Apparatus and method for detecting degradation of charging terminal

Abstract

The present disclosure provides an apparatus for detecting degradation of a fast charge terminal, comprising: one or more processors and a storage medium storing computer-readable instructions, where when executed by the one or more processors, the one or more processors are configured to: while performing fast charge, execute the fast charge terminal; an inter-terminal voltage caused by contact resistance between quick charge terminals respectively provided in an inlet and an outlet is measured using a terminal not used for quick charge among the terminals provided in the inlet and the outlet, and whether the quick charge terminals are degraded is determined based on the measured inter-terminal voltage.

Description

[0001] Cross-reference of related applications

[0002] This application claims priority to Korean Patent Application No. 10-2024-0074928, filed on June 10, 2024, with the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0003] This disclosure relates to equipment and methods for detecting degradation of fast charging terminals. Background Technology

[0004] When an electric vehicle is fast-charging, a large current (e.g., up to 500A) flows, so it is necessary to minimize the contact resistance between the fast-charging terminal at the outlet connected to the charging facility and the fast-charging terminal at the inlet connected to the vehicle.

[0005] However, if fast charging is performed repeatedly, the fast charging terminals will deteriorate (i.e., their condition will deteriorate) and the contact resistance will increase.

[0006] Increased contact resistance can cause arcing and heat to form at the contact points between the fast charging terminals, which can lead to melting, where the fast charging terminals stick together momentarily. Summary of the Invention

[0007] One aspect of this disclosure provides an apparatus and method for detecting degradation of fast-charging terminals, capable of detecting whether fast-charging terminals deteriorate during fast charging. One advantage of this disclosure is its ability to detect degradation before melting occurs.

[0008] According to one aspect of this disclosure, an apparatus for detecting fast charging terminal degradation includes one or more processors and a storage medium storing computer-readable instructions, wherein when the computer-readable instructions are executed by the one or more processors, the one or more processors are configured to measure the inter-terminal voltage caused by contact resistance between fast charging terminals disposed in an inlet and an outlet while performing fast charging, and to determine whether the fast charging terminal is degraded based on the measured inter-terminal voltage, wherein the voltage is measured using terminals in the inlet and outlet that are not used for fast charging.

[0009] Terminals not used for fast charging can be slow charging terminals.

[0010] One or more processors can be configured to measure voltage via a closed circuit that includes a fast charging terminal and a slow charging terminal.

[0011] The closed circuit can include a first closed circuit including a first one of the slow charging terminals and a first one of the fast charging terminals, and a second closed circuit including a second one of the slow charging terminals and a second one of the fast charging terminals.

[0012] The one or more processors can be configured to measure, through the first closed circuit, a first inter-terminal voltage caused by a first contact resistance between a first one of the fast charging terminals, and measure, through the second closed circuit, a second inter-terminal voltage caused by a second contact resistance between a second one of the fast charging terminals.

[0013] The one or more processors can be configured to determine that the fast charging terminals are deteriorated when at least one of the first inter-terminal voltage and the second inter-terminal voltage is greater than or equal to a predetermined first reference value.

[0014] The one or more processors can be configured to determine that the fast charging terminals are deteriorated when a slope of the first inter-terminal voltage or a slope of the second inter-terminal voltage is greater than or equal to a predetermined second reference value.

[0015] The slow charging terminals can be AC1 and AC2 terminals when the inlet and the outlet comply with Combined Charging System 1 (CCS1) charging connector standards.

[0016] The slow charging terminals can be any two of AC1, AC2, and AC3 terminals when the inlet and the outlet comply with CCS2 charging connector standards.

[0017] A relay can be provided in a slow charging line connected to the slow charging terminals of the inlet, and the relay is in an open state while the fast charging is performed.

[0018] According to another aspect of the disclosure, a method of detecting deterioration of fast charging terminals includes a first operation of measuring an inter-terminal voltage caused by a contact resistance between fast charging terminals provided in an inlet and an outlet while fast charging is performed, and a second operation of determining whether the fast charging terminals are deteriorated based on the measured inter-terminal voltage, wherein in the first operation, a voltage is measured using terminals provided in the inlet and the outlet that are not used for the fast charging.

[0019] The terminals not used for the fast charging can be slow charging terminals.

[0020] In the first operation, the voltage can be measured through a closed circuit including the fast charging terminals and the slow charging terminals.

[0021] The closed circuits can include a first closed circuit including a first one of the slow charging terminals and a first one of the fast charging terminals, and a second closed circuit including a second one of the slow charging terminals and a second one of the fast charging terminals.

[0022] The first operation can include an operation of measuring a first inter-terminal voltage caused by a first contact resistance between the first one of the fast charging terminals through the first closed circuit, and an operation of measuring a second inter-terminal voltage caused by a second contact resistance between the second one of the fast charging terminals through the second closed circuit.

[0023] In the second operation, when at least one of the first inter-terminal voltage and the second inter-terminal voltage is greater than or equal to a predetermined first reference value, it can be determined that the fast charging terminal is deteriorated.

[0024] In the second operation, when a slope of the first inter-terminal voltage or a slope of the second inter-terminal voltage is greater than or equal to a predetermined second reference value, it can be determined that the fast charging terminal is deteriorated.

[0025] When the inlet and the outlet comply with a Combined Charging System 1 (CCS1) charging connector standard, the slow charging terminals can be AC1 and AC2 terminals.

[0026] When the inlet and the outlet comply with a CCS2 charging connector standard, the slow charging terminals can be any two of AC1, AC2, and AC3 terminals.

[0027] A relay can be provided in a slow charging line connected to the slow charging terminals of the inlet, and the relay is in an open state while the fast charging is performed. BRIEF DESCRIPTION OF DRAWINGS

[0028] The above and other aspects, features and advantages of the present disclosure will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0029] Figure 1 is a diagram illustrating a charging system according to an embodiment of the present disclosure;

[0030] Figure 2 is a diagram illustrating a terminal configuration of a Combined Charging System 1 (CCS1) and a CCS2 among charging connector standards;

[0031] Figure 3 is a diagram illustrating a block diagram of an apparatus for detecting deterioration of a fast charging terminal according to an embodiment of the present disclosure;

[0032] Figure 4is a flowchart illustrating a method of detecting degradation of a rapid charging terminal according to an embodiment of the present disclosure; and

[0033] Figure 5 is a block diagram of a computing device according to an embodiment of the present disclosure, which can fully or partially implement a control module of an apparatus of detecting degradation of a rapid charging terminal. DETAILED DESCRIPTION

[0034] Embodiments of the present disclosure are described below with reference to the accompanying drawings. The following description is provided to assist in comprehensive understanding of a method, an apparatus, and / or a system disclosed in the summary of the invention. However, the following description is merely exemplary, and is not intended to limit the present disclosure.

[0035] In the following description of the present disclosure, detailed descriptions of known functions and configurations incorporated herein will be omitted when it is deemed that the subject matter of the present disclosure will be unnecessarily obscured. The terms used in the specification are defined in consideration of functions used in the present disclosure, and can be changed according to the intention of the client, the operator, and the user or the method of the conventional use. Therefore, the definition of the terms should be understood based on the overall description of the specification. The terms used in the following description are provided only to describe embodiments of the present disclosure, and are not intended to limit the inventive concept. Unless the context clearly indicates otherwise, as used herein, the singular forms "a," "an," and "the" are intended to include the plural forms as well. It will also be understood that the terms "comprise" or "have," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, or portions thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, portions thereof, or groups thereof.

[0036] A specific embodiment of the present disclosure will be described below with reference to the accompanying drawings.

[0037] Figure 1 is a diagram illustrating a charging system according to an embodiment of the present disclosure.

[0038] As Figure 1 indicated, the charging system can include a charging facility 110 and an electric vehicle 120. In the present disclosure, the electric vehicle 120 can include a high-voltage battery charged by the charging facility 110, and in addition to a pure electric vehicle, can include a plug-in hybrid electric vehicle (PHEV).

[0039] The charging facility 110 can be equipped with an outlet 10, and correspondingly, the electric vehicle 120 can be equipped with an inlet 20, and after the outlet 10 is connected to the inlet 20, the electric vehicle 120 can be charged by the charging facility 110. The charging facility 110 can be a slow charging facility or a rapid charging facility.

[0040] The fast charging facility supplies direct current (DC) power to the electric vehicle 120 to directly charge the high voltage battery of the electric vehicle 120, and can perform fast charging in about 30 minutes. Meanwhile, the slow charging facility can supply AC power to the electric vehicle 120, and can charge the high voltage battery using an on-board charger (OBC) in the electric vehicle 120 and can perform slow charging for about 6 to 8 hours.

[0041] In the present disclosure, while fast charging is performed, deterioration of the fast charging terminal is detected, and hereinafter, the charging facility 110 is limited to a fast charging facility.

[0042] Meanwhile, the outlet 10 and the inlet 20 can include an inlet including a plurality of terminals for fast charging and slow charging according to a charging connector standard.

[0043] Figure 2 is a diagram illustrating a configuration of terminals (pins) of a combined charging system 1 (CCS1) and CCS2 in a charging connector standard. The CCS1 can be referred to as DC Combined Type 1, and the CCS2 can be referred to as DC Combined Type 2.

[0044] As shown in Figure 2 According to the CCS1, two AC terminals L1 and L2 / N, a proximity detection (PD) terminal, a control pilot (CP) terminal, a protective earth (PE) terminal, and DC terminals DC+, DC- can be provided in the inlet. Hereinafter, the two AC terminals L1 and L2 / N are slow charging terminals, and are referred to as an AC1 terminal and an AC2 terminal, respectively. Also, the two DC terminals DC+, DC- are fast charging terminals, and are referred to as a DC1 terminal and a DC2 terminal, respectively.

[0045] Also, according to the CCS2, three AC terminals L1, L2, and L3, a neutral terminal, a PD terminal, a CP terminal, a PE terminal, and DC terminals DC+, DC- can be provided in the inlet. Similarly, the three AC terminals L1, L2, and L3 are slow charging terminals, and are referred to as an AC1 terminal, an AC2 terminal, and an AC3 terminal, respectively. Also, the two DC terminals DC+, DC- are fast charging terminals, and are referred to as a DC1 terminal and a DC2 terminal, respectively.

[0046] According to the charging connector standard, during fast charging, the fast charging terminals are used without using the slow charging terminals. Meanwhile, during slow charging, the slow charging terminals are used without using the fast charging terminals.

[0047] According to an embodiment of the present disclosure, it is possible to determine whether the fast charging terminals are deteriorated using the slow charging terminals that are not used during fast charging.

[0048] Hereinafter, a description will be given with reference toFigure 3 A detailed description of an apparatus for detecting deterioration of a fast charging terminal according to an embodiment of the disclosure.

[0049] Figure 3 is a block diagram illustrating an apparatus 300 for detecting deterioration of a fast charging terminal according to an embodiment of the disclosure.

[0050] As Figures 1 to 3 indicated, the outlet 10 on the fast charging facility 110 side includes two slow charging terminals 1, 2 and two fast charging terminals 6, 7, and the inlet 20 on the electric vehicle 120 side coupled to the outlet 10 on the fast charging facility 110 side can also include two slow charging terminals 1, 2 and two fast charging terminals 6, 7.

[0051] Each of the two fast charging terminals 6, 7 provided in the outlet 10 can be connected to the fast charging facility 110 through the fast charging lines 16, 17, and can deliver DC power provided from the fast charging facility 110 to the battery of the electric vehicle 120 through the inlet 20 while performing fast charging.

[0052] Meanwhile, each of the two slow charging terminals 1, 2 provided in the outlet 10 can be connected to the slow charging facility through the slow charging lines 11, 12. Since the slow charging terminals 1, 2 are not connected to the slow charging facility during fast charging, the slow charging lines 11, 12 connected to the slow charging terminals 1, 2 can be in an open state.

[0053] In addition, each of the two slow charging terminals 1, 2 provided in the inlet 20 is connected to the OBC via the slow charging lines 21, 22, and the slow charging lines 21, 22 can include two relays RLY1, RLY2. The two relays RLY1, RLY2 can be turned on during slow charging and turned off during fast charging.

[0054] Similarly, each of the two fast charging terminals 6, 7 provided in the outlet 10 can be connected to the fast charging facility 110 via the fast charging lines 16, 17.

[0055] In addition, each of the two fast charging terminals 6, 7 provided in the inlet 20 can be connected to the battery via the fast charging lines 26, 27, and the fast charging lines 26, 27 can include two relays RLY3, RLY4. The two relays RLY1, RLY2 can be turned on during fast charging and turned off during slow charging.

[0056] Meanwhile, the contact resistances CR1, CR2 can be contact resistances between the quick charging terminals 6, 7 provided in the outlet 10 and the quick charging terminals 6, 7 provided in the inlet 20 when the outlet 10 and the inlet 20 are connected. That is, the contact resistances CR1, CR2 can include a first contact resistance CR1 between the first quick charging terminal 6 provided in the outlet 10 and the first quick charging terminal 6 provided in the inlet 20, and a second contact resistance CR2 between the second quick charging terminal 7 provided in the outlet 10 and the first quick charging terminal 7 provided in the outlet 20.

[0057] The two voltage sensors 311, 312 can be sensors for measuring a voltage between terminals caused by the contact resistances CR1, CR2 while the quick charging is performed.

[0058] Here, among the two voltage sensors 311, 312, the first inter-terminal voltage sensor 311 can be a sensor for measuring a first inter-terminal voltage VP1 through the first contact resistance CR1, and among the two voltage sensors 311, 312, the second inter-terminal voltage sensor 312 can be a sensor for measuring a second inter-terminal voltage VP2 through the second contact resistance CR2.

[0059] The closed circuit including the quick charging terminals 6, 7 and the slow charging terminals 1, 2 can be configured to measure an inter-terminal voltage through each of the contact resistances CR1, CR2.

[0060] The closed circuits 331, 332 can include a first closed circuit 331 including a first slow charging terminal 1 among the slow charging terminals 1, 2 and a first quick charging terminal 6 among the quick charging terminals 6, 7, and a second closed circuit 332 including a second slow charging terminal 2 among the slow charging terminals 1, 2 and a second quick charging terminal 7 among the quick charging terminals 6, 7.

[0061] In order to configure the closed circuits, as shown in FIG. 3, Figure 3 For the quick charging facility 110 side, a first input terminal of the first inter-terminal voltage sensor 311 can be connected to the first slow charging line 11 opened through the first connection line CL1, and a second input terminal of the first inter-terminal voltage sensor 311 can be connected to the first quick charging line 16 through the second connection line CL2.

[0062] In addition, in the case of the quick charging facility 110 side, a first input terminal of the second inter-terminal voltage sensor 312 can be connected to the second slow charging line 12 opened through the third connection line CL3, and a second input terminal of the second inter-terminal voltage sensor 312 can be connected to the second quick charging line 17 through the fourth connection line CL4.

[0063] Meanwhile, for the electric vehicle 120 side, the first slow charging line 21 can be connected to the first fast charging line 26 through the fifth connection line CL5. In addition, the second slow charging line 22 can be connected to the second fast charging line 27 through the sixth connection line C6.

[0064] The control module 320 can detect whether the fast charging terminal 7, 6 is deteriorated based on the inter-terminal voltage VP1, VP2 caused by the contact resistance CR1, CR2 between the fast charging terminals 6, 7 measured by the voltage sensors 311, 312. To this end, the control module 320 can include a controller 321 and a storage unit 322.

[0065] The above-described control module 320 can include a processor (e.g., a computer, a microprocessor, a CPU, an ASIC, a logic circuit, etc.) and a memory storing software instructions that provide various functions when executed by the processor. Here, the processor and the memory can be implemented as separate semiconductor circuits. Alternatively, the processor and the memory can be implemented as a single integrated semiconductor circuit. There can be one or more processors.

[0066] Specifically, the controller 321 can measure the inter-terminal voltage VP1, VP2 caused by the contact resistance CR1, CR2 between the fast charging terminals 6, 7 respectively provided in the outlet 10, the inlet 20 using the two voltage sensors 311, 312 while performing fast charging, and determine whether the fast charging terminals 6, 7 are deteriorated based on the measured inter-terminal voltage VP1, VP2.

[0067] At this time, the controller 321 can measure the voltage using a terminal not used for fast charging among the terminals provided in the outlet 10, the inlet 20. Here, the terminal not used for fast charging can be a slow charging terminal 6, 7.

[0068] According to an embodiment of the disclosure, when the outlet 10, the inlet 20 comply with the CCS1 charging connector standard, the slow charging terminals can be the AC1 terminal and the AC2 terminal.

[0069] According to another embodiment of the disclosure, when the outlet 10, the inlet 20 comply with the CCS2 charging connector standard, the slow charging terminals can be any two of the AC1 terminal, the AC2 terminal, and the AC3 terminal.

[0070] Specifically, the controller 321 can measure the voltage through the closed circuits 331, 332 including the fast charging terminals 1, 2 and the slow charging terminals 6, 7 while performing the fast charging. The relays RLY1, RLY2 provided in the slow charging lines 21, 22 can be in an OFF state, and the relays RLY3, RLY4 provided in the fast charging lines 26, 27 can be in an ON state while performing the fast charging.

[0071] The closed circuits 331, 332 can include a first closed circuit 331 including a first slow charging terminal 1 of the slow charging terminals 1, 2 and a first fast charging terminal 6 of the fast charging terminals 6, 7, and a second closed circuit 332 including a second slow charging terminal 2 of the slow charging terminals 1, 2 and a second fast charging terminal 7 of the fast charging terminals 6, 7.

[0072] Specifically, the controller 321 can measure a first inter-terminal voltage VP1 caused by a first contact resistance CR1 between the first fast charging terminal 6 of the fast charging terminals 6, 7 through the first closed circuit 331, and can measure a second inter-terminal voltage VP2 caused by a second contact resistance CR2 between the second fast charging terminal 7 of the fast charging terminals 6, 7 through the second closed circuit 332.

[0073] Thereafter, the controller 321 can determine whether the fast charging terminals 6, 7 are deteriorated based on the measured inter-terminal voltages VP1, VP2.

[0074] According to an embodiment of the present disclosure, if at least one of the first inter-terminal voltage VP1 and the second inter-terminal voltage VP2 is equal to or greater than a predetermined first reference value, the controller 321 can determine that the fast charging terminals 6, 7 are deteriorated.

[0075] Here, the first reference value can be, for example, a value between twice to ten times of a voltage applied between the fast charging terminals 6, 7 in an undeteriorated state. The specific numerical value of the first reference value is merely intended to help understanding of the present disclosure, which can be differently set depending on a material of the fast charging terminals 6, 7 or a size of a direct current (DC) power source, and thus, it should be noted that it is not limited to the specific numerical value.

[0076] According to another embodiment of the present disclosure, if a slope of the first inter-terminal voltage VP1 or a slope of the second inter-terminal voltage VP2 is greater than a predetermined second reference value, the controller 321 can determine that the fast charging terminals 6, 7 are deteriorated.

[0077] Here, the second reference value can be a value between 50 V / sec and 100 V / sec. The specific numerical value of the second reference value is intended only to aid in understanding the present disclosure, which can be differently set depending on the material of the fast charging terminals 6, 7 or the size of the direct current (DC) power supply, and thus, it should be noted that it is not limited to the specific numerical value.

[0078] Meanwhile, if it is determined that the fast charging terminals 6, 7 are deteriorated, the controller 321 can reduce the charging current or stop the charging.

[0079] Meanwhile, the storage unit 322 can store a program for implementing the above-described functions of the controller 321.

[0080] As described above, according to the embodiment of the present disclosure, while the fast charging is performed, the inter-terminal voltage caused by the contact resistance between the fast charging terminals provided in the inlet and the outlet can be measured, and it can be determined whether the fast charging terminals are deteriorated using the measured inter-terminal voltage, and the voltage can be measured using the terminals not used for the fast charging, thereby detecting whether the fast charging terminals are deteriorated during the fast charging.

[0081] Meanwhile, Figure 4 is a flowchart illustrating a method of detecting deterioration of fast charging terminals according to an embodiment of the present disclosure.

[0082] Hereinafter, the method of detecting deterioration of fast charging terminals according to the embodiment of the present disclosure will be described with reference to Figures 1 to 4 However, for the sake of brevity, the description identical to that given above with reference to Figures 1 to 3 will be omitted.

[0083] With reference to Figures 1 to 4 , the method of detecting deterioration of fast charging terminals according to the embodiment of the present disclosure (S400) can start and measure the inter-terminal voltage VP1, VP2 caused by the contact resistance CR1, CR2 between the fast charging terminals 6, 7 while the fast charging is performed (S401).

[0084] Specifically, while the fast charging is performed, the inter-terminal voltage VP1, VP2 caused by the contact resistance CR1, CR2 between the fast charging terminals 6, 7 provided in the outlet 10, the inlet 20 can be measured using the two voltage sensors 311, 312.

[0085] At this time, the device 300 of detecting deterioration of fast charging terminals can measure the voltage using the terminals not used for the fast charging among the terminals provided in the outlet 10, the inlet 20. Here, the terminals not used for the fast charging can be the slow charging terminals 6, 7.

[0086] According to an embodiment of the disclosure, when the outlet 10, the inlet 20 comply with the CCS1 charging connector standard, the slow charging terminals can be the AC1 terminal and the AC2 terminal.

[0087] According to another embodiment of the disclosure, when the outlet 10, the inlet 20 comply with the CCS2 charging connector standard, the slow charging terminals can be any two of the AC1 terminal, the AC2 terminal, and the AC3 terminal.

[0088] Meanwhile, the device 300 for detecting deterioration of the fast charging terminals can measure a voltage through a closed circuit 331, 332 including the fast charging terminals 1, 2 and the slow charging terminals 6, 7 while performing fast charging.

[0089] The closed circuit 331, 332 can include a first closed circuit 331 including a first slow charging terminal 1 of the slow charging terminals 1, 2 and a first fast charging terminal 6 of the fast charging terminals 6, 7, and a second closed circuit 332 including a second slow charging terminal 2 of the slow charging terminals 1, 2 and a second fast charging terminal 7 of the fast charging terminals 6, 7.

[0090] Specifically, the device 300 for detecting deterioration of the fast charging terminals can measure a first inter-terminal voltage VP1 caused by a first contact resistance CR1 between the first fast charging terminal 6 of the fast charging terminals 6, 7 through the first closed circuit 331, and can measure a second inter-terminal voltage VP2 caused by a second contact resistance CR2 between the second fast charging terminal 7 of the fast charging terminals 6, 7 through the second closed circuit 332.

[0091] Thereafter, the device 300 for detecting deterioration of the fast charging terminals can determine whether the fast charging terminals 6, 7 are deteriorated based on the measured inter-terminal voltages VP1, VP2 (S402).

[0092] According to an embodiment of the disclosure, if at least one of the first inter-terminal voltage VP1 and the second inter-terminal voltage VP2 is greater than or equal to a predetermined first reference value, the device 300 for detecting deterioration of the fast charging terminals can determine that the fast charging terminals 6, 7 are deteriorated.

[0093] Alternatively, according to another embodiment of the disclosure, if a slope of the first inter-terminal voltage VP1 or a slope of the second inter-terminal voltage VP2 is greater than or equal to a predetermined second reference value, the device 300 for detecting deterioration of the fast charging terminals can determine that the fast charging terminals 6, 7 are deteriorated.

[0094] If it is determined in step S402 that the fast charging terminals 6, 7 are deteriorated, the device 300 for detecting deterioration of the fast charging terminals can reduce a charging current or stop charging (S403).

[0095] As described above, according to the embodiments of the disclosure, the inter-terminal voltage caused by the contact resistance between the fast charging terminals disposed in the inlet and the outlet can be measured while performing the fast charging, and it can be determined whether the fast charging terminal is deteriorated using the measured inter-terminal voltage, and here, the voltage is determined using the terminals not used for the fast charging, thereby detecting whether the fast charging terminal is deteriorated during the fast charging.

[0096] Finally, Figure 5 is a block diagram of a computing device 500 according to the embodiments of the disclosure, which can fully or partially implement the control module 320 of the apparatus 300 for detecting deterioration of the fast charging terminal.

[0097] As Figure 5 shown, the computing device 500 includes at least one processor 501, a computer-readable storage medium 502, and a communication bus 503.

[0098] The processor 501 can cause the computing device 500 to operate according to the above-described embodiments. For example, the processor 501 can execute one or more programs stored on the computer-readable storage medium 502. The one or more programs can include one or more computer-executable instructions that, when executed by the processor 501, can be configured to cause the computing device 500 to perform operations according to the embodiments described herein.

[0099] The computer-readable storage medium 502 is configured to store computer-executable instructions or program codes, program data, and / or other suitable forms of information. The program 502a stored in the computer-readable storage medium 502 includes a set of instructions executable by the processor 501. In embodiments, the computer-readable storage medium 502 can be a memory (volatile memory such as random access memory, non-volatile storage, or appropriate combinations thereof), one or more disk storage devices, optical disk storage devices, flash memory devices, or any other form of storage medium, or appropriate combinations thereof, which the computing device 500 can access and capable of storing the desired information.

[0100] The communication bus 503 interconnects various other components of the computing device 500, including the processor 501, the computer-readable storage medium 502.

[0101] The computing device 500 can also include one or more input / output interfaces 505 that provide interfaces for one or more input / output devices 504 and one or more network communication interfaces 506. The input / output interfaces 505 and the network communication interfaces 506 are connected to the communication bus 503. The network can be any one of cellular networks such as Global System for Mobile Communications (GSM), Enhanced Data Rates for GSM Evolution (EDGE), General Packet Radio Service (GPRS), Code Division Multiple Access (CDMA), Time Division CDMA (TD-CDMA), Universal Mobile Telecommunication System (UMTS), Long Term Evolution (LTE), or other cellular networks.

[0102] The input / output devices 504 can be connected to other components of the computing device 500 via the input / output interfaces 505. For example, the input / output devices 504 can include input devices such as a pointing device (such as a mouse or a touchpad), a keyboard, a touch input device (such as a touchpad or a touchscreen), a voice or sound input device, various types of sensor devices, and / or imaging devices, and / or output devices such as a display device, a printer, a speaker, and / or a network card. For example, the input / output devices 504 can be components that constitute the computing device 500 and are included in the computing device 500, or can be separate devices that are different from the computing device 500 and are connected to the computing device 500.

[0103] According to an embodiment of the disclosure, the inter-terminal voltage caused by the contact resistance between the fast charging terminals disposed in the inlet and the outlet can be measured while performing fast charging, and it can be determined whether the fast charging terminals are deteriorated using the measured inter-terminal voltage, and here, the voltage can be measured using terminals that are not used for fast charging, thereby detecting whether the fast charging terminals are deteriorated during fast charging.

[0104] Meanwhile, the embodiments of the disclosure can include a program for executing the methods described in the specification on a computer and a computer-readable recording medium including the program. The computer-readable recording medium can include program instructions, local data files, local data structures, etc., alone or in combination. The medium can be those specifically designed and configured for the disclosure, or those commonly available in the computer software field. Examples of the computer-readable recording medium include magnetic media such as hard disks, floppy disks, and magnetic tapes, optical recording media such as CD-ROMs and DVDs, and hardware devices specifically configured to store and execute program instructions, such as ROMs, RAMs, flash memories, etc. Examples of the program can include not only machine language codes such as generated by a compiler, but also high-level language codes that can be executed by a computer using an interpreter, etc.

[0105] While the present disclosure has been particularly shown and described with reference to embodiments thereof, it will be understood by those skilled in the art that various changes in form and details can be made therein without departing from the spirit and scope of the present disclosure. Therefore, the scope of the present disclosure is defined not by the embodiments described above, but by the scope of the appended claims and their equivalents.

Claims

1. A device for detecting the degradation of fast charging terminals, the device comprising: One or more processors; as well as Storage media that store computer-readable instructions. Wherein, when the computer-readable instructions are executed by the one or more processors, the one or more processors are configured to: While performing fast charging, the inter-terminal voltage caused by the contact resistance between the fast charging terminals located at the inlet and outlet is measured; and Degradation of fast charging terminals can be determined based on measured inter-terminal voltage. The voltage is measured using a terminal that is not used for fast charging, which is located in the terminals of the inlet and the outlet.

2. The device according to claim 1, wherein, The terminal not used for fast charging is the slow charging terminal.

3. The device according to claim 2, wherein, The one or more processors are configured to: The voltage is measured using a closed circuit that includes the fast charging terminal and the slow charging terminal.

4. The device according to claim 3, wherein, The closed circuit includes: The first closed circuit includes a first slow charging terminal in the slow charging terminals and a first fast charging terminal in the fast charging terminals; and The second closed circuit includes a second slow charging terminal in the slow charging terminal and a second fast charging terminal in the fast charging terminal.

5. The device according to claim 4, wherein, The one or more processors are configured to: The first closed circuit is used to measure the first inter-terminal voltage caused by the first contact resistance between the first fast charging terminals in the fast charging terminals, and the second closed circuit is used to measure the second inter-terminal voltage caused by the second contact resistance between the second fast charging terminals in the fast charging terminals.

6. The device according to claim 5, wherein, The one or more processors are configured to: When at least one of the first terminal voltage and the second terminal voltage is greater than or equal to a predetermined first reference value, the fast charging terminal is determined to be degraded.

7. The device according to claim 5, wherein, The one or more processors are configured to: When the slope of the voltage between the first terminal or the slope of the voltage between the second terminal is greater than or equal to a predetermined second reference value, the fast charging terminal is determined to be degraded.

8. The device according to claim 2, wherein, When the inlet and the outlet conform to the Combined Charging System 1 (CCS1) charging connector standard, the slow charging terminals are AC1 and AC2 terminals.

9. The device according to claim 2, wherein, When the inlet and the outlet conform to the Combined Charging System 2 (CCS2) charging connector standard, the slow charging terminal is any two of the AC1 terminal, AC2 terminal, and AC3 terminal.

10. The device according to claim 2, wherein, A relay is provided in the slow charging line connected to the slow charging terminal of the inlet, and the relay is in an open state while fast charging is being performed.

11. A method for detecting degradation of fast charging terminals, the method comprising the following steps: A first operation is performed while fast charging is being executed, measuring the inter-terminal voltage caused by the contact resistance between the fast charging terminals respectively located in the inlet and outlet. as well as The second operation involves determining whether the fast charging terminal has deteriorated based on the measured inter-terminal voltage. In the first operation, the voltage is measured using a terminal that is not used for fast charging, which is located in the terminals of the inlet and the outlet.

12. The method according to claim 11, wherein, The terminal not used for fast charging is the slow charging terminal.

13. The method according to claim 12, wherein, In the first operation, the voltage is measured by a closed circuit including the fast charging terminal and the slow charging terminal.

14. The method according to claim 13, wherein, The closed circuit includes: The first closed circuit includes a first slow charging terminal in the slow charging terminals and a first fast charging terminal in the fast charging terminals; and The second closed circuit includes a second slow charging terminal in the slow charging terminal and a second fast charging terminal in the fast charging terminal.

15. The method according to claim 14, wherein, The first operation includes: The operation of measuring the first inter-terminal voltage caused by the first contact resistance between the first fast charging terminals in the first fast charging terminal through the first closed circuit; and The operation of measuring the second terminal voltage caused by the second contact resistance between the second fast charging terminals in the second closed circuit.

16. The method according to claim 15, wherein, When at least one of the first terminal voltage and the second terminal voltage is greater than or equal to a predetermined first reference value, the fast charging terminal is determined to be degraded.

17. The method according to claim 15, wherein, In the second operation, when the slope of the voltage between the first terminal or the slope of the voltage between the second terminal is greater than or equal to a predetermined second reference value, it is determined that the fast charging terminal is degraded.

18. The method according to claim 12, wherein, When the inlet and the outlet conform to the Combined Charging System 1 (CCS1) charging connector standard, the slow charging terminals are AC1 and AC2 terminals.

19. The method according to claim 12, wherein, When the inlet and the outlet conform to the Combined Charging System 2 (CCS2) charging connector standard, the slow charging terminal is any two of the AC1 terminal, AC2 terminal, and AC3 terminal.

20. The method according to claim 12, wherein, A relay is provided in the slow charging line connected to the slow charging terminal of the inlet, and the relay is in an open state while fast charging is being performed.

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