Direct-current power supply multifunctional comprehensive test method and system

Abstract

The invention relates to the technical field of electronic measurement, in particular to a multifunctional comprehensive test method and system for a direct-current power supply, and the method comprises the steps: initializing a test; a static performance test step; a dynamic performance test step: driving a direct-current electronic load module to execute a time sequence instruction sequence in the dynamic load test file, and acquiring an output voltage and an output current waveform through a high-speed data acquisition module in the execution process; a ripple noise test step: switching the high-speed data acquisition module to an alternating current coupling mode and acquiring a high-frequency noise waveform in a constant load current section in the time sequence instruction sequence; a correlation analysis step; and a test termination step: controlling the load to return to zero and closing the tested DC power supply. Through automatic configuration and test execution of the system, the complexity of manual operation is reduced, and the test efficiency is improved. And especially in a high-frequency test scene, the test time is remarkably saved through automatic execution.

Description

Technical Field

[0001] This invention relates to the field of electronic measurement technology, and in particular to a multifunctional integrated testing method and system for DC power supplies. Background Technology

[0002] DC power supplies, as core power supply units, are widely used in industrial control, communication equipment, new energy vehicles, and aerospace. Their performance directly affects the stability and reliability of the entire power system. Currently, DC power supply testing typically employs a discrete testing method, using different specialized equipment (such as electronic loads, oscilloscopes, and data acquisition cards) to test their output voltage accuracy, load regulation, ripple noise, and dynamic response characteristics separately.

[0003] Existing testing methods have the following significant drawbacks:

[0004] Low testing efficiency: Testing each performance indicator requires rebuilding the test platform, connecting equipment, and setting parameters. The process is cumbersome and time-consuming, which cannot meet the needs of modern production lines for rapid full inspection of power supplies.

[0005] Isolated test data: Data obtained from discrete tests is isolated and lacks correlation analysis. For example, it is impossible to effectively analyze the intrinsic relationship between the power supply's output voltage recovery process and its own temperature rise changes when experiencing dynamic load transitions, making it difficult to make an in-depth evaluation of the power supply's overall performance.

[0006] Insufficient dynamic performance testing: Traditional methods simulate load change patterns in a single way (such as step transitions), which cannot realistically reproduce the random and complex load dynamic characteristics generated by complex electrical equipment (such as frequency-driven motors and intermittently operating RF modules), resulting in insufficient test coverage.

[0007] Poor test consistency: The test relies heavily on the experience of the operators for manual testing. There may be slight differences in the test steps and judgment criteria between different personnel or at different times, which affects the consistency and comparability of the test results.

[0008] Therefore, there is an urgent need in this field for a comprehensive testing method that can integrate multiple testing functions, automate execution, and deeply explore the correlation between various performance parameters. Summary of the Invention

[0009] To achieve the above objectives, the present invention provides a multi-functional comprehensive testing method and system for DC power supplies. The multi-functional comprehensive testing method for DC power supplies includes the following steps:

[0010] Test initialization steps: Configure the rated parameters and data acquisition parameters of the DC power supply under test through the host computer and load a dynamic load test file. The dynamic load test file contains a sequence of timing instructions generated based on the load characteristics of the target application scenario to simulate complex load changes in real working conditions.

[0011] Static performance test steps: Control the DC electronic load module to make the load current increase and decrease in preset steps between zero and the rated output current, and wait for the output voltage to stabilize after each current change. Simultaneously collect the output voltage, output current and power device temperature data of the DC power supply under test through the high-speed data acquisition module and temperature sensing module.

[0012] Dynamic performance test steps: Drive the DC electronic load module to execute the timing instruction sequence in the dynamic load test file, and acquire the output voltage and output current waveforms through the high-speed data acquisition module during the execution process;

[0013] Ripple noise test procedure: During the constant load current segment in the timing command sequence, switch the high-speed data acquisition module to AC coupling mode and acquire high-frequency noise waveforms;

[0014] Correlation analysis steps: Establish a performance correlation database, correlate and store the voltage, current and temperature data collected in static performance testing, correlate and store the dynamic response parameters extracted from the waveform in dynamic performance testing with the corresponding load current change rate, correlate and store the ripple noise index obtained from the ripple noise test with the corresponding load current and temperature, and perform multi-dimensional data correlation analysis based on the performance correlation database.

[0015] Test termination procedure: Control the load to zero and turn off the DC power supply under test.

[0016] Preferably, the dynamic load test file is generated through the following process:

[0017] Analyze the operating modes of electrical equipment in the target application scenario to determine its typical and extreme load current variation characteristics, including the range of current variation amplitude, the range of current variation rate, and the duration distribution of different load states.

[0018] Based on the aforementioned variation characteristics, the upper limit of the load current command amplitude, the lower limit of the amplitude, the upper limit of the rate of change, and the range of constant current duration are set.

[0019] A random process generation algorithm is used to randomly generate load current command values ​​between the upper and lower limits of the amplitude, randomly generate the rate of change between adjacent command values ​​within the upper limit of the rate of change, and randomly generate the holding time of the constant current segment within the constant current duration.

[0020] The generated random instructions are combined in chronological order and timestamps are added to form the chronological instruction sequence.

[0021] Preferably, in the static performance test step, the delay time for waiting for the output voltage to stabilize after each change in load current is determined by the following method:

[0022] Obtain the output capacitance value, rated feedback loop bandwidth, and maximum load current value of the DC power supply under test;

[0023] Based on the output capacitance value and the maximum load current value, calculate the longest theoretical time required for the output voltage to recover from the maximum deviation to a stable state.

[0024] Based on the rated bandwidth of the feedback loop, calculate the setup time required for the loop response;

[0025] The larger of the longest theoretical time and the establishment time is taken and multiplied by a safety factor to obtain the delay time.

[0026] Preferably, in the ripple noise test step, after entering the constant load current range, there is a delay before starting to acquire the high-frequency noise waveform. The method for determining this delay time is as follows:

[0027] Obtain the expected output voltage value of the DC power supply under test under the constant load current value;

[0028] Real-time monitoring of the actual output voltage value of the DC power supply under test;

[0029] Calculate the deviation between the actual output voltage value and the expected output voltage value;

[0030] When the deviation remains below the preset deviation threshold for a short period of time, the output voltage is determined to be stable, and the high-frequency noise waveform is then collected.

[0031] Preferably, the process of extracting dynamic response parameters from the acquired output voltage waveform in the dynamic performance testing step includes:

[0032] The acquired output current waveform is mathematically differentiated to calculate its instantaneous rate of change;

[0033] Set a load current change rate threshold, and identify the moment when the instantaneous change rate of the output current waveform exceeds the threshold as the load jump moment;

[0034] Using the load transition moment as a reference, locate the corresponding response interval on the output voltage waveform;

[0035] Within the response range, find the overshoot peak point and undershoot valley point of the output voltage, and calculate the deviation amplitude of the voltage relative to the rated output voltage.

[0036] Starting from the trough point, analyze the output voltage waveform backward, calculate the time required for the output voltage value to enter and remain within the voltage band centered on the rated output voltage value and with a preset allowable deviation as the radius, and define this time as the recovery time.

[0037] Preferably, the multidimensional data association analysis in the association analysis step specifically includes:

[0038] Temperature-stability analysis: Load regulation and output voltage accuracy data collected at different power device temperature points are fitted into continuous curves, and their variation trends and slopes are analyzed to evaluate the impact of temperature on the static stability of DC power supply.

[0039] Rate of change-response analysis: Establish a three-dimensional relationship model between the load current change rate and the output voltage overshoot amplitude, undershoot amplitude and recovery time, and analyze the sensitivity of dynamic response characteristics to the degree of load change.

[0040] Load / Temperature-Ripple Analysis: Using different load current values ​​and different power device temperature values ​​as inputs, observe the changes in the peak-to-peak value and RMS value of the output ripple noise, and establish a multi-dimensional data spectrum characterizing the relationship between ripple and load and temperature.

[0041] Preferably, a self-test and fault diagnosis step is included before the static performance test step:

[0042] The DC electronic load module is controlled to make the load current zero, and the no-load output voltage value of the DC power supply under test is acquired through the high-speed data acquisition module.

[0043] Calculate the absolute deviation between the no-load output voltage value and the set rated output voltage value;

[0044] If the absolute deviation is greater than the first fault threshold, the output voltage reference of the tested DC power supply is determined to be faulty, and the test is terminated.

[0045] If the absolute deviation is less than the first fault threshold but greater than the second fault threshold, the output voltage accuracy of the tested DC power supply is determined to be deteriorated, the warning information is recorded and the test continues.

[0046] If the absolute deviation is less than the second fault threshold, the DC power supply under test is determined to be in normal initial state, and subsequent test steps are continued.

[0047] Preferably, before the DC electronic load module executes the timing instruction sequence, the instructions in the sequence are subjected to compliance checks and smoothing processing:

[0048] Read the current change and time interval between two adjacent instruction points in the timing instruction sequence, and calculate its rate of change;

[0049] Compare this rate of change with the maximum allowable conversion rate of the DC electronic load module itself;

[0050] If the calculated rate of change exceeds the maximum conversion rate, the current change segment is divided into several sub-segments by inserting intermediate command points to ensure that the rate of change of each sub-segment is less than or equal to the maximum conversion rate, thereby achieving smooth processing of the original command sequence and keeping it within the executable range of the DC electronic load module.

[0051] Preferably, after the correlation analysis step, a comprehensive performance evaluation step is also included:

[0052] Weighting coefficients are assigned to multiple performance indicators such as load regulation, output voltage accuracy, overshoot amplitude, undershoot amplitude, recovery time, and ripple noise. The sum of the weighting coefficients is 1. The sum of the weighting coefficients of the dynamic response-related indicators is higher than that of the static indicators.

[0053] Set an ideal expected value and a passing threshold for each performance indicator;

[0054] A linear or nonlinear scoring function is used to map the measured value of each performance indicator to a single score. The scoring function makes the score higher the measured value is closer to the ideal expected value, lower the score is closer to the qualified threshold, and the score is zero if the measured value is lower than the qualified threshold.

[0055] The scores of each item are multiplied by their corresponding weighting coefficients and then summed to obtain a comprehensive performance score, which is used to quantitatively evaluate the overall performance level of the tested DC power supply.

[0056] Accordingly, embodiments of the present invention also provide a multi-functional integrated testing system for DC power supplies, including a memory configured to store instructions, a processor configured to retrieve the instructions from the memory, and capable of implementing any of the multi-functional integrated testing methods for DC power supplies described in the embodiments of the present invention when executing the instructions.

[0057] The beneficial effects of this invention are:

[0058] 1. This invention, by introducing a test initialization module and automatically loading dynamic load test files, achieves unified configuration and one-click execution of the test process, significantly reducing the cumbersome equipment connection and manual setup processes before testing. Each test step is executed automatically through programmed control, supporting fully automated operation and significantly improving testing efficiency to meet the needs of modern production lines for rapid batch testing. Self-testing and fault diagnosis functions can automatically determine the initial power supply state before testing, avoiding invalid or false tests and improving the overall effectiveness of the test process.

[0059] 2. This invention is the first to propose constructing a performance correlation database, systematically storing various types of data collected at different testing stages and managing their correlation. Through multi-dimensional data analysis, it achieves cross-correlation of multiple dimensions such as temperature-stability analysis, rate of change-response analysis, and load / temperature-ripple analysis, revealing the intrinsic relationships between different performance parameters and providing a quantitative basis for comprehensive power supply performance evaluation. The comprehensive performance evaluation model further integrates various performance scores, quantitatively providing a final score, effectively overcoming the problem that traditional test results cannot be integrated for evaluation.

[0060] 3. This invention employs a dynamic load test file generation method based on the load characteristics of the target application scenario. It simulates complex, variable, and nonlinear actual load waveforms through a random process generation algorithm, effectively reproducing the actual operating conditions of the equipment and providing stronger test coverage. During dynamic testing, combined with load jump identification and response parameter extraction, key dynamic indicators such as output voltage overshoot, undershoot, and recovery time can be accurately obtained, improving the realism and detail of the dynamic test. Through compliance checks and smoothing mechanisms for the rate of change, it is ensured that the generated test commands can be actually executed by the load module, ensuring the reliability and safety of the test.

[0061] 4. This invention provides a structured testing process. All test actions and parameter settings are uniformly configured and automatically executed by the host computer system, eliminating the impact of human error on test results. The output voltage stability determination mechanism automatically determines the sampling timing based on physical parameter modeling and threshold judgment, avoiding errors from subjective human judgment. In dynamic response testing, the response range is automatically identified based on the load transition point, achieving a unified standard for extracting response parameters and significantly improving the repeatability and consistency of test results. Attached Figure Description

[0062] To more clearly illustrate the technical solutions in this invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, those skilled in the art can obtain other drawings based on these drawings without creative effort.

[0063] Figure 1 This is a flowchart of the steps of the method of the present invention;

[0064] Figure 2 This is a flowchart illustrating the self-testing and fault diagnosis steps of the method of the present invention;

[0065] Figure 3 This is a flowchart illustrating the steps of the comprehensive performance evaluation method of the present invention. Detailed Implementation

[0066] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments. It should also be noted that, to make the embodiments more comprehensive, the following embodiments are the best and preferred embodiments, and those skilled in the art can use other alternative methods to implement some well-known technologies; moreover, the accompanying drawings are only for more specific description of the embodiments and are not intended to specifically limit the present invention.

[0067] Please see Figures 1-3 This invention provides a multi-functional comprehensive testing method for DC power supplies. A host computer is used to configure the rated output parameters of the DC power supply under test (such as rated voltage, rated current, power, etc.) and to set data acquisition parameters (such as sampling frequency, number of sampling points, etc.). Furthermore, the host computer loads a dynamic load test file, which generates a representative timing instruction sequence based on the target application scenario (such as industrial control, communication equipment, etc.). The timing instruction sequence is designed based on the characteristics of the target load, considering factors such as the amplitude, rate of change, and duration of the load current, simulating complex load changes in real-world operating conditions. This step, through software and hardware coordination, ensures that the test scenario is as realistic as possible, thereby improving the authenticity and comprehensiveness of the test.

[0068] The DC electronic load module controls the load current to incrementally increase and decrease between zero and the rated current, with the step size determined by preset parameters. After each load current change, the system synchronously acquires the output voltage and current data of the tested DC power supply through a high-speed data acquisition module, and acquires the temperature data of the power devices through a temperature sensing module. To ensure stability, the system waits for the output voltage to stabilize after each load current change. During this process, the synchronous acquisition of output current and power device temperature allows for real-time monitoring of the power supply's performance and heat dissipation status.

[0069] The DC electronic load module is driven to perform dynamic load testing according to a preset timing command sequence. This timing file contains load current fluctuation commands, representing load fluctuations in real-world application scenarios. During the test, a high-speed data acquisition module collects output voltage and current waveform data, recording the power supply response in real time as the load changes. This process effectively evaluates the power supply's steady-state response capability and recovery time under dynamic loads, simulating the dynamic characteristics of the load under different power supply conditions.

[0070] During the constant load current segment in the timing command sequence, the system switches the data acquisition module to AC coupling mode, which allows for the dedicated acquisition of high-frequency noise signals (such as power supply ripple noise). This mode effectively filters out low-frequency signals and focuses on noise fluctuations at the power supply output, accurately reflecting the ripple characteristics of the DC power supply and thus assessing its impact on sensitive equipment.

[0071] Data generated during testing (such as voltage, current, temperature, dynamic response, ripple noise, etc.) is collected and stored by a high-speed data acquisition module. All this data is then correlated and stored in a performance correlation database. By establishing a multi-dimensional data correlation analysis model, the system can correlate and store voltage, current, and temperature data from static performance tests; correlate dynamic response parameters extracted from dynamic performance tests with the load current change rate; and correlate noise indicators from ripple noise tests with load current, temperature, etc. Finally, based on this data, in-depth correlation analysis is performed to reveal the intrinsic relationships between different performance parameters. For example, the relationship between the load current change rate and output voltage overshoot amplitude, undershoot amplitude, and recovery time can be analyzed to evaluate the overall dynamic response performance of the power supply.

[0072] Upon completion of the test, the system automatically controls the DC electronic load module to return the load current to zero and shuts off the DC power supply under test via the control system. This step is designed to ensure that no abnormal or unsafe operations occur during the test, guaranteeing the integrity of the test.

[0073] Through the above steps and technical features, this invention can effectively solve the shortcomings of traditional power supply testing methods, improve testing efficiency, enhance data analysis capabilities, and provide more comprehensive and accurate technical support for power supply performance evaluation.

[0074] In one possible implementation, a thorough analysis of the electrical equipment in the target application scenario is required before generating dynamic load test files. This process includes studying the equipment's operating modes and identifying typical load current variation characteristics, particularly its performance under normal operation, extreme loads, and transient responses. These load current variation characteristics include:

[0075] Range of current variation: This refers to the maximum and minimum values ​​of load current variation that the equipment may experience under different operating conditions.

[0076] The range of current change rate reflects the time required for the load current to change from one value to another. The speed of change has a significant impact on the response and stability of the equipment.

[0077] Duration distribution under different load conditions: The duration of different load conditions (such as high load, low load, steady state, etc.) during actual use. The duration distribution helps determine the actual frequency and duration of load current under different conditions.

[0078] Based on the analysis of the target application scenario, the relevant parameters of the load current command are set, including:

[0079] Upper and lower amplitude limits: These set the maximum and minimum values ​​of the load current, which depend on the operating range of the target device and possible extreme operating conditions.

[0080] Upper limit of rate of change: Sets the upper limit of the rate of change between adjacent load current commands. This parameter ensures that the current change does not exceed a certain rate to avoid excessive fluctuations or slow response of the device.

[0081] Constant current duration range: For situations where a constant load is maintained within a specific time period, set the duration range of the constant current segment to ensure that the test can cover scenarios where the load operates stably for a long time.

[0082] After defining the characteristics of various load current variations, a random process generation algorithm is used to generate load current commands. The specific steps are as follows:

[0083] Between the upper and lower limits of amplitude, current values ​​are randomly generated by an algorithm to simulate the current fluctuations of the equipment during actual operation.

[0084] Based on the upper limit of the rate of change, a suitable rate of change is generated for each pair of adjacent command values. This process ensures that the load current does not exceed the set rate of change during the change process, and that the generated current change conforms to the dynamic characteristics under actual operating conditions.

[0085] For periods requiring constant current, random constant current times are generated within a set duration range. These constant current segments reflect the device's ability to maintain a stable load current over long periods under certain states (such as standby, low power consumption, etc.).

[0086] The current commands generated through the above random process are combined in chronological order to form a complete timing command sequence. Each command item is timestamped to indicate its execution time during the test. These timing command sequences can comprehensively simulate the load changes of actual equipment under target operating conditions and accurately describe the time characteristics of each load change stage.

[0087] In one possible implementation, firstly, several key parameters need to be collected, which form the basis for determining the delay time:

[0088] Output capacitance value: The output capacitance of the DC power supply under test is an important parameter in power supply design, as it determines the stability and recovery speed of the power supply's output voltage. The output capacitance value is usually provided by the power supply's circuit design and can be obtained through measurement or by consulting the power supply's technical documentation.

[0089] Feedback loop bandwidth rating: Feedback loop bandwidth refers to the response frequency range of the feedback loop in a power supply control system, determining the power supply's ability to quickly respond to load changes. This parameter is usually obtained through the power supply's design specifications or testing.

[0090] Maximum load current: This is the maximum load current that the power supply can provide, typically determined by the power supply's rated output power and output voltage. This parameter helps determine the power supply's output stability under maximum load conditions.

[0091] Based on the output capacitance and maximum load current, the longest theoretical time required for the power supply output voltage to recover from its maximum deviation to a stable state can be calculated. This process is based on the relationship between capacitance and load current. A larger capacitance results in a longer recovery time, and a larger load current may lead to a slower power supply response. Specific calculations can be performed using a circuit model, calculating the recovery time based on the power supply's capacitance and load current.

[0092] The calculation formula is:

[0093]

[0094] Among them, t max For the longest voltage recovery time, C out For output capacitor, ΔV is the maximum voltage deviation, and I is the output capacitor. max This is the maximum load current.

[0095] The response time of the feedback loop can be calculated based on its rated bandwidth. Loop response time is typically related to bandwidth; the larger the bandwidth, the shorter the system response time. The loop response time can be calculated using the following formula:

[0096]

[0097] Among them, t loop It is the loop response setup time, f bw It is the bandwidth of the feedback loop.

[0098] To ensure the stability and safety of the test, the delay time needs to take into account both the power supply's output voltage recovery time and the feedback loop setup time. In actual testing, to ensure the voltage stabilizes and avoid excessive system oscillation, the delay time should be set to the larger of the longest theoretical time and the setup time, multiplied by a safety factor. This safety factor is a value slightly greater than 1, used to compensate for uncertainties in the test or instantaneous changes in the system response.

[0099] The formula is as follows:

[0100] t delay =max(t) max ,t loop )×k;

[0101] Among them, t delay is the required delay time, and k is the safety factor, which is usually 1.2 or 1.3.

[0102] After each change in load current, the system waits for this calculated delay time to ensure the output voltage stabilizes before proceeding with subsequent tests. This delay time ensures that the output voltage will not produce inaccurate test data due to premature system response during load current changes.

[0103] In one possible implementation, before starting the ripple noise test, it is first necessary to obtain the expected output voltage of the DC power supply under test under a constant load current. This expected voltage value is typically determined by the power supply's rated output voltage and load conditions. The magnitude of the load current directly affects the stability of the power supply's output voltage; therefore, this value can be obtained from the power supply's datasheet, test documentation, or through experimental measurement under a known load current.

[0104] Once the power supply enters the constant load current range, its actual output voltage will be affected by factors such as load changes, internal circuit response, and temperature. Therefore, it is necessary to monitor the actual output voltage value in real time to determine whether the power supply has reached the expected stable state. This can be done using high-precision voltage acquisition equipment or a digital oscilloscope.

[0105] Once the actual output voltage value is obtained, it needs to be compared with the previously obtained expected output voltage value, and the deviation between the two needs to be calculated. The deviation is expressed as:

[0106] △V=|V actual -V expected |;

[0107] Where ΔV is the deviation of the output voltage, V actual V is the actual output voltage monitored in real time. expected This represents the expected output voltage value.

[0108] To ensure the accuracy of test data, it is necessary to determine whether the power supply's output voltage has stabilized. Voltage stability can be determined by the following two conditions:

[0109] The deviation value should remain consistently below a preset deviation threshold. This threshold is typically set based on the power supply's accuracy requirements and the test's tolerance. Generally, the deviation threshold can be set to a few millivolts (mV) or less.

[0110] The deviation should remain below the threshold for a short period of time. The length of this time window typically depends on the power supply's response characteristics and can be set from several hundred milliseconds to several seconds. Within this time window, if the voltage deviation remains below the set value, it indicates that the power supply has stabilized and entered a steady state.

[0111] Once it's determined that the power supply's output voltage has stabilized, high-frequency noise waveform acquisition can begin. At this point, the power supply output is stable, allowing for accurate capture of noise components generated by switching, filtering, and other factors. High-frequency noise waveform acquisition is typically achieved using an oscilloscope or a dedicated noise analyzer. The acquired waveforms can help analyze the power supply's ripple and noise characteristics.

[0112] By collecting high-frequency noise waveforms only after the voltage has stabilized, inaccurate noise data is avoided when the power supply is not fully stable. Only after the power supply has reached a stable state can its ripple noise waveform accurately reflect its actual operating conditions, thus improving the accuracy of the test results.

[0113] DC power supplies typically experience a transient process when the load current changes. During this process, the output voltage may fluctuate, which can affect noise testing. By waiting for the output voltage to stabilize before starting noise testing, the interference of these transient fluctuations can be eliminated, ensuring the purity of the test results.

[0114] In one possible implementation, during dynamic performance testing, the output current waveform of the DC power supply is first acquired during load changes. To analyze the instantaneous changes in current, the output current waveform needs to be mathematically differentiated. The purpose of differentiation is to obtain the instantaneous rate of change of the current waveform (i.e., the rate of current change). This step can be achieved by performing first-order difference or numerical differentiation calculations on the current waveform. The calculated instantaneous rate of change reveals the speed and magnitude of load changes.

[0115] To identify the moment of load current change, a load current change rate threshold needs to be set. This threshold is used to distinguish between normal current fluctuations and rapid changes caused by load current changes. When the instantaneous change rate exceeds this threshold, it can be determined that a load current change has occurred. By comparing the instantaneous change rates, the exact moment of the load current change can be found.

[0116] Once the instantaneous rate of change exceeds a set threshold, the load transition moment can be identified. The load transition moment is typically the starting point of the power supply's response and a key reference point for dynamic performance testing. This moment serves as the starting point for further analysis of the power supply's dynamic response.

[0117] After determining the load transition moment, the next step is to locate the corresponding response range on the output voltage waveform. The response range refers to the process by which the output voltage changes after a load transition and eventually returns to a stable value. Within this range, voltage fluctuations are significant and include overshoot and undershoot phenomena. By analyzing the output voltage waveform using the load transition moment as a reference, the specific range of this interval can be determined.

[0118] After determining the response range, further analysis of the output voltage waveform is needed to identify the overshoot peak and undershoot trough points. The overshoot peak represents the highest point of the output voltage after a load change, while the undershoot trough represents the lowest point of the output voltage. These two points typically occur during the transient response after a load change. By calculating the deviation of these two points from the rated output voltage, the transient response capability of the power supply during load changes can be understood.

[0119] Finally, starting from the trough point, analyze the output voltage waveform backward, calculating the time required for the output voltage value to recover and remain within a voltage band centered on the rated output voltage and with a preset allowable deviation as the radius. This time is called the recovery time. Recovery time is an important indicator of a power supply's dynamic response capability, representing its ability to recover to stable operation after load changes. The shorter the recovery time, the better the power supply's dynamic response and the faster it can adapt to load changes.

[0120] This invention accurately identifies load transition moments through mathematical differentiation and instantaneous rate of change analysis, and calculates key dynamic response parameters such as overshoot, undershoot, and recovery time. This helps to comprehensively evaluate the dynamic response capability of the power supply, providing strong support for power supply design and optimization.

[0121] In one possible implementation, when performing temperature-stability analysis, it is first necessary to collect load regulation and output voltage accuracy data at different power device temperatures. Temperature variations can have a significant impact on power supply stability; therefore, temperature needs to be considered as a variable to analyze its effect on power supply stability.

[0122] The operating temperature of the power devices is changed using temperature regulation or environmental control devices, and the load regulation rate (i.e., the ratio of load current change to output voltage change) and output voltage accuracy (i.e., the deviation of output voltage from the rated value) are collected at each temperature point. These data will be fitted into a continuous curve.

[0123] By fitting the curves, the trends of load regulation and output voltage accuracy as a function of temperature are analyzed. In particular, the effect of temperature on the static stability of the DC power supply can be assessed by observing the changes in the slope of the curves. A larger change in the slope of the curve indicates a more significant effect of temperature on stability.

[0124] Rate-of-change response analysis focuses on the impact of the rate of change of load current on the dynamic response performance of a DC power supply, particularly the overshoot, undershoot, and recovery time of the output voltage.

[0125] First, record the relationship between the load current change rate (i.e., the rate of change of the load current) and the overshoot, undershoot, and recovery time of the output voltage. This can be obtained from experimental data, and a multidimensional data model (such as a three-dimensional regression model, surface fitting, etc.) can be used to describe the relationship between these variables.

[0126] By analyzing this model, the sensitivity of the power supply's dynamic response to the load change rate (load current change rate) is evaluated. Particular attention should be paid to how the power supply's overshoot, undershoot, and recovery time change under drastic load changes, thus assessing the power supply's response characteristics under different load variation conditions.

[0127] Ripple noise is a common interference factor in DC power supplies, and it is affected by load current and temperature. To fully understand the causes and variation patterns of ripple, load / temperature-ripple analysis is required.

[0128] The peak-to-peak value and RMS value of the power supply output ripple noise were collected under different load current values ​​and power device temperatures (the RMS value represents the average energy of the ripple). This data can be acquired using an oscilloscope or spectrum analyzer, covering ripple characteristics under different loads and temperatures.

[0129] By using load current and power device temperature as independent variables, and peak-to-peak and RMS ripple noise as dependent variables, a multidimensional data graph characterizing the relationship between ripple and load / temperature is constructed. This graph can help further analyze the variation patterns of ripple noise under different conditions.

[0130] Through multidimensional data correlation analysis, combined with temperature-stability analysis, rate of change-response analysis, and load / temperature-ripple analysis, a comprehensive evaluation of DC power supply performance is conducted. By establishing relationship models between different factors, designers can optimize power supply design, improve power supply adaptability and stability, and also enhance testing efficiency and accuracy.

[0131] In one possible implementation, a self-test and fault diagnosis step is performed before static performance testing. The main purpose of this step is to ensure that the DC power supply under test is in a normal initial state before testing begins, so that the subsequent test results are more reliable.

[0132] Before testing, a DC electronic load module was used to control the load current to zero, ensuring that the load would not interfere with the output voltage of the DC power supply. Under these conditions, the output voltage of the DC power supply is only affected by its own performance.

[0133] A high-speed data acquisition module is used to acquire the no-load output voltage of the DC power supply under test. This data can be obtained using an oscilloscope or voltage sensor, and the no-load output voltage value is recorded.

[0134] The collected no-load output voltage value is compared with the preset rated output voltage value, and the absolute deviation between them is calculated. This deviation reflects whether the output voltage of the tested DC power supply meets the design requirements.

[0135] Different handling measures are taken based on the absolute deviation between the no-load output voltage value and the rated output voltage value:

[0136] If the calculated absolute deviation exceeds the preset first fault threshold, the output voltage reference of the tested DC power supply is deemed to have failed. The test should be terminated immediately to avoid invalid or erroneous testing. The first fault threshold can be set to ±5%, meaning that when the deviation between the output voltage and the rated voltage exceeds 5%, the power supply is considered to have a serious fault and testing cannot continue.

[0137] If the deviation value is between the first fault threshold and the second fault threshold (in this embodiment of the invention, the deviation is between ±1% and ±5%), the output voltage accuracy is determined to be degraded. At this time, a warning message is recorded, and subsequent tests are continued to better understand the power supply's performance within this accuracy range. The specific value of the second fault threshold can be set to ±1%, meaning that when the deviation between the output voltage and the rated voltage is between 1% and 5%, it indicates that the power supply accuracy has decreased, but further testing can still be performed.

[0138] If the absolute deviation is less than the second fault threshold (in this embodiment of the invention, the deviation is within ±1%), then the initial state of the DC power supply is determined to be normal, and subsequent test steps can continue.

[0139] The self-test and fault diagnosis steps, by checking in advance whether the power supply's output voltage meets the rated value, avoid invalid tests caused by power supply malfunctions or performance degradation. This ensures the accuracy of subsequent test results, allowing each test to reflect the power supply's performance under normal operating conditions.

[0140] By setting first and second fault thresholds, reference faults or accuracy degradation of the power supply can be effectively detected in a timely manner, and different measures can be taken according to different situations. This early diagnosis and handling can reduce test errors caused by power supply problems, avoid the invalidity of subsequent tests, and improve the efficiency of the test process.

[0141] In one possible implementation, before the DC electronic load module executes the timing instruction sequence, the sequence needs to undergo compliance checks and smoothing. This process ensures that the instruction sequence remains within the executable range of the DC electronic load module and will not cause the load module to overload or become unstable. The specific implementation steps are as follows:

[0142] The system first reads all instruction points in the timing instruction sequence. Each instruction point contains the expected current value and its corresponding time interval. The timing instruction sequence may be generated from a test case or application.

[0143] For each pair of adjacent instruction points in the timing instruction sequence, calculate the current change and time interval between them. The current change is the difference in current values ​​between two adjacent instruction points, and the time interval is the time difference between the two instruction points. Then, calculate the rate of change of current, which is the ratio of the current change to the time interval, based on these two data points:

[0144]

[0145] Where ΔI is the change in current, Δ t It is a time interval.

[0146] The calculated rate of change is compared to the maximum allowable slewing rate of the DC electronic load module. DC electronic load modules typically have a maximum current slewing rate limit, which is determined by hardware capabilities. If the calculated rate of change exceeds this maximum slewing rate, the instruction sequence needs to be smoothed.

[0147] If the rate of change exceeds the maximum slew rate, an intermediate command point is inserted in the region of excessive change. The current value of the intermediate command point is set in a smooth transition manner, ensuring that the current change remains within the maximum slew rate range of the DC electronic load module within each segment. The number and specific location of the inserted intermediate command points are determined based on the rate of current change and the maximum allowable slew rate, and are usually done automatically by an algorithm.

[0148] After inserting intermediate instruction points, a smoothed timing instruction sequence is regenerated to ensure that the current change rate of each segment is within the executable range of the load module. The smoothed instruction sequence can then be safely loaded into the DC electronic load module for execution.

[0149] By performing compliance checks and smoothing on the timing instruction sequence, problems caused by excessively rapid current changes in the load module can be effectively avoided, ensuring the safety, stability, and accuracy of the testing process. This method improves testing reliability, prevents equipment damage, extends service life, and ensures the accuracy of test data, making it a necessary step for high-precision DC power supply testing.

[0150] In one possible implementation, following the correlation analysis step, a comprehensive performance evaluation is further performed to quantitatively assess the overall performance level of the tested DC power supply. The specific steps are as follows:

[0151] To comprehensively evaluate the performance of a DC power supply, it is first necessary to determine several key performance indicators, including but not limited to: load regulation, output voltage accuracy, overshoot amplitude, undershoot amplitude, recovery time, and ripple noise.

[0152] These performance metrics are weighted. Each metric is assigned a weight coefficient based on its contribution to overall performance, and the sum of all weight coefficients is 1. Dynamic response-related metrics (such as overshoot amplitude, undershoot amplitude, recovery time, and ripple noise) usually have a greater impact on the system's real-time response, therefore their weight coefficients are higher than those of static metrics (such as load regulation and output voltage accuracy).

[0153] For each performance metric, set an ideal expected value and a passing threshold:

[0154] The ideal expected value is the target value when the performance indicator achieves its best performance.

[0155] The pass threshold is the minimum standard value at which the indicator can pass the test and meet the basic requirements.

[0156] For example, the ideal expected value for output voltage accuracy might be ±0.5%, with a pass threshold of ±1%, while the ideal expected value for ripple noise might be 10mV, with a pass threshold of 50mV.

[0157] Use linear or nonlinear scoring functions to map the measured value of each performance metric to an individual score. The design of the scoring function ensures that:

[0158] The closer the measured value is to the ideal expected value, the higher the score;

[0159] The closer the measured value is to the passing threshold, the lower the score.

[0160] If the measured value is lower than the acceptable threshold, the score for that performance indicator is zero.

[0161] For example, for the output voltage accuracy index, if the measured value is ±0.6%, its score will be lower than the ideal expected value, but still higher than the zero score when it is below the qualified threshold.

[0162] The overall performance score is obtained by multiplying the score of each performance indicator by its corresponding weighting coefficient and then summing the results. This score reflects the overall performance of the DC power supply across all performance indicators. The specific calculation formula is as follows:

[0163]

[0164] Among them, the score i Represents the score of the i-th performance metric, with weights i is the weighting coefficient of the performance indicator, and n is the total number of performance indicators.

[0165] By assigning weights to each performance indicator and scoring them based on the closeness of the measured values ​​to the ideal expected values, the overall performance of the DC power supply is effectively quantified. This method provides accurate performance evaluation, helping users fully understand the strengths and weaknesses of the equipment, make optimization decisions, and improve testing efficiency and standardization, thus possessing significant engineering application value.

[0166] Accordingly, embodiments of the present invention also provide a multi-functional integrated testing system for DC power supplies, including a memory configured to store instructions, a processor configured to retrieve the instructions from the memory, and capable of implementing any of the multi-functional integrated testing methods for DC power supplies described in the embodiments of the present invention when executing the instructions.

[0167] The following examples will illustrate this in detail:

[0168] The purpose of this invention is to provide a comprehensive scoring method for evaluating the performance of DC power supplies, which can quantify multiple performance indicators of the power supply and provide a specific and operable scoring scheme in practical applications.

[0169] This embodiment evaluates different models of DC power supplies through comparative experiments and a comprehensive scoring method, showcasing their performance using a unified scoring standard. The experiments include the measurement and scoring of multiple performance indicators such as load regulation, overshoot amplitude, output ripple noise, and conversion efficiency.

[0170] Test equipment and parameters:

[0171] Device under test: 3 different models of DC power supplies:

[0172] Model A: Rated output voltage 12V, rated output current 10A;

[0173] Model B: Rated output voltage 15V, rated output current 8A;

[0174] Model C: Rated output voltage 5V, rated output current 20A.

[0175] Test equipment:

[0176] Precision digital multimeter, accuracy 0.01%;

[0177] Oscilloscope, 100MHz bandwidth, 1GSa / s sampling rate;

[0178] Load cell, current accuracy ±0.1%;

[0179] Temperature sensor, accuracy ±0.5℃;

[0180] Measurement frequency: 50Hz.

[0181] Test environment: ambient temperature 25℃, humidity 50%.

[0182] Implementation process:

[0183] The following performance tests were performed on each DC power supply:

[0184] Load regulation:

[0185] Measure the percentage change in power supply output voltage under load conditions of 25%, 50%, 75%, and 100% of the rated output current.

[0186] The formula is:

[0187] Measure the maximum fluctuation of the power supply output voltage when the load changes rapidly.

[0188] The formula is:

[0189] Under no-load and full-load conditions, the ripple noise amplitude of the output voltage is measured using an oscilloscope.

[0190] The formula is:

[0191]

[0192] Calculate the ratio of input power to output power to evaluate the power supply's conversion efficiency. The formula is:

[0193]

[0194] Among them, P out =V out ·I out ,P in =V in ·I in ;

[0195] Assuming the ideal load regulation rate is 0% and the acceptable threshold is 2%, the following scoring function is used to score the load regulation rate based on the measured value:

[0196]

[0197] If the load adjustment rate exceeds 2%, the score will be 0.

[0198] Assuming the ideal overshoot amplitude is 0% and the acceptable threshold is 10%, the following scoring function is used based on the measured overshoot amplitude:

[0199]

[0200] If the overshoot exceeds 10%, the score will be 0.

[0201] Assuming the ideal value for ripple noise is 0% and the acceptable threshold is 0.5%, the following scoring function is used based on the measured value of ripple noise:

[0202]

[0203] If the ripple noise exceeds 0.5%, the score will be 0.

[0204] Assuming an ideal conversion efficiency of 95% and a pass / fail threshold of 85%, the following scoring function is used based on the measured conversion efficiency:

[0205]

[0206] The overall score is calculated using a weighted average, assuming the weights of each indicator are as follows:

[0207] Load regulation weight: 20%;

[0208] Overshoot amplitude weight: 30%;

[0209] Ripple noise weight: 25%;

[0210] Conversion efficiency weight: 25%.

[0211] The formula for calculating the overall score is as follows:

[0212] Overall score = Load regulation score × 20% + Overshoot score × 30% + Ripple noise score × 25% + Conversion efficiency score × 25%;

[0213] Assuming tests were conducted on three DC power supplies, the following data was obtained:

[0214] Performance indicators Model A Model B Model C Load regulation 1.5％ 2.2％ 1.1％ overshoot amplitude 8％ 12％ 5％ Ripple noise 0.4％ 0.6％ 0.3％ Conversion efficiency 92％ 88％ 90％

[0215] Based on the above data, calculate the score for each DC power supply:

[0216] Model A:

[0217]

[0218] Overall score = 75 × 20% + 20 × 30% + 20 × 25% + 70 × 25% = 35;

[0219] Model B:

[0220]

[0221] Overall score = 0 × 20% + 0 × 30% + 0 × 25% + 30 × 25% = 7.5;

[0222] Model C:

[0223]

[0224] Overall score = 45 × 20% + 50 × 30% + 40 × 25% + 50 × 25% = 47.5;

[0225] By combining the scores, we can see that:

[0226] Model A has better load regulation and conversion efficiency, but the overshoot amplitude is slightly larger.

[0227] Model B had the lowest overall score, indicating that it was unsatisfactory in several indicators, especially overshoot amplitude and ripple noise.

[0228] Model C offers a balanced performance and is suitable for demanding environments.

[0229] This evaluation method quantifies various performance indicators, providing users with clear selection criteria, avoiding subjective judgments in traditional evaluation methods, and improving the scientific nature and accuracy of power supply selection.

[0230] The comprehensive scoring method provided by this invention can quantitatively evaluate DC power supplies across multiple performance dimensions, demonstrating significant advantages and practical value.

[0231] This invention encompasses any substitutions, modifications, equivalent methods, and solutions made within the spirit and scope of this invention. To provide the public with a thorough understanding of this invention, specific details are described in detail in the following preferred embodiments; however, those skilled in the art will fully understand the invention even without these details. Furthermore, to avoid unnecessary misunderstanding of the essence of this invention, well-known methods, processes, procedures, components, and circuits are not described in detail.

[0232] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A multi-functional integrated testing method for DC power supplies, characterized in that, Includes the following steps: Test initialization steps: Configure the rated parameters and data acquisition parameters of the DC power supply under test through the host computer and load a dynamic load test file. The dynamic load test file contains a sequence of timing instructions generated based on the load characteristics of the target application scenario to simulate complex load changes in real working conditions. Static performance test steps: Control the DC electronic load module to make the load current increase and decrease in preset steps between zero and the rated output current, and wait for the output voltage to stabilize after each current change. Simultaneously collect the output voltage, output current and power device temperature data of the DC power supply under test through the high-speed data acquisition module and temperature sensing module. Dynamic performance test steps: Drive the DC electronic load module to execute the timing instruction sequence in the dynamic load test file, and acquire the output voltage and output current waveforms through the high-speed data acquisition module during the execution process; Ripple noise test procedure: During the constant load current segment in the timing command sequence, switch the high-speed data acquisition module to AC coupling mode and acquire high-frequency noise waveforms; Correlation analysis steps: Establish a performance correlation database, correlate and store the voltage, current and temperature data collected in static performance testing, correlate and store the dynamic response parameters extracted from the waveform in dynamic performance testing with the corresponding load current change rate, correlate and store the ripple noise index obtained from the ripple noise test with the corresponding load current and temperature, and perform multi-dimensional data correlation analysis based on the performance correlation database. Test termination procedure: Control the load to zero and turn off the DC power supply under test.

2. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, The dynamic load test file is generated through the following process: Analyze the operating modes of electrical equipment in the target application scenario to determine its typical and extreme load current variation characteristics, including the range of current variation amplitude, the range of current variation rate, and the duration distribution of different load states. Based on the aforementioned variation characteristics, the upper limit of the load current command amplitude, the lower limit of the amplitude, the upper limit of the rate of change, and the range of constant current duration are set. A random process generation algorithm is used to randomly generate load current command values ​​between the upper and lower limits of the amplitude, randomly generate the rate of change between adjacent command values ​​within the upper limit of the rate of change, and randomly generate the holding time of the constant current segment within the constant current duration. The generated random instructions are combined in chronological order and timestamps are added to form the chronological instruction sequence.

3. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, In the static performance test procedure, the delay time for the output voltage to stabilize after each change in load current is determined in the following way: Obtain the output capacitance value, rated feedback loop bandwidth, and maximum load current value of the DC power supply under test; Based on the output capacitance value and the maximum load current value, calculate the longest theoretical time required for the output voltage to recover from the maximum deviation to a stable state. Based on the rated bandwidth of the feedback loop, calculate the setup time required for the loop response; The larger of the longest theoretical time and the establishment time is taken and multiplied by a safety factor to obtain the delay time.

4. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, In the ripple noise test procedure, after entering the constant load current range, there is a delay before the high-frequency noise waveform is acquired. The method for determining this delay time is as follows: Obtain the expected output voltage value of the DC power supply under test under the constant load current value; Real-time monitoring of the actual output voltage value of the DC power supply under test; Calculate the deviation between the actual output voltage value and the expected output voltage value; When the deviation remains below the preset deviation threshold for a short period of time, the output voltage is determined to be stable, and the high-frequency noise waveform is then collected.

5. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, The dynamic performance testing step includes the following process: extracting dynamic response parameters from the acquired output voltage waveform. The acquired output current waveform is mathematically differentiated to calculate its instantaneous rate of change; Set a load current change rate threshold, and identify the moment when the instantaneous change rate of the output current waveform exceeds the threshold as the load jump moment; Using the load transition moment as a reference, locate the corresponding response interval on the output voltage waveform; Within the response range, find the overshoot peak point and undershoot valley point of the output voltage, and calculate the deviation amplitude of the voltage relative to the rated output voltage. Starting from the trough point, analyze the output voltage waveform backward, calculate the time required for the output voltage value to enter and remain within the voltage band centered on the rated output voltage value and with a preset allowable deviation as the radius, and define this time as the recovery time.

6. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, The multidimensional data correlation analysis in the correlation analysis step specifically includes: Temperature-stability analysis: Load regulation and output voltage accuracy data collected at different power device temperature points are fitted into continuous curves, and their variation trends and slopes are analyzed to evaluate the impact of temperature on the static stability of DC power supply. Rate of change-response analysis: Establish a three-dimensional relationship model between the load current change rate and the output voltage overshoot amplitude, undershoot amplitude and recovery time, and analyze the sensitivity of dynamic response characteristics to the degree of load change. Load / Temperature-Ripple Analysis: Using different load current values ​​and different power device temperature values ​​as inputs, observe the changes in the peak-to-peak value and RMS value of the output ripple noise, and establish a multi-dimensional data spectrum characterizing the relationship between ripple and load and temperature.

7. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, Prior to the static performance testing steps, a self-test and fault diagnosis step is also included: The DC electronic load module is controlled to make the load current zero, and the no-load output voltage value of the DC power supply under test is acquired through the high-speed data acquisition module. Calculate the absolute deviation between the no-load output voltage value and the set rated output voltage value; If the absolute deviation is greater than the first fault threshold, the output voltage reference of the tested DC power supply is determined to be faulty, and the test is terminated. If the absolute deviation is less than the first fault threshold but greater than the second fault threshold, the output voltage accuracy of the tested DC power supply is determined to be deteriorated, the warning information is recorded and the test continues. If the absolute deviation is less than the second fault threshold, the DC power supply under test is determined to be in normal initial state, and subsequent test steps are continued.

8. The multi-functional integrated testing method for DC power supplies according to claim 2, characterized in that, Before the DC electronic load module executes the timing instruction sequence, compliance checks and smoothing processes are performed on the instructions in the sequence: Read the current change and time interval between two adjacent instruction points in the timing instruction sequence, and calculate its rate of change; Compare this rate of change with the maximum allowable conversion rate of the DC electronic load module itself; If the calculated rate of change exceeds the maximum conversion rate, the current change segment is divided into several sub-segments by inserting intermediate command points to ensure that the rate of change of each sub-segment is less than or equal to the maximum conversion rate, thereby achieving smooth processing of the original command sequence and keeping it within the executable range of the DC electronic load module.

9. The multi-functional integrated testing method for DC power supplies according to claim 1, characterized in that, Following the correlation analysis step, a comprehensive performance evaluation step is also included: Weighting coefficients are assigned to multiple performance indicators such as load regulation, output voltage accuracy, overshoot amplitude, undershoot amplitude, recovery time, and ripple noise. The sum of the weighting coefficients is 1. The sum of the weighting coefficients of the dynamic response-related indicators is higher than that of the static indicators. Set an ideal expected value and a passing threshold for each performance indicator; A linear or nonlinear scoring function is used to map the measured value of each performance indicator to a single score. The scoring function makes the score higher the measured value is closer to the ideal expected value, lower the score is closer to the qualified threshold, and the score is zero if the measured value is lower than the qualified threshold. The scores of each item are multiplied by their corresponding weighting coefficients and then summed to obtain a comprehensive performance score, which is used to quantitatively evaluate the overall performance level of the tested DC power supply.

10. A multi-functional integrated testing system for DC power supplies, characterized in that, It includes a memory configured to store instructions, a processor configured to retrieve the instructions from the memory, and is capable of implementing a multi-functional integrated test method for a DC power supply as described in any one of claims 1-9 when executing the instructions.

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