Quality control method and device of logging while drilling data and computing device

Abstract

Embodiments of the application disclose a method and device for quality control of logging-while-drilling data and a computing device. The method comprises: obtaining measured signal values of different sampling directions collected by a logging-while-drilling electromagnetic wave logging instrument at a target depth; performing waveform fitting on the measured signal values of different sampling directions to generate waveform coefficients corresponding to the target depth; generating fitted signal values of different sampling directions based on the waveform coefficients; extracting a waveform baseline from the waveform coefficients, processing the measured signal values using the waveform baseline to obtain corrected measured signal values, and processing the fitted signal values using the waveform baseline to obtain corrected fitted signal values; calculating data errors of the sampling directions according to the corrected measured signal values and the corrected fitted signal values of the sampling directions; and generating a quality index value of the target depth according to the data errors of different sampling directions at the target depth. The method can achieve accurate detection and control of the quality of logging-while-drilling data and improve the accuracy of subsequent logging data analysis.

Description

TECHNICAL FIELD

[0001] Embodiments of the present application relate to the technical field of logging-while-drilling data processing, and in particular to a logging-while-drilling data quality control method and device and a computing device. BACKGROUND

[0002] Logging-while-drilling data is a related logging signal collected by a logging-while-drilling tool such as a logging-while-drilling electromagnetic wave logging instrument during oil and gas drilling.

[0003] However, due to environmental factors, instrument factors and / or operation factors, etc., the obtained logging-while-drilling data may be of uneven quality. The quality of logging-while-drilling data directly or indirectly affects the accuracy of subsequent data analysis based on logging-while-drilling data, and thus it is of great significance to control the quality of logging-while-drilling data. SUMMARY

[0004] In view of the above problems, the present application is proposed to provide a logging-while-drilling data quality control method, device and computing device to overcome the above problems or at least partially solve the above problems.

[0005] According to a first aspect of embodiments of the present application, a logging-while-drilling data quality control method is provided, comprising:

[0006] Obtaining measured signal values of different sampling directions collected by a logging-while-drilling electromagnetic wave logging instrument at a target depth;

[0007] Performing waveform fitting on the measured signal values of different sampling directions to generate waveform coefficients corresponding to the target depth;

[0008] Generating fitted signal values of different sampling directions based on the waveform coefficients;

[0009] Extracting a waveform baseline from the waveform coefficients, processing the measured signal values using the waveform baseline to obtain corrected measured signal values, and processing the fitted signal values using the waveform baseline to obtain corrected fitted signal values;

[0010] For any sampling direction, calculating the data error of the sampling direction according to the corrected measured signal values and the corrected fitted signal values of the sampling direction;

[0011] Generating a quality index value of the target depth according to the data errors of different sampling directions at the target depth.

[0012] In an optional implementation, the generating of the quality index value of the target depth according to the data errors of different sampling directions at the target depth comprises:

[0013] identify a qualified sampling orientation according to the data error and an error threshold value;

[0014] generate the quality index value according to a proportion of the qualified sampling orientation.

[0015] In an optional implementation, before the identifying a qualified sampling orientation according to the data error and an error threshold value, the method further includes:

[0016] generating the error threshold value according to a formation background resistivity; wherein the error threshold value is positively correlated with the formation background resistivity.

[0017] In an optional implementation, before the generating the error threshold value according to a formation background resistivity, the method further includes:

[0018] calculating the formation background resistivity based on a waveform baseline; wherein the formation background resistivity is negatively correlated with the waveform baseline.

[0019] In an optional implementation, the generating the quality index value according to a proportion of the qualified sampling orientation includes:

[0020] if the proportion of the qualified sampling orientation is greater than a first threshold value, the quality index value is a first level;

[0021] if the proportion of the qualified sampling orientation is less than or equal to the first threshold value and greater than or equal to a second threshold value, the quality index value is a second level;

[0022] if the proportion of the qualified sampling orientation is less than the second threshold value, the quality index value is a third level.

[0023] In an optional implementation, the method further includes:

[0024] if the quality index value is the second level, generating a re-fitting instruction for the target depth;

[0025] if the quality index value is the third level, generating a re-sampling instruction for the target depth.

[0026] According to a second aspect of the embodiments of the present application, a quality control device for logging-while-drilling data is provided, which includes:

[0027] an acquisition module, configured to acquire measured signal values of different sampling orientations collected by a logging-while-drilling electromagnetic wave logging instrument at a target depth;

[0028] a fitting module, configured to perform waveform fitting on the measured signal values of the different sampling orientations to generate waveform coefficients corresponding to the target depth;

[0029] The generation module is used to generate fitted signal values ​​at different sampling orientations based on the waveform coefficients;

[0030] The correction module is used to extract the waveform baseline from the waveform coefficients, process the measured signal value using the waveform baseline to obtain the corrected measured signal value, and process the fitted signal value using the waveform baseline to obtain the corrected fitted signal value.

[0031] The error calculation module is used to calculate the data error of any sampling azimuth based on the corrected measured signal value and the corrected fitted signal value of that sampling azimuth.

[0032] The quality calculation module is used to generate a quality index value for the target depth based on the data error at different sampling azimuths at the target depth.

[0033] In one optional implementation, the quality calculation module is used to: identify qualified sampling locations based on the data error and an error threshold;

[0034] The quality index value is generated based on the proportion of qualified sampling locations.

[0035] In one alternative embodiment, the device further includes a threshold determination module for generating the error threshold based on the formation background resistivity; wherein the error threshold is positively correlated with the formation background resistivity.

[0036] In one alternative implementation, the threshold determination module is used to: calculate the formation background resistivity based on the waveform baseline; wherein the formation background resistivity is negatively correlated with the waveform baseline.

[0037] In one optional implementation, the quality calculation module is used to: if the proportion of qualified sampling locations is greater than a first threshold, then the quality index value is a first level;

[0038] If the proportion of qualified sampling locations is less than or equal to the first threshold and greater than or equal to the second threshold, then the quality index value is the second level.

[0039] If the proportion of qualified sampling locations is less than the second threshold, then the quality index value is the third level.

[0040] In one alternative embodiment, the apparatus further includes a post-processing module for generating a refit instruction for the target depth if the quality index value is a second level.

[0041] If the quality index value is at level three, a resampling instruction for the target depth is generated.

[0042] According to a third aspect of the embodiments of the present application, a computing device is provided, comprising a processor, a memory, a communication interface and a communication bus, the processor, the memory and the communication interface complete communication with each other through the communication bus;

[0043] The memory is configured to store at least one executable instruction, and the executable instruction causes the processor to perform the operation corresponding to the quality control method of the logging-while-drilling data.

[0044] According to a fourth aspect of the embodiments of the present application, a computer storage medium is provided, and the storage medium stores at least one executable instruction, and the executable instruction causes the processor to perform the operation corresponding to the quality control method of the logging-while-drilling data.

[0045] According to a fifth aspect of the embodiments of the present application, a computer program product is provided, comprising at least one executable instruction, and the executable instruction causes the processor to perform the operation corresponding to the quality control method of the logging-while-drilling data.

[0046] The quality control method of the logging-while-drilling data, the device, the computing device, the computer storage medium and the computer program product provided by the embodiments of the present application are based on the fitting of the measured signal values of different sampling orientations of the target depth to obtain the waveform coefficients of the target depth, and then generate the fitting signal values of different sampling orientations; then the waveform baseline in the waveform coefficients is used to correct the measured signal values and the fitting signal values to obtain the corrected measured signal values and the corrected fitting signal values, and the data error of the sampling orientation is obtained according to the corrected measured signal values and the corrected fitting signal values, and finally the quality index value of the target depth is obtained based on the data error of different sampling orientations. By using the present scheme, the quality of the logging-while-drilling data can be accurately detected and controlled, and the analysis accuracy of the subsequent logging data is improved.

[0047] The above description is only a summary of the technical solutions of the embodiments of the present application, in order to more clearly understand the technical means of the embodiments of the present application, the embodiments of the present application can be implemented according to the content of the specification, and in order to make the above and other purposes, characteristics and advantages of the embodiments of the present application more obvious and easy to understand, the following specific embodiments of the embodiments of the present application are described. BRIEF DESCRIPTION OF DRAWINGS

[0048] By reading the detailed description of the preferred embodiments below, various other advantages and benefits will become clear to those of ordinary skill in the art. The drawings are only for the purpose of illustrating the preferred embodiments and are not considered as limiting the embodiments of the present application. Moreover, the same reference symbols are used to represent the same parts throughout the drawings. In the drawings:

[0049] Figure 1 A flowchart of a quality control method of logging-while-drilling data provided by an embodiment of the present application is shown.

[0050] Figure 2 A flowchart of a quality control method of logging-while-drilling data provided by Embodiment Two of the present application is shown;

[0051] Figure 3 A flowchart of a quality control method of logging-while-drilling data provided by Embodiment Three of the present application is shown;

[0052] Figure 4 A structural diagram of a quality control device of logging-while-drilling data provided by Embodiment Four of the present application is shown;

[0053] Figure 5 A structural diagram of a computing device provided by Embodiment Five of the present application is shown. DETAILED DESCRIPTION

[0054] Exemplary embodiments of the present disclosure will be described in greater detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be accurately conveyed to those skilled in the art.

[0055] Embodiment One

[0056] Figure 1 A flowchart of a quality control method of logging-while-drilling data provided by Embodiment One of the present application is shown. As shown in the figure, the method specifically includes the following steps: Figure 1

[0057] Step S101: Obtain measured signal values of different sampling orientations collected by a logging-while-drilling electromagnetic wave logging tool at a target depth.

[0058] The logging-while-drilling electromagnetic wave logging tool is a common logging-while-drilling tool, and the specific structure, type, etc. of the logging-while-drilling electromagnetic wave logging tool are not limited in the present application. For example, the logging-while-drilling electromagnetic wave logging tool can adopt an axial orthogonal coil system, a tilted transmitting-axial receiving coil system, an axial transmitting-tilted receiving coil system, and / or a tilted transmitting-tilted receiving coil system, etc.

[0059] During logging, the logging-while-drilling electromagnetic wave logging tool usually adopts a rotary measurement method, i.e. the logging-while-drilling electromagnetic wave logging tool rotates one revolution at the corresponding logging depth to obtain signal values at different sampling orientations, which are referred to as measured signal values. The sampling orientation can be expressed in degrees or in sectors.

[0060] ​The step obtains the logging data of the electromagnetic wave logging instrument while drilling at the target depth, which is obtained by rotating the electromagnetic wave logging instrument while drilling at the target depth for one round, and the logging data includes the logging signal values at different sampling directions at the target depth, i.e., the measured signal values at different sampling directions at the target depth.

[0061] In step S102, the measured signal values at different sampling directions are subjected to waveform fitting to generate the waveform coefficients corresponding to the target depth.

[0062] A waveform fitting model is established in advance, which is a waveform function of the signal value (such as voltage value, etc.) and the sampling direction, and the waveform coefficients in the waveform function are the to-be-fitted parameters in the subsequent fitting process.

[0063] In an optional implementation, a matched waveform fitting model can be used according to the specific type of the electromagnetic wave logging instrument while drilling. For example, for the tilted transmitting-axial receiving coil system, the axial transmitting-tilted receiving coil system, and the axial orthogonal coil system, etc., a first-order trigonometric function as shown in formula 1 can be used as the waveform fitting model; for the tilted transmitting-tilted receiving coil system, a second-order trigonometric function as shown in formula 2 can be used as the waveform fitting model.

[0064] (Formula 1)

[0065] Wherein, θ represents the sampling direction; V (θ) represents the signal value at the sampling direction θ. , , a represents the waveform coefficient.

[0066] (Formula 2)

[0067] Wherein, θ represents the sampling direction; V (θ) represents the signal value at the sampling direction θ. , , , , a represents the waveform coefficient.

[0068] The measured signal values of different sampling orientations obtained in step S101 can obtain a plurality of data points, each data point being composed of a sampling orientation and a measured signal value corresponding to the sampling orientation. Then, the plurality of data points are used to fit the pre-constructed waveform fitting model to obtain the fitting value of the waveform coefficient in the waveform fitting model, so as to obtain the waveform coefficient corresponding to the target depth. Wherein, the specific fitting algorithm is not limited in the embodiments of the present application, for example, the least square method, and / or analytical fitting method can be used for fitting.

[0069] In step S103, the fitting signal values of different sampling orientations are generated based on the waveform coefficients.

[0070] The waveform coefficients are substituted into the waveform fitting model to obtain the fitted waveform model. For any sampling orientation, the sampling orientation is substituted into the fitted waveform model to obtain the corresponding signal value, which is referred to as the fitting signal value of the sampling orientation. Thus, the fitting signal values of different sampling orientations at the target depth can be obtained.

[0071] In step S104, the waveform baseline is extracted from the waveform coefficients, the measured signal values are processed by using the waveform baseline to obtain the corrected measured signal values, and the fitting signal values are processed by using the waveform baseline to obtain the corrected fitting signal values.

[0072] The constant term coefficient in the waveform coefficients is taken as the waveform baseline, and the measured signal values and the fitting signal values are processed by using the waveform baseline respectively to obtain the corrected measured signal values and the corrected fitting signal values. Specifically, the difference between the measured signal values and the waveform baseline is taken as the corrected measured signal values, and the difference between the fitting signal values and the waveform baseline is taken as the corrected fitting signal values.

[0073] In step S105, for any sampling orientation, the data error of the sampling orientation is calculated according to the corrected measured signal value and the corrected fitting signal value of the sampling orientation.

[0074] Wherein, the data error of the sampling orientation is specifically the relative error of the corrected measured signal value and the corrected fitting signal value. For example, the absolute value of the difference between the corrected measured signal value and the corrected fitting signal value can be calculated, and the ratio of the absolute value to the corrected measured signal value is taken as the data error of the sampling orientation.

[0075] In step S106, the quality index value of the target depth is generated according to the data errors of different sampling orientations at the target depth.

[0076] The data errors of each sampling direction at the target depth can be obtained through steps S101-S105, and the overall data quality of the target depth can be obtained according to the data errors of each sampling direction, that is, the quality index value of the target depth is obtained. The quality index value can be a quality score, a quality level, and the like. For example, the average value or the sum of the data errors of each sampling direction can be calculated, and the quality index value is generated according to the average value or the sum; or, the qualified sampling directions can be identified according to the data errors and the error threshold; the quality index value is generated according to the proportion of the qualified sampling directions, and the like.

[0077] It can be seen that the quality control method for logging-while-drilling data provided by the embodiments of the present application is based on the waveform coefficients of the target depth fitted by the measured signal values of different sampling directions of the target depth, and then the fitted signal values of different sampling directions are generated. Then, the measured signal values and the fitted signal values are corrected according to the waveform baseline in the waveform coefficients to obtain corrected measured signal values and corrected fitted signal values, the data errors of the sampling directions are obtained according to the corrected measured signal values and the corrected fitted signal values, and finally the quality index value of the target depth is obtained based on the data errors of different sampling directions. By using the present scheme, the quality of the logging-while-drilling data can be accurately detected and controlled, and the subsequent logging data analysis accuracy can be improved.

[0078] Embodiment Two

[0079] Figure 2 A flowchart of a quality control method for logging-while-drilling data provided by Embodiment Two of the present application is shown. As shown in Figure 2 The method specifically includes the following steps:

[0080] Step S201, calculating the data errors of different sampling directions at the target depth.

[0081] The specific implementation process of this step can refer to the related description in Embodiment One, which will not be repeated here.

[0082] Step S202, determining an error threshold.

[0083] In order to improve the calculation accuracy of the final quality index value and make the data quality of different formations comparable, the error threshold in the embodiments of the present application is a dynamic threshold, that is, the error threshold matched according to the current actual situation is determined.

[0084] In a specific implementation process, the error threshold value can be generated according to the formation background resistivity, and the error threshold value is positively correlated with the formation background resistivity. Specifically, when the formation background resistivity is higher, the signal strength is weaker, the signal-to-noise ratio is lower, the relative error is higher, and a looser error threshold value is used, that is, the error threshold value is higher; when the formation background resistivity is lower, the signal strength is higher, the signal-to-noise ratio is higher, the relative error is lower, and a stricter error threshold value is used, that is, the error threshold value is lower. In an actual implementation process, a positive correlation function of the error threshold value and the formation background resistivity can be generated in advance, and the error threshold value can be quickly calculated according to the positive correlation function in the implementation process of the step.

[0085] In an optional implementation, the formation background resistivity can be represented by a waveform baseline, and the formation background resistivity is negatively correlated with the waveform baseline. The waveform baseline is positively correlated with the signal strength, the higher the waveform baseline, the higher the signal strength, the higher the signal-to-noise ratio, and the lower the formation background resistivity. In an actual implementation process, a negative correlation function of the dynamic threshold value and the waveform baseline can be established in advance, that is, the higher the waveform baseline, the lower the dynamic threshold value; the lower the waveform baseline, the higher the dynamic threshold value. Then, the error threshold value can be quickly calculated according to the negative correlation function in the implementation process of the step.

[0086] In an optional implementation, the formation background resistivity can be represented by a phase difference and / or an amplitude ratio of the apparent resistivity measured by the instrument, and the formation background resistivity is positively correlated with the phase difference and the amplitude ratio. In an actual implementation process, a positive correlation function of the dynamic threshold value and the phase difference / amplitude ratio can be established in advance, that is, the higher the phase difference / amplitude ratio, the higher the dynamic threshold value; the lower the phase difference / amplitude ratio, the lower the dynamic threshold value. Then, the error threshold value can be quickly calculated according to the positive correlation function in the implementation process of the step.

[0087] In an optional implementation, the error threshold value can be determined according to the waveform baseline, the signal-to-noise ratio, and the phase difference / amplitude ratio. Specifically, a function of the error threshold value, the waveform baseline, the signal-to-noise ratio, and the phase difference / amplitude ratio is generated in advance, and in the function, the error threshold value is negatively correlated with the waveform baseline, negatively correlated with the signal-to-noise ratio, and positively correlated with the phase difference / amplitude ratio. The coefficients in the function can be obtained based on test data fitting in advance. Then, in the implementation process of the step, the current waveform baseline, signal-to-noise ratio, and phase difference / amplitude ratio can be obtained, and the corresponding error threshold value can be obtained by substituting the function.

[0088] Therefore, the error threshold value can be quickly calculated without directly measuring the formation background resistivity, so that the error threshold value determination efficiency is improved.

[0089] In step S203, the qualified sampling direction is identified according to the data error and the error threshold value.

[0090] Specifically, for any sampling orientation, if the data error of the sampling orientation is less than the error threshold, the sampling orientation is determined as a qualified sampling orientation; otherwise, the sampling orientation is determined as an unqualified sampling orientation.

[0091] Step S204, generating a quality index value of the target depth according to the proportion of the qualified sampling orientations.

[0092] The ratio of the qualified sampling orientations to the total sampling orientations is calculated, and the ratio is taken as the proportion of the qualified sampling orientations, and then the quality index value is generated according to the proportion.

[0093] In an optional embodiment, the quality index value can be represented in a quality level manner. Specifically, if the proportion of the qualified sampling orientations is greater than a first threshold, the quality index value is of a first level; if the proportion of the qualified sampling orientations is less than or equal to the first threshold and greater than or equal to a second threshold, the quality index value is of a second level; if the proportion of the qualified sampling orientations is less than the second threshold, the quality index value is of a third level. For example, if the proportion of the qualified sampling orientations is greater than 80%, the quality index value is excellent; if the proportion of the qualified sampling orientations is greater than or equal to 60% and less than or equal to 80%, the quality index value is medium; and if the proportion of the qualified sampling orientations is less than 60%, the quality index value is low.

[0094] It can be seen that the quality control method for logging-while-drilling data provided in the embodiments of the present application determines the error threshold matching the threshold according to the actual situation, realizes dynamic determination of the error threshold, and then identifies the qualified sampling orientations according to the error threshold, and then generates the quality index value, thereby improving the calculation accuracy of the quality index value.

[0095] Embodiment Three

[0096] Figure 3 A flowchart of a quality control method for logging-while-drilling data provided in Embodiment Three of the present application is shown. As shown in the figure, the method specifically includes the following steps: Figure 3

[0097] Step S301, calculating a quality index value of the target depth; if the quality index value is of a first level, performing step S302; if the quality index value is of a second level, performing step S303; and if the quality index value is of a third level, performing step S304.

[0098] The specific calculation process of the quality index value can refer to the description of the corresponding part in Embodiment One and Embodiment Two, which will not be repeated here.

[0099] Step S302, performing data quality control on the next target depth.

[0100] ​If the quality index value of the target depth is of the first level, it indicates that the data quality of the current target depth is relatively high, and the logging signal of the target depth is adopted, and the measurement and quality control of the next target depth are performed.

[0101] In step S303, a re-fitting instruction for the target depth is generated.

[0102] If the quality index value of the target depth is of the second level, it indicates that the data quality of the current target depth is medium, and a re-fitting instruction for the target depth is generated to perform waveform re-fitting.

[0103] Specifically, according to the data error, the abnormal sampling orientation and the normal sampling orientation are identified, the measured signal value of the normal sampling orientation is re-fitted to generate a re-fitting waveform coefficient, and the quality index value of the target depth is re-generated based on the re-fitting waveform coefficient. For example, a third threshold is set, which is greater than the preset threshold. If the data error of the sampling orientation is greater than the third threshold, the sampling orientation is determined as the abnormal sampling orientation; if the data error of the sampling orientation is less than or equal to the third threshold, the sampling orientation is determined as the normal sampling orientation.

[0104] The waveform coefficient obtained by re-fitting the measured signal value of the normal sampling orientation at the target depth again is called a re-fitting waveform coefficient, that is, the re-fitting waveform coefficient is obtained by re-fitting after excluding the abnormal sampling orientation. Then, step S301 is executed again to re-determine the quality index value of the target depth based on the re-fitting waveform coefficient, that is, the fitting signal value of different sampling orientations is generated based on the re-fitting waveform coefficient, the waveform baseline is extracted from the re-fitting waveform coefficient, the corrected measured signal value is obtained by processing the measured signal value using the waveform baseline, and the corrected fitting signal value is obtained by processing the fitting signal value using the waveform baseline; for any sampling orientation, the data error of the sampling orientation is calculated according to the corrected measured signal value and the corrected fitting signal value of the sampling orientation; and the quality index value of the target depth is generated according to the data error of different sampling orientations at the target depth.

[0105] In an optional embodiment, if the re-fitting number corresponding to the target depth is greater than a preset number threshold, step S304 is executed.

[0106] In step S304, a re-sampling instruction for the target depth is generated.

[0107] If the quality index value of the target depth is of the third level, it indicates that the data quality of the current target depth is poor, and a re-sampling instruction for the target depth is generated to re-collect the measured signal values of different sampling orientations collected at the target depth, that is, step S301 is executed again to re-obtain the quality index value of the target depth.

[0108] Therefore, the quality control method for logging-while-drilling data provided by the embodiments of the present application can adopt the currently collected logging signals when the quality index value at the target depth is high, re-perform waveform fitting to obtain the quality index value again when the quality index value at the target depth is medium, and re-perform data collection when the quality index value at the target depth is poor, thereby facilitating guarantee of the data quality of the adopted logging data and providing accurate data basis for subsequent data analysis.

[0109] Embodiment four

[0110] Figure 4 A structure schematic diagram of a quality control device for logging-while-drilling data provided by the fourth embodiment of the present application is shown. As shown in the figure, Figure 4 The device 400 includes an acquisition module 410, a fitting module 420, a generation module 430, a correction module 440, an error calculation module 450, and a quality calculation module 460.

[0111] The acquisition module 410 is configured to acquire measured signal values of different sampling directions collected by the logging-while-drilling electromagnetic wave logging instrument at a target depth.

[0112] The fitting module 420 is configured to perform waveform fitting on the measured signal values of the different sampling directions to generate waveform coefficients corresponding to the target depth.

[0113] The generation module 430 is configured to generate fitted signal values of different sampling directions based on the waveform coefficients.

[0114] The correction module 440 is configured to extract a waveform baseline from the waveform coefficients, process the measured signal values by using the waveform baseline to obtain corrected measured signal values, and process the fitted signal values by using the waveform baseline to obtain corrected fitted signal values.

[0115] The error calculation module 450 is configured to calculate, for any sampling direction, a data error of the sampling direction according to the corrected measured signal value and the corrected fitted signal value of the sampling direction.

[0116] The quality calculation module 460 is configured to generate a quality index value at the target depth according to the data errors of different sampling directions at the target depth.

[0117] In an optional implementation, the quality calculation module 460 is configured to identify qualified sampling directions according to the data errors and an error threshold.

[0118] The quality index value is generated according to the proportion of the qualified sampling directions.

[0119] In an optional implementation, the apparatus further comprises a threshold determination module (not shown in the figure) configured to generate the error threshold according to a formation background resistivity; wherein the error threshold is positively correlated with the formation background resistivity.

[0120] In an optional implementation, the threshold determination module is configured to calculate the formation background resistivity based on the waveform baseline; wherein the formation background resistivity is negatively correlated with the waveform baseline.

[0121] In an optional implementation, the quality calculation module 460 is configured to: if the proportion of the qualified sampling orientations is greater than a first threshold, the quality indicator value is a first level;

[0122] if the proportion of the qualified sampling orientations is less than or equal to the first threshold and greater than or equal to a second threshold, the quality indicator value is a second level;

[0123] if the proportion of the qualified sampling orientations is less than the second threshold, the quality indicator value is a third level.

[0124] In an optional implementation, the apparatus further comprises a post-processing module (not shown in the figure) configured to: if the quality indicator value is the second level, generate a re-fitting instruction for the target depth;

[0125] if the quality indicator value is the third level, generate a re-sampling instruction for the target depth.

[0126] Therefore, the quality control apparatus for logging-while-drilling data provided by the embodiments of the present application can obtain the waveform coefficients of the target depth based on the measured signal values of different sampling orientations of the target depth, and then generate the fitted signal values of different sampling orientations; then the measured signal values and the fitted signal values are corrected based on the waveform baseline in the waveform coefficients to obtain the corrected measured signal values and the corrected fitted signal values, the data errors of the sampling orientations are obtained based on the corrected measured signal values and the corrected fitted signal values, and finally the quality indicator value of the target depth is obtained based on the data errors of different sampling orientations. By using the present solution, the quality of the logging-while-drilling data can be accurately detected and controlled, and the subsequent analysis accuracy of the logging data can be improved.

[0127] Embodiment Five

[0128] Figure 5 A structural schematic diagram of a computing device provided by Embodiment Five of the present application is shown. The specific implementation of the present application does not limit the specific implementation of the computing device.

[0129] As shown in Figure 5 the computing device can include a processor 502, a communication interface 504, a memory 506, and a communication bus 508.

[0130] The processor 502, the communication interface 504, and the memory 506 communicate with each other through the communication bus 508. The communication interface 504 is configured to communicate with network elements such as clients or other servers. The processor 502 is configured to execute the program 510, and specifically, can execute the related steps in the method embodiments of quality control of logging-while-drilling data of a computing device.

[0131] Specifically, the program 510 can include program codes including computer operation instructions.

[0132] The processor 502 can be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application. The one or more processors included in the computing device can be processors of the same type, such as one or more CPUs, or processors of different types, such as one or more CPUs and one or more ASICs.

[0133] The memory 506 is configured to store the program 510. The memory 506 can include a high-speed RAM memory, and can further include a non-volatile memory such as at least one disk memory.

[0134] The program 510 can be specifically configured to cause the processor 502 to perform the method of quality control of logging-while-drilling data in any of the method embodiments described above. The specific implementation of each step in the program 510 can refer to the corresponding description in the corresponding step and unit in the method embodiments of quality control of logging-while-drilling data described above, and will not be described herein. Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the devices and modules described above can refer to the corresponding process descriptions in the foregoing method embodiments, and will not be described herein.

[0135] Embodiment six

[0136] Embodiment six of the present application provides a non-volatile computer storage medium, and the computer storage medium stores at least one executable instruction or computer program. The executable instruction or computer program can cause the processor to perform the operations corresponding to the method of quality control of logging-while-drilling data in any of the method embodiments described above.

[0137] Embodiment seven

[0138] Embodiment seven of the present application provides a computer program product, and the computer program product includes at least one executable instruction or computer program. The executable instruction or computer program can cause the processor to perform the operations corresponding to the method of quality control of logging-while-drilling data in any of the method embodiments described above.

[0139] The algorithms and displays presented herein are not inherently related to any particular computer, virtual system, or other apparatus. Various general purpose systems can be used with programs in accordance with the teachings herein, or it can prove convenient to construct more specialized apparatus to perform the required method steps. The required structure for a variety of these systems will be apparent from the description above. In addition, the present embodiments are not described with reference to any particular programming language. It will be appreciated that a variety of programming languages can be used to implement the teachings of the present embodiments as described herein, and any references below to specific languages are provided for disclosure of enablement of the best mode of the present embodiments.

[0140] In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the application can be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been described in detail in order to not obscure the understanding of this description.

[0141] Similarly, it is to be understood that the mechanical details of the application can be used in accordance with a variety of embodiments, and that referencing the application as a single embodiment, figure, or description thereof, is intended to cover by way of example a broad number of combinations and to the full extent that the application is deemed to cover. It is the intention, therefore, to be limited only as indicated by the following claims, and not by the details revealed on the specific embodiments given above by way of description and illustration of the application.

[0142] Those skilled in the art will appreciate that the modules in the apparatuses in the embodiments can be adapted and placed in one or more apparatuses other than the embodiments. The modules or units or components in the embodiments can be combined into one module or unit or component, and further can be divided into multiple sub-modules or sub-units or sub-components. Any combination of all the features disclosed in the specification (including the accompanying claims, abstract and drawings), and any method or apparatus otherwise disclosed in the specification, can be used in any combination, except that at least some of such features and / or processes or units are mutually exclusive. Unless explicitly stated otherwise, each feature disclosed in the specification (including the accompanying claims, abstract and drawings) can be replaced by alternative features that serve the same, equivalent or similar purpose.

[0143] Furthermore, those skilled in the art will recognize that, while certain embodiments described herein include certain features that are not included in other embodiments, combinations of those features from different embodiments are meant to be within the scope of the application, and form different embodiments, for example, in the following claims. For example, in the following claims, any of the claimed embodiments can be used in any combination.

[0144] The various component embodiments of the present application can be implemented in hardware, or as software modules running in one or more processors, or in combinations thereof. Those skilled in the art will appreciate that a microprocessor or digital signal processor (DSP) can be used in practice to implement some or all of the functionality according to some or all of the components of the present application. The present application can also be implemented as a program of instructions for performing part or all of the methods described herein, e.g., a computer program and a computer program product. Such program implementing the present application can be stored on a computer readable medium, or can be in the form of one or more signals. Such signals can be downloaded from an Internet website, or provided on a carrier signal, or in any other form.

[0145] It is noted that the above-described embodiments illustrate rather than limit the application, and that those skilled in the art will be able to design many alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps other than those listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application can be implemented by means of both hardware and software, and any combination thereof. In a unitary claim, several devices or sub-claims can be listed, comprising at least one of each such device, but not only one of each. Each of the devices can be further divided, and can consist of additional sub-claims. The use of the word "at least" followed by a list of one or more items does not exclude additional such items. The use of the words "one" or "only one" followed by a list of one or more items does not exclude additional such items. The scope of the application is not limited to the embodiments described herein, but can be implemented in any desired form, which does not depart from the novel teachings described herein and which includes any and all equivalents thereof.

Claims

1. A method of quality control of logging-while-drilling data, characterized by, The method comprises: acquiring measured signal values of different sampling directions collected by a while-drilling electromagnetic wave logging instrument at a target depth; performing waveform fitting on the measured signal values of the different sampling directions to generate waveform coefficients corresponding to the target depth; generating fitted signal values of different sampling directions based on the waveform coefficients; extracting a waveform baseline from the waveform coefficients, processing the measured signal values using the waveform baseline to obtain corrected measured signal values, and processing the fitted signal values using the waveform baseline to obtain corrected fitted signal values; for any sampling direction, calculating data errors of the sampling direction according to the corrected measured signal values and the corrected fitted signal values of the sampling direction; generating a quality indicator value of the target depth according to the data errors of different sampling directions at the target depth.

2. The method for quality control of logging-while-drilling data according to claim 1, wherein, The generation of the quality indicator value of the target depth according to the data errors of different sampling directions at the target depth comprises: identifying qualified sampling directions according to the data errors and an error threshold value; generating the quality indicator value according to a proportion of the qualified sampling directions.

3. The method for quality control of logging-while-drilling data according to claim 2, wherein, Before the identification of the qualified sampling directions according to the data errors and the error threshold value, the method further comprises: generating the error threshold value according to a formation background resistivity; wherein the error threshold value is positively correlated with the formation background resistivity.

4. The method for quality control of logging-while-drilling data according to claim 3, wherein, Before the generation of the error threshold value according to the formation background resistivity, the method further comprises: calculating the formation background resistivity based on the waveform baseline; wherein the formation background resistivity is negatively correlated with the waveform baseline.

5. The method of quality control of logging-while-drilling data according to any one of claims 2-4, characterized in that, The generation of the quality indicator value according to the proportion of the qualified sampling directions comprises: if the proportion of the qualified sampling directions is greater than a first threshold value, the quality indicator value is of a first level; if the proportion of the qualified sampling directions is less than or equal to the first threshold value and greater than or equal to a second threshold value, the quality indicator value is of a second level; if the proportion of the qualified sampling directions is less than the second threshold value, the quality indicator value is of a third level.

6. The method for quality control of logging-while-drilling data according to claim 5, wherein, The method further comprises: if the quality indicator value is of the second level, generating a re-fitting instruction for the target depth; if the quality indicator value is of the third level, generating a re-sampling instruction for the target depth.

7. A device for quality control of logging-while-drilling data, characterized by The method comprises: an acquiring module configured to acquire measured signal values of different sampling directions collected by a while-drilling electromagnetic wave logging instrument at a target depth; a fitting module configured to perform waveform fitting on the measured signal values of the different sampling directions to generate waveform coefficients corresponding to the target depth; a generating module configured to generate fitted signal values of different sampling directions based on the waveform coefficients; a correcting module configured to extract a waveform baseline from the waveform coefficients, process the measured signal values using the waveform baseline to obtain corrected measured signal values, and process the fitted signal values using the waveform baseline to obtain corrected fitted signal values; an error calculating module configured to, for any sampling direction, calculate data errors of the sampling direction according to the corrected measured signal values and the corrected fitted signal values of the sampling direction; and a quality indicator value of the target depth is generated according to the data errors of different sampling directions at the target depth. A quality calculation module is configured to generate a quality index value of the target depth according to data errors of different sampling directions at the target depth.

8. A computing device, comprising: The method comprises the following steps: A processor, a memory, a communication interface and a communication bus, the processor, the memory and the communication interface complete communication with each other through the communication bus; The memory is used for storing at least one executable instruction, and the executable instruction causes the processor to execute the corresponding operation of the quality control method of the logging-while-drilling data according to any one of claims 1-6.

9. A computer storage medium, characterized in that The storage medium stores at least one executable instruction, and the executable instruction causes the processor to execute the corresponding operation of the quality control method of the logging-while-drilling data according to any one of claims 1-6.

10. A computer program product, characterised in that, The storage medium stores at least one executable instruction, and the executable instruction causes the processor to execute the corresponding operation of the quality control method of the logging-while-drilling data according to any one of claims 1-6. The storage medium stores at least one executable instruction, and the executable instruction causes the processor to execute the corresponding operation of the quality control method of the logging-while-drilling data according to any one of claims 1-6.

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