Electronic component testing mechanism for online material pulling

Abstract

The invention provides an on-line material pulling electronic component testing mechanism, which comprises a working table, wherein a defective product storage box is arranged on the working table; the supporting piece is connected to the working table, the conveying table is connected to the supporting piece, a conveying carrier belt is arranged on the conveying table, and a plurality of resistor pieces are located on the conveying carrier belt; and the testing mechanism is provided with a plurality of testing probes and a plurality of hook pins, and the testing mechanism is located right above the conveying carrier tape. When the resistor pin is detected to be unqualified, the pin hooking probe is driven by the telescopic air cylinder to move to the pin to be matched with the test probe, the pin hooking probe hooks the pin, when the lifting plate is lifted, the hooked pin falls into the defective product storage box due to the head weight, batch testing can be achieved through the structure, and the detection efficiency is improved. And defective products can be removed in time, so that the testing efficiency and the testing quality are greatly improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electronic component testing, in particular to an electronic component testing mechanism for online material pulling. BACKGROUND

[0002] Electronic component pin testing is a key link to ensure the normal function of components and the reliability of circuits, and its core is to verify whether the components are intact and the welding is correct by accurately detecting the electrical characteristics (such as resistance, voltage, conductivity, etc.) between the pins.

[0003] Currently, electronic component pin testing usually uses a multimeter, an LCR tester or a special test fixture. For un-welded components, offline detection can be performed. During the testing process, attention should be paid to avoid short circuit between pins. If the pin resistance is found to be abnormal, the conductivity is inconsistent or the signal transmission is invalid, the component damage, welding defects or circuit design problems need to be checked in time to ensure the stable operation of electronic products.

[0004] However, the existing testing method either tests individually, which seriously affects the testing efficiency, or tests in batches, which cannot timely remove defective products during the testing process, thereby increasing the burden of removing defective products in the later stage. SUMMARY

[0005] Therefore, the present application provides an electronic component testing mechanism for online material pulling, which solves the problem that the existing testing method either tests individually, which seriously affects the testing efficiency, or tests in batches, which cannot timely remove defective products during the testing process, thereby increasing the burden of removing defective products in the later stage.

[0006] To this end, in one aspect, the present application provides an electronic component testing mechanism for online material pulling, which comprises: a workbench, wherein a defective product storage box is arranged on the workbench; a support connected to the workbench, a conveying table connected to the support, wherein a conveying tape is arranged on the conveying table, and a plurality of resistance elements are arranged on the conveying tape; and a testing mechanism, wherein a plurality of testing probes and a plurality of pin hooks are arranged on the testing mechanism, and the testing mechanism is located directly above the conveying tape.

[0007] Further, the support comprises a connecting column, a connecting block and a plurality of support protrusions, the connecting column is connected to the workbench, the connecting block is connected to the connecting column, and the plurality of support protrusions are connected to the connecting block.

[0008] Further, a limiting plate is arranged on the conveying table.

[0009] Further, the testing probes are connected to the lifting plate, and the pin hooks are located on the side of the testing probes.

[0010] Further, the hooking foot probe is provided with a telescopic cylinder on the top, and the telescopic cylinder is connected to the lifting plate.

[0011] Further, the hooking foot probe is provided with a hooking foot groove.

[0012] Further, the test probe is provided with a transmitter, the telescopic cylinder is provided with a signal receiver, the top of the test probe is provided with a connecting interface, the connecting interface penetrates through the lifting plate, and the electric wire is connected to the connecting interface.

[0013] Further, the lifting plate is provided with a plurality of lifting cylinders, and the plurality of lifting cylinders are connected to the mounting plate.

[0014] The electronic component testing mechanism for online material pulling provided by the application places a plurality of resistors on an anti-static conveying tape on a workbench, the conveying tape is continuously conveyed under the driving motor of the conveying structure, a testing mechanism is arranged above the conveying tape, when the conveying tape is conveyed below the testing mechanism, the lifting cylinder is lowered, the test probe is abutted against the resistor pin, when the test probe detects that the resistor pin is qualified, the hooking foot probe is in the original position, when the resistor pin is detected to be unqualified, the hooking foot probe is driven by the telescopic cylinder to move to the pin and cooperate with the test probe, the hooking foot probe hooks the pin, when the lifting plate is lifted, the hooked pin falls into the defective product storage box due to the weight of the head, the structure can realize batch testing and timely removal of defective products, and the testing efficiency and testing quality are greatly improved.

[0015] Therefore, the embodiment has the following beneficial effects compared with the prior art: The electronic component testing mechanism for online material pulling solves the problem that the existing testing method is either single testing, which seriously affects the testing efficiency, or batch testing, which cannot timely remove defective products in the testing process, thereby increasing the burden of removing defective products in the later period. BRIEF DESCRIPTION OF DRAWINGS

[0016] Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The accompanying drawings are included to provide a description of preferred embodiments, and are not meant to limit the present application. Moreover, the same reference numerals in the attached drawings indicate the same or similar components. In the drawings: Figure 1 A perspective view of the electronic component testing mechanism for online material pulling provided by the embodiment of the application Figure 1 ; Figure 2 A perspective view of the electronic component testing mechanism for online material pulling provided by the embodiment of the application Figure 2 ; Figure 3 A perspective view of an electronic component testing mechanism with online material pulling provided by an embodiment of the present application Figure 3 Figure 4 A perspective view of an electronic component testing mechanism with online material pulling provided by an embodiment of the present application Figure 4 .

[0017] Wherein, 1 - workbench; 2 - defective product storage box; 3 - support; 31 - connecting column; 32 - connecting block; 33 - supporting protrusion; 4 - conveying table; 5 - conveying carrier tape; 6 - resistance; 7 - testing mechanism; 8 - test probe; 9 - hook probe; 10 - limit plate; 11 - lifting plate; 12 - telescopic cylinder; 13 - hook groove; 14 - connecting interface; 15 - lifting cylinder; 16 - mounting plate. DETAILED DESCRIPTION

[0018] Exemplary embodiments of the present disclosure will be described in greater detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it is understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be accurately conveyed to those skilled in the art. Embodiment one:

[0019] Referring to Figures 1-4 , the present embodiment provides an electronic component testing mechanism with online material pulling, which comprises: a workbench 1, on which a defective product storage box 2 is arranged; a support 3 connected to the workbench 1, a conveying table 4 connected to the support 3, on which a conveying carrier tape 5 is arranged, and a plurality of resistance elements 6 are arranged on the conveying carrier tape 5; and a testing mechanism 7 comprising a plurality of test probes 8 and a plurality of hook probes 9, which is located directly above the conveying carrier tape 5.

[0020] Specifically, referring to Figures 1-4 , the support 3 comprises a connecting column 31, a connecting block 32 and a plurality of supporting protrusions 33, the connecting column 31 is connected to the workbench 1, the connecting block 32 is connected to the connecting column 31, and the plurality of supporting protrusions 33 are connected to the connecting block 32.

[0021] Specifically, referring to Figures 1-4 ​The limiting plate 10 is arranged on the conveying table 4, and the tail of the resistance pin is limited by the limiting plate, so that the resistance pin is prevented from falling directly from the conveying belt due to the head being heavier than the foot, and when the resistance pin is hooked by the hooking probe due to unqualified test, the resistance pin is easily fallen into the defective product recycling box.

[0022] The electronic component test mechanism for online material pulling provided by the application comprises a defective product storage box arranged on a workbench, a plurality of resistors are placed on an anti-static conveying belt, the conveying belt is continuously conveyed under the driving motor of a conveying structure, a test mechanism is arranged above the conveying belt, when the conveying belt is conveyed to below the test mechanism, a lifting cylinder is lowered to abut the test probe against the resistance pin, when the test probe detects that the resistance pin is qualified, the hooking probe is located at the original position, when the resistance pin is detected to be unqualified, the hooking probe is driven by the telescopic cylinder to move to the resistance pin and cooperate with the test probe, the hooking probe hooks the resistance pin, and when the lifting plate is lifted, the hooked resistance pin falls into the defective product storage box due to the weight of the head, so that batch testing and timely removal of defective products are realized, and the test efficiency and test quality are greatly improved.

[0023] Therefore, the embodiment has the following beneficial effects compared with the prior art: The electronic component test mechanism for online material pulling solves the problem that the existing test method cannot timely remove defective products during testing if batch testing is performed, and increases the burden of removing defective products in the later stage. Embodiment two

[0024] Referring to Figures 1-4 The electronic component test mechanism for online material pulling provided by the embodiment two is shown in the figure, and the embodiment further makes the following improved technical solutions on the basis of the above-mentioned embodiment: the test probe 8 is connected to the lifting plate 11, and the hooking probe 9 is located at the side of the test probe 8, so that when the resistance is unqualified, the resistance pin is hooked by the hooking probe, and the defective product is removed.

[0025] The telescopic cylinder 12 is arranged at the top of the hooking probe 9 and connected to the lifting plate 11, so that the hooking probe is moved to the resistance pin by the telescopic cylinder, and the resistance pin is easily hooked.

[0026] The hooking groove 13 is arranged on the hooking probe 9. Embodiment three

[0027] Referring to Figures 1-4, the electronic component testing mechanism provided by the embodiment three of the present application is shown in the figure, and the technical scheme improved further based on the above-mentioned embodiment is that: the transmitter is arranged on the test probe 8, the signal receiver is arranged on the telescopic air cylinder 12, the connecting interface 14 is arranged on the top of the test probe 8, the connecting interface 14 penetrates through the lifting plate 11, and the wire is connected on the connecting interface 14. When the test probe tests the defective product, the signal is sent to the telescopic air cylinder in time, and the telescopic air cylinder drives the hooking probe to hook the resistance pin. Embodiment four:

[0028] Referring to Figures 1-4 , the electronic component testing mechanism provided by the embodiment three of the present application is shown in the figure, and the technical scheme improved further based on the above-mentioned embodiment is that: the transmitter is arranged on the test probe 8, the signal receiver is arranged on the telescopic air cylinder 12, the connecting interface 14 is arranged on the top of the test probe 8, the connecting interface 14 penetrates through the lifting plate 11, and the wire is connected on the connecting interface 14. When the test probe tests the defective product, the signal is sent to the telescopic air cylinder in time, and the telescopic air cylinder drives the hooking probe to hook the resistance pin.

[0029] The distance between the test probe and the conveying tape is greater than the distance between the hooking probe and the conveying tape, so that when the bottom of the test probe abuts against the pin, the hooking probe abuts against the conveying tape, and the resistance pin is conveniently hooked.

[0030] The testing mechanism of the present application is suitable for resistance components and any electronic components with heads.

[0031] Obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application belong to the scope of the claims of the present application and the equivalent technologies thereof, the present application also intends to include these modifications and variations.

Claims

1. An electronic component testing mechanism for in-line depaneling, comprising: Include: Workbench (1), which is provided with a defective product storage box (2); Support (3) connected to the workbench (1), Conveying table (4) connected to the support (3), the conveying table (4) is provided with a conveying belt (5), and a plurality of resistance elements (6) are located on the conveying belt (5); And test mechanism (7) comprising a plurality of test probes (8) and a plurality of hook probes (9), the test mechanism (7) is located directly above the conveying belt (5).

2. An electronic component testing mechanism for in-line stripping according to claim 1, wherein, The support (3) comprises a connecting column (31), a connecting block (32) and a plurality of support protrusions (33), the connecting column (31) is connected to the workbench (1), the connecting block (32) is connected to the connecting column (31), and a plurality of support protrusions (33) are connected to the connecting block (32).

3. The electronic component testing mechanism of claim 1, wherein, The limiting plate (10) is arranged on the conveying table (4).

4. An electronic component testing mechanism for in-line stripping according to claim 3, wherein, The test probe (8) is connected to the lifting plate (11), and the hook probe (9) is located on the side of the test probe (8).

5. An electronic component testing mechanism for in-line stripping according to claim 4, wherein The hook probe (9) is provided with a telescopic air cylinder (12) at the top, and the telescopic air cylinder (12) is connected to the lifting plate (11).

6. An electronic component testing mechanism for in-line stripping according to claim 5, wherein The hook probe (9) is provided with a hook groove (13).

7. An electronic component testing mechanism for in-line stripping as defined in claim 6, wherein The test probe (8) is provided with a transmitter, the telescopic air cylinder (12) is provided with a signal receiver, the test probe (8) is provided with a connecting interface (14) at the top, the connecting interface (14) passes through the lifting plate (11), and an electric wire is connected to the connecting interface (14).

8. The electronic component testing mechanism of claim 4, wherein, The lifting plate (11) is provided with a plurality of lifting air cylinders (15), and a plurality of lifting air cylinders (15) are connected to the mounting plate (16).

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