Bus capacitor life prediction method, power supply device, electronic device and storage medium

Abstract

The invention discloses a bus capacitor service life prediction method, power supply equipment, electronic equipment and a storage medium. The bus capacitor service life prediction method comprises the following steps: determining a maximum voltage fluctuation difference value and average output power of a bus voltage corresponding to a bus capacitor in a ripple period; determining the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference value and the average output power; and determining a service life prediction value of the bus capacitor through a plurality of capacitor capacitance values obtained through detection in a plurality of ripple periods. The capacitance value of the bus capacitor is calculated based on the maximum voltage fluctuation difference value and the average output power, the detection difficulty can be reduced, the detection real-time performance can be improved, the service life prediction value of the bus capacitor is determined through the multiple capacitance values obtained through detection in the multiple ripple periods, accidental error interference can be reduced, and the service life prediction accuracy of the bus capacitor is improved. Therefore, the detection accuracy is improved and the prediction precision of the service life of the bus capacitor is improved.

Description

Technical Field

[0001] This application relates to the field of electrical equipment technology, and in particular to a method for predicting the lifespan of bus capacitors, power supply equipment, electronic equipment, and storage media. Background Technology

[0002] ATX (Advanced Technology eXtended) power supplies are standard power supply units for electrical devices such as PCs (Personal Computers). They are used to convert AC (Alternating Current) to DC (Direct Current) to provide stable voltage to various hardware components such as the motherboard, CPU (Central Processing Unit), and graphics card.

[0003] ATX power supplies typically use aluminum electrolytic capacitors as their bus capacitors. Aluminum electrolytic capacitors are consumable parts; as their operating time increases, the electrolyte level decreases, gradually reducing their lifespan until they eventually fail. When an aluminum electrolytic capacitor reaches the end of its lifespan, it often leaks, explodes, or even catches fire, posing a significant threat to equipment safety, production safety, and personal safety. To improve equipment reliability and safety, ATX power supply bus capacitors are regularly inspected. This inspection involves opening the power supply casing and performing offline testing on the ATX power supply bus capacitors.

[0004] However, the above methods are relatively complex to operate, cannot effectively detect bus capacitors online, have poor real-time performance, and cannot accurately predict the lifespan of bus capacitors. Summary of the Invention

[0005] The main technical problem addressed by this application is to provide a method for predicting the lifespan of bus capacitors, a power supply device, an electronic device, and a storage medium, which can solve the problem that related technologies cannot improve the prediction accuracy of the lifespan of bus capacitors while reducing the difficulty of detection.

[0006] To address the aforementioned technical problems, this application provides a method for predicting the lifespan of a bus capacitor, comprising: determining the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle; determining the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and average output power; and determining the predicted lifespan value of the bus capacitor by using multiple capacitance values ​​obtained from multiple ripple cycles.

[0007] The steps of determining the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle include: determining the trough voltage value and peak voltage value of the bus voltage corresponding to the bus capacitor within one ripple cycle; determining the maximum voltage fluctuation difference based on the peak voltage value and trough voltage value; determining the average output power based on the charging waveform curve corresponding to the trough voltage value and the peak voltage value; or, determining the average output power based on the discharging waveform curve corresponding to the peak voltage value and the trough voltage value.

[0008] The step of determining the trough voltage value and peak voltage value of the bus voltage corresponding to the bus capacitor within one ripple cycle includes: continuously acquiring multiple output voltage values ​​corresponding to the bus voltage at a preset frequency within one ripple cycle, and comparing the currently acquired output voltage value with the previously acquired output voltage value; in response to the starting point of the ripple cycle being a trough, determining the first acquired output voltage value as the trough voltage value, and when it is detected that the currently acquired output voltage value is less than the previously acquired output voltage value, determining the previously acquired output voltage value as the peak voltage value; in response to the starting point of the ripple cycle being a peak, determining the first acquired output voltage value as the peak voltage value, and when it is detected that the currently acquired output voltage value is greater than the previously acquired output voltage value, determining the previously acquired output voltage value as the trough voltage value.

[0009] The step of determining the average output power based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value includes: recording the number of detections corresponding to the trough voltage value to the peak voltage value, and performing an integral calculation based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value to obtain the total output power corresponding to the charging process; and calculating the average output power based on the total output power corresponding to the charging process and the number of detections.

[0010] The step of determining the average output power based on the discharge waveform curve corresponding to the peak voltage value to the trough voltage value includes: recording the number of detections corresponding to the peak voltage value to the trough voltage value, and performing an integral calculation based on the discharge waveform curve corresponding to the peak voltage value to the trough voltage value to obtain the total output power corresponding to the discharge process; and calculating the average output power based on the total output power corresponding to the discharge process and the number of detections.

[0011] The step of determining the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and the average output power includes: determining the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference, the average output power, the output voltage frequency corresponding to the bus capacitor, and the rated output voltage value corresponding to the bus capacitor.

[0012] The step of determining the predicted lifespan of the bus capacitor by detecting multiple capacitance values ​​obtained from multiple ripple cycles includes: summing the capacitance values ​​corresponding to multiple ripple cycles of a preset number to obtain a total capacitance; using the ratio of the total capacitance to a preset number as the average capacitance value, and determining the average capacitance value as the predicted lifespan.

[0013] The process includes, before determining the maximum voltage fluctuation difference of the bus voltage corresponding to the bus capacitor and the average output power within one ripple cycle, the following steps: determining the input power based on the input voltage and input current of the input power supply corresponding to the bus capacitor; and triggering the process of calculating the capacitance value of the bus capacitor in response to detecting that the input power is greater than a preset power value and the number of detections is greater than or equal to a preset number.

[0014] The step of determining the predicted life value of the bus capacitor by detecting multiple capacitance values ​​obtained through multiple ripple cycles includes: in response to detecting that the predicted life value is less than or equal to a preset capacitance threshold, outputting a bus capacitor life warning message.

[0015] To solve the above-mentioned technical problems, the second technical solution adopted in this application is to provide a power supply device, which includes a power factor correction circuit, an input power supply, a rectifier bridge, a boost unit, a bus capacitor, and a load; wherein, the power supply device predicts the service life of the bus capacitor using the bus capacitor life prediction method described above.

[0016] To solve the above-mentioned technical problems, the third technical solution adopted in this application is to provide an electronic device, including: a memory for storing program data, wherein when the program data is executed, the steps in the bus capacitor life prediction method described above are implemented; and a processor for executing the program data stored in the memory to implement the steps in the bus capacitor life prediction method described above.

[0017] To solve the above-mentioned technical problems, the fourth technical solution adopted in this application is to provide a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it implements the steps in the bus capacitor life prediction method as described in any of the above claims.

[0018] The beneficial effects of this application are as follows: Unlike related technologies, this application provides a method for predicting the lifespan of a bus capacitor, a power supply device, an electronic device, and a storage medium. By determining the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculating the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and average output power, the detection difficulty can be reduced and the real-time performance of the detection can be improved. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from detection over multiple ripple cycles, random error interference can be reduced, thereby improving detection accuracy and, consequently, the prediction accuracy of the bus capacitor's lifespan. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a topology diagram of one embodiment of the power factor correction circuit of this application;

[0021] Figure 2 This is a flowchart illustrating the first embodiment of the bus capacitor life prediction method of this application;

[0022] Figure 3 This is a flowchart illustrating the second embodiment of the bus capacitor life prediction method of this application;

[0023] Figure 4 This is a flowchart illustrating the third embodiment of the bus capacitor life prediction method of this application;

[0024] Figure 5 This is a flowchart of the application scenario of the bus capacitor life prediction method of this application;

[0025] Figure 6 This is a schematic diagram of the structure of one embodiment of the electronic device of this application;

[0026] Figure 7 This is a schematic diagram of one embodiment of the computer-readable storage medium of this application. Detailed Implementation

[0027] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0028] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to limit the application. The singular forms “a,” “said,” and “the” used in the embodiments of this application and the appended claims are also intended to include the plural forms, unless otherwise clearly indicated above. “Multiple” generally includes at least two, but does not exclude the inclusion of at least one.

[0029] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0030] It should be understood that the terms "comprising," "including," or any other variations used herein are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0031] To meet current harmonic requirements, ATX power supplies typically require a PFC (Power Factor Correction) circuit. The bus capacitors in an ATX power supply play a crucial role in stabilizing the DC bus voltage within the PFC circuit. ATX power supplies usually use aluminum electrolytic capacitors, which are consumable components. As the operating time of an aluminum electrolytic capacitor increases, its electrolyte level decreases, gradually reducing its lifespan until it eventually fails. When an aluminum electrolytic capacitor reaches the end of its lifespan, it often leaks, explodes, or even catches fire, posing a significant hazard to equipment safety, production safety, and personal safety.

[0032] In related technologies, in order to improve the reliability and safety of equipment, the bus capacitors of ATX power supplies are regularly inspected. The inspection method is to open the equipment casing and perform offline testing on the bus capacitors of the ATX power supply.

[0033] However, the above methods are relatively complex to operate, cannot effectively detect bus capacitors online, have poor real-time performance, and cannot accurately predict the lifespan of bus capacitors.

[0034] Based on the above, this application provides a method for predicting the lifespan of bus capacitors, a power supply device, an electronic device, and a storage medium, which can solve the problem that related technologies cannot improve the prediction accuracy of the lifespan of bus capacitors while reducing the difficulty of detection.

[0035] The bus capacitor life prediction method, power supply equipment, electronic equipment and storage medium disclosed in this application can be used in computers and related electronic systems.

[0036] The bus capacitor life prediction method of this application is applied to the power supply equipment of electrical equipment such as PCs.

[0037] The power supply device provided in this application includes a PFC circuit; please refer to [link / reference]. Figure 1 , Figure 1 This is a topology diagram of one embodiment of the power factor correction circuit of this application.

[0038] In this embodiment, the power factor correction circuit 100 includes an input power supply 10, a rectifier bridge 20, a boost unit 30, a bus capacitor C, and a load R.

[0039] Among them, the input power supply 10 is an AC input power supply.

[0040] The rectifier bridge 20 includes a first diode D1, a second diode D2, a third diode D3, and a fourth diode D4. The output terminal of the first diode D1 is connected to the output terminal of the third diode D3 to form the output terminal of the rectifier bridge 20. The output terminal of the second diode D2 is connected to the input terminal of the first diode D1, and the output terminal of the fourth diode D4 is connected to the input terminal of the third diode D3 to form the input terminal of the rectifier bridge 20. The input terminals of the second diode D2 and the fourth diode D4 are grounded.

[0041] The boost unit 30 includes a boost inductor L, a freewheeling diode D5, and a boost switch Q. The first terminal of the boost inductor L is connected to the output terminal of the rectifier bridge 20. The input terminal of the freewheeling diode D5 is connected to the second terminal of the boost inductor L, and the output terminal of the freewheeling diode D5 is connected to the load R. The first terminal of the bus capacitor C is connected to the output terminal of the freewheeling diode D5, and the second terminal of the bus capacitor C is grounded. The first terminal of the boost switch Q is connected to the second terminal of the boost inductor L, and the second terminal of the boost switch Q is grounded. The control terminal of the boost switch Q is used to receive control signals to enable or disable the boost switch.

[0042] In some implementations, the boost switch Q is a MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor), and its control terminal is connected to an MCU (Microcontroller Unit) to receive control signals sent by the MCU. If the control signal is a high-level signal, the boost switch Q is turned on; if the control signal is a low-level signal, the boost switch Q is turned off.

[0043] The bus capacitor lifetime prediction method of this application requires real-time sampling during the operation of the power factor correction circuit 100. Specifically, real-time sampling is performed at the output of the rectifier bridge 20 to obtain the input voltage V of the input power supply 10. in The inductor current is sampled in real time at the boost inductor L and used as the input current I of the input power supply 10. in The output of the freewheeling diode D5 is sampled in real time to obtain the bus voltage V corresponding to the bus capacitor C. out .

[0044] The power supply equipment of this application predicts the service life of the bus capacitor C using a bus capacitor life prediction method.

[0045] Please see Figure 2 , Figure 2 This is a flowchart illustrating the first embodiment of the bus capacitor lifetime prediction method of this application. In this embodiment, the bus capacitor lifetime prediction method includes:

[0046] S11: Determine the maximum voltage fluctuation difference of the bus voltage corresponding to the bus capacitor and the average output power within one ripple cycle.

[0047] In this embodiment, the bus capacitor is an aluminum electrolytic capacitor. As the working time of the aluminum electrolytic capacitor continues to increase, its electrolyte will decrease continuously, and the lifespan of the aluminum electrolytic capacitor will gradually decline.

[0048] In this embodiment, the bus voltage is the steady-state voltage value of the DC bus in the power supply system. It is usually the main supply voltage after rectification and filtering, and is the reference voltage for the operation of the power supply. Ideally, it should be a stable value, but in reality, there are slight fluctuations (i.e., ripple voltage).

[0049] Ripple voltage is an AC fluctuation component superimposed on the bus voltage, caused by switching operations, load changes, or the charging and discharging of bus capacitors. It is a periodic fluctuation on the bus voltage. The amplitude of ripple voltage is typically 0.1% to 5% of the bus voltage, and its frequency is related to the switching frequency of the input power supply or its harmonics.

[0050] In this embodiment, the ripple period is the period of the ripple voltage. Specifically, the ripple period refers to the time required for the AC fluctuation component superimposed on the bus voltage in the switching power supply to complete one complete oscillation. It refers to the time interval from one peak (or trough) to the next adjacent peak (or trough). It reflects the frequency characteristics of the ripple voltage and is a key parameter for analyzing power supply stability and capacitor performance.

[0051] In this embodiment, the maximum voltage fluctuation difference refers to the maximum ripple amplitude corresponding to the bus voltage within one ripple cycle, that is, the difference between the peak voltage value and the trough voltage value.

[0052] In some implementations, the maximum voltage fluctuation difference is determined by continuously sampling the bus voltage across the bus capacitor and detecting the peak and trough voltage values ​​of the bus voltage using the voltage difference method.

[0053] Among them, the bus voltage is Figure 1 Bus voltage V out .

[0054] One approach is to continuously sample within the ripple period and continuously calculate the difference between the current voltage sample value and the previous voltage sample value, and then determine the direction of signal change through the difference result.

[0055] In this embodiment, since the peak voltage value and the adjacent trough voltage value are separated by half a ripple cycle, the peak voltage value and the trough voltage value can be obtained by continuous sampling within half a ripple cycle. While detecting the peak voltage value and the trough voltage value, the waveform curve corresponding to half a ripple cycle (peak to trough or trough to peak) is integrated to obtain the total output power, and the average output power is calculated based on the total output power.

[0056] Understandably, as the bus capacitor ages, its capacitance value gradually decreases, leading to a gradual increase in ripple voltage. When the capacitance value decreases by 20%, the ripple may increase by more than 50%, which is easy to detect. Therefore, by detecting the difference between the peak and trough voltage values ​​of the ripple voltage, the maximum voltage fluctuation difference can be determined, and the capacitance value decay can be calculated based on the maximum voltage fluctuation difference.

[0057] Understandably, by continuously sampling the bus voltage and associated power data across the bus capacitor, non-invasive real-time online detection of the bus capacitor can be performed without disassembly, thereby reducing detection difficulty and improving real-time performance. Furthermore, by accurately capturing ripple characteristics, highly reliable input can be provided for calculating the capacitance value, thus improving the accuracy of bus capacitor life prediction.

[0058] S12: Determine the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and the average output power.

[0059] In this embodiment, the capacitance value of the bus capacitor is determined based on the maximum voltage fluctuation difference, the average output power, the output voltage frequency corresponding to the bus capacitor, and the rated output voltage value corresponding to the bus capacitor.

[0060] The maximum voltage fluctuation difference and average output power are calculated from the sampling results. The output voltage frequency corresponding to the bus capacitor is the output voltage frequency of the input power supply, and the rated output voltage value corresponding to the bus capacitor is the rated output voltage value of the input power supply.

[0061] In some implementations, a calibration factor is introduced to improve the accuracy of the calculation. In some specific implementations, the calibration factor is the ratio of the rated capacitance to the calibrated capacitance of the bus capacitor.

[0062] The rated capacitance is the nominal capacitance value given by the manufacturer under standard test conditions (such as 25°C, specific frequency and voltage), usually marked on the capacitor case (such as "100μF±20%)", representing the design target value of the capacitor under ideal conditions.

[0063] Among them, the calibrated capacitance value is the capacitance value obtained through actual measurement or calibration, which reflects the true performance under specific operating conditions.

[0064] S13: Determine the predicted lifespan of the bus capacitor by measuring multiple capacitance values ​​obtained from multiple ripple cycles.

[0065] In this embodiment, the predicted lifespan of the bus capacitor is the ratio of the sum of the capacitance values ​​of multiple capacitors to the number of ripple cycles.

[0066] In this embodiment, multiple capacitance values ​​can be obtained by detecting multiple consecutive ripple cycles, or by detecting multiple discrete ripple cycles.

[0067] Understandably, calculating the capacitance value of the bus capacitor multiple times can avoid the random errors of a single measurement and improve the reliability of the prediction. Furthermore, averaging the capacitance values ​​corresponding to multiple ripple cycles can suppress noise interference, making the predicted lifespan of the bus capacitor closer to the actual lifespan value, thereby improving the prediction accuracy and, consequently, the prediction precision of the bus capacitor's lifespan.

[0068] Unlike related technologies, this implementation method determines the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculates the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and average output power. This reduces the detection difficulty and improves the real-time performance of the detection. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from multiple ripple cycles, it reduces random error interference, thereby improving prediction accuracy and ultimately enhancing the prediction precision of the bus capacitor's lifespan.

[0069] Please see Figure 3 , Figure 3 This is a flowchart illustrating a second embodiment of the bus capacitor lifetime prediction method of this application. In this embodiment, the bus capacitor lifetime prediction method includes:

[0070] S21: Determine the trough and peak voltage values ​​of the bus voltage corresponding to the bus capacitor within one ripple cycle.

[0071] In this embodiment, multiple output voltage values ​​corresponding to the bus voltage are continuously acquired at a preset frequency within one ripple cycle, and the currently acquired output voltage value is compared with the previously acquired output voltage value.

[0072] In this embodiment, the difference between the currently acquired output voltage value and the previously acquired output voltage value is calculated in the following manner:

[0073] ΔU=U (n) -U (n-1) (1)

[0074] Among them, U (n) U is the currently acquired output voltage value. (n-1) ΔU is the output voltage value obtained from the previous acquisition, and ΔU is the difference between the currently acquired output voltage value and the previously acquired output voltage value.

[0075] Specifically, a value greater than 0 indicates that the bus voltage is rising and in the charging process; a value less than 0 indicates that the bus voltage is falling and in the discharging process; and a value equal to 0 indicates that the bus voltage is stable and in the plateau region. By continuously calculating ΔU, when ΔU changes from positive to negative, U is recorded. (n-1) This represents the peak voltage value; when ΔU changes from negative to positive, record U. (n-1) This represents the trough voltage value.

[0076] In some implementations, in response to the starting point of the ripple period being a trough, the output voltage value obtained from the first acquisition is determined as the trough voltage value, and when it is detected that the currently acquired output voltage value is less than the previously acquired output voltage value, the previously acquired output voltage value is determined as the peak voltage value.

[0077] In some specific implementations, in response to the starting point of the ripple period being the trough, the output voltage value U obtained from the first acquisition is... (0) It was determined to be the trough voltage value, and U was detected. (n) Less than U (n-1) At that time, U (n-1) Determine the peak voltage value.

[0078] Understandably, if we are concerned with the charging process of the bus capacitor, we can start detecting half a ripple cycle (from trough to peak) from the trough and then determine the complete ripple cycle by the interval between adjacent troughs.

[0079] In other implementations, in response to the start point of the ripple period being the peak, the first acquired output voltage value is determined as the peak voltage value, and when it is detected that the currently acquired output voltage value is greater than the previously acquired output voltage value, the previously acquired output voltage value is determined as the trough voltage value.

[0080] In some specific implementations, in response to the start point of the ripple period being the peak, the output voltage value U obtained from the first acquisition is... (0) It was determined to be the peak voltage value, and U was detected. (n) Greater than U (n-1) At that time, U (n-1) Determine the trough voltage value.

[0081] Understandably, if we are concerned with the discharge process of the bus capacitor, we can start by detecting half a ripple cycle (from peak to trough) from the peak, and then determine the complete ripple cycle by the interval between adjacent peaks.

[0082] S22: Determine the maximum voltage fluctuation difference based on the peak voltage value and the trough voltage value.

[0083] In this embodiment, the maximum voltage fluctuation difference is calculated as follows:

[0084] ΔU max =|U (n-1) -U (0) | (2)

[0085] Wherein, ΔU max U represents the maximum voltage fluctuation difference. (0) U represents the trough voltage value (or peak voltage value). (n-1) is the peak voltage value (or trough voltage value), and || is the absolute value symbol.

[0086] S23: Determine the average output power based on the charging waveform curve corresponding to the peak voltage value from the trough voltage value to the peak voltage value; or, determine the average output power based on the discharging waveform curve corresponding to the peak voltage value from the trough voltage value to the peak voltage value.

[0087] In this embodiment, in response to the trough of the ripple period, the average output power is determined based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value; in response to the peak of the ripple period, the average output power is determined based on the discharging waveform curve corresponding to the peak voltage value to the trough voltage value.

[0088] In some implementations, in response to the trough being the starting point of the ripple period, the number of detections (i.e., the number of sampling points within half a ripple period) corresponding to the voltage trough to the voltage peak is recorded. An integral calculation is then performed based on the charging waveform curve corresponding to the voltage trough to the voltage peak to obtain the total output power corresponding to the charging process. The average output power is then calculated based on the total output power corresponding to the charging process and the number of detections.

[0089] In other implementations, in response to the start point of the ripple period being the peak, the number of detections (i.e., the number of sampling points within half a ripple period) corresponding to the voltage values ​​from the peak to the trough is recorded. An integral calculation is then performed based on the discharge waveform curve corresponding to the voltage values ​​from the peak to the trough to obtain the total output power corresponding to the discharge process. The average output power is then calculated based on the total output power corresponding to the discharge process and the number of detections.

[0090] In this embodiment, the total output power and the average output power are calculated as follows:

[0091]

[0092] Among them, P o_sum The total output power corresponds to the charging or discharging process, and N is the number of sampling points within half a ripple cycle. Let be the average output power corresponding to the charging or discharging process, and i be the i-th sampling point.

[0093] S24: Determine the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference, average output power, output voltage frequency corresponding to the bus capacitor, and rated output voltage value corresponding to the bus capacitor.

[0094] In this embodiment, the capacitance value of the bus capacitor is calculated as follows:

[0095]

[0096] Among them, C ap This is the capacitance value of the bus capacitor. ΔU is the average output power corresponding to the charging or discharging process. max U represents the maximum voltage fluctuation difference. out f is the rated output voltage value corresponding to the bus capacitor. cπ represents the output voltage frequency corresponding to the bus capacitor, and π is the mathematical constant pi.

[0097] In some implementations, a calibration factor is introduced to improve the accuracy of the calculation. In some specific implementations, the calibration factor is the ratio of the rated capacitance to the calibrated capacitance of the bus capacitor.

[0098] Specifically, the corrected bus capacitor value is calculated as follows:

[0099] C ap1 =C ap ×K (6)

[0100] Among them, C ap C is the capacitance value of the bus capacitor. ap1 K represents the corrected capacitance value of the bus capacitor, and K is the calibration coefficient.

[0101] S25: Sum the capacitance values ​​corresponding to multiple ripple cycles of a preset number to obtain the total capacitance.

[0102] In some implementations, the preset quantity is greater than or equal to 10. In some specific implementations, the preset quantity is 12. In other specific implementations, the preset quantity is 15. In still other specific implementations, the preset quantity is 20.

[0103] In this embodiment, the total capacitance is calculated as follows:

[0104]

[0105] Among them, C ap_sum The total capacitance is M, where M is the preset quantity, and C is the total capacitance. ap(i) Let be the capacitance value corresponding to the i-th ripple cycle, where i is the i-th ripple cycle.

[0106] S26: The ratio of the total capacitance to the preset number is used as the average capacitance value, and the average capacitance value is determined as the life prediction value.

[0107] In this embodiment, the predicted lifetime value is calculated in the following manner:

[0108]

[0109] in, C is the predicted lifespan value. ap_sum M represents the total capacitance, and M is the preset quantity.

[0110] Understandably, calculating the capacitance value of the bus capacitor multiple times can avoid the random errors of a single measurement and improve the reliability of the prediction. Furthermore, averaging the capacitance values ​​corresponding to multiple ripple cycles can suppress noise interference, making the predicted lifespan of the bus capacitor closer to the actual lifespan value, thereby improving the prediction accuracy and, consequently, the prediction precision of the bus capacitor's lifespan.

[0111] Unlike related technologies, this implementation method determines the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculates the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and average output power. This reduces the detection difficulty and improves the real-time performance of the detection. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from multiple ripple cycles, it reduces random error interference, thereby improving prediction accuracy and ultimately enhancing the prediction precision of the bus capacitor's lifespan.

[0112] Please see Figure 4 , Figure 4 This is a flowchart illustrating a third embodiment of the bus capacitor lifetime prediction method of this application. In this embodiment, the bus capacitor lifetime prediction method includes:

[0113] S31: Determine the input power based on the input voltage and input current of the input power supply corresponding to the bus capacitor.

[0114] In this embodiment, the input power is determined based on the input voltage and input current of the AC input power supply corresponding to the bus capacitor.

[0115] Wherein, the input voltage is Figure 1 Input voltage V in Input current is Figure 1 Input current I in .

[0116] If the input voltage and input current are sinusoidal, then the effective values ​​of the input voltage and input current are calculated from the peak voltage and peak current, respectively. The peak voltage of the input voltage is the peak voltage value, and the peak current of the input current is the peak current value.

[0117] In this embodiment, the input power is calculated as follows:

[0118] P in =V in_rms *I in_rms (8)

[0119]

[0120] Among them, P in For input power, Vin_rms I is the effective value of the input voltage. in_rms V is the effective value of the input current. in_peak I is the peak voltage of the input voltage. in_peak This is the peak current of the input current.

[0121] S32: In response to the detection that the input power is greater than the preset power value and the number of detections is greater than or equal to the preset number of detections, the process of calculating the capacitance value of the bus capacitor is triggered.

[0122] In this embodiment, the preset power value is obtained by multiplying the rated load capacity of the input power supply by a preset ratio.

[0123] In some implementations, the preset ratio is 50%, which means the preset power value is half of the rated load capacity (i.e., half load).

[0124] In some implementations, the preset number of times is greater than or equal to 10. In some specific implementations, the preset number of times is 12. In other specific implementations, the preset number of times is 15. In still other specific implementations, the preset number of times is 20.

[0125] In some implementations, a process for calculating the capacitance value of the bus capacitor is triggered when the input power is continuously detected to be greater than a preset power value and the number of detections is greater than or equal to a preset number. Here, continuous detection refers to detecting over multiple consecutive input cycles.

[0126] In other implementations, when the cumulative detected input power exceeds a preset power value and the number of detections is greater than or equal to a preset number, a process for calculating the capacitance value of the bus capacitor is triggered. Here, cumulative detection refers to detecting inputs over multiple discrete cycles.

[0127] Understandably, if the input power continues to exceed half load, it may indicate an abnormal increase in load or an increase in internal losses (such as capacitor / inductor aging). Therefore, when the input power continues to exceed half load, a process is triggered to calculate the capacitance value of the bus capacitor, which can more accurately predict the remaining life of the capacitor based on the operating status of the PFC circuit.

[0128] S33: Determine the maximum voltage fluctuation difference of the bus voltage corresponding to the bus capacitor and the average output power within one ripple cycle.

[0129] For details, please refer to the descriptions in S11 and S21 to S23, which will not be repeated here.

[0130] S34: Determine the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and the average output power.

[0131] For details, please refer to the descriptions in S12 and S24, which will not be repeated here.

[0132] S35: Determine the predicted lifespan of the bus capacitor by measuring multiple capacitance values ​​obtained from multiple ripple cycles.

[0133] For details, please refer to the descriptions in S13 and S25-S26, which will not be repeated here.

[0134] S36: In response to detecting that the predicted life value is less than or equal to the preset capacitance threshold, output bus capacitor life warning information.

[0135] In this embodiment, the predicted lifetime value is compared with a preset tolerance threshold to determine whether an early warning is needed.

[0136] In some implementations, in response to detecting that the predicted lifespan value is less than or equal to a preset capacitance threshold, a bus capacitor lifespan warning message is output.

[0137] In other implementations, the device is controlled to operate normally in response to the detection that the predicted lifetime value is greater than a preset tolerance threshold.

[0138] In this embodiment, the preset capacitance threshold is obtained by multiplying the rated capacitance value of the bus capacitor by 80%.

[0139] Understandably, when the predicted lifespan value is detected to be less than or equal to the preset capacitance threshold, the bus capacitor lifespan warning information is output. This can provide an early warning before the bus capacitor fails, reminding users to replace the ATX power supply in time, thereby reducing safety hazards and improving the safety and reliability of electrical equipment.

[0140] Unlike related technologies, this implementation method triggers the calculation of the bus capacitor's capacitance value when the detected input power exceeds a preset power value and the number of detections is greater than or equal to a preset number. This allows for a more accurate prediction of the capacitor's remaining lifespan based on the equipment's operating status. Furthermore, by determining the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculating the bus capacitor's capacitance value based on these values, the detection difficulty is reduced and the real-time performance is improved. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from multiple ripple cycles, random error interference is reduced, thereby improving detection accuracy and, consequently, the prediction accuracy of the bus capacitor's lifespan. Furthermore, by outputting a bus capacitor lifespan warning message when the predicted lifespan value is less than or equal to a preset capacitance threshold, early warnings can be provided before the bus capacitor fails, reducing safety hazards and improving the safety and reliability of electrical equipment.

[0141] Please see Figure 5 , Figure 5This is a flowchart illustrating an application scenario of the bus capacitor life prediction method of this application. In this embodiment, the input power is first determined based on the input voltage and input current of the input power supply corresponding to the bus capacitor. In response to the detection that the input power is greater than a preset power value, and the number of detections is greater than or equal to a preset number, a process for calculating the capacitance value of the bus capacitor is triggered. Next, within one ripple cycle, the trough voltage value and peak voltage value of the bus voltage corresponding to the bus capacitor are determined, and the maximum voltage fluctuation difference is determined based on the peak voltage value and trough voltage value. Then, the average output power is determined based on the charging waveform curve corresponding to the trough voltage value and the peak voltage value, or, based on the discharging waveform curve corresponding to the peak voltage value and the trough voltage value (i.e., the average output power is determined based on the waveform curve corresponding to half a ripple cycle). Next, the capacitance value of the bus capacitor is determined based on the maximum voltage fluctuation difference, the average output power, the output voltage frequency corresponding to the bus capacitor, and the rated output voltage value corresponding to the bus capacitor. Finally, the capacitance values ​​corresponding to multiple ripple cycles of a preset number are summed to obtain the total capacitance. The capacitance values ​​corresponding to multiple ripple cycles of a preset number are summed to obtain the total capacitance. Finally, the predicted lifespan value is compared with a preset capacitance threshold. If the predicted lifespan value is less than or equal to the preset capacitance threshold, a bus capacitor lifespan warning message is output; if the predicted lifespan value is greater than the preset capacitance threshold, the control equipment operates normally.

[0142] Unlike related technologies, this implementation method triggers the calculation of the bus capacitor's capacitance value when the detected input power exceeds a preset power value and the number of detections is greater than or equal to a preset number. This allows for a more accurate prediction of the capacitor's remaining lifespan based on the equipment's operating status. Furthermore, by determining the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculating the bus capacitor's capacitance value based on these values, the detection difficulty is reduced and the real-time performance is improved. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from multiple ripple cycles, random error interference is reduced, thereby improving detection accuracy and, consequently, the prediction accuracy of the bus capacitor's lifespan. Furthermore, by outputting a bus capacitor lifespan warning message when the predicted lifespan value is less than or equal to a preset capacitance threshold, early warnings can be provided before the bus capacitor fails, reducing safety hazards and improving the safety and reliability of electrical equipment.

[0143] Correspondingly, this application provides an electronic device.

[0144] Please see Figure 6 , Figure 6 This is a schematic diagram of one embodiment of the electronic device of this application. For example... Figure 6As shown, in this embodiment, the electronic device 60 includes a memory 61 and a processor 62.

[0145] In this embodiment, memory 61 is used to store program data, which, when executed, implements the steps in the bus capacitor lifetime prediction method described above. Processor 62 is used to execute the program instructions stored in memory 61 to implement the steps in the bus capacitor lifetime prediction method described above.

[0146] Specifically, processor 62 controls itself and memory 61 to implement the steps in the bus capacitor lifetime prediction method described above. Processor 62 can also be referred to as a CPU (Central Processing Unit). Processor 62 may be an integrated circuit chip with signal processing capabilities. Processor 62 can also be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. A general-purpose processor can be a microprocessor or any conventional processor. Furthermore, processor 62 can be implemented using multiple integrated circuit chips.

[0147] Unlike related technologies, this embodiment uses processor 62 to determine the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle, and calculates the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and average output power. This reduces the detection difficulty and improves the real-time performance of the detection. Furthermore, by determining the predicted lifespan value of the bus capacitor using multiple capacitance values ​​obtained from multiple ripple cycles, random error interference can be reduced, thereby improving the prediction accuracy and, consequently, the prediction precision of the bus capacitor's lifespan.

[0148] Correspondingly, this application provides a computer-readable storage medium.

[0149] Please see Figure 7 , Figure 7 This is a schematic diagram of one embodiment of the computer-readable storage medium of this application.

[0150] The computer-readable storage medium 70 includes a computer program 701 stored on it. When executed by the aforementioned processor, the computer program 701 implements the steps in the bus capacitor life prediction method described above. Specifically, if the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium 70. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the related technology, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a computer-readable storage medium 70 and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned computer-readable storage medium 70 includes various media capable of storing program code, such as a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0151] In the several embodiments provided in this application, it should be understood that the disclosed methods and apparatus can be implemented in other ways. For example, the apparatus implementations described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0152] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment, depending on actual needs.

[0153] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0154] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to related technologies, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0155] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A method for predicting the lifespan of bus capacitors, characterized in that, include: Determine the maximum voltage fluctuation difference and average output power of the bus voltage corresponding to the bus capacitor within one ripple cycle. The capacitance value of the bus capacitor is determined based on the maximum voltage fluctuation difference and the average output power. The predicted lifespan of the bus capacitor is determined by measuring multiple capacitance values ​​obtained over multiple ripple cycles.

2. The method for predicting the lifespan of bus capacitors according to claim 1, characterized in that, The steps of determining the maximum voltage fluctuation difference of the bus voltage corresponding to the bus capacitor and the average output power within one ripple cycle include: Within one ripple cycle, determine the trough voltage value and peak voltage value of the bus voltage corresponding to the bus capacitor; The maximum voltage fluctuation difference is determined based on the peak voltage value and the trough voltage value; The average output power is determined based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value; or, the average output power is determined based on the discharging waveform curve corresponding to the peak voltage value to the trough voltage value.

3. The method for predicting the lifespan of bus capacitors according to claim 2, characterized in that, The step of determining the trough voltage value and peak voltage value of the bus voltage corresponding to the bus capacitor within one ripple cycle includes: Within one ripple cycle, multiple output voltage values ​​corresponding to the bus voltage are continuously acquired at a preset frequency, and the currently acquired output voltage value is compared with the previously acquired output voltage value. In response to the fact that the starting point of the ripple period is a trough, the output voltage value obtained in the first acquisition is determined as the trough voltage value, and when it is detected that the output voltage value obtained in the current acquisition is less than the output voltage value obtained in the previous acquisition, the output voltage value obtained in the previous acquisition is determined as the peak voltage value. In response to the fact that the starting point of the ripple period is the peak, the output voltage value obtained in the first acquisition is determined as the peak voltage value, and when it is detected that the output voltage value obtained in the current acquisition is greater than the output voltage value obtained in the previous acquisition, the output voltage value obtained in the previous acquisition is determined as the trough voltage value.

4. The method for predicting the lifespan of bus capacitors according to claim 3, characterized in that, The step of determining the average output power based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value includes: Record the number of detections from the trough voltage value to the peak voltage value, and perform integration calculations based on the charging waveform curve corresponding to the trough voltage value to the peak voltage value to obtain the total output power corresponding to the charging process; The average output power is calculated based on the total output power corresponding to the charging process and the number of detections.

5. The method for predicting the lifespan of bus capacitors according to claim 3, characterized in that, The step of determining the average output power based on the discharge waveform curve corresponding to the peak voltage value to the trough voltage value includes: The number of detections from the peak voltage value to the trough voltage value is recorded, and the total output power corresponding to the discharge process is obtained by integral calculation based on the discharge waveform curve corresponding to the peak voltage value to the trough voltage value. The average output power is calculated based on the total output power corresponding to the discharge process and the number of detections.

6. The method for predicting the lifespan of bus capacitors according to claim 1, characterized in that, The step of determining the capacitance value of the bus capacitor based on the maximum voltage fluctuation difference and the average output power includes: The capacitance value of the bus capacitor is determined based on the maximum voltage fluctuation difference, the average output power, the output voltage frequency corresponding to the bus capacitor, and the rated output voltage value corresponding to the bus capacitor.

7. The method for predicting the lifespan of bus capacitors according to claim 1, characterized in that, The step of determining the predicted lifetime value of the bus capacitor by obtaining multiple capacitance values ​​through multiple ripple cycle detections includes: The capacitance values ​​corresponding to a preset number of ripple cycles are summed to obtain the total capacitance. The ratio of the total capacitance to the preset number is used as the average capacitance value, and the average capacitance value is determined as the predicted lifetime value.

8. The method for predicting the lifespan of bus capacitors according to claim 1, characterized in that, Before the steps of determining the maximum voltage fluctuation difference of the bus voltage corresponding to the bus capacitor and the average output power within one ripple cycle, the following are included: The input power is determined based on the input voltage and input current of the input power supply corresponding to the bus capacitor; In response to the detection that the input power is greater than a preset power value and the number of detections is greater than or equal to a preset number, the process of calculating the capacitance value of the bus capacitor is triggered.

9. The method for predicting the lifespan of bus capacitors according to claim 1, characterized in that, After determining the predicted lifespan value of the bus capacitor by obtaining multiple capacitance values ​​through multiple ripple cycle detections, the method includes: In response to detecting that the predicted lifespan value is less than or equal to a preset capacitance threshold, a bus capacitor lifespan warning message is output.

10. A power supply device, characterized in that, The power supply device includes a power factor correction circuit, which includes an input power supply, a rectifier bridge, a boost unit, a bus capacitor, and a load; wherein, the power supply device predicts the service life of the bus capacitor using the bus capacitor life prediction method as described in any one of claims 1 to 9.

11. An electronic device, characterized in that, include: A memory for storing program data, which, when executed, implements the steps in the bus capacitor lifetime prediction method as described in any one of claims 1 to 9; A processor is configured to execute the program data stored in the memory to implement the steps in the bus capacitor lifetime prediction method as described in any one of claims 1 to 9.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps in the bus capacitor lifetime prediction method as described in any one of claims 1 to 9.

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