Method and device for testing electronic controller

Abstract

The embodiment of the invention provides a test method and device for an electronic controller, relates to the technical field of brake test, is suitable for a vehicle brake system, and comprises the following steps: controlling an analog relay to connect an analog sensor and the electronic controller, the analog sensor comprises any one or more test items of preset signal value identification, system time base identification, fault code and status bit identification and cyclic redundancy check code identification, and the test items comprise test data; corresponding test items in the simulation sensor are triggered to generate test signals, the test signals are sent to the electronic controller, and the test signals carry test data of the corresponding test items; and obtaining an evaluation result of the electronic controller according to a processing result of the electronic controller on the test signal, and the evaluation result is used for representing the signal processing performance quality of the electronic controller. Therefore, under the condition that the real sensor is not damaged, the comprehensiveness and the accuracy of ECU performance testing can be improved.

Description

Technical Field

[0001] This application relates to the field of braking test technology, and in particular to a test method and apparatus for an electronic controller. Background Technology

[0002] An ECU (Electronic Control Unit), also known as a car's "on-board computer," is used to control the vehicle's driving status and perform its various functions. It primarily uses data acquisition and exchange from various sensors and buses to determine the vehicle's status and the driver's intentions, and then controls the vehicle through actuators. For example, an ECU can receive wheel speed information from wheel speed sensors and control the vehicle based on that information.

[0003] In related technologies, test benches are typically built for ECUs to simulate the actual components of a vehicle's braking system and their connections, thus obtaining the ECU's operating environment. Real sensors within these components are triggered to generate corresponding test signals, which are then sent to the ECU. The ECU's processing results are monitored, and the signal processing performance quality of the ECU can be determined based on the processing results of these test signals. However, this method still has some drawbacks, including: 1. The signal values ​​fed back by the real sensors are constrained by product characteristics and cannot reach the maximum signal value of the real sensors, making it impossible to test the ECU's recognition and processing of the maximum signal value; 2. It is impossible to induce a fault signal from the real sensors without damaging them; 3. It is impossible to measure the time it takes for a fault signal to be sent to the ECU for recognition. Furthermore, when testing the accuracy of the ECU's signal recognition and processing, the difference between the signal generated by the real sensors and the desired signal is factored into the ECU's recognition accuracy calculation, leading to inaccurate testing of the ECU's information processing performance.

[0004] Therefore, there is an urgent need for a testing method and device for electronic controllers that can improve the comprehensiveness and accuracy of ECU performance testing without damaging the actual sensors. Summary of the Invention

[0005] This application provides a testing method and apparatus for electronic controllers, which can improve the comprehensiveness and accuracy of ECU performance testing without damaging real sensors.

[0006] In a first aspect, embodiments of this application provide a testing method for an electronic controller, applicable to vehicle braking systems, wherein the electronic controller is connected to an analog sensor via an analog relay, comprising: The analog relay is controlled to connect the analog sensor to the electronic controller. The analog sensor includes one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The test items include test data. The corresponding test item in the simulated sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller. The test signal is used to test the signal processing performance of the electronic controller, and the test signal carries the test data of the corresponding test item. Based on the processing results of the test signal by the electronic controller, the electronic controller is evaluated to obtain evaluation results, which are then used to characterize the signal processing performance quality of the electronic controller.

[0007] Secondly, embodiments of this application provide a testing apparatus for an electronic controller, applicable to vehicle braking systems. The electronic controller is connected to an analog sensor via an analog relay, and includes: The control unit is used to control the analog relay to connect the analog sensor and the electronic controller. The analog sensor includes one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The first test unit is used to trigger the corresponding test item in the analog sensor to generate a test signal and send the test signal to the electronic controller. The test signal is used to test the signal processing performance of the electronic controller. The second testing unit is used to evaluate the electronic controller based on the processing result of the test signal by the electronic controller, and obtain the evaluation result, which is used to characterize the signal processing performance quality of the electronic controller.

[0008] Optionally, the triggered test item is a signal value recognition test item, and the first test unit is specifically used for: The signal value recognition test item in the analog sensor is triggered to generate a fast frame signal value command, and the fast frame signal value command is sent to the electronic controller; The second test unit is specifically used to: obtain the identification signal value of the command signal value in the fast frame signal value command by the electronic controller, and obtain the evaluation result based on the signal difference between the command signal value and the identification signal value, wherein the command signal value is any signal value in the range of executable signal values ​​of the fast frame signal value command.

[0009] Optionally, the triggered test item is the system time base identification test item, and the first test unit is specifically used to: trigger the system time base identification test item in the analog sensor to generate a system time base command, and send the system time base command to the electronic controller; The second test unit is specifically used to: obtain the identification time base value of the system time base value in the system time base command by the electronic controller, and obtain the evaluation result based on the time base difference between the system time base value and the identification time base value.

[0010] Optionally, the triggered test item is a fault code and status bit recognition test item. The first test unit is specifically used to: trigger the fault code and status bit recognition test item in the simulated sensor to generate fault code and status bit commands, and send the fault code and status bit commands to the electronic controller. The second test unit is specifically used to: obtain the fault identification results of the electronic controller for the fault code and status bit command, and evaluate the electronic controller based on the fault identification results to obtain the evaluation results.

[0011] Optionally, the triggered test item is a cyclic redundancy check code recognition test item, and the first test unit is specifically used to: trigger the cyclic redundancy check code recognition test item in the simulated sensor to generate an error check code command, and send the error check code command to the electronic controller; The second testing unit is specifically used to: obtain the abnormal identification result of the electronic controller for the error check code command, and evaluate the electronic controller based on the abnormal identification result to obtain the evaluation result.

[0012] Optionally, the second test unit is further configured to: record the fault injection time point when the error check code command is sent, and collect the abnormal fault time point when the electronic controller obtains the abnormal identification result, and evaluate the electronic controller based on the time difference between the fault injection time point and the abnormal fault time point to obtain an evaluation result.

[0013] Optionally, the electronic controller is connected to a real sensor via a real relay. The real sensor has the same function as the sensor actually used by the controller in the braking system. The control unit is also used to control the real relay to disconnect the connection between the real sensor and the electronic controller.

[0014] Optionally, the first test unit is also used for: Initialize the configuration of each test item of the analog sensor so that each test item generates a corresponding command when triggered to test the electronic controller.

[0015] The beneficial effects of this application are: This application provides a testing method for an electronic controller. The electronic controller is connected to an analog sensor via an analog relay, which can control the connection between the analog sensor and the electronic controller. The analog sensor can be pre-set with one or more test items, including signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. When the corresponding test item in the analog sensor is triggered, a test signal is generated and sent to the electronic controller to obtain the processing result of the electronic controller and evaluate the signal processing performance quality of the electronic controller.

[0016] In this application, the test items in the simulated sensor contain test data, and the test signal generated by triggering the test item contains the test data of that corresponding test item. In other words, by setting test items and their test data in the simulated sensor, a test signal containing any required test data can be generated. Compared to related technologies where the maximum signal value cannot be reached due to sensor product characteristics, thus preventing the testing of the ECU's processing capability for the maximum signal value, this application can test the ECU's processing capability for any signal value, improving the comprehensiveness of the test. Furthermore, it eliminates the need to damage the sensor. By setting fault codes, status bits, and other test data in the corresponding test items, the simulated sensor can generate a fault signal (test signal) when the test item is triggered, allowing the ECU to obtain its processing capability for that fault signal. Moreover, unlike related technologies where the timing of signal transmission when a real sensor is triggered cannot be accurately determined, the timing of signal transmission when the simulated sensor is triggered can be accurately determined, thus allowing for accurate determination of the ECU's signal processing speed.

[0017] Finally, compared to the possibility that the signals generated by real sensors may differ from the desired signals, this application can use a simulated sensor to generate test signals directly, bypassing the series of processing logic required by real sensors. This not only allows for accurate control of the test data carried by the test signals, ensuring the accuracy of the test data, but also improves the accuracy and comprehensiveness of ECU performance testing without damaging the real sensors, while reducing testing costs.

[0018] These or other implementations of this application will become clearer and easier to understand in the following description of the embodiments. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 A schematic diagram of the structure of a test system for an electronic controller provided in an embodiment of this application; Figure 2 A flowchart illustrating a testing method for an electronic controller provided in an embodiment of this application; Figure 3 A schematic diagram of the configuration interface of "MCP_Configuration - Custom Data Input" for an analog sensor provided in an embodiment of this application; Figure 4 A schematic diagram of the configuration interface of a host computer for "Message transmission in the MCP_Send_ch1ch2 protocol" for analog sensors provided in an embodiment of this application; Figure 5 A schematic diagram of the configuration interface for the fast frame signal value command -MCP_ch1 in a host computer provided for an embodiment of this application; Figure 6 A simplified schematic diagram of the signal value recognition result and the signal change line of the host computer for the ECU to recognize the fast frame signal value command, provided in an embodiment of this application; Figure 7 A schematic diagram of the configuration interface for the system time base command - MCP_Tick in a host computer provided for an embodiment of this application; Figure 8 A simplified schematic diagram of the Tick result and the identified signal change piecewise linear relationship of the ECU identification system time base command provided in this application embodiment; Figure 9 A schematic diagram of the configuration interface for the fault code and status bit command -MCP_ExData in a host computer provided for an embodiment of this application; Figure 10 A simplified schematic diagram of the results of a host computer identifying fault codes and status bit commands from an ECU, and the line graph showing the changes in the identified signals, provided in this embodiment of the application. Figure 11 A schematic diagram of the configuration interface for the error check code command - MCP CrcSet in a host computer provided for an embodiment of this application; Figure 12 A simplified schematic diagram of the result of the host computer recognizing the error check code command of the ECU and the recognized signal change line provided in this embodiment of the application; Figure 13 A simplified schematic diagram illustrating the display of FTTI-related information in ECU functional safety by a host computer, as provided in this application embodiment; Figure 14 This is a schematic diagram of a testing device for an electronic controller provided in an embodiment of this application. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0022] It should be noted that in the embodiments of this application, "connection" can be understood as electrical connection. The connection between two electrical components can be a direct or indirect connection between the two electrical components. For example, the connection between A and B can be a direct connection between A and B, or an indirect connection between A and B through one or more other electrical components, such as A and B directly connected to C, and C directly connected to B, with A and B connected through C. In some scenarios, "connection" can also be understood as coupling, such as electromagnetic coupling between two inductors. In short, the connection between A and B enables the transmission of electrical energy between A and B.

[0023] In modern industry and the automotive sector, the signal processing capabilities of electronic control units (ECUs) are crucial for ensuring system reliability and performance, and testing their performance is essential for product quality. However, existing testing methods are limited by the signal generation characteristics of real sensors, making it difficult to comprehensively and accurately evaluate the processing capabilities of electronic controllers.

[0024] Specifically, due to their inherent characteristics, real sensors cannot generate maximum signal values ​​or specific fault signals, making it difficult to cover all signal processing scenarios of the electronic controller and thus impossible to test the controller's extreme signal processing capabilities. Furthermore, the precise timing of signal generation by real sensors is difficult to determine, affecting the accurate assessment of the electronic controller's response speed. In addition, the complex processing logic of real sensors may lead to signal deviations, reducing the reliability of test data.

[0025] To address the aforementioned issues, electronic controller testing faces a core technical challenge: how to overcome the limitations of real sensors, flexibly generate test signals containing arbitrary test data, and precisely control the signal generation time to comprehensively evaluate the signal processing capabilities and response speed of the electronic controller. This problem manifests in two ways: first, it is impossible to generate test signals containing maximum signal values ​​or specific fault codes using real sensors, limiting comprehensive testing of the electronic controller's performance; second, the uncertainty of signal generation time makes it difficult to accurately assess the electronic controller's processing speed. These issues directly affect the test coverage and data accuracy, urgently requiring a new testing method to overcome the limitations of real sensors in signal generation and improve the comprehensiveness and accuracy of the test.

[0026] Therefore, embodiments of this application provide a testing system for an electronic controller. In this testing system, the electronic controller is connected to a real sensor via a real relay. The real sensor has the same function as the sensor actually used by the controller in the braking system, and the electronic controller is connected to a simulated sensor via an analog relay. Figure 1 As shown, this is a test system for an electronic controller provided in an embodiment of this application. Figure 1 The 0x412x_KA28-0x412x_KA38 wiring shown on the left is connected to MCP_V+, MCP_V-, MCP_2, MCP_1, PSU_V+, PSU_V-, PSU_2, PSU_1, MPS_V+, and MPS_V-, respectively. In the real sensors, MPC and ECP represent different pressure sensors, while MPS and PTS represent other sensors. MPC, as the real sensor, sends signals to the ECU's MCP_1 via the real relay 0x412x_KA47. The simulated sensor sends test signals to the ECU's PSU_1 via the simulated relay 0x412x_KA48. MCP_V+ and MCP_V- represent the power supply to the pressure sensor receiver, PSU_V+ and PSU_V- represent the power supply to another pressure sensor receiver, MCP_2 and PSU_2 represent redundant signal receivers, and MPS_V+ and MPS_V- represent the power supply to the receivers of other sensors. That is Figure 1 The left side of the circuit is the ECU signal receiving terminal, and the right side is the real / analog sensor terminal.

[0027] In one embodiment, the analog sensor model may be SENT 0x4000x, which has multiple pins including multiple receivers and transmitters.

[0028] In one embodiment, two relays are used (one for connecting or disconnecting the ECU from the real sensor – a real relay, and the other for connecting or disconnecting the ECU from the analog sensor – an analog relay), connected in series between the ECU and the sensor. By default, the real relay between the ECU and the real sensor is closed, and the analog relay between the ECU and the analog sensor is open. The host computer controls the opening / closing of the analog / real relays by sending commands to the control analog / real relay boards. For example, when the analog sensor needs to be tested, the real relay of the real sensor is opened, and the analog relay of the analog sensor is closed, thus achieving testing in a specific scenario by controlling the analog sensor. That is to say, the real sensor can also generate a test signal after being triggered. However, this application can selectively choose to use the real sensor to generate the test signal when the test item needs to include the execution process of the real sensor's processing logic. In cases where the execution of other real sensor processing logic may cause changes in the test data, resulting in a difference between the data in the test signal and the required test data, or in cases where the test data cannot be achieved by the real sensor product features, the analog sensor can be used for testing. In this way, the ECU performance can be comprehensively and accurately tested and evaluated.

[0029] Before using the analog sensor for testing, that is, before controlling the analog relay to connect the analog sensor and the electronic controller, the various test items of the analog sensor can be initialized and configured so that each test item generates a corresponding command when triggered to test the electronic controller.

[0030] Based on the above testing system, embodiments of this application provide a testing method flow for an electronic controller, such as... Figure 2 As shown, this test method is applicable to vehicle braking systems. The electronic controller is connected to analog sensors via analog relays, including: Step 201: Control the analog relay to connect the analog sensor and the electronic controller. The analog sensor contains one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The test items contain test data.

[0031] Step 202: Trigger the generation of test signals for the corresponding test items in the analog sensor and send the test signals to the electronic controller. The test signals are used to test the signal processing performance of the electronic controller and carry the test data of the corresponding test items.

[0032] Step 203: Based on the processing results of the electronic controller on the test signal, evaluate the electronic controller and obtain the evaluation results. The evaluation results are used to characterize the signal processing performance quality of the electronic controller.

[0033] In one embodiment, before triggering the generation of a test signal for the corresponding test item in the simulated sensor in step 202, the method further includes controlling the real relay to disconnect the connection between the real sensor and the electronic controller.

[0034] In one embodiment, the analog sensor has control interfaces that meet the requirements of SAE_J2716-2010 (format) & SAE_J2716-2016 protocol, and also open the control interfaces for test items such as tick time, status, custom data input, custom CRC rules, and fast / slow frames in the protocol, as shown below. The host computer's manual or automatic monitoring and control of the analog sensor's control interface includes: MCP Start Stop_set: Settings for starting or stopping certain functions or operations in the test system.

[0035] MCP TickSize_Set: Settings for tick time in the test system.

[0036] MCP_Slow_Clear: A setting for clearing slow frame data in the test system.

[0037] MCP_Configuration: Settings for custom data input in the test system.

[0038] MCP_Slow_Config: Settings for fast / slow frames in the test system.

[0039] MCP_Listen_Set: Settings for the listening mode in the test system.

[0040] MCP_Control: The setting for the physical value coefficient of the sent conversion of signal values ​​in the test system.

[0041] MCP_Rx_Val: Settings for the receiver in the test system.

[0042] MCP_Send_ExData: Settings for sending data in the test system.

[0043] MCP_Send_ch1ch2: Settings for the sent physical value in the protocol within the test system.

[0044] In other words, the timing and control status of the control interface can be monitored by the host computer to measure the accuracy of the ECU's identification signals, faults, and response time.

[0045] In one embodiment, based on the above Figure 1The test system and the "manual or automatic monitoring and control of the host computer's control interface for analog sensors" are described in the following steps, using the MCP_1 sensor circuit (relay number 0x412x_KA48) in the control circuit as an example: Send initialization configuration commands for the analog sensor (including Tick time (system time base command), CRC (error check code command), signal values ​​(fault code and status bit commands, fast frame signal value commands, etc.), such as Figure 3 The diagram shown is a schematic of the configuration interface of "MCP_Configuration - Custom Data Input" for an analog sensor provided in an embodiment of this application. It includes: signal name, data bytes, signal generator (including operable area), generator, original value, original progress value, physical value, physical progress value, and annotations, among other related data items. The test signals for each configurable test item include: MCP_Out_Polarity: Enables high and low level output for the MCP sensor protocol.

[0046] MCP Tick: Bit time in the MCP sensor protocol.

[0047] MCP_Loop_Trig: Output mode of the MCP sensor protocol.

[0048] MCp_SensorClasse: Configuration of the channel signal length for the MCP sensor protocol.

[0049] MCP_Serial: Configuration of the slow frame channel output format for the MCP sensor protocol.

[0050] MCP_BitConfig: Configures the slow frame data bit type and length for the MCP sensor protocol.

[0051] MCP_CrcSet: CRC check configuration for the MCP sensor protocol.

[0052] MCP_SyncTime: Configures the synchronization time delay for the MCP sensor protocol.

[0053] The corresponding physical values ​​of each test signal (one type of data in the test data): MCP_Out_Polarity-[0] Orthophase: Active high.

[0054] MCP Tick-[5] Tick=3us: Bit time is 3 microseconds.

[0055] MCP_Loop_Trig-[0] Loop_0ut: Periodic output.

[0056] MCp_SensorClasse-[0]Channel1(12bit)+Channel2(12bit): Channel 1 is 12bit + Channel 2 is 12bit.

[0057] MCP_Serial-[0] LongForm_18: 18 frames make up 1 frame of channel signal. MCP_BitConfig-[0]c=0,D=8,Data=12: Type=0, ID=8bit, Data=12bit.

[0058] MCP_CrcSet-[0] General: General CRC algorithm.

[0059] like Figure 4 The diagram shown is a schematic of a configuration interface for "Message Sending in the MCP_Send_ch1ch2 Protocol" of an analog sensor provided in an embodiment of this application. It includes: signal name, data bytes, signal generator (including operable areas), generator, original value, original progress value, physical value, physical progress value, and related data items such as annotations. Configurable test signals include: MCP_ch1: The physical value of the data for MCP fast frame channel 1.

[0060] MCP_ch2: The physical data value of MCP fast frame channel 2.

[0061] The above Figure 3 and Figure 4 Each column can be viewed as a test item. The parameters, type, and other related data of the test item can be changed manually or automatically. When triggered, the analog sensor will generate a test signal that reflects these parameters, type, and other related data and send it to the ECU.

[0062] This application provides a test method for the signal value recognition capability of an electronic controller. The triggered test item is a signal value recognition test item. In step 202, the corresponding test item in the analog sensor is triggered to generate a test signal and the test signal is sent to the electronic controller. This includes: triggering the signal value recognition test item in the analog sensor to generate a fast frame signal value command and sending the fast frame signal value command to the electronic controller. In step 203, the electronic controller is evaluated based on the processing result of the test signal by the electronic controller to obtain the evaluation result, including: obtaining the identification signal value of the command signal value in the fast frame signal value command of the electronic controller, and obtaining the evaluation result based on the signal difference between the command signal value and the identification signal value, wherein the command signal value is any signal value in the range of executable signal values ​​of the fast frame signal value command.

[0063] In one embodiment, testing the signal value recognition accuracy of the ECU (functional safety equivalence / internal interface testing) can trigger a command to generate fast-frame signal values ​​in the analog sensor's signal value recognition test item, and send a command to configure the fast-frame signal values ​​(such as...). Figure 5 The diagram shows a configuration interface for the command -MCP_ch1 for the fast frame signal value in a host computer according to an embodiment of this application. The fast frame signal value is configured to 125 (command signal value) and sent to the ECU. Simultaneously, the interface monitors whether the ECU detects that the fast frame signal value is within 125 ± 1%. Figure 6 The diagram shows a simplified representation of the signal value recognition result and signal change curve of the host computer in response to the ECU's command to recognize the fast frame signal value (in the line graph, MCP represents the change of MCP_ch1, and Cdd represents the change of the signal recognized by the ECU (Cdd_HdyPres_MC1SampleInfo.ChannelPressureBar: the physical value variable of the signal recognized by the software in MCP channel 1)). The ECU recognizes a signal value of 124.91 (recognized signal value), which meets the requirements, so the ECU passes this test. In the graph, the column name "name" represents the signal name, and the column name "Measurement cursor" represents the signal value.

[0064] Therefore, compared to using real sensor testing methods, which, due to product characteristics, can only achieve a maximum signal value of around 0 to 50 under real-world conditions and thus cannot meet the requirements of this test item, using simulated sensors allows for setting arbitrary signal values ​​to test the ECU's ability to process any signal value in the corresponding command, thereby improving the comprehensiveness of the test.

[0065] This application provides a test method for the system time base recognition capability of an electronic controller. The triggered test item is the system time base recognition test item. In step 202, the corresponding test item in the analog sensor is triggered to generate a test signal and the test signal is sent to the electronic controller. This includes: triggering the system time base recognition test item in the analog sensor to generate a system time base command and sending the system time base command to the electronic controller. In step 203, the electronic controller is evaluated based on its processing results of the test signals, and the evaluation results are obtained, including: Obtain the identification time base value of the system time base value in the system time base command of the electronic controller, and obtain the evaluation result based on the time base difference between the system time base value and the identification time base value.

[0066] In one embodiment, testing the ECU's Tick time recognition (system time base recognition) triggers the generation of a system time base command - Tick time command in the simulated sensor's system time base recognition test item, and sends a configuration Tick time command (such as...). Figure 7The diagram shows a configuration interface for the system time base command - MCP_Tick in a host computer according to an embodiment of this application (configured to 2.5us). The system time base command is sent to the electronic controller, and the system monitors whether the ECU detects an abnormal tick time and reports a fault. Figure 8 The diagram shown is a simplified schematic of the Tick result of the ECU's identification system time base command and the identified signal change curve provided in this embodiment of the application. The ECU identifies the signal abnormality fault, meets the requirements, and the test is passed.

[0067] in, Figure 8 Description of the meaning of the relevant content in the Chinese text: Measurement cursor: Measurement line cursor.

[0068] MCP_Tick=Tick=2.5us: The MCP sensor bit time is equal to 2.5 microseconds.

[0069] Dem_FaultMemory.DetailFault._0_.FaultId=e_Flt_MC1HydPressSignalDataFault (Fault record number 0 shows a fault report indicating an error in the MCP1 pressure sensor data).

[0070] Dem_FaultMemory.DetailFault._0_.FaultStatus=175 (The current fault is displayed as the 0th fault status recorded).

[0071] Dem_FaultMemory.DetailFault._1_.FaultId=e_Flt_MC1HydPressSignalDataFault (Fault record number 1 shows a fault report indicating an error in the MCP1 pressure sensor data).

[0072] Dem_FaultMemory.DetailFault._1_.FaultStatus=47 (The first recorded fault status is displayed as the current fault).

[0073] Compared to the above method, which uses a real sensor for testing, because the real sensor chip can only emit a normal signal with a tick time of 3µs, thus failing to meet the test requirements, this application allows for arbitrary configuration of the tick time.

[0074] This application provides a test method for the fault code and status bit recognition capability of an electronic controller. The triggered test item is the fault code and status bit recognition test item. In step 202, the corresponding test item in the analog sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller. This includes: triggering the fault code and status bit recognition test item in the analog sensor to generate a fault code and status bit command, and sending the fault code and status bit command to the electronic controller. In step 203, the electronic controller is evaluated based on the processing results of the test signals by the electronic controller to obtain evaluation results, including: obtaining the fault identification results of the electronic controller for fault codes and status bit commands, and evaluating the electronic controller based on the fault identification results to obtain evaluation results.

[0075] In one embodiment, during the test of ECU slow-frame fault codes and status bit recognition—fault code and status bit recognition (functional safety fault injection / error guessing test)—configuration commands for fault codes and status bits are sent (e.g., ... Figure 9 The diagram shows a configuration interface for the fault code and status bit command -MCP_ExData in a host computer according to an embodiment of this application. For example, the fault code is configured as 2064 (0x810h), and the status bit is configured as 1 (error). Simultaneously, it monitors whether the ECU detects an anomaly and reports a fault. Figure 10 The diagram shown is a simplified schematic of the results of a host computer identifying fault codes and status bit commands for an ECU, and the identified signal change curve provided in an embodiment of this application. The ECU identifies an abnormal signal fault, meets the requirements, and the test is passed.

[0076] in, Figure 9 In Chinese, the meaning of signal names is as follows: MCP_Ex_ID: Sets the MCP slow frame channel.

[0077] MMCP_ExData: Sets the raw value for the MCP slow frame channel.

[0078] MCP_Er: Sets the error status bit for the MCP slow frame channel.

[0079] Figure 10 Meaning of related descriptions in Chinese: Measurement cursor: Measurement line cursor.

[0080] MCP_ExData= 0810h: Sets the original value of the MCP slow frame channel to 2064 (0x810h).

[0081] MCP_Er= 1: Sets the error status bit of the MCP slow frame channel to 1 (error).

[0082] Dem_FaultMemory.DetailFault._0_.FaultId=e_Flt_MC1HydPressSignalDataFault (Fault record number 0 shows a fault report indicating an error in the MCP1 pressure sensor data).

[0083] Dem_FaultMemory.DetailFault._0_.FaultStatus=175 (The current fault is displayed as the 0th fault status recorded).

[0084] Dem_FaultMemory.DetailFault._1_.FaultId= e_Flt_MC1HydPressGeneralASICSignalFault (Fault record number 1 shows a fault report for the pressure sensor MCP1 chip).

[0085] Dem_FaultMemory.DetailFault._1_.FaultStatus=175 (The first recorded fault status is displayed as the current fault).

[0086] Compared to the above methods, which require damaging the actual sensor components (short circuit / open circuit / power supply abnormality / removal of components, etc.), resulting in high testing costs and failure to meet the conditions for repeated testing, this application can complete the test without damaging the sensor and can repeat the test at no cost.

[0087] This application provides a test method for the cyclic redundancy check code recognition capability of an electronic controller. The triggered test item is the cyclic redundancy check code recognition test item. In step 202, the corresponding test item in the analog sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller. This includes: triggering the cyclic redundancy check code recognition test item in the analog sensor to generate an error check code command, and sending the error check code command to the electronic controller. In step 203, the electronic controller is evaluated based on the processing result of the test signal by the electronic controller to obtain the evaluation result, including: obtaining the abnormal identification result of the electronic controller for the error check code command, and evaluating the electronic controller based on the abnormal identification result to obtain the evaluation result.

[0088] In one embodiment, during the test of CRC (Cyclic Redundancy Check) error identification (functional safety fault injection / error guessing test), a configuration error CRC command - error check code command is sent (e.g.) Figure 11The diagram shown is a configuration interface diagram of the error check code command - MCP CrcSet in a host computer according to an embodiment of this application (configured as Add0000_Crc). It also monitors whether the ECU detects an anomaly and reports a fault. Figure 12 The diagram shown is a simplified illustration of the result of the host computer recognizing the error check code command of the ECU and the recognized signal change line provided in an embodiment of this application. The ECU recognizes the abnormal signal fault, meets the requirements, and the test is passed.

[0089] in, Figure 12 The changes in the broken line section involve: Measurement cursor: Measurement line cursor.

[0090] MCP CrcSet: Add0000_Crc: Incorrectly configured calculated CRC value.

[0091] Dem_FaultMemory.DetailFault._0_.FaultId=e_Flt_MC1HydPressSignalDataFault (Fault record number 0 shows a fault report indicating an error in the MCP1 pressure sensor data).

[0092] Dem_FaultMemory.DetailFault._0_.FaultStatus=175 (The current fault is displayed as the 0th fault status recorded).

[0093] Dem_FaultMemory.DetailFault._1_.FaultId=e_Flt_MC2HydPressSignalDataFault (Fault record number 1 shows a fault report indicating an error in the MCP2 pressure sensor data).

[0094] Dem_FaultMemory.DetailFault._1_.FaultStatus=175 (The first recorded fault status is displayed as the current fault).

[0095] In the above method, compared with the actual sensor chip test, which always issues a normal CRC due to the characteristics of the actual sensor chip and cannot be modified externally, thus failing to meet the test item, this application can be arbitrarily modified to obtain the faulty CRC-error CRC command and obtain the ECU identification result.

[0096] This application provides a method for testing the cyclic redundancy check code recognition capability of an electronic controller, and further includes: Record the fault injection time point when the error check code command is sent, and collect the abnormal fault time point when the electronic controller obtains the abnormal identification result. Based on the time difference between the fault injection time point and the abnormal fault time point, evaluate the electronic controller and obtain the evaluation result.

[0097] In one embodiment, using simulated sensors for testing, compared to using real sensors, offers the advantage of simulating fault signals without damaging components. It also simulates the maximum and minimum signal values ​​of the sensor, expanding the signal value test coverage. This includes, but is not limited to, tests that meet functional safety requirements such as FTTI / FDTI / fault injection / error guessing. For example, in testing CRC error identification, the fault injection time is set to the point T0 when the configuration error CRC command is sent. The time T1 when the ECU detects the abnormal signal fault is monitored. The FTTI time is calculated as T1 - T0 = 0.003375s. If the FTTI requirement of ≤250ms is met, the test passes. Figure 13 The diagram shown is a simplified illustration of a host computer displaying FTTI-related information in ECU functional safety, as provided in an embodiment of this application.

[0098] Therefore, using simulated sensors can meet most functional safety testing requirements. Fault injection / error guessing tests can be performed without damaging real sensors, reducing testing costs to some extent. Furthermore, as functional safety development matures, it increases the feasibility of future boundary value testing, interface consistency testing, robustness testing, performance testing, and stress testing. Conversely, using real sensors cannot fully cover most functional safety tests. Secondly, simulated sensors can be customized for different projects or protocols, reducing the configuration requirements of the testing environment / conditions and laying the foundation for future updates and iterations. It also increases the feasibility for low-level interface developers to perform interface debugging later.

[0099] Based on the same concept, embodiments of this application provide a testing device for an electronic controller, such as... Figure 14 As shown, this is applicable to a vehicle braking system. The electronic controller is connected to an analog sensor via an analog relay and includes: Control unit 1401 is used to control the analog relay to connect the analog sensor and the electronic controller. The analog sensor includes one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The first test unit 1402 is used to trigger the corresponding test item in the analog sensor to generate a test signal and send the test signal to the electronic controller. The test signal is used to test the signal processing performance of the electronic controller. The second test unit 1403 is used to evaluate the electronic controller based on the processing result of the test signal by the electronic controller, and obtain the evaluation result, which is used to characterize the signal processing performance quality of the electronic controller.

[0100] Optionally, the triggered test item is a signal value recognition test item, and the first test unit 1402 is specifically used for: The signal value recognition test item in the analog sensor is triggered to generate a fast frame signal value command, and the fast frame signal value command is sent to the electronic controller; The second test unit 1403 is specifically used to: obtain the identification signal value of the command signal value in the fast frame signal value command by the electronic controller, and obtain the evaluation result based on the signal difference between the command signal value and the identification signal value, wherein the command signal value is any signal value in the range of executable signal values ​​of the fast frame signal value command.

[0101] Optionally, the triggered test item is the system time base identification test item. The first test unit 1402 is specifically used to: trigger the system time base identification test item in the analog sensor to generate a system time base command, and send the system time base command to the electronic controller; The second test unit 1403 is specifically used to: obtain the identification time base value of the system time base value in the system time base command by the electronic controller, and obtain the evaluation result based on the time base difference between the system time base value and the identification time base value.

[0102] Optionally, the triggered test item is a fault code and status bit recognition test item. The first test unit 1402 is specifically used to: trigger the fault code and status bit recognition test item in the analog sensor to generate fault code and status bit commands, and send the fault code and status bit commands to the electronic controller. The second test unit 1403 is specifically used to: obtain the fault identification result of the electronic controller for the fault code and status bit command, and evaluate the electronic controller according to the fault identification result to obtain the evaluation result.

[0103] Optionally, the triggered test item is a cyclic redundancy check code recognition test item. The first test unit 1402 is specifically used to: trigger the cyclic redundancy check code recognition test item in the analog sensor to generate an error check code command, and send the error check code command to the electronic controller. The second test unit 1403 is specifically used to: obtain the abnormal identification result of the electronic controller for the error check code command, and evaluate the electronic controller according to the abnormal identification result to obtain the evaluation result.

[0104] Optionally, the second test unit 1403 is further configured to: record the fault injection time point when the error check code command is sent, and collect the abnormal fault time point when the electronic controller obtains the abnormal identification result, and evaluate the electronic controller based on the time difference between the fault injection time point and the abnormal fault time point to obtain an evaluation result.

[0105] Optionally, the electronic controller is connected to a real sensor via a real relay. The real sensor has the same function as the sensor actually used by the controller in the braking system. The control unit 1401 is also used to control the real relay to disconnect the connection between the real sensor and the electronic controller.

[0106] Optionally, the first test unit 1402 is further configured to: initialize and configure each test item of the analog sensor so that each test item generates a corresponding command when triggered to test the electronic controller.

[0107] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0108] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to this application. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0109] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0110] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0111] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

Claims

1. A testing method for an electronic controller, characterized in that, Applicable to vehicle braking systems, the electronic controller is connected to analog sensors via analog relays, and the method includes: The analog relay is controlled to connect the analog sensor to the electronic controller. The analog sensor includes one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The test items include test data. The corresponding test item in the simulated sensor is triggered to generate a test signal, and the test signal is sent to the electronic controller. The test signal is used to test the signal processing performance of the electronic controller, and the test signal carries the test data of the corresponding test item. Based on the processing results of the test signal by the electronic controller, the electronic controller is evaluated to obtain evaluation results, which are then used to characterize the signal processing performance quality of the electronic controller.

2. The method as described in claim 1, characterized in that, The triggered test item is a signal value recognition test item. The triggering of the corresponding test item in the analog sensor generates a test signal, and the test signal is sent to the electronic controller, including: The signal value recognition test item in the analog sensor is triggered to generate a fast frame signal value command, and the fast frame signal value command is sent to the electronic controller; The step of evaluating the electronic controller based on the processing result of the test signal by the electronic controller and obtaining the evaluation result includes: The electronic controller obtains the identification signal value of the command signal value in the fast frame signal value command, and obtains the evaluation result based on the signal difference between the command signal value and the identification signal value. The command signal value is any signal value within the range of executable signal values ​​of the fast frame signal value command.

3. The method as described in claim 1, characterized in that, The triggered test item is the system time base identification test item. The triggering of the corresponding test item in the analog sensor generates a test signal, and the test signal is sent to the electronic controller, including: The system time base identification test item in the analog sensor is triggered to generate a system time base command, and the system time base command is sent to the electronic controller; The step of evaluating the electronic controller based on the processing result of the test signal by the electronic controller and obtaining the evaluation result includes: The electronic controller obtains the identification time base value of the system time base value in the system time base command, and obtains the evaluation result based on the time base difference between the system time base value and the identification time base value.

4. The method as described in claim 1, characterized in that, The triggered test items are fault code and status bit recognition test items. The triggering of the corresponding test item in the simulated sensor generates a test signal, and the test signal is sent to the electronic controller, including: The fault code and status bit recognition test item in the simulated sensor is triggered to generate fault code and status bit commands, and the fault code and status bit commands are sent to the electronic controller; The step of evaluating the electronic controller based on the processing result of the test signal by the electronic controller and obtaining the evaluation result includes: The electronic controller obtains the fault identification results of the fault code and status bit command, and evaluates the electronic controller based on the fault identification results to obtain the evaluation results.

5. The method as described in claim 1, characterized in that, The triggered test item is a cyclic redundancy check code recognition test item. The step of triggering the corresponding test item in the simulated sensor to generate a test signal and sending the test signal to the electronic controller includes: The cyclic redundancy check code identification test item in the analog sensor is triggered to generate an error check code command, and the error check code command is sent to the electronic controller; The step of evaluating the electronic controller based on the processing result of the test signal by the electronic controller and obtaining the evaluation result includes: Obtain the anomaly identification result of the electronic controller for the error check code command, and evaluate the electronic controller based on the anomaly identification result to obtain the evaluation result.

6. The method as described in claim 5, characterized in that, Also includes: Record the fault injection time point when the error check code command is sent, and collect the abnormal fault time point when the electronic controller obtains the abnormal identification result. Based on the time difference between the fault injection time point and the abnormal fault time point, evaluate the electronic controller and obtain the evaluation result.

7. The method according to any one of claims 1-6, characterized in that, The electronic controller is connected to real sensors via real relays, and these real sensors have the same function as the sensors actually used by the controller in the braking system. Before triggering the generation of a test signal for the corresponding test item in the simulated sensor, the method further includes: The real relay is controlled to disconnect the real sensor from the electronic controller.

8. The method according to any one of claims 1-6, characterized in that, Before controlling the analog relay to connect the analog sensor and the electronic controller, the method further includes: Initialize the configuration of each test item of the analog sensor so that each test item generates a corresponding command when triggered to test the electronic controller.

9. A testing device for an electronic controller, characterized in that, Applicable to vehicle braking systems, the electronic controller is connected to analog sensors via analog relays, and the testing device includes: The control unit is used to control the analog relay to connect the analog sensor and the electronic controller. The analog sensor includes one or more of the following test items: signal value recognition, system time base recognition, fault code and status bit recognition, and cyclic redundancy check code recognition. The first test unit is used to trigger the corresponding test item in the analog sensor to generate a test signal and send the test signal to the electronic controller. The test signal is used to test the signal processing performance of the electronic controller. The second testing unit is used to evaluate the electronic controller based on the processing result of the test signal by the electronic controller, and obtain the evaluation result, which is used to characterize the signal processing performance quality of the electronic controller.

10. The testing apparatus as described in claim 9, characterized in that, The triggered test item is the signal value recognition test item, and the first test unit is specifically used for: The signal value recognition test item in the analog sensor is triggered to generate a fast frame signal value command, and the fast frame signal value command is sent to the electronic controller; The second test unit is specifically used for: The electronic controller obtains the identification signal value of the command signal value in the fast frame signal value command, and obtains the evaluation result based on the signal difference between the command signal value and the identification signal value. The command signal value is any signal value within the range of executable signal values ​​of the fast frame signal value command.

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