Adjustment testing device for travel switch

Abstract

The application discloses a kind of installation and adjustment test devices of travel switch, it relates to switch test technical field.The installation and adjustment test device of travel switch includes support component, test component, lifting component and detection component.The support component includes support and carousel.Support is fixedly arranged, and support top center is provided with placement hole, and placement hole is used to place travel switch, and carousel is rotatably connected with support by bearing.Test component includes fixed seat and micrometer fixed seat setting on carousel, micrometer is installed on fixed seat, and micrometer is located in the positive overhead of the stress axis of travel switch.Lifting component includes spring base and tension spring.Spring base is fixed on carousel, and tension spring is connected between spring base and stress axis.Detection component is arranged on support, and detection component includes first indicating circuit and second indicating circuit.First indicating circuit is connected to the first loop of travel switch, and second indicating circuit is connected to the second loop of travel switch.

Description

Technical Field

[0001] This invention relates to the field of switch testing technology, specifically to a limit switch assembly and testing device. Background Technology

[0002] On a space launch vehicle, a limit switch is a sensor used to detect whether a mechanical component has reached a predetermined position. It changes the circuit state by physically contacting the object being detected, triggering internal electrical contacts (normally open or normally closed), thereby sending a clear "yes / no" or "start / stop" binary signal to the control system.

[0003] Limit switches used in space launchers are characterized by their small size and high precision requirements. To ensure the accuracy of launches, the quality requirements for these limit switches are very high.

[0004] Therefore, it is necessary to design an assembly and testing device to debug and test the limit switches, ensuring that the quality of the limit switches meets the requirements for use on space launch vehicles.

[0005] To address the above problems, the present invention provides an assembly and testing device for limit switches, thereby solving the aforementioned issues. Summary of the Invention

[0006] To achieve the above objectives, the present invention provides the following technical solution: a limit switch assembly and testing device, comprising a support assembly, a testing assembly, a lifting assembly, and a detection assembly. The support assembly includes a base and a turntable. The base is fixedly installed, with a placement hole at the center of its top for placing the limit switch. The turntable is rotatably connected to the base via a bearing. The testing assembly includes a fixed base and a micrometer. The micrometer is mounted on the fixed base, with its output end located directly above the force-bearing shaft of the limit switch. The lifting assembly includes a spring base and a tension spring. The spring base is fixed to the turntable, and the tension spring connects the spring base to the force-bearing shaft. The detection assembly is located on the base and includes a first indicating circuit and a second indicating circuit. The first indicating circuit is connected to the first circuit of the limit switch, and the second indicating circuit is connected to the second circuit of the limit switch.

[0007] Furthermore, as a preferred option,

[0008] The first indicating circuit includes a first power supply, a first indicating element, and a first connecting part. The first connecting part is connected to the first circuit of the limit switch, and the first indicating element is connected between the first power supply and the first connecting part.

[0009] The second indicating circuit includes a second power supply, a second indicating element, and a second connecting part. The second connecting part is connected to the second circuit of the limit switch, and the second indicating element is connected between the second power supply and the second connecting part.

[0010] Furthermore, preferably, the first indicator is configured as an indicator light or a buzzer; the second indicator is configured as an indicator light or a buzzer.

[0011] Furthermore, as a preferred embodiment, the top of the spring base is provided with a sliding groove along the transverse direction and a retaining groove along the longitudinal direction, and the multiple sliding grooves are all connected to the retaining groove.

[0012] A tension rod is slidably installed in the groove. One end of the tension rod is connected to a tension spring. A latch is rotatably installed on the tension rod, and the latch can be locked into the groove.

[0013] Furthermore, as a preferred embodiment, the turntable is provided with a dovetail groove, and the bottom of the fixing seat is provided with a dovetail block that matches the dovetail groove, and the dovetail block is slidably disposed in the dovetail groove.

[0014] The bottom of the mounting base has a first threaded hole, and both sides of the dovetail groove have second threaded holes. The screw can pass through the first threaded hole and be fixed in the second threaded hole to fix the mounting base to the turntable.

[0015] Furthermore, as a preferred embodiment, a wiping cloth is fitted onto the end of the tension spring away from the tension rod, and the wiping cloth is placed between the tension spring and the force-bearing shaft.

[0016] Furthermore, as a preferred embodiment, the tension rod consists of a tension rod one and a tension rod two. The tension rod one has a variable diameter threaded groove, and the tension rod two has a T-shaped groove. The tension rod one and the tension rod two are connected by a T-shaped post. A guide block is fixed on the peripheral wall of the T-shaped post. The guide block is slidably disposed in the variable diameter threaded groove. The T-shaped part of the T-shaped post is rotatably disposed in the T-shaped groove and is locked to the tension rod one. The tension spring is connected to the end of the tension rod two.

[0017] Furthermore, as a preferred embodiment, a bracket is fixed on the fixed base, a micrometer is fixed in the middle of the bracket, and a first transmission component is provided on the top of the bracket;

[0018] The first transmission assembly includes gear one, gear two, and a knob. A key shaft is rotatably provided inside the bracket. Gear one is engaged with the key shaft. Gear two is keyed to the rotating part of the micrometer. Gear one and gear two mesh. The knob is fixed inside gear one.

[0019] Furthermore, as a preferred embodiment, it also includes a second transmission mechanism, which includes a rotating shaft, a third gear, a first bevel gear, and a second bevel gear. The top of the rotating shaft rotatably passes through the bracket, and the bottom of the rotating shaft passes through the sliding groove and is rotatably disposed within the first pull rod. The third gear is keyed to the rotating shaft and meshes with the second gear. The first bevel gear is fixed on the rotating shaft. A guide groove is provided on the peripheral wall of the T-shaped column. The second bevel gear is fitted onto the T-shaped column. A locking block is fixed on the inner wall of the second bevel gear and is slidably disposed within the guide groove. The first bevel gear meshes with the second bevel gear. A T-shaped locking groove is provided on the end wall of the first pull rod. A T-shaped locking ring is fixed on the second bevel gear and is rotatably disposed within the T-shaped locking groove.

[0020] Compared with the prior art, the present invention provides an assembly and testing device for limit switches, which has the following advantages:

[0021] 1. By using the lifting component, the tension spring applies a circumferential eccentric force to the force axis of the limit switch, thereby simulating the situation where the limit switch encounters impact forces in different directions during actual use, making the test data more reliable.

[0022] 2. By using the first transmission mechanism, the stepping speed of the force-bearing shaft and the internal moving contact can be reduced, avoiding excessive stepping of the moving contact when directly rotating the micrometer, preventing stroke error, and thus improving the testing accuracy.

[0023] 3. Through the cooperation of the T-shaped column and the first tie rod, when the right end of the tension spring moves up or down synchronously with the force axis, the left end of the tension spring moves to the right or left synchronously with the second tie rod. Thus, the elongation of the tension spring remains unchanged, ensuring that the tension value on the force axis is constant. Therefore, the test results can correspond to the preset tension value, thereby improving the accuracy of the test data.

[0024] 4. Through the coordinated use of the first and second transmission mechanisms, when the force shaft moves up or down, the T-shaped column will move to the right or left simultaneously, thereby ensuring that the elongation of the tension spring remains constant during the test, thus improving the accuracy of the test results. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0026] Figure 2 This is a schematic diagram of the support structure of the present invention;

[0027] Figure 3 This is a schematic diagram of the limit switch structure of the present invention;

[0028] Figure 4 This is a schematic diagram of the first transmission mechanism of the present invention;

[0029] Figure 5 For the present invention Figure 4 Enlarged view of point A in the middle;

[0030] Figure 6 This is a schematic diagram of the connection structure between the second transmission mechanism and the T-shaped column of the present invention;

[0031] Figure 7 This is a schematic diagram of the connection structure between the T-shaped column and the tension rod of the present invention.

[0032] In the diagram: 11. Support; 12. Turntable; 13. Bearing; 2. Limit switch; 31. Fixed base; 32. Micrometer; 41. Spring base; 42. Tension spring; 21. Force-bearing shaft; 411. Slide groove; 412. Slot; 42. Tension spring; 43. Wiping cloth; 44. Pull rod; 45. Lock; 51. Bracket; 52. Gear 1; 53. Gear 2; 54. Knob; 441. Pull rod 1; 442. Pull rod 2; 46. T-shaped column; 47. Guide block; 61. Rotating shaft; 62. Gear 3; 63. Bevel gear 1; 64. Bevel gear 2; 461. Guide groove; 65. T-shaped retaining ring; 122. Dovetail groove. Detailed Implementation

[0033] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings.

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims and drawings of this application are intended to cover non-exclusive inclusion.

[0035] The directional terms appearing in the following description refer to the directions shown in the figures and are not intended to limit the specific structure of this application. For example, in the description of this application, the terms "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the figures. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0036] Furthermore, the terms "first," "second," etc., in the specification and claims of this application or in the aforementioned drawings are used to distinguish different objects rather than to describe a specific order, and may explicitly or implicitly include one or more of the features.

[0037] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, "connection" or "joining" in mechanical structures can refer to a physical connection, such as a fixed connection, for example, a connection fixed by fasteners, such as a connection fixed by screws, bolts, or other fasteners; a physical connection can also be a detachable connection, such as a snap-fit ​​or interlocking connection; a physical connection can also be an integral connection, such as a connection formed by welding, bonding, or integral molding. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0038] Reference Figures 1-7 The present invention provides a technical solution:

[0039] A limit switch assembly and testing device includes a support assembly, a testing assembly, a lifting assembly, and a detection assembly. The support assembly includes a base 11 and a turntable 12. The base 11 is fixedly mounted, and a placement hole is formed at the center of its top for placing the limit switch 2. The turntable 12 is rotatably connected to the base 11 via a bearing 13. The testing assembly includes a fixed base 31 and a micrometer 32. The fixed base 31 is mounted on the turntable 12, and the micrometer 32 is mounted on the fixed base 31, with its output end located directly above the force-bearing shaft 21 of the limit switch 2. The lifting assembly includes a spring base 41 and a tension spring 42. The spring base 41 is fixed to the turntable 12, and the tension spring 42 connects the spring base 41 and the force-bearing shaft 21. The detection assembly is mounted on the base 11 and includes a first indicating circuit and a second indicating circuit. The first indicating circuit is connected to the first circuit of the limit switch 2, and the second indicating circuit is connected to the second circuit of the limit switch 2.

[0040] First, it should be noted that the first circuit within limit switch 2 is typically configured with a long contact piece, while the second circuit is typically configured with a short contact piece. When testing limit switch 2, a first indicating circuit is connected to the long contact piece, and a second indicating circuit is connected to the short contact piece. Rotating the micrometer 32 allows its output end to move up and down. As the micrometer 32 moves, it presses against the force-bearing shaft 21, causing it to move synchronously. This movement of the force-bearing shaft 21 causes the moving contact in limit switch 2 to move synchronously. Therefore, when the force-bearing shaft 21 moves, the continuity of the first indicating signal from the first indicating circuit and the second indicating signal from the second indicating circuit are observed to determine whether the long contact piece and the moving contact, and the short contact piece and the moving contact, are making good contact.

[0041] The trigger position, reset position, and hysteresis of limit switch 2 are all determined by minute mechanical dimensions. The accuracy of micrometer 32 (0.01mm, estimable to 0.001mm) perfectly matches this order of magnitude. Moreover, micrometer 32 can transform the abstract "trigger point" into a precise displacement value. This allows test results to be recorded accurately.

[0042] When a tension spring 42 is connected between the spring base 41 and the force-bearing shaft 21, the tension spring 42 will generate an eccentric pulling force on the force-bearing shaft 21 along the contraction direction of the tension spring 42. When the turntable 12 is rotated, the tension spring 42 rotates around the center of the force-bearing shaft 21, and the force direction on the force-bearing shaft 21 changes synchronously along the rotation direction of the tension spring 42. Thus, the effect of the tension spring 42 on the force-bearing shaft 21 can simulate the situation where the limit switch 2 encounters impact forces in different directions during actual use, making the test data more reliable.

[0043] In the specific test: Connect the first indicating circuit to the long contact piece of the limit switch 2. Rotate the micrometer 32 and observe the first indicating signal emitted by the first indicating circuit during the rotation of the micrometer 32. When the first indicating signal is activated for the first time, record the scale L0 on the micrometer 32. Then, rotate the dial 12 clockwise and counterclockwise and observe whether the first indicating signal is activated. If the first indicating signal emitted by the first indicating circuit is continuously activated during the rotation, it is determined that the position of the long contact piece is appropriate, and it is considered that the long contact piece can make good contact with the moving contact.

[0044] When rotating turntable 12, if the first indicator signal from the first indicator circuit is intermittently conducting, it is determined that a part of the long contact piece is incorrectly positioned, and it is assumed that the long contact piece cannot make good contact with the moving contact. At this time, limit switch 2 needs to be removed to adjust the long contact piece and then tested again. This process is repeated until the first indicator signal from the first indicator circuit is continuously conducting. Afterward, slowly rotate micrometer 32 until the first indicator signal from the first indicator circuit is disconnected and no longer conducting. Record the scale L1 on micrometer 32. At this point, the scale corresponding to L1 is considered to be the scale when the long contact piece and the moving contact are exactly disconnected.

[0045] The test then continues: Using the second indicating circuit on the short contact of limit switch 2, rotate micrometer 32 and observe the second indicating signal emitted by the second indicating circuit during rotation. When the second indicating signal first conducts, record the scale L2 on micrometer 32. Then, rotate dial 12 clockwise and counterclockwise, observing whether the second indicating signal conducts. If the second indicating signal remains conducting during rotation, it is determined that the short contact is properly positioned, and that the short contact can make good contact with the moving contact.

[0046] When rotating turntable 12, if the second indicator signal is intermittently on, it is determined that a part of the short contact piece is incorrectly positioned, indicating that the short contact piece cannot make good contact with the moving contact. In this case, limit switch 2 needs to be removed to adjust the short contact piece before testing again. This process is repeated until the second indicator signal is continuously on. Afterward, slowly rotate micrometer 32 until the second indicator signal is de-energized and no longer on, and record the scale L3 on micrometer 32. At this point, the scale corresponding to L3 is considered to be the scale at which the short contact piece and the moving contact are exactly disconnected.

[0047] After the test is completed: determine whether the distances between L0 and L1, and between L3 and L2, are within the preset range. If they are, the fixtures for the long and short contact pieces are considered to meet the requirements; otherwise, they do not meet the requirements. Also, calculate the distance between L2 and L1 as the travel distance L2-1 of limit switch 2, and determine whether L2-1 is within the preset travel range.

[0048] Limit switch 2 is considered to meet quality requirements when the distance between L0 and L1, the distance between L2 and L3 are within preset ranges, and L2-1 is within a preset travel range. Otherwise, limit switch 2 is considered to fail to meet quality requirements.

[0049] In a preferred embodiment, the first indicating circuit includes a first power supply, a first indicating element, and a first connecting portion. The first connecting portion is connected to the first circuit of the limit switch 2, and the first indicating element is connected between the first power supply and the first connecting portion. The second indicating circuit includes a second power supply, a second indicating element, and a second connecting portion. The second connecting portion is connected to the second circuit of the limit switch 2, and the second indicating element is connected between the second power supply and the second connecting portion.

[0050] During testing, observe the on / off state of the first and second indicators to determine whether the limit switch 2 meets the quality requirements.

[0051] In a preferred embodiment, the first indicator is configured as an indicator light or a buzzer; the second indicator is configured as an indicator light or a buzzer.

[0052] If an indicator light is used as the indicator, when the indicator light is on, it is considered that the long contact piece or the short contact piece is in good contact with the moving contact; otherwise, it is considered that the two are not in good contact or are disconnected. If a buzzer is used as the indicator, when the buzzer sounds, it is considered that the long contact piece or the short contact piece is in good contact with the moving contact; otherwise, it is considered that the two are not in good contact or are disconnected.

[0053] In a preferred embodiment, the top of the spring base 41 is provided with a sliding groove 411 along the horizontal direction, and the top of the spring base 41 is provided with a locking groove 412 along the vertical direction. The sliding grooves 411 are all connected to the locking grooves 412. A tension rod 44 is slidably provided in the sliding groove 411. The tension rod 44 is connected to one end of the tension spring 42. A latch 45 is rotatably provided on the tension rod 44. The latch 45 can be locked into the locking groove 412.

[0054] When the latch 45 moves into the slot 412, the tension rod 44 will achieve end limit, that is, the elongation of the tension spring 42 can be determined, and thus the magnitude of the eccentric force on the force shaft 21 can be determined.

[0055] In addition, the slide groove 411 serves as a clearance groove to facilitate the sliding of the latch 45 within the spring base 41, providing a sliding track for the synchronous movement of the tension rod 44 and the fixed base 31, as described later.

[0056] In a preferred embodiment, the turntable 12 is provided with a dovetail groove 122, and the bottom of the fixed base 31 is provided with a dovetail block that is adapted to the dovetail groove 122. The dovetail block is slidably disposed in the dovetail groove 122.

[0057] The bottom of the fixing seat 31 is provided with a first threaded hole, and the dovetail groove 122 is provided with second threaded holes on both sides. The screw can pass through the first threaded hole and be fixed in the second threaded hole to fix the fixing seat 31 to the turntable 12.

[0058] When installing or removing limit switch 2, it is necessary to move the positions of the mounting base 31 and micrometer 32 to provide installation space for limit switch 2.

[0059] In a preferred embodiment, a wiping cloth 43 is sleeved on the end of the tension spring 42 away from the tension rod 44, and the wiping cloth 43 is placed between the tension spring 42 and the force-bearing shaft 21.

[0060] If the tension spring 42 is in direct contact with the force shaft 21, when the tension spring 42 and the force shaft 21 rotate relative to each other, the direct contact and friction between the two hard materials will cause the surface of the force shaft 21 to be scratched. The soft wiping cloth 43 can act as a buffer pad, protecting the surface finish of the two metal parts and extending the service life of the test fixture.

[0061] At the same time, due to the large surface roughness of the wiping cloth 43, the friction between the wiping cloth 43 and the tension spring 42, and between the wiping cloth 43 and the force shaft 21 is large. This prevents the tension spring 42 from shifting relative to the force shaft 21 during the movement of the force shaft 21, thereby preventing the tension spring 42 from slipping off the force shaft 21 and causing the test process to fail to simulate the actual situation.

[0062] In a preferred embodiment, the tension rod 44 is composed of a first tension rod 441 and a second tension rod 442. The first tension rod 441 has a variable diameter threaded groove, and the second tension rod 442 has a T-shaped groove. The first tension rod 441 and the second tension rod 442 are connected by a T-shaped post 46. A guide block 47 is fixed on the peripheral wall of the T-shaped post 46. The guide block 47 is slidably disposed in the variable diameter threaded groove. The T-shaped part of the T-shaped post 46 is rotatably disposed in the T-shaped groove. The latch 45 rotates on the first tension rod 441, and the tension spring 42 is connected to the end of the second tension rod 442.

[0063] The above states that the friction between the wiping cloth 43 and the tension spring 42, and between the wiping cloth 43 and the force-bearing shaft 21, is relatively large. One end of the tension spring 42 and the force-bearing shaft 21 remain fixed in the vertical direction. Therefore, when the force-bearing shaft 21 is displaced, the tension spring 42 will tilt along with the force-bearing shaft 21, causing the tension force of the tension spring 42 on the force-bearing shaft 21 to change. The specific explanation is as follows:

[0064] For example, please refer to Figure 6 When conducting the test, if the left end of the tension spring 42 is fixed, when the force shaft 21 moves downward, the right end of the tension spring 42 will move downward synchronously with the force shaft 21, thereby increasing the elongation of the tension spring 42. According to Hooke's Law, the tension spring 42 will increase the tension on the force shaft 21, which will change the initial set conditions (the set value of the tension on the force shaft 21 remains unchanged), causing the test results to not correspond to the preset tension value, which will reduce the accuracy of the test data.

[0065] Conversely, if the force shaft 21 moves upward, the right end of the tension spring 42 will move upward synchronously with the force shaft 21, thereby reducing the elongation of the tension spring 42. According to Hooke's Law, the tension spring 42 will reduce the tension on the force shaft 21, which will change the initial set conditions, causing the test results to not correspond to the preset tension value, and also reducing the accuracy of the test data.

[0066] In this application, for example, please refer to [link / reference]. Figures 6-7 When the T-shaped column 46 rotates counterclockwise under the action of external force, the T-shaped column 46 will drive the tie rod 442 to move to the right synchronously through the guide block 47 of the T-shaped column 46 and the variable diameter thread groove of the tie rod 441.

[0067] Conversely, under the action of external force, when the T-shaped column 46 rotates clockwise, the T-shaped column 46 will drive the tie rod 442 to move to the left synchronously through the guide block 47 of the T-shaped column 46 and the variable diameter threaded groove of the first tie rod 441.

[0068] In summary, when the right end of the tension spring 42 moves upward or downward synchronously with the force shaft 21, the left end of the tension spring 42 moves to the right or left synchronously with the pull rod 442. As a result, the elongation of the tension spring 42 remains constant, ensuring that the tension value on the force shaft 21 is constant. Therefore, the test results can correspond to the preset tension value, thereby improving the accuracy of the test data.

[0069] It should be noted that when the left end of the tension spring 42 is fixed, and the force shaft 21 moves at a constant speed in the vertical direction, the elongation of the tension spring 42 increases or decreases at varying speeds (this can be compared to the motion relationship between the hypotenuse and the right-angled side in a right triangle: when one right-angled side increases or decreases at a constant speed, if the length of the hypotenuse remains unchanged, the other right-angled side needs to shorten faster or lengthen slower). In this application, when the guide block 47 moves at a constant speed in the variable-diameter threaded groove, it drives the T-shaped column 46 to move at varying speeds. Therefore, the movement value of the left end of the tension spring 42 can just compensate for the deformation of the tension spring 42 itself. Thus, the tension of the tension spring 42 on the force shaft 21 can remain constant during the test.

[0070] When machining variable diameter thread grooves, it is important to ensure that the thread helix angle is less than the friction angle to prevent self-locking. At the same time, the change in the helix angle of the variable diameter thread groove should be smooth to avoid abrupt changes and reduce the risk of the guide block 47 getting stuck at the abrupt change in the helix angle.

[0071] In a preferred embodiment, a bracket 51 is fixed on the fixed base 31, the micrometer 32 is fixed in the middle part of the bracket 51, and a first transmission assembly is provided on the top of the bracket 51; the first transmission assembly includes a first gear 52, a second gear 53 and a knob 54, a key shaft is rotatably provided inside the bracket 51, the first gear 52 is engaged on the key shaft, the second gear 53 is keyed to the rotating part of the micrometer 32, the first gear 52 meshes with the second gear 53, and the knob 54 is fixed inside the first gear 52.

[0072] It should be explained that the number of teeth of gear 1 52 is less than the number of teeth of gear 2 53, therefore gear 1 52 and gear 2 53 constitute a reduction gear set.

[0073] Specifically, the movement distance of the force-bearing shaft 21 of the limit switch 2 needs to be precisely controlled to verify whether its trigger point meets the design requirements. For example, if the force-bearing shaft 21 needs to move 0.1mm to trigger the switch, directly rotating the rotating part of the micrometer 32 will cause a stroke error due to the excessive step of the moving contact. However, by using gear transmission, the moving contact can achieve a stroke step of 0.05mm or even smaller, thereby improving the test accuracy.

[0074] In a preferred embodiment, this application further includes a second transmission mechanism, which includes a rotating shaft 61, a third gear 62, a first bevel gear 63, and a second bevel gear 64. The top of the rotating shaft 61 rotatably passes through the bracket 51, and the bottom of the rotating shaft 61 passes through the sliding groove 411 and is rotatably disposed within the first pull rod 441. The third gear 62 is keyed to the rotating shaft 61 and meshes with the second gear 53. The first bevel gear 63 is fixed on the rotating shaft 61. A guide groove 461 is provided on the peripheral wall of the T-shaped column 46. The second bevel gear 64 is fitted onto the T-shaped column 46. A locking block is fixed on the inner wall of the second bevel gear 64 and is slidably disposed within the guide groove 461. The first bevel gear 63 meshes with the second bevel gear 64. A T-shaped retaining groove is provided on the end wall of the first pull rod 441. A T-shaped retaining ring 65 is fixed on the second bevel gear 64 and is rotatably disposed within the T-shaped retaining groove.

[0075] Among them, the T-shaped retaining ring 65 can keep the second bevel gear 64 and the first bevel gear 63 always engaged, and prevent the second bevel gear 64 from moving with the T-shaped post 46.

[0076] Specifically, when the operator turns knob 54, gear 1 52 meshes with gear 2 53, causing the output end of micrometer 32 to move up and down against the force-bearing shaft 21. At the same time, gear 2 53 meshes with gear 3 62, which drives shaft 61 to rotate synchronously. Shaft 61 drives bevel gear 1 63 to rotate, which meshes with bevel gear 2 64. The locking block on the inner wall of bevel gear 2 64 drives the inner wall of guide groove 461 to rotate synchronously and uniformly, thereby achieving uniform rotation of T-shaped column 46.

[0077] Therefore, through the coordinated use of the first and second transmission mechanisms, when the force shaft 21 moves up or down, the T-shaped column 46 moves synchronously to the right or left, thereby ensuring that the elongation of the tension spring 42 remains constant during the test, thus improving the accuracy of the test results. Moreover, this setting method can achieve synchronous dual adjustment simply by turning the knob 54, thus improving the degree of automation.

[0078] In addition, it should be explained that the rotating shaft 61 can limit the pull rod 441 to prevent it from rotating, ensuring that the guide block 47 and the variable diameter thread groove can slide relative to each other. At the same time, when the rotating shaft 61 moves, it can drive the pull rod 441 to move synchronously, realizing the overall movement without the need to recalibrate the position of each component.

[0079] In this application, before testing the limit switch 2: first, the limit switch 2 is installed in the placement hole, then the fixing seat 31 is moved so that the nut engages with the threaded hole, then the tension spring 42 is connected between the pull rod 442 and the force-bearing shaft 21, and a wiping cloth 43 is placed between the tension spring 42 and the force-bearing shaft 21. After pulling up the latch 45 and rotating it, the latch 45 is locked into the slot 412, so that the tension spring 42 is in a stretched state, and the tension spring 42 applies a constant eccentric force to the force-bearing shaft 21. Then the limit switch 2 is tested to determine whether the limit switch 2 meets the quality requirements.

[0080] The above description is merely a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A device for assembling and testing limit switches, characterized in that: include: The support assembly includes a support (11) and a turntable (12). The support (11) is fixedly installed. A placement hole is provided at the center of the top of the support (11). The placement hole is used to place a limit switch (2). The turntable (12) is rotatably connected to the support (11) through a bearing (13). The test assembly includes a mounting base (31) and a micrometer (32). The mounting base (31) is disposed on the turntable (12), and the micrometer (32) is mounted on the mounting base (31). The output end of the micrometer (32) is located directly above the force shaft (21) of the limit switch (2). The lifting assembly includes a spring base (41) and a tension spring (42). The spring base (41) is fixed on the turntable (12), and the tension spring (42) is connected between the spring base (41) and the force-bearing shaft (21). A detection component is provided on the support (11). The detection component includes a first indicator circuit and a second indicator circuit. The first indicator circuit is connected to the first circuit of the limit switch (2), and the second indicator circuit is connected to the second circuit of the limit switch. The top of the spring base (41) is provided with a sliding groove (411) along the horizontal direction, and the top of the spring base (41) is provided with a slot (412) along the vertical direction. All of the sliding grooves (411) are connected to the slots (412). A tension rod (44) is slidably provided in the groove (411). The tension rod (44) is connected to one end of the tension spring (42). A latch (45) is rotatably provided on the tension rod (44). The latch (45) can be locked into the slot (412). The tension rod (44) is composed of a first tension rod (441) and a second tension rod (442). The first tension rod (441) has a variable diameter threaded groove, and the second tension rod (442) has a T-shaped groove. The first tension rod (441) and the second tension rod (442) are connected by a T-shaped column (46). A guide block (47) is fixed on the peripheral wall of the T-shaped column (46). The guide block (47) is slidably disposed in the variable diameter threaded groove. The T-shaped part of the T-shaped column (46) is rotatably disposed in the T-shaped groove. The latch (45) rotates on the first tension rod (441). The tension spring (42) is connected to the end of the second tension rod (442). A bracket (51) is fixed on the fixed base (31), the micrometer (32) is fixed in the middle part of the bracket (51), and a first transmission component is provided on the top of the bracket (51). The first transmission assembly includes a first gear (52), a second gear (53), and a knob (54). A key shaft is rotatably provided inside the bracket (51). The first gear (52) is engaged on the key shaft. The second gear (53) is keyed to the rotating part of the micrometer (32). The first gear (52) meshes with the second gear (53). The knob (54) is fixed inside the first gear (52). It also includes a second transmission mechanism, which includes a rotating shaft (61), a third gear (62), a first bevel gear (63), and a second bevel gear (64). The top of the rotating shaft (61) rotatably passes through the bracket (51), and the bottom of the rotating shaft (61) passes through the slide groove (411) and is rotatably disposed in the first pull rod (441). The third gear (62) is keyed to the rotating shaft (61), and the third gear (62) meshes with the second gear (53). The first bevel gear (63) is fixed to the rotating shaft (61). Above, a guide groove (461) is provided on the peripheral wall of the T-shaped column (46), the second bevel gear (64) is fitted on the T-shaped column (46), a locking block is fixed on the inner wall of the second bevel gear (64), the locking block is slidably disposed in the guide groove (461), the first bevel gear (63) meshes with the second bevel gear (64), a T-shaped slot is provided on the end wall of the first pull rod (441), a T-shaped retaining ring (65) is fixed on the second bevel gear (64), and the T-shaped retaining ring (65) is rotatably disposed in the T-shaped retaining ring.

2. The device for assembling and testing a limit switch according to claim 1, characterized in that: The first indicating circuit includes a first power supply, a first indicating element and a first connecting part. The first connecting part is connected to the first circuit of the limit switch (2), and the first indicating element is connected between the first power supply and the first connecting part. The second indicator circuit includes a second power supply, a second indicator, and a second connection part. The second connection part is connected to the second circuit of the limit switch (2), and the second indicator is connected between the second power supply and the second connection part.

3. The device for assembling and testing a limit switch according to claim 2, characterized in that: The first indicator is configured as an indicator light or a buzzer; the second indicator is configured as an indicator light or a buzzer.

4. The device for assembling and testing a limit switch according to any one of claims 1 to 3, characterized in that: The turntable (12) is provided with a dovetail groove (122), and the bottom of the fixed base (31) is provided with a dovetail block that is adapted to the dovetail groove (122). The dovetail block is slidably disposed in the dovetail groove (122). The bottom of the fixing seat (31) is provided with a first threaded hole, and the dovetail groove (122) is provided with a second threaded hole on both sides. The screw can pass through the first threaded hole and be fixed in the second threaded hole to fix the fixing seat (31) to the turntable (12).

5. The device for assembling and testing a limit switch according to claim 4, characterized in that: The end of the tension spring (42) away from the tension rod (44) is fitted with a wiping cloth (43), and the wiping cloth (43) is placed between the tension spring (42) and the force shaft (21).

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