A method, system, device, electronic device and storage medium for testing performance of a memory alloy wire

Abstract

This invention relates to a method for testing the performance of shape memory alloy wires, including establishing a univariate linear calibration model correction system; obtaining the performance parameters of the shape memory alloy wires and determining whether they are qualified. The invention also relates to a system, including the shape memory alloy wire to be tested, a worktable, a slide rail fixed on the worktable, and first and second clamps fixed on the slide rail. The first and second clamps have limit slots; the first and second clamps are connected to limit blocks; the positive and negative terminals of a power supply are respectively connected to the two limit slots; a counterweight is connected to the second clamp; and an industrial camera is mounted on a first connecting plate. The invention also relates to an apparatus, including testing, calibration, and judgment modules. The invention further relates to an electronic device and a storage medium. The method, system, apparatus, electronic device, and storage medium for testing the performance of shape memory alloy wires designed according to this invention can solve the problems of disconnection from real products, high cost, poor adaptability, and low efficiency in shape memory alloy wire testing.

Description

Technical Field

[0001] This invention relates to the field of quality testing technology, and specifically to a method, system, device, electronic device, and storage medium for testing the performance of shape memory alloy wires. Background Technology

[0002] Shape memory alloy wires, due to their shape memory effect and superelasticity, are widely used in medical devices, precision drives, consumer electronics, and other fields. In actual products, shape memory alloy wires are usually connected to external circuits or mechanisms through crimp terminals, solder terminals, or adhesive terminals. Their heating, stress, and cooling processes are all completed in the "terminal-equipped" assembled state.

[0003] To ensure consistent quality of shape memory alloy wires during mass production, existing technologies typically employ specialized testing tools and precision sensors to assess their performance. However, these existing methods suffer from the following shortcomings:

[0004] First, the testing conditions are disconnected from real product operating conditions: Existing patents and testing devices mainly target the performance testing of "bare wires," that is, clamping the two ends of the wire through specially designed clamping structures or weight systems, without considering the impact of terminal crimping, welding, and other processes on the local structure and stress state of the wire. In actual products, the terminal crimping area may change the local resistance, stress distribution, and deformation mode of the wire. If the test is only for bare wires, there is a risk that the performance measured in the laboratory will not match the performance under actual assembly conditions, which is not conducive to evaluating the true performance of product-grade shape memory alloy wires. Second, the system is costly and has poor environmental adaptability: Existing testing systems rely heavily on high-precision dedicated sensors such as laser displacement sensors. These sensors are expensive, have strict requirements for installation conditions and environmental stability, and are easily affected by electromagnetic interference, temperature fluctuations, and vibrations. In multi-station production lines or complex electrical environments, maintaining high-precision measurements is costly, and the system's environmental adaptability is limited. Third, it is difficult to adapt to mass production scenarios, and the testing efficiency is low: Some existing devices have complex mechanical structures, with many steps in the clamping, alignment, and zeroing processes, which heavily rely on the experience of the operators. For production scenarios that require large-scale sampling or full inspection, the aforementioned cumbersome operating procedures can lead to long preparation times for individual items and difficulty in compressing cycle time, which is not conducive to promoting its use on the production line.

[0005] Therefore, existing technologies have shortcomings and need to be improved and developed. Summary of the Invention

[0006] The present invention provides a method, system, apparatus, electronic device and storage medium for testing the performance of shape memory alloy wires, which solves the problems of the prior art when using special testing tools and precision sensors to test the performance of shape memory alloy wires, such as the test state being out of touch with the actual product working conditions, high system cost and poor environmental adaptability, difficulty in adapting to mass production scenarios and low testing efficiency.

[0007] In a first aspect, the present invention provides a method for testing the properties of shape memory alloy wires, comprising:

[0008] Based on at least 10 known reference lengths captured by an industrial camera in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the visible positions of the second clamp;

[0009] Establish a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors;

[0010] A system for testing the properties of shape memory alloy wires was used to test the initial length of the wire. The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained;

[0011] Calculate the average value in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire to be tested is determined to be a non-qualified product.

[0012] Furthermore, the establishment of a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the systematic error compensation value, used to correct systematic errors, including:

[0013] After establishing a univariate linear calibration model, at least three operators each perform three tests to obtain the GR&R index after performing measurement system analysis. If GR&R ≤ 10%, the system for testing the performance of shape memory alloy wire is deemed to be capable enough and the univariate linear calibration model is valid. If GR&R > 10%, after analyzing the sources of variation and improving the system for testing the performance of shape memory alloy wire, the univariate linear calibration model is re-established based on the images captured by the industrial camera until GR&R ≤ 10%.

[0014] Furthermore, the system used for testing the performance of shape memory alloy wires has an initial length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the initial power-on test, the performance parameters of the shape memory alloy wire under test were obtained, including:

[0015] After the memory alloy wire to be tested, with terminals attached, is installed between the first and second clamps via the limiting groove, an industrial camera is triggered to acquire an initial state image, and the initial state length of the memory alloy wire to be tested is measured based on the initial state image. ;

[0016] The shape memory alloy wire to be tested is subjected to voltage Fu, time The heating process begins within milliseconds. Upon completion of heating, an industrial camera is triggered to capture an image of the shrinkage state, and the shrinkage length of the shape memory alloy wire under test is measured based on this image. ;

[0017] Power is turned off to allow the shape memory alloy wire under test to cool and recover. Once the displacement stabilizes, an industrial camera is triggered to capture an image of the recovered state, and the recovered length of the shape memory alloy wire under test is measured based on the image. ;

[0018] Based on the initial state length Length in contracted state Length of recovery state Calculate the performance parameters of the shape memory alloy wire to be tested, including at least the shrinkage displacement. , restore displacement strain rate ,in , , .

[0019] Furthermore, the average value The calculation formula is: ,in These are the performance parameter values ​​under the first power-on test, ... For the first The values ​​of performance parameters under the first power-on test.

[0020] Furthermore, the standard deviation The calculation formula is: ,in For the first The performance parameters under the second power-on test and .

[0021] Furthermore, the average value is calculated in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the test results in a value between 0.5 and 0.5, the shape memory alloy wire is deemed a qualified product; otherwise, it is deemed a defective product, including:

[0022] According to the eight SPC anomaly detection rules, if any one of the SPC anomaly detection rules is not met, it is determined that the production process of the memory alloy wire under test has abnormal fluctuations and an early warning message is sent to improve the production process of the memory alloy wire.

[0023] In a second aspect, the present invention provides a system for testing the performance of shape memory alloy wires, which implements the method for testing the performance of shape memory alloy wires, comprising shape memory alloy wires, wherein terminals are fixed at both ends of the shape memory alloy wires;

[0024] It also includes a worktable, on which a slide rail is fixed, and an insulated first clamp is fixed on the slide rail and an insulated second clamp is slidably connected thereto. Limiting grooves are provided on the side of the first clamp facing the second clamp and the side of the second clamp facing the first clamp, and the shape of the limiting grooves is adapted to the shape of the terminal.

[0025] The upper surface of the first clamp is equipped with a spring and is fixedly connected to an insulated first limiting block. The upper surface of the second clamp is equipped with a spring and is fixedly connected to an insulated second limiting block. When the spring is in an unextended state, the other end of the first limiting block that is not connected to the spring covers the limiting groove of the first clamp, and the other end of the second limiting block that is not connected to the spring covers the limiting groove of the second clamp.

[0026] The positive terminal of the power supply is electrically connected to the limiting groove of the first clamp via a wire, and the negative terminal of the power supply is electrically connected to the limiting groove of the second clamp via a wire.

[0027] A first connecting plate is also fixed on the workbench. A second connecting plate is directly fixed to the side of the slide rail away from the first clamp and the first connecting plate. A pulley is fixed on the second connecting plate. A connecting column is fixed on the second clamp. A connecting rope is fixed on the connecting column. The connecting rope is placed in the groove of the pulley and a counterweight is fixed to the end of the rope that is not connected to the connecting column.

[0028] An industrial camera is mounted on the first connecting plate, and the field of view of the industrial camera covers at least the sliding range of the first clamp and the second clamp on the slide rail.

[0029] A third aspect of the present invention provides an apparatus for testing the properties of shape memory alloy wires, comprising:

[0030] The acquisition module is used to capture at least 10 known reference lengths based on an industrial camera in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the visible positions of the second clamp;

[0031] The calibration module is used to establish a univariate linear calibration model. ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors;

[0032] The testing module is used to test the properties of shape memory alloy wires with an initial length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained;

[0033] The judgment module is used to calculate the average value of each performance parameter in real time. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire to be tested is determined to be a non-qualified product.

[0034] In a fourth aspect, the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the electronic device implements the method for testing the performance of shape memory alloy wires.

[0035] In a fifth aspect of this invention, a computer-readable storage medium is provided for storing a computer program that, when run on a computer, causes the computer to perform the method for testing the performance of shape memory alloy wires.

[0036] Beneficial effects:

[0037] As can be seen from the above technical solutions, the present invention provides a method, system, device, electronic device, and storage medium for testing the performance of shape memory alloy wires, which has the following beneficial effects:

[0038] 1. Achieving Terminal-Modified Testing Consistent with Product Operating Conditions: By setting limiting grooves adapted to the terminal shape on the first and second clamps, and using insulating limiting blocks and spring structures to hold the terminals, the shape memory alloy wire to be tested is clamped between the clamps in a "terminal-mounted" form. Counterweights and pulley structures provide constant or controllable tension to the wire, making its stress state closely resemble the actual operating conditions of the product. This structure allows the testing process to directly reflect the comprehensive impact of terminal crimping, welding, and other processes on the wire's performance, making the test sample equivalent to a product component. The obtained data such as displacement, restoring force, and cycle life directly reflect the true performance of the final product. The test results have extremely high reliability and guiding value, improving the consistency between test results and practical applications.

[0039] 2. Replacing high-cost displacement sensors with industrial camera vision measurement: Images covering the movement range of both the first and second clamps are acquired using an industrial camera. Visual markers are placed at the transparent locations of the second clamp. A univariate linear calibration model is established based on at least 10 known reference lengths and the number of pixels in the image, mapping pixel size to actual physical length. This eliminates reliance on expensive sensors such as laser displacement sensors, utilizing a general-purpose industrial camera for displacement measurement, reducing system hardware costs. Furthermore, visual calibration and error compensation improve measurement accuracy and environmental adaptability.

[0040] 3. Simplified testing structure, high clamping efficiency, and adaptability to mass production cycles: A simple mechanical structure is constructed using slide rails, a sliding second clamp, and a counterweight. Terminals are directly positioned via limit slots, and insulating limit blocks automatically hold the terminals under spring pressure. Operators only need to place the wire with the terminal into the limit slot and release the limit block to complete the clamping process, eliminating the need for complex alignment and adjustment operations. This structure helps shorten single-piece preparation time, reduces reliance on operator skills, and is suitable for production line sampling inspection and multi-station layouts. Furthermore, it not only obtains performance data closest to the actual product state at extremely low cost and high efficiency, but also establishes dynamic quality control limits through real-time analysis of massive amounts of data. This enables a leap from single judgment to trend prediction, and from post-inspection to pre-warning, providing unprecedented data support and decision-making basis for the production quality control and process optimization of core components.

[0041] 4. Introducing Measurement System Analysis and Statistical Process Control to Construct a Digital Quality Control Link: After establishing a linear calibration model, at least three operators are involved, each performing multiple repeated measurements. Measurement system analysis is conducted to obtain the GR&R (Gross Response Rate) index. When GR&R ≤ 10%, the system's measurement capability is confirmed to be sufficient. Subsequently, by calculating the average value μ and standard deviation σ of various performance parameters in real time from n power-on tests, statistical quality control upper and lower limits of μ ± 3σ are established. Based on rules such as whether performance parameters fall within control limits, are close to ± 3σ, or whether multiple consecutive samples fall outside ± 2σ, samples are classified into qualified, borderline, and unqualified products. Simultaneously, abnormal fluctuations in the production process are assessed, triggering early warnings. This scheme, based on single-piece judgment, constructs a complete statistical quality control link from measurement system capability verification to process control.

[0042] 5. Stable, intuitive, and concise representation of shape memory alloy wire: Non-contact measurement with strong anti-interference capabilities, capable of acquiring rich two-dimensional image information. In addition to core displacement data, it can also: perform process monitoring and fault diagnosis through image analysis: for example, by analyzing whether the movement trajectory of marked points is straight, it can determine whether the clamping is parallel and whether there is any jamming during movement; record the testing process: saved images or videos can be archived as raw data for subsequent traceability and analysis; expand to more measurement items: in the future, more complex algorithms can be used to simultaneously analyze the wire's diameter changes, surface morphology, etc., from the images.

[0043] It should be understood that all combinations of the foregoing concepts and the additional concepts described in more detail below can be considered part of the inventive subject matter of this disclosure, provided that such concepts do not contradict each other.

[0044] The foregoing and other aspects, embodiments, and features of the teachings of the present invention will be more fully understood from the following description in conjunction with the accompanying drawings. Other additional aspects of the invention, such as features and / or beneficial effects of exemplary embodiments, will become apparent from the following description or may be learned through practice of specific embodiments according to the teachings of the present invention. Attached Figure Description

[0045] The accompanying drawings are not drawn to scale. In the drawings, each identical or nearly identical component shown in the various figures may be denoted by the same reference numeral. For clarity, not every component is labeled in each figure. Embodiments of various aspects of the invention will now be described by way of example and with reference to the accompanying drawings, wherein:

[0046] Figure 1 This is a flowchart of a method for testing the performance of shape memory alloy wires according to an embodiment of this application.

[0047] Figure 2 This is a structural diagram of a system for testing the performance of shape memory alloy wires according to an embodiment of this application.

[0048] Figure 3 for Figure 2 Enlarged view of point A in the middle.

[0049] Figure 4 This is a schematic diagram of an electronic device according to an embodiment of this application.

[0050] Explanation of icon numbers:

[0051] 1. Workbench; 2. Slide rail; 3. First clamp; 4. Second clamp; 5. Memory alloy wire to be tested; 6. First limiting block; 7. Second limiting block; 8. First connecting plate; 9. Second connecting plate; 10. Pulley; 11. Connecting column; 12. Connecting rope; 13. Counterweight; 14. Industrial camera. Detailed Implementation

[0052] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention without creative effort are within the scope of protection of the present invention. Unless otherwise defined, the technical or scientific terms used herein should have the ordinary meaning understood by those skilled in the art to which this invention pertains.

[0053] The terms "first," "second," and similar words used in the specification and claims of this patent application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Similarly, unless the context clearly indicates otherwise, the singular forms of "an," "a," or "the," etc., do not indicate a quantity limitation, but rather indicate the presence of at least one. Terms such as "comprising" or "including" mean that the element or object preceding "comprising" encompasses the features, integrals, steps, operations, elements, and / or components listed following "comprising" or "including," and do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components, and / or collections thereof. Terms such as "upper," "lower," "left," and "right" are used only to indicate relative positional relationships; these relative positional relationships may change accordingly when the absolute position of the described object changes.

[0054] To ensure consistent quality of shape memory alloy wires during mass production, existing technologies typically employ specialized testing tools and precision sensors to assess their performance. However, these existing methods suffer from the following shortcomings:

[0055] First, the testing conditions are disconnected from real product operating conditions: Existing patents and testing devices mainly target the performance testing of "bare wires," that is, clamping the two ends of the wire through specially designed clamping structures or weight systems, without considering the impact of terminal crimping, welding, and other processes on the local structure and stress state of the wire. In actual products, the terminal crimping area may change the local resistance, stress distribution, and deformation mode of the wire. If the test is only for bare wires, there is a risk that the performance measured in the laboratory will not match the performance under actual assembly conditions, which is not conducive to evaluating the true performance of product-grade shape memory alloy wires. Second, the system is costly and has poor environmental adaptability: Existing testing systems rely heavily on high-precision dedicated sensors such as laser displacement sensors. These sensors are expensive, have strict requirements for installation conditions and environmental stability, and are easily affected by electromagnetic interference, temperature fluctuations, and vibrations. In multi-station production lines or complex electrical environments, maintaining high-precision measurements is costly, and the system's environmental adaptability is limited. Third, it is difficult to adapt to mass production scenarios, and the testing efficiency is low: Some existing devices have complex mechanical structures, with many steps in the clamping, alignment, and zeroing processes, which heavily rely on the experience of the operators. For production scenarios that require large-scale sampling or full inspection, the aforementioned cumbersome operating procedures can lead to long preparation times for individual items and difficulty in compressing cycle time, which is not conducive to promoting its use on the production line.

[0056] Therefore, embodiments of the present invention provide a method for testing the properties of shape memory alloy wires, referring to... Figure 1 ,include:

[0057] Step S102: Based on at least 10 known reference lengths captured by an industrial camera 14 in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the transparent positions of the second clamp 4.

[0058] Step S104: Establish a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors.

[0059] Step S106: Using a system for testing the properties of shape memory alloy wires, the initial length is... The shape memory alloy wire to be tested is subjected to voltage 5 Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire 5 to be tested were obtained.

[0060] Step S108: Calculate the average value for each performance parameter in real time. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire 5 to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire 5 to be tested is determined to be a non-qualified product.

[0061] To establish the correspondence between pixels and actual lengths, at least 10 memory alloy wire samples of known reference lengths can be sequentially clamped on the workbench 1. The length of each sample is measured and recorded using a conventional vernier caliper or measuring tool before clamping. During clamping, the positioning terminals are located using the limiting slots of the first clamp 3 and the second clamp 4, ensuring that the field of view of the industrial camera 14 covers the effective area between the two clamps. Visual markers are set at the transparent positions of the second clamp 4. A transparent position means that it is located in a position that moves with the second clamp 4 and is within the field of view of the industrial camera 14; and that the backlight source can transmit light. For example, by attaching a high-contrast marker patch to the side of the second clamp 4 near the counterweight 13, the industrial camera 14 can clearly identify the edge of the marker. For each reference sample, the pixel distance from the visual marker to the reference edge of the image is extracted using an image processing algorithm, multiple sets of data are constructed, and the proportional coefficient and system error compensation value are obtained through linear fitting, thereby establishing a univariate linear calibration model.

[0062] After calibration, the memory alloy wires 5 to be tested, with terminals, are clamped one by one between the first clamp 3 and the second clamp 4. A stable tensile force is formed using the counterweight 13, and then voltage is applied. and time Each filament was subjected to an electrical test. In each electrical cycle, performance parameters were calculated, and for each performance parameter, the mean and standard deviation were calculated. Then, statistical quality control limits were set, and the quality of the tested filament was determined. Statistical analysis of the electrical test results was then performed. Control limits are used to determine the quality of samples, expanding the test results from single measurements to a comprehensive judgment based on statistical characteristics, thereby improving the ability to characterize the performance stability and dispersion of the tested shape memory alloy wire.

[0063] In some embodiments, a univariate linear calibration model is established. ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the systematic error compensation value, used to correct systematic errors, including:

[0064] After establishing the univariate linear calibration model, at least three operators each perform three tests to obtain the GR&R index after performing measurement system analysis. If GR&R ≤ 10%, the system for testing the performance of shape memory alloy wire is deemed to have sufficient capability, the univariate linear calibration model is valid, and the system for testing the performance of shape memory alloy wire is confirmed to have the measurement capability to meet engineering applications. If GR&R > 10%, after analyzing the source of variation and improving the system for testing the performance of shape memory alloy wire, the univariate linear calibration model is re-established based on the images captured by the industrial camera 14 until GR&R ≤ 10%.

[0065] A measurement system analysis step has been added, calculating the GR&R index through repeated measurements by multiple operators to determine if the system has sufficient measurement capabilities. If the GR&R does not meet the requirements, the system is improved, for example, by reducing fixture repeatability errors, stabilizing the counterweight, or standardizing operating habits. Targeted optimizations are made to the fixture structure, operating procedures, or optical configuration. Then, a new calibration model is established, and the GR&R evaluation is repeated until the GR&R meets the set threshold. In some embodiments, the system's capabilities are sufficient, and the effective GR&R index range for the univariate linear calibration model can be expanded to 30%. That is, if GR&R ≤ 30%, the system for testing the performance of shape memory alloy wires is considered to have sufficient capabilities, the univariate linear calibration model is effective, and it is suitable for production conditions with different requirements.

[0066] When GR&R > 10%, the system structure, optical configuration or operating procedures are adjusted by analyzing the sources of variation in operators, equipment, environment, etc., and calibration and GR&R evaluation are performed again.

[0067] In existing quality management systems, measurement system analysis (MSA) and GR&R assessment are widely used in dimensional measurement, performance testing, and other applications to determine whether a measurement system is suitable as a basis for process control. This embodiment introduces the concept of MSA into the performance testing scenario of shape memory alloy wires, which helps improve the reliability of the entire testing system. By introducing MSA, the testing method not only possesses measurement capabilities but also self-monitoring capabilities, ensuring the reliability of the data upon which subsequent statistical analysis is based and helping to avoid erroneous judgments caused by excessive measurement system errors.

[0068] In some embodiments, a system for testing the properties of shape memory alloy wires is used to test the initial length of the wire. The shape memory alloy wire to be tested is subjected to voltage 5 Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire 5 under test were obtained, including:

[0069] After the memory alloy wire 5 with terminals is installed between the first clamp 3 and the second clamp 4 through the limiting groove, the industrial camera 14 is triggered to acquire an initial state image and the initial state length of the memory alloy wire 5 is measured based on the initial state image. ;

[0070] The shape memory alloy wire 5 to be tested is subjected to voltage Fu, time The heating process begins within milliseconds. Upon completion of heating, an industrial camera 14 is triggered to capture an image of the shrinkage state. Based on this image, the shrinkage length of the shape memory alloy wire 5 under test is measured. ;

[0071] Power is turned off to allow the shape memory alloy wire 5 under test to cool and recover. Once the displacement stabilizes, the industrial camera 14 is triggered to acquire an image of the recovered state, and the recovered length of the shape memory alloy wire 5 is measured based on the image. ;

[0072] Based on the initial state length Length in contracted state Length of recovery state Calculate the performance parameters of the shape memory alloy wire 5 to be tested. The performance parameters include at least the shrinkage displacement. , restore displacement strain rate ,in , , .

[0073] The test wire with terminals is installed in the limiting groove between the first and second clamps. The terminals are positioned and held by the limiting block and spring. In the initial state, the industrial camera 14 is triggered to acquire images, and calculations are performed using the calibration model. ; then with voltage ,time The wire is electrically heated, and images of the shrinkage state are acquired and calculated at the end of the heating process. Power was turned off and the area was allowed to cool down. After the displacement stabilized, images of the recovered state were acquired and calculations were performed. The performance parameters were calculated. By acquiring images in three states and calculating the length, the shrinkage and recovery behavior of shape memory alloy wires during the electric heating and cooling recovery processes can be fully characterized, and quantitative indicators of shrinkage capacity, residual deformation and strain characteristics can be obtained, providing basic data for subsequent statistical analysis.

[0074] In some embodiments, the average value The calculation formula is: ,in These are the performance parameter values ​​under the first power-on test, ... For the first The performance parameters under the first power-on test are numerical values. The average value is defined using a standard arithmetic mean formula to ensure the statistical calculation method is clear and easy to implement directly in software or control systems, thereby enhancing the feasibility and reproducibility of the method.

[0075] In some embodiments, standard deviation The calculation formula is: ,in For the first The performance parameters under the second power-on test and The method employs the standard statistical method for calculating sample standard deviation, ensuring it conforms to general guidelines for statistical process control. A clearly defined calculation formula helps reduce comprehension bias and improves the consistency and comparability of statistical results.

[0076] In some embodiments, the average value is calculated in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the test results are within the acceptable range, the shape memory alloy wire 5 is deemed a qualified product; otherwise, the shape memory alloy wire 5 is deemed a defective product, including:

[0077] According to the eight SPC anomaly detection rules, if any one of the SPC anomaly detection rules is not met, it is determined that the production process of the memory alloy wire 5 under test has abnormal fluctuations and an early warning message is sent to improve the production process of the memory alloy wire 5 under test.

[0078] In the production process of shape memory alloy wires, it is necessary to monitor their key performance parameters (such as initial length) in real time. Length in contracted state To assess the stability of the performance parameter, statistical process control is performed using conventional control charts (such as Xbar-R charts). The center line (CL) of the control chart is set as the target value of the performance parameter (i.e., ...). The upper control limit (UCL) and lower control limit (LCL) are set as follows: and The control chart is divided into three regions, A, B, and C, along both sides of the center line. Each region is [width missing]. Specifically: Area C ( to ), Area B ( to , to Area A to , to ).

[0079] When any of the following abnormal patterns appear on the control chart, it is determined that there is an abnormal fluctuation in the production process of shape memory alloy wire, and the early warning system is automatically triggered to notify production personnel to take corrective measures in a timely manner:

[0080] Mode 1 (Out-of-bounds detection): Any sample performance parameter data point exceeds the upper control limit (UCL) or lower control limit (LCL).

[0081] Mode 2 (Chain Differential): Nine consecutive sample performance parameter data points fall on the same side of the center line.

[0082] Mode 3 (Trend Anomaly Detection): Six consecutive sample performance parameter data points show an increasing or decreasing trend.

[0083] Mode 4 (Alternating Anomaly Detection): In 14 consecutive sample performance parameter data points, adjacent points fluctuate alternately up and down.

[0084] Mode 5 (Deviation Detection): Among eight consecutive sample performance parameter data points, two or more points fall outside Zone B on the same side of the center line (i.e., the data points are greater than...). or less This embodiment specifically applies this mode for monitoring: when it detects that two out of eight consecutive data points fall outside area B on the same side, the system determines that there is an abnormal fluctuation in the production process and sends an alert.

[0085] Mode 6 (Clustering Differential Detection): Among five consecutive sample performance parameter data points, four or more points fall outside region C on the same side of the center line (i.e., the data points are greater than...). or less ).

[0086] Mode 7 (Stratified Differential Detection): All 15 consecutive sample performance parameter data points fall within Zone C on both sides of the center line (i.e., all points are within...). to (within the range).

[0087] Mode 8 (Missing Near-Center Anomaly Detection): Eight consecutive sample performance parameter data points fall on both sides of the center line, and none of them fall within region C (i.e., all points are within the center line). to (outside the scope).

[0088] Improvement process after early warning:

[0089] Upon receiving any alarm, production personnel must suspend or closely monitor the production process. Based on the alarm pattern's indication (e.g., too high, too low, periodic, etc.), they should investigate the specific cause, such as checking equipment, calibrating instruments, verifying raw materials, and adjusting process parameters. After eliminating the cause of the anomaly and the process stabilizes, data must be collected again to assess control limits, and the process transitions to the control chart stage for continuous monitoring.

[0090] By systematically applying anomaly detection criteria, full-mode, automated, and intelligent monitoring of the shape memory alloy wire production process has been achieved. It can not only detect obvious points of loss of control, but also keenly identify early or hidden signs of anomalies such as process mean deviations, trend changes, and periodic disturbances. This enables earlier warnings and more accurate location of problems, greatly improving the preventative capabilities of process control and the consistency of product quality, and possesses high industrial practical value.

[0091] Another embodiment of the present invention also provides a system for testing the properties of shape memory alloy wires, and a method for testing the properties of shape memory alloy wires, as described above. Figures 2-3 The test includes a memory alloy wire 5 to be tested, with terminals fixed at both ends of the memory alloy wire 5, and a worktable 1. A slide rail 2 is fixed on the worktable 1. An insulated first clamp 3 is fixed on the slide rail 2 and an insulated second clamp 4 is slidably connected thereto. Limiting grooves are provided on the side of the first clamp 3 facing the second clamp 4 and the side of the second clamp 4 facing the first clamp 3. The shape of the limiting grooves is adapted to the shape of the terminals.

[0092] The upper surface of the first clamp 3 is equipped with a spring and is fixedly connected to an insulated first limiting block 6. The upper surface of the second clamp 4 is equipped with a spring and is fixedly connected to an insulated second limiting block 7. When the spring is in an unextended state, the other end of the first limiting block 6, which is not connected to the spring, covers the limiting groove of the first clamp 3. The other end of the second limiting block 7, which is not connected to the spring, covers the limiting groove of the second clamp 4.

[0093] The positive terminal of the power supply is electrically connected to the limiting groove of the first clamp 3 via a wire, and the negative terminal of the power supply is electrically connected to the limiting groove of the second clamp 4 via a wire.

[0094] The workbench 1 is also fixed with a first connecting plate 8. The side of the slide rail 2 away from the first clamp 3 is directly fixed with the first connecting plate 8 and a second connecting plate 9. A pulley 10 is fixed on the second connecting plate 9. A connecting column 11 is fixed on the second clamp 4. A connecting rope 12 is fixed on the connecting column 11. The connecting rope 12 is placed in the groove of the pulley 10 and a counterweight 13 is fixed at the end that is not connected to the connecting column 11.

[0095] An industrial camera 14 is mounted on the first connecting plate 8. The field of view of the industrial camera 14 covers at least the sliding range of the first clamp 3 and the second clamp 4 on the slide rail 2.

[0096] A slide rail 2 is fixed on the workbench 1. A first clamp 3 is fixed on the slide rail 2, and a second clamp 4 can slide along the slide rail 2. Limiting grooves, shaped to fit the terminals, are provided on opposite sides of the two clamps for positioning the terminals. Springs are installed on the upper surfaces of the first clamp 3 and the second clamp 4, and are connected to insulating limiting blocks via the springs. When the springs are not extended, the limiting blocks cover the limiting grooves to hold the terminals. The positive and negative terminals of the power supply are electrically connected to the two limiting grooves via wires to energize the wire with terminals. One end of the slide rail 2 is fixed to a second connecting plate 9 via a first connecting plate 8. A pulley 10 is provided on the second connecting plate 9. A connecting post 11 is fixed on the second clamp 4. One end of a connecting rope 12 is tied to the connecting post 11, passes through the pulley 10, and the other end is connected to a counterweight 13 to achieve tensile loading on the wire. An industrial camera 14 is installed on the first connecting plate 8, whose field of view covers the sliding range of the two clamps on the slide rail 2, facilitating the acquisition of images of the wire in different states. This system architecture enables rapid clamping and constant tensile loading of terminal wires while ensuring electrical insulation and energization. The industrial camera 14 and slide rail 2 are strategically positioned to ensure image acquisition throughout the entire range of motion. The system provides the mechanical and optical foundation for the method implementation, enabling linear calibration, three-state imaging, and statistical analysis to be performed on a unified platform.

[0097] The workbench 1 serves as a support platform. The slide rail 2 is fixed to the workbench 1 along the length of the wire. The first clamp 3 is fixed to one end of the slide rail 2 by bolts or positioning blocks. The second clamp 4 slides by cooperating with the slide rail 2 through a slider. The first clamp 3 and the second clamp 4 have limiting grooves with shapes matching the shape of the terminal on the side facing each other to ensure that the terminal can be laterally positioned and rotated after insertion.

[0098] Springs are installed on the upper surfaces of the two clamps, with the other end of each spring connected to an insulating limiting block. Under the tension of the spring, the limiting block covers the limiting groove, creating downward pressure on the terminal. When the terminal is inserted into the limiting groove, clamping is completed by lifting the limiting block upwards. After releasing the limiting block, the spring presses the terminal firmly, preventing it from falling off during energization and retraction. The power supply is electrically connected to the two limiting grooves via wires, ensuring that current flows through the terminal and wire to form a closed circuit.

[0099] The end of the slide rail 2 away from the first clamp 3 is fixed to the workbench 1 by the first connecting plate 8. The second connecting plate 9 is further fixed on the first connecting plate 8. The pulley 10 is installed on the second connecting plate 9. One end of the connecting rope 12 is tied to the connecting column 11 on the second clamp 4. After passing around the pulley 10, the counterweight 13 is fixed to achieve the tensile loading of the wire.

[0100] The industrial camera 14 is mounted on the first connecting plate 8 via a bracket. Its mounting position and field of view are designed to cover at least the entire working stroke of the two clamps on the slide rail 2. The industrial camera 14 is connected to a host computer for acquiring images and performing visual calibration, length measurement, and result storage.

[0101] Another embodiment of the present invention also provides an apparatus for testing the properties of shape memory alloy wires, comprising:

[0102] The acquisition module is used to acquire at least 10 known reference lengths based on data captured by an industrial camera 14 in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the transparent positions of the second clamp 4.

[0103] The calibration module is used to establish a univariate linear calibration model. ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors.

[0104] The testing module is used to test the properties of shape memory alloy wires with an initial length of... The shape memory alloy wire to be tested is subjected to voltage 5 Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire 5 to be tested were obtained.

[0105] The judgment module is used to calculate the average value of each performance parameter in real time. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire 5 to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire 5 to be tested is determined to be a non-qualified product.

[0106] It should be noted that although several units or sub-units of the device have been mentioned in the detailed description above, this division is merely exemplary and not mandatory. In fact, according to embodiments of this application, the features and functions of two or more units described above can be embodied in one unit. Conversely, the features and functions of one unit described above can be further divided and embodied by multiple units.

[0107] Based on the same inventive concept as the above method embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it enables the electronic device to implement the control method described in the above embodiments.

[0108] In one embodiment, the electronic device may be a server, and in this embodiment, the structure of the electronic device may be as follows: Figure 4 As shown, it includes a memory, a communication module, and one or more processors.

[0109] Memory is used to store computer programs executed by the processor. Memory can be mainly divided into a program storage area and a data storage area. The program storage area can store the operating system and programs required to run instant messaging functions, etc.; the data storage area can store various instant messaging information and operation instruction sets, etc.

[0110] Memory can be volatile memory, such as random access memory (RAM); memory can also be non-volatile memory, such as read-only memory, flash memory, hard disk drive (HDD), or solid-state drive (SSD); or memory can be any other medium capable of carrying or storing a desired computer program having the form of instructions or data structures and accessible by a computer, but is not limited thereto. Memory can be a combination of the above-mentioned types of memory.

[0111] A processor may include one or more central processing units (CPUs) or digital processing units, etc. The processor is used to implement the aforementioned audio data processing methods when it invokes computer programs stored in memory.

[0112] The communication module is used to communicate with terminal devices and other servers.

[0113] This application embodiment does not limit the specific connection medium between the above-described memory, communication module, and processor. This application embodiment... Figure 4 The memory and processor are connected via a bus, and the bus is in... Figure 4 The connections between other components are illustrated with arrows and are for illustrative purposes only, not as limiting information. Buses can be categorized as address buses, data buses, control buses, etc. For ease of description, Figure 4 The text uses only one arrow to describe it, but does not indicate that there is only one bus or one type of bus.

[0114] Based on the same inventive concept as the above-described method embodiments, embodiments of the present invention also provide a computer-readable storage medium for storing a computer program. When the computer program is run on a computer, it enables an electronic device to implement the control methods described in the above embodiments. The computer-readable storage medium can be a readable signal medium or a readable storage medium. A readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection having one or more wires, a portable disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof.

[0115] Based on the same inventive concept as the above-described method embodiments, embodiments of the present invention also provide a computer program product. The computer program product includes a computer program that, when run on an electronic device, causes the electronic device to perform the steps of the control methods described above according to various exemplary embodiments of this application. The program product may take the form of any combination of one or more readable media. These computer program commands can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to produce a machine, such that the commands executed by the processor of the computer or other programmable data processing device generate a process for implementing... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0116] While the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the invention. Those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention shall be determined by the claims.

Claims

1. A method for testing properties of a memory alloy wire, characterized by, include: Based on at least 10 known fiducial lengths of a memory alloy wire sample captured by an industrial camera in a system for testing the performance of a memory alloy wire to gather the number of pixels from a visual marker point to an image fiducial edge wherein the visual marker point is disposed at a transparent location of the second clamp Establish a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors; A system for testing the properties of shape memory alloy wires was used to test the initial length of the wire. The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained; Calculate the average value in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire to be tested is determined to be a non-qualified product.

2. The method for testing the properties of shape memory alloy wire according to claim 1, characterized in that, The establishment of a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the systematic error compensation value, used to correct systematic errors, including: After establishing a univariate linear calibration model, at least three operators each perform three tests to obtain the GR&R index after performing measurement system analysis. If GR&R ≤ 10%, the system for testing the performance of shape memory alloy wire is deemed to be capable enough and the univariate linear calibration model is valid. If GR&R > 10%, after analyzing the sources of variation and improving the system for testing the performance of shape memory alloy wire, the univariate linear calibration model is re-established based on the images captured by the industrial camera until GR&R ≤ 10%.

3. The method for testing the properties of shape memory alloy wire according to claim 1, characterized in that, The system used for testing the performance of shape memory alloy wires was applied to the initial state length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the initial power-on test, the performance parameters of the shape memory alloy wire under test were obtained, including: After the memory alloy wire to be tested, with terminals attached, is installed between the first and second clamps via the limiting groove, an industrial camera is triggered to acquire an initial state image, and the initial state length of the memory alloy wire to be tested is measured based on the initial state image. ; The shape memory alloy wire to be tested is subjected to voltage Fu, time The heating process begins within milliseconds. Upon completion of heating, an industrial camera is triggered to capture an image of the shrinkage state, and the shrinkage length of the shape memory alloy wire under test is measured based on this image. ; Power is turned off to allow the shape memory alloy wire under test to cool and recover. Once the displacement stabilizes, an industrial camera is triggered to capture an image of the recovered state, and the recovered length of the shape memory alloy wire under test is measured based on the image. ; Based on the initial state length Length in contracted state Length of recovery state Calculate the performance parameters of the shape memory alloy wire to be tested, including at least the shrinkage displacement. , restore displacement strain rate ,in , , .

4. The method for testing the properties of shape memory alloy wire according to claim 1, characterized in that, The average value The calculation formula is ,in These are the performance parameter values ​​under the first power-on test, ... For the first The values ​​of performance parameters under the first power-on test.

5. The method for testing the properties of shape memory alloy wire according to claim 1, characterized in that, The standard deviation The calculation formula is ,in For the first The performance parameters under the second power-on test and .

6. The method for testing the properties of shape memory alloy wire according to claim 1, characterized in that, The average value is calculated in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the values ​​are within a certain range, the shape memory alloy wire to be tested is determined to be a qualified product; Otherwise, the shape memory alloy wire to be tested is deemed unqualified, including: According to the eight SPC anomaly detection rules, if any one of the SPC anomaly detection rules is not met, it is determined that the production process of the memory alloy wire under test has abnormal fluctuations and an early warning message is sent to improve the production process of the memory alloy wire.

7. A system for testing the performance of shape memory alloy wire, used to implement the method for testing the performance of shape memory alloy wire according to any one of claims 1 to 6, comprising shape memory alloy wire, wherein terminals are fixed at both ends of the shape memory alloy wire, characterized in that, It also includes a worktable, on which a slide rail is fixed, and an insulated first clamp is fixed on the slide rail and an insulated second clamp is slidably connected thereto. Limiting grooves are provided on the side of the first clamp facing the second clamp and the side of the second clamp facing the first clamp, and the shape of the limiting grooves is adapted to the shape of the terminal. The upper surface of the first clamp is equipped with a spring and is fixedly connected to an insulated first limiting block. The upper surface of the second clamp is equipped with a spring and is fixedly connected to an insulated second limiting block. When the spring is in an unextended state, the other end of the first limiting block that is not connected to the spring covers the limiting groove of the first clamp, and the other end of the second limiting block that is not connected to the spring covers the limiting groove of the second clamp. The positive terminal of the power supply is electrically connected to the limiting groove of the first clamp via a wire, and the negative terminal of the power supply is electrically connected to the limiting groove of the second clamp via a wire. A first connecting plate is also fixed on the workbench. A second connecting plate is directly fixed to the side of the slide rail away from the first clamp and the first connecting plate. A pulley is fixed on the second connecting plate. A connecting column is fixed on the second clamp. A connecting rope is fixed on the connecting column. The connecting rope is placed in the groove of the pulley and a counterweight is fixed to the end of the rope that is not connected to the connecting column. An industrial camera is mounted on the first connecting plate, and the field of view of the industrial camera covers at least the sliding range of the first clamp and the second clamp on the slide rail.

8. An apparatus for testing the properties of shape memory alloy wires, characterized in that, include: The acquisition module is used to capture at least 10 known reference lengths based on an industrial camera in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the visible positions of the second clamp; The calibration module is used to establish a univariate linear calibration model. ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors; The testing module is used to test the properties of shape memory alloy wires with an initial length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained; The judgment module is used to calculate the average value of each performance parameter in real time. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire to be tested is determined to be a non-qualified product.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it causes the electronic device to implement the method for testing the performance of shape memory alloy wire as described in any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store a computer program that, when run on a computer, causes the computer to perform the method for testing the performance of shape memory alloy wires as described in any one of claims 1 to 6.

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