System and method for predictive assembly

Abstract

The invention relates to a system and method for predictive assembly. A system for predictive assembly includes a model generator, a model analyzer, and an assembly planner. The model generator generates a first model of the first component and a second model of the second component before the first component and the second component are coupled together. A model analyzer analyzes the first model and the second model to determine a dimension of a gap between a first mating surface of the first component and a second mating surface of the second component after the first component and the second component are coupled together. The assembly planner recommends an action based on a comparison of the gap to a gap threshold.

Description

TECHNICAL FIELD

[0001] The present disclosure relates generally to predictive assembly, and more specifically to systems and methods for predictive assembly based on predicted gaps between mating surfaces. BACKGROUND

[0002] Various surfaces mate when coupling parts together during the manufacture of an object. In some cases, after coupling together, there is one or more gaps between the mating surfaces. However, certain manufacturing requirements can not allow for gaps greater than a certain threshold or gaps to be filled. As such, gaps that exceed the threshold can require disassembly and re-manufacturing of one or both of the parts. While there are techniques for predicting gaps between mating surfaces, conventional predictive assembly methods can not adequately predict the size of the gap when one or more of the parts has a geometry during measurement that is different than its geometry after coupling to another part. Accordingly, those skilled in the art continue with research and development efforts in the field of predictive assembly. SUMMARY

[0003] Examples of systems for predictive assembly, methods for predictive assembly, and computer program products for predictive assembly are disclosed. The following is a non-exhaustive list of examples that can or can not be claimed in accordance with the subject matter of the present disclosure.

[0004] In one example, the disclosed system includes a model generator, a model analyzer, and an assembly planner. The model generator generates a first model of a first part and a second model of a second part before the first part and the second part are coupled together. The model analyzer analyzes the first model and the second model to determine a size of a gap between a first mating surface of the first part and a second mating surface of the second part after the first part and the second part are coupled together. The assembly planner recommends an action based on a comparison of the gap to a gap threshold.

[0005] In one example, the disclosed method includes the steps of: (1) generating a first model of a first part and generating a second model of a second part before the first part and the second part are coupled together; (2) filtering out a deformation of at least one of the first part and the second part before the first part and the second part are coupled together; and (3) determining a size of a gap between a first mating surface of the first part and a second mating surface of the second part after the first part and the second part are coupled together; and (4) recommending an action based on the size of the gap.

[0006] In another example, the disclosed method includes the steps of: (1) generating a first model of a first component and a second model of a second component prior to the first component and the second component being coupled together; (2) analyzing the first model and the second model to determine a size of a gap between a first mating surface of the first component and a second mating surface of the second component after the first component and the second component are coupled together; and (3) recommending an action based on a comparison of the gap to a gap threshold.

[0007] In one example, the disclosed computer program product includes a non-transitory computer-readable medium including program code, when executed by one or more processors, causes the one or more processors to perform operations comprising: (1) generating a first model of a first component from first data before the first component is coupled to a second component; (2) generating a second model of the second component from second data before the second component is coupled to the first component; (3) determining a first overall deviation between the first model of the first component and a first nominal model in a normal direction; (4) determining a second overall deviation between the second model of the second component and a second nominal model in the normal direction; (5) performing a best-fit alignment between the first model of the first component and the first nominal model to determine the first overall deviation; (6) performing a best-fit alignment between the second model of the second component and the second nominal model to determine the second overall deviation; (7) determining a first overall size of the first overall deviation in the normal direction; (8) determining a second overall size of the second overall deviation in the normal direction; (9) mapping the first overall deviation from an XYZ coordinate system to a UVW coordinate system such that a first value of a first size of the first overall deviation is represented along a W-axis; (10) mapping the second overall deviation from the XYZ coordinate system to the UVW coordinate system such that a second value of a second size of the second overall deviation is represented along the W-axis; (11) filtering the first value of the first size of the first overall deviation into a first form deviation and a first waviness deviation; (12) filtering the second value of the second size of the second overall deviation into a second form deviation and a second waviness deviation; (13) mapping the first waviness deviation from the UVW coordinate system to the XYZ coordinate system such that a first value of a first waviness size of the first waviness deviation is represented as a first distance relative to the first nominal model; (14) mapping the second waviness deviation from the UVW coordinate system to the XYZ coordinate system such that a second value of a second waviness size of the second waviness deviation is represented as a second distance relative to the second nominal model; (15) modifying the first nominal model of the first component by the first waviness deviation such that the first modified nominal model represents a first mating surface of the first component after the first component and the second component are coupled together; (16) modifying the second nominal model of the second component by the second waviness deviation such that the second modified nominal model represents a second mating surface of the second component after the first component and the second component are coupled together; (17) analyzing the first modified nominal model and the second modified nominal model to determine a size of a gap between the first mating surface of the first component and the second mating surface of the second component after the first component and the second component are coupled together; and recommending an action based on a comparison of the gap to a gap threshold, wherein the action comprises one of: coupling the first component and the second component together when the size of the gap is less than or equal to the gap threshold; re-machining at least one of the first component and the second component when the size of the gap is greater than the gap threshold;redesigning at least one of the first component and the second component when the size of the gap is greater than the gap threshold; and repairing at least one of the first component and the second component when the size of the gap is greater than the gap threshold.

[0008] In one example, the disclosed system implements the disclosed method.

[0009] In one example, the disclosed computer program product implements the disclosed method.

[0010] In one example, the disclosed method is performed using an example of the disclosed system or the disclosed computer program product.

[0011] In one example, a portion of an aircraft is manufactured and assembled using the disclosed system or the disclosed computer program product or in accordance with the disclosed method.

[0012] Other examples of assemblies, connection components, and methods will become apparent from the following detailed description, drawings, and appended claims. BRIEF DESCRIPTION OF DRAWINGS

[0013] Figure 1 is a schematic block diagram of an example of a manufacturing environment;

[0014] Figure 2A and Figure 2B is a schematic block diagram of an example of an analysis environment;

[0015] Figure 3 is a schematic diagram of an example of an aircraft;

[0016] Figure 4 is a schematic diagram of an example of a portion of an object manufactured by joining components;

[0017] Figure 5 is a graphical illustration of an example of a portion of a first nominal model representing a first component and a portion of a second nominal model representing a second component;

[0018] Figure 6 is a graphical illustration of an example of a portion of a first model representing a first component and a portion of a second model representing a second component;

[0019] Figure 7 is a graphical illustration of an example of a portion of a first model representing a first component and a portion of a second model representing a second component;

[0020] Figure 8 is a graphical illustration of an example of a portion of a first modified nominal model representing a first component and a portion of a second modified nominal model representing a second component;

[0021] Figure 9 is a graphical illustration of an example of overall bias between the first model and the nominal model in the XYZ coordinate system;

[0022] Figure 10 is a graphical illustration of an example of overall bias between the first model and the nominal model in the UVW coordinate system;

[0023] Figure 11 is a graphical illustration of an example of form bias between the first model and the nominal model in the UVW coordinate system;

[0024] Figure 12 is a graphical illustration of an example of waviness bias between the first model and the nominal model in the UVW coordinate system;

[0025] Figure 13 is a graphical illustration of an example of waviness bias between the first model and the nominal model in the XYZ coordinate system;

[0026] Figure 14 is a flowchart of an example of a method for predictive assembly;

[0027] Figure 15 is a flowchart of an example of a method for predictive assembly;

[0028] Figure 16 is a block diagram of an example of a data processing system;

[0029] Figure 17 is a flowchart of an example of an aircraft manufacturing method; and

[0030] Figure 18 is a schematic block diagram of an example of an aircraft. DETAILED DESCRIPTION

[0031] Reference is made generally to Figures 1 to 15 The present disclosure relates to, as an example, systems 100 and methods 1000, 2000 for predictive assembly. More specifically, the systems and methods relate to proactive predictive assembly, which for the purposes of the present disclosure refers to improvements in the predictive assembly method by which pre-assembly distortions of components can be eliminated and the geometry (e.g., size, shape, dimensions, etc.) of the gaps between mating surfaces after assembly can be predicted and preventative actions can be taken. As an example, pre-assembly distortions of components are “filtered out” from three-dimensional (3D) measurement data of the components, thereby enabling the 3D measurement data to be used to proactively predict the size of the gaps between mating surfaces of the components being joined.

[0032] The present disclosure recognizes that traditional assembly methods can not accurately capture variations in surfaces of components being joined. The present disclosure also recognizes that traditional predictive assembly can not adequately account for deformation of components at the time of measurement, resulting in excessive gaps after assembly. Thus, it is only after assembly and measurement of gaps that it can be determined whether manufacturing tolerances are met. Accordingly, it is desirable to have systems and methods for predicting gaps between surfaces that account for deformation and recommending actions based on the predicted gaps.

[0033] The disclosed systems and methods utilize data filtering, such as a robust Gaussian area regression filter, on 3D measurement data representing components to robustly filter out deformation of the components while preserving waviness (e.g., peaks and valleys) of mating surfaces related to gaps between surfaces. Shapes representing waviness (e.g., direction and size of dimensions) are shifted to accurately predict any gaps prior to assembly of components.

[0034] Figure 1 An example of a manufacturing environment 172 is shown. The manufacturing environment 172 is an example of a manufacturing environment in which an object 180 is manufactured.

[0035] In one or more examples, the object 180 includes or is manufactured using a plurality of components, such as at least a first component 106 and a second component 110. In various other examples, any number of other components can also be used to form or manufacture the object 180. The first component 106 includes a first mating surface 118, and the second component 110 includes a second mating surface 120. As used herein, a “surface” refers to a continuous surface or a discontinuous surface formed from a plurality of surfaces.

[0036] In one or more examples, the first component 106 and the second component 110 are joined, attached, or otherwise coupled together such that the first mating surface 118 and the second mating surface 120 mate together. For example, the first component 106 and the second component 110 are joined, and thus the first mating surface 118 and the second mating surface 120 are mated using any suitable joining process 194.

[0037] In one or more examples, the joining process 194 includes any number of operations configured to physically attach the first component 106 and the second component 110 such that the first mating surface 118 and the second mating surface 120 mate together. For example, and without limitation, the joining process 194 can include at least one of securing, bonding, mounting, welding, fastening, pinning, stitching, stapling, strapping, gluing, or otherwise coupling the first component 106 and the second component 110 together.

[0038] In one or more examples, the first component 106 and the second component 110 are made of any suitable material or combination of materials. In one or more examples, the first component 106 and the second component 110 are made of the same material. In one or more examples, the first component 106 and the second component 110 are made of different materials. For example, and without limitation, the first component 106 and the second component 110 can be made of a metallic material, a composite material, a polymeric material, a combination thereof, or the like.

[0039] In one or more examples, the first component 106 and thus each first mating surface 118 has a first shape 146. In one or more examples, the second component 110 and thus the second mating surface 120 has a second shape 246.

[0040] For purposes of the present disclosure and as used herein, the “shape” of a component or surface refers to the geometry of the component or surface, the dimensions of the component or surface, and the morphology of the component or surface. As an example, the shape of a component or surface is the three-dimensional shape of the component or surface.

[0041] In one or more examples, the first shape 146 includes a first form 198 and a first waviness 184. In one or more examples, the second shape 246 includes a second form 298 and a second waviness 284.

[0042] For purposes of the present disclosure and as used herein, “form” refers to the overall or global shape of a component or surface. For purposes of the present disclosure and as used herein, “waviness” refers to local variations or undulations in the shape of a component or surface.

[0043] In one or more examples, the first shape 146 and thus the first mating surface 118 of the first component 106 can change throughout the assembly of the object 180, e.g., from manufacturing to assembly. In one or more examples, the second component 110 and thus the second mating surface 120 can change throughout the assembly of the object 180, e.g., from manufacturing to assembly.

[0044] In one or more examples, the first component 106 and thus the first mating surface 118 has a first initial shape 174 (e.g., the first shape 146 before the joining process 194) and a first assembled shape 176 (e.g., the first shape 146 after the joining process 194). In one or more examples, the second component 110 and thus the second mating surface 120 can have a second initial shape 274 (e.g., the second shape 246 before the joining process 194) and a second assembled shape 276 (e.g., the second shape 246 after the joining process 194).

[0045] In one or more examples, at least one of the first component 106 and the second component 110, and thus at least one of the first mating surface 118 and the second mating surface 120, can experience or exhibit a degree of shape deformation at some point between the manufacture and assembly (e.g., joining) of the object 180. As an example, the first component 106, and thus the first mating surface 118, can experience or exhibit a degree of first deformation 162 in the first shape 146. As an example, the second component 110, and thus the second mating surface 120, can experience or exhibit a degree of second deformation 262 in the second shape 246.

[0046] For the purposes of the present disclosure and as used herein, “deformation” refers to a temporary change in shape form. In the examples disclosed herein, the deformation is substantially eliminated from the shape of the components after the assembly of the object 180 or as a result of the assembly of the object 180 (e.g., after the process 194). As an example, the first deformation 162 is represented in the first initial shape 174 and not in the first assembled shape 176. As an example, the second deformation 262 is represented in the second initial shape 274 and not in the second assembled shape 276.

[0047] In one or more examples, the first component 106 is susceptible to experiencing or exhibiting a degree of first deformation 162 (e.g., global deformation) after manufacture, such that the first mating surface 118 also exhibits a degree of first deformation 162. As an example, the first component 106 can be flexible, such that the first mating surface 118 is also flexible. As an example, the first component 106 can temporarily bend, deform, flex, sag, or otherwise change shape without causing any undesirable permanent effects to the first component 106 or the first mating surface 118.

[0048] In one or more examples, the second component 110 is susceptible to experiencing or exhibiting a degree of second deformation 262 (e.g., global deformation) after manufacture, such that the second mating surface 120 also exhibits a degree of second deformation 262. As an example, the second component 110 can be flexible, such that the second mating surface 120 is also flexible. As an example, the second component 110 can temporarily bend, deform, flex, sag, or otherwise change shape without causing any undesirable permanent effects to the second component 110 or the second mating surface 120.

[0049] This non-permanent change in shape (e.g., deformation) can be due to many factors, such as the dimensions, geometry, weight, etc. of the components after manufacture, boundary conditions, gravity, etc. Thus, in these examples, the shape of the components, and thus the mating surfaces, can change throughout the manufacturing process of the object 180.

[0050] As an example, the first component 106, and thus the first mating surface 118, can have a first initial shape 174 prior to assembly of the object 180, and a first assembled shape 176 after assembly of the object 180. In these examples, the first initial shape 174 and the first assembled shape 176 are different, and are a result of the first deformation 162.

[0051] As an example, the second component 110, and thus the second mating surface 120, can have a second initial shape 274 prior to assembly of the object 180, and a second assembled shape 276 after assembly of the object 180. In these examples, the second initial shape 274 and the second assembled shape 276 are different, and are a result of the second deformation 262.

[0052] In other examples, the second component 110 does not readily undergo or exhibit the second deformation 262 after manufacture, such that the second mating surface 120 also does not exhibit the second deformation 262. As an example, the second component 110 can be rigid, such that the second mating surface 120 is also rigid. As an example, the second component 110 can not be able to bend, deform, flex, sag, or otherwise change shape without causing any undesirable permanent effects to the second component 110 or the second mating surface 120. Thus, in these examples, the second shape 246 of the second component 110, and thus the second mating surface 120, can not change throughout the manufacturing process of the object 180. As an example, the second component 110, and thus the second mating surface 120, can have a second initial shape 274 prior to assembly of the object 180, and a second assembled shape 276 after assembly of the object 180. In these examples, the second initial shape 274 and the second assembled shape 276 are substantially the same.

[0053] In one or more examples, the second component 110 provides or serves as a support structure for the object 180 to which the first component 106 is coupled. Thus, after coupling the first component 106 and the second component 110 together, the first component 106, and thus the first mating surface 118, has the first assembled shape 176. As an example, the assembly forces can pull the first deformation 162 out of the first component 106 during assembly of the object 180. In these examples, the size of the difference between the first initial shape 174 and the first assembled shape 176 can be due to a number of factors, such as the load and / or forces applied to the first component 106 during the joining process 194, the number of attachment points between the first component 106 and the second component 110, the orientation of the first component 106 and / or the second component 110, and other factors that can affect the first shape 146 of the first component 106 before, during, and / or after the joining process 194.

[0054] In one or more examples, a number of gaps 116 can exist between the first mating surface 118 and the second mating surface 120. As used herein, "a number of" means one or more. In this manner, the number of gaps 116 includes one gap 116 or a plurality of gaps 116. For purposes of the present disclosure, a "gap" refers to an open space between mating surfaces of components that form the object 180. Thus, the gap 116 can also be referred to as a space.

[0055] In one or more examples, the gap 116 (e.g., each of the number of gaps 116) has a dimension 114. Generally, the dimension 114 of the gap 116 refers to a measurable parameter or shape of the gap 116, such as its thickness, length, width, etc. More specifically, the dimension 114 of the gap 116 refers to the thickness of the gap 116 or the linear distance between the first mating surface 118 and the second mating surface 120.

[0056] In some cases, it is desirable to predict the dimension 114 of the gap 116 prior to manufacturing and / or shipping the components, prior to the joining process 194, and / or prior to assembling the object 180, and to proactively modify the assembly operations, joining processes, component designs, etc. as needed. Thus, it is desirable to predict the dimension 114 (e.g., 3D shape information) of the gap 116 that will be formed between the first mating surface 118 and the second mating surface 120. In other words, the gap 116 will be formed after the first component 106 and the second component 110 are coupled together. The gap 116 is predicted prior to the first component 106 and the second component 110 being coupled together.

[0057] Thus, as disclosed herein, the system 100 for predictive assembly is used to predict the dimension 114 of the gap 116, the number of gaps 116, and other information related to the gap 116, and to determine recommended (e.g., preventative or corrective) manufacturing actions based on the gap prediction prior to manufacturing the components and / or prior to assembling the components to form the object. Figure 2A and Figure 2B ) to predict the dimension 114 of the gap 116, the number of gaps 116, and other information related to the gap 116, and to determine recommended (e.g., preventative or corrective) manufacturing actions based on the gap prediction prior to manufacturing the components and / or prior to assembling the components to form the object.

[0058] Figure 2A and Figure 2B (collectively referred to herein as Figure 2A , Figure 2B ) illustrate an example of the analysis environment 182. The analysis environment 182 is where the system 100 is implemented to proactively predict the gap 116 Figure 1) of the first component 106. In one or more examples, the analysis environment 182 is remote from or in a separate location relative to the manufacturing environment 172. However, in other examples, at least a portion of the system 100 is located in or implemented in the manufacturing environment 172, and at least another portion of the system 100 is located in or implemented in the analysis environment 182. In other examples, the entirety of the system 100 is implemented in the manufacturing environment 172.

[0059] In one or more examples, the system 100 includes or is implemented using a computer 148. For example, the system 100 is a computer-implemented system. In one or more examples, the computer 148 executes instructions 170 to perform operations performed by the system 100. In these examples, the computer 148 can include one or more computers, computing devices, or computing systems. When the computer 148 includes more than one computer, the computers can communicate with each other using any number of wired, wireless, optical, or other types of communication links.

[0060] In one or more examples, the system 100 includes a model generator 102. The model generator 102 generates (e.g., is configured or adapted to generate) a first model 104 of a first component 106. The model generator 102 also generates (e.g., is configured or adapted to generate) a second model 108 of a second component 110. Figure 1 ) of the second component 110. Figure 1 ) of the second component 110.

[0061] In one or more examples, the first model 104 is generated prior to the first component 106 and the second component 110 being coupled together. In one or more examples, the first model 104 represents the first component 106, and thus the first mating surface 118 having a first initial shape 174.

[0062] In one or more examples, the first initial shape 174 of the first component 106 is different than a first assembled shape 176 (e.g., a final shape after the joining process 194). In one or more examples, the first initial shape 174 includes a first deformation 162 in the first shape 146 of the first component 106 (e.g., the first component 106 is flexible).

[0063] In one or more examples, the second model 108 is generated prior to the first component 106 and the second component 110 being coupled together. In one or more examples, the second model 108 represents the second component 110, and thus the second mating surface 120 having a second initial shape 274.

[0064] In one or more examples, the second initial shape 274 of the second component 110 is different than the second assembled shape 276 (e.g., the final shape after the joining process 194). In one or more examples, the second initial shape 274 includes the second deformation 262 in the second shape 246 of the second component 110 (e.g., the second component 110 is flexible).

[0065] In one or more examples, the second initial shape 274 of the second component 110 is the same as the second assembled shape 276 (e.g., the final shape after the joining process 194). In one or more examples, the second initial shape 274 does not include the second deformation 262 in the second shape 246 of the second component 110 (e.g., the second component 110 is rigid).

[0066] In one or more examples, the system 100 includes a model analyzer 112. The model analyzer 112 analyzes (e.g., is configured or adapted to analyze) the first model 104 and the second model 108 to determine (e.g., predict) a dimension 114 of a gap 116 that will be formed between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together (e.g., after the joining process 194).

[0067] As used herein, singular use of the term “dimension” can refer to a single dimension (e.g., the dimension 114) or one or more of multiple dimensions (e.g., multiple dimensions 114) of one or more gaps 116. Also, as used herein, singular use of the term “gap” can refer to a single gap (e.g., the gap 116) or one or more of multiple gaps (e.g., multiple gaps 116).

[0068] In instances where mating surfaces of coupled components can change shape upon assembly, examples of the system 100 account for the assembled shape of the components and predict gap geometry based on the manufactured shape of the components. In one or more examples, the system 100 facilitates prospectively eliminating the first deformation 162 from the first shape 146 of the first component 106 during a predictive assembly operation. In one or more examples, the system 100 facilitates prospectively eliminating the second deformation 262 from the second shape 246 of the second component 110 during a predictive assembly operation.

[0069] Examples of the systems 100 and methods 1000, 2000 disclosed herein enable the prediction of the size 114 of a gap 116 to be formed between the first mating surface 118 and the second mating surface 120. The prediction of the size 114 of the gap 116 is performed using approximations of a first assembly shape 176 of the first component 106 and / or a second assembly shape 276 of the second component 110 (e.g., the final shape after the joining process 194). When the predicted size 114 of the gap 116 is larger than the size allowed based on manufacturing specifications or tolerances, such prediction of the size 114 of the gap 116 enables, if necessary, proactive and / or preventative modifications to the manufacturing process. Therefore, examples of the systems 100 and methods 1000, 2000 disclosed herein improve manufacturing speed, cost, and efficiency, and reduce the amount of waste associated with non-conforming parts.

[0070] In one or more examples, system 100 includes an assembly planner 210. The assembly planner 210 compares (e.g., configured or adapted to compare) a predicted size 114 of gap 116 with a gap threshold 214. The assembly planner 210 also recommends (e.g., configured or adapted to recommend) an action 212 based on the comparison between gap 116 (e.g., size 114) and gap threshold 214.

[0071] For the purposes of this disclosure and as used herein, clearance threshold 214 refers to a specific limit or point that must be met before a determination or action is taken. Clearance threshold 214 may refer to any measurable parameter or characteristic of the clearance or space between the mating surfaces of the components and may be based on manufacturing design, specifications, and / or tolerances. As an example, clearance threshold 214 is a dimensional threshold (e.g., dimensional threshold 216) representing the maximum permissible distance (e.g., clearance size) between the mating surfaces of the components after engagement.

[0072] If the predicted size 114 of the gap 116 is equal to or less than the size threshold 216 of the gap threshold 214, action 212 (e.g., recommended by the assembly planner 210) can continue the assembly of the component and object 180. Figure 1 However, if the predicted size 114 of the gap 116 is equal to or greater than the size threshold 216 of the gap threshold 214, action 212 (e.g., recommended by the assembly planner 210) may be a rework process before manufacturing the part or before joining the part and assembling the object 180.

[0073] In one or more examples, the action 212 recommended by the assembly planner 210 includes joining the first component 106 and the second component 110 together when the size 114 of the gap 116 is less than or equal to the gap threshold 214.

[0074] In one or more examples, the action 212 recommended by the assembly planner 210 includes reworking at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In these examples, reworking includes re-making or manufacturing a new instance of the first component 106 and / or the second component 110.

[0075] In one or more examples, the action 212 recommended by the assembly planner 210 includes re-designing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In these examples, re-designing includes making changes to the design, specifications, and / or tolerances of the first component 106, the second component 110, and / or a structural assembly (e.g., the object 180) that includes the first component 106 and the second component 110.

[0076] In one or more examples, the action 212 recommended by the assembly planner 210 includes repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In these examples, repairing includes modifying at least one of the first mating surface 118 of the first component 106 and / or the second mating surface 120 of the second component 110, such as by sanding or other surface treatment, to reduce or eliminate the gap 116.

[0077] Figure 3 An example of an aircraft 1200 is shown. In one or more examples, the aircraft 1200 includes a fuselage 1218 (e.g., a body) and a wing 1220 attached to the fuselage 1218. The aircraft 1200 includes a propulsion system 1208 (e.g., an engine) attached to the wing 1220, for example. The fuselage 1218 has a nose portion 1222 and a tail portion 1224. The aircraft 1200 includes a horizontal stabilizer 1228 and a vertical stabilizer 1226 attached to the tail portion 1224.

[0078] Reference is made to Figure 1 and Figure 3 In one or more examples, the fuselage 1218 is an example of the object 180. The fuselage 1218 includes an outer barrel 1230 and an internal frame 1232. In these examples, the barrel 1230 is an example of the first component 106 and the frame 1232 is an example of the second component 110. The frame 1232 is coupled to the barrel 1230 and serves as a support structure for the fuselage 1218. It can be appreciated that, prior to the frame 1232 being coupled to the barrel 1230, an initial shape of the barrel 1230 can exhibit a deformation 162 due to the size and weight of the barrel 1230. After the frame 1232 is coupled to the barrel 1230, the barrel 1230 can have a final shape that is different from the initial shape.

[0079] In one or more examples, the wing 1220 is an example of the object 180. The wing 1220 can also be referred to as a wing structure or a wing box. The wing 1220 includes an outer panel assembly 1234 and an inner stiffener assembly 1236. The panel assembly 1234 includes a number of panels and can also be referred to as a wing skin. The stiffener assembly 1236 includes a number of spars, ribs, etc. In these examples, the panel assembly 1234 is an example of the first component 106 and the stiffener assembly 1236 is an example of the second component 110. The stiffener assembly 1236 is coupled to the panel assembly 1234 and acts as a support structure for the wing 1220. It can be appreciated that prior to the stiffener assembly 1236 being coupled to the panel assembly 1234, the initial shape of the panel assembly 1234 can exhibit a deformation 162 due to the size and weight of the panel assembly 1234. After the stiffener assembly 1236 is coupled to the panel assembly 1234, the panel assembly 1234 can have a final shape that is different from the initial shape.

[0080] Figure 4 An example of a portion of the object 180 formed from the first component 106 coupled to the second component 110 is shown. When the first component 106 coupled to the second component 110 are coupled together, the first mating surface 118 and the second mating surface 120 mate. After the first component 106 coupled to the second component 110 are coupled together and the first mating surface 118 and the second mating surface 120 mate, a number of gaps 116 can be formed between the first mating surface 118 and the second mating surface 120.

[0081] Figure 5 An example of the first nominal model 124 and the second nominal model 224 and the gaps 116 formed between the first mating surface 118 and the second mating surface 120 represented by the first nominal model 124 and the second nominal model 224 is shown graphically. In the example shown, the first nominal model 124 represents the first component 106 as designed and after the object 180 is assembled (e.g., prior to the joining process 194), such as at least a portion of the first mating surface 118. The second nominal model 224 represents the second component 110 as designed and after the object 180 is assembled (e.g., prior to the joining process 194), such as at least a portion of the second mating surface 120. As shown, the gaps 116 between the first mating surface 118 and the second mating surface 120 are within (e.g., less than) an acceptable gap threshold 214 determined based on design specifications and / or tolerances for the object 180.

[0082] Figure 6An example of the first model 104 and the second model 108 and a size 114 of the gap 116 between the first mating surface 118 and the second mating surface 120 represented by the first model 104 and the second model 108 is shown graphically. In the example shown, the first model 104 represents the first component 106 as manufactured but prior to assembling the object 180 (e.g., prior to the joining process 194), such as at least a portion of the first mating surface 118. The second model 108 represents the second component 110 as manufactured but prior to assembling the object 180 (e.g., prior to the joining process 194), such as at least a portion of the second mating surface 120. As shown, the gap 116 between the first mating surface 118 and the second mating surface 120 is outside of an acceptable gap threshold 214 determined based on design specifications and / or tolerances of the object 180 (e.g., greater than the acceptable gap threshold 214).

[0083] In one or more examples, the first model 104 represents the first component 106 and the first mating surface 118 in a first initial shape 174 (e.g., a shape prior to the joining process 194). In one or more examples, the second model 108 represents the second component 110 and the second mating surface 120 in a second initial shape 274 (e.g., a shape prior to the joining process 194).

[0084] As an example, the first initial shape 174 includes a first deformation 162 and a first waviness 184 in the first shape 146 Figure 1 ). For example, the first component 106 is flexible and experiences a degree of the first deformation 162 (e.g., a global change in the first form 198), and the first mating surface 118 includes the first waviness 184 (e.g., a local change in a surface profile) represented by the first model 104.

[0085] As an example, the second initial shape 274 includes a second deformation 262 and a second waviness 284 in the second shape 246. For example, the second component 110 is flexible and experiences a degree of the second deformation 262 (e.g., a global change in the second form 298), and the second mating surface 120 includes the second waviness 284 (e.g., a local change in a surface profile) represented by the second model 108.

[0086] As another example, the second initial shape 274 does not include the second deformation 262 and the second waviness 284 in the second shape 246. For example, the second component 110 is rigid and does not experience the second deformation 262, and the second mating surface 120 does not include the second waviness 284.

[0087] As another example, the second initial shape 274 does not include the second deformation 262 in the second shape 246, but instead includes a second waviness 284 in the second shape 246. For example, the second component 110 is rigid and does not experience the second deformation 262, and the second mating surface 120 includes the second waviness 284.

[0088] As Figure 6 shown, the gap 116 formed between the first mating surface 118 and the second mating surface 120 after the joining process 194 is represented by the space between the representations of the first mating surface 118 and the second mating surface 120 in the first model 104 and the second model 108, respectively. The size 114 of the gap 116 is estimated or calculated from the linear distance between the representations of the first mating surface 118 and the second mating surface 120 in the first model 104 and the second model 108. It can be appreciated that the size 114 of the gap 116 indicated at this level of modeling can be greater than the size 114 of the gap 116 that actually exists when the object 180 is assembled (e.g., after the joining process 194) in this illustrative example.

[0089] Figure 7 An example of the first model 104 and the second model 108 is shown graphically. In one or more examples, the first space 200 represented by the dashed line relative to the first model 104 between the first mating surface 118 and the second mating surface 120 represents an area or distance between the first mating surface 118 and the second mating surface 120 associated with or formed by the first deformation 162 in the first shape 146 of the first component 106 (e.g., a global change of the first form 198). Similarly, in one or more examples, the second space 204 represented by the dashed line relative to the second model 108 between the first mating surface 118 and the second mating surface 120 represents an area or distance between the first mating surface 118 and the second mating surface 120 associated with or formed by the second deformation 262 in the second shape 246 of the second component 110 (e.g., a global change of the second form 298).

[0090] Generally, the first space 200 and / or the second space 204 are closed or otherwise eliminated after assembly of the object 180 or in response to assembly of the object 180 (e.g., after the joining process 194 of the first part 106 and the second part 110). Thus, any predicted dimension 114 of the gap 116 should account for such spaces that are eliminated after assembly. Thus, it is desirable to estimate the dimension 114 of the gap 116 without the first deformation 162 in the first shape 146 of the first part 106 and / or the second deformation 262 in the second shape 246 of the second part 110. The system 100 advantageously facilitates eliminating the first deformation 162 and / or the second deformation 262 from the calculation of the dimension 114 of the gap 116 that will be formed between the first mating surface 118 and the second mating surface 120 after the first part 106 and the second part 110 are coupled together (e.g., after the joining process 194).

[0091] Figure 8 Examples of the first modified nominal model 190 and the second modified nominal model 290 and the dimension 114 of the gap 116 between the first mating surface 118 and the second mating surface 120 represented by the first modified nominal model 190 and the second modified nominal model 290 are shown graphically. In the shown example, the first modified nominal model 190 represents the first part 106 as manufactured and after assembly of the object 180 (e.g., after the joining process 194), such as at least a portion of the first mating surface 118. The second modified nominal model 290 represents the second part 110 as manufactured and after assembly of the object 180 (e.g., after the joining process 194), such as at least a portion of the second mating surface 120. Thus, compared to using the first nominal model 124 and the second nominal model 224 ( Figure 5 ) or using the first model 104 and the second model 108 ( Figure 6 ), the gap 116 predicted between the first mating surface 118 and the second mating surface 120 more accurately represents the actual gap formed between the first mating surface 118 and the second mating surface 120 after assembly of the object 180.

[0092] Such as used in the predictive assembly process or the new forward-looking predictive assembly process disclosed herein, the example illustrates an analysis process for estimating (predicting) the size 114 of the gap 116 between the first mating surface 118 and the second mating surface 120. In the illustrated example, the first deformation 162 in the first shape 146 of the first part 106 (e.g., global changes of the first form 198) and / or the second deformation 262 in the second shape 246 of the second part 110 (e.g., global changes of the second form 298) are eliminated from the analysis process such that only the first waviness 184 in the first shape 146 of the first mating surface 118 (e.g., local changes of the surface profile) and the second waviness 284 in the second shape 246 of the second mating surface 120 are considered when determining the size 114 of the gap 116.

[0093] As will be described in greater detail herein, in one or more examples, the prediction of the gap 116 is achieved by replacing the first model 104 with a first modified nominal model 190 representing the first part 106 and / or replacing the second model 108 with a second modified nominal model 290 representing the second part 110.

[0094] In these examples, the first modified nominal model 190 represents the first part 106, such as at least a portion of the first mating surface 118. In one or more examples, the first modified nominal model 190 is the first nominal model 124 modified by the first waviness bias 134 extracted from the first model 104. In one or more examples, the first modified nominal model 190 represents the first part 106, and thus the first mating surface 118 as manufactured but after the assembly object 180 (e.g., after the joining process 194).

[0095] The second model 108 represents the second part 110, such as at least a portion of the second mating surface 120. In one or more examples, the second modified nominal model 290 is the second nominal model 224 modified by the second waviness bias 234 extracted from the second model 108. The second modified nominal model 290 represents the second part 110, and thus the second mating surface 120 as manufactured but after the assembly object 180 (e.g., after the joining process 194).

[0096] In one or more examples, the first modified nominal model 190 represents the first part 106 and the first mating surface 118 in the first assembled shape 176 (e.g., the final shape after the joining process 194), which for example does not include the first deformation 162, but includes the first waviness 184 in the first shape 146. As an example, the first space 200( Figure 7a first modification nominal model 190 representing the first mating surface 118 in the first assembled shape 174 (e.g., the final shape after the joining process 194) that, for example, does not include the first modification 182 but includes a first waviness 184 in the first shape 146. As an example, the first modification nominal model 190 is represented by the first space 204 between the first shape 146 and the representation of the first mating surface 118 in the first modification nominal model 190.

[0097] In one or more examples, a second modification nominal model 290 represents the second component 110 and the second mating surface 120 in the second assembled shape 276 (e.g., the final shape after the joining process 194) that, for example, does not include the second modification 262 but includes a second waviness 284 in the second shape 246. As an example, the second modification nominal model 290 is represented by the second space 204 between the second shape 246 and the representation of the second mating surface 120 in the second modification nominal model 290. Figure 7 ) of the second component 110 in the second shape 246 (e.g., a global change in the second form 298) has been eliminated (as would be pulled out by the joining process 194), and the second mating surface 120 includes a second waviness 284 (e.g., a local change in the surface profile) that is represented by the second modification nominal model 290.

[0098] In other examples, the second model 108 represents the second component 110 and the second mating surface 120 in the second assembled shape 276 (e.g., the final shape after the joining process 194) that, for example, does not include the second modification 262 and the second waviness 284 in the second shape 246. As an example, the second component 110 is rigid and does not experience the second modification 262, and the second mating surface 120 does not include the second waviness 284.

[0099] The gap 116 formed between the first mating surface 118 and the second mating surface 120 is represented by the space between the representations of the first mating surface 118 and the second mating surface 120 in the first modification nominal model 190 and the second modification nominal model 290, respectively. In one or more examples, the size 114 of the gap 116 is estimated or calculated from the linear distance between the first mating surface 118 and the second mating surface 120 represented in the first modification nominal model 190 and the second modification nominal model 290.

[0100] It can be appreciated that, in the illustrated example of the predictive assembly process or the new forward-looking predictive assembly process, the size 114 of the gap 116 predicted by the process (referred to herein as the predicted size 188) is substantially equal to the size 114 of the gap 116 that actually exists when the object 180 is assembled (e.g., after the joining process 194). Thus, a determination related to a defect or a non-conformance can be made prophylactically based on comparing the predicted gap 116 to an acceptable or tolerable gap threshold 214. Figure 2A 、 Figure 2B It can be appreciated that, in the illustrated example of the predictive assembly process or the new forward-looking predictive assembly process, the size 114 of the gap 116 predicted by the process (referred to herein as the predicted size 188) is substantially equal to the size 114 of the gap 116 that actually exists when the object 180 is assembled (e.g., after the joining process 194). Thus, a determination related to a defect or a non-conformance can be made prophylactically based on comparing the predicted gap 116 to an acceptable or tolerable gap threshold 214.

[0101] Reference is made to Figure 2A 、 Figure 2B In one or more examples, the model analyzer 112 determines (e.g., is configured or adapted to determine) a first overall deviation 122 between the first model 104 of the first component 106 and the first nominal model 124 in the normal direction 150.

[0102] In one or more examples, the model analyzer 112 determines (e.g., is configured or adapted to determine) a second overall deviation 222 between the second model 108 of the second component 110 and the second nominal model 224 in the normal direction 150.

[0103] In one or more examples, the model analyzer 112 performs (e.g., is configured or adapted to perform) a best-fit alignment (also referred to as a best-fit analysis 186) between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122.

[0104] In one or more examples, the model analyzer 112 performs (e.g., is configured or adapted to perform) a best-fit alignment (e.g., a best-fit analysis 186) between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222.

[0105] In one or more examples, the model analyzer 112 determines (e.g., is configured or adapted to determine) a first overall size 164 of the first overall deviation 122 in the normal direction 150.

[0106] In one or more examples, the model analyzer 112 determines (e.g., is configured or adapted to determine) a second overall size 264 of the second overall deviation 222 in the normal direction 150.

[0107] For purposes of the present disclosure, the first nominal model 124 and / or the second nominal model 224 refer to a computer-aided design (CAD) model of the first component 106 and the second component 110, respectively, that represents a nominal or design geometry of the first component 106 and the second component 110, respectively, and thus a nominal or design geometry of the first mating surface 118 and the second mating surface 120, respectively. It can be appreciated that the first shape 146 of the first component 106 represented in the first nominal model 124 does not include the first distortion 162 (global changes of the first form 198) or the first waviness 184 (local changes of the surface profile). Similarly, it can be appreciated that the second shape 246 of the second component 110 represented in the second nominal model 224 does not include the second distortion 262 (global changes of the second form 298) or the second waviness 284 (local changes of the surface profile).

[0108] Figures 9 to 12 An example of the disclosed predictive assembly analysis process is illustrated graphically. The described and illustrated example pertains to a process applied to first component 106. However, in one or more examples, Figures 9 to 12 The process described and shown can be equivalently applied to the second component 110. Therefore, Figures 9 to 12 The examples described and illustrated are not limited to the first component 106 in application or implementation. Thus, references to the “first” instance can be equivalently applied to the “second” instance. For the sake of brevity and to avoid repetition and to not limit the application of the process, a full description of applying the predictive assembly analysis process to the second component 110 has been omitted.

[0109] Figure 9 An example of a first overall deviation 122 in the normal direction 150 between a first model 104 and a first nominal model 124 of the first component 106 is illustrated graphically. In one or more examples, performing a best-fit analysis 186 (such as least-squares alignment) of the first mating surface 118 represented in the first model 104 and the first mating surface 118 represented in the first nominal model 124 provides the first overall deviation 122 in the normal direction 150 between the first model 104 (e.g., in the build state) and the first nominal model 124 (e.g., in the design state). The first overall dimension 164 is represented by or calculated as a value 130 relative to the XYZ coordinate system 126 (e.g., a linear distance measurement in the normal direction 150).

[0110] refer to Figure 2A , Figure 2B In one or more examples, the system 100 (such as computer 148) that executes instruction 170 includes a user interface (UI) 202. Figure 9 The graphical representations of the first overall deviation 122 and the first overall dimension 164 of the first overall deviation 122 depicted in the UI 202 are examples of graphical representations displayed to the user.

[0111] In one or more examples, the first overall deviation 122 includes both large-scale (e.g., overall or global) shape differences and small-scale surface variations. The large-scale shape variation represents a first form 198 and is referred to herein as the first form deviation 132. The small-scale surface variation represents a first waviness 184 and is referred to herein as the first waviness deviation 134. As disclosed herein, system 100 advantageously enables the determination of the size 114 of the gap 116 to be formed between the first mating surface 118 and the second mating surface 120 based solely on the small-scale variations (first waviness 184 and second waviness 284).

[0112] In one or more examples, the model analyzer 112 maps (e.g., is configured or adapted to map) the first global deviation 122 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that the W-axis 152 along the UVW coordinate system 128 represents the values 130 of the first global dimension 164 of the first global deviation 122. In one or more examples, the coordinate mapping 192 includes any suitable conformal mapping or charting technique.

[0113] Figure 10 An example of the first global deviation 122 is shown graphically as mapped from the XYZ coordinate system 126 Figure 9 ) to the UVW coordinate system 128. In one or more examples, the data representing the first global deviation 122 is changed (e.g., charted or mapped) from x, y, z coordinate points to u, v, w coordinate points. A two-dimensional (2D) coordinate system is used such that the u, v coordinates represent a location on the first part 106 and the w coordinate represents a deviation from the nominal geometry. This operation effectively removes the “design shape” from the first part 106 such that the W-axis 152 is offset from the design geometry. Figure 10 The graphical illustration of the first global deviation 122 and the first global dimension 164 of the first global deviation 122 depicted in FIG. 2B is an example of a graphical representation displayed to a user by the UI 202.

[0114] Referring to Figure 2A , Figure 2B In one or more examples, the model analyzer 112 filters (e.g., is configured or adapted to filter) the values 130 of the first global dimension 164 of the first global deviation 122 into the first form deviation 132 and the first waviness deviation 134. In one or more examples, the system 100 executing the instructions 170, such as the computer 148, includes a filter 154 that performs the filtering process. In one or more examples, the model analyzer 112 filters the values 130 using a low-pass filter 156. In one or more examples, the model analyzer 112 filters the values 130 using a robust Gaussian regression filter 158. In one or more examples, the filter 154, such as the low-pass filter 156 or the robust Gaussian regression filter 158, operates on the (u, v, w) point cloud to filter the data into the first form 198 and the first waviness 184. Because the designed curvature has been effectively removed, a first order regression function (e.g., a planar regression) is selected and used for the local fitting.

[0115] Figure 11An example of values 130 of first form bias 132 and first form size 166 that are mapped to UVW coordinate system 128 and filtered from first population size 164 of first population bias 122 is shown graphically. As depicted in the illustrated example, values 130 of first form size 166 of first form bias 132 ( Figure 11 ) are approximately equal to values 130 of first population size 164 of first population bias 122 ( Figure 10 ). This is because global changes in first form 198 due to first deformation 162 (first form bias 132) represent a majority of first population bias 122 from the design geometry. Figure 11 The graphical illustration of first form bias 132 and first form size 166 of first form bias 132 depicted in

[0116] Substantially similar operations and examples can be used for second form bias 232 and second form size 266 that are mapped to UVW coordinate system 128 and filtered from second population size 264 of second population bias 222.

[0117] Figure 12 An example of values 130 of first waviness bias 134 and first waviness size 168 that are mapped to UVW coordinate system 128 and filtered from first population size 164 of first population bias 122 is shown graphically. As depicted in the illustrated example, values 130 of first waviness size 168 of first waviness bias 134 ( Figure 12 ) are several orders of magnitude smaller than values 130 of first population size 164 of first population bias 122 ( Figure 10 ). This is because local changes in first waviness 184 due to small-scale variations in surface profile of first mating surface 118 (first waviness bias 134) represent a small fraction of first population bias 122 from the design geometry. Figure 12 The graphical illustration of first waviness bias 134 and first waviness size 168 of first waviness bias 134 depicted in

[0118] Referring again to Figure 2A , Figure 2BIn one or more examples, the model analyzer 112 (e.g., is configured or adapted to) modify the first nominal model 124 by the first waviness bias 134. The first nominal model 124 modified by the first waviness bias 134 represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together. The first nominal model 124 modified by the first waviness bias 134 is also referred to herein as a first modified nominal model 190. In one or more examples, the model analyzer 112 (e.g., is configured or adapted to) map the first waviness bias 134 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that the values 130 of the first waviness dimension 168 of the first waviness bias 134 are represented as the first distance 160 relative to the first nominal model 124.

[0119] Figure 13 An example of the first waviness bias 134 mapped back from the UVW coordinate system 128 Figure 12 ) to the XYZ coordinate system 126 and the values 130 of the first waviness dimension 168 represented as the first distance 160 relative to the first nominal model 124 in the normal direction 150 is shown graphically. In one or more examples, data representing the first waviness bias 134 is changed (e.g., plotted or mapped) from u, v, w coordinate points back to x, y, z coordinate points. The first waviness 184 calculated in the w coordinate is used as the first distance 160 to add to or subtract from the first nominal model 124 to estimate one or more dimensions 114 of one or more gaps 116 that will be formed between the first mating surface 118 and the second mating surface 120 after the first component 106 and the second component 110 are coupled together (e.g., after the joining process 194). Figure 13 The graphical illustration of the first waviness bias 134 and the first waviness dimension 168 as the first distance 160 depicted in the middle is an example of a graphical representation displayed to a user by the UI 202.

[0120] Referring again to Figure 2A , Figure 2B In one or more examples, the system 100 includes a measurement system 136. The measurement system 136 generates the first data 138 representing at least a portion of the first mating surface 118 of the first component 106 and / or for the first model 104. The measurement system 136 generates the second data 140 representing at least a portion of the second mating surface 120 of the second component 110 and / or for the second model 108. The first data 138 and the second data 140 are generated before the first component 106 and the second component 110 are coupled together and the first mating surface 118 and the second mating surface 120 are mated.

[0121] In one or more examples, the measurement system 136 includes or takes the form of a scanning device for scanning the first component 106 (such as at least a portion of the first mating surface 118) and generating the first data 138. The measurement system 136 includes or takes the form of a scanning device for scanning the second component 110 (such as at least a portion of the second mating surface 120) and generating the second data 140. The scanning device can take the form of, for example and without limitation, a laser system, an optical measurement device, or some other type of system. The laser system can be, for example, a laser radar scanner. The optical measurement device can be, for example, a three-dimensional optical measurement device. In another illustrative example, the measurement system 136 takes the form of a photogrammetry system.

[0122] In one or more examples, the first component 106 and the second component 110 can be manufactured at different locations and / or measured (e.g., scanned) at different locations. As such, in one or more examples, the measurement system 136 includes more than one scanning device, where each of these scanning devices is co-located with or dedicated to a manufacturing or measurement environment associated with a respective one of the first component 106 and the second component 110.

[0123] Referring to Figure 1 and Figure 2A , Figure 2B In one or more examples, the first data 138 includes data or 3D shape information regarding a first shape 146 (e.g., a first initial shape 174) of the first component 106 (and thus the first mating surface 118). In one or more examples, the second data 140 includes data or 3D shape information regarding a second shape 246 (e.g., a second initial shape 274) of the second component 110 (and thus the second mating surface 120).

[0124] Referring to Figure 2A , Figure 2B In one or more examples, the first data 138 and the second data 140 take the form of three-dimensional point clouds. As an example, the first data 138 takes the form of a first three-dimensional point cloud having a density sufficient to capture the first shape 146 of the first component 106 (and thus the first mating surface 118) at a desired level of accuracy. Similarly, the second data 140 takes the form of a second three-dimensional point cloud having a density sufficient to capture the second shape 246 of the second component 110 (and thus the second mating surface 120) at a desired level of accuracy.

[0125] Referring to Figure 2A , Figure 2B and Figure 16In one or more examples, the model generator 102, the model analyzer 112, and the assembly planner 210 take the form of program code 918 executed by the data processing system 900.

[0126] Referring now to the drawings Figures 1 to 13 The following is an example of a system 100 according to the present disclosure. The system 100 includes several elements, features, and components. Not all elements, features, and / or components described or illustrated in one example are required in every implementation of that example. Some or all of the elements, features and / or components described or illustrated in one example can be used in other examples, in various combinations, even if such combinations are not explicitly described or illustrated in the present document.

[0127] In one or more examples, the system 100 includes a model generator 102, a model analyzer 112, and an assembly planner 210. The model generator 102 generates a first model 104 of a first component 106 and a second model 108 of a second component 110 before the first component 106 and the second component 110 are coupled together.

[0128] In one or more examples, the model analyzer 112 analyzes the first model 104 and the second model 108 to determine a size 114 of a gap 116 between a first mating surface 118 of the first component 106 and a second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together.

[0129] In one or more examples, the model analyzer 112 filters out a first deformation 162 of the first component 106 and / or a second deformation 262 of the second component 110 before the first component 106 and the second component 110 are coupled together. The model analyzer 112 also determines the size 114 of the gap 116 between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 (e.g., computes a prediction of the size 114).

[0130] In one or more examples, the assembly planner 210 recommends an action 212 based on a comparison of the gap 116 to a gap threshold 214. In one or more examples, the assembly planner 210 recommends the action 212 based on the size 114 of the gap 116.

[0131] In one or more examples, when the size 114 of the gap 116 is less than or equal to the gap threshold 214, the action 212 recommended by the assembly planner 210 includes coupling the first component 106 and the second component 110 together. In one or more examples, when the size 114 of the gap 116 is greater than the gap threshold 214, the action 212 recommended by the assembly planner 210 includes at least one of: re-machining at least one of the first component 106 and the second component 110; re-designing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214; and repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0132] In one or more examples, the model analyzer 112 modifies the first nominal model 124 of the first component 106 by the first waviness deviation 134. The model analyzer 112 modifies the second nominal model 224 of the second component 110 by the second waviness deviation 234. The first modified nominal model 190 represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together. The second modified nominal model 290 represents the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together. The size 114 of the gap 116 is determined using the first modified nominal model 190 and the second modified nominal model 290.

[0133] In one or more examples, the model analyzer 112 determines a first overall deviation 122 in a normal direction between the first model 104 of the first component 106 and the first nominal model 124. The model analyzer 112 determines a second overall deviation 222 in a normal direction between the second model 108 of the second component 110 and the second nominal model 224. The first waviness deviation 134 is derived from the first overall deviation 122. The second waviness deviation 234 is derived from the second overall deviation 222.

[0134] In one or more examples, the model analyzer 112 performs a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122. The model analyzer 112 performs a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222.

[0135] In one or more examples, the model analyzer 112 determines a first overall size 164 of the first overall deviation 122 in the normal direction. The model analyzer 112 determines a second overall size 264 of the second overall deviation 222 in the normal direction.

[0136] In one or more examples, the model analyzer 112 maps the first population bias 122 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a first value of the first population dimension 164 of the first population bias 122 is represented along the W-axis 152. In one or more examples, the model analyzer 112 maps the second population bias 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a second value of the second population dimension 264 of the second population bias 222 is represented along the W-axis 152.

[0137] In one or more examples, the model analyzer 112 filters the first value of the first population dimension 164 of the first population bias 122 into the first form bias 132 and the first waviness bias 134. In one or more examples, the model analyzer 112 filters the second value of the second population dimension 264 of the second population bias 222 into the second form bias 232 and the second waviness bias 234.

[0138] In one or more examples, the model analyzer 112 maps the first waviness bias 134 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that a first value of the first waviness dimension 168 of the first waviness bias 134 is represented as a first distance 160 relative to the first nominal model 124. In one or more examples, the model analyzer 112 maps the second waviness bias 234 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that a second value of the second waviness dimension 268 of the second waviness bias 234 is represented as a second distance 260 relative to the second nominal model 224.

[0139] Reference is now made to Figure 14 In one or more examples, the method 1000 includes a step of generating 1002 a first model 104 of a first component 106. The method 1000 includes a step of generating 1004 a second model 108 of a second component 110. The step of generating 1002 the first model 104 and the step of generating 1004 the second model 108 are performed prior to the first component 106 and the second component 110 being coupled together. The method 1000 includes a step of filtering out 1006 a first deformation 162 of the first component 106 and a second deformation 262 of the second component 110 that existed prior to the first component 106 and the second component 110 being coupled together. The method 1000 includes a step of determining (e.g., predicting) 1008 a size 114 of a gap 116 that will exist between a first mating surface 118 and a second mating surface 120 after the first component 106 and the second component 110 are coupled together. The method 1000 includes a step of comparing 1010 the size 114 of the gap 116 to a gap threshold 214. The method 1000 includes a step of recommending 1012 an action 212 based on the prediction of the size 114 of the gap 116.

[0140] In one or more examples, the step of filtering out 1006 a deformation of at least one of the first component 106 and the second component 110 prior to the first component 106 and the second component 110 being coupled together is an example of analyzing the first model 104 and the second model 108 of the disclosed predictive assembly analysis process (e.g., the method 2000).

[0141] Reference is now made to Figure 15 In one or more examples, the method 2000 includes a step of generating 2006 the first model 104 of the first component 106. The method 2000 includes a step of generating 2008 the second model 108 of the second component 110. The step of generating 2006 the first model 104 and the step of generating 2008 the second model 108 are performed prior to the first component 106 and the second component 110 being coupled together.

[0142] In one or more examples, the method 2000 includes a step of analyzing 2010 the first model 104 and the second model 108 to determine a size 114 of the gap 116 between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together. As an example, the method 2000 includes a step of determining 2032 (e.g., calculating) the size 114 of the gap 116 between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 based on the analysis performed on the first model 104 and the second model 108.

[0143] In one or more examples, the method 2000, such as the step of analyzing 2010, includes a step of determining 2012 (e.g., calculating) a first overall deviation 122 in the normal direction 150 between the first model 104 of the first component 106 and the first nominal model 124. In one or more examples, the step of analyzing 2010 further includes a step of determining 2012 (e.g., calculating) a second overall deviation 222 in the normal direction 150 between the second model 108 of the second component 110 and the second nominal model 224.

[0144] In one or more examples, the method 2000, such as the step of determining 2012, includes a step of performing 2014 a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122. In one or more examples, the step of determining 2012 includes a step of performing 2014 a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222.

[0145] In one or more examples, the method 2000 (such as the analyzing 2010 step) includes a step of determining 2016 (e.g., calculating) a first overall dimension 164 of the first overall deviation 122 in the normal direction 150. In one or more examples, the analyzing 2010 step includes a step of determining 2016 (e.g., calculating) a second overall dimension 264 of the second overall deviation 222 in the normal direction 150.

[0146] In one or more examples, the method 2000 (such as the analyzing 2010 step) includes a step of mapping 2018 the first overall deviation 122 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a value of the first overall dimension 164 of the first overall deviation 122 is represented along the W-axis 152. In one or more examples, the analyzing 2010 step includes a step of mapping 2018 the second overall deviation 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a value of the second overall dimension 264 of the second overall deviation 222 is represented along the W-axis 152.

[0147] In one or more examples, the method 2000 (such as the analyzing 2010 step) includes a step of filtering 2020 the value of the first overall dimension 164 of the first overall deviation 122 into the first form deviation 132 and the first waviness deviation 134. In one or more examples, the analyzing 2010 step includes a step of filtering 2020 the value of the second overall dimension 264 of the second overall deviation 222 into the second form deviation 232 and the second waviness deviation 234.

[0148] In one or more examples, the filtering 2020 step is performed using a low-pass filter 156 according to the method 2000, or the filtering 2020 step includes a step of performing 2022 or conducting a low-pass filter 156. In one or more examples, the filtering 2020 step is performed using a robust Gaussian regression filter 158 according to the method 1000, or the filtering 2020 step includes a step of performing 2024 or conducting a robust Gaussian regression filter 158.

[0149] In one or more examples, the method 2000 (such as the analyzing 2010 step) includes the step of modifying 2026 the first nominal model 124 by the first waviness bias 134 such that the first nominal model 124 modified by the first waviness bias 134 represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together. In one or more examples, the analyzing 2010 step includes the step of modifying 2026 the second nominal model 224 by the second waviness bias 234 such that the second nominal model 224 modified by the second waviness bias 234 represents the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together.

[0150] In one or more examples, the first modified nominal model 190 and the second modified nominal model 290 are used to determine the size 114 of the gap 116.

[0151] In one or more examples, the method 2000 (such as the modifying 2026 step) includes the step of mapping 2028 the first waviness bias 134 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that the value of the first waviness dimension 168 of the first waviness bias 134 is represented as a first distance 160 relative to the first nominal model 124. In one or more examples, the modifying 2026 step includes the step of mapping 2028 the second waviness bias 234 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that the value of the second waviness dimension 268 of the second waviness bias 234 is represented as a second distance 260 relative to the second nominal model 224.

[0152] In one or more examples, the modifying 2026 step includes the step of adding 2030 the first distance 160 to and / or subtracting 2030 the first distance 160 from the first nominal model 124 such that the first modified nominal model 190 represents the first component 106 having the first assembled shape 176, thereby providing at least a portion of the size 114 of the gap 116. In one or more examples, the modifying 2026 step includes the step of adding 2030 the second distance 260 to and / or subtracting 2030 the second distance 260 from the second nominal model 224 such that the second modified nominal model 290 represents the second component 110 having the second assembled shape 276, thereby providing at least a portion of the size 114 of the gap 116.

[0153] In one or more examples, the method 2000 includes a step of generating 2002 first data 138 representing at least a portion of the first mating surface 118 of the first component 106. The step of generating 2002 the first data 138 is performed prior to the first component 106 and the second component 110 being coupled together. The first model 104 is generated using the first data 138.

[0154] In one or more examples, the method 1000 includes a step of generating 2004 second data 140 representing at least a portion of the second mating surface 120 of the second component 110. The step of generating 2004 the second data 140 is performed prior to the first component 106 and the second component 110 being coupled together. The second model 108 is generated using the second data 140.

[0155] In one or more examples, the method 1000 includes a step of recommending 2034 an action 212 based on a comparison of the gap 116 (e.g., the size 114) to the gap threshold 214. In one or more examples, the action 212 includes coupling the first component 106 and the second component 110 together when the size 114 of the gap 116 is less than or equal to the gap threshold 214. In one or more examples, the action 212 includes re-machining at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In one or more examples, the action 212 includes re-designing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In one or more examples, the action 212 includes repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0156] In one or more examples, the method 1000 includes a step of coupling the first component 106 and the second component 110 together. In one or more examples, the coupling step is performed using the joining process 194 such that the first mating surface 118 and the second mating surface 120 mate. In one or more examples, a number of gaps 116 are formed between the first mating surface 118 and the second mating surface 120. In these examples, the size 114 of the gap 116 is less than the gap threshold 214 such that the object meets assembly and / or gap requirements according to the design, specification, and / or tolerance.

[0157] With reference to Figure 2A , Figure 2B , Figure 14 and Figure 15In one or more examples, the method 1000 and / or the method 2000 are implemented using the computer 148. For example, the method 1000 and / or the method 2000 are computer-implemented methods. In one or more examples, the system 100 is a computer-implemented system configured or adapted to implement the method 1000 and / or the method 2000.

[0158] Referring to Figure 3 A portion of an aircraft 1200 is also disclosed. The portion of the aircraft 1200 is manufactured using the system 100 and / or according to the method 1000 or the method 2000.

[0159] Referring to Figure 16 As an example, the disclosure also relates to a computer program product 922. The computer program product 922 includes a non-transitory computer-readable medium 920 including program code 918 that when executed by one or more processors 904 causes the one or more processors 904 to perform operations.

[0160] In one or more examples, the operations include generating a first model 104 of the first component 106 from first data 138 before the first component 106 is coupled to the second component 110. The operations include generating a second model 108 of the second component 110 from second data 140 before the second component 110 is coupled to the first component 106.

[0161] In one or more examples, the operations include filtering out the first deformation 162. In one or more examples, the operations include filtering out the second deformation 262.

[0162] In one or more examples, the operations include analyzing the first model 104 and the second model 108 to determine a size 114 of a gap 116 between a first mating surface 118 of the first component 106 and a second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together.

[0163] In one or more examples, the operations include determining a first overall deviation 122 in a normal direction 150 between the first model 104 of the first component 106 and the first nominal model 124. In one or more examples, the operations include determining a second overall deviation 222 in the normal direction 150 between the second model 108 of the second component 110 and the second nominal model 224.

[0164] In one or more examples, the operations include performing a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first global deviation 122. In one or more examples, the operations include performing a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second global deviation 222.

[0165] In one or more examples, the operations include determining a first global dimension 164 of the first global deviation 122 in the normal direction 150. In one or more examples, the operations include determining a second global dimension 264 of the second global deviation 222 in the normal direction 150.

[0166] In one or more examples, the operations include mapping the first global deviation 122 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a value of the first global dimension 164 of the first global deviation 122 is represented along the W-axis 152. In one or more examples, the operations include mapping the second global deviation 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that a value of the second global dimension 264 of the second global deviation 222 is represented along the W-axis 152.

[0167] In one or more examples, the operations include filtering the value of the first global dimension 164 of the first global deviation 122 into the first form deviation 132 and the first waviness deviation 134. In one or more examples, the operations include filtering the value of the second global dimension 264 of the second global deviation 222 into the second form deviation 232 and the second waviness deviation 234.

[0168] In one or more examples, the filtering is performed using a low-pass filter 156. In one or more examples, the filtering is performed using a robust Gaussian regression filter 158.

[0169] In one or more examples, the operations include mapping the first waviness deviation 134 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that a value of the first waviness dimension 168 of the first waviness deviation 134 is represented as a first distance 160 relative to the first nominal model 124. In one or more examples, the operations include mapping the second waviness deviation 234 from the UVW coordinate system 128 to the XYZ coordinate system 126 such that a value of the second waviness dimension 268 of the second waviness deviation 234 is represented as a second distance 260 relative to the second nominal model 224.

[0170] In one or more examples, the operations include modifying the first nominal model 124 by the first waviness bias 134 (e.g., the first distance 160) such that the first nominal model 124 modified by the first waviness bias 134 (e.g., the first modified nominal model 190) represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together. In one or more examples, the operations include modifying the second nominal model 224 by the second waviness bias 234 (e.g., the second distance 260) such that the second nominal model 224 modified by the second waviness bias 234 (e.g., the second modified nominal model 290) represents the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together.

[0171] In one or more examples, the operations include analyzing the first modified nominal model 190 and the second modified nominal model 290 to determine a size 114 of the gap 116 between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together.

[0172] In one or more examples, the operations include recommending an action 212 based on a comparison of the gap 116 to the gap threshold 214. In one or more examples, the action 212 includes coupling the first component 106 and the second component 110 together when the size 114 of the gap 116 is less than or equal to the gap threshold 214. In one or more examples, the action 212 includes re-machining at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In one or more examples, the action 212 includes re-designing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214. In one or more examples, the action 212 includes repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0173] Reference Figure 2A , Figure 2B In one or more examples, the system 100 can be implemented using software, hardware, firmware, or a combination thereof. When using software, the operations performed by the system 100 can be implemented using, for example but not limited to, program code configured to be run on a processor unit. When using firmware, the operations performed by the system 100 can be implemented using, for example but not limited to, program code and data, and stored in a persistent memory to be run on a processor unit.

[0174] When hardware is employed, the hardware can include one or more circuits that operate to perform the operations performed by system 100. Depending on the implementation, the hardware can take the form of circuitry, integrated circuits, application-specific integrated circuits (ASICs), programmable logic devices, or some other suitable type of hardware device configured to perform any number of operations.

[0175] A programmable logic device can be configured to perform certain operations. The device can be permanently configured to perform these operations or can be reconfigurable. The programmable logic device can take the form of, for example, but not limited to, a programmable logic array, programmable array logic, a field programmable logic array, a field programmable gate array, or some other type of programmable hardware device.

[0176] In some illustrative examples, operations and processes performed by system 100 can be performed using organic components integrated with inorganic components. In some instances, operations and processes can be performed entirely with organic components (excluding humans). For example, circuitry in the form of organic semiconductors can be used to perform these operations and processes.

[0177] Reference Figure 16 In one or more examples, computer 148( Figure 2A , Figure 2B ) includes or takes the form of data processing system 900. In one or more examples, data processing system 900 includes a communication framework 902 that provides communication between at least one processor 904, one or more storage devices 916 (such as memory 906 and / or persistent storage 908), a communication unit 910, an input / output unit 912 (I / O unit), and a display 914. In this example, the communication framework 902 takes the form of a bus system.

[0178] Processor 904 is for executing instructions 170( Figure 2A , Figure 2B ) of software that can be loaded into memory 906. In one or more examples, processor 904 is a number of processor units, multi-processor cores, or some other type of processor, depending on the particular implementation.

[0179] Memory 906 and persistent storage 908 are examples of storage devices 916. A storage device is any hardware that is capable of storing information, such as but not limited to at least one of data, program code in functional form, or other suitable information, either temporarily or permanently. In one or more examples, storage devices 916 can also be referred to as computer readable storage devices. Memory 906 is, for example, a random access memory, or any other suitable volatile or non-volatile storage device. Depending on the particular implementation, persistent storage 908 can take many forms.

[0180] For example, the persistent storage 908 includes one or more components or devices. For example, the persistent storage 908 is a hard disk drive, a solid-state drive, flash memory, a rewritable optical disc, a rewritable tape, or some combination of the above. The media used by the persistent storage 908 can also be removable. For example, a removable hard drive can be used for the persistent storage 908.

[0181] The communication unit 910 provides communication with other systems or devices, such as the measurement system 136 or other computer systems. In one or more examples, the communication unit 910 is a network interface card.

[0182] The input / output unit 912 allows input and output of data with other devices that can be connected to the data processing system 900. As examples, the input / output unit 912 provides a connection between the user input and at least one of a keyboard, a mouse, or some other suitable input device. Further, the input / output unit 912 can send output to a printer. The display 914 provides a mechanism to display information to a user. For example, the user interface 202 is displayed to the user by the display 914.

[0183] Instructions for operating at least one of the system, application, or program (e.g., the instructions 170) can be in the storage device 916, which is in communication with the processor 904 through the communication framework 902. The processes of the various examples and operations described herein can be performed by the processor 904 using computer- implemented instructions, which can be located in a memory, such as the memory 906.

[0184] The instructions 170 are referred to as program code, computer-usable program code, or computer-readable program code that can be read and executed by a processor of the processor 904. The program code in the different examples can be embodied on different physical or computer-readable storage media, such as the memory 906 or the persistent storage 908.

[0185] In one or more examples, the program code 918 is located in a functional form on a computer-readable medium 920 that is selectively removable and can be loaded or transferred into the data processing system 900 for execution by the processor 904. In one or more examples, the program code 918 and the computer-readable medium 920 form a computer program product 922. In one or more examples, the computer-readable medium 920 is a computer-readable storage medium 924.

[0186] In one or more examples, the computer-readable storage medium 924 is a physical or tangible storage device used to store the program code 918, as opposed to a medium that propagates or transfers the program code 918.

[0187] Alternatively, program code 918 can be transferred to data processing system 900 using computer readable signal media. Computer readable signal media can be, for example, a propagated data signal containing program code 918. For example, computer readable signal media can be an electromagnetic signal, an optical signal, or any other suitable type of signal. These signals can be transmitted over at least one communication link, for example, a wireless communication link, an optical fiber cable, a coaxial cable, a wire, or any other suitable type of communication link.

[0188] The different components illustrated for data processing system 900 are not meant to provide architectural limitations to the manner in which different examples can be implemented. The different examples can be implemented in a data processing system that includes components in addition to or in place of those illustrated for data processing system 900. For example, one or more of the different examples can be implemented in a data processing system that includes multiple processors or multiple buses. Of course, the different examples can also be implemented in a computer or data processing system provided by a service offering, such as a service providing cloud computing resources. Figure 16 The other components shown in FIG. 1 can differ from those shown. The different examples can be implemented using any hardware device or system that is capable of running program code 918.

[0189] Additionally, the various components of computer 148 and / or data processing system 900 can be described as modules. For the purposes of this disclosure, a module includes hardware, software, or a combination of hardware and software. As an example, a module can include one or more circuits that are configured to perform or cause the performance of an operation described in the functionality to be performed by or as a result of execution of program code 918. As another example, a module includes a processor, a storage device (for example, memory), and a computer readable storage medium with instructions that, when executed by the processor, cause the processor to perform or cause the performance of an operation described in the functionality to be performed by or as a result of execution of program code 918. In one or more examples, a module takes the form of program code 918 and computer readable medium 920 that together form computer program product 922. In one or more examples, model generator 102, model analyzer 112, and / or assembly planner 210 are implemented as modules.

[0190] Referring now to Figure 17 and Figure 18 , examples of system 100, method 1000, method 2000, and / or computer program product 922 described herein can be related to or utilized in the context of an aircraft manufacturing and service method 1100 as shown in the flowchart of Figure 17 or an aircraft 1200 as shown schematically in Figure 3 and Figure 8 . For example, aircraft 1200 and / or aircraft manufacturing and service method 1100 can include the use of system 100 and / or objects 180 manufactured according to method 1000 or method 2000.Figure 1 ), such as a fuselage 1218, wings 1220, etc.

[0191] Referring to Figure 3 and Figure 18 which shows an example of an aircraft 1200. The aircraft 1200 includes a body 1202 having an interior 1206. The aircraft 1200 includes a plurality of onboard systems 1204 (e.g., advanced systems). Examples of the onboard systems 1204 of the aircraft 1200 include propulsion systems 1208, hydraulic systems 1212, electrical systems 1210, and environmental systems 1214. In other examples, the onboard systems 1204 also include one or more control systems 1216 coupled to the body 1202 of the aircraft 1200, such as, for example, flaps, spoilers, ailerons, slats, rudders, elevators, and trim tabs. In other examples, the onboard systems 1204 also include one or more other systems, such as, but not limited to, communication systems, avionics systems, software distribution systems, network communication systems, passenger information / entertainment systems, guidance systems, radar systems, weapon systems, etc. The aircraft 1200 can include various other structures assembled using the system 100 and / or the methods 1000, 2000.

[0192] Referring to Figure 17 During pre-production of the aircraft 1200, the manufacturing and service method 1100 can include specification and design 1102 of the aircraft 1200 and material procurement 1104. During production of the aircraft 1200, component and subassembly manufacturing 1106 and system integration 1108 of the aircraft 1200 takes place. Thereafter, the aircraft 1200 can go through certification and delivery 1110 in order to be placed in service 1112. While in service 1112 by a customer, the aircraft 1200 is scheduled for routine maintenance and service 1114, which can include modification, reconfiguration, refurbishment, and / or other maintenance and service.

[0193] Figure 17 Each of the processes of manufacturing and service method 1100 can be performed or carried out by a system integrator, a third party, and / or an operator (e.g., a customer). For the purposes of this description, a system integrator can include, without limitation, any number of aircraft manufacturers and major-systems integrators; a third party can include, without limitation, any number of vendors, subcontractors, and suppliers; and an operator can be an airline, lease company, military entity, service organization, and so on.

[0194] Examples of the system 100 and methods 1000, 2000 shown and described herein can be used in Figure 17Any one or more of the stages of the manufacturing and service method 1100 shown in the flowchart are employed during. In examples, during a portion of the component and subassembly manufacturing 1106 and / or system integration 1108, the system 100 and / or in accordance with the methods 1000, 2000 can be used to predictively assemble components of the aircraft 1200. Additionally, when the aircraft 1200 is in service 1112, the system 100 and / or in accordance with the methods 1000, 2000 can be used to predictively assemble components of the aircraft 1200. Further, during system integration 1108 and upon completion of manufacturing stages, the system 100 and / or in accordance with the methods 1000, 2000 can be used to predictively assemble components of the aircraft 1200. Similarly, when the aircraft 1200 is in service 1112 and during maintenance and service 1114, the system 100 and / or in accordance with the methods 1000, 2000 can be used to predictively assemble components of the aircraft 1200.

[0195] The present disclosure relates to example embodiments defined by the following clauses:

[0196] Clause 1. A system 100 for predictive assembly, the system 100 comprising:

[0197] a model generator 102 that generates a first model 104 of a first component 106 and a second model 108 of a second component 110 prior to the first component 106 and the second component 110 being coupled together;

[0198] a model analyzer 112 that analyzes the first model 104 and the second model 108 to determine a size 114 of a gap 116 between a first mating surface 118 of the first component 106 and a second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together; and

[0199] an assembly planner 210 that recommends an action 212 based on a comparison of the gap 116 to a gap threshold 214.

[0200] Clause 2. The system 100 of clause 1, wherein the action 212 recommended by the assembly planner 210 includes coupling the first component 106 and the second component 110 together when the size 114 of the gap 116 is less than or equal to the gap threshold 214.

[0201] Clause 3. The system 100 of clause 1, wherein the action 212 recommended by the assembly planner 210 includes re-machining at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0202] Clause 4. The system 100 of clause 1, wherein the action 212 recommended by the assembly planner 210 includes re-designing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0203] Clause 5. The system 100 of clause 1, wherein the action 212 recommended by the assembly planner 210 includes repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0204] Clause 6. The system 100 of clause 1, wherein:

[0205] the model analyzer 112:

[0206] modifies a first nominal model 124 of the first component 106 by a first waviness bias 134; and

[0207] modifies a second nominal model 224 of the second component 110 by a second waviness bias 234;

[0208] a first modified nominal model 190 represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together; and

[0209] a second modified nominal model 290 represents the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together; and

[0210] determines the size 114 of the gap 116 using the first modified nominal model 190 and the second modified nominal model 290.

[0211] Clause 7. The system 100 of clause 6, wherein:

[0212] the model analyzer 112:

[0213] determines a first overall bias 122 in a normal direction between the first model 104 of the first component 106 and the first nominal model 124; and

[0214] determining a second overall deviation 222 between the second model 108 of the second component 110 and the second nominal model 224 in the normal direction;

[0215] deriving the first waviness deviation 134 from the first overall deviation 122; and

[0216] deriving the second waviness deviation 234 from the second overall deviation 222.

[0217] Clause 8. The system 100 of clause 7, wherein the model analyzer 112:

[0218] performing a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122; and

[0219] performing a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222.

[0220] 9. The system 100 of clause 8, wherein the model analyzer 112:

[0221] determining a first overall dimension 164 of the first overall deviation 122 in the normal direction;

[0222] determining a second overall dimension 264 of the second overall deviation 222 in the normal direction;

[0223] mapping the first overall deviation 122 from an XYZ coordinate system 126 to a UVW coordinate system 128 to represent the first overall dimension 164 of the first overall deviation 122 along a W axis 152;

[0224] mapping the second overall deviation 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 to represent the second overall dimension 264 of the second overall deviation 222 along the W axis 152;

[0225] filtering the first overall dimension 164 of the first overall deviation 122 into a first form deviation 132 and a first waviness deviation 134; and

[0226] filtering the second overall dimension 264 of the second overall deviation 222 into a second form deviation 232 and a second waviness deviation 234.

[0227] Clause 10. The system 100 of clause 9, wherein the model analyzer 112:

[0228] mapping the first waviness deviation 134 from the UVW coordinate system 128 to the XYZ coordinate system 126, thereby representing a first waviness dimension 168 of the first waviness deviation 134 as a first distance 160 relative to the first nominal model 124; and

[0229] mapping the second waviness deviation 234 from the UVW coordinate system 128 to the XYZ coordinate system 126, thereby representing a second waviness dimension 268 of the second waviness deviation 234 as a second distance 260 relative to the second nominal model 224.

[0230] Clause 11. The system 100 of clause 1, further comprising a measurement system 136 for generating first data 138 representing at least a portion of the first mating surface 118 of the first component 106 and second data 140 representing at least a portion of the second mating surface 120 of the second component 110 prior to the first mating surface 118 and the second mating surface 120 mating.

[0231] Clause 12. The system 100 of clause 1, wherein the model generator 102, the model analyzer 112, and the assembly planner 210 take the form of program code 918 executed by a data processing system 900.

[0232] Clause 13. A method 1000 for predictive assembly, the method 1000 comprising:

[0233] generating a first model 104 of a first component 106 and a second model 108 of a second component 110 prior to the first component 106 and the second component 110 coupling together;

[0234] analyzing the first model 104 and the second model 108 to determine a dimension 114 of a gap 116 between a first mating surface 118 of the first component 106 and a second mating surface 120 of the second component 110 after the first component 106 and the second component 110 couple together; and

[0235] recommending an action 212 based on a comparison of the gap 116 to a gap threshold 214.

[0236] Clause 14. The method 1000 of clause 13, wherein the action 212 comprises coupling the first component 106 and the second component 110 together when the dimension 114 of the gap 116 is less than or equal to the gap threshold 214.

[0237] Clause 15. The method 1000 of clause 13, wherein the action 212 includes reworking at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0238] Clause 16. The method 1000 of clause 13, wherein the action 212 includes redesigning at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0239] Clause 17. The method 1000 of clause 13, wherein the action 212 includes repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0240] Clause 18. The method 1000 of clause 13, further comprising:

[0241] modifying a first nominal model 124 of the first component 106 by a first waviness bias 134; and

[0242] modifying a second nominal model 224 of the second component 110 by a second waviness bias 234,

[0243] wherein:

[0244] the first modified nominal model 190 represents the first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together; and

[0245] the second modified nominal model 290 represents the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together; and

[0246] determining a size 114 of the gap 116 using the first modified nominal model 190 and the second modified nominal model 290.

[0247] Clause 19. The method 1000 of clause 18, further comprising:

[0248] determining a first overall bias 122 in a normal direction between the first model 104 of the first component 106 and the first nominal model 124;

[0249] determining a second overall deviation 222 between the second model 108 of the second component 110 and the second nominal model 224 in the normal direction;

[0250] performing a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122;

[0251] performing a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222;

[0252] determining a first overall size 164 of the first overall deviation 122 in the normal direction;

[0253] determining a second overall size 264 of the second overall deviation 222 in the normal direction;

[0254] mapping the first overall deviation 122 from an XYZ coordinate system 126 to a UVW coordinate system 128 to represent the first overall size 164 of the first overall deviation 122 along a W axis 152;

[0255] mapping the second overall deviation 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 to represent the second overall size 264 of the second overall deviation 222 along the W axis 152;

[0256] filtering the first overall size 164 of the first overall deviation 122 into a first form deviation 132 and a first waviness deviation 134;

[0257] filtering the second overall size 264 of the second overall deviation 222 into a second form deviation 232 and a second waviness deviation 234;

[0258] mapping the first waviness deviation 134 from the UVW coordinate system 128 to the XYZ coordinate system 126 to represent a first waviness size 168 of the first waviness deviation 134 as a first distance 160 relative to the first nominal model 124; and

[0259] mapping the second waviness deviation 234 from the UVW coordinate system 128 to the XYZ coordinate system 126 to represent a second waviness size 268 of the second waviness deviation 234 as a second distance 260 relative to the second nominal model 224.

[0260] Clause 20. A non-transitory computer-readable medium 920 comprising program code 918 that, when executed by one or more processors 904, causes the one or more processors 904 to perform operations comprising:

[0261] generating a first model 104 of a first component 106 from first data 138 prior to the first component 106 being coupled to a second component 110;

[0262] generating a second model 108 of the second component 110 from second data 140 prior to the second component 110 being coupled to the first component 106;

[0263] determining a first overall deviation 122 in a normal direction between the first model 104 of the first component 106 and a first nominal model 124;

[0264] determining a second overall deviation 222 in the normal direction between the second model 108 of the second component 110 and a second nominal model 224;

[0265] performing a best-fit alignment between the first model 104 of the first component 106 and the first nominal model 124 to determine the first overall deviation 122;

[0266] performing a best-fit alignment between the second model 108 of the second component 110 and the second nominal model 224 to determine the second overall deviation 222;

[0267] determining a first overall size 164 of the first overall deviation 122 in the normal direction;

[0268] determining a second overall size 264 of the second overall deviation 222 in the normal direction;

[0269] mapping the first overall deviation 122 from an XYZ coordinate system 126 to a UVW coordinate system 128 such that the first overall size 164 of the first overall deviation 122 is represented along a W axis 152;

[0270] mapping the second overall deviation 222 from the XYZ coordinate system 126 to the UVW coordinate system 128 such that the second overall size 264 of the second overall deviation 222 is represented along the W axis 152;

[0271] filtering the first overall size 164 of the first overall deviation 122 into a first form deviation 132 and a first waviness deviation 134;

[0272] filtering the second overall dimension 264 of the second overall bias 222 into a second form bias 232 and a second waviness bias 234;

[0273] mapping the first waviness bias 134 from the UVW coordinate system 128 to the XYZ coordinate system 126, thereby representing a first waviness dimension 168 of the first waviness bias 134 as a first distance 160 relative to the first nominal model 124;

[0274] mapping the second waviness bias 234 from the UVW coordinate system 128 to the XYZ coordinate system 126, thereby representing a second waviness dimension 268 of the second waviness bias 234 as a second distance 260 relative to the second nominal model 224;

[0275] modifying the first nominal model 124 of the first component 106 by the first waviness bias 134, thereby causing a first modified nominal model 190 to represent a first mating surface 118 of the first component 106 after the first component 106 and the second component 110 are coupled together;

[0276] modifying the second nominal model 224 of the second component 110 by the second waviness bias 234, thereby causing a second modified nominal model 290 to represent a second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together;

[0277] analyzing the first modified nominal model 190 and the second modified nominal model 290 to determine a dimension 114 of a gap 116 between the first mating surface 118 of the first component 106 and the second mating surface 120 of the second component 110 after the first component 106 and the second component 110 are coupled together; and

[0278] recommending an action 212 based on a comparison of the gap 116 to a gap threshold 214, wherein the action 212 includes one of:

[0279] coupling the first component 106 and the second component 110 together when the dimension 114 of the gap 116 is less than or equal to the gap threshold 214;

[0280] re-machining at least one of the first component 106 and the second component 110 when the dimension 114 of the gap 116 is greater than the gap threshold 214;

[0281] redesigning at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214; and

[0282] repairing at least one of the first component 106 and the second component 110 when the size 114 of the gap 116 is greater than the gap threshold 214.

[0283] The foregoing detailed description has referred to specific examples of the disclosure described. Other examples, having different structures and operations, do not depart from the scope of the disclosure. In the different drawings, like reference numbers can refer to the same feature, element, or component. Throughout the disclosure, any one of a plurality of items can be referred to individually as an item, and a plurality of items can be referred to collectively as items and can be referred to with the same reference number. Furthermore, as used herein, a feature, element, component, or step preceded by the word “a” or “an” should be understood as not excluding plural features, elements, components, or steps, unless such exclusion is explicitly recited.

[0284] The above provides illustrative, non-exhaustive examples in accordance with the subject matter of the disclosure, which can be but are not necessarily claimed. Reference herein to “an example” means that a particular feature, structure, element, component, characteristic, and / or operational step described in connection with that example is included in at least one aspect, embodiment, and / or implementation of the subject matter of the disclosure. Thus, the phrases “example,” “an example,” “one or more examples,” and similar language throughout this disclosure can but do not necessarily refer to the same example. Furthermore, the subject matter characterized by any one example can but does not necessarily include the subject matter characterized by any other example. Moreover, the subject matter characterized by any one example can but does not necessarily be combined with the subject matter characterized by any other example.

[0285] As used herein, a system, apparatus, device, structure, article, element, component, or hardware that is “configured to” perform a particular function is capable of performing the particular function without any alteration, rather than simply having the potential to perform the particular function after a modification is made. In other words, a system, apparatus, device, structure, article, element, component, or hardware that is “configured to” perform a particular function is specifically selected, created, implemented, utilized, programmed, and / or designed for the purpose of performing the particular function. As used herein, “configured to” denotes existing characteristics of a system, apparatus, structure, article, element, component, or hardware, which enable the system, apparatus, structure, article, element, component, or hardware to perform the specified function without further modification. For purposes of the present disclosure, a system, apparatus, device, structure, article, element, component, or hardware described as being “configured to” perform a particular function can additionally or alternatively be construed as being “adapted to” and / or “operative to” perform that function.

[0286] Unless otherwise stated, the terms “first,” “second,” “third,” etc. are used herein as labels, and are not intended to impose numerical requirements on the objects to which these terms refer. Furthermore, the use of the terms “first,” “second,” “third,” etc. are not intended to limit the number of items to which these terms refer.

[0287] As used herein, the phrase “at least one of’ when used with a list of items indicates that any combination of one or more items in the list of items can be used, and that the list of items can be limited to one item. For example, “at least one of item A, item B, and item C” can include, but is not limited to, only item A or only item A and item B. The example can also include only item A, only item B, only item C, or any combination thereof. In other examples, “at least one of” can be, for example, but not limited to, two of item A, one of item B, and ten of item C; four of item B and seven of item C; and other suitable combinations. As used herein, the terms “and / or” and “ / ” encompass any and all combinations of one or more of the associated listed items.

[0288] For purposes of this disclosure, the terms “coupled,” “connected,” and similar terms, mean the element is in either direct or indirect mechanical, electrical, fluid, optical, electromagnetic, or magnetic interaction, communication, or coordination with the other element or elements. In various examples, the element can be directly or indirectly coupled with the other element. As an example, element A can be directly coupled with element B. As another example, element A can be indirectly coupled with element B, e.g., via element C. It shall be understood that not all associations between various disclosed elements are necessarily represented by way of coupling. Thus, there can be couplings other than those depicted in the drawings.

[0289] As used herein, the term “approximately” means or refers to a condition that is close to but not exactly the recited condition that still performs a desired function or achieves a desired result. As an example, the term “approximately” refers to a condition that is within an acceptable predetermined tolerance or accuracy, such as within 10% of the recited condition. However, the term “approximately” does not exclude a condition that is exactly the recited condition. As used herein, the term “substantially” refers to a condition that is the recited condition to a substantial degree.

[0290] The above-mentioned Figures 1 to 13 , Figure 16 and Figure 18 may represent functional elements, features, or components thereof, and do not necessarily imply any particular structural arrangement. Thus, modifications, additions, and / or omissions can be made to the illustrated structures. Additionally, it is understood that not all of the above-mentioned Figures 1 to 13 , Figure 16 and Figure 18 described and illustrated in the above-mentioned Figures 1 to 13 , Figure 16 and Figure 18 need be included in every example, and not all of the elements, features, and / or components described and illustrated in the above-mentioned Figures 1 to 13 , Figure 16 and Figure 18 , other drawings, and / or the appended disclosure need be included in every example. Similarly, additional features, not necessarily limited to the examples presented, can be combined with some or all of the features illustrated and described herein. Unless otherwise expressly stated, the above-mentioned Figures 1 to 13 , Figure 16 and Figure 18The schematic diagrams of the examples depicted are not meant to imply structural limitations with respect to illustrative examples. Rather, although one illustrative structure is indicated, it is understood that the structure can be modified, as appropriate, and therefore modifications, additions, and / or omissions can be made to the illustrated structure. Further, elements, features and / or components used in connection with one example described herein are likely to be used in connection with other examples as well. It will be apparent to those skilled in the art that the members, features, and / or components of the examples described herein can be used in a wide variety of Figures 1 to 13 , Figure 16 and Figure 18 are represented by the same reference numbers, and such elements, features and / or components can not be discussed in detail with respect to each of Figures 1 to 13 , Figure 16 and Figure 18 . Similarly, all elements, features and / or components can not be labeled in each of Figure 14 , Figure 15 and Figure 17 , but are referenced herein for consistency.

[0291] In the above-referenced Figure 14 , Figure 15 and Figure 17 , a block can represent an operation, a step and / or a portion thereof, and lines connecting various blocks do not imply any specific order or dependency of operations or portions thereof. It will be understood that not all dependencies between various disclosed operations need be represented. ​ , ​ and ​ and the accompanying disclosure describing operations of the disclosed methods set forth herein should not be construed as necessarily determining the order in which the operations are to be performed. Rather, although one illustrative order is indicated, it is understood that the order of the operations can be modified as appropriate. Thus, modifications, additions and / or omissions can be made to the illustrated operations, and certain operations can be performed in different orders or simultaneously. Additionally, those skilled in the art will understand that not all of the described operations are necessary.

[0292] Further, reference throughout this specification to features, advantages, or similar language does not mean that all of the features and advantages that can be achieved with the examples disclosed herein should be or are implemented in any single example or in any one example. Rather, language referring to the features and advantages is understood to mean that a particular feature, advantage, or characteristic is included in at least one example. Thus, discussions of features, advantages, and similar language, throughout the specification, can but do not necessarily refer to the same example.

[0293] The described features, advantages, and characteristics of the one example can be combined in any suitable manner in one or more other examples. Those skilled in the relevant art will recognize that the examples described herein can be practiced with one or more of the specific features or advantages of a particular example without resorting to the others. In other cases, additional features and advantages can be recognized in a certain example that may not be present in all examples. Further, although various examples of the system 100, the method 1000, the method 2000, and the computer program product 922 have been illustrated and described, modifications can be made by those skilled in the art upon reading the specification. The application includes such modifications and only the scope of the claims defines the scope of the application.

[0294] Priority

[0295] This application claims priority to U.S. Serial No. 63 / 664,340, filed June 26, 2024, and U.S. Serial No. 19 / 037,605, filed January 27, 2025, the entire contents of which are incorporated herein by reference.

Claims

1. A system (100) for predictive assembly, the system (100) comprising: A model generator (102) generates a first model (104) of the first component (106) and a second model (108) of the second component (110) before the first component (106) and the second component (110) are joined together; A model analyzer (112) analyzes the first model (104) and the second model (108) to determine the size (114) of the gap (116) between the first mating surface (118) of the first component (106) and the second mating surface (120) of the second component (110) after the first component (106) and the second component (110) are joined together; and An assembly planner (210) recommends an action (212) based on a comparison of the gap (116) with a gap threshold (214).

2. The system (100) according to claim 1, wherein, The action (212) recommended by the assembly planner (210) includes connecting the first component (106) and the second component (110) together when the size (114) of the gap (116) is less than or equal to the gap threshold (214).

3. The system (100) according to claim 1, wherein, The action (212) recommended by the assembly planner (210) includes reprocessing at least one of the first component (106) and the second component (110) when the size (114) of the gap (116) is greater than the gap threshold (214).

4. The system (100) according to claim 1, wherein, The action (212) recommended by the assembly planner (210) includes redesigning at least one of the first component (106) and the second component (110) when the size (114) of the gap (116) is greater than the gap threshold (214).

5. The system (100) according to claim 1, wherein, The action (212) recommended by the assembly planner (210) includes repairing at least one of the first component (106) and the second component (110) when the size (114) of the gap (116) is greater than the gap threshold (214).

6. The system (100) according to claim 1, wherein: The model analyzer (112): The first nominal model (124) of the first component (106) is modified by the first waviness deviation (134); and The second nominal model (224) of the second component (110) is modified by the second waviness deviation (234); The first modified nominal model (190) represents the first mating surface (118) of the first component (106) after the first component (106) and the second component (110) are joined together; and The second modified nominal model (290) represents the second mating surface (120) of the second component (110) after the first component (106) and the second component (110) are joined together; and The size (114) of the gap (116) is determined using the first modified nominal model (190) and the second modified nominal model (290).

7. The system (100) according to claim 6, wherein: The model analyzer (112): Determine the first overall deviation (122) in the normal direction between the first model (104) and the first nominal model (124) of the first component (106); and Determine the second overall deviation (222) in the normal direction between the second model (108) and the second nominal model (224) of the second component (110); The first waviness deviation (134) is derived from the first overall deviation (122); and The second waviness deviation (234) is derived from the second overall deviation (222).

8. The system (100) according to claim 7, wherein, The model analyzer (112): Perform a best-fit alignment between the first model (104) of the first component (106) and the first nominal model (124) to determine the first overall deviation (122); and Perform the best fit alignment between the second model (108) of the second component (110) and the second nominal model (224) to determine the second overall deviation (222).

9. A method (1000) for predictive assembly, the method (1000) comprising: A first model (104) of the first component (106) and a second model (108) of the second component (110) are generated before the first component (106) and the second component (110) are joined together; Analyze the first model (104) and the second model (108) to determine the size (114) of the gap (116) between the first mating surface (118) of the first component (106) and the second mating surface (120) of the second component (110) after the first component (106) and the second component (110) are joined together; and Action (212) is recommended based on the comparison between the gap (116) and the gap threshold (214).

10. A non-transitory computer-readable medium (920) comprising program code (918) that, when executed by one or more processors (904), causes the one or more processors (904) to perform operations, the operations including: A first model (104) of the first component (106) is generated from the first data (138) before the first component (106) is connected to the second component (110); A second model (108) of the second component (110) is generated from the second data (140) before the second component (110) is connected to the first component (106); Determine the first overall deviation (122) in the normal direction between the first model (104) and the first nominal model (124) of the first component (106); Determine the second overall deviation (222) in the normal direction between the second model (108) and the second nominal model (224) of the second component (110); Perform the best fit alignment between the first model (104) of the first component (106) and the first nominal model (124) to determine the first overall deviation (122); Perform the best fit alignment between the second model (108) of the second component (110) and the second nominal model (224) to determine the second overall deviation (222); Determine the first overall dimension (164) of the first overall deviation (122) in the direction of the normal; Determine the second overall deviation (222) in the direction of the normal as the second overall dimension (264); The first overall deviation (122) is mapped from the XYZ coordinate system (126) to the UVW coordinate system (128), thereby representing the first overall size (164) of the first overall deviation (122) along the W axis (152); The second overall deviation (222) is mapped from the XYZ coordinate system (126) to the UVW coordinate system (128), thereby representing the second overall size (264) of the second overall deviation (222) along the W axis (152); The first overall size (164) of the first overall deviation (122) is filtered into a first form deviation (132) and a first waviness deviation (134); The second overall size (264) of the second overall deviation (222) is filtered into the second form deviation (232) and the second waviness deviation (234); The first waviness deviation (134) is mapped from the UVW coordinate system (128) to the XYZ coordinate system (126), thereby representing the first waviness dimension (168) of the first waviness deviation (134) as a first distance (160) relative to the first nominal model (124); The second waviness deviation (234) is mapped from the UVW coordinate system (128) to the XYZ coordinate system (126), thereby representing the second waviness dimension (268) of the second waviness deviation (234) as a second distance (260) relative to the second nominal model (224); The first nominal model (124) of the first component (106) is modified by the first waviness deviation (134) so ​​that the first modified nominal model (190) represents the first mating surface (118) of the first component (106) after the first component (106) and the second component (110) are joined together; The second nominal model (224) of the second component (110) is modified by the second waviness deviation (234) so ​​that the second modified nominal model (290) represents the second mating surface (120) of the second component (110) after the first component (106) and the second component (110) are joined together; Analyze the first modified nominal model (190) and the second modified nominal model (290) to determine the size (114) of the gap (116) between the first mating surface (118) of the first component (106) and the second mating surface (120) of the second component (110) after the first component (106) and the second component (110) are joined together; and An action (212) is recommended based on a comparison between the gap (116) and the gap threshold (214), wherein the action (212) includes one of the following: When the size (114) of the gap (116) is less than or equal to the gap threshold (214), the first component (106) and the second component (110) are connected together; When the size (114) of the gap (116) is greater than the gap threshold (214), at least one of the first component (106) and the second component (110) is reprocessed; When the size (114) of the gap (116) is greater than the gap threshold (214), at least one of the first component (106) and the second component (110) is redesigned; as well as When the size (114) of the gap (116) is greater than the gap threshold (214), at least one of the first component (106) and the second component (110) is repaired.

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