Infrared or laser precision measurement device for detecting flatness of titanium and titanium alloy plate

Abstract

The invention belongs to the technical field of titanium material processing, and discloses an infrared or laser precision measuring device for detecting the flatness of a titanium and titanium alloy plate, the infrared or laser precision measuring device comprises a lower plate and an upper plate, the top end of the lower plate is fixedly connected with the upper plate, the bottom end in the upper plate is provided with an infrared receiving belt, the lower plate is internally fixedly connected with a cross rod, and the cross rod is fixedly connected with the infrared receiving belt. The outer portion of the transverse rod is movably sleeved with a moving block, a sleeve is fixedly connected to the front end of the bottom of the moving block, through grooves are formed in the top and the bottom of the sleeve, a mounting column penetrates through the through grooves, a light source emitter is fixedly assembled at the top end of the mounting column, a spring is fixedly connected to the bottom end of the mounting column, and a protection plate is fixedly connected to the bottom end of the spring. The bottom end of the protection plate is fixedly connected with a horizontal block, and the bottom end of the horizontal block is provided with a rotatable inspection small wheel. The small inspection wheel moves on a measured surface, emits detection light waves and captures fine plane fluctuation, so that flatness measurement is accurate, visual inspection is not needed, and the problem of personal errors is solved.

Description

Technical Field

[0001] This invention belongs to the field of titanium material processing technology, and relates to the precise inspection and testing of the flatness of the inner and outer surfaces of titanium and titanium alloy plates after machining or additive manufacturing 3D printing large forming cylinders after mechanical processing. Specifically, it is an infrared or laser precision measuring device for detecting the flatness of titanium and titanium alloy plates. Background Technology

[0002] Mechanical flatness is an important parameter for measuring the smoothness or finish of machined surfaces. Common tools for inspecting mechanical flatness include spirit levels, straight rulers, and optical flatness measuring instruments.

[0003] Currently available mechanical flatness measuring devices generally rely on visual observation of the scale, resulting in limited accuracy. Manual observation is easily affected by operator subjectivity and ambient lighting, leading to decreased reliability of the results. They also cannot generate real-time data images for analysis, making them unsuitable for measuring the high-precision flatness requirements in precision machinery manufacturing. In particular, they cannot meet the precision flatness measurement needs of machined titanium surfaces used in the manufacturing of large and ultra-large titanium and titanium alloy equipment, including the flatness inspection of the inner and outer surfaces of large additive manufacturing 3D-printed cylinders after machining.

[0004] Therefore, there is an urgent need for a precision measurement device for mechanical flatness using infrared light or laser to address the aforementioned technical defects or deficiencies. Summary of the Invention

[0005] The purpose of this invention is to provide an infrared or laser precision measuring device for mechanical flatness, so as to solve the problems of human error, technical defects or deficiencies mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution:

[0007] 1. An infrared precision measuring device for detecting the flatness of titanium and titanium alloy plates, comprising a lower plate and an upper plate, characterized in that: the upper plate is fixedly connected to the top of the lower plate; an infrared receiving strip is installed at the bottom of the upper plate; a crossbar is fixedly connected inside the lower plate; a movable block is movably sleeved on the outside of the crossbar; a sleeve is fixedly connected to the bottom front end of the movable block; a through groove is provided at the top and bottom of the sleeve; a mounting column passes through the through groove; an infrared emitter is fixedly mounted at the top of the mounting column; a spring is fixedly connected to the bottom of the mounting column; a protective plate is fixedly connected to the bottom of the spring; a horizontal block is fixedly connected to the bottom of the protective plate; a rotatable inspection wheel is installed at the bottom of the horizontal block; a battery is provided on the top right side of the upper plate; and a central processing unit is provided on one side of the battery.

[0008] The battery powers the central processing unit and the infrared transmitter;

[0009] When the test wheel (12) moves on the surface being tested, if it encounters undulations on the surface, the spring (9) will cause the mounting column (5) to rise and fall due to slight deformation, thereby changing the vertical distance h between the infrared transmitter (4) and the infrared receiving strip (3). The infrared transmitter (4) continuously emits detection waves to the infrared receiving strip (3). The time interval Δt between the infrared transmitter (4) emitting the infrared wave and the infrared receiving strip (3) receiving the infrared wave is recorded.

[0010] The Δt = t2 - t1, where t1 is the transmission time and t2 is the reception time; when Δt changes, the central processing unit (27) records the change in vertical distance Δh in real time.

[0011] The Δh = k * c * Δt - h = k * c * (t2 - t1) - h, where k is the environmental correction coefficient, k = (speed of light in air / speed of light in vacuum) * (measured ambient temperature / theoretical ambient temperature), c is the speed of light, and * is the multiplication sign;

[0012] The Δh value is transmitted to the data receiving terminal by the central processing unit (27) and a corresponding fluctuation curve is generated. By accurately capturing the subtle undulation changes of the measured plane, the Δh is output to obtain the measurement result.

[0013] As a further technical solution of the present invention, the infrared transmitter and the infrared receiver are aligned vertically, and the lower plate and the upper plate are parallel to each other.

[0014] As a further technical solution of the present invention, a guide rod is fixedly connected to the rear of the upper plate, and the moving block includes two sets of connected and fixed half-blocks. The half-blocks are fixed to each other by connecting screws, and the half-blocks are combined to form a moving groove, which is sleeved on the outside of the crossbar.

[0015] As a further technical solution of the present invention, each of the semi-blocks is equipped with a rolling guide bead at its rear end, and the guide bead and the guide rod form a rolling connection.

[0016] As a further technical solution of the present invention, a support plate is fixedly connected between the moving block and the sleeve, and the support plate is a right-angled triangular steel plate.

[0017] As a further technical solution of the present invention, sleeves are welded to both sides of the upper plate, a support rod is inserted into the sleeve, a fixing hole with equal spacing is opened in the support rod, and a positioning bolt is installed at the sleeve.

[0018] As a further technical solution of the present invention, the support rods are provided in two sets, and the support rods are symmetrically distributed about the vertical center line of the upper plate.

[0019] As a further technical solution of the present invention, the top of the upper plate is machined with two sets of parallel placement grooves, and a handle is fixedly mounted above the placement grooves.

[0020] 2. The present invention provides another alternative technical solution:

[0021] A laser measuring device for detecting the flatness of titanium and titanium alloy plates is characterized in that a laser emitter and a laser receiving strip are used to replace the infrared emitter and the infrared receiving strip in the device for detecting the flatness of titanium and titanium alloy plates, respectively.

[0022] Compared with the prior art, the beneficial effects of the present invention are: the mechanical flatness measuring device not only eliminates the need for visual observation, avoiding human error and improving measurement accuracy and stability, but also enhances the portability of the equipment, facilitating rapid movement.

[0023] (1) By setting up a small inspection wheel, spring, mounting column, infrared transmitter, infrared receiving belt, and central processing unit, when the inspection wheel moves and encounters surface undulations, the spring will cause slight deformation, which will drive the mounting column to rise and fall, thereby changing the vertical distance h between the infrared transmitter and the infrared receiving belt. The infrared transmitter continuously emits detection waves to the infrared receiving belt. The interval between the infrared wave emitted by the infrared transmitter and the infrared wave received by the infrared receiving belt and the change in vertical distance Δh are used to generate a corresponding fluctuation curve. This can capture subtle plane undulations, making the flatness measurement accurate and outputting the vertical distance change value Δh, without relying on visual observation of the measured surface, thus avoiding human error.

[0024] (2) By setting up a moving block, a half-locking block, a guide bead, and a guide rod, the moving block is fixedly connected by two sets of half-locking blocks, ensuring that the device remains stable during movement. The inspection wheel moves on the mechanical plane, and the guide bead rolls in the guide rod, providing an effective limit for the horizontal movement of the inspection wheel, preventing deviation or tilting during testing, and keeping it moving on the predetermined path, which significantly improves the measurement accuracy and stability.

[0025] (3) By setting up a sleeve, support rod, fixing hole, placement slot and handle, the support rod is fixed on both sides of the upper plate by the sleeve, and the support height of the support rod is adjusted by multiple sets of fixing holes so that the inspection wheel can be accurately placed on the mechanical plane. After use, the operator can disassemble the support rod and insert it horizontally into the placement slot of the upper plate for storage. The device can be lifted by the handle for carrying, which not only improves the portability of the equipment, but also facilitates quick movement. Attached Figure Description

[0026] Figure 1 This is a front view structural diagram of the present invention;

[0027] Figure 2This is a side view of the inspection wheel structure of the present invention;

[0028] Figure 3 This is a top view cross-sectional structural diagram of the lower plate of the present invention;

[0029] Figure 4 This is a schematic diagram of the upper plate structure of the present invention;

[0030] Figure 5 This is a fluctuation curve output by the data receiving terminal of the present invention.

[0031] In the diagram: 1. Top plate; 2. Handle; 3. Infrared receiver strip; 4. Infrared transmitter; 5. Mounting post; 6. Moving block; 7. Through slot; 8. Sleeve; 9. Spring; 10. Protective plate; 11. Horizontal block; 12. Inspection wheel; 13. Bottom plate; 14. Support rod; 15. Fixing hole; 16. Positioning bolt; 17. Insert sleeve; 18. Support piece; 19. Semi-clamping block; 20. Connecting screw; 21. Guide ball; 22. Moving slot; 23. Guide rod; 24. Crossbar; 25. Battery; 26. Placement slot; 27. Central processing unit; Δh -- Vertical distance change value; h1 -- Upper deviation value of vertical distance; h2 -- Lower deviation value of vertical distance. Detailed Implementation

[0032] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0033] Please see Figure 1-4 An embodiment of the present invention provides an infrared measuring device for detecting the mechanical flatness of titanium and titanium alloy plates, comprising a lower plate 13 and an upper plate 1. The upper plate 1 is fixedly connected to the top of the lower plate 13. An infrared receiving strip 3 is installed at the bottom of the upper plate 1. A crossbar 24 is fixedly connected inside the lower plate 13. A movable block 6 is movably sleeved on the outside of the crossbar 24. A sleeve 8 is fixedly connected to the bottom front end of the movable block 6. A through groove 7 is provided at the top and bottom of the sleeve 8. A mounting column 5 passes through the through groove 7. An infrared emitter 4 is fixedly mounted at the top of the mounting column 5. A spring 9 is fixedly connected to the bottom of the mounting column 5. A protective plate 10 is fixedly connected to the bottom of the spring 9. A horizontal block 11 is fixedly connected to the bottom of the protective plate 10. A rotatable inspection wheel 12 is installed at the bottom of the horizontal block 11. The infrared emitter 4 and the infrared receiving strip 3 are aligned vertically. The lower plate 13 and the upper plate 1 are parallel to each other.

[0034] Specifically, such as Figures 1-3 and Figure 5As shown, when the test wheel 12 moves, if it encounters undulations on the surface of the titanium and titanium alloy sheet being tested, the spring 9 will cause the mounting column 5 to rise and fall due to slight deformation, thereby changing the vertical distance between the infrared transmitter 4 and the infrared receiving strip 3. The infrared transmitter 4 continuously emits detection waves to the infrared receiving strip 3. When the vertical distance h changes, the central processing unit 27 of the device will record the change in the vertical distance Δh in real time and transmit it to the data receiving terminal or display (not shown), displaying the corresponding fluctuation curve and outputting the data Δh. This can capture subtle planar undulations and achieve the purpose of precise measurement. The infrared receiving strip 3 is a strip-shaped infrared receiver.

[0035] Inside the upper plate 1, a guide rod 23 is fixedly connected to the rear. The moving block 6 includes two sets of fixed half-blocks 19. The half-blocks 19 are fixed together by connecting screws 20. The half-blocks 19 merge to form a moving groove 22. The moving groove 22 is sleeved on the outside of the crossbar 24. The rear end of each half-block 19 is equipped with a rolling guide ball 21. The guide ball 21 and the guide rod 23 form a rolling connection. A support plate 18 is fixedly connected between the moving block 6 and the sleeve 8. The support plate 18 is a right-angled triangular steel plate.

[0036] Specifically, such as Figure 1 , Figure 2 and Figure 3 As shown, the inspection wheel 12 moves on the mechanical plane, and the guide ball 21 rolls inside the guide rod 23, providing an effective limit for the horizontal movement of the inspection wheel 12, preventing deviation or tilting during testing, and keeping it moving on the predetermined path.

[0037] The upper plate 1 has two sleeves 17 welded on both sides. A support rod 14 is inserted into the sleeve 17. The support rod 14 has equally spaced fixing holes 15. A positioning bolt 16 is installed at the sleeve 17. There are two sets of support rods 14. The support rods 14 are symmetrically distributed about the vertical center line of the upper plate 1. Two sets of parallel placement slots 26 are machined at the top of the upper plate 1. A handle 2 is fixedly installed above the placement slots 26. A battery 25 is set on the top right side of the upper plate 1. A central processing unit 27 is set on one side of the battery 25. The battery 25 supplies power to the central processing unit 27 and the infrared transmitter 4.

[0038] Specifically, such as Figure 1 and Figure 4 As shown, the upper plate 1 has support rods 14 fixed on both sides by insert sleeves 17, and the support height H of the support rods 14 is adjusted by multiple sets of fixing holes 15 so that the inspection wheel 12 can be accurately placed on the mechanical plane. After use, the operator can remove the support rods 14 and insert them horizontally into the placement slot 26 of the upper plate 1.

[0039] Working principle: The support rod 14 is removed from the placement slot 26 and inserted into the insert sleeve 17. Its height is fixed using the positioning bolt 16, allowing the inspection wheel 12 to rest on the mechanical plane. The sleeve 8 is pulled horizontally. When the inspection wheel 12 moves, if it encounters surface undulations, the spring 9 will slightly deform, causing the mounting column 5 to rise or fall, thereby changing the vertical distance h between the infrared transmitter 4 and the infrared receiving strip 3. The infrared transmitter 4 continuously emits detection waves to the infrared receiving strip 3. When the detection height changes, the central processing unit 27 records these height changes in real time and transmits them to the data receiving terminal or display for output and display, generating a corresponding wave diagram. This waveform curve of the vertical distance change value Δh is observed and recorded by the observer. (See...) Figure 5 This allows for the capture of subtle changes in the planar undulation value Δh, resulting in accurate flatness measurement and the output of the vertical distance change value Δh, which is used to determine whether the tolerance requirements are met.

[0040] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. For example, the infrared emitter 4 can be replaced by an externally customized, adapted laser emitter, and the infrared receiving band 3 can be replaced by an externally customized, adapted laser receiver. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. An infrared precision measuring device for detecting the flatness of titanium and titanium alloy plates, comprising an upper plate (1) and a lower plate (13), characterized in that: The upper plate (1) is fixedly connected to the top of the lower plate (13). An infrared receiving strip (3) is installed at the bottom of the upper plate (1). A crossbar (24) is fixedly connected inside the lower plate (13). A moving block (6) is movably sleeved on the outside of the crossbar (24). A sleeve (8) is fixedly connected to the bottom front end of the moving block (6). A through groove (7) is opened at the top and bottom of the sleeve (8). An installation column (5) passes through the through groove (7). An infrared transmitter (4) is fixedly mounted at the top of the installation column (5). A spring (9) is fixedly connected to the bottom of the installation column (5). A protective plate (10) is fixedly connected to the bottom of the spring (9). A horizontal block (11) is fixedly connected to the bottom of the protective plate (10). A rotatable inspection wheel (12) is installed at the bottom of the horizontal block (11). A battery (25) is provided on the top right side of the upper plate (1), and a central processing unit (27) is provided on one side of the battery (25) to supply power to the central processing unit (27) and the infrared transmitter (4); When the test wheel (12) moves on the surface being tested, if it encounters undulations on the surface being tested, the spring (9) will cause the mounting column (5) to rise and fall due to slight deformation, thereby changing the vertical distance h between the infrared transmitter (4) and the infrared receiving strip (3). The infrared transmitter (4) continuously emits infrared waves to the infrared receiving strip (3). If the interval between the infrared transmitter (4) emitting infrared waves and the infrared receiving strip (3) receiving infrared waves is Δt, then Δt = t2 - t1, where t1 is the emission time and t2 is the reception time. When Δt changes, the central processing unit (27) records the change in vertical distance h in real time as Δh; The Δh = k * c * Δt - h = k * c * (t2 - t1) - h, where k is the environmental correction coefficient, k = (speed of light in air / speed of light in vacuum) * (measured ambient temperature / theoretical ambient temperature), c is the speed of light, and * is the multiplication sign; The Δh value is transmitted by the central processing unit (27) to the data receiving terminal for display and to generate a corresponding fluctuation curve. The Δh value is then output to obtain the measurement result.

2. The infrared precision measuring device according to claim 1, characterized in that: The infrared transmitter (4) and the infrared receiving strip (3) are aligned vertically, and the lower plate (13) and the upper plate (1) are parallel to each other.

3. The infrared precision measuring device according to claim 1, characterized in that: The upper plate (1) is fixedly connected to the rear of the interior with a guide rod (23). The moving block (6) includes two sets of fixed half-blocks (19). The half-blocks (19) are fixed together by connecting screws (20). The half-blocks (19) are combined to form a moving groove (22). The moving groove (22) is sleeved on the outside of the crossbar (24).

4. The infrared precision measuring device according to claim 3, characterized in that: The semi-block (19) is equipped with a rolling guide bead (21) inside and at the rear end, and the guide bead (21) and the guide rod (23) form a rolling connection.

5. The infrared precision measuring device according to claim 1, characterized in that: A support plate (18) is fixedly connected between the movable block (6) and the sleeve (8), and the support plate (18) is a right-angled triangular steel plate.

6. The infrared precision measuring device according to claim 1, characterized in that: The upper plate (1) has sleeves (17) welded on both sides respectively. A support rod (14) is inserted into the sleeve (17). The support rod (14) has fixing holes (15) distributed at equal intervals. A positioning bolt (16) is installed at the sleeve (17).

7. The infrared precision measuring device according to claim 6, characterized in that: The support rod (14) is provided in two sets, and the support rod (14) is symmetrically distributed with respect to the vertical center line of the upper plate (1).

8. The infrared precision measuring device according to claim 1, characterized in that: The top of the upper plate (1) is machined with two sets of parallel placement grooves (26), and a handle (2) is fixedly mounted above the placement grooves (26).

9. A laser precision measuring device for detecting the flatness of titanium and titanium alloy plates, characterized in that, The infrared emitter (4) and the infrared receiver (3) in any of the infrared precision measuring devices for detecting the flatness of titanium and titanium alloy plates as described in claims 1 to 6 are replaced by a laser emitter and a laser receiver strip, respectively.

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