Testing tool and method for super capacitor

Abstract

The invention provides a testing tool and method for a super capacitor, and belongs to the field of capacitor testing. The tool comprises a test cable, a four-hole plug and a metal clamp, the four-hole plug is arranged at one end of the test cable, the metal clamp is arranged at the other end of the test cable, a quick change mechanism is arranged between the metal clamp and the test cable, and the quick change mechanism comprises a first butt joint block, a second butt joint block, a mounting seat and a cover plate. The first butt-joint block is fixed at one end, far away from the clamping opening, of the metal clamp, the second butt-joint block is fixed at one end, close to the metal clamp, of the test cable, the first butt-joint block is in contact connection with the second butt-joint block, a mounting groove is formed in the mounting seat, the first butt-joint block and the second butt-joint block are arranged in the mounting groove, and the cover plate covers the mounting groove. By adopting the test tool and method for the supercapacitor provided by the embodiment of the invention, the problem of compatibility in the prior art can be solved.

Description

Technical Field

[0001] This invention relates to the field of capacitance testing, and in particular to a testing fixture and method for supercapacitors. Background Technology

[0002] Supercapacitors, also known as electric double-layer capacitors or ultra-high capacitance capacitors, are a new type of energy storage device that falls between traditional electrostatic capacitors and rechargeable batteries. They combine the advantages of high power density and rapid charge / discharge capabilities of capacitors with the high energy density of batteries. With the continuous development of supercapacitors, they are increasingly widely used in various fields. The capacitance value of a supercapacitor is the core indicator measuring its charge storage capacity and directly determines its energy density. Therefore, to ensure the performance, reliability, and safety of supercapacitors in various application scenarios, accurate testing of their key electrochemical performance parameters is crucial.

[0003] In existing technologies, supercapacitor testing fixtures consist of positive and negative electrode test clamps, cables, and external testing equipment. During testing, the test clamps are connected to the positive and negative electrodes of the capacitor, and the test probes are connected to the external testing equipment via cables to form a circuit, thus enabling the testing of the supercapacitor. However, due to the large internal resistance of supercapacitors, the use of positive and negative electrode clamps results in significant errors. To address this issue, existing technologies employ two output electrode clamps to provide the test current and two measuring electrode clamps to measure the battery voltage, thereby improving the measurement accuracy of the testing fixture.

[0004] In existing supercapacitor testing fixtures, the electrode clamps are typically fixed to the cable. After numerous tests, these clamps suffer significant wear, sometimes even resulting in damaged internal springs that prevent them from clamping the supercapacitor. Replacing the clamps requires replacing the entire cable and clamp, leading to material waste. Furthermore, testing different supercapacitor models requires different sized electrode clamps due to variations in contact size. The current fixtures, with the clamps fixed to the cable, suffer from low compatibility when testing different supercapacitor models. Summary of the Invention

[0005] This invention provides a testing fixture and method for supercapacitors, which can solve the problem of low compatibility in the prior art. The technical solution is as follows: Firstly, a testing fixture for a supercapacitor includes: a test cable, a four-hole plug, and a metal clamp. The four-hole plug is located at one end of the test cable, and the metal clip is located at the other end of the test cable. A quick-change mechanism is provided between the metal clip and the test cable. The quick-change mechanism includes a first mating block, a second mating block, a mounting base, and a cover plate. The first mating block is fixed to the end of the metal clip away from the clamp opening, and the second mating block is fixed to the end of the test cable near the metal clip. The first mating block and the second mating block are in contact and connected. The mounting base has a mounting groove, and the first mating block and the second mating block are located in the mounting groove. The cover plate covers the mounting groove.

[0006] Optionally, the first mating block has a first inclined surface, and the second mating block has a second inclined surface, with the first inclined surface and the second inclined surface abutting each other.

[0007] Optionally, the test cable includes a first test cable and a second test cable, one end of the first test cable is connected to the metal clip, the other end is connected to one end of the second test cable, and the other end of the second test cable is connected to the four-hole plug.

[0008] Optionally, a connection mechanism is provided between the first test cable and the second test cable. The connection mechanism includes a plug block and a connector. The plug block is provided with a plug pin. The other end of the first test cable communicates with the plug pin. The connector has a horizontal connection hole. One end of the second test cable communicates with the connection hole. The plug pin is plugged into the connection hole.

[0009] Optionally, the bottom of the plug block is provided with a plug seat, and the plug seat has a plug groove in the same direction as the connecting hole, and the plug seat is plugged into the plug groove.

[0010] Optionally, the plug block is provided with slots on both sides, the connector is provided with hollow plates with horizontal openings on both sides, a rotating plate is provided inside the hollow plate, the rotating plate is arranged along the opening direction of the hollow plate, a vertical rotating shaft is provided in the middle of the rotating plate, the rotating shaft is rotatably provided inside the hollow plate, and a locking block is provided at the end of the rotating plate, the locking block engaging with the slot.

[0011] Optionally, the hollow plate has a mounting hole on its side, and the rotating plate has a button and a first spring at the end away from the locking block. The button passes through the mounting hole and protrudes from the hollow plate, and the first spring is located between the rotating plate and the side wall of the connecting seat.

[0012] Optionally, the four-hole plug is fitted with a connecting shell, which is rotatably and slidably connected to the four-hole plug, and the connecting shell is provided with anti-slip texture on the outside.

[0013] Optionally, the four-hole plug is provided with a locking groove and a locking mechanism. The locking groove and the locking mechanism are located on the side of the connecting shell near the test cable. The locking mechanism includes a locking block, a guide rod, and a second spring. The guide rod is vertically fixed in the locking groove. The locking block is slidably disposed on the guide rod. The second spring is sleeved on the guide rod and is located between the locking block and the bottom of the locking groove. A limit block is provided at the end of the guide rod to limit the maximum distance that the locking block can slide on the guide rod.

[0014] Secondly, a testing method for a supercapacitor, including the aforementioned testing fixture for a supercapacitor, further includes the following steps: Step 1: Place the first docking block and the second docking block into the mounting base and cover them with the cover plate; Step 2: Clamp and fix the metal clip onto the pins of the supercapacitor under test, and insert the four-hole plug into the external testing equipment for testing; Step 3: Disconnect the four-hole plug from the external testing equipment, open the cover plate, replace the metal clip and the first docking block according to the type of supercapacitor to be tested, and put the first docking block into the mounting slot to connect with the second docking block, and then close the cover plate; Step 4: Repeat steps 2 and 3 to test different types of supercapacitors.

[0015] The beneficial effects of the technical solutions provided in the embodiments of the present invention include at least the following: This invention provides a testing fixture and method for supercapacitors. A metal clip is used to clamp and fix the pins of the supercapacitor under test, and a four-hole plug is inserted into an external testing device, thereby connecting the supercapacitor under test to the test circuit of the external testing device. By setting a quick-change mechanism between the test cable and the metal clip, when the first and second mating blocks are placed in the mounting slot and make contact, the metal clip is connected to the test circuit. When it is necessary to change to a different size metal clip, the cover plate is removed from the mounting base, a different metal clip is replaced, and the first mating block of the different metal clip is placed back into the mounting slot to make contact with the second mating block, thereby connecting different metal clips to the test circuit. This facilitates clamping and fixing different types of supercapacitors under test and connecting them to the test circuit, effectively solving the problem of low compatibility in the prior art. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the overall structure of the tooling provided in an embodiment of the present invention; Figure 2 This is an exploded view of the quick-change mechanism provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the connection mechanism structure provided in an embodiment of the present invention; Figure 4 This is an exploded view of the connection mechanism provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of the locking mechanism and connecting shell provided in an embodiment of the present invention; Figure 6 This is an exploded schematic diagram of the locking mechanism provided in an embodiment of the present invention; Figure 7 This is a flowchart of the method provided in an embodiment of the present invention.

[0018] In the diagram: 1-Test cable; 11-First test cable; 12-Second test cable; 2-Four-hole plug; 21-Connecting shell; 22-Anti-slip texture; 23-Locking groove; 3-Metal clip; 4-Quick-change mechanism; 41-First mating block; 411-First bevel; 42-Second mating block; 421-Second bevel; 43-Mounting base; 44-Cover plate; 45-Mounting groove; 5-Connecting mechanism; 51-Plug-in block; 511-Plug-in pin; 512-Plug-in socket; 513-Slot; 52-Connector; 521-Connecting hole; 522-Plug-in groove; 523-Hollow plate; 524-Rotating plate; 525-Rotating shaft; 526-Clamping block; 527-Mounting hole; 528-Button; 529-First spring; 6-Locking mechanism; 61-Locking block; 62-Guide rod; 63-Second spring; 64-Limiting block; 7-Binding rope. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.

[0020] Figure 1 This is a schematic diagram of the overall structure of the tooling provided in an embodiment of the present invention; Figure 2 This is an exploded view of the quick-change mechanism provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the connection mechanism structure provided in an embodiment of the present invention; Figure 4This is an exploded view of the connection mechanism provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of the locking mechanism and connecting shell provided in an embodiment of the present invention; Figure 6 This is an exploded schematic diagram of the locking mechanism provided in an embodiment of the present invention; Figure 7 This is a flowchart of a method provided in an embodiment of the present invention. Figures 1 to 7 The supercapacitor testing fixture shown is characterized by comprising: a test cable 1, a four-hole plug 2, and a metal clip 3. The four-hole plug 2 is disposed at one end of the test cable 1, and the metal clip 3 is disposed at the other end of the test cable 1. A quick-change mechanism 4 is provided between the metal clip 3 and the test cable 1. The quick-change mechanism 4 includes a first connecting block 41, a second connecting block 42, a mounting base 43, and a cover plate 44. The first connecting block 41 is fixed at the end of the metal clip 3 away from the clamp opening, and the second connecting block 42 is fixed at the end of the test cable 1 close to the metal clip 3. The first connecting block 41 and the second connecting block 42 are in contact with each other. The mounting base 43 has a mounting groove 45, and the first connecting block 41 and the second connecting block 42 are disposed in the mounting groove 45. The cover plate 44 covers the mounting groove 45.

[0021] Exemplarily, in this embodiment of the invention, the test cable 1 contains four wires, each connected to one of four metal clips 3. Two wires are used to provide test current, and the other two are used to measure voltage. The four wires are connected to an external testing device via a four-hole plug 2. Multiple metal clips 3 are provided depending on the model and size of the supercapacitor under test. The first mating blocks 41 on all metal clips 3 are identical, facilitating mating with the second mating blocks 42. The mounting base 43 provides bottom support for the contact connection between the first mating blocks 41 and the second mating blocks 42. The mounting groove 45 provides a limiting function for the first mating blocks 41 and the second mating blocks 42. The cover plate 44, placed over the mounting groove 45, further limits the positioning of the first mating blocks 41 and the second mating blocks 42 and also provides insulation. Before testing, metal clips 3 of different sizes are selected according to the pins of the supercapacitor under test. The first mating block 41 at the tail of the clip is installed in the mounting groove 45 and connected to the second mating block 42. Then, the cover plate 44 is placed on the mounting groove 45, and the metal clip 3 is clamped and fixed to the pins of the supercapacitor under test and connected. The four-hole plug 2 is electrically connected to the external testing equipment to perform circuit testing on the supercapacitor under test. Compared with the traditional technology of fixing the metal clip to the test cable, this embodiment sets a quick-change mechanism 4 between the metal clip 3 and the test cable 1, which allows for the selection of metal clips 3 of different sizes according to the pins of the supercapacitor under test, thereby improving the compatibility of this testing fixture. The metal clip 3 is a consumable part and is prone to damage after repeated use. When the metal clip 3 is damaged, it can be replaced with a new metal clip 3, thereby extending the service life of the remaining components.

[0022] This invention provides a testing fixture and method for supercapacitors. A metal clip 3 is used to clamp and fix the pins of the supercapacitor under test, and a four-hole plug 2 is connected to an external testing device, thereby connecting the supercapacitor under test to the testing circuit of the external testing device. A quick-change mechanism 4 is provided between the test cable 1 and the metal clip 3. When the first mating block 41 and the second mating block 42 are placed in the mounting groove 45 and make contact, the metal clip 3 is connected to the testing circuit. When it is necessary to replace the metal clip 3 with a different size, the cover plate 44 is removed from the mounting base 43, a different metal clip 3 is replaced, and the first mating block 41 of the different metal clip 3 is placed back into the mounting groove 45 to make contact with the second mating block 42, thereby connecting the different metal clips 3 to the testing circuit. This facilitates clamping and fixing different types of supercapacitors under test and connecting them to the testing circuit, effectively solving the problem of low compatibility in the prior art.

[0023] Optionally, the first mating block 41 has a first inclined surface 411, and the second mating block 42 has a second inclined surface 421, with the first inclined surface 411 and the second inclined surface 421 abutting each other.

[0024] Exemplary, in embodiments of the present invention, such as Figure 2 As shown, the first mating block 41 is located above the second mating block 42. The first inclined surface 411 and the second inclined surface 421 have the same inclination angle. By changing the point contact to a surface contact, the contact area of ​​the first mating block 41 and the second mating block 42 can be increased. Furthermore, since it is a contact between inclined surfaces, the first mating block 41 and the second mating block 42 can be in closer contact in any direction due to gravity, thereby reducing the possibility of a break in contact between the first mating block 41 and the second mating block 42 and improving the stability of the test circuit.

[0025] Optionally, the test cable 1 includes a first test cable 11 and a second test cable 12. One end of the first test cable 11 is connected to the metal clip 3, and the other end is connected to one end of the second test cable 12. The other end of the second test cable 12 is connected to the four-hole plug 2.

[0026] Exemplary, in embodiments of the present invention, such as Figure 1 As shown, since the four-hole plug 2 is also a vulnerable part, it is easy to be damaged after repeated plugging and unplugging. By dividing the test cable 1 into a first test cable 11 and a second test cable 12, when the four-hole plug 2 is damaged, the four-hole plug 2 and the second test cable 12 can be replaced, thus eliminating the need to replace the entire test cable 1, thereby reducing the testing cost of this test fixture.

[0027] Optionally, a connection mechanism 5 is provided between the first test cable 11 and the second test cable 12. The connection mechanism 5 includes a plug block 51 and a connector 52. The plug block 51 is provided with a plug pin 511. The other end of the first test cable 11 is connected to the plug pin 511. The connector 52 is provided with a horizontal connection hole 521. One end of the second test cable 12 is connected to the connection hole 521. The plug pin 511 is plugged into the connection hole 521.

[0028] Exemplary, in embodiments of the present invention, such as Figure 1 and Figure 4 As shown, the connecting mechanism 5 is located near the four-hole plug 2, making the second test cable 12 shorter. This reduces the amount of material needed when replacing the second test cable 12 and the four-hole plug 2. A binding rope 7 is provided on the first test cable 11 to bundle any excess cable. The connecting mechanism 5 allows for quick connection of the first test cable 11 and the second test cable 12, reducing the need for cable splicing. The first test cable 11 is connected to the connector pin 511, and the second test cable 12 is connected to the connecting hole 521. When the connector pin 511 is inserted into the connecting hole 521, the first test cable 11 and the second test cable 12 are connected. This structure allows for quick connection or disconnection of the first test cable 11 and the second test cable 12 when replacing the second test cable 12 and the four-hole plug 2, thus improving the ease of operation of this testing fixture.

[0029] Optionally, the bottom of the plug block 51 is provided with a plug seat 512, and the connector 52 is provided with a plug groove 522 in the same direction as the connector hole 521, and the plug seat 512 and the plug groove 522 are plugged into each other.

[0030] Exemplary, in embodiments of the present invention, such as Figure 4 As shown, by setting the plug socket 512 to engage with the plug slot 522, a guiding function can be provided for the plug pin 511 to be plugged into the connection hole 521, preventing the plug pin 511 from breaking due to misalignment between the plug pin 511 and the connection hole 521 during the plugging process. By setting this structure, the ease of operation of this test fixture is further improved.

[0031] Optionally, the plug-in block 51 is provided with slots 513 on both sides, and the connector 52 is provided with hollow plates 523 with horizontal openings on both sides. A rotating plate 524 is provided inside the hollow plate 523. The rotating plate 524 is arranged along the opening direction of the hollow plate 523. A vertical rotating shaft 525 is provided in the middle of the rotating plate 524. The rotating shaft 525 is rotatably provided inside the hollow plate 523. A locking block 526 is provided at the end of the rotating plate 524. The locking block 526 engages with the slots 513.

[0032] Exemplary, in embodiments of the present invention, such as Figure 3 and Figure 4 As shown, for the rotating plate 524 on the right side of the figure, after the connector pin 511 is inserted into the connection hole 521, the rotating plate 524 is driven to rotate clockwise around the rotating shaft 525, causing the locking block 526 to rotate and engage with the locking slot 513, thereby preventing the connector block 51 and the connector seat 52 from separating. When it is necessary to separate the connector pin 511 from the connection hole 521, the rotating plate 524 must first be rotated clockwise to separate the locking block 526 from the locking slot 513, and only then can the connector block 51 and the connector seat 52 be separated. By setting this structure, the engagement between the connector pin 511 and the connection hole 521 can be strengthened, preventing the phenomenon of disconnection between the first test cable 11 and the second test cable 12, and further improving the stability of the test circuit.

[0033] Optionally, the hollow plate 523 has a mounting hole 527 on its side, and the rotating plate 524 is provided with a button 528 and a first spring 529 at the end away from the locking block 526. The button 528 passes through the mounting hole 527 and protrudes from the hollow plate 523, and the first spring 529 is located between the rotating plate 524 and the side wall of the connecting seat 52.

[0034] Exemplary, in embodiments of the present invention, such as Figure 4 As shown, the first spring 529 is initially compressed, causing the locking block 526 to move towards the connector 52. When the locking block 526 engages with the slot 513, the engagement force is greater under the action of the first spring 529, making the engagement of the locking block 526 with the slot 513 more stable. When it is necessary to separate the plug block 51 and the connector 52, pressing the button 528 further compresses the first spring 529, causing the locking block 526 to move away from the connector 52, and the locking block 526 to separate from the slot 513. By setting this structure, the locking block 526 can be stably engaged and fixed with the slot 513 without applying external force, thereby further improving the stability of the test circuit.

[0035] Optionally, a connecting shell 21 is provided on the outside of the four-hole plug 2. The connecting shell 21 is rotatably connected to the four-hole plug 2 and slidably connected. The outside of the connecting shell 21 is provided with anti-slip texture 22.

[0036] Exemplary, in embodiments of the present invention, such as Figure 5As shown, the connecting shell 21 can be internally threaded, while the connector of the external testing equipment has a matching external thread. After the four-hole plug 2 is inserted into the external testing equipment, the internal thread of the connecting shell 21 mates with the external thread of the connector of the external testing equipment, thus enabling the four-hole plug 2 to connect more stably to the external testing equipment and further improving the stability of the test circuit. The anti-slip texture 22 prevents slippage when the operator rotates the connecting shell 21, further improving the ease of operation of this testing fixture.

[0037] Optionally, the four-hole plug 2 is provided with a locking groove 23 and a locking mechanism 6. The locking groove 23 and the locking mechanism 6 are located on the side of the connecting shell 21 near the test cable 1. The locking mechanism 6 includes a locking block 61, a guide rod 62 and a second spring 63. The guide rod 62 is vertically fixed in the locking groove 23. The locking block 61 is slidably disposed on the guide rod 62. The second spring 63 is sleeved on the guide rod 62 and is located between the locking block 61 and the bottom of the locking groove 23. A limit block 64 is provided at the end of the guide rod 62. The limit block 64 is used to limit the maximum distance that the locking block 61 can slide on the guide rod 62.

[0038] Exemplary, in embodiments of the present invention, such as Figure 5 and Figure 6 As shown, when the connecting shell 21 is not connected to the connector of the external test equipment, the connecting shell 21 is located on the locking groove 23, causing the locking block 61 to slide along the guide rod 62 into the locking groove 23 and be compressed and fixed in the locking groove 23. At this time, the second spring 63 is compressed. When the connecting shell 21 is connected to the connector of the external test equipment, the locking block 61 is no longer restricted by the connecting shell 21 and pops out of the locking groove 23 under the elastic force of the second spring 63. The side wall of the locking block 61 abuts against the end of the connecting shell 21. At this time, the connecting shell 21 cannot be disengaged from the connector of the external test equipment. When it is necessary to disconnect the four-hole plug 2 from the external test equipment, the locking block 61 must be pressed first so that it is fully inserted into the locking groove 23 before the connecting shell 21 can slide towards the test cable 1. By setting this structure, the connection between the four-hole plug 2 and the external test equipment can be prevented from being interrupted during the test, thereby further improving the stability of the test circuit.

[0039] A method for testing a supercapacitor, comprising the aforementioned testing fixture for a supercapacitor, and further comprising the following steps: S1: Place the first docking block 41 and the second docking block 42 into the mounting base 43 and cover it with the cover plate 44; S2: Clamp and fix the metal clip 3 onto the pins of the supercapacitor under test, and insert the four-hole plug 2 into the external testing equipment for testing; S3: Disconnect the four-hole plug 2 from the external testing equipment, open the cover plate 44, replace the metal clip 3 and the first docking block 41 according to the type of supercapacitor to be tested, and put the first docking block 41 into the mounting slot 45 to connect with the second docking block 42, and then close the cover plate 44. S4; Repeat S2 and S3 to test different types of supercapacitors.

[0040] Exemplary, in embodiments of the present invention, such as Figure 7 As shown, before testing, metal clips 3 of different sizes are selected according to the pins of the supercapacitor under test. The first mating block 41 at the tail of the clip is installed in the mounting slot 45 and connected to the second mating block 42. Then, the cover plate 44 is placed on the mounting slot 45, and the metal clip 3 is clamped and fixed to the pins of the supercapacitor under test and connected. The four-hole plug 2 is electrically connected to the external testing equipment to perform circuit testing on the supercapacitor under test. After testing the current batch of supercapacitors under test, a suitable metal clip 3 is selected according to the shape and size of the pins of the next batch of supercapacitors under test. The cover plate 44 is opened, the first mating block 41 of the original metal clip 3 is removed, and the first mating block 41 of the new metal clip 3 is inserted and connected to the second mating block 42, so that the new metal clip 3 is connected to the test circuit, thereby testing the next batch of supercapacitors under test.

[0041] Unless otherwise defined, the technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention pertains. The terms “first,” “second,” and similar terms used in this patent application specification and claims do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Similarly, the terms “an” or “a” and similar terms do not indicate a quantity limitation, but rather indicate the presence of at least one. The terms “comprising” or “including” and similar terms mean that the elements or objects preceding “comprising” or “including” encompass the elements or objects listed following “comprising” or “including” and their equivalents, and do not exclude other elements or objects. The terms “connected” or “linked” and similar terms are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The terms “upper,” “lower,” “left,” and “right” are used only to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0042] The above description is merely an optional embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A test fixture for ultracapacitors, comprising: Include: Test cable (1), four-hole plug (2) and metal clamp (3), The four-hole plug (2) is arranged at one end of the test cable (1), the metal clamp (3) is arranged at the other end of the test cable (1), the quick change mechanism (4) is arranged between the metal clamp (3) and the test cable (1), the quick change mechanism (4) includes first docking block (41), second docking block (42), mounting seat (43) and cover plate (44), the first docking block (41) is fixed at one end of the metal clamp (3) away from the clamp opening, the second docking block (42) is fixed at one end of the test cable (1) close to the metal clamp (3), the first docking block (41) and the second docking block (42) are in contact connection, the mounting seat (43) is provided with mounting groove (45), the first docking block (41) and the second docking block (42) are arranged in the mounting groove (45), the cover plate (44) is arranged on the mounting groove (45).

2. The test fixture of claim 1, wherein, The first docking block (41) has a first inclined surface (411), the second docking block (42) has a second inclined surface (421), and the first inclined surface (411) and the second inclined surface (421) are in abutment.

3. The test fixture of claim 1, wherein: The test cable (1) includes first test cable (11) and second test cable (12), one end of the first test cable (11) is communicated with the metal clamp (3), the other end is communicated with one end of the second test cable (12), the other end of the second test cable (12) is communicated with the four-hole plug (2).

4. The test fixture of claim 3, wherein, The first test cable (11) and the second test cable (12) are provided with connecting mechanism (5), the connecting mechanism (5) includes plug-in block (51) and connecting seat (52), the plug-in block (51) is provided with plug-in pin (511), the other end of the first test cable (11) is communicated with the plug-in pin (511), the connecting seat (52) is provided with transverse connecting hole (521), one end of the second test cable (12) is communicated with the connecting hole (521), the plug-in pin (511) and the connecting hole (521) are plug-in matched.

5. The test fixture of claim 4, wherein, The plug-in block (51) is provided with plug-in seat (512), the connecting seat (52) is provided with plug-in slot (522) with the same direction as the connecting hole (521), the plug-in seat (512) and the plug-in slot (522) are plug-in matched.

6. The test fixture of claim 4, wherein, Both sides of the plug-in block (51) are provided with clamping grooves (513), both sides of the connecting seat (52) are provided with horizontally opened hollow plates (523), the hollow plates (523) are provided with rotating plates (524), the rotating plates (524) are arranged along the opening direction of the hollow plates (523), the middle part of the rotating plate (524) is provided with a vertical rotating shaft (525), the rotating shaft (525) is rotatably arranged in the hollow plate (523), and the end part of the rotating plate (524) is provided with a clamping block (526) which is clamped with the clamping groove (513).

7. The test fixture of claim 6, wherein, The side surface of the hollow plate (523) is provided with a mounting hole (527), one end of the rotating plate (524) away from the clamping block (526) is provided with a button (528) and a first spring (529), the button (528) penetrates through the mounting hole (527) and protrudes from the hollow plate (523), and the first spring (529) is located between the rotating plate (524) and the side wall of the connecting seat (52).

8. The test fixture of claim 1, wherein, The outer part of the four-hole plug (2) is sleeved with a connecting shell (21), the connecting shell (21) is rotationally and slidably connected with the four-hole plug (2), and the outer part of the connecting shell (21) is provided with anti-skid lines (22).

9. The test fixture of claim 8, wherein, The four-hole plug (2) is provided with a locking groove (23) and a locking mechanism (6), the locking groove (23) and the locking mechanism (6) are located on the side of the connecting shell (21) close to the test cable (1), the locking mechanism (6) comprises a locking block (61), a guide rod (62) and a second spring (63), the guide rod (62) is vertically and fixedly arranged in the locking groove (23), the locking block (61) is slidably arranged on the guide rod (62), the second spring (63) is sleeved on the guide rod (62), the second spring (63) is located between the locking block (61) and the groove bottom of the locking groove (23), and the end part of the guide rod (62) is provided with a limiting block (64), and the limiting block (64) is used for limiting the maximum distance of the locking block (61) on the guide rod (62).

10. A method of testing a supercapacitor, comprising a testing fixture according to any one of claims 1 to 9, wherein, Further comprising the following steps: Step one: the first abutting block (41) and the second abutting block (42) are put into the mounting seat (43), and the cover plate (44) is covered; Step two: the metal clamp (3) is clamped and fixed on the pin of the super capacitor to be tested, the four-hole plug (2) is inserted into the external test equipment for testing; Step three: disconnect the four-hole plug (2) from the external test equipment, open the cover plate (44), replace the different metal clamps (3) and first abutting blocks (41) according to the type of the super capacitor to be tested, put the first abutting block (41) into the mounting groove (45) and connect the second abutting block (42), and then cover the cover plate (44); Step four: repeat steps two and three to test different types of super capacitors to be tested.

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