Spectrometer device for obtaining spectroscopy information about at least one object

Abstract

A spectrometer device (110) for obtaining spectroscopy information about at least one object (112) is disclosed. The spectrometer device (110) comprises:-at least one detector (116) for detecting light from an object (112); -at least one optical filter (122) configured for passing incident light in at least one selected wavelength range onto the detector (116); -at least one light source (126) configured for emitting light in at least one optical spectral range; -at least one sample interface (132) configured for allowing light emitted by the light source (126) to illuminate an object (112) held by the sample interface (132), and configured for allowing light from the object (112) held by the sample interface (132) to propagate via the optical filter (122) to the detector (116), the sample interface (132) comprises at least one module cover window (134), the at least one module cover window comprises at least one substrate (136), and the module cover window (134) comprises at least one internal calibration target (138) partially covering the substrate (136); -at least one first light path (140), where the first light path (140) is configured for allowing light emitted by the light source (126) to propagate via the optical filter (122) to the detector (116) by at least one pass through the sample interface (132); and-at least one second light path (142), where the second light path (142) is configured for allowing light emitted by the light source (126) to propagate via the optical filter (122) to the detector (116) by at least one interaction with the internal calibration target (138).

Description

Technical Field

[0001] This invention relates to spectrometer equipment and several applications. Generally, such equipment can be used for research or monitoring purposes, particularly in the infrared (IR) spectral region, especially in the near-infrared (NIR) spectral region, and in the visible (VIS) spectral region. However, other applications are also possible. Background Technology

[0002] Generally, spectrometers are known to collect information about the spectral composition of an object when it irradiates, reflects, and / or absorbs light. To allow comparison of spectra from multiple spectrometers, these spectrometers must be calibrated. Typically, spectrometers require wavelength or wavenumber calibration, such as calibration of the x-axis of the recorded spectrum, and calibration of the signal, reflectance, transmittance, and / or absorbance (i.e., calibration of the y-axis of the recorded spectrum). For example, calibration of the y-axis of the recorded spectrum for reflectance measurements, typically required in diffuse near-infrared spectroscopy, can be performed using an external reflectance standard placed at the object's location. Alternatively, calibration can use internal calibration targets, which are automatically moved into the measurement field by the spectrometer itself to calibrate the spectrometer's response.

[0003] However, in the field of mobile spectroscopy, using external calibration standards and / or moving internal calibration targets may be impractical. Therefore, known calibration schemes avoid the need to place external calibration standards and / or move internal calibration targets at the object's location. These schemes can utilize internal calibration paths.

[0004] US 2021 / 0063241 A1 describes an optical measurement apparatus comprising: a light source; emitting optics configured to guide a first portion of light generated by the light source to a measurement target; a collecting optics configured to receive light from the measurement target; an optical guide configured to guide a second portion of light generated by the light source to a spectral reference; a spectral reference; a sensor; and a filter. A first portion of the filter may be disposed between the collecting optics and a first portion of the sensor. A second portion of the filter may be disposed between the spectral reference and a second portion of the sensor.

[0005] US 2021 / 0356322 A1 describes a method for calibrating an optical sensor, the method comprising: acquiring a first characteristic of an external light source by a detector of the optical sensor when an internal light source of the optical sensor is turned off; driving the internal light source; acquiring a second characteristic of the internal light source and the external light source by the detector based on driving the internal light source; and acquiring a reference characteristic of the internal light source based on the first characteristic and the second characteristic for calculating the absorbance of an object.

[0006] Despite the known methods and devices that have achieved these advantages, several technical challenges remain. Typically, the goal of calibrating a spectrometer is to maintain a constant for all temperatures. ,in, It refers to a wavelength of The calibration factor of the filter. If the calibration constant If the signal is not constant, the spectrometer calibration will typically fail. For calibration schemes using internal calibration paths, a signal can be used... and To determine the calibration factor, these signals depend on the spectral flux of the light source, which is typically temperature-dependent. Furthermore, the signal can depend on the reflectivity of the external reflecting target on the external path. Reflectivity of internally reflecting targets on internal paths and the transmittance of optical filters on the external and internal paths. and :

[0007]

[0008]

[0009] Therefore, when the spectral flux changes with temperature, the spectral flux of the light source... They are weighted differently. If and / or This different weighting may lead to a different calibration factor. Therefore, when a temperature-dependent light source is combined with an angle-of-incidence (AOI) dependent optical filter for use in a spectrometer, temperature variations can cause a drift in the spectrometer's calibration factor. This drift can specifically include changes in the ratio of light in the internal path to light in the external path with temperature. Thus, a drift in the calibration factor can cause a temperature-dependent drift in the recorded spectrum. This can be particularly critical when the temperature dependence of the light source varies across its emission spectrum.

[0010] Furthermore, on the one hand, small spectrometers require less space and a compact design. On the other hand, high-performance spectrometers need to block stray light to achieve a high dynamic range. No light should deviate from the predefined optical path, thus requiring the material to be opaque. The problem to be solved

[0011] Therefore, it is desirable to provide a spectrometer device that at least partially addresses the aforementioned technical challenges of known devices. Specifically, a spectrometer device should be provided that allows for temperature-robust internal calibration of miniaturized NIR spectra. Summary of the Invention

[0012] This problem is solved by a spectrometer device having the features of the independent claims. Advantageous embodiments that can be implemented independently or in any arbitrary combination are set forth in the dependent claims and throughout the specification.

[0013] In a first aspect of the invention, a spectrometer apparatus for obtaining spectroscopic information about at least one object is disclosed.

[0014] The spectrometer equipment includes

[0015] - At least one detector, which is used to detect light from an object;

[0016] - At least one optical filter configured to deliver incident light within at least one selected wavelength range to the detector;

[0017] - At least one light source, which is configured to emit light in at least one optical spectral range;

[0018] - At least one sample interface configured to allow light emitted by the light source to illuminate an object held by the sample interface, and configured to allow light from the object held by the sample interface to propagate to the detector via the optical filter, wherein the sample interface includes at least one module cover window, the at least one module cover window including at least one substrate, wherein the module cover window includes at least one internal calibration target that partially covers the substrate.

[0019] - At least one first optical path, wherein the first optical path is configured to allow light emitted by the light source to propagate to the detector via the optical filter after passing through the sample interface at least once; and

[0020] - At least one second optical path, wherein the second optical path is configured to allow light emitted by the light source to propagate to the detector via the optical filter by interacting with the internal calibration target at least once.

[0021] As used herein, the term "spectrometer device" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, an optical device configured to acquire at least one spectral information item about at least one object.

[0022] Specifically, at least one spectral information item can refer to at least one optical characteristic or optically measurable characteristic determined as a function of wavelength for one or more different wavelengths. More specifically, the optical characteristic or optically measurable characteristic and at least one spectral information item can relate to at least one characteristic characterizing at least one of transmission, absorption, reflection, and emission of at least one object itself or after external light irradiation. At least one optical characteristic can be determined for one or more wavelengths. The spectrometer device can specifically be configured to record signal intensity with respect to corresponding wavelengths or partitions (e.g., wavelength intervals) of the spectrum, wherein the signal intensity can specifically be provided as an electrical signal that can be used for further evaluation.

[0023] As an example, a spectrometer device may be, or may include, a device that allows the measurement of at least one spectrum (e.g., for measuring spectral flux, specifically as a function of wavelength or detection wavelength). As an example, the spectrum may be acquired in absolute or relative units (e.g., relative to at least one reference measurement). Thus, as an example, the acquisition of at least one spectrum may specifically be performed for the measurement of spectral flux (in W / nm) or spectrum (in 1) relative to at least one reference material, which may describe the material's properties (e.g., reflectance as a function of wavelength). Additionally or alternatively, the reference measurement may be based on a reference light source, an optical reference path, a calculated reference signal (e.g., a calculated reference signal from a document), and / or a reference device.

[0024] The spectrometer device may be a diffuse reflectance spectrometer device configured to acquire spectral information from light diffusely reflected by the at least one object (e.g., at least one physical object). Additionally or alternatively, at least one spectrometer device may be or may include an absorption spectrometer and / or a transmission spectrometer. In particular, measuring the spectrum with the spectrometer device may include measuring reflectance in a reflective configuration. Specifically, the spectrometer device may be configured to measure reflectance in a reflective configuration. However, as outlined above, other types of spectrometer devices are also feasible.

[0025] The spectrometer device may include at least one light source, which, as an example, may be at least one of a tunable light source, a light source having at least one fixed emission wavelength, and a broadband light source. As will be further described in detail below, the spectrometer device further includes at least one detector configured to detect electromagnetic radiation, particularly light, such as at least one of light transmitted, reflected, or emitted from at least one object. As will be further described in detail below, the spectrometer device may further include at least one wavelength selection element, such as at least one of a grating, a prism, and a filter (e.g., a length-variable filter having varying transmission characteristics on its lateral extension). The wavelength selection element can be used to separate the incident light into spectra comprising wavelength signals, the corresponding intensities of which are determined by employing a detector (e.g., a detector having a detector array described in more detail below).

[0026] The spectrometer device can specifically be a portable spectrometer device. For example, the portable spectrometer device can be part of or attached to a mobile device, such as a laptop computer, tablet computer, cellular phone (e.g., smartphone), smartwatch, and / or wearable computer.

[0027] As used herein, the term "spectral information" (also referred to as "spectral information" or "spectral information item") is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, information items relating to, at least one object and / or radiation emitted by, at least one object, characterizing at least one optical property of that object, and more specifically, characterizing, for example, at least one information item qualitatively and / or quantitatively representing, at least one of the transmission, absorption, reflection, and emission of that at least one object. As an example, at least one spectral information item may include at least one intensity information, such as information regarding the intensity of at least one type of light transmitted, absorbed, reflected, or emitted by the object, the intensity being, for example, a function of wavelength or a subrange of wavelength within one or more wavelengths (e.g., within a wavelength range). Specifically, the intensity information may correspond to, or be derived from, a signal intensity (specifically an electrical signal) recorded by a spectrometer device in relation to the wavelength or wavelength range of the spectrum.

[0028] Specifically, a spectrometer can be configured to obtain at least one spectrum or at least a portion of a spectrum of light propagating from an object to the spectrometer. The spectrum can be given in radiometric units describing spectral flux, such as watts per nanometer (W / nm), or in other units, such as as a function of the wavelength of the detected light. Thus, a spectrum can describe the optical power of light, for example, within a specific wavelength band in the NIR spectral range. A spectrum can include one or more optical variables that vary with wavelength, such as power spectral density, electrical signals obtained through optical measurements, etc. As an example, a spectrum can indicate the power spectral density and / or spectral flux of an object (e.g., a physical object) relative to a reference object, such as the transmittance and / or reflectance of the object (specifically, the physical object).

[0029] The spectrometer device can be configured to obtain spectra within a wavelength range that at least partially includes one or more of the infrared, visible, and ultraviolet spectral ranges. The spectrometer device can be a near-infrared spectrometer. For example, the spectrometer device can be configured to obtain spectra within a wavelength range that at least partially includes the near-infrared spectral range, such as in the wavelength range from 760 nm to 5 µm, specifically in the wavelength range from 1 µm to 3 µm.

[0030] As an example, the spectrum may include at least one measurable optical variable or characteristic of the detection light and / or object, specifically varying with the illumination light and / or detection light. As an example, the at least one measurable optical variable or characteristic may include at least one radiometric quantity, such as spectral density, power spectral density, spectral flux, radiant flux, radiant intensity, spectral radiant intensity, irradiance, or spectral irradiance. Specifically, as an example, the spectrometer device (specifically the detector) may measure in watts per square meter (W / m²). 2 Irradiance is measured in units of watts per square meter per nanometer (W / m²). 2 Spectral irradiance is measured in watts per nanometer (W / nm). Based on the measured quantities, the spectral flux in watts per nanometer (W / nm) and / or the radiative flux in watts (W) can be determined (e.g., calculated) by taking into account the area of ​​the detector.

[0031] As used herein, the term "object" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a particular or customary meaning. The term may specifically refer to, but is not limited to, any body selected from living and inanimate objects. Thus, by way of example, at least one object may include one or more articles and / or one or more parts of articles, wherein at least one article or at least one part thereof may include at least one component that can provide a spectrum suitable for study. Additionally or alternatively, an object may be or may include one or more organisms and / or one or more parts thereof, such as one or more body parts of a human (e.g., a user) and / or an animal. Specifically, an object may include at least one sample that can be fully or partially analyzed by spectroscopic methods. By way of example, an object may be or may include at least one of the following: human or animal skin; edible matter, such as fruit; plastics and textiles.

[0032] Spectrometer equipment includes at least one detector for detecting light from an object, particularly detection light. As used herein, the term "detection" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, the process of qualitatively and / or quantitatively determining, measuring, and monitoring at least one parameter (e.g., at least one of physical, chemical, and biological parameters). Specifically, physical parameters may be or may include electrical parameters. Therefore, as used herein, the term "detector" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, any device configured for detecting, i.e., qualitatively and / or quantitatively determining, measuring, and monitoring at least one parameter (e.g., at least one of physical, chemical, and biological parameters). The detector may be configured to generate at least one detector signal, more specifically at least one electrical detector signal, such as analog and / or digital detector signals, which provide information about at least one parameter measured by the detector. The detector signal can be provided directly or indirectly to at least one evaluation unit, allowing the detector and evaluation unit to be directly or indirectly connected. The detector signal can be used as a "raw" detector signal and / or can be processed or preprocessed (e.g., by filtering) before further use. Therefore, the detector may include at least one processing device and / or at least one preprocessing device, such as at least one of an amplifier, an analog-to-digital converter, and an electrical filter.

[0033] In this example, the detector is configured to detect light propagating from an object to the spectrometer device, or more specifically, to the detector of the spectrometer device, also referred to as "detection light." Therefore, specifically, the detector can be or may include at least one optical detector. The optical detector can be configured to determine at least one optical parameter, such as the intensity and / or power of light irradiating at least one sensitive area of ​​the detector. More specifically, the optical detector may include at least one photosensitive element and / or at least one optical sensor, such as at least one of a photodiode, photovoltaic cell, photoresistor, phototransistor, thermopile sensor, photoacoustic sensor, pyroelectric sensor, photomultiplier, and calorimeter. Therefore, the detector can be configured to generate at least one detector signal, more specifically at least one electrical detector signal in the above sense, which provides information about at least one optical parameter (such as the power and / or intensity of light irradiating the detector or a sensitive area of ​​the detector).

[0034] The detector may include a single optically sensitive element or region or multiple optically sensitive elements or regions. Specifically, the detector may be or may include at least one detector array (more specifically, an array of photosensitive elements). Each photosensitive element may include at least a photosensitive region adapted to generate an electrical signal based on the intensity of the incident light, wherein the electrical signal may be specifically provided to the evaluation unit, as will be further detailed below.

[0035] The photosensitive region comprised of each optical sensing element can be, in particular, a single, uniform photosensitive region configured to receive incident light illuminating the individual optical sensing element. However, other arrangements of the optical sensing elements are also conceivable.

[0036] An array of optical sensing elements can be designed to generate detector signals, preferably electronic signals, associated with the intensity of incident light illuminating each optical sensing element. The detector signals can be analog and / or digital signals. Accordingly, electronic signals from adjacent pixelated sensors can be generated simultaneously or sequentially over time. For example, during line or row scanning, a series of electronic signals corresponding to a series of individual optical sensing elements arranged in a row can be generated. Furthermore, these individual optical sensing elements can preferably be active pixel sensors, adapted to amplify the electronic signals before providing them to the evaluation unit. For this purpose, the detector can include one or more signal processing devices, such as one or more filters and / or analog-to-digital converters, for processing and / or preprocessing the electronic signals.

[0037] When the detector comprises an array of optically sensitive elements, as an example, the detector can be selected from any known pixel sensor, particularly from pixelated organic camera elements, preferably pixelated organic camera chips, or from pixelated inorganic camera elements, preferably pixelated inorganic camera chips, more preferably from CCD chips or CMOS chips, which are commonly used in various types of cameras. Alternatively, the detector can typically be or include a photoconductor, particularly an inorganic photoconductor, especially PbS, PbSe, Ge, InGaAs, extended InGaAs, InSb, or HgCdTe. As another alternative, the detector can include at least one of a pyroelectric element, a radiation calorimeter element, or a thermopile detector element. Therefore, a camera chip with a matrix of 1 × N pixels or M × N pixels can be used here, where, as an example, M can be < 10, and N can range from 1 to 50, preferably from 2 to 20, more preferably from 5 to 10. Furthermore, monochrome camera elements, preferably monochrome camera chips, can be used, wherein the monochrome camera elements can be selected differently for each optical sensor, particularly based on varying wavelengths on a series of optical sensors. The array can be adapted to provide multiple electrical signals, which can be generated by the photosensitive regions of the optical sensors included in the array. The electrical signals provided by the array of the spectrometer device can be forwarded to the evaluation unit.

[0038] The spectrometer apparatus further includes at least one optical filter configured to transmit incident light within at least one selected wavelength range to the detector. As used herein, the term "optical filter" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, any optical element configured to selectively transmit light of different wavelengths. Specifically, the optical filter may be configured to transmit light having wavelengths within at least one selected wavelength range, wherein the transmission of light having wavelengths outside the selected wavelength range can be at least partially blocked, for example by giving a reduced transmittance outside the selected wavelength range compared to the transmittance within the selected wavelength range. Thus, as used herein, the term "selected wavelength range" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning, and may specifically refer to, but is not limited to, at least one wavelength range of light that the optical filter allows to be transmitted. For example, light having wavelengths within the selected wavelength range may be able to pass through the optical filter, wherein light having wavelengths outside the selected wavelength range can be at least partially blocked, for example by having a reduced light intensity after the optical filter. Optical filters may include at least one filter selected from the group consisting of: interference filters; absorption filters; dichroic filters; and MEMS Fabry-Perot interferometers. Specifically, optical filters may include at least one narrow bandpass filter, and more specifically, a group of narrow bandpass filters. Narrow bandpass filters may be configured to transmit light only within a narrow selected wavelength range, such as a wavelength range with a width in the range of 10 nm to 100 nm, specifically a wavelength range in the range of 10 nm to 50 nm, more specifically a wavelength range with a width of 20 nm, and most specifically a wavelength range with a width of 15 nm. For example, in this group of narrow bandpass filters, each narrow bandpass filter may have a narrower selected wavelength range that is at least partially different from each other.

[0039] The transmission profile of an optical filter can be dependent on the angle of incidence. As used herein, the term "transmission profile" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom-defined meaning. Specifically, the term may refer to, but is not limited to, transmittance as a function of wavelength. Specifically, a transmission profile can indicate the ability of an optical filter to transmit light as a function of wavelength. A transmission profile can include a numerical indication of the ability of an optical filter to transmit light as a function of wavelength. For example, for each wavelength within a selected wavelength range, a transmission profile can include a numerical indication quantifying a portion of the transmitted light passing through the optical filter. A transmission profile can specifically include a quantified ratio of the amount of light transmitted by the optical filter relative to the amount of incident light. For example, a transmission profile can include a quantified ratio of the power of the light transmitted by the optical filter to the power of the incident light. A transmission profile can specifically be wavelength-dependent, such as by having different ratios of transmitted light for different wavelengths of incident light. As used herein, the term "angle of incidence" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom-defined meaning. The term can specifically refer to, but is not limited to, the angle at which incident light strikes the surface normal of the surface of an optical element. The surface normal can refer to the direction perpendicular to a specific surface. The angle of incidence can specifically be the angle between the incident light and the surface normal of the optical filter.

[0040] The spectrometer apparatus further includes at least one light source configured to emit light in at least one optical spectral range, also referred to herein as illumination light. As used herein, the term "light" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or customary meaning. Specifically, the term may refer to, but is not limited to, electromagnetic radiation in one or more of the infrared, visible, and ultraviolet spectral ranges. In this document, the term "ultraviolet spectral range" generally refers to electromagnetic radiation with wavelengths from 1 nm to 380 nm, preferably from 100 nm to 380 nm. Further, in part according to the standard ISO-21348, the effective version of this document as of the date of this document, the term "visible spectral range" generally refers to the spectral range from 380 nm to 760 nm. The term "infrared spectral range" (IR) generally refers to electromagnetic radiation from 760 nm to 1000 µm, with the range from 760 nm to 1.5 µm typically referred to as the "near-infrared spectral range" (NIR), the range from 1.5 µm to 15 µm as the "mid-infrared spectral range" (MidIR), and the range from 15 µm to 1000 µm as the "far-infrared spectral range" (FIR). Preferably, the light used for the typical purposes of this invention is light within the infrared (IR) spectral range, more preferably light within the near-infrared (NIR) and / or mid-infrared spectral range (MidIR), especially light with wavelengths from 1 µm to 5 µm, preferably 1 µm to 3 µm. This is because the material properties or characteristics relating to the chemical composition of many objects can be obtained from the near-infrared spectral range. However, it should be noted that spectral analysis in other spectral ranges is also applicable and within the scope of this invention.

[0041] As used herein, the term "light source" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom-defined meaning. Specifically, the term may refer to, but is not limited to, any device configured to generate or provide light in the sense defined above. A light source may specifically be or may include at least one electric light source, such as an electrically driven light source. For example, a light source may include at least one light-emitting diode (LED).

[0042] In spectroscopy, it is important to distinguish between various light sources and optical paths. In the context of this invention, the nomenclature used here first refers to light propagating from the light source to the object as "illumination light." Secondly, light propagating from the object to the detector is referred to as "detection light." Detection light can include at least one of the following: illumination light reflected by the object, illumination light scattered by the object, illumination light transmitted by the object, and luminescence generated by the object (e.g., phosphorescence or fluorescence generated by the object after optical, electrical, or acoustic excitation by illumination light). Therefore, detection light can be generated directly or indirectly by irradiating the object with illumination light.

[0043] As used herein, the term "optical spectral range" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, a range of wavelengths including, but not limited to, one or more of the infrared, visible, and ultraviolet spectral ranges.

[0044] The illumination light has an optical spectral range that is at least partially located in the near-infrared spectral range. For example, the optical spectral range of the illumination light may include a wavelength range from 760 nm to 5 µm, specifically from 1 µm to 3 µm.

[0045] The spectrometer device includes at least one sample interface configured to allow light emitted from a light source to illuminate an object held by the sample interface, and configured to allow light from the object held by the sample interface to propagate via an optical filter to a detector. As used herein, the term "sample interface" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a port of the spectrometer device through which light within an optical spectral range (e.g., at least one partition of the optical spectral range or the full optical spectral range) can enter the spectrometer device, specifically for spectral sensing purposes, and / or exit the spectrometer device, for example, for illuminating at least one object. As an example, the sample interface may define an optical plane of the spectrometer device, such as a material plane or an imaginary plane, through which illumination light from a first optical path can travel to the object, and / or detection light from the object can travel to the detector, for example, to generate a detector signal. The sample interface may be an imaginary plane. The sample interface may or may not consist of physical elements and / or barriers (such as transparent elements, like glass or quartz windows). The sample interface may also be the sample surface itself or a plane on which the sample can be placed or aligned. The sample interface may be arranged in the optical path of the spectrometer apparatus, specifically in the first optical path, to allow light emitted from the light source to illuminate an object placed in front of the spectrometer apparatus, specifically in front of the sample interface. As used herein, the term "through the sample interface" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, one or more of propagation to and from the sample interface, propagation across the sample interface, and interaction with the sample interface. Emitted light may, for example, illuminate the sample interface at an incident angle. Emitted light may interact with the sample interface and may, for example, exit the sample interface at an exit angle. The irradiated point or area on the sample interface may be on the same side of the sample interface or on the opposite side of the exit point or area of ​​the sample interface.

[0046] The sample interface includes at least one module cover window. As used herein, the term "module" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, a complex element providing at least one function, which in this case is within the sample interface. As used herein, the term "cover" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an element configured to at least partially enclose at least one other element. As used herein, the term "window" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a special or customized meaning. The term may specifically refer to, but is not limited to, an optically transparent optical element having a defined refractive index and thickness. The window may provide an interface to the exterior of the spectrometer device, such as the exterior of the spectrometer device housing. As used herein, the term "module cover window" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a special or customized meaning. The term can specifically refer to, but is not limited to, a module configured to provide at least one overlay function and at least one window.

[0047] The module cover window includes at least one substrate. As used herein, the term "substrate" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. Specifically, the term may refer to, but is not limited to, the base element on which further elements for which a sample interface can be applied, for example, by coating.

[0048] The substrate may be at least partially transparent within at least one given wavelength range. Specifically, the substrate may comprise at least one translucent material. As used herein, the term "translucent" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a particular or custom meaning. The term may specifically refer to, but is not limited to, the characteristic of an optical element to partially transmit incident light within at least one wavelength range. Specifically, a translucent optical element may be configured to transmit a portion of the incident light, while another portion of the incident light is reflected at the translucent optical element. The material of the substrate may specifically be translucent at least within a selected wavelength range. The wavelength range in which the substrate is translucent may be selected such that it at least partially matches the wavelength range of the light source. However, the wavelength range of the substrate may differ from the wavelength range of the light source, for example, being narrower. Thus, the substrate may at least partially serve as a window. The substrate may be configured to allow light within at least one wavelength range to pass through in accordance with Snell's law. For example, the substrate may be a glass substrate, such as a transparent glass window. For example, the glass substrate may include at least one material selected from the group consisting of: fused silica, soda lime, borosilicate, sapphire, silicon, germanium, calcium fluoride, magnesium fluoride, barium fluoride, etc. The top and / or bottom surfaces may include an antireflective coating (AR coating), for example, to enhance the total transmittance in the wavelength range of interest and with respect to the angle of incidence (AOI).

[0049] The substrate can be at least partially structured, for example, by sandblasting. For instance, the substrate can be at least partially structured in the region that includes the internal calibration target. This structure can allow for ensuring a desired reflection profile, such as that of a Lambertian model.

[0050] The module cover window includes at least one internal calibration target that partially covers the substrate.

[0051] As used herein, the term "calibration target" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a reference object that has a known (e.g., predetermined and / or predefined) interaction with light. A calibration target can be used to calibrate spectrometer equipment.

[0052] As used herein, the term "internal calibration target" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, at least one calibration target integrated into a spectrometer device, particularly into the second optical path of the spectrometer device. Specifically, the internal calibration target may be configured to interact with illumination light in the second optical path in a predetermined or predefined manner. The internal calibration target may be configured to receive illumination light emitted from the light source and transmit the illumination light via the second optical path to an optical filter. In particular, the internal calibration target may be configured to ensure that illumination light emitted from the light source propagates through the second optical path to the optical filter without passing through a sample interface, for example, by interacting with the illumination light, such as by reflecting and / or scattering the illumination light onto the optical filter and / or filtering the illumination light.

[0053] An internal calibration target may include at least one diffuse reflective surface. As used herein, the term "diffuse reflective surface" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a surface configured to scatter incident light at multiple different angles (e.g., ideally, Lambertian reflection). The internal calibration target may have diffuse scattering characteristics and a reflectivity that is not equal to zero. Specifically, the internal calibration target may be used as a diffuse mirror. The internal calibration target may include a surface roughness configured to generate a Lambertian reflection curve. The surface roughness may be selected such that specular reflection on the surface has a Lambertian curve due to the ratio of the wavelength of the incident radiation to the surface roughness, thereby producing a "diffuse mirror". The surface roughness may be selected according to the wavelength of the incident light, for example, such that the reflection (e.g., Fresnel reflection generated by a metal, or partial Fresnel reflection and partial diffuse reflection generated by a dielectric material) has a Lambertian curve.

[0054] As used herein, the term "interaction with internal calibration targets" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or customary meaning. Specifically, the term may refer to, but is not limited to, at least one of at least one or more processes of reflection, absorption, or transmission.

[0055] For example, the internal calibration target may include one or more of the following: at least one polytetrafluoroethylene (PTFE) layer; at least one optical coating, such as a white surface coating, for example, obtainable from Nextel® velvet coating 3101; a dielectric coating; at least one partially reflective dielectric mirror; at least one metal coating or metal foil including one or more of gold, silver, aluminum, and chromium; and at least one beam splitter. For example, the internal calibration target may be applied to the substrate by one or more of spraying, stamping, printing, gluing, or at least one brushing process.

[0056] The substrate is at least partially covered by an internal calibration target. The internal calibration target may cover 0.1% to 99.9% of the substrate, specifically 0.5% to 25% of the substrate, and more specifically 1% to 10% of the substrate. For example, 1% to 10% of the substrate may be covered by the internal calibration target, and the remaining portion (e.g., 99% to 90%) may be used for the first optical path of the object being measured.

[0057] Internal calibration targets may include at least one white reflective element, such as a coating, film, or foil. As used herein, the term "white" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may characterize, but is not limited to, an element whose reflection is substantially wavelength-independent within a range of wavelengths of interest; in particular, the element's reflection spectrum has no dominant absorption peak within a given wavelength range. As used herein, the term "white reflective element" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, a material layer having a surface that is at least partially diffusely reflective. A white reflective element may provide a diffusely reflective surface. A white reflective element may be translucent within at least one given wavelength range. The wavelength range in which the white reflective element is translucent may be selected such that it at least partially matches the wavelength range of the light source. However, the wavelength range of the white reflective element may differ from the wavelength range of the light source, for example, being narrower. A white reflective element may be configured to at least partially reflect and / or partially transmit incident light. White reflective elements may include one or more of the following: at least one polytetrafluoroethylene (PTFE) layer; at least one optical coating, such as a white surface coating, for example, a white varnish available from Nextel® velvet coating 3101.

[0058] White reflective elements can be directly disposed on the substrate. As used herein, the term "directly disposed" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, the absence of any additional elements between the substrate and the white reflective element. For example, the white reflective element may be coated (e.g., sprayed) onto the substrate. However, other processes are also possible, such as stamping, printing, bonding, at least one brushing process, etc.

[0059] The internal calibration target may include at least one carrier element, through which a white reflective element is disposed on a substrate. As used herein, the term "carrier element" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, at least one element and / or layer disposed between two other elements (e.g., the substrate and the white reflective element). The carrier element may be configured to provide at least one support function for mounting at least one additional element of the internal calibration target onto the substrate. For example, the white reflective element and the carrier element may be used together as the internal calibration target, and / or the carrier element may support the white reflective element. The carrier element may be diffusely reflective over at least one wavelength range. The carrier element may include at least one reflective material. The white reflective element may be translucent. The carrier element may be configured to scatter light when the white reflective element transmits light. Thus, the reflective carrier can improve the overall reflectivity. Mounting the white reflective element onto the carrier element may be performed, for example, using a transparent adhesive (e.g., epoxy) or in at least one spraying (varnish) process. However, other processes are also possible.

[0060] In one embodiment, the module cover window may include a stack. The stack may include at least a white reflective element, a carrier element, and a substrate. In one embodiment, the stack may include a carrier element coated with a white reflective element, wherein the carrier element is directly coated onto the substrate. For example, the carrier element includes at least one metal layer comprising one or more of gold, silver, aluminum, and chromium, wherein the metal layer is coated onto the substrate, for example, using at least one thin-film process. In another embodiment, the stack may include a carrier element coated with a white reflective element, the carrier element being mounted to the substrate using at least one adhesive. For example, the carrier element includes a metal film fixed to the substrate by means of an adhesive. In one embodiment, the stack may include a carrier element mounted to the substrate using at least one adhesive, and the white reflective element being mounted to the carrier element using at least one transparent adhesive. For example, the carrier element includes a metal film fixed to the substrate by an adhesive, wherein the white reflective element is a reflective coating fixed to the carrier element by a transparent adhesive.

[0061] For example, the white reflective element includes at least one PTFE layer, and the carrier element may further include at least one aluminum foil serving as a reflector. The PTFE layer can be mounted on the aluminum foil using a transparent adhesive. PTFE can be used as a diffuser and can be combined with a reflector as an internal calibration target.

[0062] The module cover window is at least partially structured. As used herein, the term "structured" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, a non-uniform distribution of an element.

[0063] For example, internal calibration targets may be non-uniformly distributed on the substrate. For example, internal calibration targets may include at least one pattern. As used herein, the term "pattern" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, any structured element. The pattern may be at least one pattern selected from the group consisting of: dot patterns, checkerboard patterns, or random patterns, or any other pattern characterized by macroscopic 2D uniformity over the surface area of ​​the calibration target. Patterns may be implemented such that the pattern only partially covers the substrate. For example, a white reflective element may be structured such that it scatters light within a given wavelength range.

[0064] As outlined above, for example, the substrate can be at least partially structured, such as by sandblasting. The substrate can be partially or completely structured, for example, such that it can have a desired reflection profile (e.g., Lambertian). The substrate can be partially coated with a metal layer that also acts as a barrier layer.

[0065] As used herein, the term "optical path" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, the path of light in a spectrometer device. The optical path in a spectrometer device may be affected by reflection, refraction, dispersion, and / or absorption at one or more optical elements (such as lenses, prisms, mirrors, gratings, etc.) included in the spectrometer device. As generally used herein, the terms "first" and "second" are used for naming purposes only and do not imply any ordering or numbering.

[0066] As used herein, the term "first optical path" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, the optical path that interacts with illumination light at an object. Specifically, the detector signal obtained via the first optical path may be affected by the presence and / or absence of an object at the spectrometer device, specifically at the sample interface of the spectrometer device. For example, the detector signal obtained via the first optical path when an object is applied to the spectrometer device may differ from the detector signal obtained via the first optical path when no object is applied to the spectrometer device, specifically regardless of constant environmental conditions. In particular, the first optical path is configured to allow illumination light emitted from the light source to propagate to the detector via an optical filter after passing through the sample interface at least once. Specifically, the first optical path may allow illumination light emitted from the light source to propagate to the sample interface and then to the detector via an optical filter. Illumination light emitted from the light source may be directed to the sample interface directly or indirectly (e.g., by reflection, refraction, and / or dispersion) via the first optical path. The first optical path may be partially disposed outside the spectrometer device, such as outside the housing of the spectrometer device. Specifically, the illumination light in the first optical path can exit the spectrometer device, particularly the housing of the spectrometer device, at the sample interface to illuminate an object disposed outside the spectrometer device. The first optical path can be configured to couple the detection light reflected at the object back into the spectrometer device. The detection light can be directed directly or indirectly (e.g., by reflection, refraction, and / or dispersion) from the sample interface to an optical filter and subsequently to a detector. Reflection at the sample interface can include diffuse reflection. Specifically, the detection light in the first optical path illuminating the optical filter and subsequently the detector can be light diffusely reflected at the object. The detector can be configured to generate at least one detector signal in response to illumination by incident light via the first optical path.

[0067] As used herein, the term "second optical path" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any particular or custom meaning. Specifically, the term may refer to, but is not limited to, an optical path that does not interact with illumination light at the object. Specifically, the detector signal obtained via the second optical path may be unaffected by the presence and / or absence of an object at the spectrometer device. For example, the detector signal obtained via the second optical path when an object is applied to the spectrometer device (specifically, to the sample interface) may be equal to the detector signal obtained via the second optical path when the object is not applied to the spectrometer device, specifically assuming constant environmental conditions. In particular, the second optical path may be configured to allow illumination light emitted from the light source to propagate through an optical filter to the detector without passing through the sample interface, specifically without reflection at the object. Through the second optical path, illumination light emitted from the light source can travel to an internal calibration target, then to the optical filter, and finally to the detector without interacting with the object. The second optical path may be entirely housed within the spectrometer device, such as within the spectrometer device housing. The illumination light following the second optical path can be emitted by a light source and can be guided directly or indirectly (e.g., through reflection, refraction, and / or dispersion) to an internal calibration target, and subsequently to an optical filter and a detector. As an example, the second optical path may include an fiber-coupled optical path that transmits light from the light source to the internal calibration target, which reflects the illumination light to the optical filter. Alternatively or additionally, the second optical path can be configured to directly illuminate the internal calibration target with illumination light emitted from the light source. The detector can be configured to generate at least one detector signal in response to illumination by incident light via the second optical path.

[0068] The module cover window may include at least one stray light suppression element configured to suppress unwanted light from illuminating the object and / or suppress stray light. The substrate may be at least partially covered by the stray light suppression element. As used herein, the term "stray light" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, light originating from at least one source other than the object, which produces a signal other than a measurement signal specific to a selected wavelength range. For example, one or more of interference, reflection, and scattering at at least one element (e.g., grating, housing, etc.) of a spectrometer device can generate stray light. As used herein, the term "stray light suppression element" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, at least one element configured to reduce stray light. The stray light suppression element may be made of a black material. The stray light suppression element may have approximately zero reflectivity and transmittance. Stray light suppression elements may cover a small portion of the substrate, such as in an area where internal calibration targets are arranged. The stray light suppression element may be part of a module cover window. The stray light suppression element may include a coating made of black varnish (e.g., Nextel® Black Velvet). The stray light suppression element may be applied to the substrate by one or more of the following processes: spraying, stamping, printing, or at least one brushing process. For example, the stray light suppression element may be disposed directly on the substrate. For example, the stray light suppression element may be disposed on the substrate via at least one additional carrier element. For example, the additional carrier element may include at least one element selected from the group consisting of: at least one metal foil, such as aluminum foil, for example, Acktar; at least one plastic foil; at least one plastic film. The additional carrier element may be mounted to the substrate using at least one adhesive material. Using an additional carrier element may be advantageous because the shape of the coating can be pre-treated, and / or masks or other means are not required.

[0069] The white reflective element can be arranged adjacent to the stray light suppression element. For example, the white reflective element and the stray light suppression element can be arranged side by side on the substrate. For example, the white reflective element and the stray light suppression element can both be coatings arranged adjacent to each other on the substrate.

[0070] For example, a white reflective element and a stray light suppression element are arranged in a stack of the module cover window. The white reflective element can be arranged to at least partially cover the stray light suppression element. For example, the stack can include a white reflective element applied to the stray light suppression element, which may optionally be mounted on a separate carrier element mounted on a substrate. For example, the white reflective element is mounted to the stray light suppression element via at least one transparent adhesive. Alternatively, the stray light suppression element may be or may include at least one opaque adhesive. The white reflective element can be bonded to the (separate) carrier element via an opaque adhesive. Partial absorption of light in the adhesive layer can be prevented. This allows the absorption spectrum of the adhesive to be prevented from being seen in the reflection spectrum of the white reflective material.

[0071] The spectrometer device may include at least one evaluation unit configured to evaluate at least one detector signal generated by a detector. As used herein, the term "evaluation unit" is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. Specifically, the term may refer to, but is not limited to, any device or combination of devices configured to evaluate or process at least one first information item to generate at least one second information item thereof. Thus, specifically, the evaluation unit may be configured to process at least one input signal and generate at least one output signal thereof. As an example, the at least one input signal may include at least one detector signal provided directly or indirectly by at least one detector. As an example, the evaluation unit may be or may include one or more integrated circuits (e.g., one or more application-specific integrated circuits (ASICs)) and / or one or more data processing devices (e.g., one or more of a computer, digital signal processor (DSP), field-programmable gate array (FPGA), preferably one or more microcomputers and / or microcontrollers). Additional components may be included, such as one or more preprocessing devices and / or data acquisition devices, such as one or more devices for receiving and / or preprocessing detector signals, such as one or more AD converters and / or one or more filters. Further, the evaluation unit may include one or more data storage devices. Furthermore, the evaluation unit may include one or more interfaces, such as one or more wireless interfaces and / or one or more wired interfaces.

[0072] At least one evaluation unit may be adapted to execute at least one computer program, such as at least one computer program that performs or supports the information item generation step. As an example, one or more algorithms may be implemented that, by using at least one detector signal, can perform a predetermined transformation to determine spectroscopic information about an object, such as determining at least one spectroscopic piece of information describing at least one property of the object. For this purpose, the evaluation unit may specifically include at least one data processing device (also called a processor, particularly an electronic data processing device) designed to generate desired information by evaluating the detector signal. The evaluation unit may use any process to generate the desired information, such as by calculating and / or using at least one stored and / or known relation. Specifically, the evaluation unit may be configured to perform at least one digital signal processing (DSP) technique on the primary detector signal or any secondary detector signal derived therefrom, particularly at least one Fourier transform. Additionally or alternatively, the evaluation unit may be configured to perform one or more other digital signal processing techniques on the primary detector signal or any secondary detector signal derived therefrom, such as windowing, filtering, the Goertzel algorithm, cross-correlation, and autocorrelation. In addition to the detector signal, one or more additional parameters and / or information items may also affect the relation. This relationship can be determined or determined by empirical, analytical, or semi-empirical methods. As an example, the relationship may include at least one of a model or calibration curve, at least one set of calibration curves, at least one function, or a combination of the mentioned possibilities. One or more calibration curves may be stored, for example, in a data storage device and / or a table as a set of values ​​and their associated function values. However, alternatively or additionally, at least one calibration curve may also be stored, for example, in parametric form and / or as a functional equation. A separate relationship for processing the detector signal into information items can be used. Alternatively, at least one combined relationship for processing the detector signal is feasible. Various possibilities are conceivable, and these possibilities can also be combined.

[0073] The spectrometer device can be configured to use a first optical path with at least one wavelength. The light is used to illuminate the detector in order to obtain at least one first detector signal. The object may include at least one external calibration target. The external calibration target may be applied by the user to the sample interface of the spectrometer device. The spectrometer device may be configured to use at least one second optical path with at least one wavelength. The detector is illuminated with light to obtain at least one calibration signal. The evaluation unit can be configured to use the first detector signal. and calibration signal Determine at least one calibration information item The determination of calibration information items can also be referred to as "initial calibration." Specifically, calibration information items can be determined according to the following formula.

[0074]

[0075] As used herein, the term "calibration information item" is a broad term and will be given its common and conventional meaning to those skilled in the art, and is not limited to any specific or custom meaning. Specifically, the term may refer to, but is not limited to, any information item suitable for calibrating a spectrometer device. For example, a calibration information item may include information about one or more of wavelength calibration, dark current calibration, and intensity calibration. Calibration information items can be used to correct, adjust, and / or compensate measurement signals at the spectrometer device. Specifically, calibration information items may include information about the relationship between the spectrometer device's measurement signals and known calibration standards, specifically, external calibration targets.

[0076] Calibration information items can be determined during the initial calibration of the spectrometer equipment (e.g., during factory calibration). Additionally, calibration information items can be re-determined in the field (e.g., at the user's site) by re-performing the initial calibration steps using an external calibration target. Calibration information items can be stored, for example, in the spectrometer equipment's data storage device and / or in data storage accessible to the spectrometer equipment, and can be used to determine the spectroscopic information of an object using the spectrometer equipment. Specifically, calibration information items can be applied to the measurement signals of the spectrometer equipment to correct, adjust, and / or compensate the measurement signals to obtain calibrated measurement signals, such as measurement signals calibrated to a known calibration standard, specifically an external calibration target. The calibrated measurement signals can directly provide spectroscopic information about the object, or alternatively, can be used to obtain spectroscopic information about the object.

[0077] The spectrometer device can be configured to use a first optical path with at least one wavelength. The detector is illuminated with light to obtain at least one measurement signal. In this example, the object may include at least one measurement object, such as at least one object to be studied using a spectrometer device. The spectrometer device may be further configured to use at least one second optical path with at least one wavelength. The detector is illuminated with light to obtain at least one reference signal. The evaluation unit can be configured to use calibration information items. Reference signal The first detector signal is used to determine spectroscopic information about the object. For example, the spectroscopic information of the object could be reflectance. ,in,

[0078]

[0079] In the calibration of spectrometer equipment (e.g., in factory calibration), the object applied to the spectrometer equipment, such as with the user's assistance, can include an external calibration target. The reflectance of the external calibration target... and the reflectivity of the internal calibration target They can be proportional to each other, among which,

[0080]

[0081] in, It is a constant.

[0082] For each wavelength within the selected wavelength range, the reflectivity of the externally calibrated target and the reflectivity of the internal calibration target They can be proportional to each other. Constant. It may be independent of temperature and / or wavelength.

[0083] External calibration targets may include standardized diffuse reflectance targets with >99% reflectance in the range of 400 nm to 1500 nm and >95% reflectance in the range of 250 nm to 2500 nm. For example, external calibration targets may include commercially available calibration targets such as Spectralon® diffuse reflectance targets. These reflectance targets may include thermally and / or chemically stable reflective panels. These reflectance targets may include white or gray material plates up to 24 × 24 inches mounted in a robust anodized aluminum frame. The reflectance of these reflectance targets is typically >99% in the wavelength range of 400 nm to 1500 nm and typically >95% in the wavelength range of 250 nm to 2500 nm. Spectralon® diffuse reflectance standards are available on plates up to 24 × 24 inches with the following reflectance values: 99%, 80%, 60%, 40%, 20%, 10%, 5%, and 2% (maximum for 10" targets).

[0084] The internal calibration target can be specifically designed to simulate the reflectivity of the external calibration target. For example, the external calibration target can have a first material, and the internal calibration target can have a second material. The first and second materials can be matched to each other such that the reflectivity of the external calibration target is... and the reflectivity of the internal calibration target They are proportional to each other.

[0085] In another aspect of the invention, a method for calibrating a spectrometer device is disclosed. As used herein, the term "perform calibration" (also referred to as "calibration") is a broad term and will be given its common and conventional meaning to those skilled in the art and is not limited to a specific or custom meaning. The term may specifically refer to, but is not limited to, the process of correcting, adjusting, and / or compensating a measurement signal at a spectrometer device. The calibration process may include determining at least one calibration information item, which may include at least one information item regarding the result of the calibration process, such as a calibration function, calibration factor, calibration matrix, etc., and may be used to convert one or more measured values ​​into one or more calibrated values ​​or "true" values. Calibration of the spectrometer device may include at least one of wavelength calibration, dark current calibration, and intensity calibration. Calibration may include at least one two-step process, wherein, in the first step, information regarding the relationship between the measurement signal of the spectrometer device and a known calibration standard, specifically with an external calibration target, is determined, wherein, in the second step, the information is used to correct and / or adjust the measurement signal of the spectrometer device, for example, to reduce, minimize, and / or eliminate deviations of the measurement signal from the known calibration standard. Thus, calibration may include applying the calibration information item to, for example, the measurement signal and / or measurement spectrum of the spectrometer device. Calibration of spectrometer equipment can improve and / or maintain the accuracy of measurements performed using calibrated spectrometer equipment.

[0086] In this method, the spectrometer device to be calibrated is a spectrometer device according to the present invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments disclosed in further detail below). Therefore, for possible embodiments and definitions related to the spectrometer device, refer to the description of the spectrometer device.

[0087] The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0088] The method includes:

[0089] I. Provide the object to the sample interface of the spectrometer device, wherein the object includes at least one external calibration target;

[0090] II. Via the at least one first optical path having at least one wavelength The detector is illuminated with light to obtain at least one first detector signal. ;

[0091] III. Via the at least one second optical path having the at least one wavelength The detector is illuminated with light to obtain at least one calibration signal. ;as well as

[0092] IV. By using the signal of the first detector and the calibration signal Determine at least one calibration information item .

[0093] Specifically, the calibration information item can be determined according to the following formula.

[0094]

[0095] This method can specifically include multiple wavelengths. Repeat steps II through IV.

[0096] In another aspect of the invention, a method for determining at least one spectroscopic piece of information about at least one object using a spectrometer device is disclosed. In this method, the spectrometer device to be used is a spectrometer device according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments disclosed in further detail below). Therefore, reference is made to the description of the spectrometer device regarding possible embodiments and definitions related to it.

[0097] The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0098] The method includes:

[0099] i. Provide the object to the sample interface, wherein the object includes at least one measurement object;

[0100] ii. Via the first optical path, using a wavelength of at least one The detector is illuminated with light to obtain at least one measurement signal. ;

[0101] iii. Via the second optical path, using at least one wavelength The detector is illuminated with light to obtain at least one reference signal. ;as well as

[0102] iv. By using the measurement signal The reference signal and the calibration information item The spectroscopic information of the object is determined by means of a calibration spectrometer apparatus according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments disclosed in further detail below).

[0103] The spectroscopic information of an object can specifically be one or more of its reflectance, transmittance, and absorbance. For example, the spectroscopic information of an object could be its reflectance. ,in,

[0104]

[0105] The method may include multiple wavelengths Repeat steps ii. to iv.

[0106] In another aspect of the invention, a computer program is disclosed, comprising instructions that, when executed by a computer or computer network, cause the computer or computer network to perform a method for calibrating a spectrometer device according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below), and / or to perform a method for determining at least one spectroscopic piece of information of at least one object according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below).

[0107] In another aspect of the invention, a computer-readable storage medium, specifically a non-transitory computer-readable storage medium, is disclosed, the computer-readable storage medium including instructions that, when executed by a computer or computer network, cause the computer or computer network to perform a method for calibrating a spectrometer device according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below), and / or to perform a method for determining at least one spectroscopic piece of information of at least one object according to the invention (e.g., according to any of the embodiments disclosed above and / or according to any of the embodiments further detailed below).

[0108] As used herein, the term "computer-readable storage medium" can specifically refer to a non-transitory data storage device, such as a hardware storage medium on which computer-executable instructions are stored. Storage media can specifically be or can include storage media such as random access memory (RAM) and / or read-only memory (ROM).

[0109] In one or more of the above embodiments and / or in one or more of the embodiments described in further detail below, the spectrometer apparatus and method according to the invention offer numerous advantages over known apparatuses and methods of similar types. Specifically, a spectrometer apparatus having transmission profiles of optical filters with first and second optical paths proportional to each other can provide an internal calibration path, which can be specifically designed such that temperature-induced drift in the second optical path is identical to temperature-induced drift in the first optical path when an object is applied to the spectrometer apparatus. Therefore, the spectrometer apparatus can provide reduced temperature dependence.

[0110] The spectrometer apparatus and method according to the invention can specifically provide optical designs for internal calibration paths of spectrometer apparatuses (e.g., spectrometer apparatuses including angle-dependent dispersive elements) that, for example, show the dependence of the spectrum on the direction of the collected light (e.g., the direction of the incident angle) on the x-axis and / or y-axis. In one example, the dispersive element can be an optical filter, specifically an interference filter, such as a set of narrow bandpass filters. The spectrometer apparatus and method according to the invention can be specifically applied to spectrometer apparatuses that use open-port light and / or a reference emitter to calibrate the spectrometer apparatus.

[0111] The spectrometer device according to the present invention may specifically include a transmission curve matched to a first optical path and a second optical path for an optical filter, wherein, ,and This is a constant independent of temperature, wavelength, and / or angle. The transmission curve of an optical filter can depend on the angular distribution of the light incident on the optical filter. Therefore, to match the transmission curves in the first and second optical paths, the spectrometer device according to the invention can provide a matching angular distribution of light in the first and second optical paths on the optical filter. The matching transmission curves of the optical filter for these two optical paths can provide improved temperature compensation for the light source. Additionally, when the reflectivity of the internal calibration target matches the reflectivity of the external calibration target, this ensures that all wavelengths in the wavelength region of interest are matched. Temperature compensation of the light source can be improved even better, specifically so that the calibration information can be constant for all temperatures.

[0112] The spectrometer device according to the invention can specifically provide the same effective transmission profile for light in both the first and second optical paths. The transmission profile of the optical filter can depend on the distribution of incident light across the filter. In one embodiment, internal calibration targets can be arranged in a specific manner to match the transmission profiles, which can specifically provide an improved open-port calibration scheme for the spectrometer device. In one embodiment, the spectrometer device can include a reference light source arranged symmetrically with respect to the optical filter, which can specifically provide an improved calibration scheme using a second reference light source. Constant It can generate specific calibration information items. It can scale, but without introducing any unwanted temperature dependence.

[0113] In another aspect of the invention, the use of the spectrometer device according to the invention is disclosed in applications selected from the group consisting of: infrared detection applications; spectroscopy applications; exhaust gas monitoring applications; combustion process monitoring applications; pollution monitoring applications; industrial process monitoring applications; mixing or blending process monitoring; chemical process monitoring applications; food processing process monitoring applications; food preparation process monitoring; water quality monitoring applications; air quality monitoring applications; quality control applications; temperature control applications; motion control applications; emission control applications; gas sensing applications; gas analysis applications; motion sensing applications; chemical sensing applications; mobile applications; medical applications; mobile spectroscopy applications; food analysis applications; agricultural applications, particularly characterization of soil, silage, feed, crops or agricultural products, and monitoring of plant health; plastic identification and / or recycling applications; healthcare and / or beauty applications, particularly determining, for example, skin hydration and / or oxygen saturation in animal or human skin, determining oxygen saturation in blood, urine, saliva or other bodily fluids, non-invasive blood glucose measurement or tracking applications, long-term blood glucose measurement or tracking applications, and body temperature measurement or tracking applications.

[0114] As used herein, the terms “have,” “include,” or “contain,” or any of their grammatical variations, are used in a non-exclusive manner. Thus, these terms can refer either to a situation where no other features exist in the entity described in the context besides those introduced by these terms, or to a situation where one or more other features exist. For example, the statements “A has B,” “A includes B,” and “A contains B” can refer either to a situation where no other elements exist in A besides B (i.e., A consists solely of B), or to a situation where entity A contains one or more other elements besides B (such as element C, elements C and D, or even other elements).

[0115] Furthermore, it should be noted that the terms "at least one," "one or more," or similar expressions indicating a feature or element may appear once or more, but are typically used only once when describing the corresponding feature or element. In most cases, the expressions "at least one" or "one or more" are not repeated when referring to the corresponding feature or element, but in fact, the corresponding feature or element may appear once or more.

[0116] Furthermore, as used herein, the terms “preferredly,” “more preferably,” “particularly,” “more particularly,” “specifically,” “more specifically,” or similar terms are used in combination with optional features without limiting the possibility of alternatives. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As those skilled in the art will recognize, the invention can be practiced by using alternative features. Similarly, features introduced by phrases such as “in embodiments of the invention” are intended to be optional features and do not limit any alternative embodiments of the invention, the scope of the invention, or the possibility of combining features introduced in this way with other optional or non-optional features of the invention.

[0117] In summary, and without excluding other possible embodiments, the following embodiments are conceivable:

[0118] In summary, and without excluding other possible embodiments, the following embodiments are conceivable:

[0119] Example 1: A spectrometer device for obtaining spectroscopic information about at least one object, the spectrometer device comprising...

[0120] - At least one detector, which is used to detect light from an object;

[0121] - At least one optical filter configured to deliver incident light within at least one selected wavelength range to the detector;

[0122] - At least one light source, which is configured to emit light in at least one optical spectral range;

[0123] - At least one sample interface configured to allow light emitted by the light source to illuminate an object held by the sample interface, and configured to allow light from the object held by the sample interface to propagate to the detector via the optical filter, wherein the sample interface includes at least one module cover window, the at least one module cover window including at least one substrate, wherein the module cover window includes at least one internal calibration target that partially covers the substrate.

[0124] - At least one first optical path, wherein the first optical path is configured to allow light emitted by the light source to propagate to the detector via the optical filter after passing through the sample interface at least once; and

[0125] - At least one second optical path, wherein the second optical path is configured to allow light emitted by the light source to propagate to the detector via the optical filter by interacting with the internal calibration target at least once.

[0126] Example 2: The spectrometer device according to the previous example, wherein the internal calibration target includes at least one diffuse reflective surface.

[0127] Example 3: The spectrometer device according to any one of the foregoing embodiments, wherein the internal calibration target is used as a diffuser, and wherein the internal calibration target includes a surface roughness configured to generate a Lambertian reflection curve.

[0128] Example 4: The spectrometer device according to any one of the foregoing embodiments, wherein the internal calibration target includes at least one of the following: at least one polytetrafluoroethylene (PTFE) layer; at least one optical coating, such as a white surface coating; a dielectric coating; at least one partially reflective dielectric mirror; at least one metal coating or metal foil including one or more of gold, silver, aluminum, and chromium; and at least one beam splitter.

[0129] Example 5: The spectrometer device according to any one of the foregoing embodiments, wherein the internal calibration target includes at least one white reflective element, or at least one white reflective element and at least one carrier element.

[0130] Example 6: The spectrometer device according to the previous embodiment, wherein the carrier element is diffusely reflective in at least one wavelength range, and wherein the white reflective element is translucent in at least one given wavelength range.

[0131] Example 7: A spectrometer device according to any one of the preceding embodiments, wherein the module cover window is at least partially structured, wherein the internal calibration target includes at least one pattern, wherein the pattern is arranged such that the pattern partially covers the substrate, wherein the pattern is at least one pattern selected from the group consisting of: a dot pattern, a checkerboard pattern or a random pattern, or any other pattern characterized by macroscopic 2D uniformity over the surface area of ​​the calibration target.

[0132] Example 8: The spectrometer device according to any one of the foregoing embodiments, wherein the substrate is a glass substrate.

[0133] Example 9: The spectrometer device according to any one of the preceding embodiments, wherein the substrate is at least partially covered by the internal calibration target, wherein the internal calibration target covers 0.1% to 99.9% of the substrate, specifically 0.5% to 25% of the substrate, and more specifically 1% to 10% of the substrate.

[0134] Example 10: The spectrometer device according to any one of the foregoing embodiments, wherein the module cover window includes at least one stray light suppression element configured to suppress unwanted light from illuminating the object and / or suppress stray light.

[0135] Example 11: The spectrometer device according to the previous embodiment, wherein the stray light suppression element has a reflectivity and transmittance of approximately zero.

[0136] Example 12: A spectrometer device according to any one of the preceding two examples, wherein the stray light suppression element covers a small portion of the substrate.

[0137] Example 13: A spectrometer device according to any one of the preceding three embodiments, wherein the stray light suppression element is disposed directly on the substrate, or the stray light suppression element is disposed on the substrate via at least one additional carrier element.

[0138] Example 14: A spectrometer device according to any one of the preceding four embodiments, wherein the stray light suppression element includes a coating, wherein the coating is made of black varnish.

[0139] Example 15: A spectrometer device according to any one of the preceding five examples, wherein the stray light suppression element is applied to the substrate by one or more of spraying, stamping, printing, or at least one brushing process.

[0140] Example 16: A spectrometer device according to any one of the preceding six embodiments, wherein the stray light suppression element is disposed on the substrate via a further carrier element, wherein the further carrier element comprises at least one element selected from the group consisting of: at least one metal foil, such as aluminum foil; at least one plastic foil; at least one plastic film.

[0141] Example 17: The spectrometer device according to the previous embodiment, wherein the additional carrier element is mounted on the substrate using at least one adhesive material.

[0142] Example 18: A spectrometer device according to any one of the foregoing embodiments, wherein the spectrometer device is a near-infrared spectrometer.

[0143] Example 19: A spectrometer device according to any one of the foregoing embodiments, wherein the emitted light has an optical spectral range that is at least partially located in the near-infrared spectral range.

[0144] Example 20: A spectrometer device according to any one of the foregoing embodiments, wherein the spectrometer device includes at least one evaluation unit configured to evaluate at least one detector signal generated by the detector.

[0145] Example 21: A method for calibrating a spectrometer device, wherein the spectrometer device is the spectrometer device according to any one of the foregoing embodiments, the method comprising:

[0146] I. Provide the object to the sample interface of the spectrometer device, wherein the object includes at least one external calibration target;

[0147] II. Via the at least one first optical path having at least one wavelength The detector is illuminated with light to obtain at least one first detector signal. ;

[0148] III. Via the at least one second optical path having the at least one wavelength The detector is illuminated with light to obtain at least one calibration signal. ;as well as

[0149] IV. By using the signal of the first detector and the calibration signal Determine at least one calibration information item .

[0150] Example 22: A method for determining at least one spectroscopic piece of information about at least one object using a spectrometer device according to any of the foregoing embodiments relating to a spectrometer device, the method comprising:

[0151] i. Provide the object to the sample interface, wherein the object includes at least one measurement object;

[0152] ii. Via the first optical path, using a wavelength of at least one The detector is illuminated with light to obtain at least one measurement signal. ;

[0153] iii. Via the second optical path, using at least one wavelength The detector is illuminated with light to obtain at least one reference signal. ;as well as

[0154] iv. By using the measurement signal The reference signal and the calibration information item The spectroscopic information of the object is determined by using the method of the calibration spectrometer apparatus according to the preceding claim.

[0155] Example 23: Use of the spectrometer device according to any one of the foregoing embodiments relating to the spectrometer device in applications selected from the group consisting of: infrared detection applications; spectroscopy applications; exhaust gas monitoring applications; combustion process monitoring applications; pollution monitoring applications; industrial process monitoring applications; mixing or blending process monitoring; chemical process monitoring applications; food processing process monitoring applications; food preparation process monitoring; water quality monitoring applications; air quality monitoring applications; quality control applications; temperature control applications; motion control applications; emission control applications; gas sensing applications; gas analysis applications; motion sensing applications; chemical sensing applications; mobile applications; medical applications; mobile spectroscopy applications; food analysis applications; agricultural applications, particularly characterization of soil, silage, feed, crops or agricultural products, monitoring plant health; plastic identification and / or recycling applications; healthcare and / or beauty applications, particularly determining, for example, skin hydration and / or oxygen saturation in animal or human skin, determining oxygen saturation in blood, urine, saliva or other bodily fluids, non-invasive blood glucose measurement or tracking applications, long-term blood glucose measurement or tracking applications, body temperature measurement or tracking applications. Attached Figure Description

[0156] Further optional features and embodiments will be disclosed in more detail, preferably in conjunction with the dependent claims, in the following embodiments. As those skilled in the art will recognize, the corresponding optional features can be implemented independently and in any feasible combination. The scope of the invention is not limited to the preferred embodiments. Embodiments are schematically depicted in the accompanying drawings. The same reference numerals in these drawings denote the same or functionally equivalent elements.

[0157] In the attached diagram:

[0158] Figure 1 A schematic diagram of an embodiment of a spectrometer apparatus for obtaining spectroscopic information about at least one object is shown; and

[0159] Figures 2 to 5C Schematic diagrams of different embodiments of the sample interface of a spectrometer device are shown;

[0160] Figure 6 A flowchart illustrating an embodiment of a method for calibrating a spectrometer device; and

[0161] Figure 7 A flowchart illustrating an embodiment of the method is shown. Detailed Implementation

[0162] Figure 1 A schematic diagram of an exemplary embodiment of a spectrometer device 110 for obtaining spectroscopic information about at least one object 112 is shown. The spectrometer device 110 may specifically be a near-infrared spectrometer 114.

[0163] The spectrometer device 110 includes at least one detector 116 for detecting light, particularly detection light 118, from an object 112. The detector 116 may include a single optically sensitive element or region, or multiple optically sensitive elements or regions (not shown). Specifically, the detector 116 may be or may include at least one detector array (more specifically, an array of photosensitive elements). Each photosensitive element may include at least a photosensitive region adapted to generate an electrical signal based on the intensity of the incident light, wherein the electrical signal may be specifically provided to an evaluation unit 120. The spectrometer device 110 may specifically include at least one evaluation unit 120 for evaluating at least one detector signal generated by the detector 116 and for using the detector signal to determine spectroscopic information about the object 112.

[0164] The spectrometer device 110 further includes at least one optical filter 122 configured to transmit incident light within at least one selected wavelength range to the detector 116. The transmission profile of the optical filter 122 may depend on the incident angle. (As shown in...) Figure 1 As can be seen, the optical filter 122 can be arranged adjacent to the detector 116, for example, by placing the optical filter 122 on top of the detector 116. As an example, the optical filter 122 may include at least one narrow bandpass filter 124, more specifically, a set of narrow bandpass filters 124. The narrow bandpass filters 124 can be configured to transmit light only within a narrow selected wavelength range, such as a wavelength range with a width in the range of 10 nm to 100 nm, specifically a wavelength range in the range of 10 nm to 50 nm, more specifically a wavelength range with a width of 20 nm, and most specifically a wavelength range with a width of 15 nm. For example, in this set of narrow bandpass filters 124, each narrow bandpass filter 124 may have a narrower selected wavelength range that is at least partially different from each other.

[0165] The spectrometer device 110 further includes at least one light source 126 configured to emit light within at least one optical spectral range, specifically illuminating light 128. For example, the light source 126 may include at least one light-emitting diode (LED) 130. Figure 1In the example, the illumination light 128 may have an optical spectral range that is at least partially located in the near-infrared spectral range.

[0166] The spectrometer device 110 further includes at least one sample interface 132 configured to allow light emitted by the light source 126 to illuminate an object 112 held by the sample interface 132, and configured to allow light from the object 112 held by the sample interface 132 to propagate to the detector 116 via an optical filter 122. The sample interface 132 includes at least one module cover window 134, which includes at least one substrate 136, wherein the module cover window 134 includes at least one internal calibration target 138 that partially covers the substrate 136. Figures 2 to 6 Different embodiments of the sample interface 132 and the module cover window 134 are shown. Therefore, for a detailed description of the sample interface 134 and the module cover window 132, please refer to... Figures 2 to 6 The description.

[0167] The spectrometer device 110 further includes at least one first optical path 140 and at least one second optical path 142. The first optical path 140 is configured to allow light emitted by the light source 126, specifically illumination light 128, to propagate to the detector 116 via an optical filter 122 after passing through the sample interface 132 at least once. The second optical path 142 is configured to allow light emitted by the light source 126, specifically illumination light 128, to propagate to the detector 116 via the optical filter 122 after interacting with an internal calibration target 138 at least once.

[0168] Figures 2 to 6 Schematic diagrams of different exemplary embodiments of the sample interface 132 of the spectrometer device 110 are shown. Figures 2 to 6 In these exemplary embodiments shown, the substrate 136 may be a glass substrate.

[0169] exist Figure 2 In the example, the internal calibration target 138 may include at least one white reflective element 144, such as a coating, film, or foil. The white reflective element 144 may provide a diffuse reflective surface. Figure 2As shown, the white reflective element 144 can be directly disposed on the substrate 136. Additionally, the module cover window 134 may include at least one stray light suppression element 146 configured to suppress unwanted light from illuminating the object 112 and / or suppress stray light. The stray light suppression element 146 may be a black material. The stray light suppression element 146 may have approximately zero reflectivity and transmittance. The stray light suppression element 146 may cover a small portion of the substrate 136, for example, in the area where the internal calibration target 138 is disposed. The stray light suppression element 146 may be part of the module cover window 134. The substrate 136 may be at least partially covered by the stray light suppression element 146. The stray light suppression element 146 may include a coating made of black varnish (e.g., Nextel® Black Velvet). The stray light suppression element 146 may be applied to the substrate 136 by one or more of the following processes: spraying, stamping, printing, or at least one brushing process. For example, as in... Figure 2 As can be seen, the stray light suppression element 146 can be directly disposed on the substrate 136. Figure 2 In an exemplary embodiment, the white reflective element 144 may be arranged adjacent to the stray light suppression element 146. For example, the white reflective element 144 and the stray light suppression element 146 may be arranged side by side on the substrate 136. For example, both the white reflective element 144 and the stray light suppression element 146 may be coatings arranged adjacent to each other on the substrate 136. However, other alternative arrangements are also possible.

[0170] Figure 3 It shows something similar to Figure 2 An exemplary embodiment of the sample interface 132 of the embodiment, wherein, in this example, the stray light suppression element 146 is disposed on the substrate 136 via at least one additional carrier element 148; in this case, there is no internal calibration target. For example, the additional carrier element 148 may include at least one element selected from the group consisting of: at least one metal foil, such as aluminum foil, for example, Acktar; at least one plastic foil; at least one plastic film. The additional carrier element 148 may be mounted on the substrate 136 using at least one adhesive material 150. Using the additional carrier element 148 may be advantageous because the shape of the coating can be pre-treated, and / or masks or other means are not required.

[0171] exist Figures 4A to 5C In an exemplary embodiment, the module cover window 134 may include a stack 152. Additionally, the internal calibration target 138 may include at least one carrier element 154, through which a white reflective element 144 is disposed on a substrate 136. The stack 152 may include at least the white reflective element 144, the carrier element 154, and the substrate 136.

[0172] For example, such as Figure 4A As shown, the stack 152 may include a carrier element 154 coated with a white reflective element 144, wherein the carrier element 154 is directly coated onto the substrate 136. For example, the carrier element 154 includes at least one metal layer 156, which includes one or more of gold, silver, aluminum, and chromium, wherein the metal layer 156 is coated onto the substrate 136, for example, using at least one thin-film process.

[0173] Additionally or alternatively, such as Figure 4B As shown, the stack 152 may include a carrier element 154 coated with a white reflective element 144. The carrier element 154 may be mounted to the substrate 136 using at least one adhesive 158. For example, the carrier element 154 may include a metal film 160 fixed to the substrate 136 by means of an adhesive 158.

[0174] Additionally or alternatively, such as Figure 4C As shown, the stack 152 may include a carrier element 154 mounted to the substrate 136 using at least one adhesive 158, and a white reflective element 144 mounted to the carrier element 154 using at least one transparent adhesive 162. For example, the carrier element 154 includes a metal film 160 fixed to the substrate 136 by adhesive 158, wherein the white reflective element 144 is a reflective coating fixed to the carrier element 154 by transparent adhesive 162.

[0175] exist Figures 5A to 5C In an exemplary embodiment, additionally or alternatively, the white reflective element 144 and the stray light suppression element 146 may be arranged in the stack 152 of the module cover window 134. The white reflective element 144 may be arranged to at least partially cover the stray light suppression element 146.

[0176] For example, such as Figure 5A As shown, the stack 152 may include a white reflective element 144 applied to the stray light suppression element 146, which is mounted on a separate carrier element 148, which is mounted on the substrate 136, for example, via an adhesive 158. The white reflective element 144 may be mounted to the stray light suppression element 146 via at least one transparent adhesive 162.

[0177] Alternatively, such as Figure 5BAs shown, the stray light suppression element 146 may be or may include at least one opaque adhesive 164. The white reflective element 144 may be bonded to another carrier element 148 via the opaque adhesive 164. This prevents partial absorption of light in the adhesive layer 158. This allows the absorption spectrum of the adhesive 158 to be prevented from being seen in the reflection spectrum of the white reflective material.

[0178] For example, such as Figure 5C As shown, the stack 152 can be implemented as similar to Figure 5A The stack 152, wherein the white reflective element 144 can be arranged to partially cover the stray light suppressing element 146.

[0179] Figure 6 A flowchart illustrating an exemplary embodiment of a method for calibrating a spectrometer device 110 is shown. In this method, the spectrometer device 110 to be calibrated is based on the present invention (e.g., according to...). Figure 1 The spectrometer apparatus 110 (illustrated embodiments and / or any other embodiments disclosed herein). Therefore, the description of the spectrometer apparatus 110 is based on... Figure 1 The description.

[0180] The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0181] The method includes:

[0182] I. (Indicated by reference numeral 166) Provide object 112 to sample interface 132 of spectrometer device 110, wherein object 112 includes at least one external calibration target;

[0183] II. (Indicated by reference numeral 168) via at least one first optical path 140 using a wavelength having at least one wavelength The light is used to illuminate the detector 116 to obtain at least one first detector signal. ;

[0184] III. (Indicated by reference numeral 170) via at least one second optical path 142 using a wavelength having at least one wavelength The light is used to illuminate the detector 116 to obtain at least one calibration signal. ;as well as

[0185] IV. (Indicated by reference numeral 172) By using the signal of the first detector and calibration signal Determine at least one calibration information item .

[0186] Specifically, the calibration information item can be determined according to the following formula.

[0187]

[0188] This method can specifically include multiple wavelengths. Repeat steps II through IV.

[0189] Figure 7 A flowchart illustrating an exemplary embodiment of a method for determining at least one spectroscopic piece of information about at least one object 112 using a spectrometer device 110 is shown. In this method, the spectrometer device 110 to be used is according to the present invention (e.g., according to...). Figure 1 The spectrometer apparatus 110 (illustrated embodiments and / or any other embodiments disclosed herein). Therefore, the description of the spectrometer apparatus 110 is based on... Figure 1 The description.

[0190] The method includes the following steps, which can be performed in a given order. However, different orders are also possible. In particular, one, more than one, or even all method steps may be performed once or repeatedly. Further, these method steps may be performed sequentially, or alternatively, one or more method steps may be performed in a timely overlapping manner or even in a parallel and / or combined manner. The method may further include additional method steps not listed.

[0191] The method includes:

[0192] i. (Indicated by reference numeral 174) Provide object 112 to sample interface 132, wherein object 112 includes at least one measurement object;

[0193] ii. (Indicated by reference numeral 176) via the first optical path 140 using a wavelength having at least one wavelength The light is used to illuminate the detector 116 to obtain at least one measurement signal. ;

[0194] iii. (Indicated by reference numeral 178) via the second optical path 142 using a wavelength having at least one wavelength The light is used to illuminate the detector 116 to obtain at least one reference signal. ;as well as

[0195] iv. (Indicated by reference numeral 180 in the attached figure) By using measurement signals Reference signal and calibration information items To determine the spectroscopic information of object 112, these signals and the calibration information item are obtained by using the present invention (e.g., according to...). Figure 6 The method for calibrating the spectrometer device 110 (as shown in the embodiments and / or any other embodiments disclosed herein) is determined.

[0196] The spectroscopic information of object 112 can specifically be one or more of the following: reflectance, transmittance, and absorbance. For example, the spectroscopic information of object 112 could be reflectance. ,in,

[0197]

[0198] The method may include multiple wavelengths Repeat steps ii. to iv.

[0199] List of reference numerals

[0200] .

Claims

1. A spectrometer apparatus (110) for obtaining spectroscopic information about at least one object (112), the spectrometer apparatus (110) comprising: - At least one detector (116) for detecting light from the object (112); - At least one optical filter (122) configured to deliver incident light within at least one selected wavelength range to the detector (116); - At least one light source (126), which is configured to emit light in at least one optical spectral range; - At least one sample interface (132) configured to allow light emitted by the light source (126) to illuminate an object (112) held by the sample interface (132), and configured to allow light from the object (112) held by the sample interface (132) to propagate to the detector (116) via the optical filter (122), wherein the sample interface (132) includes at least one module cover window (134) including at least one substrate (136). The module cover window (134) includes at least one internal calibration target (138) that partially covers the substrate (136), wherein the module cover window (134) includes at least one stray light suppression element (146) configured to suppress unwanted light from illuminating the object (112) and / or suppress stray light, wherein the stray light suppression element (146) has a reflectivity and transmittance of approximately zero, wherein the stray light suppression element (146) covers a small portion of the substrate (136); - At least one first optical path (140), wherein the first optical path (140) is configured to allow light emitted by the light source (126) to propagate to the detector (116) via the optical filter (122) through the sample interface (132) at least once; and - At least one second optical path (142), wherein the second optical path (142) is configured to allow light emitted by the light source (126) to propagate to the detector (116) via the optical filter (122) through at least one interaction with the internal calibration target (138).

2. The spectrometer apparatus (110) according to the preceding claim, wherein, The internal calibration target (138) includes at least one diffuse reflective surface.

3. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The internal calibration target (138) is used as a diffuser, wherein the internal calibration target (138) includes a surface roughness configured to generate a Lambertian reflection curve.

4. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The internal calibration target (138) includes one or more of the following: at least one polytetrafluoroethylene (PTFE) layer; at least one optical coating, such as a white surface coating; a dielectric coating; at least one partially reflective dielectric mirror; at least one metal coating or metal foil including one or more of gold, silver, aluminum, and chromium; and at least one beam splitter.

5. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The internal calibration target (138) includes at least one white reflective element (144), or at least one white reflective element (144) and at least one carrier element (154), wherein the carrier element (154) is diffusely reflective in at least one wavelength range, and wherein the white reflective element (144) is translucent in at least one given wavelength range.

6. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The module cover window (134) is at least partially structured, wherein the internal calibration target (138) includes at least one pattern, wherein the pattern is arranged such that the pattern partially covers the substrate (136), wherein the pattern is at least one pattern selected from the group consisting of: a dot pattern, a checkerboard pattern or a random pattern, or any other pattern characterized by macroscopic 2D uniformity over the surface area of ​​the calibration target.

7. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The substrate (136) is a glass substrate.

8. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The substrate (136) is at least partially covered by the internal calibration target (138), wherein the internal calibration target (138) covers 0.1% to 99.9% of the substrate (136).

9. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The stray light suppression element (146) is disposed directly on the substrate (136), or the stray light suppression element (146) is disposed on the substrate (136) via at least one other carrier element (148).

10. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The stray light suppression element (146) includes a coating, wherein the coating is made of black varnish, and / or wherein the stray light suppression element (146) is applied to the substrate (136) by one or more of spraying, stamping, printing, or at least one brushing process.

11. The spectrometer apparatus (110) according to any one of the preceding claims, wherein, The stray light suppression element (146) is disposed on the substrate (136) via a further carrier element (148), wherein the further carrier element (148) comprises at least one element selected from the group consisting of: at least one metal foil, such as aluminum foil; at least one plastic foil; at least one plastic film, wherein the further carrier element (148) is mounted on the substrate (136) using at least one adhesive material (150).

12. A method for calibrating a spectrometer device (110), wherein, The spectrometer device (110) is the spectrometer device (110) according to any one of the preceding claims, and the method includes: I. The object (112) is provided to the sample interface (132) of the spectrometer device (110), wherein the object (112) includes at least one external calibration target; II. Via the at least one first optical path (140) using a wavelength of at least one The detector (116) is illuminated with light to obtain at least one first detector signal. ; III. Via the at least one second optical path (142) using a wavelength having at least one wavelength The detector (116) is illuminated with light to obtain at least one calibration signal. ;as well as IV. By using the signal of the first detector and the calibration signal Determine at least one calibration information item .

13. A method for determining at least one spectroscopic piece of information of at least one object (112) using a spectrometer device (110) according to any one of the preceding claims relating to a spectrometer device (110), the method comprising: i. Provide the object (112) to the sample interface (132), wherein the object (112) includes at least one measurement object; ii. Via the first optical path (140) using a wavelength of at least one The detector (116) is illuminated with light to obtain at least one measurement signal. ; iii. Via the second optical path (142) using a wavelength of at least one The detector (116) is illuminated with light to obtain at least one reference signal. ;as well as iv. By using the measurement signal The reference signal and the calibration information item The spectroscopic information of the object (112) is determined by means of the calibration spectrometer device (110) according to the preceding claim.

14. Use of the spectrometer device (110) according to any one of the preceding claims in applications selected from the group consisting of: infrared detection applications; spectroscopy applications; exhaust gas monitoring applications; combustion process monitoring applications; pollution monitoring applications; industrial process monitoring applications; mixing or blending process monitoring; chemical process monitoring applications; food processing process monitoring applications; food preparation process monitoring; water quality monitoring applications; air quality monitoring applications; quality control applications; temperature control applications; motion control applications; emission control applications; gas sensing applications; gas analysis applications; motion sensing applications; chemical sensing applications; mobile applications; medical applications; mobile spectroscopy applications; food analysis applications; agricultural applications, particularly characterization of soil, silage, feed, crops or agricultural products, monitoring plant health; plastic identification and / or recycling applications; healthcare and / or beauty applications, particularly determining, for example, skin hydration and / or oxygen saturation in animal or human skin, determining oxygen saturation in blood, urine, saliva or other body fluids, non-invasive blood glucose measurement or tracking applications, long-term blood glucose measurement or tracking applications, body temperature measurement or tracking applications.

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