Equipment testing method and device, electronic equipment and computer readable storage medium

By configuring the protocol and business of the functional module under test through the configuration view, generating and automatically executing test scripts, the problems of high hardware dependence and low efficiency in existing technologies are solved, and fast and efficient industrial equipment testing is achieved.

CN120994480APending Publication Date: 2025-11-21SHENZHEN RAYSEES TECHNOLOGY CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202511164587.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-19
Publication Date
2025-11-21

AI Technical Summary

Technical Problem

Existing industrial equipment testing methods rely on hardware environments, resulting in high costs, low efficiency, and long testing cycles, making it difficult to achieve fast and efficient testing.

Method used

By configuring the protocol and business of the functional module under test through the configuration view, test scripts are generated and executed automatically, reducing dependence on the hardware environment and realizing automated testing.

Benefits of technology

It shortens the testing cycle, reduces testing costs, improves testing efficiency, and reduces the time spent on whole-machine testing, enabling faster and more efficient testing of industrial equipment.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN120994480A_ABST
    Figure CN120994480A_ABST
Patent Text Reader

Abstract

The invention discloses an equipment test method and device, electronic equipment and a computer readable storage medium, and the method comprises the steps: determining a to-be-tested function module of to-be-tested equipment according to a test command, and outputting a configuration view corresponding to the to-be-tested function module; configuring the function module to be tested through the configuration view to obtain protocol configuration information and service configuration information; executing a test script corresponding to the to-be-tested function module according to the protocol configuration information and the service configuration information; and determining a test result of the to-be-tested function module according to an execution result of the test script. By applying the technical scheme provided by the invention, quicker and more efficient industrial equipment testing can be realized, the delivery period is further shortened, and the testing cost is reduced.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This application relates to the field of industrial testing technology, and in particular to a device testing method, apparatus, electronic device, and computer-readable storage medium. Background Technology

[0002] Currently, system testing of industrial equipment is often limited by many factors, resulting in longer testing cycles or the inability to fully execute tests. For example... Figure 1 As shown, Figure 1 This is a schematic diagram of the architecture of an industrial equipment provided in this application. In industrial welding scenarios, in order to meet the needs of automated production, industrial equipment typically includes multiple functional modules such as power controller, PLC (Programmable Controller), industrial camera, water chiller, and temperature measurement module. The modules involve multiple communication links and protocols such as Ethernet and 232 / 485 serial ports, and are characterized by high system complexity and long testing cycle.

[0003] Traditional system testing methods primarily test by subsystem, such as... Figure 1 The industrial equipment shown is simplified as follows: Figures 2 to 4 The three subsystems were tested separately. However, this implementation method is too dependent on the hardware environment, requiring corresponding hardware modules for testing, which is costly; moreover, the dependency path is long, requiring all functional modules included in the system to be developed and debugged before testing can start, which lengthens the delivery cycle; in addition, since it is a manual operation, it heavily relies on the business skills and proficiency of the testers, which is too inefficient.

[0004] Therefore, how to achieve faster and more efficient industrial equipment testing, shorten delivery cycles, and reduce testing costs is a problem that urgently needs to be solved by those skilled in the art. Summary of the Invention

[0005] The purpose of this application is to provide a device testing method that enables faster and more efficient testing of industrial equipment, further shortening the delivery cycle and reducing testing costs. Another purpose of this application is to provide a device testing apparatus, electronic equipment, and computer-readable storage medium, all of which have the aforementioned beneficial effects.

[0006] In a first aspect, this application discloses a device testing method, comprising:

[0007] The test command determines the functional module under test of the device under test and outputs the configuration view corresponding to the functional module under test.

[0008] The configuration view is used to configure the functional module under test to obtain protocol configuration information and service configuration information;

[0009] Execute the test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information;

[0010] The test results of the functional module under test are determined based on the execution results of the test script.

[0011] Optionally, the configuration view is used to configure the functional module under test to obtain protocol configuration information, including:

[0012] The protocol configuration information is obtained by configuring the functional module under test through the configuration view, including communication link configuration information, standard protocol configuration information, and functional role configuration information.

[0013] Optionally, the functional module under test can be configured through the configuration view to obtain business configuration information, including:

[0014] The configuration view is used to configure the business of the functional module under test, and the business protocol configuration information and the automated test case set are obtained as the business configuration information.

[0015] Optionally, the test script corresponding to the functional module under test is executed according to the protocol configuration information and the service configuration information, including:

[0016] Deploy the automated test case set according to the protocol configuration information and the business configuration information;

[0017] Generate test scripts corresponding to the functional modules to be tested based on the automated test case set;

[0018] Execute the test script corresponding to the functional module to be tested.

[0019] Optionally, deploying the automated test case set according to the protocol configuration information and the service configuration information includes:

[0020] The test role of the functional module to be tested is determined based on the protocol configuration information and the service configuration information;

[0021] When the test role is the receiving end, the automated test case set is deployed in the test system;

[0022] When the test role is the sender, the automated test case set is deployed on the functional module to be tested.

[0023] Optionally, the test script corresponding to the functional module under test is executed, including:

[0024] When the test role is the receiving end, a first test instruction is sent to the functional module under test, and a first response result is received from the functional module under test based on the first test instruction; the test result of the receiving end is determined based on the first response result.

[0025] When the test role is the sending end, it receives the second test instruction sent by the function module under test, and generates a second response result according to the second test instruction and sends it to the function module under test, so that the function module under test determines the test result of the sending end according to the second response result.

[0026] Optionally, the test result of the functional module under test is determined based on the execution result of the test script, including:

[0027] The test results from the receiving end and the test results from the sending end are used as the execution results of the test script;

[0028] A test report is generated based on the execution results of the test script to obtain the test results of the functional module under test.

[0029] Secondly, this application discloses a device testing apparatus, comprising:

[0030] The output module is used to determine the functional module under test of the device under test according to the test command, and output the configuration view corresponding to the functional module under test;

[0031] The configuration module is used to configure the functional module under test through the configuration view to obtain protocol configuration information and service configuration information;

[0032] The execution module is used to execute the test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information;

[0033] The determination module is used to determine the test result of the functional module under test based on the execution result of the test script.

[0034] Thirdly, this application discloses an electronic device, including:

[0035] Memory, used to store computer programs;

[0036] A processor, used to execute the computer program to implement the steps of any of the device testing methods described above.

[0037] Fourthly, this application discloses a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of any of the device testing methods described above.

[0038] This application provides a device testing method, comprising: determining the functional module under test of the device under test according to a test command, and outputting a configuration view corresponding to the functional module under test; configuring the functional module under test through the configuration view to obtain protocol configuration information and service configuration information; executing a test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information; and determining the test result of the functional module under test based on the execution result of the test script.

[0039] By applying the technical solution provided in this application, corresponding configuration views can be pre-developed for each functional module under test in the industrial equipment under test. This allows for protocol and service configuration to be completed through the corresponding configuration view when testing any functional module under test, thereby enabling the execution of the corresponding test scripts, obtaining the test results of the functional module under test, and completing the equipment test. Therefore, this technical solution allows for flexible configuration of different functional modules within the equipment under test through their respective configuration views to complete individual tests, effectively reducing the dependence of equipment testing on the hardware environment and thus reducing the environmental costs required for equipment testing. It also effectively reduces the time spent on whole-machine testing, thereby improving equipment testing efficiency. Furthermore, the entire testing process can be automated, eliminating the need for manual operation and further improving equipment testing efficiency. Therefore, this implementation method enables faster and more efficient industrial equipment testing, further shortening the delivery cycle and reducing testing costs.

[0040] The equipment testing apparatus, electronic equipment, and computer-readable storage medium provided in this application also have the above-mentioned technical effects, and will not be described in detail here. Attached Figure Description

[0041] To more clearly illustrate the technical solutions in the prior art and the embodiments of this application, the accompanying drawings used in the description of the prior art and the embodiments of this application will be briefly introduced below. Of course, the accompanying drawings described below with respect to the embodiments of this application are only a part of the embodiments in this application. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort, and such other drawings also fall within the protection scope of this application.

[0042] Figure 1 A schematic diagram of the architecture of an industrial device provided in this application;

[0043] Figure 2 for Figure 1 A schematic diagram of the vision subsystem of the industrial equipment shown.

[0044] Figure 3 for Figure 1A schematic diagram of the motion control subsystem of the industrial equipment shown.

[0045] Figure 4 for Figure 1 A schematic diagram of the temperature control subsystem of the industrial equipment shown.

[0046] Figure 5 This is a schematic flowchart of a device testing method provided in an embodiment of this application;

[0047] Figure 6 This is a schematic diagram of a layered model of a device testing system provided in an embodiment of this application;

[0048] Figure 7 This is a schematic diagram of a pre-configuration based on a configuration view, provided as an embodiment of this application.

[0049] Figure 8 This is a schematic diagram of a pre-configuration process provided in an embodiment of this application;

[0050] Figure 9 This is a schematic diagram of a protocol configuration process provided in an embodiment of this application;

[0051] Figure 10 This is a schematic diagram of a service configuration process provided in an embodiment of this application;

[0052] Figure 11 This is a schematic flowchart illustrating another device testing method provided in an embodiment of this application;

[0053] Figure 12 This is a diagram of an industrial equipment testing architecture provided in an embodiment of this application;

[0054] Figure 13 This is a schematic diagram of the structure of a device testing apparatus provided in an embodiment of this application;

[0055] Figure 14 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0056] The core of this application is to provide a device testing method that enables faster and more efficient testing of industrial equipment, further shortening the delivery cycle and reducing testing costs. Another core aspect of this application is to provide a device testing apparatus, electronic equipment, and computer-readable storage medium, all of which have the aforementioned beneficial effects.

[0057] To provide a clearer and more complete description of the technical solutions in the embodiments of this application, the technical solutions in the embodiments of this application will be described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0058] Please refer to Figure 5 , Figure 5 This is a schematic flowchart of a device testing method provided in an embodiment of this application. The device testing method may include, but is not limited to, the following S101~S104.

[0059] S101: Determine the functional module under test of the device under test according to the test command, and output the configuration view corresponding to the functional module under test.

[0060] This step aims to identify the functional modules under test (DUT) in the device under test (DUT) and output their corresponding configuration views. Specifically, device testing can be initiated via a test command, which can be a user-initiated command directly through the front end or an automatic trigger based on preset response conditions (such as interface sensing). Furthermore, based on this test command, the target device to be tested and the target functional modules within that device can be identified, i.e., the aforementioned DUT and the functional modules under test. Finally, for various industrial equipment, corresponding configuration views can be pre-developed for each functional module requiring testing, enabling pre-test configuration to facilitate device testing. Therefore, after identifying the DUT functional modules in the DUT, their corresponding configuration views can be output for visual display. Users can then pre-configure the DUT functional modules within these configuration views to facilitate subsequent testing processes.

[0061] Understandably, pre-developing corresponding configuration views for different functional modules within industrial equipment to enable flexible configuration and individual testing can effectively reduce the dependence of equipment testing on the hardware environment, thereby reducing the environmental costs required for equipment testing; at the same time, it can effectively reduce the time spent on whole-machine testing, thereby improving equipment testing efficiency.

[0062] S102: Configure the functional module under test through the configuration view to obtain protocol configuration information and service configuration information.

[0063] This step aims to pre-configure the corresponding functional modules under test based on the configuration view, mainly including protocol configuration and service configuration. Protocol configuration refers to protocol-related information required to complete device testing, such as, but not limited to, the communication links and protocols used for device testing. Service configuration refers to service-related information required to complete device testing, such as, but not limited to, service test types and service test case sets.

[0064] Specifically, to achieve the aforementioned pre-configured functions, embodiments of this application propose the following: Figure 6 The layered model shown, Figure 6 A layered model diagram of a device testing system (used for device testing and can be deployed on testing equipment, such as a computer) provided in an embodiment of this application mainly includes:

[0065] (1) Communication link layer: Load the corresponding link layer protocol stack according to the actual communication interface of the device under test, such as Ethernet, Wi-Fi, 485 serial port, etc.; the protocol of this layer is the standard protocol.

[0066] (2) Standard Protocol Layer: Based on the standard protocol of the actual device under test, the corresponding standard protocol stack is loaded. For Ethernet and Wi-Fi, it is IP / TCP / UDP, and for 485 serial port, it is Modbus protocol stack. The protocol in this layer is the standard protocol.

[0067] (3) Business Protocol Layer: Based on the module functions of the actual device under test, the corresponding business protocols are ported. The protocols in this layer are related to the business functions of the actual modules of the device under test and are private protocols, such as the temperature control and motion control business protocols of the industrial control computer.

[0068] (4) Automation layer: Based on the system testing requirements, design corresponding automated test sets and scripts for the module functions of the actual device under test; this layer also belongs to the business protocol.

[0069] Therefore, based on the above hierarchical model, pre-configuration based on configuration views can be achieved, such as... Figure 7 As shown, Figure 7 This is a pre-configuration diagram based on a configuration view provided in an embodiment of this application. Thus, the device testing system can support configuration simulation of different business modules on different views, wherein each view is carried out on a separate task.

[0070] As mentioned above, the pre-configuration of the functional module under test mainly includes protocol configuration and service configuration. Based on this, please refer to... Figure 8 , Figure 8 This is a schematic diagram of a pre-configuration process provided in an embodiment of this application, in which standard protocol configuration can be performed first, and then service configuration can be performed.

[0071] In one possible implementation, the protocol configuration information is obtained by configuring the functional module under test through a configuration view. This can include: configuring the communication link configuration information, standard protocol configuration information, and functional role configuration information as protocol configuration information by configuring the functional module under test through a configuration view. Figure 9 As shown, Figure 9 This is a schematic diagram of a protocol configuration process provided in an embodiment of this application. In its implementation, the communication link type, standard protocol type, functional role (client or server, master node or slave node), and standard protocol parameters can be configured sequentially.

[0072] In one possible implementation, the functional module under test is configured through a configuration view to obtain business configuration information. This can include: configuring the functional module under test through a configuration view to obtain business protocol configuration information and automated test case sets as business configuration information. For example... Figure 10 As shown, Figure 10 This is a schematic diagram of a business configuration process provided in an embodiment of this application. In its implementation, the simulation module, business protocol, and automated test case set can be configured sequentially.

[0073] S103: Execute the test script corresponding to the functional module under test according to the protocol configuration information and service configuration information.

[0074] This step aims to execute the test scripts corresponding to the functional modules under test. After determining the protocol configuration information and service configuration information, that is, after completing the protocol configuration and service configuration, the test scripts corresponding to the functional modules under test can be executed according to these configuration information, thereby completing the testing of the functional modules under test in the device under test.

[0075] In one possible implementation, executing the test script corresponding to the functional module under test based on the protocol configuration information and the business configuration information may include:

[0076] Deploy automated test case sets based on protocol configuration information and business configuration information;

[0077] Generate test scripts for the functional modules to be tested based on the automated test case set;

[0078] Execute the test script corresponding to the functional module to be tested.

[0079] As mentioned above, the pre-configuration of the functional module under test mainly includes protocol configuration and business configuration. The business configuration includes the configuration of automated test case sets. Based on the completed configuration, the automated deployment of automated test case sets can be further realized based on these configuration information, thereby generating a complete test script corresponding to the functional module under test. Finally, the test script can be executed.

[0080] Deploying automated test case sets based on protocol configuration information and business configuration information may include:

[0081] The test roles of the functional modules to be tested are determined based on the protocol configuration information and business configuration information.

[0082] When the test role is the receiver, the automated test case set will be deployed in the test system;

[0083] When the test role is the sender, the automated test case set will be deployed to the functional module under test.

[0084] Specifically, the deployment location of automated test cases during equipment testing is determined by the testing role of the functional module under test. When the functional module under test is tested as a receiver, the automated test case set can be deployed in the equipment testing system, and the equipment testing system will execute the automated test case set to achieve the testing of the functional module under test as a receiver. When the functional module under test is tested as a sender, the automated test case set can be deployed in the functional module under test, and the functional module under test will execute the automated test case set to achieve the testing of the functional module under test as a sender.

[0085] The test scripts that execute the functional module under test may include:

[0086] When the test role is the receiver, a first test instruction is sent to the functional module under test, and a first response result is received from the functional module under test based on the first test instruction; the test result of the receiver is determined based on the first response result.

[0087] When the test role is the sender, it receives the second test instruction sent by the module under test, generates a second response result based on the second test instruction, and sends it to the module under test so that the module under test can determine the test result of the sender based on the second response result.

[0088] As described above, the testing of the functional module under test (DUT) in the device under test (DUT) includes testing the DUT as a receiver and testing the DUT as a transmitter. Based on this, when the DUT is configured as a receiver, the device testing system, acting as a transmitter, sends a first test command to it. The DUT responds to this first test command and sends the corresponding first response result back to the device testing system. The device testing system then determines the receiver test result based on the first response result. Clearly, this receiver test result is the test result for the DUT as a receiver. When the DUT is configured as a transmitter, it sends a second test command to the device testing system. The device testing system, acting as a receiver, responds to this second test command and sends the corresponding second response result back to the DUT. The DUT then determines the transmitter test result based on the second response result. Clearly, this transmitter test result is the test result for the DUT as a transmitter.

[0089] S104: Determine the test results of the functional module under test based on the execution results of the test script.

[0090] This step aims to determine the device test results. The execution result of the test script is essentially the test result of the functional module under test. It's conceivable that once all functional modules in the device under test are tested, the entire device test is complete; of course, it's also possible to test only a single functional module, depending on the actual requirements.

[0091] In one possible implementation, determining the test result of the functional module under test based on the execution result of the test script may include:

[0092] The test results from the receiving end and the test results from the sending end are used as the execution results of the test script;

[0093] A test report is generated based on the execution results of the test script, and the test results of the functional module under test are obtained.

[0094] As mentioned above, the testing of the functional module under test (DUT) in the device under test (DUT) includes testing the DUT as a receiver and testing the DUT as a transmitter. Based on this, after completing both types of tests, the receiver test results and transmitter test results can be combined into the execution result of the test script, and finally output in the form of a test report, thus obtaining the test results of the DUT. Figure 11 As shown, Figure 11This is a flowchart illustrating another device testing method provided in an embodiment of this application. In its implementation, configuration operations, test script execution operations, and test report generation operations can be performed sequentially to achieve complete device testing.

[0095] As can be seen, the device testing method provided in this application allows for the pre-development of corresponding configuration views for each functional module under test in the industrial device under test. This enables the completion of protocol and service configurations through the corresponding configuration view when testing any functional module, thereby executing the corresponding test script, obtaining the test results of the functional module under test, and completing the device test. Therefore, this technical solution allows for flexible configuration of different functional modules within the device under test through their respective configuration views to complete individual tests, effectively reducing the dependence of device testing on the hardware environment and thus lowering the environmental costs required for device testing. It also effectively reduces the time consumed in whole-machine testing, thereby improving device testing efficiency. Furthermore, the entire testing process can be automated, eliminating the need for manual operation and further enhancing device testing efficiency. Therefore, this implementation method enables faster and more efficient industrial device testing, further shortening the delivery cycle and reducing testing costs.

[0096] Finally, for easier understanding, please refer to the following example. For example... Figure 12 As shown, Figure 12 This application provides an embodiment of an industrial equipment testing architecture diagram, in which the PCL simulation module is a computer-based equipment testing system. The test object is an industrial control computer, which runs relevant test sets of the motion control subsystem. The execution steps are as follows:

[0097] 1. Open a single configuration view on PLC simulation module 6 and complete the standard protocol-related configurations (e.g., set the communication link to Ethernet, select the network card, set the standard protocol to Modbus-TCP, set the test role to client, and configure parameters such as IP address and TCP port number).

[0098] 2. Complete the relevant configurations for the business protocol (e.g., select PLC for the simulation module, select motion control for the business protocol, and select PLC-motion control test set for the automation test set).

[0099] 3. Configure the application, execute the test script, and run the corresponding automated test suite;

[0100] 4. The PLC simulation module 6 simulates sending the salesperson's instructions to the industrial computer 1 based on the test set. The industrial computer 1 processes and responds. The PLC simulation module 6 judges whether the result meets the expectations and outputs the Pass / Failed result.

[0101] 5. All test cases in the PLC simulation module 6 test set have been executed and a test report has been generated. The relevant test cases of industrial computer 1 as the data receiving end have been tested.

[0102] 6. The industrial computer 1 executes the automated test set. Based on the test set, the industrial computer 1 sends motion control related instructions to the PLC simulation module 6. The PLC simulation module 6 processes and responds. The industrial computer 1 judges whether the result meets the expectations and outputs the Pass / Failed result.

[0103] 7. All test cases in the test suite of Industrial Control Computer 1 have been executed and a test report has been generated. The relevant test cases of Industrial Control Computer 1 as the data sending end have been tested.

[0104] This application provides a device testing apparatus.

[0105] Please refer to Figure 13 , Figure 13 This is a schematic diagram of a device testing apparatus provided in an embodiment of this application. The device testing apparatus may include:

[0106] Output module 1 is used to determine the functional module under test of the device under test according to the test command, and output the configuration view corresponding to the functional module under test;

[0107] Configuration module 2 is used to configure the functional module under test through the configuration view to obtain protocol configuration information and service configuration information;

[0108] Execution module 3 is used to execute the test scripts corresponding to the functional modules under test according to the protocol configuration information and service configuration information;

[0109] Module 4 is used to determine the test results of the functional module under test based on the execution results of the test script.

[0110] As can be seen, the equipment testing apparatus provided in this application embodiment can pre-develop corresponding configuration views for each functional module under test in the industrial equipment under test. This allows for protocol and service configuration to be completed through the corresponding configuration view when testing any functional module under test, thereby enabling the execution of the corresponding test script, obtaining the test results of the functional module under test, and completing the equipment test. Therefore, this technical solution allows for flexible configuration of different functional modules within the equipment under test through corresponding configuration views to complete individual testing, effectively reducing the dependence of equipment testing on the hardware environment and thus reducing the environmental costs required for equipment testing. It also effectively reduces the time consumed in whole-machine testing, thereby improving equipment testing efficiency. Furthermore, the entire testing process can be automated, eliminating the need for manual operation and further improving equipment testing efficiency. Therefore, this implementation method enables faster and more efficient industrial equipment testing, further shortening the delivery cycle and reducing testing costs.

[0111] In one embodiment of this application, the configuration module 2 described above can be specifically used to configure the protocol of the functional module under test through the configuration view, and obtain communication link configuration information, standard protocol configuration information, and functional role configuration information as protocol configuration information.

[0112] In one embodiment of this application, the configuration module 2 described above can be specifically used to configure the functional module under test through the configuration view, and obtain business protocol configuration information and automated test case set as business configuration information.

[0113] In one embodiment of this application, the execution module 3 may include:

[0114] The deployment unit is used to deploy automated test case sets based on protocol configuration information and business configuration information.

[0115] The generation unit is used to generate test scripts for the functional modules to be tested based on the automated test case set.

[0116] The execution unit is used to execute the test scripts corresponding to the functional modules under test.

[0117] In one embodiment of this application, the deployment unit can be specifically used to determine the test role of the functional module under test based on the protocol configuration information and the service configuration information; when the test role is the receiver, the automated test case set is deployed in the test system; when the test role is the sender, the automated test case set is deployed in the functional module under test.

[0118] In one embodiment of this application, the execution unit can be specifically used to send a first test instruction to the functional module under test when the test role is the receiver, and receive a first response result fed back by the functional module under test based on the first test instruction; determine the test result of the receiver based on the first response result; when the test role is the sender, receive a second test instruction sent by the functional module under test, and generate a second response result based on the second test instruction and send it to the functional module under test, so that the functional module under test can determine the test result of the sender based on the second response result.

[0119] In one embodiment of this application, the determining module 4 can be specifically used to take the test results of the receiving end and the test results of the sending end as the execution results of the test script; generate a test report based on the execution results of the test script, and obtain the test results of the functional module to be tested.

[0120] For a description of the apparatus provided in the embodiments of this application, please refer to the above method embodiments; further details will not be repeated here.

[0121] This application also provides an electronic device, please refer to... Figure 14 , Figure 14 This application provides a schematic diagram of the structure of an electronic device, which may include:

[0122] Memory 11 is used to store computer programs;

[0123] The processor 10 is configured to execute computer programs and implement the steps of any of the device testing methods described above.

[0124] like Figure 14 The diagram shows the structural composition of an electronic device, which may include a processor 10, a memory 11, a communication interface 12, and a communication bus 13. The processor 10, memory 11, and communication interface 12 all communicate with each other through the communication bus 13.

[0125] In this embodiment, the processor 10 may be a central processing unit (CPU), an application-specific integrated circuit, a digital signal processor, a field-programmable gate array, or other programmable logic devices.

[0126] The processor 10 can call programs stored in the memory 11. Specifically, the processor 10 can execute operations in the embodiments of the device testing method.

[0127] The memory 11 is used to store one or more programs. The programs may include program code, which includes computer operation instructions. In this embodiment, the memory 11 stores at least a program for implementing the following functions:

[0128] The test command determines the functional module under test of the device under test and outputs the configuration view corresponding to the functional module under test.

[0129] Configure the functional module under test through the configuration view to obtain protocol configuration information and service configuration information;

[0130] Execute the test scripts corresponding to the functional modules under test based on the protocol configuration information and business configuration information;

[0131] The test results of the functional module under test are determined based on the execution results of the test script.

[0132] In one possible implementation, the memory 11 may include a program storage area and a data storage area, wherein the program storage area may store the operating system and applications required for at least one function; and the data storage area may store data created during use.

[0133] In addition, memory 11 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device or other volatile solid-state storage device.

[0134] Communication interface 12 can be an interface for the communication module, used to connect with other devices or systems.

[0135] Of course, it should be noted that, Figure 14 The structure shown does not constitute a limitation on the electronic device in the embodiments of this application. In practical applications, the electronic device may include more than Figure 14 More or fewer components as shown, or combinations of certain components.

[0136] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps of any of the device testing methods described above.

[0137] The computer-readable storage medium may include various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0138] For a description of the computer-readable storage medium provided in this application, please refer to the above method embodiments; further details will not be repeated here.

[0139] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to the method section.

[0140] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0141] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein can be implemented directly by hardware, a software module executed by a processor, or a combination of both. The software module can be located in random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.

[0142] The technical solutions provided in this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are only for the purpose of helping to understand the methods and core ideas of this application. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of this application.

Claims

1. A device testing method, characterized in that, include: The test command determines the functional module under test of the device under test and outputs the configuration view corresponding to the functional module under test. The configuration view is used to configure the functional module under test to obtain protocol configuration information and service configuration information; Execute the test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information; The test results of the functional module under test are determined based on the execution results of the test script.

2. The equipment testing method according to claim 1, characterized in that, The configuration view is used to configure the functional module under test, thereby obtaining protocol configuration information, including: The protocol configuration information is obtained by configuring the functional module under test through the configuration view, including communication link configuration information, standard protocol configuration information, and functional role configuration information.

3. The equipment testing method according to claim 1, characterized in that, The configuration view is used to configure the functional module under test, thereby obtaining business configuration information, including: The configuration view is used to configure the business of the functional module under test, and the business protocol configuration information and the automated test case set are obtained as the business configuration information.

4. The equipment testing method according to claim 3, characterized in that, Execute the test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information, including: Deploy the automated test case set according to the protocol configuration information and the business configuration information; Generate test scripts corresponding to the functional modules to be tested based on the automated test case set; Execute the test script corresponding to the functional module to be tested.

5. The equipment testing method according to claim 4, characterized in that, Deploying the automated test case set according to the protocol configuration information and the business configuration information includes: The test role of the functional module to be tested is determined based on the protocol configuration information and the service configuration information; When the test role is the receiving end, the automated test case set is deployed in the test system; When the test role is the sender, the automated test case set is deployed on the functional module to be tested.

6. The equipment testing method according to claim 5, characterized in that, Execute the test script corresponding to the functional module under test, including: When the test role is the receiving end, a first test instruction is sent to the functional module under test, and a first response result is received from the functional module under test based on the first test instruction; the test result of the receiving end is determined based on the first response result. When the test role is the sending end, it receives the second test instruction sent by the function module under test, and generates a second response result according to the second test instruction and sends it to the function module under test, so that the function module under test determines the test result of the sending end according to the second response result.

7. The equipment testing method according to claim 6, characterized in that, The test results of the functional module under test are determined based on the execution results of the test script, including: The test results from the receiving end and the test results from the sending end are used as the execution results of the test script; A test report is generated based on the execution results of the test script to obtain the test results of the functional module under test.

8. A device for testing equipment, characterized in that, include: The output module is used to determine the functional module under test of the device under test according to the test command, and output the configuration view corresponding to the functional module under test; The configuration module is used to configure the functional module under test through the configuration view to obtain protocol configuration information and service configuration information; The execution module is used to execute the test script corresponding to the functional module under test according to the protocol configuration information and the service configuration information; The determination module is used to determine the test result of the functional module under test based on the execution result of the test script.

9. An electronic device, characterized in that, include: Memory, used to store computer programs; A processor for executing the computer program to implement the steps of the device testing method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the device testing method as described in any one of claims 1 to 7.