A pair of n short circuit detection device and detection method of slot commutator
By designing a slotted commutator testing device with a static probe disk and a rotating electrode disk structure, comprehensive, reliable, and safe testing of 1-to-N short circuit detection of large-size and heavy slotted commutators has been achieved. This solves the problems of missed detection and inconvenient operation of traditional methods, and improves testing efficiency and product quality.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-24
- Publication Date
- 2026-03-24
AI Technical Summary
Existing testing methods and devices are insufficient for comprehensive, reliable, and safe detection of 1-to-N plate short circuits between the internal iron rings and copper plates of large-size, heavy slotted commutators. This poses a risk of missed detections and is inconvenient to operate, leading to the scrapping of batches of products and waste of subsequent processing steps.
A short-circuit detection device for a slotted commutator with 1 to N plates was designed. It adopts a static probe disk and a rotating electrode disk structure. The detection probes are evenly distributed and make full contact with the copper plates. Combined with the short-circuit effect of the short-circuit copper ring and the live wire electrode, 360° detection without dead angle is achieved. There is no need to rotate the heavy product during operation. The elastic telescopic probe adapts to the flatness deviation of the copper plate surface and reduces the contact resistance.
It achieves comprehensive and reliable 1-to-N short-circuit detection for large-size, heavy-weight slot commutators, reduces the risk of missed detection, improves detection efficiency and safety, and avoids product scrapping and processing waste.
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Figure CN121385729B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of testing equipment for slotted commutators, specifically to a short-circuit testing device and method for a slotted commutator with 1 pair of N plates. Background Technology
[0002] Slotted commutators used in equipment such as starter motors are sometimes quite large, with outer diameters of 80mm and heights of 60mm and above. Some large-sized products can reach an outer diameter of 88.7mm, a height of 66mm, and a weight of 3.7KG. Due to the large weight and outer diameter of each copper sheet in this type of slotted commutator, the commutator copper sheets must withstand extremely high temperatures and centrifugal forces at the moment of power-on startup. To prevent the "flying sheet" phenomenon, iron rings are usually added to both ends of the product for reinforcement, and a structure combining mica sheets and resin rings is used to achieve insulation between the iron rings and the copper sheets.
[0003] However, due to the limited internal space of the product, the gap between the iron ring and the copper sheet is extremely small. During the die-casting process, problems such as burrs on the copper sheet, residual impurities, iron ring displacement caused by mold precision deviations, and damage to the insulating ring can easily lead to internal short circuits between the iron ring and the copper sheet. The distribution of these internal short circuits on the copper sheet in the circumferential direction is irregular, posing a significant challenge to the inspection work.
[0004] In existing technologies, finished product electrical testing mainly relies on inter-chip withstand voltage tests and chip axis withstand voltage tests, using leakage current monitoring for alarms. However, these two testing methods cannot detect internal short circuits between any single copper chip and all other copper chips. An industry-standard improvement involves adding a short-circuit spring that wraps half a turn around the product to the inter-chip testing fixture. This spring is used to detect short circuits in some copper chips. However, this method can only detect internal short circuits of copper chips within the 90°~270° range relative to the live wire at the 0° position. For short circuit faults between 9.7°~90° and 270°~350°, no matter how the product is rotated, it cannot be detected, posing a significant risk of missed detections.
[0005] Furthermore, for the aforementioned large-sized and heavy slotted commutators, after the hydraulic pressing process, their outer diameter has not yet been machined, resulting in a polygonal structure and residual bakelite powder on the surface. When using the traditional spring short-circuit method, the contact resistance between the spring and the copper sheet is high, leading to poor detection reliability. At the same time, these products are heavy, making manual rotation for testing inconvenient and posing safety hazards.
[0006] In summary, existing testing methods and devices are insufficient for comprehensive, reliable, and safe testing of 1-to-N plate short circuits between the internal iron rings and copper plates of large-size, heavy slot commutators. This can easily lead to the scrapping of batch products and waste of subsequent processing steps. The industry urgently needs a dedicated testing fixture and method for such heavy-size, large-size slot commutators. Summary of the Invention
[0007] This invention provides a device and method for detecting short circuits between one pair of N plates in a slotted commutator, which can solve the technical problem that existing detection methods and devices are unable to comprehensively, reliably and safely detect short circuits between one pair of N plates between the internal iron ring and copper plates of large-size and heavy slotted commutators.
[0008] To achieve the above objectives, in a first aspect, the present invention provides the following technical solution: a short-circuit detection device for a slotted commutator with one pair of N plates, comprising a base plate, a transverse slide rail mounted on one upper end of the base plate, a commutator positioning bracket mounted on a slider on the transverse slide rail, and a fixed bracket provided on the other upper end of the base plate. A stationary probe disk extending towards the commutator positioning bracket is fixedly connected to the upper part of the fixed bracket. A ring of detection probes is evenly arranged around the circumference on the axial end face of the stationary probe disk. A rotating electrode disk is coaxially arranged on the outer side of the stationary probe disk. A short-circuit copper ring is provided on the axial end face of the rotating electrode disk at a position corresponding to the detection probe. The short-circuit copper ring has a notch, and an insulating material is embedded in the notch. The insulating block contains an embedded live wire electrode, which is electrically connected to a conductive slip ring assembly fitted on the outside of a rotating electrode disk. The conductive slip ring assembly is in contact with a power supply component on one side of the disk. As the rotating electrode disk rotates, the live wire electrode contacts a ring of detection probes in sequence. Through the complete contact of the detection probes with the copper plates of the slotted commutator, combined with the short-circuit effect of the short-circuit copper ring on adjacent probes, and the sequential contact of the live wire electrode with each probe, short-circuit detection of any copper plate with all other copper plates is achieved, covering 360° without blind spots, completely solving the problem of missed detection in traditional methods. During testing, there is no need to rotate the heavy slotted commutator; only the lightweight rotating electrode disk needs to be rotated, making it suitable for testing heavy and large-sized slotted commutators, and ensuring safe and convenient operation.
[0009] Preferably, the static probe disk has a conductive pin holder embedded on the end face facing the rotating electrode disk, which corresponds to the detection probe. One end of the detection probe is inserted into the conductive pin holder. When the rotating electrode disk rotates, the live wire electrode comes into contact with the conductive pin holder. The conductive pin holder provides a stable mounting position and conductive channel for the detection probe, increases the contact area between the live wire electrode and the detection probe, reduces the contact resistance, and improves the stability and reliability of the detection signal transmission.
[0010] Preferably, the detection probe is an elastic telescopic probe. The elastic telescopic structure enables the detection probe to adapt to the flatness deviation of the copper sheet surface when it contacts the slotted commutator copper sheet, ensuring that the probe and the copper sheet are always in close contact, and avoiding poor contact problems caused by residual bakelite powder or polygonal structure on the surface of the copper sheet.
[0011] Preferably, the live wire electrode includes a ball-shaped pin passing through the insulating block and an elastic element located at one end of the ball-shaped pin. The elastic element is connected to a conductive component extending along the outer side of the rotating electrode disk to the conductive slip ring assembly. The conductive component is fixed to the rotating electrode disk by screws. The ball-shaped pin and the conductive needle seat are in point contact, reducing contact friction and making the rotating electrode disk rotate more smoothly, thus reducing the difficulty of operation. The elastic element provides continuous elastic pressure to the ball-shaped pin, ensuring that the ball-shaped pin and the conductive needle seat are always in close contact, avoiding contact interruption caused by vibration or installation deviation during rotation, and improving the continuity and reliability of detection.
[0012] Preferably, the rotating electrode disk includes a disk body that is in close contact with the stationary probe disk and a slip ring mounting post located on the rear side of the disk body. The short-circuit copper ring is embedded in the end face of the disk body. The outer side of the slip ring mounting post is provided with a groove for mounting conductive components along the axial direction. The conductive slip ring assembly is sleeved on the outer side of the slip ring mounting post. The slip ring mounting post provides a stable mounting reference for the conductive slip ring assembly. The groove limits and protects the conductive components, preventing them from shifting or being damaged during rotation, and ensuring the stability of current transmission.
[0013] And / or, the outer radial side of the disc is provided with anti-slip texture. The anti-slip texture increases the friction when the operator rotates the disc, making the rotation operation more labor-saving and convenient. It is especially suitable for manual rotation operation scenarios and improves detection efficiency.
[0014] Preferably, the stationary probe disk includes a probe fixing disk and a support shaft disposed on the rear side of the probe fixing disk. The rotating electrode disk is sleeved on the support shaft, the probe fixing disk is in close contact with the disk body, and the support shaft provides stable rotational support for the rotating electrode disk, ensuring the coaxiality of the rotating electrode disk and the stationary probe disk, and ensuring accurate contact between the live wire electrode and the conductive needle socket.
[0015] Preferably, a bearing is installed between the rotating electrode disk and the stationary probe disk. The bearing reduces the rotational friction between the rotating electrode disk and the stationary probe disk, making the rotating electrode disk easier and less labor-intensive to rotate, reducing the labor intensity of the operator, and improving the detection efficiency.
[0016] Preferably, the fixed bracket is equipped with a protective cover that covers the conductive slip ring assembly. The protective cover provides dust and collision protection for the conductive components of the conductive slip ring assembly and the live wire electrode, preventing operators from accidentally contacting live parts and causing safety accidents. At the same time, it prevents external impurities from entering and affecting the contact performance and service life of the electrical components, thereby improving the safety and reliability of the testing mechanism.
[0017] Preferably, a commutator positioning seat is installed on the side of the transverse slide rail, and a positioning ball is installed on the commutator positioning seat. The side of the commutator positioning bracket is provided with a positioning hole that matches the positioning ball. The cooperation between the positioning ball and the positioning hole enables the commutator positioning bracket to be quickly positioned and locked, ensuring that the contact position between the detection probe and the slotted commutator copper sheet is accurate and consistent, improving the repeatability and accuracy of the detection. The positioning structure is easy to operate, requires no additional locking device, and automatically locks after the commutator positioning bracket is pushed into place, improving detection efficiency.
[0018] In a second aspect, the present invention also provides a detection method for a 1-to-N plate short-circuit detection device for a slotted commutator according to the first aspect, comprising the following steps:
[0019] S1: Install the slotted commutator to be tested on the commutator positioning bracket, and push the commutator positioning bracket along the transverse slide rail towards the stationary probe disk until the positioning structure locks the position of the commutator positioning bracket. At this time, the tip of the test probe is inserted into the copper sheet of the slotted commutator and undergoes elastic compression. The tail end of the test probe makes good contact with the short-circuit copper ring on the rotating electrode disk.
[0020] S2: Power is supplied to the conductive slip ring assembly through the power supply component, and the conductive slip ring assembly transmits the power to the live wire electrode;
[0021] S3: Rotate the rotating electrode disk to bring the fire wire electrode into contact with a ring of detection probes in sequence. During this process, adjacent detection probes are short-circuited through the short-circuit copper ring to form a short-circuit detection circuit of 1 to N pieces.
[0022] S4: Monitor the current change in the detection circuit in real time through an external testing instrument. If an abnormal current occurs, it is determined that there is a short circuit fault between the internal iron ring and copper sheet of the slot commutator. If the current is normal, it is determined that there is no short circuit fault in the slot commutator.
[0023] Compared with the prior art, the beneficial effects of the present invention are:
[0024] To address the problem that traditional testing devices cannot adapt to the heavy and unmachined slotted commutator after the hydraulic process, this invention adopts a transverse slide rail pushing and positioning method. It eliminates the need to rotate the heavy product, requiring only the rotation of a lightweight rotating electrode disk, making operation safe and convenient. The testing probe adopts an elastic telescopic structure, which can adapt to the flatness deviation of the copper sheet surface, avoiding poor contact caused by the product not being machined, thus solving the main problem of the difficulty in testing heavy and large-sized products.
[0025] Traditional inter-chip withstand voltage and chip axis withstand voltage tests can only monitor leakage current and cannot detect short circuits between any one copper chip and all other copper chips. The spring short-circuit method used in the industry can only cover a detection range of 90° to 270°, resulting in a large area of missed detection. However, this invention achieves 360° blind-spot-free 1-to-N chip short-circuit detection by using a ring of evenly distributed detection probes that make full contact with the copper chips, combined with the short-circuit copper ring that short-circuits adjacent probes, and the sequential contact between the live wire electrode and each probe. No matter what angle the short-circuit fault occurs in, it can be accurately detected without any missed detection.
[0026] Traditional spring short-circuit method has high and unstable contact resistance with copper sheet, which is easily affected by the surface condition of the product; the present invention adopts a rigid contact and elastic pressure structure between conductive needle seat and live wire electrode, which has low and stable contact resistance and accurate detection signal transmission.
[0027] The detection process of this invention only requires four steps: product installation, pushing and positioning, rotating the electrode disk, and unloading the product. The operation process is simple and does not require professional skills training. The rotating electrode disk (6) is easy and labor-saving to rotate, and a single person can complete the detection operation. The detection efficiency is high, which meets the detection needs of mass production and avoids the production bottleneck caused by low detection efficiency. Attached Figure Description
[0028] Figure 1 This is a three-dimensional first-view structural diagram of the present invention;
[0029] Figure 2 This is a three-dimensional second-view structural diagram of the present invention;
[0030] Figure 3 This is a front view structural diagram of the present invention;
[0031] Figure 4 This is a partial structural cross-sectional view of the present invention;
[0032] Figure 5 This is a three-dimensional structural diagram of the static probe disk and the rotating electrode disk of the present invention in a combined state;
[0033] Figure 6 This is a three-dimensional structural diagram of the static probe disk of the present invention;
[0034] Figure 7 This is a front sectional view of the rotating electrode disk of the present invention;
[0035] Figure 8 This is a first-view perspective three-dimensional structural diagram of the rotating electrode disk of the present invention;
[0036] Figure 9 This is a second-view perspective three-dimensional structural diagram of the rotating electrode disk of the present invention;
[0037] Figure 10This is a three-dimensional structural diagram of the test state of the present invention.
[0038] Figure label:
[0039] 1. Base plate; 11. Positioning hole; 12. Detection probe; 13. Conductive needle seat; 14. Short-circuit copper ring; 15. Bearing; 16. Conductive slip ring assembly; 17. Power supply component; 18. Live wire electrode; 181. Ball head pin; 182. Elastic element; 183. Screw; 19. Insulating block; 2. Transverse slide rail; 21. Fixed seat; 3. Slider; 4. Commutator positioning bracket; 5. Fixed bracket; 6. Rotating electrode disk; 61. Disk body; 62. Slip ring mounting post; 63. Groove; 64. Anti-slip texture; 7. Stationary probe disk; 71. Probe fixing disk; 72. Support shaft; 8. Protective cover; 9. Limiting top seat; 10. Commutator positioning seat; A. Tested slot-type commutator. Detailed Implementation
[0040] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
[0041] like Figure 1-10As shown, this invention addresses the technical problem of existing detection methods and devices being unable to comprehensively, reliably, and safely detect 1-to-N plate short circuits between the internal iron rings and copper plates of large-size, heavy slotted commutators. The invention provides the following technical solution: a 1-to-N plate short circuit detection device for slotted commutators, comprising a base plate 1. A transverse slide rail 2 is mounted on one upper end of the base plate 1. A commutator positioning bracket 4 is mounted on a slider 3 on the transverse slide rail 2. A fixed bracket 5 is provided on the other upper end of the base plate 1. A stationary probe disk 7 extending towards the commutator positioning bracket 4 is fixedly connected to the upper part of the fixed bracket 5. A ring of detection probes 12 is evenly arranged around the axial end face of the stationary probe disk 7. A rotating electrode disk 6 is coaxially arranged on the outer side of the stationary probe disk 7. A short-circuit copper ring 14 is arranged on the axial end face of the rotating electrode disk 6 at a position corresponding to the detection probes 12. The short-circuit copper ring 14 has a notch, and an insulating block 19 is embedded in the notch. A live wire electrode 18 is embedded in the insulating block 19. The live wire electrode 18 is electrically connected to a conductive slip ring assembly 16 sleeved on the outside of the rotating electrode disk 6. The conductive slip ring assembly 16 is in contact with the power supply component 17 on one side. When the rotating electrode disk 6 rotates, the live wire electrode 18 contacts a ring of detection probes 12 in sequence. Through the ring of detection probes 12 making full contact with the copper sheets of the slotted commutator, combined with the short-circuit effect of the short-circuit copper ring 14 on adjacent probes, and the live wire electrode 18 contacting each probe in sequence, short-circuit detection of any copper sheet with all other copper sheets is achieved, covering 360° without dead angles, completely solving the problem of missed detection in traditional methods. During detection, there is no need to rotate the heavy slotted commutator, only the lightweight rotating electrode disk 6 needs to be rotated, which is suitable for the detection needs of heavy and large-size slotted commutators, and the operation is safe and convenient.
[0042] Specifically, the base plate 1 is made of Q235 steel plate; the transverse slide rail 2 is a THKSRG25 linear slide rail, and its slider 3 has a load-bearing capacity of not less than 50KG to meet the installation and positioning requirements of heavy slot commutators. The commutator positioning bracket 4 is L-shaped, and its side is equipped with a support shaft, which is adapted to the spindle of the slot commutator A under test to ensure the coaxiality of the product after installation.
[0043] The rotating electrode disk 6 and the stationary probe disk 7 are both made of insulating material, which can be epoxy resin or polytetrafluoroethylene. The stationary probe disk 7 has 36 probe mounting holes arranged around its circumference. The short-circuit copper ring 14 is made of copper with a notch width of 20mm, which is interference-fitted with the insulating block 19. The insulating block 19 is made of epoxy resin and its size matches the notch. The live wire electrode 18 is made of brass. The conductive slip ring assembly 16 is a JSR-125 conductive slip ring. The power supply component 17 is the output connector of the withstand voltage tester and makes elastic contact with the brush of the conductive slip ring assembly 16.
[0044] The conductive slip ring assembly 16 may include at least two conductive slip rings spaced apart and insulating rings disposed on both sides of the conductive slip rings. The power supply component 17 corresponds to each conductive slip ring and is fixed to the base plate 1 by a fixing seat 21.
[0045] In this embodiment, a conductive needle holder 13 corresponding to a detection probe 12 is embedded on the end face of the stationary probe disk 7 facing the rotating electrode disk 6. One end of the detection probe 12 is inserted into the conductive needle holder 13. When the rotating electrode disk 6 rotates, the live wire electrode 18 contacts the conductive needle holder 13. The conductive needle holder 13 provides a stable mounting position and conductive channel for the detection probe 12, increases the contact area between the live wire electrode 18 and the detection probe 12, reduces the contact resistance, and improves the stability and reliability of the detection signal transmission. Specifically, the conductive needle holder 13 is made of brass and is cylindrical with a diameter of 8mm and a length of 15mm. It has a mounting hole inside that matches the detection probe 12, with a hole depth of 10mm. After the detection probe 12 is inserted, it is fixed by a set screw. The conductive needle holder 13 and the stationary probe disk 7 are embedded with an interference fit, and each conductive needle holder 13 corresponds to one detection probe 12.
[0046] In this embodiment, the detection probe 12 is an elastic telescopic probe. The elastic telescopic structure allows the detection probe 12 to adapt to the flatness deviation of the copper sheet surface when in contact with the slot commutator copper sheet, ensuring that the probe and the copper sheet are always in close contact, avoiding poor contact caused by residual bakelite powder or polygonal structures on the surface of the copper sheet. Specifically, the detection probe 12 adopts an elastic telescopic structure with an internal spring. The probe outer tube is made of stainless steel with an inner diameter of 4mm, an outer diameter of 6mm, and a length of 40mm. The internal spring is made of stainless steel with a wire diameter of 0.5mm, a free length of 35mm, and an elastic coefficient of 5N / mm. The probe core is made of tungsten steel with a diameter of 3mm and a length of 50mm, and the tip is ground into a 30° sharp angle. When the slot commutator is pushed into place, the probe core is squeezed by the copper sheet, and the spring compression is 5-10mm, generating an elastic pressure of 25-50N, ensuring reliable contact between the probe and the copper sheet. Even if there are protrusions or depressions within 0.5mm on the surface of the copper sheet, effective contact can be achieved through elastic telescopic structure.
[0047] In this embodiment, as Figure 7As shown, the live wire electrode 18 includes a ball-headed pin 181 passing through the insulating block 19 and an elastic element 182 located at one end of the ball-headed pin 181. The elastic element 182 is connected to a conductive component extending along the outer side of the rotating electrode disk 6 to the conductive slip ring assembly 16. The conductive component is fixed to the rotating electrode disk 6 by screws 183. The ball-headed pin 181 and the conductive needle seat 13 are in point contact, reducing contact friction and making the rotation of the rotating electrode disk 6 smoother and reducing the difficulty of operation. The elastic element 182 provides continuous elastic pressure to the ball-headed pin 181, ensuring... The ball head pin 181 and the conductive pin seat 13 are always in close contact to avoid contact interruption caused by vibration or installation deviation during rotation, thereby improving the continuity and reliability of detection. Specifically, the ball head pin 181 is made of tungsten steel, with a ball head diameter of 3mm, a rod diameter of 4mm, and a length of 25mm. The elastic element 182 is a cylindrical compression spring. The conductive component is a copper busbar with a width of 10mm, a thickness of 2mm, and a length of 150mm. One end is fixed to the root of the elastic element 182 by a screw 183, and the other end is fixedly connected to the conductive ring of the conductive slip ring assembly 16.
[0048] In this embodiment, as Figure 8-9 As shown, the rotating electrode disk 6 includes a disk body 61 that is in close contact with the stationary probe disk 7 and a slip ring mounting post 62 located on the rear side of the disk body 61. The short-circuit copper ring 14 is embedded in the end face of the disk body 61. The outer side of the slip ring mounting post 62 is provided with a groove 63 along the axial direction for mounting conductive components. The conductive slip ring assembly 16 is sleeved on the outer side of the slip ring mounting post 62. The slip ring mounting post 62 provides a stable mounting reference for the conductive slip ring assembly 16. The groove 63 plays a limiting and protective role for the conductive components, preventing the conductive components from shifting or being damaged during rotation, and ensuring the stability of current transmission. Specifically, the disk body 61 can be made of polytetrafluoroethylene, and an annular groove is opened on its end face facing the stationary probe disk 7 for embedding the short-circuit copper ring 14, with an interference fit. The slip ring mounting post 62 and the disk body 61 can be integrally formed or have an interference fit.
[0049] Meanwhile, the outer radial side of the disc 61 is provided with anti-slip texture 64. The anti-slip texture 64 increases the friction force when the operator rotates the disc 61, making the rotation operation more labor-saving and convenient. It is especially suitable for manual rotation operation scenarios and improves detection efficiency.
[0050] In this embodiment, as Figure 6As shown, the stationary probe disk 7 includes a probe fixing disk 71 and a support shaft 72 disposed on the rear side of the probe fixing disk 71. The rotating electrode disk 6 is sleeved on the support shaft 72. The probe fixing disk 71 is in close contact with the disk body 61. The support shaft 72 provides stable rotational support for the rotating electrode disk 6, ensuring the coaxiality of the rotating electrode disk 6 and the stationary probe disk 7, and ensuring precise contact between the live wire electrode 18 and the conductive needle seat 13. A bearing 15 is installed between the rotating electrode disk 6 and the stationary probe disk 7. The bearing 15 reduces the rotational friction between the rotating electrode disk 6 and the stationary probe disk 7, making the rotation of the rotating electrode disk 6 easier and less strenuous, reducing the labor intensity of the operator, and improving the detection efficiency. The bearing 15 is a deep groove ball bearing 6205 to ensure smooth rotation of the rotating electrode disk 6.
[0051] In this embodiment, as Figure 2 As shown, the fixed bracket 5 is equipped with a protective cover 8 that covers the conductive slip ring assembly 16. The protective cover 8 provides dustproof and collision-proof protection for the conductive components of the conductive slip ring assembly 16 and the live wire electrode 18, preventing operators from accidentally contacting live parts and causing safety accidents. At the same time, it prevents external impurities from entering and affecting the contact performance and service life of the electrical components, thereby improving the safety and reliability of the testing mechanism. Specifically, the protective cover 8 can be made of transparent acrylic sheet, with a semi-cylindrical structure, an inner diameter of 150mm, a height of 100mm, and connecting fasteners at both axial ends.
[0052] In this embodiment, a commutator positioning seat 10 is installed on the side of the transverse slide rail 2, and a positioning ball is installed on the commutator positioning seat 10. The side of the commutator positioning bracket 4 is provided with a positioning hole 11 that matches the positioning ball. The cooperation between the positioning ball and the positioning hole 11 enables the commutator positioning bracket 4 to be quickly positioned and locked, ensuring that the contact position between the detection probe 12 and the copper sheet of the slotted commutator is accurately consistent, improving the repeatability and accuracy of the detection. The positioning structure is easy to operate and does not require an additional locking device. It automatically locks after the commutator positioning bracket 4 is pushed into place, improving detection efficiency. At the same time, a limiting top seat 9 can be provided at the end of the transverse slide rail 2 to prevent the slider 3 and the commutator positioning bracket 4 from sliding out of the transverse slide rail 2, and also to limit the extreme position of the slotted commutator under test.
[0053] As a specific testing method in this embodiment, the process includes the following steps:
[0054] Preparation: Connect the live wire of the withstand voltage tester to the power supply component 17, and make a conductive connection between the ground wire and the short-circuit copper ring 14. Set the test parameters of the withstand voltage tester to 500V and 1mA for the leakage current threshold.
[0055] Product installation: Install the spindle of the QB270 slot commutator to be tested into the positioning slot of the commutator positioning bracket 4, align it with the preset circumferential mark, and ensure that the copper sheet corresponds to the position of the test probe 12;
[0056] Positioning and locking: Push the commutator positioning bracket 4 along the transverse slide rail 2 towards the stationary probe disk 7 until the positioning ball is embedded in the positioning hole 11 and the commutator positioning bracket 4 is locked. At this time, the tip of the detection probe 12 is inserted into the copper sheet of the slotted commutator and compressed by the built-in spring by 5-8mm. The conductive needle seat 13 at the end of the probe is in close contact with the short-circuit copper ring 14.
[0057] Short circuit detection: The operator holds the rotating electrode disk 6 and slowly rotates the rotating electrode disk 6 at a speed of 1 r / min. During the rotation, the ball head pin 181 of the live wire electrode 18 contacts each conductive pin seat 13 in sequence under the action of the elastic element 182. Adjacent conductive pin seats 13 are short-circuited through the short-circuit copper ring 14 to form a detection circuit of 1 to N pieces.
[0058] Result judgment: The withstand voltage tester monitors the leakage current in the detection circuit in real time. If the leakage current exceeds the set threshold (e.g., 1mA), the withstand voltage tester will issue an alarm signal, indicating that there is a short circuit fault between the internal iron ring and copper sheet of the slot commutator. If the withstand voltage tester does not alarm after one rotation and the leakage current is always below the threshold, it is determined that the product has no short circuit fault.
[0059] Product unloading: After the test is completed, push the commutator positioning bracket 4 in the reverse direction, the positioning ball will disengage from the positioning hole 11, the slotted commutator will be removed, and one test will be completed.
[0060] Therefore, the testing mechanism in this embodiment, through the above structural design and testing process, achieves seamless short-circuit testing of the QB270 model heavy-weight, large-size slotted commutator, with a testing efficiency of up to 1 piece / minute and a testing accuracy of ≥99.5%. This effectively solves the problems of missed detections, poor contact, and inconvenient operation associated with traditional testing methods. Compared with traditional inter-segment withstand voltage testing, segment shaft withstand voltage testing, and spring short-circuit methods, it represents a significant improvement in testing range, reliability, adaptability, and ease of operation. It effectively avoids the scrapping of batch products and the waste of subsequent processing steps, demonstrating significant practical value and industry promotion significance.
[0061] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.
[0062] Furthermore, in this invention, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly and specifically defined.
[0063] In this invention, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0064] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.
Claims
1. A short-circuit detection device for a slotted commutator with one pair of N plates, comprising a base plate (1), wherein a transverse slide rail (2) is mounted on one upper end of the base plate (1), and a commutator positioning bracket (4) is mounted on a slider (3) on the transverse slide rail (2), characterized in that, A fixed bracket (5) is provided on the other side of the upper side of the base plate (1). A stationary probe disk (7) extending towards the commutator positioning bracket (4) is fixedly connected to the upper part of the fixed bracket (5). A ring of detection probes (12) is uniformly arranged around the axial end face of the stationary probe disk (7). A rotating electrode disk (6) is coaxially arranged on the outer side of the stationary probe disk (7). A short-circuit copper ring (14) is provided on the axial end face of the rotating electrode disk (6) at a position corresponding to the detection probe (12). A notch is provided on the short-circuit copper ring (14) and an insulating block (19) is embedded in the notch. A live wire electrode (18) is embedded in the insulating block (19). The live wire electrode (18) is electrically connected to a conductive slip ring assembly (16) sleeved on the outer side of the rotating electrode disk (6). The conductive slip ring assembly (16) is in contact with a power supply component (17) on one side of it. When the rotating electrode disk (6) rotates, the live wire electrode (18) contacts a ring of detection probes (12) in sequence.
2. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 1, characterized in that: The stationary probe disk (7) has a conductive needle seat (13) embedded on the end face facing the rotating electrode disk (6) that corresponds one-to-one with the detection probe (12). One end of the detection probe (12) is inserted into the conductive needle seat (13). When the rotating electrode disk (6) rotates, the live wire electrode (18) comes into contact with the conductive needle seat (13).
3. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 2, characterized in that: The detection probe (12) is an elastic telescopic probe.
4. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 3, characterized in that: The live wire electrode (18) includes a ball-head pin (181) passing through the insulating block (19) and an elastic element (182) located at one end of the ball-head pin (181). The elastic element (182) is connected to a conductive component extending along the outside of the rotating electrode disk (6) to the conductive slip ring assembly (16). The conductive component is fixed to the rotating electrode disk (6) by screws (183).
5. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 4, characterized in that: The rotating electrode disk (6) includes a disk body (61) that is in close contact with the stationary probe disk (7) and a slip ring mounting post (62) located on the rear side of the disk body (61). The short-circuit copper ring (14) is embedded in the end face of the disk body (61). The slip ring mounting post (62) has a groove (63) for setting conductive components along the axial direction on its outer side. The conductive slip ring assembly (16) is sleeved on the outer side of the slip ring mounting post (62). And / or, the outer radial side of the disc body (61) is provided with anti-slip texture (64).
6. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 5, characterized in that: The stationary probe disk (7) includes a probe fixing disk (71) and a support shaft (72) disposed on the rear side of the probe fixing disk (71). The rotating electrode disk (6) is sleeved on the support shaft (72), and the probe fixing disk (71) is in close contact with the disk body (61).
7. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 1, characterized in that: A bearing (15) is installed between the rotating electrode disk (6) and the stationary probe disk (7).
8. The short-circuit detection device for a slotted commutator with one pair of N plates according to claim 1, characterized in that: The fixed bracket (5) is equipped with a protective cover (8) that covers the conductive slip ring assembly (16).
9. The short-circuit detection device for a slotted commutator with one pair of N plates according to any one of claims 1-8, characterized in that: The side of the transverse slide rail (2) is equipped with a commutator positioning seat (10), and a positioning ball is installed on the commutator positioning seat (10). The side of the commutator positioning bracket (4) is provided with a positioning hole (11) that matches the positioning ball.
10. A detection method for a short-circuit detection device for a slotted commutator with one pair of N plates according to claim 6, characterized in that, Includes the following steps: S1: Install the slotted commutator to be tested on the commutator positioning bracket (4), and push the commutator positioning bracket (4) along the transverse slide rail (2) towards the stationary probe disk (7) until the positioning structure locks the position of the commutator positioning bracket (4). At this time, the tip of the detection probe (12) is inserted into the copper sheet of the slotted commutator and undergoes elastic compression. The tail end of the detection probe (12) makes good contact with the short-circuit copper ring (14) on the rotating electrode disk (6). S2: Power is supplied to the conductive slip ring assembly (16) through the power supply component (17), and the conductive slip ring assembly (16) transmits the power to the live wire electrode (18). S3: Rotate the rotating electrode disk (6) to make the live wire electrode (18) contact a ring of detection probes (12) in sequence. During this process, adjacent detection probes (12) are short-circuited through the short-circuit copper ring (14) to form a short-circuit detection circuit of 1 to N pieces. S4: Monitor the current change in the detection circuit in real time through an external testing instrument. If an abnormal current occurs, it is determined that there is a short circuit fault between the internal iron ring and copper sheet of the slot commutator. If the current is normal, it is determined that there is no short circuit fault in the slot commutator.
Citation Information
Patent Citations
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