Test strip recognition and result interpretation method, system, and medium based on a multi-wavelength light source

Abstract

The application provides a test paper recognition and result interpretation method, system and medium based on a multi-wavelength light source. First, the coordinate positions of a type recognition area, a control line area and a detection line area on the test paper are accurately positioned. Then, the type recognition area is irradiated in a preset sequence, the reflection light ratio and difference of a specific wavelength combination are calculated, and the test paper type is automatically distinguished by comparing with a preset threshold. Then, the control line area is irradiated by a corresponding wavelength light source according to the test paper type, when the reflection light intensity is lower than a preset first reflection light threshold, a multi-wavelength scanning is started to generate a dynamic determination threshold. Finally, the detection line area is detected by a type adaptation wavelength, and the final interpretation result is output by comparing the reflection light intensity with the dynamic threshold. Through the multi-wavelength optical feature recognition and dynamic threshold technology, the application realizes the automatic distinction of the test paper type and the accurate interpretation of the detection result, and improves the adaptability, accuracy and reliability of the detection system.

Description

Technical Field

[0001] This invention relates to the field of medical test strip identification and result interpretation, and more specifically, to a method, system, and medium for test strip identification and result interpretation based on a multi-wavelength light source. Background Technology

[0002] In the field of automated test strip recognition technology for medical testing equipment, achieving automatic and accurate identification and result interpretation of HCG (human chorionic gonadotropin) or LH (luteinizing hormone) test strips is a significant technical challenge. First, existing solutions generally rely on users manually selecting the test strip type, which not only increases operational complexity but also introduces the risk of human error, potentially leading to serious misdiagnosis. Second, traditional identification methods often use a single wavelength light source and fixed thresholds, failing to effectively address optical characteristic variations caused by batch differences in test strips and environmental interference, resulting in a significant decrease in recognition accuracy. Third, existing systems lack a multi-dimensional verification mechanism for the control line status; when the control line response is weak or abnormal, the system often fails to accurately identify test strip failure, directly impacting the reliability of the test results. Finally, existing technologies have poor adaptability to ambient light interference and lack the ability to dynamically adjust detection parameters based on signal quality, leading to unstable performance in complex operating environments.

[0003] Therefore, there is an urgent need for a test strip identification and result interpretation technology based on multi-wavelength light sources to improve the accuracy and reliability of detection. Summary of the Invention

[0004] In view of the above problems, the purpose of this invention is to provide a method, system, and medium for test strip identification and result interpretation based on multi-wavelength light sources. By combining multi-wavelength optical feature recognition with dynamic threshold technology, it achieves automatic differentiation of test strip types and accurate interpretation of detection results, eliminating the risk of misoperation due to manual selection of test strip types. Specifically, firstly, precise mechanical positioning and coordinate calculation ensure the accuracy of the optical detection area, providing a reliable foundation for subsequent optical measurements; secondly, robust optical feature parameters are extracted by calculating the ratio and difference of reflected light from specific wavelength combinations, overcoming the limitations of single-wavelength detection; then, a reliable test strip type discrimination mechanism is constructed through a two-level progressive threshold judgment logic, improving the accuracy of type identification; simultaneously, multi-wavelength spectral scanning and weighted calculation models are used to generate dynamic judgment thresholds adapted to the actual test strip conditions, solving the problem of poor adaptability of fixed thresholds; finally, accurate discrimination of detection results is achieved through type-specific wavelength selection and dynamic threshold comparison, ensuring the accuracy of qualitative interpretation.

[0005] The first aspect of this invention provides a method for test strip identification and result interpretation based on a multi-wavelength light source, the method comprising:

[0006] In response to the test strip insertion signal, determine the coordinate positions of the type identification area, control line area, and detection line area on the test strip;

[0007] Based on the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain the first reflected light ratio value and the first reflected light difference value;

[0008] Based on the first reflected light ratio and the first reflected light difference, the test strip type information is obtained by comparing them with the preset first threshold and the second threshold, respectively.

[0009] Based on the test strip type information, a first wavelength light source is selected to illuminate the control line area to obtain the first reflected light information;

[0010] If the first reflected light information is lower than the preset first reflected light threshold, then a dynamic judgment threshold is obtained based on the reflected light intensity of the control line area under multiple wavelengths.

[0011] Based on the test strip type information, a second wavelength light source is selected to illuminate the detection line area to obtain the second reflected light information;

[0012] By comparing the second reflected light information with the dynamic judgment threshold, the test strip reading result is obtained.

[0013] In this solution, the step of determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes:

[0014] In response to the test strip insertion trigger signal detected by the photoelectric sensor, the stepper motor is controlled to start;

[0015] The stepper motor is controlled according to the preset number of traction steps to pull the test strip to the optical detection platform;

[0016] The reference position coordinates of the test strip on the optical detection platform are obtained through a position sensor;

[0017] Based on the reference position coordinates, and according to the preset test strip area layout data, the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area are calculated.

[0018] Store the coordinate information of each region into the coordinate register and output the coordinate ready signal.

[0019] In this solution, the step of illuminating the type identification area according to the coordinate position and the first light source sequence to obtain the first reflected light ratio and the first reflected light difference value specifically includes:

[0020] Control the multi-wavelength light source to sequentially illuminate the type identification area according to a preset first light source sequence;

[0021] When each wavelength of light source illuminates the object, the photoelectric sensor is synchronously controlled to collect the corresponding reflected light intensity value;

[0022] The collected reflected light intensity values ​​are sequentially stored into the reflected light intensity register;

[0023] The first reflected light ratio value is obtained by calculating the ratio of the reflected intensity values ​​of the first identification wavelength light and the second identification wavelength light.

[0024] The first reflected light difference value is obtained by calculating the difference between the reflection intensity values ​​of the third and fourth identification wavelengths.

[0025] In this scheme, the step of comparing the first reflected light ratio and the first reflected light difference with a preset first threshold and a second threshold respectively to obtain the test strip type information specifically includes:

[0026] Determine whether the first reflected light ratio is lower than the first threshold;

[0027] If so, the test strip is deemed invalid;

[0028] If not, then determine whether the first reflected light difference value is lower than the second threshold;

[0029] If so, then the test strip type information is determined to be an HCG test strip;

[0030] If not, the test strip type information is determined to be LH test strip.

[0031] In this scheme, the dynamic determination threshold obtained based on the reflected light intensity of the control line region at multiple wavelengths specifically includes:

[0032] The multi-wavelength light source is controlled to illuminate the control line area sequentially according to a preset second light source sequence, and the intensity of reflected light at each wavelength is collected.

[0033] Select the corresponding weighting factor based on the test strip type information;

[0034] The collected multi-wavelength reflected light intensity values ​​are input into a preset dynamic threshold weighted calculation model;

[0035] Based on the calculation results of the dynamic threshold weighted calculation model, the dynamic judgment threshold is obtained.

[0036] In this scheme, the step of comparing the second reflected light information with the dynamic judgment threshold to obtain the test strip reading result specifically includes:

[0037] The detection line area is illuminated by a second wavelength light source, and the reflected light is collected to obtain the second reflected light information.

[0038] Determine whether the second reflected light information is lower than the dynamic determination threshold;

[0039] If yes, output a negative result.

[0040] If not, output a positive result;

[0041] The interpretation information is combined with the test strip type information to generate the test strip interpretation result.

[0042] A second aspect of the present invention provides a test strip identification and result interpretation system based on a multi-wavelength light source, including a test strip identification and result interpretation method program based on a multi-wavelength light source. When the test strip identification and result interpretation method program based on a multi-wavelength light source is executed by the processor, it performs the following steps:

[0043] In response to the test strip insertion signal, determine the coordinate positions of the type identification area, control line area, and detection line area on the test strip;

[0044] Based on the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain the first reflected light ratio value and the first reflected light difference value;

[0045] Based on the first reflected light ratio and the first reflected light difference, the test strip type information is obtained by comparing them with the preset first threshold and the second threshold, respectively.

[0046] Based on the test strip type information, a first wavelength light source is selected to illuminate the control line area to obtain the first reflected light information;

[0047] If the first reflected light information is lower than the preset first reflected light threshold, then a dynamic judgment threshold is obtained based on the reflected light intensity of the control line area under multiple wavelengths.

[0048] Based on the test strip type information, a second wavelength light source is selected to illuminate the detection line area to obtain the second reflected light information;

[0049] By comparing the second reflected light information with the dynamic judgment threshold, the test strip reading result is obtained.

[0050] In this solution, the step of determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes:

[0051] In response to the test strip insertion trigger signal detected by the photoelectric sensor, the stepper motor is controlled to start;

[0052] The stepper motor is controlled according to the preset number of traction steps to pull the test strip to the optical detection platform;

[0053] The reference position coordinates of the test strip on the optical detection platform are obtained through a position sensor;

[0054] Based on the reference position coordinates, and according to the preset test strip area layout data, the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area are calculated.

[0055] Store the coordinate information of each region into the coordinate register and output the coordinate ready signal.

[0056] In this solution, the step of illuminating the type identification area according to the coordinate position and the first light source sequence to obtain the first reflected light ratio and the first reflected light difference value specifically includes:

[0057] Control the multi-wavelength light source to sequentially illuminate the type identification area according to a preset first light source sequence;

[0058] When each wavelength of light source illuminates the object, the photoelectric sensor is synchronously controlled to collect the corresponding reflected light intensity value;

[0059] The collected reflected light intensity values ​​are sequentially stored into the reflected light intensity register;

[0060] The first reflected light ratio value is obtained by calculating the ratio of the reflected intensity values ​​of the first identification wavelength light and the second identification wavelength light.

[0061] The first reflected light difference value is obtained by calculating the difference between the reflection intensity values ​​of the third and fourth identification wavelengths.

[0062] A third aspect of the present invention provides a computer-readable storage medium comprising a test strip identification and result interpretation method program based on a multi-wavelength light source, wherein when the test strip identification and result interpretation method program based on a multi-wavelength light source is executed by a processor, the steps of the test strip identification and result interpretation method based on a multi-wavelength light source as described in any of the preceding claims are implemented.

[0063] This invention provides a method, system, and medium for test strip identification and result interpretation based on multi-wavelength light sources. First, the coordinates of the type identification area, control line area, and detection line area on the test strip are precisely located. Then, the type identification area is illuminated according to a preset sequence. By calculating the ratio and difference of reflected light from specific wavelength combinations and comparing it with a preset threshold, the test strip type is automatically determined. Next, the control line area is illuminated with a corresponding wavelength light source based on the test strip type. When the reflected light intensity is lower than a preset first reflected light threshold, multi-wavelength scanning is initiated to generate a dynamic judgment threshold. Finally, the detection line area is detected using a type-adaptive wavelength, and the final interpretation result is output by comparing the reflected light intensity with the dynamic threshold. This invention achieves automatic differentiation of test strip types and accurate interpretation of detection results through multi-wavelength optical feature recognition and dynamic threshold technology, improving the adaptability, accuracy, and reliability of the detection system. Attached Figure Description

[0064] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope.

[0065] Figure 1 A flowchart of a test strip identification and result interpretation method based on a multi-wavelength light source according to the present invention is shown;

[0066] Figure 2 This invention provides a flowchart of a test strip partition coordinate positioning method according to an embodiment of the invention.

[0067] Figure 3 This invention provides a flowchart for calculating the reflected light ratio and difference according to an embodiment of the invention.

[0068] Figure 4 The diagram shows a block diagram of a test strip identification and result interpretation system based on a multi-wavelength light source according to the present invention. Detailed Implementation

[0069] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0070] Unless otherwise defined, all terms (including technical and scientific terms) used in embodiments of this invention shall have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in a common dictionary shall be interpreted as having a meaning consistent with their meaning in the context of the relevant art, and not as being interpreted in an idealized or highly formalized sense, unless expressly defined in this embodiment of the invention.

[0071] The terms "first," "second," and similar words used in the embodiments of this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "an," "a," or "the" do not indicate a quantity limitation, but rather indicate the presence of at least one. Similarly, terms such as "including" or "comprising" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The steps preceding or following the steps in the method of the embodiments of this invention are not necessarily performed precisely in sequence. Instead, various steps can be processed in reverse order or simultaneously. Furthermore, other operations can be added to these processes, or one or more steps can be removed from these processes.

[0072] In addition, the functional modules in the various embodiments of the present invention can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0073] Figure 1 The flowchart of a test strip identification and result interpretation method based on a multi-wavelength light source according to the present invention is shown.

[0074] like Figure 1 As shown, the first aspect of this invention discloses a method for test strip identification and result interpretation based on a multi-wavelength light source, the method comprising:

[0075] S102, in response to the test strip insertion signal, determines the coordinate positions of the type identification area, control line area and detection line area on the test strip;

[0076] S104, according to the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain the first reflected light ratio value and the first reflected light difference value;

[0077] S106, Based on the first reflected light ratio value and the first reflected light difference value, compare them with the preset first threshold and the second threshold respectively to obtain the test strip type information;

[0078] S108, based on the test strip type information, select a first wavelength light source to illuminate the control line area to obtain first reflected light information;

[0079] S110, if the first reflected light information is lower than the preset first reflected light threshold, then a dynamic determination threshold is obtained based on the reflected light intensity of the control line area under multiple wavelengths.

[0080] S112, based on the test strip type information, select a second wavelength light source to illuminate the detection line area to obtain second reflected light information;

[0081] S114, compare the second reflected light information with the dynamic judgment threshold to obtain the test strip reading result.

[0082] It should be noted that the first reflected light ratio is the ratio of the reflected light intensity obtained when the first identification wavelength light (such as blue light) and the second identification wavelength light (such as green light) illuminate the type identification area; the first reflected light difference is the ratio of the reflected light intensity obtained when the third identification wavelength light (red light) and the fourth identification wavelength light (such as infrared red light) illuminate the type identification area; the first wavelength light source is the sensitive wavelength light source corresponding to the control line area of ​​the test strip type; the first reflected light information is the reflected light intensity of the control line area relative to the first wavelength light source; the second wavelength light source is the sensitive wavelength light source corresponding to the detection line area of ​​the test strip type; and the second reflected light information is the reflected light intensity of the detection line area relative to the second wavelength light source.

[0083] In this embodiment, firstly, the coordinates of the type identification area, control line area, and detection line area on the test strip are precisely located. Secondly, the type identification area is illuminated according to a preset first light source sequence. The first reflected light ratio is obtained by calculating the ratio of the reflected intensity of the first identification wavelength light to that of the second identification wavelength light, and the first reflected light difference is obtained by calculating the difference between the reflected intensity of the third identification wavelength light and that of the fourth identification wavelength light. Then, these two key optical parameters are compared with preset first and second thresholds, respectively, to intelligently determine the test strip type information. After determining the test strip type, the corresponding first wavelength light source is selected to illuminate the control line area according to the type information to obtain the first reflected light information. If the first reflected light information is lower than the preset first reflected light threshold, a judgment threshold is dynamically generated based on the reflected light intensity of the control line area at multiple wavelengths according to a preset weighted algorithm. Finally, the second wavelength light source is selected to illuminate the detection line area according to the test strip type information to obtain the second reflected light information; then, by comparing the second reflected light information with the dynamic judgment threshold, a complete judgment result including the test strip type and the positive / negative status is finally output.

[0084] This embodiment achieves automatic and accurate identification of HCG and LH test strips by comprehensively utilizing multi-wavelength optical features, eliminating the error risk associated with manual selection of test strip types in traditional methods. Simultaneously, it replaces fixed thresholds with dynamically generated judgment thresholds, thereby improving adaptability to different batches of test strips and complex environmental conditions. Furthermore, it organically integrates type identification and result interpretation onto the same optical detection platform, simplifying the hardware structure while ensuring the efficiency and consistency of the detection process.

[0085] Figure 2 The diagram illustrates a flowchart of the positioning of test strip partition coordinates according to an embodiment of the present invention.

[0086] According to embodiments of the present invention, such as Figure 2 As shown, the step of determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes:

[0087] S202, in response to the test strip insertion trigger signal detected by the photoelectric sensor, controls the stepper motor to start;

[0088] S204, controls the stepper motor according to the preset number of traction steps to pull the test strip to the optical detection platform;

[0089] S206, The reference position coordinates of the test strip on the optical detection platform are obtained through the position sensor;

[0090] S208, Based on the reference position coordinates, and according to the preset test strip area layout data, calculate the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area;

[0091] S210 stores the coordinate information of each region into the coordinate register and outputs the coordinate ready signal.

[0092] It should be noted that in this embodiment, when the photoelectric sensor detects the test strip insertion trigger signal, it immediately controls the stepper motor to start running. According to the pre-set traction step parameters, the stepper motor drives the test strip to precisely pull it to the designated detection position on the optical detection platform. Then, a high-precision position sensor acquires the reference position coordinates of the test strip on the platform; these reference position coordinates serve as the reference origin for all subsequent area calculations. Based on these reference coordinates, and combined with pre-stored test strip area layout data, including the offset and size information of each area relative to the reference point, a coordinate transformation algorithm calculates the precise center coordinates of the type identification area, control line area, and detection line area. Finally, the coordinate information of all areas is stored in a dedicated coordinate register, and a coordinate ready signal is output to trigger the subsequent optical detection process.

[0093] This embodiment achieves highly accurate test strip positioning through the coordinated control of a stepper motor and a position sensor, laying a solid foundation for the accuracy of subsequent optical detection. A coordinate register stores the region's position information, enabling rapid response and execution of multi-region sequential detection, thus improving overall detection efficiency. The standardized positioning process provided in this embodiment effectively overcomes the problem of detection area offset caused by test strip insertion deviation, ensuring that the optical probe is always aligned with the correct detection area, thereby ensuring the consistency and reliability of measurement results.

[0094] Figure 3 A flowchart illustrating the calculation of the reflected light ratio and difference provided by an embodiment of the present invention is shown.

[0095] According to embodiments of the present invention, such as Figure 3As shown, the step of illuminating the type identification area according to the coordinate position and the first light source sequence to obtain the first reflected light ratio and the first reflected light difference value specifically includes:

[0096] S302, control the multi-wavelength light source to illuminate the type identification area sequentially according to the preset first light source sequence;

[0097] S304, when each wavelength of light source is irradiated, the photoelectric sensor is synchronously controlled to collect the corresponding reflected light intensity value;

[0098] S306, the collected reflected light intensity values ​​are sequentially stored into the reflected light intensity register;

[0099] S308, calculate the ratio of the first reflected light ratio based on the reflection intensity value of the first identification wavelength light and the reflection intensity value of the second identification wavelength light;

[0100] S310, calculate the difference between the reflection intensity values ​​of the third identification wavelength light and the fourth identification wavelength light to obtain the first reflected light difference value.

[0101] It should be noted that in this embodiment, firstly, the multi-wavelength light source module is controlled to sequentially illuminate the type identification area of ​​the test strip according to a preset first light source sequence; the light source sequence specifies the activation order and duration of different wavelength light sources. During the illumination of each wavelength light source, the photoelectric sensor is synchronously controlled to collect the corresponding analog signal of reflected light intensity and convert it into a digital quantity through an analog-to-digital converter. These digitized reflected light intensity values ​​are sequentially stored in a dedicated reflected light intensity register, forming a complete optical feature dataset. Then, the processing unit reads the reflected intensity values ​​of the first and second identification wavelength light from the register and obtains the first reflected light ratio value through division; simultaneously, it reads the reflected intensity values ​​of the third and fourth identification wavelength light and obtains the first reflected light difference value through subtraction; the aforementioned reflected light ratio and reflected light difference value serve as optical parameters, providing key feature inputs for subsequent test strip type identification.

[0102] This embodiment combines ratio and difference calculation methods to eliminate the interference of uneven ambient lighting and differences in test strip background color on measurement results, extracting stable optical feature parameters. A control strategy of sequential illumination and synchronous acquisition ensures the temporal and spatial consistency of multi-wavelength optical data, providing a high-quality data foundation for accurate identification. Simultaneously, the optical parameter calculation process is standardized and modularized, allowing for rapid adaptation to the identification needs of different types of test strips; identification capabilities can be expanded simply by adjusting the light source sequence and calculation logic.

[0103] According to an embodiment of the present invention, the step of comparing the first reflected light ratio and the first reflected light difference with a preset first threshold and a second threshold respectively to obtain test strip type information specifically includes:

[0104] Determine whether the first reflected light ratio is lower than the first threshold;

[0105] If so, the test strip is deemed invalid;

[0106] If not, then determine whether the first reflected light difference value is lower than the second threshold;

[0107] If so, then the test strip type information is determined to be an HCG test strip;

[0108] If not, the test strip type information is determined to be LH test strip.

[0109] It should be noted that in this embodiment, the process first determines whether the first reflected light ratio is lower than a preset first threshold. If so, the test strip is deemed invalid and the process terminates. This step serves as the primary screening condition for test strip validity. If the first reflected light ratio is higher than the first threshold, the process continues to determine whether the first reflected light difference is lower than a preset second threshold. If the first reflected light difference is lower than the second threshold, the test strip type is determined to be an HCG test strip; if the first reflected light difference is higher than the second threshold, the test strip type is determined to be an LH test strip. This embodiment forms a two-level progressive decision logic for the entire judgment process. The final output test strip type information will directly determine the wavelength selection scheme and parameter calculation strategy used in the subsequent control line area and detection line area detection.

[0110] This embodiment employs a two-level threshold judgment mechanism to ensure the reliability of test strip validity testing while achieving high-precision differentiation between HCG and LH test strips, thereby reducing the risk of misclassification. The type identification process is designed with a clear binary decision tree structure, resulting in clear judgment logic and efficient execution. Furthermore, this embodiment utilizes the complementarity of multi-wavelength optical features, using a ratio parameter to verify test strip quality and a difference parameter to distinguish test strip types, forming a complete and efficient test strip type identification process.

[0111] According to an embodiment of the present invention, obtaining the dynamic determination threshold based on the reflected light intensity of the control line region at multiple wavelengths specifically includes:

[0112] The multi-wavelength light source is controlled to illuminate the control line area sequentially according to a preset second light source sequence, and the intensity of reflected light at each wavelength is collected.

[0113] Select the corresponding weighting factor based on the test strip type information;

[0114] The collected multi-wavelength reflected light intensity values ​​are input into a preset dynamic threshold weighted calculation model;

[0115] Based on the calculation results of the dynamic threshold weighted calculation model, the dynamic judgment threshold is obtained.

[0116] It should be noted that in this embodiment, when the first reflected light information of the control line area is lower than a preset threshold, the multi-wavelength spectral scanning process is automatically initiated. Multi-wavelength light sources are controlled to sequentially illuminate the control line area according to a preset second light source sequence, and the reflected light intensity values ​​at each wavelength are simultaneously collected to form complete spectral response data. Then, based on the identified test strip type information, a corresponding weighting factor combination is selected from a preset parameter library, where the weighting factor reflects the degree of influence of different wavelengths on the interpretation results of a specific test strip type. The collected multi-wavelength reflected light intensity values ​​and the corresponding weighting factors are input into a preset dynamic threshold weighting calculation model. Through a comprehensive calculation of weighted summation and nonlinear transformation, a dynamic judgment threshold matching the current actual reaction state of the test strip and environmental conditions is generated. Finally, the dynamic judgment threshold is output as a benchmark reference value for subsequent interpretation of the test line area results, replacing the traditional fixed threshold.

[0117] This embodiment utilizes a comprehensive weighted calculation of multi-wavelength spectral information to enable the judgment threshold to adapt to differences in manufacturing processes and complex environmental conditions between different batches of test strips, thereby improving the accuracy and consistency of the interpretation results. Specifically, the introduction of a weighting factor specific to the test strip type makes the threshold generation process targeted, fully reflecting the specific reaction characteristics of HCG and LH test strips at different wavelengths. Furthermore, the dynamic threshold mechanism effectively overcomes the interpretation deviation problems caused by factors such as test strip aging and changes in environmental temperature and humidity in the traditional fixed threshold method, thus improving the reliability and applicability of the test strip detection.

[0118] According to an embodiment of the present invention, the step of comparing the second reflected light information with the dynamic determination threshold to obtain the test strip reading result specifically includes:

[0119] The detection line area is illuminated by a second wavelength light source, and the reflected light is collected to obtain the second reflected light information.

[0120] Determine whether the second reflected light information is lower than the dynamic determination threshold;

[0121] If yes, output a negative result.

[0122] If not, output a positive result;

[0123] The interpretation information is combined with the test strip type information to generate the test strip interpretation result.

[0124] It should be noted that, in this embodiment, the detection line area is illuminated by the corresponding second wavelength light source based on the determined test strip type information, and a quantitative second reflected light information is obtained by collecting the reflected light signal through a photoelectric sensor. The second reflected light information is compared with a dynamic judgment threshold to determine whether it is lower than the dynamic threshold. If the second reflected light information is lower than the dynamic judgment threshold, a negative interpretation is output, indicating that the concentration of the target substance in the test sample has not reached the detection limit. If the second reflected light information is higher than or equal to the dynamic judgment threshold, a positive interpretation is output, indicating that there is a sufficient concentration of the target substance in the test sample. Finally, the negative / positive interpretation information is logically combined with the test strip type information to generate a complete interpretation result containing the test strip type and the test result, and output to the display module or communication interface.

[0125] This embodiment combines type-specific wavelength selection with dynamic threshold comparison to achieve accurate differentiation of test results from different test strips, avoiding false positives or false negatives caused by wavelength mismatch or unreasonable thresholds. A unified interpretation logic framework is used to process the output results of different types of test strips, ensuring both architectural simplicity and consistency of interpretation standards. Furthermore, the final combined output includes test strip type identification and detection judgment information, facilitating user understanding and use.

[0126] It is worth mentioning that, prior to performing the irradiation operation, the following also applies:

[0127] Real-time acquisition of ambient light intensity inside the optical detection chamber;

[0128] Determine whether the ambient light intensity exceeds a preset ambient light intensity safety threshold;

[0129] If so, output a light leakage abnormality alarm;

[0130] If not, determine whether the ambient light intensity exceeds the preset ambient light intensity stability threshold.

[0131] If so, then activate the light source compensation mechanism;

[0132] Control the multi-wavelength light source to emit test light intensity sequentially according to the compensation sequence, and collect the reflection intensity of each wavelength under the influence of ambient light;

[0133] An ambient light compensation coefficient mapping table is established based on the deviation of reflection intensity at each wavelength.

[0134] The reflected light intensity in the detection is compensated in real time according to the compensation coefficient mapping table.

[0135] It should be noted that, in this embodiment, before formal optical testing, ambient light intensity data within the optical testing chamber is first collected in real time using an ambient light sensor. The system determines whether the ambient light intensity exceeds a preset ambient light intensity safety threshold. If it does, a light leakage alarm is immediately output and the testing process is paused. If it does not exceed the safety threshold but is higher than a preset ambient light intensity stability threshold, a light source compensation mechanism is activated. Under this compensation mechanism, multiple wavelength light sources are controlled to emit test light intensities sequentially according to a specific compensation sequence, and the reflection intensity data of each wavelength under the influence of ambient light is collected. Based on the deviation of the reflection intensity of each wavelength from the standard value, an ambient light compensation coefficient mapping table is established using an interpolation algorithm. During subsequent formal testing, the real-time collected reflected light intensity is dynamically corrected according to this compensation coefficient mapping table to eliminate the interference of ambient light fluctuations on the measurement results.

[0136] This embodiment ensures both the safety of the optical measurement environment and the stability of the detection conditions through real-time monitoring and a graded response mechanism for ambient light intensity. The established multi-wavelength compensation coefficient mapping table can accurately compensate for the optical characteristics of different wavelengths, thereby overcoming the influence of ambient light differences on light sources of different wavelengths. The light intensity compensation mechanism provided in this embodiment maintains high measurement accuracy even under non-ideal lighting conditions, thus broadening the applicable environment range and reliability of the equipment.

[0137] It is worth mentioning that it also includes:

[0138] After determining that the first reflected light information is lower than the preset first reflected light threshold, control at least three different wavelength light sources to sequentially illuminate the control line area;

[0139] The intensity values ​​of reflected light at each wavelength were collected, and the characteristics of the reflected light spectrum were extracted.

[0140] The reflection spectral characteristics are matched with a preset standard control line spectral template to obtain the matching degree;

[0141] If the matching degree is lower than the preset matching threshold, a retest mechanism is initiated;

[0142] If the matching degree is still lower than the preset matching threshold after retesting, the test strip is deemed invalid.

[0143] It should be noted that, in this embodiment, when the first reflected light information of the control line area is lower than a preset threshold, before generating a dynamic judgment threshold, at least three different wavelength light sources are sequentially used to illuminate the control line area to collect high-resolution spectral reflectance data. Key spectral feature parameters are extracted from these multi-wavelength reflectance data, including but not limited to characteristic peak positions, spectral shapes, and relative intensity distributions. Then, the extracted reflectance spectral features are compared with a preset standard control line spectral template to calculate the matching degree, and a quantified matching degree score is obtained through correlation analysis or pattern recognition algorithms. If the matching degree score is lower than a preset matching threshold, a retesting mechanism is automatically initiated, and the spectral acquisition and matching calculation process is re-executed. If the matching degree is still lower than the preset threshold after retesting, the test strip is ultimately determined to be invalid, and the detection process is terminated.

[0144] This embodiment provides a highly reliable method for verifying the validity of test strips through multi-wavelength spectral feature matching analysis, effectively identifying test strips that, although the control lines are visible, are actually ineffective or deteriorated. A retesting mechanism is introduced to provide a second verification opportunity for test strips in a critical state, avoiding misjudgments caused by fluctuations in a single measurement. The failure verification mechanism provided in this embodiment, together with the initial validity judgment, forms a dual guarantee, thereby improving the security of the entire detection system and the reliability of the results.

[0145] It is worth mentioning that it also includes:

[0146] Real-time monitoring of the signal-to-noise ratio of reflected light intensity at each wavelength;

[0147] Based on the signal-to-noise ratio, the wavelength combination used in subsequent detection is dynamically adjusted;

[0148] Based on a preset weighting factor adjustment algorithm, the weighting factor of the dynamic judgment threshold is adjusted according to the test strip type information and the signal-to-noise ratio.

[0149] It should be noted that in this embodiment, the signal-to-noise ratio (SNR) of the reflected light intensity at each wavelength is monitored in real time during the detection process. The signal quality of each wavelength is evaluated by calculating the ratio of signal intensity to noise fluctuation amplitude. Based on the real-time acquired SNR data, the wavelength combination used in subsequent detections is dynamically adjusted; wavelengths with high SNR are preferentially selected for calculation, while wavelengths with excessively low SNR are reduced or eliminated. Furthermore, based on a preset weighting factor adjustment algorithm, combined with test strip type information and real-time SNR, the weighting factors of each wavelength in the dynamic judgment threshold calculation are dynamically optimized, so that wavelengths with good signal quality have a higher weight in the threshold calculation. Through this adaptive adjustment mechanism, it is ensured that the detection process always completes test strip identification and result interpretation under the optimal wavelength configuration.

[0150] This embodiment achieves automatic adaptation to different usage environments and test strip conditions through signal-to-noise ratio monitoring and dynamic optimization of wavelength combinations, maintaining optimal detection performance at all times. The adaptive adjustment of the weighting factor ensures that the downstream calculation process fully utilizes high-quality optical signals, effectively suppressing the impact of noise interference on the final result. The self-optimizing wavelength management mechanism provided in this embodiment enhances the level of intelligence and anti-interference capability, maintaining stable and reliable detection accuracy even under complex usage conditions.

[0151] Figure 4 The diagram shows a block diagram of a test strip identification and result interpretation system based on a multi-wavelength light source according to the present invention.

[0152] like Figure 4 As shown, the second aspect of the present invention discloses a test strip identification and result interpretation system 4 based on a multi-wavelength light source, including a memory 41 and a processor 42. The memory includes a test strip identification and result interpretation method program based on a multi-wavelength light source. When the test strip identification and result interpretation method program based on a multi-wavelength light source is executed by the processor, it performs the following steps:

[0153] In response to the test strip insertion signal, determine the coordinate positions of the type identification area, control line area, and detection line area on the test strip;

[0154] Based on the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain the first reflected light ratio value and the first reflected light difference value;

[0155] Based on the first reflected light ratio and the first reflected light difference, the test strip type information is obtained by comparing them with the preset first threshold and the second threshold, respectively.

[0156] Based on the test strip type information, a first wavelength light source is selected to illuminate the control line area to obtain the first reflected light information;

[0157] If the first reflected light information is lower than the preset first reflected light threshold, then a dynamic judgment threshold is obtained based on the reflected light intensity of the control line area under multiple wavelengths.

[0158] Based on the test strip type information, a second wavelength light source is selected to illuminate the detection line area to obtain the second reflected light information;

[0159] By comparing the second reflected light information with the dynamic judgment threshold, the test strip reading result is obtained.

[0160] It should be noted that the first reflected light ratio is the ratio of the reflected light intensity obtained when the first identification wavelength light (such as blue light) and the second identification wavelength light (such as green light) illuminate the type identification area; the first reflected light difference is the ratio of the reflected light intensity obtained when the third identification wavelength light (red light) and the fourth identification wavelength light (such as infrared red light) illuminate the type identification area; the first wavelength light source is the sensitive wavelength light source corresponding to the control line area of ​​the test strip type; the first reflected light information is the reflected light intensity of the control line area relative to the first wavelength light source; the second wavelength light source is the sensitive wavelength light source corresponding to the detection line area of ​​the test strip type; and the second reflected light information is the reflected light intensity of the detection line area relative to the second wavelength light source.

[0161] In this embodiment, firstly, the coordinates of the type identification area, control line area, and detection line area on the test strip are precisely located. Secondly, the type identification area is illuminated according to a preset first light source sequence. The first reflected light ratio is obtained by calculating the ratio of the reflected intensity of the first identification wavelength light to that of the second identification wavelength light, and the first reflected light difference is obtained by calculating the difference between the reflected intensity of the third identification wavelength light and that of the fourth identification wavelength light. Then, these two key optical parameters are compared with preset first and second thresholds, respectively, to intelligently determine the test strip type information. After determining the test strip type, the corresponding first wavelength light source is selected to illuminate the control line area according to the type information to obtain the first reflected light information. If the first reflected light information is lower than the preset first reflected light threshold, a judgment threshold is dynamically generated based on the reflected light intensity of the control line area at multiple wavelengths according to a preset weighted algorithm. Finally, the second wavelength light source is selected to illuminate the detection line area according to the test strip type information to obtain the second reflected light information; then, by comparing the second reflected light information with the dynamic judgment threshold, a complete judgment result including the test strip type and the positive / negative status is finally output.

[0162] This embodiment achieves automatic and accurate identification of HCG and LH test strips by comprehensively utilizing multi-wavelength optical features, eliminating the error risk associated with manual selection of test strip types in traditional methods. Simultaneously, it replaces fixed thresholds with dynamically generated judgment thresholds, thereby improving adaptability to different batches of test strips and complex environmental conditions. Furthermore, it organically integrates type identification and result interpretation onto the same optical detection platform, simplifying the hardware structure while ensuring the efficiency and consistency of the detection process.

[0163] According to an embodiment of the present invention, determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes:

[0164] In response to the test strip insertion trigger signal detected by the photoelectric sensor, the stepper motor is controlled to start;

[0165] The stepper motor is controlled according to the preset number of traction steps to pull the test strip to the optical detection platform;

[0166] The reference position coordinates of the test strip on the optical detection platform are obtained through a position sensor;

[0167] Based on the reference position coordinates, and according to the preset test strip area layout data, the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area are calculated.

[0168] Store the coordinate information of each region into the coordinate register and output the coordinate ready signal.

[0169] It should be noted that in this embodiment, when the photoelectric sensor detects the test strip insertion trigger signal, it immediately controls the stepper motor to start running. According to the pre-set traction step parameters, the stepper motor drives the test strip to precisely pull it to the designated detection position on the optical detection platform. Then, a high-precision position sensor acquires the reference position coordinates of the test strip on the platform; these reference position coordinates serve as the reference origin for all subsequent area calculations. Based on these reference coordinates, and combined with pre-stored test strip area layout data, including the offset and size information of each area relative to the reference point, a coordinate transformation algorithm calculates the precise center coordinates of the type identification area, control line area, and detection line area. Finally, the coordinate information of all areas is stored in a dedicated coordinate register, and a coordinate ready signal is output to trigger the subsequent optical detection process.

[0170] This embodiment achieves highly accurate test strip positioning through the coordinated control of a stepper motor and a position sensor, laying a solid foundation for the accuracy of subsequent optical detection. A coordinate register stores the region's position information, enabling rapid response and execution of multi-region sequential detection, thus improving overall detection efficiency. The standardized positioning process provided in this embodiment effectively overcomes the problem of detection area offset caused by test strip insertion deviation, ensuring that the optical probe is always aligned with the correct detection area, thereby ensuring the consistency and reliability of measurement results.

[0171] According to an embodiment of the present invention, the step of illuminating the type identification area according to the coordinate position and a first light source sequence to obtain a first reflected light ratio and a first reflected light difference specifically includes:

[0172] Control the multi-wavelength light source to sequentially illuminate the type identification area according to a preset first light source sequence;

[0173] When each wavelength of light source illuminates the object, the photoelectric sensor is synchronously controlled to collect the corresponding reflected light intensity value;

[0174] The collected reflected light intensity values ​​are sequentially stored into the reflected light intensity register;

[0175] The first reflected light ratio value is obtained by calculating the ratio of the reflected intensity values ​​of the first identification wavelength light and the second identification wavelength light.

[0176] The first reflected light difference value is obtained by calculating the difference between the reflection intensity values ​​of the third and fourth identification wavelengths.

[0177] It should be noted that in this embodiment, firstly, the multi-wavelength light source module is controlled to sequentially illuminate the type identification area of ​​the test strip according to a preset first light source sequence; the light source sequence specifies the activation order and duration of different wavelength light sources. During the illumination of each wavelength light source, the photoelectric sensor is synchronously controlled to collect the corresponding analog signal of reflected light intensity and convert it into a digital quantity through an analog-to-digital converter. These digitized reflected light intensity values ​​are sequentially stored in a dedicated reflected light intensity register, forming a complete optical feature dataset. Then, the processing unit reads the reflected intensity values ​​of the first and second identification wavelength light from the register and obtains the first reflected light ratio value through division; simultaneously, it reads the reflected intensity values ​​of the third and fourth identification wavelength light and obtains the first reflected light difference value through subtraction; the aforementioned reflected light ratio and reflected light difference value serve as optical parameters, providing key feature inputs for subsequent test strip type identification.

[0178] This embodiment combines ratio and difference calculation methods to eliminate the interference of uneven ambient lighting and differences in test strip background color on measurement results, extracting stable optical feature parameters. A control strategy of sequential illumination and synchronous acquisition ensures the temporal and spatial consistency of multi-wavelength optical data, providing a high-quality data foundation for accurate identification. Simultaneously, the optical parameter calculation process is standardized and modularized, allowing for rapid adaptation to the identification needs of different types of test strips; identification capabilities can be expanded simply by adjusting the light source sequence and calculation logic.

[0179] According to an embodiment of the present invention, the step of comparing the first reflected light ratio and the first reflected light difference with a preset first threshold and a second threshold respectively to obtain test strip type information specifically includes:

[0180] Determine whether the first reflected light ratio is lower than the first threshold;

[0181] If so, the test strip is deemed invalid;

[0182] If not, then determine whether the first reflected light difference value is lower than the second threshold;

[0183] If so, then the test strip type information is determined to be an HCG test strip;

[0184] If not, the test strip type information is determined to be LH test strip.

[0185] It should be noted that in this embodiment, the process first determines whether the first reflected light ratio is lower than a preset first threshold. If so, the test strip is deemed invalid and the process terminates. This step serves as the primary screening condition for test strip validity. If the first reflected light ratio is higher than the first threshold, the process continues to determine whether the first reflected light difference is lower than a preset second threshold. If the first reflected light difference is lower than the second threshold, the test strip type is determined to be an HCG test strip; if the first reflected light difference is higher than the second threshold, the test strip type is determined to be an LH test strip. This embodiment forms a two-level progressive decision logic for the entire judgment process. The final output test strip type information will directly determine the wavelength selection scheme and parameter calculation strategy used in the subsequent control line area and detection line area detection.

[0186] This embodiment employs a two-level threshold judgment mechanism to ensure the reliability of test strip validity testing while achieving high-precision differentiation between HCG and LH test strips, thereby reducing the risk of misclassification. The type identification process is designed with a clear binary decision tree structure, resulting in clear judgment logic and efficient execution. Furthermore, this embodiment utilizes the complementarity of multi-wavelength optical features, using a ratio parameter to verify test strip quality and a difference parameter to distinguish test strip types, forming a complete and efficient test strip type identification process.

[0187] According to an embodiment of the present invention, obtaining the dynamic determination threshold based on the reflected light intensity of the control line region at multiple wavelengths specifically includes:

[0188] The multi-wavelength light source is controlled to illuminate the control line area sequentially according to a preset second light source sequence, and the intensity of reflected light at each wavelength is collected.

[0189] Select the corresponding weighting factor based on the test strip type information;

[0190] The collected multi-wavelength reflected light intensity values ​​are input into a preset dynamic threshold weighted calculation model;

[0191] Based on the calculation results of the dynamic threshold weighted calculation model, the dynamic judgment threshold is obtained.

[0192] It should be noted that in this embodiment, when the first reflected light information of the control line area is lower than a preset threshold, the multi-wavelength spectral scanning process is automatically initiated. Multi-wavelength light sources are controlled to sequentially illuminate the control line area according to a preset second light source sequence, and the reflected light intensity values ​​at each wavelength are simultaneously collected to form complete spectral response data. Then, based on the identified test strip type information, a corresponding weighting factor combination is selected from a preset parameter library, where the weighting factor reflects the degree of influence of different wavelengths on the interpretation results of a specific test strip type. The collected multi-wavelength reflected light intensity values ​​and the corresponding weighting factors are input into a preset dynamic threshold weighting calculation model. Through a comprehensive calculation of weighted summation and nonlinear transformation, a dynamic judgment threshold matching the current actual reaction state of the test strip and environmental conditions is generated. Finally, the dynamic judgment threshold is output as a benchmark reference value for subsequent interpretation of the test line area results, replacing the traditional fixed threshold.

[0193] This embodiment utilizes a comprehensive weighted calculation of multi-wavelength spectral information to enable the judgment threshold to adapt to differences in manufacturing processes and complex environmental conditions between different batches of test strips, thereby improving the accuracy and consistency of the interpretation results. Specifically, the introduction of a weighting factor specific to the test strip type makes the threshold generation process targeted, fully reflecting the specific reaction characteristics of HCG and LH test strips at different wavelengths. Furthermore, the dynamic threshold mechanism effectively overcomes the interpretation deviation problems caused by factors such as test strip aging and changes in environmental temperature and humidity in the traditional fixed threshold method, thus improving the reliability and applicability of the test strip detection.

[0194] According to an embodiment of the present invention, the step of comparing the second reflected light information with the dynamic determination threshold to obtain the test strip reading result specifically includes:

[0195] The detection line area is illuminated by a second wavelength light source, and the reflected light is collected to obtain the second reflected light information.

[0196] Determine whether the second reflected light information is lower than the dynamic determination threshold;

[0197] If yes, output a negative result.

[0198] If not, output a positive result;

[0199] The interpretation information is combined with the test strip type information to generate the test strip interpretation result.

[0200] It should be noted that, in this embodiment, the detection line area is illuminated by the corresponding second wavelength light source based on the determined test strip type information, and a quantitative second reflected light information is obtained by collecting the reflected light signal through a photoelectric sensor. The second reflected light information is compared with a dynamic judgment threshold to determine whether it is lower than the dynamic threshold. If the second reflected light information is lower than the dynamic judgment threshold, a negative interpretation is output, indicating that the concentration of the target substance in the test sample has not reached the detection limit. If the second reflected light information is higher than or equal to the dynamic judgment threshold, a positive interpretation is output, indicating that there is a sufficient concentration of the target substance in the test sample. Finally, the negative / positive interpretation information is logically combined with the test strip type information to generate a complete interpretation result containing the test strip type and the test result, and output to the display module or communication interface.

[0201] This embodiment combines type-specific wavelength selection with dynamic threshold comparison to achieve accurate differentiation of test results from different test strips, avoiding false positives or false negatives caused by wavelength mismatch or unreasonable thresholds. A unified interpretation logic framework is used to process the output results of different types of test strips, ensuring both architectural simplicity and consistency of interpretation standards. Furthermore, the final combined output includes test strip type identification and detection judgment information, facilitating user understanding and use.

[0202] It is worth mentioning that, prior to performing the irradiation operation, the following also applies:

[0203] Real-time acquisition of ambient light intensity inside the optical detection chamber;

[0204] Determine whether the ambient light intensity exceeds a preset ambient light intensity safety threshold;

[0205] If so, output a light leakage abnormality alarm;

[0206] If not, determine whether the ambient light intensity exceeds the preset ambient light intensity stability threshold.

[0207] If so, then activate the light source compensation mechanism;

[0208] Control the multi-wavelength light source to emit test light intensity sequentially according to the compensation sequence, and collect the reflection intensity of each wavelength under the influence of ambient light;

[0209] An ambient light compensation coefficient mapping table is established based on the deviation of reflection intensity at each wavelength.

[0210] The reflected light intensity in the detection is compensated in real time according to the compensation coefficient mapping table.

[0211] It should be noted that, in this embodiment, before formal optical testing, ambient light intensity data within the optical testing chamber is first collected in real time using an ambient light sensor. The system determines whether the ambient light intensity exceeds a preset ambient light intensity safety threshold. If it does, a light leakage alarm is immediately output and the testing process is paused. If it does not exceed the safety threshold but is higher than a preset ambient light intensity stability threshold, a light source compensation mechanism is activated. Under this compensation mechanism, multiple wavelength light sources are controlled to emit test light intensities sequentially according to a specific compensation sequence, and the reflection intensity data of each wavelength under the influence of ambient light is collected. Based on the deviation of the reflection intensity of each wavelength from the standard value, an ambient light compensation coefficient mapping table is established using an interpolation algorithm. During subsequent formal testing, the real-time collected reflected light intensity is dynamically corrected according to this compensation coefficient mapping table to eliminate the interference of ambient light fluctuations on the measurement results.

[0212] This embodiment ensures both the safety of the optical measurement environment and the stability of the detection conditions through real-time monitoring and a graded response mechanism for ambient light intensity. The established multi-wavelength compensation coefficient mapping table can accurately compensate for the optical characteristics of different wavelengths, thereby overcoming the influence of ambient light differences on light sources of different wavelengths. The light intensity compensation mechanism provided in this embodiment maintains high measurement accuracy even under non-ideal lighting conditions, thus broadening the applicable environment range and reliability of the equipment.

[0213] It is worth mentioning that it also includes:

[0214] After determining that the first reflected light information is lower than the preset first reflected light threshold, control at least three different wavelength light sources to sequentially illuminate the control line area;

[0215] The intensity values ​​of reflected light at each wavelength were collected, and the characteristics of the reflected light spectrum were extracted.

[0216] The reflection spectral characteristics are matched with a preset standard control line spectral template to obtain the matching degree;

[0217] If the matching degree is lower than the preset matching threshold, a retest mechanism is initiated;

[0218] If the matching degree is still lower than the preset matching threshold after retesting, the test strip is deemed invalid.

[0219] It should be noted that, in this embodiment, when the first reflected light information of the control line area is lower than a preset threshold, before generating a dynamic judgment threshold, at least three different wavelength light sources are sequentially used to illuminate the control line area to collect high-resolution spectral reflectance data. Key spectral feature parameters are extracted from these multi-wavelength reflectance data, including but not limited to characteristic peak positions, spectral shapes, and relative intensity distributions. Then, the extracted reflectance spectral features are compared with a preset standard control line spectral template to calculate the matching degree, and a quantified matching degree score is obtained through correlation analysis or pattern recognition algorithms. If the matching degree score is lower than a preset matching threshold, a retesting mechanism is automatically initiated, and the spectral acquisition and matching calculation process is re-executed. If the matching degree is still lower than the preset threshold after retesting, the test strip is ultimately determined to be invalid, and the detection process is terminated.

[0220] This embodiment provides a highly reliable method for verifying the validity of test strips through multi-wavelength spectral feature matching analysis, effectively identifying test strips that, although the control lines are visible, are actually ineffective or deteriorated. A retesting mechanism is introduced to provide a second verification opportunity for test strips in a critical state, avoiding misjudgments caused by fluctuations in a single measurement. The failure verification mechanism provided in this embodiment, together with the initial validity judgment, forms a dual guarantee, thereby improving the security of the entire detection system and the reliability of the results.

[0221] It is worth mentioning that it also includes:

[0222] Real-time monitoring of the signal-to-noise ratio of reflected light intensity at each wavelength;

[0223] Based on the signal-to-noise ratio, the wavelength combination used in subsequent detection is dynamically adjusted;

[0224] Based on a preset weighting factor adjustment algorithm, the weighting factor of the dynamic judgment threshold is adjusted according to the test strip type information and the signal-to-noise ratio.

[0225] It should be noted that in this embodiment, the signal-to-noise ratio (SNR) of the reflected light intensity at each wavelength is monitored in real time during the detection process. The signal quality of each wavelength is evaluated by calculating the ratio of signal intensity to noise fluctuation amplitude. Based on the real-time acquired SNR data, the wavelength combination used in subsequent detections is dynamically adjusted; wavelengths with high SNR are preferentially selected for calculation, while wavelengths with excessively low SNR are reduced or eliminated. Furthermore, based on a preset weighting factor adjustment algorithm, combined with test strip type information and real-time SNR, the weighting factors of each wavelength in the dynamic judgment threshold calculation are dynamically optimized, so that wavelengths with good signal quality have a higher weight in the threshold calculation. Through this adaptive adjustment mechanism, it is ensured that the detection process always completes test strip identification and result interpretation under the optimal wavelength configuration.

[0226] This embodiment achieves automatic adaptation to different usage environments and test strip conditions through signal-to-noise ratio monitoring and dynamic optimization of wavelength combinations, maintaining optimal detection performance at all times. The adaptive adjustment of the weighting factor ensures that the downstream calculation process fully utilizes high-quality optical signals, effectively suppressing the impact of noise interference on the final result. The self-optimizing wavelength management mechanism provided in this embodiment enhances the level of intelligence and anti-interference capability, maintaining stable and reliable detection accuracy even under complex usage conditions.

[0227] A third aspect of the present invention provides a computer-readable storage medium comprising a test strip identification and result interpretation method program based on a multi-wavelength light source, wherein when the test strip identification and result interpretation method program based on a multi-wavelength light source is executed by a processor, the steps of the test strip identification and result interpretation method based on a multi-wavelength light source as described in any of the preceding claims are implemented.

[0228] In summary, this invention provides a method, system, and medium for test strip identification and result interpretation based on multi-wavelength light sources. First, the coordinates of the type identification area, control line area, and detection line area on the test strip are precisely located. Then, the type identification area is illuminated according to a preset sequence. By calculating the ratio and difference of reflected light from specific wavelength combinations and comparing it with a preset threshold, the test strip type is automatically determined. Next, the control line area is illuminated with a corresponding wavelength light source based on the test strip type. When the reflected light intensity is lower than a preset first reflected light threshold, multi-wavelength scanning is initiated to generate a dynamic judgment threshold. Finally, the detection line area is detected using a type-adaptive wavelength, and the final interpretation result is output by comparing the reflected light intensity with the dynamic threshold. This invention, through multi-wavelength optical feature recognition and dynamic threshold technology, achieves automatic differentiation of test strip types and accurate interpretation of detection results, improving the adaptability, accuracy, and reliability of the detection system.

[0229] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0230] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for test strip identification and result interpretation based on multi-wavelength light sources, characterized in that, The method includes: In response to the test strip insertion signal, determine the coordinate positions of the type identification area, control line area, and detection line area on the test strip; Based on the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain a first reflected light ratio value and a first reflected light difference value. Specifically, this includes: controlling multiple wavelength light sources to sequentially illuminate the type identification area according to a preset first light source sequence; synchronously controlling a photoelectric sensor to collect the corresponding reflected light intensity value when each wavelength light source is illuminating; storing the collected reflected light intensity values ​​sequentially into a reflected light intensity register; calculating the ratio of the reflected light intensity values ​​of the first identification wavelength light and the second identification wavelength light to obtain the first reflected light ratio value; and calculating the difference between the reflected light intensity values ​​of the third identification wavelength light and the fourth identification wavelength light to obtain the first reflected light difference value. Based on the first reflected light ratio and the first reflected light difference, the test strip type information is obtained by comparing them with a preset first threshold and a second threshold, respectively. Specifically, this includes: determining whether the first reflected light ratio is lower than the first threshold; if yes, the test strip is determined to be invalid; if no, determining whether the first reflected light difference is lower than the second threshold; if yes, the test strip type information is determined to be an HCG test strip; if no, the test strip type information is determined to be an LH test strip. Based on the test strip type information, a first wavelength light source is selected to illuminate the control line area to obtain the first reflected light information; If the first reflected light information is lower than the preset first reflected light threshold, a dynamic judgment threshold is obtained based on the reflected light intensity of the control line area at multiple wavelengths. Specifically, this includes: controlling a multi-wavelength light source to sequentially illuminate the control line area according to a preset second light source sequence, and collecting the reflected light intensity at each wavelength; selecting the corresponding weighting factor according to the test strip type information; inputting the collected multi-wavelength reflected light intensity values ​​into a preset dynamic threshold weighted calculation model; and obtaining the dynamic judgment threshold based on the calculation result of the dynamic threshold weighted calculation model. Based on the test strip type information, a second wavelength light source is selected to illuminate the detection line area to obtain the second reflected light information; By comparing the second reflected light information with the dynamic judgment threshold, the test strip reading result is obtained.

2. The method for test strip identification and result interpretation based on a multi-wavelength light source according to claim 1, characterized in that, The step of determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes: In response to the test strip insertion trigger signal detected by the photoelectric sensor, the stepper motor is controlled to start; The stepper motor is controlled according to the preset number of traction steps to pull the test strip to the optical detection platform; The reference position coordinates of the test strip on the optical detection platform are obtained through a position sensor; Based on the reference position coordinates, and according to the preset test strip area layout data, the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area are calculated. Store the coordinate information of each region into the coordinate register and output the coordinate ready signal.

3. The method for test strip identification and result interpretation based on a multi-wavelength light source according to claim 1, characterized in that, The comparison of the second reflected light information with the dynamic judgment threshold to obtain the test strip reading result specifically includes: The detection line area is illuminated by a second wavelength light source, and the reflected light is collected to obtain the second reflected light information. Determine whether the second reflected light information is lower than the dynamic determination threshold; If yes, output a negative result. If not, output a positive reading message; The interpretation information is combined with the test strip type information to generate the test strip interpretation result.

4. A test strip identification and result interpretation system based on a multi-wavelength light source, characterized in that, The system includes a memory and a processor. The memory includes a program for a test strip identification and result interpretation method based on a multi-wavelength light source. When the processor executes the program, the test strip identification and result interpretation method based on a multi-wavelength light source performs the following steps: In response to the test strip insertion signal, determine the coordinate positions of the type identification area, control line area, and detection line area on the test strip; Based on the coordinate position, the type identification area is illuminated according to the first light source sequence to obtain a first reflected light ratio value and a first reflected light difference value. Specifically, this includes: controlling multiple wavelength light sources to sequentially illuminate the type identification area according to a preset first light source sequence; synchronously controlling a photoelectric sensor to collect the corresponding reflected light intensity value when each wavelength light source is illuminating; storing the collected reflected light intensity values ​​sequentially into a reflected light intensity register; calculating the ratio of the reflected light intensity values ​​of the first identification wavelength light and the second identification wavelength light to obtain the first reflected light ratio value; and calculating the difference between the reflected light intensity values ​​of the third identification wavelength light and the fourth identification wavelength light to obtain the first reflected light difference value. Based on the first reflected light ratio and the first reflected light difference, the test strip type information is obtained by comparing them with a preset first threshold and a second threshold, respectively. Specifically, this includes: determining whether the first reflected light ratio is lower than the first threshold; if yes, the test strip is determined to be invalid; if no, determining whether the first reflected light difference is lower than the second threshold; if yes, the test strip type information is determined to be an HCG test strip; if no, the test strip type information is determined to be an LH test strip. Based on the test strip type information, a first wavelength light source is selected to illuminate the control line area to obtain the first reflected light information; If the first reflected light information is lower than the preset first reflected light threshold, a dynamic judgment threshold is obtained based on the reflected light intensity of the control line area at multiple wavelengths. Specifically, this includes: controlling a multi-wavelength light source to sequentially illuminate the control line area according to a preset second light source sequence, and collecting the reflected light intensity at each wavelength; selecting the corresponding weighting factor according to the test strip type information; inputting the collected multi-wavelength reflected light intensity values ​​into a preset dynamic threshold weighted calculation model; and obtaining the dynamic judgment threshold based on the calculation result of the dynamic threshold weighted calculation model. Based on the test strip type information, a second wavelength light source is selected to illuminate the detection line area to obtain the second reflected light information; By comparing the second reflected light information with the dynamic judgment threshold, the test strip reading result is obtained.

5. The test strip identification and result interpretation system based on a multi-wavelength light source according to claim 4, characterized in that, The step of determining the coordinate positions of the type identification area, control line area, and detection line area on the test strip in response to the test strip insertion signal specifically includes: In response to the test strip insertion trigger signal detected by the photoelectric sensor, the stepper motor is controlled to start; The stepper motor is controlled according to the preset number of traction steps to pull the test strip to the optical detection platform; The reference position coordinates of the test strip on the optical detection platform are obtained through a position sensor; Based on the reference position coordinates, and according to the preset test strip area layout data, the center coordinates of the type identification area, the center coordinates of the control line area, and the center coordinates of the detection line area are calculated. Store the coordinate information of each region into the coordinate register and output the coordinate ready signal.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that, The computer-readable storage medium includes a test strip identification and result interpretation method program based on a multi-wavelength light source. When the test strip identification and result interpretation method program based on a multi-wavelength light source is executed by a processor, it implements the steps of the test strip identification and result interpretation method based on a multi-wavelength light source as described in any one of claims 1 to 3.

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