Asymmetric BTB connector test fixture and calibration method thereof
By designing an asymmetric BTB connector test fixture and employing a combined calibration method of multiple circuit modules and a single probe, the problems of cumbersome testing and poor reliability of existing BTB connectors are solved, achieving independent performance characterization and lifespan extension.
Patent Information
- Application Number
- CN202511372250.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-24
- Publication Date
- 2025-11-14
AI Technical Summary
Existing BTB connector testing methods are cumbersome, costly, and difficult to independently characterize the performance of male and female terminals. They also have poor testing reliability, large calibration errors, and short connector lifespan.
Design an asymmetric BTB connector test fixture comprising multiple circuit modules and a single probe. Calibration is performed by combining different circuit modules, supporting independent performance characterization of the male or female terminals of the BTB connector, reducing the number of mating cycles, and employing a specific circuit structure for load matching and delay calibration.
This enables independent performance characterization of the male or female terminals of BTB connectors, improving testing efficiency and connector lifespan, reducing calibration errors, and ensuring the accuracy and reliability of test results.
Smart Images
Figure CN120948836A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of microwave radio frequency measurement technology, and in particular to an asymmetric BTB connector test fixture and its calibration method. Background Technology
[0002] Currently, the mainstream testing method for BTB (board-to-board) connectors involves soldering or mounting the male and female ends of the connector separately in a test fixture composed of multiple or multi-layer PCBs, and then connecting it to a vector network analyzer (VNA) via two RF probes or cables to form a complete test loop. However, this method is not only cumbersome and costly, but also has testing limitations: First, it cannot support independent performance characterization of male or female connectors, making it difficult to identify defects or parameter deviations in a single terminal. Second, male and female connectors undergo repeated insertion and removal during testing, which can easily lead to wear on the contact surface, fatigue of the mechanical structure, or even failure, affecting test reliability and connector lifespan. Third, in terms of calibration, existing methods often require the introduction of adapters that do not exist in actual testing to calibrate probes, resulting in calibration errors. In addition, traditional calibration methods cannot simultaneously incorporate test fixtures and probes into the calibration model, thus significantly limiting the overall test bandwidth and accuracy.
[0003] Therefore, designing a BTB connector test fixture and calibration method that can support independent performance characterization, accurate de-embedding, improved testing efficiency, and extended connector lifespan for the male or female ends of BTB connectors is a technical problem that urgently needs to be solved. Summary of the Invention
[0004] The purpose of this application is to overcome the above-mentioned technical problems and provide an asymmetric BTB connector test fixture and its calibration method, which can support independent performance characterization of the male or female ends of the BTB connector, accurate de-embedding, improved test efficiency and connector lifespan.
[0005] Firstly, one embodiment of this application discloses an asymmetric BTB connector test fixture, which adopts the following solution: An asymmetric BTB connector test fixture, comprising: The board body is provided with pads and circuit components. The pads are for the pins of the BTB connector to connect. The circuit components include: a fixture main circuit module, a standard component common circuit module, a transmission line reflection standard component, a transmission line matching load component circuit module, a probe matching load component circuit module, a first delay line standard component circuit module, and a second delay line standard component circuit module. The pads are electrically connected to the fixture main circuit module. A probe, configured as a single probe, is used to connect to the VNA and sequentially electrically connect to one of the circuit components, the VNA having a first port and a second port; Wherein, when the probe and the standard component share a circuit module for electrical connection, they form a through standard component; When the standard component shared circuit module is electrically connected to the second port alone, it serves as a transmission line reflection standard component. When the probe is electrically connected to the probe matching load circuit module, a probe matching load is formed; When the probe is electrically connected to the transmission line matching load circuit module, a transmission line matching load is formed. When the probe is electrically connected to the first delay line standard circuit module, it forms the first delay line standard. When the probe is electrically connected to the second delay line standard circuit module, a second delay line standard is formed; When the probe is connected to the first port alone and suspended, it serves as a probe reflection standard. The BTB connector undergoes de-embedding calibration sequentially through the through standard component, the transmission line reflection standard component, the probe reflection standard component, the probe matching load component, the transmission component matching load component, the first delay line standard component, and the second delay line standard component. After the BTB connector test fixture completes the de-embedding calibration, the first port is electrically connected to the probe via an adapter, and the probe is pressed against the pin to be tested of the BTB connector. The second port is electrically connected to the main circuit module of the fixture via an adapter to test the BTB connector.
[0006] By adopting the above technical solution, the board body is equipped with pads and circuit sections. The pads are for BTB connector pin connections, and the circuit section contains multiple circuit modules. The pads are electrically connected to the main circuit module of the fixture, providing a stable connection foundation for the BTB connector, enabling the connector to be accurately connected to the test system. A single probe is used to connect to the VNA and sequentially to one of the circuit sections, allowing flexible switching between different circuit modules and facilitating the construction of various standard components. The probe and standard component share a circuit module for electrical connection to form a through standard component. The standard component's shared circuit module is separately electrically connected to the second port as a transmission line reflection standard component, providing accurate through and transmission line reflection calibration standards for testing. The probe and probe matching load circuit module are electrically connected to form a probe matching load component, and the transmission line matching load circuit module is individually connected to the second port. The probe is electrically connected to the second port as a transmission line matching load component to provide a load calibration standard for the transmission line section; the probe is electrically connected to the first delay line standard circuit module to form the first delay line standard component, and electrically connected to the second delay line standard circuit module to form the second delay line standard component, which can provide different delay calibration standards for testing to meet the calibration and testing requirements of broadband; the probe is individually connected to the first port and suspended as a probe reflection standard component, which can be used for the probe reflection calibration standard; the BTB connector is sequentially de-embedded and calibrated by multiple standard components, which can effectively eliminate the influence of other factors in the test system besides the connector itself, and improve the accuracy and reliability of the test; after the de-embedded calibration is completed, the BTB connector is tested through a specific connection method to ensure that the test results can truly reflect the performance of the connector.
[0007] Optionally, the standard component shared circuit module (2) includes: a through standard component circuit unit and a transmission line reflection standard component circuit unit. When the probe is electrically connected to the shared circuit unit, it forms the through standard component, and when the shared circuit unit is used independently, it forms the transmission line reflection standard component.
[0008] By adopting the above technical solution, the through standard circuit unit and the transmission line reflection standard circuit unit are combined into a common circuit module. When the probe is electrically connected to the through standard circuit unit, a through standard is formed. When the transmission line reflection standard circuit unit is used independently, it can form a transmission line reflection standard. This can provide different types of standard parts for asymmetric BTB connector test fixtures and help reduce the complexity of calibration parts.
[0009] Optionally, the load unit in the probe matching load circuit module is composed of two parallel 100Ω chip resistors, and a ring ground structure is adopted in the probe matching load circuit module.
[0010] By adopting the above technical solution, a specific impedance matching can be formed by using two parallel 100Ω chip resistors to form a load unit; the probe matching load circuit module adopts a ring common ground structure, which can optimize the common ground effect between the probe and the board. Combined with the structure of the board, probe and other components, the calibration and testing of BTB connectors can be realized.
[0011] Optionally, the transmission line matching load circuit module has two 100Ω chip resistors connected in parallel at the end of the microstrip transition line as 50Ω matching load terminals for the transmission line.
[0012] By adopting the above technical solution, two 100Ω chip resistors are connected in parallel at the end of the microstrip transition line of the transmission line matching load circuit module as 50Ω matching load terminals of the transmission line, which can form a transmission line matching load device. Together with other circuit modules and probes, it can realize the de-embedding calibration and testing of BTB connectors.
[0013] Optionally, the fixture main circuit module, the standard component common circuit module, the transmission line matching load component circuit module, the first delay line standard component circuit module, and the second delay line standard component circuit module are all provided with connection ports on the board body. During de-embedding calibration, the second port is connected to each of the connection ports via an adapter.
[0014] By adopting the above technical solution, connection ports are set for each circuit module on the board, and the second port of the VNA is connected to each connection port via an adapter during de-embedding calibration, which facilitates the connection between the VNA and each circuit module and enables more efficient completion of the de-embedding calibration work.
[0015] Optionally, the transmission line portion of the fixture main circuit module, the standard component common circuit module, the transmission line matching load component circuit module, the first delay line standard component circuit module, and the second delay line standard component circuit module all include microstrip transition lines and CPWG transmission lines, and are connected to the connection port.
[0016] By adopting the above technical solution, the transmission line section includes microstrip transition lines and CPWG transmission lines, enabling functional complementarity between different types of transmission lines. The microstrip transition line allows for a smooth signal transition between the pads and the CPWG transmission line, while the CPWG transmission line offers superior electromagnetic shielding and low radiation characteristics. The combination of these two technologies improves the stability and quality of signal transmission. The connection port design facilitates electrical connections with other circuit modules or devices, creating a complete circuit path for the entire test fixture and ensuring smooth calibration and testing.
[0017] Secondly, one embodiment of this application discloses an asymmetric BTB connector test fixture de-embedding calibration and testing method, which adopts the following scheme: A method for de-embedding calibration and testing of an asymmetric BTB connector test fixture, applied to the aforementioned test fixture, includes: Perform the calibration steps: Set the operating frequency of the TRL calibrator in the VNA; Connect the first port of the VNA to the probe via an adapter to perform reflection and matching calibration; Connect the second port to the connection port on the board via an adapter to perform reflection and matching calibration; After connecting the first port to the probe, the probe is sequentially connected to the through standard, the first delay line standard and the second delay line standard connected to the second port for through and delay calibration. Perform the test steps: The first port and the second port are respectively connected to the probe and the target connection port on the board through adapters. The target connection port is the connection port corresponding to the main circuit module of the fixture. Connect the pins of the BTB connector to the pads of the board. The probe is pressed onto the pin header of the BTB connector and grounded with the CPWG to establish a test circuit and perform measurements.
[0018] By adopting the above technical solution, setting the operating frequency of the TRL calibrator in the VNA can determine an accurate frequency range for subsequent calibration and testing, ensuring that calibration and testing are performed under appropriate frequency conditions. Connecting the first port of the VNA to the probe via an adapter and performing reflection and matching calibration can calibrate the reflection and matching at the connection between the first port of the VNA and the probe, improving measurement accuracy. Connecting the second port of the VNA to the connection port on the board via an adapter and performing reflection and matching calibration can calibrate the reflection and matching at the connection between the second port of the VNA and the board, further improving measurement accuracy. After connecting the first port of the VNA to the probe, the probe is then sequentially connected to the port connected to the second port of the VNA. Through-pass and delay calibrations are performed on the through-pass standard, the first delay line standard, and the second delay line standard to calibrate the through-pass and delay characteristics of the measurement system, making the measurement results more consistent with actual conditions. The first and second ports of the VNA are connected to the probe and the target connection port on the board respectively through adapters. The target connection port is the connection port corresponding to the main circuit module of the fixture, which can establish a stable signal transmission path and ensure smooth testing. Connecting the pins of the BTB connector to the pads on the board can realize a reliable connection between the BTB connector and the test fixture. Pressing the probe onto the pin header of the BTB connector and grounding it with the CPWG establishes a test loop and performs measurements, which can accurately measure the relevant parameters of the BTB connector.
[0019] Optionally, the TRL calibration kit includes a through standard, a transmission line reflection standard, a probe reflection standard, a probe matching load, a transmission line matching load, a first delay line standard, and a second delay line standard.
[0020] By adopting the above technical solution, the specific composition of the TRL calibration component is clarified, including a through standard component, a transmission line reflection standard component, a probe reflection standard component, a probe matching load component, a transmission component matching load component, a first delay line standard component, and a second delay line standard component. This provides an accurate calibration basis for VNA in BTB connector test fixture de-embedding calibration and testing, and helps to improve the accuracy of calibration and testing.
[0021] In summary, this application includes at least one of the following beneficial technical effects: 1. By adopting an asymmetric BTB connector test fixture, the probe and transmission line are used to perform collaborative testing on the BTB connector. This supports independent performance characterization of male or female connectors and can identify defects or parameter deviations in a single terminal. 2. The structure of the asymmetric BTB connector test fixture avoids repeated insertion and removal of the male and female connectors, reducing contact surface wear, mechanical fatigue and failure, and improving test reliability and connector lifespan; 3. By using straight-through standard parts, transmission line reflection standard parts, probe reflection standard parts, probe matching load parts, transmission component matching load parts, first delay line standard parts, and second delay line standard parts, the board end part and probes in the test fixture can be de-embedded and calibrated together, reducing calibration errors and improving test efficiency and accuracy.
[0022] 4. The standard component shared circuit module includes a through standard component circuit unit and a transmission line reflection standard component circuit unit, which reduces the complexity of the calibration components. Attached Figure Description
[0023] Figure 1 This is a schematic diagram showing the division of circuit modules on an asymmetric BTB connector test fixture board according to an embodiment of this application; Figure 2 This is a schematic diagram of the connection structure during testing of an asymmetric BTB connector test fixture disclosed in an embodiment of this application; Figure 3 This is a schematic diagram of the connection structure of an asymmetric BTB connector test fixture disclosed in an embodiment of this application during Thru calibration; Figure 4 This is a schematic diagram of the connection structure for VNA port 1 reflection calibration of an asymmetric BTB connector test fixture disclosed in an embodiment of this application. Figure 5This is a schematic diagram of the connection structure for VNA port 2 reflection calibration using an asymmetric BTB connector test fixture disclosed in an embodiment of this application. Figure 6 This is a schematic diagram of the connection structure for VNA port 1 match calibration of an asymmetric BTB connector test fixture disclosed in an embodiment of this application. Figure 7 This is a schematic diagram of the connection structure for VNA port 2 match calibration of an asymmetric BTB connector test fixture disclosed in an embodiment of this application; Figure 8 This is a schematic diagram of the connection structure for calibrating a first delay line standard component using an asymmetric BTB connector test fixture disclosed in an embodiment of this application. Figure 9 This is a schematic diagram of the connection structure for line calibration of a second delay line standard component using an asymmetric BTB connector test fixture disclosed in an embodiment of this application; Figure 10 This is a schematic diagram showing the phase difference between the signal loop formed and Thru when the probe contacts the end of the microstrip transition line of the first delay line standard circuit module. Figure 11 This is a schematic diagram showing the phase difference between the signal loop formed and Thru when the probe contacts the end of the microstrip transition line of the second delay line standard circuit module. Figure 12 This is a flowchart illustrating a calibration method for an asymmetric BTB connector test fixture, as disclosed in another embodiment of this application.
[0024] Explanation of reference numerals in the attached figures: 1. Fixture main circuit module; 2. Standard component common circuit module; 3. Transmission line matching load circuit module; 4. Probe matching load circuit module; 5. First delay line standard component circuit module; 6. Second delay line standard component circuit module; 10. Board body; 11. Pads; 12. Circuit section; 20. Probes; 30. Chip resistors. Detailed Implementation
[0025] The present application will be further described in detail below with reference to the accompanying drawings.
[0026] Embodiments of this application will now be described in more detail with reference to the accompanying drawings. While embodiments of this application are shown in the drawings, it should be understood that this application may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to make this application more thorough and complete, and to fully convey the scope of this application to those skilled in the art.
[0027] The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The singular forms “a” and “the” as used in this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any or all possible combinations of one or more of the associated listed items.
[0028] It should be understood that although the terms "first," "second," etc., may be used in this application to describe various information, such information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another. For example, without departing from the scope of this application, first information may also be referred to as second information, and similarly, second information may also be referred to as first information. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.
[0029] The technical solutions of the embodiments of this application are described in detail below with reference to the accompanying drawings.
[0030] [First Embodiment] Please see Figure 1 and Figure 2 The first embodiment of this application discloses an asymmetric BTB connector test fixture, which includes a board body 10 and a probe 20. The board body 10 is provided with a pad 11 and a circuit section 12. The pad 11 is for connecting the pins of the BTB connector (corresponding to the male or female end). The probe 20 is located on the board body 10 and is used to connect the VNA and one of the circuit sections 12 in sequence.
[0031] In order to remove the performance of probe 20 and the transmission line and measure the performance of the BTB connector itself independently, the BTB connector test fixture needs to be calibrated using a TRL calibrator. This allows the test fixture to independently calibrate the BTB connector, improving the testing accuracy of the BTB connector. It should be noted that... Figure 2 The diagram shows multiple probes 20, but in actual applications, only a single probe 20 is used to connect to each circuit module in sequence. This can be understood as the state when the probe 20 is connected to different circuit modules.
[0032] Specifically, the pads 11 on board 10 are specifically designed for connecting BTB connector pins. Their shape is typically adapted to the pin arrangement of the BTB connector to ensure accurate and stable connections. The pads 11 are generally made of a highly conductive metal, such as copper, and may also be gold-plated to improve their oxidation resistance and conductivity.
[0033] See Figure 2The circuit section 12 of the board 10 includes a fixture main circuit module 1, a standard component common circuit module 2, a transmission line matching load component circuit module 3, a probe matching load component circuit module 4, a first delay line standard component circuit module 5, and a second delay line standard component circuit module 6. The pads 11 are electrically connected to the fixture main circuit module 1. Each circuit module is electrically connected to the probe 20 to form multiple TRL calibration components (Thru standard component, two reflection standards components (Reflect1, Reflect2), probe matching load component (Match1), transmission component matching load component (Match2), first delay line standard component (Line1), and second delay line standard component (Line2), such as... Figure 2 (As shown).
[0034] The fixture main circuit module 1 is one of the core components of the entire circuit section 12, and it mainly serves to connect and transmit signals. This module typically consists of a printed circuit board (PCB) and circuit traces on it. In terms of connection, it achieves electrical connection with other circuit modules through methods such as soldering.
[0035] Standard component shared circuit module 2 is a circuit module for both through-type standard components and transmission line reflection standard components. The through-type standard component circuit unit is mainly used to realize direct signal transmission between fixtures; it generally consists of a short transmission line, which can be a microstrip line or stripline, etc. The transmission line reflection standard component circuit unit is used to generate reflected signals, typically consisting of an element with specific reflection characteristics and a transmission line, such as a terminating load and a transmission line.
[0036] Specifically, when probe 20 is electrically connected to the through standard circuit unit, it forms the through standard Thru; when the shared circuit unit is used independently, it forms the transmission line reflection standard Reflect2. Additionally, when probe 20 is connected to and suspended by the first port of the VNA alone, it serves as the probe reflection standard Reflect1.
[0037] The function of transmission line matching load circuit module 3 is to provide an ideal load for the transmission line for matching calibration. Two 100Ω surface mount resistors 30 connected in parallel at the end of the microstrip transition line form the 50Ω matching load termination for the transmission line. The microstrip transition line is an important component of this module; it is used to achieve the transition between the pads and the CPWG transmission line. Its shape and size are optimized according to specific design requirements. The transmission line matching load independently constitutes the matching load module Match2.
[0038] The load unit in the probe-matched load circuit module 4 consists of two parallel 100Ω surface mount resistors 30. A ring-shaped common ground structure is used in this module to achieve a common ground between the probe 20 and the load. The two parallel 100Ω resistors then serve as the 50Ω matching load termination for the probe 20. This ring-shaped common ground structure improves the stability of signal transmission.
[0039] The first delay line standard circuit module 5 and the second delay line standard circuit module 6 are mainly used to generate specific delay signals to meet calibration and testing requirements. They are typically composed of a transmission line of a specific length, the length of which determines the delay time. The transmission line can be a microstrip line or a CPWG transmission line, etc. Specifically, when probe 20 is electrically connected to the first delay line standard circuit module 5, it forms the first delay line standard Line 1; when probe 20 is electrically connected to the second delay line standard circuit module 6, it forms the second delay line standard Line 2.
[0040] The combinational logic of these circuit modules enables them to work collaboratively through reasonable circuit design and connection methods. For example, during calibration, probe 20 connects to different circuit modules sequentially, utilizing the characteristics of each module to complete the calibration process. During testing, the cooperation of each module connects the VNA to the BTB connector, enabling the testing of the BTB connector.
[0041] Specifically, probe 20 is an important component of the test fixture, used to connect the VNA and circuit section 12. In terms of installation, probe 20 is fixed to the board 10 using a specific clamp and can be fine-tuned to ensure accurate connection with circuit section 12. During calibration, probe 20 sequentially connects to various modules in circuit section 12, such as standard component common circuit module 2 and transmission line matching load component circuit module 3. During testing, probe 20 presses against the pin under test of the BTB connector, transmitting the VNA signal to the BTB connector.
[0042] Please see Figures 3-9 This is a schematic diagram showing the connection between the VNA, probe 20 and each circuit part 12 during the calibration process.
[0043] See Figure 3 This diagram illustrates the connection between probe 20 and standard part common circuit module 2 during Thru calibration of a standard part. Probe 20 is connected to fixture main circuit module 1. The first port (i.e., port 1) of the VNA is connected to probe 20 via an adapter (not shown in the diagram). The second port (i.e., port 2) of the VNA is connected to the corresponding port of standard part common circuit module 2 via an adapter (this loop completely includes all fixture parts), thereby realizing Thru calibration of the standard part.
[0044] See Figure 4 For Reflect calibration of VNA port 1, VNA port 1 is connected to probe 20 via an adapter (VNA port 2 does not need to be connected). For Reflect1, when probe 20 is suspended, it is in an open circuit state, and almost total reflection occurs at the end of probe 20.
[0045] See Figure 5 For the reflection calibration of VNA port 2, probe 20 is connected to standard component common circuit module 2. VNA port 2 is connected to the corresponding port of transmission line matching load component circuit module 3 via an adapter (VNA port 1 does not need to be connected). Standard component common circuit module 2 is in an open circuit state, and almost total reflection occurs at the transmission line terminal.
[0046] See Figure 6 For the match calibration of VNA port 1, probe 20 is connected to probe matching load circuit module 4. VNA port 1 is connected to probe 20 via an adapter (VNA port 2 does not need to be connected). Here, the two 100Ω resistors connected in parallel in probe matching load circuit module 4 serve as the 50Ω matching load termination for probe 20.
[0047] See Figure 7 For the match calibration of VNA port 2, probe 20 is connected to the fixture main circuit module 1. VNA port 2 is connected to the corresponding port of transmission line matching load circuit module 3 via an adapter (VNA port 1 does not need to be connected). Here, in transmission line matching load circuit module 3, two 100Ω resistors are connected in parallel at the end of the microstrip transition line, which serve as the 50Ω matching load termination of the transmission line.
[0048] See Figure 8 For line calibration of the first delay line standard, probe 20 is connected to the first delay line standard circuit module 5. Port 1 of the VNA is connected to probe 20 via an adapter, and port 2 of the VNA is connected to the corresponding port of the first delay line standard circuit module 5 via an adapter.
[0049] See Figure 9 For line calibration of the second delay line standard, probe 20 is connected to the second delay line standard circuit module 6. Port 1 of the VNA is connected to probe 20 via an adapter, and port 2 of the VNA is connected to the corresponding port of the second delay line standard circuit module 6 via an adapter.
[0050] Specifically, for Line1 and Line2, when probe 20 contacts the ends of the microstrip transition lines in the first delay line standard circuit module 5 and the second delay line standard circuit module 6, respectively, the resulting signal loops are 24mm and 6.1mm longer than Thru, respectively. At this time, their phase differences with Thru are as follows: Figure 10 and Figure 11 As shown, there are phase differences of 20-160° in the ranges of 0.45-3.6GHz and 0.77-14.26GHz, respectively. Combined with the substitution effect of Match on Line at low frequencies, coverage of 0-12GHz can be achieved.
[0051] Once the above steps are completed, the calibration is finished, and the performance de-embedding of probe 20 and the transmission line is complete. It should be noted that the order of the above steps is not limited. Additionally, the connection port on board 10 for each module can be a 2.92mm interface.
[0052] See Figure 2 This is a circuit connection diagram for testing after calibration. Probe 20 is connected to the main circuit module 1 of the fixture. Port 1 of the VNA is connected to probe 20 via an adapter, and port 2 of the VNA is connected to the corresponding port of the main circuit module 1 of the fixture via an adapter.
[0053] The implementation principle of this embodiment is as follows: By setting multiple circuit modules on the board 10, and using a single probe 20 in conjunction with these circuit modules to form an asymmetric BTB connector test fixture and TRL calibration components (straight-through standard, transmission line reflection standard, probe reflection standard, probe matching load, transmission line matching load, first delay line standard, and second delay line standard), the performance of the male or female end of the BTB connector can be independently characterized, accurately de-embedded, and the testing efficiency improved. Furthermore, during the testing process, the test face of the VNA can be accurately moved onto the BTB connector under test, improving testing accuracy. Simultaneously, it avoids the problem of repeated insertion and removal of the male and female connectors in traditional testing methods, reducing connector wear and mechanical fatigue, extending the connector's service life, and solving the problem of incomplete de-embedding.
[0054] [Second Embodiment] Please see Figure 12 The second embodiment of this application discloses an asymmetric BTB connector test fixture de-embedding calibration and testing method, applied to the BTB connector test fixture disclosed in the first embodiment above. The method includes the following steps: S1. Set the operating frequency of the TRL calibrator in the VNA.
[0055] The TRL calibration kit includes a through standard (Thru), two reflection standards (Reflect1, Reflect2), a probe matching load (Match1), a transmission matching load (Match2), a first delay line standard (Line1), and a second delay line standard (Line2). When setting the operating frequency, the operator can input a specific frequency value through the VNA's interface or select a preset frequency range. Of course, the specific value or range of this operating frequency is not limited; the operator can set it based on actual conditions.
[0056] S2. Connect the first port in the VNA to probe 20 via an adapter to perform reflection and matching calibration.
[0057] The adapter is used to establish the electrical connection between the VNA port and probe 20, and its type and specifications must be compatible with both the VNA port and probe 20. During reflection and matching calibration, the VNA sends a specific signal, which is transmitted through probe 20 to the corresponding circuit module. Then, calibration calculations are performed based on the reflected signal to ensure the accuracy and stability of signal transmission.
[0058] S3. Connect the second port of the VNA to the connection port on board 10 via an adapter to perform reflection and matching calibration.
[0059] Similarly, the adapter here serves as a connection. By connecting the second port of the VNA to the connection port on the board, another part of the test fixture can be calibrated, further improving the accuracy of the calibration.
[0060] S4. After connecting the first port of the VNA to the probe 20, connect the probe 20 to the through standard, the first delay line standard and the second delay line standard connected to the second port of the VNA in sequence to perform through and delay calibration.
[0061] During this process, the VNA records the signal transmission under different standard components. By comparing and calculating, it obtains accurate calibration parameters to eliminate the delay and error of the test fixture itself.
[0062] S5. Connect the first and second ports of the VNA to the probe 20 and the target connection port on the board 10 respectively through the adapter. The target connection port is the connection port corresponding to the fixture main circuit module 1.
[0063] This step is to establish a test loop by connecting the VNA to the BTB connector test fixture.
[0064] S6. Connect the pins of the BTB connector to the pads 11 of the board 10.
[0065] During connection, methods such as soldering can be used to ensure a firm connection between the pins and the pad 11, thereby enabling circuit conduction.
[0066] S7. Press probe 20 onto the pin header of the BTB connector and ground it with CPWG to establish a test circuit and perform measurement.
[0067] When probe 20 is pressed onto the pin header under test, the signal is transmitted to the BTB connector through probe 20, and then transmitted back to VNA through the circuit part 12 of the test fixture. VNA will analyze and measure the signal to obtain various performance parameters of the BTB connector.
[0068] The implementation principle of this embodiment is as follows: After setting the operating frequency, reflection and matching calibration are performed on the two ports of the VNA respectively, which ensures the accuracy of signal transmission. Calibration accuracy can be further improved by calibrating different standard components. During the testing process, by establishing a stable test circuit, the performance parameters of the BTB connector can be accurately measured, thereby enabling independent calibration and testing of the male or female terminals of the BTB connector, avoiding the limitations of traditional testing methods.
[0069] It should be noted that the asymmetric BTB connector test fixture calibration method disclosed in the second embodiment of this application is applied to the first embodiment, and therefore will not be described in detail here. Optionally, the various modules and other operations or functions in this embodiment are respectively for implementing the methods in the foregoing embodiments.
[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims
1. An asymmetric BTB connector test fixture, characterized in that, include: The board body (10) is provided with pads (11) and circuit parts (12). The pads (11) are for the pins of the BTB connector to be connected. The circuit parts (12) include: a fixture main circuit module (1), a standard part common circuit module (2), a transmission line matching load circuit module (3), a probe matching load circuit module (4), a first delay line standard part circuit module (5), and a second delay line standard part circuit module (6). The pads (11) are electrically connected to the fixture main circuit module (1). The probe (20) is configured as a single probe for electrically connecting the VNA and sequentially electrically connecting one of the circuit portions (12), the VNA being provided with a first port and a second port; Wherein, when the probe (20) is electrically connected to the first delay line standard circuit module (5), it forms the first delay line standard; When the probe (20) is electrically connected to the second delay line standard circuit module (6), a second delay line standard is formed; When the probe (20) is connected to the first port alone and suspended, it serves as a probe reflection standard. The BTB connector is de-embedded and calibrated sequentially through the through standard component, the transmission line reflection standard component, the probe reflection standard component, the probe matching load component, the transmission line matching load component, the first delay line standard component, and the second delay line standard component. After the BTB connector test fixture is de-embedded and calibrated, the first port is electrically connected to the probe (20) via an adapter, the probe (20) is pressed onto the pin to be tested of the BTB connector, and the second port is electrically connected to the fixture main circuit module (1) via an adapter to test the BTB connector.
2. The test fixture according to claim 1, characterized in that, The standard component shared circuit module (2) includes: a through standard component circuit unit and a transmission line reflection standard component circuit unit. When the probe (20) is electrically connected to the through standard component circuit unit, it forms the through standard component. When the transmission line reflection standard component circuit unit is used independently, it forms the transmission line reflection standard component.
3. The test fixture according to claim 1, characterized in that, The load unit in the probe matching load circuit module (4) is composed of two parallel 100Ω chip resistors (30), and a ring ground structure is adopted in the probe matching load circuit module (4).
4. The test fixture according to claim 3, characterized in that, In the transmission line matching load circuit module (3), two 100Ω chip resistors (30) are connected in parallel at the end of the microstrip transition line as 50Ω matching load terminals of the transmission line.
5. The test fixture according to claim 1, characterized in that, The fixture main circuit module (1), the standard part common circuit module (2), the transmission line matching load circuit module (3), the first delay line standard part circuit module (5), and the second delay line standard part circuit module (6) are all provided with connection ports on the board body (10). During de-embedding calibration, the second port is connected to each of the connection ports via an adapter.
6. The test fixture according to claim 5, characterized in that, The transmission line portions of the fixture main circuit module (1), the standard component common circuit module (2), the probe matching load component circuit module (4), the transmission line matching load component circuit module (3), the first delay line standard component circuit module (5), and the second delay line standard component circuit module (6) all include microstrip transition lines and CPWG transmission lines, and are connected to the connection port.
7. A calibration method for an asymmetric BTB connector test fixture, characterized in that, The test fixture used in any one of claims 1 to 6 comprises: Perform the calibration steps: The operating frequency of the TRL calibrator is set in the VNA, which includes a first port and a second port; Connect the first port to the probe (20) via an adapter to perform reflection and matching calibration; Connect the second port to the connection port on the board (10) via an adapter to perform reflection and matching calibration; After connecting the first port to the probe (20), the probe (20) is sequentially connected to the through standard, the first delay line standard and the second delay line standard connected to the second port for through and delay calibration. Perform the test steps: The first port and the second port are connected to the probe (20) and the target connection port on the plate (10) respectively via adapters. The target connection port is the connection port corresponding to the main circuit module (1) of the fixture. Connect the pins of the BTB connector to the pads (11) of the board (10); The probe (20) is pressed onto the pin header of the BTB connector and grounded with the CPWG to establish a test circuit and perform measurements.
8. The method according to claim 7, characterized in that, The TRL calibration kit includes a through standard, a transmission line reflection standard, a probe reflection standard, a probe matching load, a transmission line matching load, a first delay line standard, and a second delay line standard.