Scanning scattering type light beam analyzer

By employing a multi-position imaging scanning mechanism and image stitching technology, the problems of insufficient resolution and Rayleigh length coverage in existing high beam quality laser measurements have been solved, enabling high-precision beam quality analysis.

CN121364060APending Publication Date: 2026-01-20NATIONAL INSTITUTE OF METROLOGY CHINA
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Patent Information

Application Number
CN202511946830.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-23
Publication Date
2026-01-20

AI Technical Summary

Technical Problem

Existing scattering imaging beam analyzers struggle to simultaneously guarantee high resolution and sufficient Rayleigh length coverage when measuring high-beam-quality lasers, leading to a significant increase in measurement errors.

Method used

A multi-position imaging scanning mechanism is adopted, which uses movable imaging components or fixed array imaging components to achieve full field-of-view acquisition of beam scattered light. Combined with host computer control, image stitching and parameter fitting are performed to obtain beam quality indicators.

Benefits of technology

It achieves high-resolution imaging and long Rayleigh length coverage, improving measurement accuracy and adapting to the measurement needs of high-power and high-beam-quality lasers.

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Abstract

The invention relates to a scanning scattering type light beam analyzer, which comprises an imaging scanning mechanism for realizing full-view-field acquisition of light beam scattered light through multiple positions of a light beam propagation path, and the imaging scanning mechanism adopts a movable imaging assembly or a fixed array type imaging assembly. The imaging unit comprises an imaging darkroom, a field diaphragm, an imaging lens and a camera; the upper computer is electrically connected with the scanning mechanism and the camera, controls the scanning mechanism to collect scattered light images at different positions, carries out splicing processing on the images, calculates a light beam center position and a light beam width based on the spliced images, fits propagation parameters of a laser beam according to the light beam center position and the light beam width, and carries out detection on the laser beam according to the propagation parameters. And finally obtaining a laser beam quality index. The laser beam is scanned and imaged to realize multi-position high-resolution imaging and Rayleigh length coverage, the beam acquisition stability is high, and the measurement accuracy is improved; and the device is adaptive to high-power, short-wave and other high-beam-quality lasers.
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Citation Information

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