., the target voltage value tr-V LA .

[0149] In the current control section 82, as the processing for the B phase, the same processing as that performed for the A phase is performed, i.e., the current value correction block 95A is replaced with the current value correction block 95B, the sample current value fb-I LA is replaced with the sample current value fb-I LB , the correction table group data 7A is replaced with the correction table group data 7B, the correction tables 7A-1, 7A-2, 7A-3,... are replaced with the correction tables 7B-1, 7B-2, 7B-3,..., the corrected reactor current value C-I LA is replaced with the corrected reactor current value C-I LB , the addition point 96A is replaced with the addition point 96B, and the current PI block 97A is replaced with the current PI block 97B. Thus, the current PI block 97B for the B phase calculates and outputs the target value of the voltage V LB between the both terminals of the reactor 12B, i.e., the target voltage value tr-V LB .

[0150] Here, an example of a change in the case where the current correction value is applied will be described with reference to Figure 11 . Figure 11Yes Figure 2 A graph showing the changes caused by the application of the current correction value. Sample current value fb-I LA The values, designated as positions 31, 32, 33, and 34 in the time series, are supplied to the current value correction block 95A. In this case, the current value correction block 95A corrects the sample current values ​​fb-I for each of the reference numerals 31, 32, 33, and 34. LA All detected current correction values ​​were positive. In this case, the current correction value was applied using the current correction block 95A, and compared with the sample current value fb-I in the attached figure (reference numeral 31). LA The corresponding corrective reactor current value CI LA This corresponds to the position indicated by reference numeral 35 in the attached figure. The sample current value fb-I is the same as that indicated by reference numeral 32 in the attached figure. LA The corresponding corrective reactor current value CI LA This corresponds to the position of reference numeral 36 in the attached figure. The sample current value fb-I is the same as that of reference numeral 33. LA The corresponding corrective reactor current value CI LA This corresponds to the position indicated by reference numeral 37 in the attached figure. The sample current value fb-I is the same as that indicated by reference numeral 34 in the attached figure. LA The corresponding corrective reactor current value CI LA This becomes the position of reference numeral 38 in the attached figure. Therefore, reference numeral 29 shows the sample current values ​​fb-I arranged in a time series. LA The average value increases, approaching the actual reactor current value I shown in Figure 28. LA The average value.

[0151] (Processing of the duty cycle calculation unit in the control signal generation unit)

[0152] The following describes the processing performed on phase A in the duty cycle calculation unit 83. The divider block 98A obtains the target voltage value tr-V output by the current PI block 97A. LA And the voltage value fb-V2 supplied as feedback information. Divider block 98A divides the target voltage value tr-V... LA tr-V is calculated and output by dividing by the voltage value fb-V2. LA / fb-V2. Addition point 99A obtains the tr-V output of division block 98A. LA / fb-V2 and the inverter boost ratio are used to calculate the inverter boost ratio fb-V1 / fb-V2 output. The summation point 99A is obtained by subtracting tr-V from fb-V1 / fb-V2. LA / fb-V2, calculate {(fb-V1)-(tr-V LA )} / fb-V2. The {(fb-V1)-(tr-V LA{fb-V1} - {tr-V2} / fb-V2 becomes the on-duty ratio (DutyA) of the switching element 14A-U of the upper arm of the A phase. The addition point 99A outputs the calculated on-duty ratio (DutyA) of the switching element 14A-U of the upper arm of the A phase.

[0153] In the duty ratio operation section 83, as the processing for the B phase, the same processing as that for the A phase is performed, that is, the processing of replacing the division block 98A with the division block 98B, replacing the current PI block 97A with the current PI block 97B, replacing the target voltage value tr-V LA with the target voltage value tr-V LB , replacing the addition point 99A with the addition point 99B. Thus, the addition point 99B calculates {fb-V1} - {tr-V2} / fb-V2. This {fb-V1} - {tr-V2} / fb-V2 becomes the on-duty ratio (DutyB) of the switching element 14B-U of the upper arm of the B phase. The addition point 99B outputs the calculated on-duty ratio (DutyB) of the switching element 14B-U of the upper arm of the B phase. LB LB

[0154] (Pulse generation section of control signal generation section)

[0155] The pulse generation section 84 internally has a PWM (Pulse Width Modulation) circuit. The pulse generation section 84 acquires the switching period Ts supplied from the outside. The processing performed in the pulse generation section 84 for the A phase will be described below. The pulse generation section 84 acquires the on-duty ratio (DutyA) of the switching element 14A-U of the upper arm output from the addition point 99A. The pulse generation section 84 generates, based on the acquired DutyA, a pulse signal indicating the switching timing of the turning on and off of the switching element 14A-U of the upper arm and the switching element 14A-L of the lower arm each in one period of the acquired switching period Ts by the PWM circuit. The pulse generation section 84 repeatedly outputs, as control signals, the pulse signal for the upper arm to the gate terminal of the switching element 14A-U and the pulse signal for the lower arm to the gate terminal of the switching element 14A-L every switching period Ts.

[0156] In the pulse generation section 84, the same processing as that for the A phase is performed, that is, the processing of replacing the addition point 99A with the addition point 99B, replacing the switching element 14A-U with the switching element 14B-U, replacing the switching element 14A-L with the switching element 14B-L, and replacing DutyA with DutyB.

[0157] (Action and effect of the present embodiment)

[0158] ​​In the voltage boosting device 1 of the above-described embodiment, the correction table group data 7A, 7B, which is the correction value detection information used in the purpose of detecting the current correction value, is stored in advance in the storage section 6. In the correction table group data 7A, 7B, there are included the correction tables 7A-1, 7A-2, 7A-3,..., 7B-1, 7B-2, 7B-3,... representing the relationship of the information related to the electric input and output of the voltage boosting chopper circuit 2, i.e., the voltage values V1 between the input terminals 10, the voltage values V2 between the output terminals 20, and the power value P of the power supplied from the electric storage connected to the input terminals 10, and the current correction value.

[0159] The correction table group data 7A, 7B is data generated by the correction value detection information generation device 40. In the correction value detection information generation device 40, the actual current estimation section 41 calculates the estimated actual inductor current value corresponding to each of a plurality of parameters generated by combining the information related to the electric input and output of the voltage boosting chopper circuit 2, based on the reactor characteristic value of the reactors 12A, 12B, the switching period Ts of the voltage boosting chopper circuit 2, and the voltage boosting chopper circuit model formula modeling the voltage boosting chopper circuit 2.

[0160] The measurement current estimation section 42 calculates the estimated measurement inductor current value of each parameter from the estimated actual inductor current value of each parameter, based on the time constant of the current measurement circuit 16A, 16B, i.e., the current measurement circuit time constant, and the current measurement circuit model formula modeling the current measurement circuit 16A, 16B. The sample current estimation section 43 samples the estimated measurement inductor current value of each parameter at the same sampling timing as the sampling timing of the AD conversion sections 4A, 4B, and extracts the estimated sample current value of each parameter. The information generation section 44 calculates the current correction value of each parameter from the estimated actual inductor current value calculated by the actual current estimation section 41 and the estimated sample current value extracted by the sample current estimation section 43, and generates the correction table group data 7A, 7B representing the relationship of the parameters and the current correction value.

[0161] The control signal generation section 5 provided to the control section 3 of the voltage boosting device 1 detects the current correction value of each of the A phase and the B phase from the correction table group data 7A, 7B, based on the voltage values fb-V1, fb-V2 included in the feedback information related to the electric input and output of the voltage boosting chopper circuit 2 and the power value P supplied from the outside at the time of acquisition of the sample current values fb-I LA , fb-I LB . LA , fb-I LB , respectively, to calculate the corrected reactor current values C-I LA , C-I LB .

[0162] The control signal generation section 5 generates a control signal indicating a switching timing of one cycle amount of the switching period Ts in which the phase difference of the drive phases of the boost circuits 13A, 13B driven at the same switching period Ts is made to coincide with 180°, based on the voltage values fb-V1, fb-V2 included in the feedback information related to the electric input and output of the boost chopper circuit 2 at the time when the corrected reactor current value C-I LA , C-I LB LA , C-I LB , and the calculated corrected reactor current value C-I LA , C-I LB , performs feedback control in which the control target value is set to the target voltage value tr-V2. The control signal generation section 5 generates, through the feedback control, a control signal indicating that the voltage value V2 between the output terminals 20 is made to approach the target voltage value tr-V2, and that the phase difference of the drive phases of the boost circuits 13A, 13B driven at the same switching period Ts is made to coincide with 180°, by one cycle amount of the switching period Ts. The control signal generation section 5 repeatedly outputs, every switching period Ts, the generated control signal to the gate terminals of the switching elements 14A-U, 14A-L, 14B-U, 14B-L.

[0163] The current measurement circuits for feedback control are required to have high responsiveness in order to follow the feedback control, as with the current measurement circuits 16A, 16B provided in the boost device 1. On the other hand, in the case where the current measurement circuits 16A, 16B having such high responsiveness are used, a difference occurs between the respective average values of the actual reactor current values I LA , I LB and the average values of the sample current values fb-I LA , fb-I LB corresponding to each. Therefore, even if the control signal generation section 5 directly uses the sample current values fb-I LA , fb-I LB supplied from the AD conversion sections 4A, 4B to perform feedback control, good controllability cannot be obtained.

[0164] In contrast, in the present embodiment, the correction value detection information generation device 40 calculates a current correction value for compensating for the difference with respect to each of a plurality of parameters generated by combining the information related to the electric input and output of the boost chopper circuit 2 to generate the correction table set data 7A, 7B. The control signal generation section 5 detects, every time feedback information is supplied, a current correction value corresponding to the information related to the electric input and output of the boost chopper circuit 2 at the time when the feedback information is supplied, from the correction table set data 7A, 7B generated by the correction value detection information generation device 40. The control signal generation section 5 corrects the sample current values fb-I LA , fb-I LB supplied from the AD conversion sections 4A, 4B based on the detected current correction value to obtain a corrected reactor current value C-ILA , C-I LB .

[0165] That is, by using the voltage-boosting device 1 and the correction value detection information generating device 40 of the present embodiment, in the polyphase voltage-boosting chopper circuit 2, the current measurement circuits 16A, 16B capable of following the speed required in the feedback control can be used, and the actual reactor current value I LA , I LB the respective average values and the respective sample current values fb-I LA , fb-I LB are corrected. The average value of the corrected reactor current value C-I LA obtained by the correction approaches the average value of the current value of the current actually flowing through the reactor 12A, that is, the actual reactor current value I LA , and the average value of the corrected reactor current value C-I LB obtained by the correction approaches the average value of the current value of the current actually flowing through the reactor 12B, that is, the actual reactor current value I LB . Therefore, in the feedback control performed by the control signal generating section 5, good controllability can be obtained.

[0166] (Other configuration examples of the present embodiment)

[0167] In the above-described embodiment, as the parameters provided to the correction value detection information generating device 40, one is selected from each of the plurality of voltage values V1, the plurality of voltage values V2, and the plurality of power values P, and combined. In contrast, the voltage value V2 can be set as a parameter fixed to the target voltage value tr-V2, for example. In other words, a value obtained by adding the target voltage value tr-V2 to the combination of one selected from each of the plurality of voltage values V1 and the plurality of power values P can be used as the parameter. In this case, the correction table set data 7A generated by the correction value detection information generating device 40 contains only one correction table 7A-1 indexed by "voltage value V2 = target voltage value tr-V2", and the correction table set data 7B contains only one correction table 7B-1 indexed by "voltage value V2 = target voltage value tr-V2". Therefore, the current value correction blocks 95A, 95B of the control signal generating section 5 do not need to search for the correction table from the correction table set data 7A, 7B, and thus do not need to acquire the voltage value fb-V2, and based on the voltage value fb-V1 and the power value P, the current correction values of the A phase and the B phase are detected from the respective correction tables 7A-1, 7B-1. Note that the voltage value V2 can be fixed to a constant value other than the target voltage value tr-V2 to generate the parameter.

[0168] In the above embodiment, the inductance values ​​of reactor 12A and reactor 12B are values ​​that change in the same way according to the power value P, and are inductance values ​​that are the same relative to the same power value P. Conversely, the inductance values ​​of reactor 12A and reactor 12B are the same inductance values ​​that do not change according to the power value P, or the change in inductance value caused by the power value P is small, so that there is no obstacle in determining a common inductance value shared by reactors 12A and 12B as a representative value. In this case, the reactor characteristic values ​​provided to the actual current estimation unit 41 include a common inductance value L shared by reactors 12A and 12B. Therefore, the actual current estimation unit 41... Figure 5 In the S3 process, instead of selecting the inductance value L corresponding to the power value P from the reactor characteristic value, an inductance value L contained in the reactor characteristic value is read out, and the read inductance value L is applied in subsequent processes.

[0169] Thus, if the inductance L of reactors 12A and 12B is set to a constant value that does not change according to the power value P and is the same, the current increase rate in equations (7) to (10) will not change according to the power value P. Therefore, in Figure 8 In the graph 60 shown, which represents the change in the estimated actual reactor current value, even if the power value P changes, the horizontal axis I... end（1） ~I end（4） The value is also based solely on the average current I, which serves as the reference. ave The value of P moves parallel to the vertical axis of the current value. In other words, the shape of curve 60 does not change even if the power value P changes. Therefore, regardless of the power value P, the same current correction value can be obtained as long as the combination of voltage values ​​V1 and V2 is the same.

[0170] Therefore, if the inductance values ​​of reactors 12A and 12B are constant values ​​that do not change according to the power value P and are the same, the correct current correction value can be calculated even without using the power value P. Therefore, the power value P included in the parameters provided to the information generation device 40 for correction value detection can be fixed as a constant value, such as "0". In other words, the parameter can also be obtained by adding a combination of each of the multiple voltage values ​​V1 and V2 to a constant value predetermined as the power value P. Alternatively, the power value P can be omitted from the parameters. In this case, when the actual current estimation unit 41 performs the calculation of equation (6), it applies the constant value predetermined as the power value P to "P" in equation (6).

[0171] When the power value P is fixed at a constant value to generate calibration table data 7A and 7B, the calibration tables 7A-1, 7A-2, 7A-3, ... and 7B-1, 7B-2, 7B-3, ... in the calibration table data 7A and 7B contain only one horizontal sub-item of the power value P corresponding to this constant value, forming a table with only one column. In this case, it is not necessary to provide the power value P to the control signal generation unit 5. The current value calibration blocks 95A and 95B of the control signal generation unit 5 can detect the current calibration values ​​of phase A and phase B respectively based on the voltage values ​​fb-V1 and fb-V2, according to the corresponding calibration tables 7A-1, 7A-2, 7A-3, ... and 7B-1, 7B-2, 7B-3, ...

[0172] When the power value P is fixed at a constant value, the voltage value V2 can also be further fixed at a constant value such as the target voltage value tr-V2. In this case, the calibration table sets 7A and 7B each contain a calibration table 7A-1 and 7B-1. Calibration tables 7A-1 and 7B-1 each have "voltage value V2 = fixed constant value voltage value V2" as an index, becoming a table that only represents a single value corresponding to the fixed constant value power value P in the sub-item of the horizontal power value P. In this case, the current value calibration blocks 95A and 95B of the control signal generation unit 5 do not acquire the voltage value fb-V2, but only detect the current calibration values ​​of phase A and phase B based on the voltage value fb-V1 and their corresponding calibration tables 7A-1 and 7B-1, respectively.

[0173] In the above-described embodiments, the correction value detection information generated by the correction value detection information generation device 40 is, for example, the correction value detection information generated by the device 40. Figure 3 The data format is as shown in the calibration table 7A-1. In contrast, the calibration value detection information generation device 40 can also generate a function representing the relationship between information related to the electrical input and output of the boost chopper circuit 2 and the current calibration value as calibration value detection information. For example, as such a function, the information generation unit 44 of the calibration value detection information generation device 40 can also generate multiple functions for each combination of voltage value V2 and power value P, that is, functions representing the relationship between voltage value V1 and current calibration value. The function representing the relationship between voltage value V1 and current calibration value can, for example, be a function that divides voltage value V1 into intervals of 200V~240V, 245V~300V, and 305V~400V, and includes multiple functions that approximate the relationship between voltage value V1 and current calibration value for each interval of voltage value V1.

[0174] In the above-described embodiment, the inductance value of the reactor 12A is the same as the inductance value of the reactor 12B, but the inductance value of the reactor 12A can be different from the inductance value of the reactor 12B. In this case, for the A phase, instead of the formula (2), the formula (2A) shown below is applied. Figure 6 Figure 12 For the B phase, instead of the formula (3), the formula (3B) shown below is applied. Figure 12 Figure 12 In the formula (2B), the formula (3B), the formula (4B), and the formula (5B), L1 is the inductance value of the reactor 12A, and L2 is the inductance value of the reactor 12B. In addition, in a case where the inductance value of the reactor 12A and the inductance value of the reactor 12B vary depending on the power value P, in the reactors 12A, 12B, different varying inductance values can be represented.

[0175] As described in the above-described embodiment, the step-up chopper circuit 2 is two-phase, but can be a three-phase or more step-up chopper circuit. The step-up chopper circuit 2 includes the input terminal 10, the capacitor 11, the step-up circuits 13A, 13B, the smoothing capacitor 19, and the output terminal 20, but can be a step-up chopper circuit that does not include the input-side capacitor 11, like the step-up device 200 shown in FIG. 2. Figure 15 The step-up circuits 13A, 13B of the step-up chopper circuit 2 are provided with the upper-arm switching elements 14A-U, 14B-U, but can be step-up chopper circuits that are not provided with the upper-arm switching elements 14A-U, 14B-U, like the step-up device 200 shown in FIG. 2. Figure 15 The step-up circuits 13A, 13B of the step-up chopper circuit 2 are provided with the freewheeling diodes 15A-U, 15A-L, 15B-U, 15B-L, but can be step-up chopper circuits that are not provided with the freewheeling diodes 15A-U, 15A-L, 15B-U, 15B-L. However, in a case where the step-up chopper circuit 2 is provided as a step-up chopper circuit that is not provided with the upper-arm switching elements 14A-U, 14B-U, the upper arm needs a diode, like the step-up device 200 of FIG. 2. Figure 15

[0176] In the above-described embodiment, the reactor 12A is magnetically coupled to the reactor 12B, but can not be magnetically coupled. In this case, the reactor characteristic value provided to the actual current estimation unit 41 does not include the coupling coefficient k. In a case of a three-phase or more step-up chopper circuit, the reactors included in the respective step-up circuits forming the step-up chopper circuit can not be all magnetically coupled, can be partially magnetically coupled, or can be all magnetically coupled.

[0177] ​​​In the above embodiment, the sampling timings of the AD conversion units 4A and 4B are the same, and a detection timing corresponding to the sampling timing shared by the AD conversion units 4A and 4B is provided to the sample current estimation unit 43 of the correction value detection information generation device 40. Conversely, when the sampling timings of the AD conversion unit 4A and 4B are different, two detection timings are assigned to the sample current estimation unit 43: a detection timing for phase A corresponding to the sampling timing of the AD conversion unit 4A and a detection timing for phase B corresponding to the sampling timing of the AD conversion unit 4B. In this case, the sample current estimation unit 43... Figure 5 In the processing of S1, the sampling timing for phase A is calculated based on the detection timing used for phase A, and the sampling timing for phase B is calculated based on the detection timing used for phase B. The sample current estimation unit 43... Figure 5 In the S10 processing, the estimated measured reactor current value of phase A is sampled according to the time series data during the sampling timing of phase A, and the estimated sample current value of phase A is extracted according to the time series data. Similarly, the estimated measured reactor current value of phase B is sampled according to the time series data during the sampling timing of phase B, and the estimated sample current value of phase B is extracted according to the time series data.

[0178] In the above embodiment, the switching elements 14A-U, 14A-L, 14B-U, and 14B-L are, for example, IGBTs. Alternatively, bipolar transistors or MOSFETs (Metal-Oxide Semiconductor Field Effect Transistors) can also be used as the switching elements 14A-U, 14A-L, 14B-U, and 14B-L. When using MOSFETs, for example, the freewheeling diodes 15A-U, 15A-L, 15B-U, and 15B-L may be omitted, and instead, the parasitic diodes of the MOSFET switching elements 14A-U, 14A-L, 14B-U, and 14B-L can be used instead of the freewheeling diodes 15A-U, 15A-L, 15B-U, and 15B-L.

[0179] In the above embodiments, the current measuring circuits 16A and 16B respectively include sensor circuits 17A and 17B and filter circuits 18A and 18B. Conversely, the current measuring circuits 16A and 16B may be circuits that only include sensor circuits 17A and 17B, or they may be current measuring circuits other than those consisting of sensor circuits 17A and 17B and filter circuits 18A and 18B.

[0180] In the above embodiment, the control target of the control signal generation unit 5 is set to the target voltage value tr-V2 of the voltage value V2. In contrast, for example, the control target of the control signal generation unit 5 can be set to the current value of the current flowing in each of the reactors 12A and 12B, or the current value of the current supplied to the load connected to the output terminal 20, or other values ​​related to the electrical input and output of the boost chopper circuit 2.

[0181] (Other uses of current correction values)

[0182] The control signal generation unit 5 of the boost converter 1 uses the corrected reactor current value CI of the reactor 12A, which is obtained by correcting the current correction value detected from the correction table data 7A and 7B from the storage unit 6. LA The corrected reactor current value CI of reactor 12B LB Either or both of them can thus make the following temperature estimation and resistance estimation.

[0183] (How to use temperature estimation)

[0184] Figure 13 The storage device 100 shown is, for example, a storage device connected to the input terminals 10-1 and 10-2 of the boost device 1. If the storage device 100 is not used when the temperature of the electrode plates is below a specified temperature, its lifespan will be shortened. However, the temperature of the electrode plates existing in the electrolyte cannot be directly measured. In such a case, it is envisioned that the portion of the electrode plates existing in the electrolyte is used as the measurement target portion 101 to monitor the temperature Ta of this measurement target portion 101.

[0185] Will Figure 13 The temperature estimation device 110 shown is connected to the control signal generation unit 5 of the boost converter 1. The temperature estimation device 110 obtains the correction reactor current value CI from the control signal generation unit 5. LA and the corrected reactor current value CI LB The temperature estimation device 110 is equipped with a temperature sensor, which measures the temperature Tb of a part 102 (hereinafter referred to as the measurable part 102) that can be measured from the outside of the battery.

[0186] If the thermal resistance value of the thermal resistance 103 in the accumulator 100 is set as the thermal resistance value Rth, the temperature Ta of the measurement object 101 can be calculated by the following formula (13).

[0187] [Mathematical Expression 9]

[0188]

[0189] The thermal resistance value Rth is a value representing the difficulty of heat transfer, and the unit is, for example, [°C / W]. The "loss" shown in equation (13) represents the heat at the measurable part 102, and the "loss" can be calculated, for example, based on the current value I of the current flowing in the storage device 100. Therefore, the temperature estimation device 110 will obtain the correction reactor current value CI from the control signal generation unit 5. LA With the corrected reactor current value CI LB The current value I flowing through the storage device 100 is calculated by adding the two values, and the "loss" in equation (13) is calculated based on the calculated current value I. The temperature estimation device 110 substitutes the temperature Tb of the measurable part 102 measured by the temperature sensor and the calculated "loss" into equation (13) to calculate the temperature Ta of the measured part 101. The temperature Ta calculated by the temperature estimation device 110 is the corrected reactor current value CI, which is based on the current value of the current that closely approximates the actual current flowing through reactors 12A and 12B. LA and the corrected reactor current value CI LB The calculated temperature value is therefore a highly accurate temperature value.

[0190] The above describes an example where the battery 100 is the target, and the electrode plate of the battery 100 is the measurement target 101. In contrast, for example, a semiconductor or other component present in the boost converter 1 can be used instead of the battery 100. Such a component may also be damaged when the temperature of a specific location exceeds a predetermined temperature. In this case, if the specific location is, for example, a location where the temperature cannot be directly measured, or a location with a high temperature that cannot be measured by a temperature sensor, then this specific location is designated as the measurement target 101, and the measurable portion of the component is designated as the measurable portion 102. The temperature of the measurement target 101 can be estimated by the temperature estimation device 110 in the same order as described above.

[0191] (Methods of using estimated resistance values)

[0192] For example, consider a scenario where you want to measure the resistance value of the internal resistor 105 in a storage device 100 connected to input terminals 10-1 and 10-2. Figure 14 The internal resistance estimation device 120 shown is connected to the control signal generation unit 5 of the boost converter 1. The internal resistance estimation device 120 obtains the correction reactor current value CI from the control signal generation unit 5. LA and the corrected reactor current value CI LB The internal resistance estimation device 120 is connected to the input terminals 10-1 and 10-2 of the boost device 1 to measure the voltage value V1 between the input terminals 10-1 and 10-2.

[0193] The internal resistance estimation device 120 adds the correction reactor current value C-I LA to the correction reactor current value C-I LB and calculates the current value I of the current flowing through the reactor 100. The internal resistance estimation device 120 divides the measured voltage value VI between the input terminals 10-1, 10-2 by the calculated current value I and calculates the resistance value of the internal resistance 105. The resistance value of the internal resistance 105 calculated by the internal resistance estimation device 120 is a resistance value using the correction reactor current value C-I LA which is a current value that highly accurately approximates the current actually flowing through the reactors 12A, 12B LB and the correction reactor current value C-I LA and calculates the resistance value. Therefore, the resistance value calculated becomes a resistance value with high accuracy.

[0194] Note that the temperature estimation device 110 and the internal resistance estimation device 120 can also not add the correction reactor current value C-I LB to the correction reactor current value C-I LA but can use a value twice the correction reactor current value C-I LB or the correction reactor current value C-I LA as the current value I in the case where the inductance values of the reactors 12A, 12B are the same. In this case, the temperature estimation device 110 and the internal resistance estimation device 120 can obtain either one of the correction reactor current value C-I LB and the correction reactor current value C-I LA from the control signal generation section 5.

[0195] In the above-described utilization method of the temperature estimation device 110 and the internal resistance estimation device 120, the control property required in feedback control is not required, and therefore, for example, a current measurement circuit with a large time constant and a slow response can be used, and a sample current value with less difference from the actual reactor current value can be obtained and used with respect to the average value. However, in this case, it is necessary to provide a current measurement circuit with a large time constant and a slow response separately from the current measurement circuits 16A, 16B in the voltage boosting device 1. In contrast, as shown in Figure 13 , Figure 14 if the correction reactor current value C-I LB output from the control signal generation section 5 is used, the value of the temperature and the resistance value can be estimated without increasing the number of components of the voltage boosting device 1.

[0196] The control signal generation section 5 and the correction value detection information generation device 40 of the above-described embodiments can be configured using a microcomputer, a CPU (Central Processing Unit), and the like, a computer, and a peripheral circuit, a peripheral device, and the like of the computer. Also, the control signal generation section 5 has a voltage control section 81, a current control section 82, a duty ratio operation section 83, and a pulse generation section 84 as a functional structure configured by a combination of software such as a program executed by the hardware and the computer, and the correction value detection information generation device 40 has an actual current estimation section 41, a measured current estimation section 42, a sample current estimation section 43, and an information generation section 44 as a functional structure configured by a combination of software such as a program executed by the hardware and the computer.

[0197] Note that the control signal generation section 5 and the correction value detection information generation device 40 can also be configured using a custom LSI (Large Scale Integrated Circuit) such as a PLD (Programmable Logic Device). As examples of the PLD, there are a PAL (Programmable Array Logic), a GAL (Generic Array Logic), a CPLD (Complex Programmable Logic Device), and an FPGA (Field Programmable Gate Array). In this case, a part or all of the functions realized by the processor can be realized by the integrated circuit.

[0198] A part or all of the program executed by the computer in the above-described embodiments can be distributed via a recording medium readable by the computer, a communication line.

[0199] In the above-described embodiments, the reactors 12A, 12B are elements that realize the property of inductance, and are a kind of inductors. That is, in inductors, in addition to the elements called reactors, there are elements that realize various properties of inductance. Instead of the reactors 12A, 12B, such elements that realize various properties of inductance other than the name called reactors can be applied to the voltage-boosting device 1. In the case where such application is considered, as the name including the reactors 12A, 12B, it is preferable to be set to inductors 12A, 12B, and in the case where it is set to the name such as inductors 12A, 12B, the above-described embodiments are all replaced with the description of “inductor” instead of the description of “reactor”.

[0200] The above-described embodiments of the present disclosure have been described with reference to the drawings, but the specific structure is not limited to the above-described embodiments, and design changes and the like within a range not departing from the gist of the present disclosure are also included.

[0201] Industrial applicability

[0202] According to one embodiment described above, in the polyphase boost chopper circuit, a current measurement circuit capable of following a speed required in feedback control can be used, and feedback control with good controllability can be performed.

[0203] Explanation of reference numerals:

[0204] 1…boost device; 2…boost chopper circuit; 3…control section; 4A, 4B…AD conversion section; 5…control signal generation section; 6…storage section; 7A, 7B…correction table group data; 10, 10-1, 10-2…input terminal; 11…capacitor; 12…magnetically coupled reactor; 12A, 12B…reactor; 13A, 13B…boost circuit; 14A-U, 14A-L, 14B-U, 14B-L…switching element; 15A-U, 15A-L, 15B-U, 15B-L…freewheeling diode; 16A, 16B…current measurement circuit; 17A, 17B…sensor circuit; 18A, 18B…filter circuit; 19…smoothing capacitor; 20, 20-1, 20-2…output terminal; 40…information generation device for correction value detection; 41…actual current estimation section; 42…measured current estimation section; 43…sample current estimation section; 44…information generation section.

Claims

1. A step-up device, wherein the step-up device comprises: a multiphase step-up chopper circuit formed of a plurality of step-up circuits each having an inductor and a switching element, and a smoothing capacitor; a plurality of current measurement circuits that measure currents flowing through the respective inductors to obtain measured inductor current values; and a control unit that drives the switching elements in a manner that approximates a predetermined control target value and is consistent with a phase amount obtained by dividing a phase difference between respective drive phases of the step-up circuits each driven at the same switching period by the number of the step-up circuits, by performing feedback control based on a corrected inductor current value obtained by applying a current correction value to a sample current value obtained by sampling the measured inductor current values at constant sampling intervals, and a voltage value between input terminals and between output terminals of the step-up chopper circuit, the current correction value correcting a difference between an average value of the sample current values and an average value of actual inductor current values that are true values of currents flowing through the inductors, which difference arises depending on the number of the step-up circuits.

2. The step-up device according to claim 1, wherein the step-up device comprises a storage unit that stores, in advance, correction value detection information indicating a relationship between information related to electrical input and output of the step-up chopper circuit including at least the voltage value between the input terminals of the step-up chopper circuit and the current correction value, the control unit detects the current correction value based on information related to electrical input and output of the step-up chopper circuit at the time when the sample current value is obtained and the correction value detection information, and applies the detected current correction value to the sample current value to obtain the corrected inductor current value.

3. A correction value detection information generation device that generates correction value detection information indicating a relationship between a current correction value and information related to electrical input and output of a multiphase step-up chopper circuit, the current correction value being used to correct a difference between an average value of actual inductor current values and an average value of sample current values, the average value of the actual inductor current values being a true value of a current flowing through an inductor included in the step-up chopper circuit of a step-up device that performs interleaved control of the step-up chopper circuit, the average value of the sample current values being obtained by measuring a current flowing through the inductor using a current measurement circuit and sampling at constant sampling intervals, wherein the correction value detection information generation device comprises: an actual current estimation unit that calculates, based on an inductor characteristic value indicating a characteristic of the inductor, a switching period of the step-up chopper circuit, and a step-up chopper circuit model formula modeling the step-up chopper circuit, an estimated actual inductor current value of each of a plurality of parameters generated by combining the information related to electrical input and output of the step-up chopper circuit. ​ a measurement current estimation unit that estimates a measurement current value of the inductor based on a time constant of the current measurement circuit and a current measurement circuit model formula that models the current measurement circuit, from the estimated actual inductor current value of each of the parameters; a sample current estimation unit that samples the estimated measurement inductor current value of each of the parameters at the same sampling timing as the sampling timing of the sampling interval, and extracts an estimated sample inductor current value of each of the parameters; and an information generation unit that calculates the current correction value of each of the parameters from the estimated actual inductor current value and the estimated sample inductor current value, and generates the correction value detection information that indicates the relationship between the parameters and the current correction values.

4. The correction value detection information generation device according to claim 3, wherein the information related to the electrical input and output of the step-up chopper circuit includes a voltage value between input terminals of the step-up chopper circuit and a voltage value between output terminals of the step-up chopper circuit, and the parameter is generated by combining the voltage value between the input terminals of the step-up chopper circuit and the voltage value between the output terminals of the step-up chopper circuit.

5. The correction value detection information generation device according to claim 4, wherein in the parameter, the voltage value between the output terminals is fixed to a constant value.

6. The correction value detection information generation device according to claim 4 or 5, wherein the information related to the electrical input and output of the step-up chopper circuit further includes a power value supplied to the input terminals of the step-up chopper circuit, and the parameter is generated by adding the power value supplied to the input terminals of the step-up chopper circuit to the combined elements.

7. The correction value detection information generation device according to claim 6, wherein the inductor characteristic value includes an inductance value of the inductor, that is, an inductance value determined in advance for each of a plurality of the power values.

8. The correction value detection information generation device according to claim 3, wherein all or a part of the inductor is a magnetically coupled inductor, and a coupling coefficient is included in the magnetically coupled inductor characteristic value.

9. The correction value detection information generation device according to claim 3, wherein the current measurement circuit includes: a sensor circuit that detects a sensor inductor current value that indicates a current value of a current flowing through the inductor; and a filter circuit that low-pass filters the sensor inductor current value detected by the sensor circuit to obtain a measurement inductor current value, the time constant of the current measurement circuit includes a time constant of the sensor circuit and a time constant of the filter circuit.

10. The correction value detection information generation device according to claim 3, wherein the information generation unit generates information that indicates a table in which a discrete value including the current correction value is an element, or generates information represented by a function that calculates the current correction value, as the correction value detection information. ​ 11. A temperature estimation device connected to the control section of the voltage boosting device according to claim 1, wherein the temperature estimation device measures the temperature of a measurement target portion in the voltage boosting chopper circuit or a portion of a component including the measurement target portion in an apparatus connected between the input terminals of the voltage boosting chopper circuit, which is capable of being measured from the outside, and calculates the temperature of the measurement target portion based on the measured temperature and the corrected inductor current value obtained from the control section.

12. An internal resistance estimation device connected to the control section of the voltage boosting device according to claim 1, wherein the internal resistance estimation device calculates the internal resistance value of an accumulator connected between the input terminals of the voltage boosting chopper circuit based on the voltage value between the input terminals of the voltage boosting chopper circuit and the corrected inductor current value obtained from the control section.

13. A voltage boosting method, wherein the voltage boosting method is as follows: obtaining measurement inductor current values by measuring currents flowing through respective inductors in a plurality of voltage boosting chopper circuits that are multiphased and formed of a plurality of voltage boosting circuits each having an inductor and a switching element and a smoothing capacitor; calculating corrected inductor current values by applying a current correction value to sample current values obtained by sampling the measurement inductor current values at constant sampling intervals, the current correction value correcting a difference that occurs depending on the number of voltage boosting circuits, that is, a difference between an average value of the sample current values and an average value of actual inductor current values that are true values of currents flowing through the inductors; and driving the switching elements in a manner that approaches a predetermined control target value and is consistent with a phase amount obtained by dividing a phase difference of 360° of respective drive phases of the voltage boosting circuits each driven at the same switching period by the number of voltage boosting circuits, by performing feedback control based on the calculated corrected inductor current values and voltage values between the input terminals and between the output terminals of the voltage boosting chopper circuit.

14. A correction value detection information generation method that generates correction value detection information indicating a relationship between a current correction value and information related to electrical input and output of a voltage boosting chopper circuit that is multiphased, the current correction value being used to correct a difference between an average value of actual inductor current values and an average value of sample current values, the average value of actual inductor current values being a true value of a current flowing through an inductor included in the voltage boosting chopper circuit of a voltage boosting device that performs interleaved control of the voltage boosting chopper circuit, the average value of sample current values being obtained by measuring a current flowing through the inductor using a current measurement circuit and sampling at constant sampling intervals, wherein the correction value detection information generation method is as follows: calculating an estimated actual inductor current value of each of a plurality of parameters generated by combining information related to electrical input and output of the voltage boosting chopper circuit based on an inductor characteristic value indicating a characteristic of the inductor, a switching period of the voltage boosting chopper circuit, and a voltage boosting chopper circuit model formula modeling the voltage boosting chopper circuit; and generating the correction value detection information based on the estimated actual inductor current value of each of the plurality of parameters. ​ ​ ​ ​ ​ ​ ​ ​ ​ calculating, based on the estimated actual inductor current value of each of the parameters, an estimated measured inductor current value of each of the parameters from a time constant of the current measurement circuit and a current measurement circuit model formula modeling the current measurement circuit; sampling the estimated measured inductor current value of each of the parameters at the same sampling timing as the sampling timing of the sampling interval, and extracting an estimated sample current value of each of the parameters; and calculating the current correction value of each of the parameters from the estimated actual inductor current value and the estimated sample current value, and generating the correction value detection information indicating the relationship between the parameters and the current correction value.

15. A program for causing a computer to execute the steps of: calculating a corrected inductor current value by applying a current correction value to a sample current value extracted by sampling a measured inductor current value at a constant sampling interval, the measured inductor current value being a measured value of a current flowing through each of inductors included in a multiphase boost chopper circuit formed of a plurality of boost circuits each having an inductor and a switching element and a smoothing capacitor, and the current correction value correcting a difference between an average value of the sample current value and an average value of an actual inductor current value which is a true value of the current flowing through the inductor, the difference being caused by the number of the boost circuits; and driving the switching elements in a manner close to a predetermined control target value and in a manner coinciding with a phase amount obtained by dividing a phase difference of 360° of respective drive phases of the boost circuits each driven at the same switching period by the number of the boost circuits, by performing feedback control based on the calculated corrected inductor current value and voltage values between input terminals and between output terminals of the boost chopper circuit.

16. A program for causing a computer to generate correction value detection information indicating a relationship between a current correction value and information related to electrical input and output of a multiphase boost chopper circuit, the current correction value being used to correct a difference between an average value of an actual inductor current value which is a true value of a current flowing through an inductor included in the boost chopper circuit of a boost device performing interleaved control of the boost chopper circuit and an average value of a sample current value obtained by measuring the current flowing through the inductor using a current measurement circuit and sampling at a constant sampling interval, wherein the program is for causing the computer to execute the steps of: calculating an estimated actual inductor current value of each of a plurality of parameters generated by combining information related to electrical input and output of the boost chopper circuit from an inductor characteristic value indicating a characteristic of the inductor, a switching period of the boost chopper circuit, and a boost chopper circuit model formula modeling the boost chopper circuit. based on a time constant of the current measurement circuit and a current measurement circuit model formula modeling the current measurement circuit, calculating an estimated measured inductor current value of each of the parameters from the estimated actual inductor current value of each of the parameters; sampling the estimated measured inductor current value of each of the parameters at the same sampling timing as the sampling timing of the sampling interval, and extracting an estimated sample current value of each of the parameters; and based on the estimated actual inductor current value and the estimated sample current value, calculating the current correction value of each of the parameters, and generating the correction value detection information indicating the relationship between the parameters and the current correction value.

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