Device and method for detecting and analyzing fores in cathode

Abstract

The present disclosure relates to an apparatus and a method for detecting and analyzing foreign matter in a cathode, the apparatus comprising: a first imaging device for dividing a cathode conveyed in one direction into a predetermined region and imaging the predetermined region; an image processing processor for processing an image of the predetermined region captured by the first imaging device to specify a position where the foreign matter is formed; a second image capturing device for capturing an image of the foreign matter specified by the image processing processor; and a spectral processing processor for analyzing a spectral signal of an image of the foreign matter captured by the second image capturing device to classify a component of the foreign matter.

Description

TECHNICAL FIELD

[0001] This disclosure claims the benefit of the filing date of Korean Patent Application No. 10-2023-0149852, filed on November 2, 2023, in the Korean Intellectual Property Office, the entire contents of which are incorporated herein by reference.

[0002] The present disclosure relates to an apparatus and method for detecting and analyzing foreign matter in a cathode, and more particularly to an apparatus and method for detecting and analyzing foreign matter in a cathode, which can photograph a predetermined portion of a cathode transported in one direction using a visual camera device to designate the location of foreign matter, and then photograph the foreign matter using a hyperspectral imaging camera device to classify the composition of the foreign matter. BACKGROUND

[0003] Among elements constituting a secondary battery, a cathode is one of important factors that determine the capacity, life, and charging speed of the battery along with an anode. Materials for the cathode include lithium cobalt oxide (LCO), lithium nickel manganese oxide (NCM), lithium iron phosphate (LFP), etc.

[0004] Such a cathode determines the capacity and average voltage of the battery. Therefore, various types of fine foreign matter mixed during the cathode manufacturing process can significantly affect the quality of the manufactured battery cell, such as low voltage.

[0005] Finally, foreign matter mixed into the cathode is detected and its composition is analyzed using inductively coupled plasma mass spectrometry (ICP-MS), a laser-induced breakdown spectroscopy (LIBS) microscope, a micro XRF, a general visual inspection method, etc.

[0006] ICP-MS requires a pretreatment process to analyze a sample, which has a disadvantage of being complex and requiring the use of a separate solvent. The LIBS microscope is a technology that scans a specific area using a microscope, burns a portion identified as foreign matter with a laser, and then observes the spectrum of the plasma. However, it has a disadvantage of destroying a portion of the sample and making it difficult to use the sample in large quantities. The Micro-XRF is a technology that analyzes the composition of foreign matter by examining the X-ray reaction spectrum of a particle, but has a disadvantage that movement for mapping and photography takes a long time. The general visual inspection method has a problem of being difficult to distinguish the composition of foreign matter since it is required to distinguish particles only by the color of visible light.

[0007] The above background art is technical information possessed by the inventor or obtained during the derivation process for deducing embodiments of the present disclosure, but is not necessarily considered to be well-known technical knowledge publicly disclosed to the public before the embodiments of the present disclosure are submitted. SUMMARY

[0008]

Technical Problem

[0009] To solve the above problems, the present disclosure provides an apparatus and a method for detecting and analyzing a foreign object in a cathode, which can photograph a predetermined portion of a cathode transported in one direction using a visual camera to designate a location of a foreign object, and then photograph the foreign object using a hyperspectral imaging camera to classify a composition of the foreign object.

[0010]

Technology Solution

[0011] According to an embodiment of the present disclosure, an apparatus for detecting and analyzing a foreign object in a cathode can include a first camera for dividing a cathode transported in one direction into predetermined areas and photographing the predetermined areas, an image processing processor for processing images of the predetermined areas photographed by the first camera to designate a location where a foreign object is formed, a second camera for photographing the foreign object designated by the image processing processor, and a spectral processing processor for analyzing spectral signals of images of the foreign object photographed by the second camera to classify a composition of the foreign object.

[0012] In particular, the first camera can be a visual camera.

[0013] Further, the apparatus can further include a first light source for irradiating light within a wavelength band capable of being photographed by the visual camera toward the predetermined areas of the cathode.

[0014] Meanwhile, the second camera can be a hyperspectral imaging camera or a multispectral imaging camera.

[0015] Further, the apparatus can further include a second light source for irradiating light within a wavelength band capable of being photographed by the hyperspectral imaging camera or the multispectral imaging camera toward the foreign object.

[0016] Meanwhile, the apparatus can further include a first transport module for moving the second camera to a location capable of photographing the foreign object in the predetermined areas when the location of the foreign object is designated by the image processing processor.

[0017] In particular, the first transport module can move the second camera in a width direction of the cathode having a predetermined width direction size and extending and transported in a length direction.

[0018] Further, the apparatus can further include a data processing processor for receiving data on the location of the foreign object designated by the image processing processor and data on a speed at which the cathode is transported, and controlling the second camera to photograph the foreign object when the foreign object is located at a location where the second camera can photograph the foreign object.

[0019] Meanwhile, the apparatus can further include a second conveying module for moving the cathode in which the foreign matter is located to a position at which the second camera can photograph the cathode when the position of the foreign matter is designated by the image processing processor.

[0020] According to an embodiment of the disclosure, a method for detecting and analyzing a foreign matter in a cathode can include the steps of: dividing a cathode conveyed in one direction into predetermined regions, and photographing the predetermined regions using a first camera; processing an image of the predetermined regions photographed by the first camera to designate a position at which the foreign matter is formed; photographing the designated foreign matter using a second camera; and analyzing a spectral signal of an image of the foreign matter photographed by the second camera to classify a composition of the foreign matter.

[0021] In particular, in the step of photographing using the first camera, the first camera can be a visual camera.

[0022] Further, in photographing the predetermined regions of the cathode using the visual camera, the method can further include the step of: irradiating light in a wavelength band that can be photographed by the visual camera toward the predetermined regions.

[0023] In addition, in the step of photographing using the second camera, the second camera can be a hyperspectral imaging camera or a multispectral imaging camera.

[0024] Further, when photographing the foreign matter using the hyperspectral imaging camera or the multispectral imaging camera, the method can further include the step of: irradiating light in a wavelength band that can be photographed by the hyperspectral imaging camera or the multispectral imaging camera toward the foreign matter.

[0025] Meanwhile, the method can further include the step of moving the second camera to a position at which the foreign matter in a specific predetermined region can be photographed.

[0026] Here, the method can further include the steps of: receiving data on a position of a specific predetermined region and data on a speed at which the cathode is conveyed, and controlling the second camera to photograph the foreign matter when the foreign matter is conveyed to a position at which the second camera can photograph the foreign matter.

[0027] Alternatively, the method can further include the step of: moving the cathode in which the foreign matter is located to a position at which the second camera can photograph the cathode in order to photograph a specific foreign matter.

[0028]

Advantageous Effects

[0029] The apparatus for detecting and analyzing a foreign matter in a cathode according to an embodiment of the disclosure has the advantage of achieving rapid and accurate quality control by analyzing and classifying fine foreign matters formed in a cathode in real time.

[0030] In addition, additional research data regarding the process in which foreign matter is mixed into the production line of the cathode can be obtained.

[0031] Effects obtainable in the present disclosure are not limited to the above-mentioned effects, and other unmentioned effects will be clearly understood by those skilled in the art from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0032] Figure 1 A perspective view of a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0033] Figure 2 A block diagram of a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0034] Figure 3 A perspective view showing movement of a second camera device in a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0035] Figure 4 A perspective view showing movement of a cathode in which foreign matter is formed in a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0036] Figure 5 An image of a predetermined area photographed by a first camera device in a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0037] Figure 6 An image of foreign matter photographed by a second camera device in a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0038] Figure 7 A spectral signal of foreign matter in a device for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0039] Figure 8 A flowchart of a method for detecting and analyzing foreign matter in a cathode according to an embodiment of the present disclosure is shown.

[0040] DESCRIPTON OF REFERENCE NUMERALS

[0041] 1: Device for detecting and analyzing foreign matter in a cathode

[0042] 10: First camera device

[0043] 20: Second camera device

[0044] 30: image processing processor

[0045] 40: spectrum processing processor

[0046] 50: data processing processor

[0047] 60: first light source

[0048] 70: second light source

[0049] 80: first conveying module

[0050] 90: second conveying module

[0051] A: FOV of first camera

[0052] B: FOV of second camera

[0053] C: cathode DETAILED DESCRIPTION

[0054] The present disclosure will become more fully understood from the detailed description given herein below, taken in conjunction with the accompanying drawings. However, it should be understood that the disclosure is not limited to the embodiments described herein below, and can be implemented in various forms. These embodiments are provided merely to complete the disclosure and to fully convey the scope of the present disclosure to those skilled in the art. The present disclosure is defined only by the scope of the claims. Meanwhile, the terms used in the specification are used to describe the embodiments, and are not intended to limit the present disclosure.

[0055] Throughout the specification, the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise.

[0056] As used throughout the specification, the terms "include" and / or "comprise" mean that one or more other components, steps, operations, and / or devices are not excluded, and other components can be further included, rather than excluding other components, unless specifically stated to the contrary.

[0057] Throughout the specification, terms such as "first" or "second" can simply be used to distinguish one component from another component, without limiting the components in any other aspect (for example, importance or order).

[0058] In addition, the term "… component / unit" described throughout the specification refers to a unit that processes at least one function or operation, which can be implemented as hardware, software, or a combination of hardware and software.

[0059] Also, throughout the specification, when it is said that a component is "connected" to another component, this includes not only the case where they are "directly connected", but also the case where they are "indirectly connected" through another component interposed therebetween.

[0060] Hereinafter, the present disclosure will be described in more detail.

[0061] Figure 1 A perspective view of an apparatus 1 for detecting and analyzing foreign substances in a cathode according to an embodiment of the present disclosure is shown, and Figure 2 A block diagram of an apparatus 1 for detecting and analyzing foreign substances in an anode according to an embodiment of the present disclosure is shown.

[0062] Referring to Figure 1 and Figure 2 , the apparatus 1 for detecting and analyzing foreign substances in a cathode according to an embodiment of the present disclosure can include a first camera 10, an image processing processor 30, a second camera 20, and a spectral processing processor 40.

[0063] The first camera 10 is configured to photograph a cathode (C) conveyed in one direction, and can be configured to be installed at a predetermined distance from one surface (particularly, an upper surface) of the cathode (C) and photograph one surface of the cathode (C).

[0064] In particular, the cathode (C) can be formed to have predetermined width and length direction sizes, and can be extended in the length direction and conveyed in one direction. Here, the first camera 10 divides the cathode (C) into a predetermined area that is a part of the longitudinal direction of the cathode (C), and photographs the predetermined area. Here, the "predetermined area" is an area within the FOV (A) range of the first camera 10, and the size of the predetermined area can be the entire width of the cathode (C) in the width direction and a corresponding part thereof in the length direction. Alternatively, the cathode (C) can be divided into a plurality of parts in the width direction, and photographed by a plurality of first cameras 10. This can be determined according to the size of the cathode (C) in the width and length directions.

[0065] In particular, the first camera 10 can be a vision camera. The vision camera is a high-performance camera, and can be, for example, a GigE camera, a CameraLink camera, or a CoaXpress camera.

[0066] Finally, the first camera 10 divides the cathode (C) conveyed in one direction into a predetermined area and repeatedly photographs the predetermined area, and the photographed images can be transmitted to the image processing processor 30.

[0067] The image processing processor 30 is a central processing unit that determines the location of the foreign matter present on the cathode (C) and can receive an image of a predetermined area photographed by the first camera 10 and designate the location where the foreign matter is formed. The image photographed by the first camera 10 can be converted into electrical energy by a CMOS image sensor and converted into a digital signal by an analog-digital converter (ADC). In this process, the location of a signal having a signal value equal to or greater than a set signal value can be designated as the location of the foreign matter.

[0068] In particular, with reference to Figure 1 and Figure 2 When the first camera 10 is a visual camera, a first light source 60 for irradiating light within a wavelength band that can be photographed by the visual camera can also be included. In general, a visual camera is a camera that can capture an image in the visible light range, and when particles have the same color, it is difficult to distinguish them, and there can be errors due to brightness. Therefore, in order to more effectively designate the location of the foreign matter, it is preferable to irradiate light within the visible light wavelength band and capture an image. To this end, the first light source 60 can directly irradiate light toward a predetermined area photographed by the first camera 10, or can illuminate the predetermined area by indirect light. In addition, the first light source 60 can be installed in the same housing as the first camera 10, or can be installed in a separate housing.

[0069] Meanwhile, although the location of the foreign matter can be designated by the first camera 10, particularly a visual camera, it is somewhat difficult to determine the type, composition, etc. of the foreign matter. A visual camera can photograph a fairly wide range due to a wide FOV (A), but it is difficult to distinguish the type of the foreign matter.

[0070] Therefore, it is necessary to photograph the foreign matter designated in the image processing processor 30 using a second camera 20 that is a separate camera.

[0071] However, since the second camera 20 has a FOV (B) smaller than the FOV (A) of the first camera 10, the area that can be photographed is somewhat narrow. Therefore, when the location of the foreign matter is designated, the second camera 20 needs to move to the location and capture an image. In an embodiment, the second camera 20 can be a hyperspectral imaging camera or a multispectral imaging camera.

[0072] In particular, the second camera 20 can be a hyperspectral imaging camera (HSI) or a multispectral imaging camera (multi-band camera). The hyperspectral imaging camera is characterized by its ability to photograph a wide wavelength range beyond the visible light wavelength range. In addition, a hyperspectral image photographed by the hyperspectral imaging camera has the advantage of being able to obtain three-dimensional information consisting of two spatial dimensions and one spectral dimension.

[0073] A characteristic of a multispectral imaging camera is its ability to capture images in the visible, near-infrared, and infrared wavelength ranges. The principle of multispectral imaging cameras and hyperspectral imaging cameras is the same, but hyperspectral imaging cameras have the characteristic of being able to have a higher radiometric resolution and a finer spectrum.

[0074] Therefore, depending on the characteristics of the foreign matter, when the signal difference on the continuous spectrum is sensitive, it is preferable to use a hyperspectral imaging camera, and when the signal difference is not significant and faster processing and analysis are desired, it is preferable to use a multispectral imaging camera.

[0075] Finally, the second camera 20 photographs the foreign matter only at the position where the foreign matter is designated in a predetermined region of the cathode (C) conveyed in one direction, and the photographed image of the foreign matter can be transmitted to the spectral processing processor 40.

[0076] The spectral processing processor 40 is a central processing unit that analyzes the spectral signal of the foreign matter, and can receive the image of the foreign matter photographed by the second camera 20 and classify the composition of the foreign matter. The image photographed by the second camera 20 has hundreds of continuous spectral bands of the spectral wavelength range reflected from the foreign matter, thereby enabling identification of the composition of the foreign matter. This wide electromagnetic spectrum range allows high wavelength resolution and includes a wide range of spatial spectral information.

[0077] In particular, when the second camera 20 is a hyperspectral imaging camera or a multispectral imaging camera, a second light source 70 for irradiating light in the wavelength band that can be photographed by the camera can also be included. Unlike a visual camera, a hyperspectral imaging camera and a multispectral imaging camera are capable of photographing light in a wider wavelength range than the visible light range, and thus it is desirable to capture an image by irradiating light in the wavelength range that can be photographed. To this end, the second light source 70 can directly irradiate light toward the foreign matter photographed by the second camera 20, or can illuminate the foreign matter by indirect light. In addition, the second light source 70 can be installed in the same housing as the second camera 20, or can be installed in a separate housing.

[0078] Meanwhile, in order for the second camera 20 to photograph the foreign matter, the second camera 20 needs to be disposed at a position where the foreign matter is formed in the cathode (C). This is particularly important when the second camera 20 is a hyperspectral imaging camera or a multispectral imaging camera, because the area that can be photographed by the camera is very small.

[0079] Therefore, the second camera 20 and / or the cathode (C) in which the foreign matter is formed needs to be moved. Figure 3is a perspective view showing movement of the second camera 20 in the apparatus 1 for detecting and analyzing foreign substances in a cathode (C) according to an embodiment of the present disclosure, and Figure 4 is a perspective view showing movement of the cathode (C) in which a foreign substance is formed in the apparatus 1 for detecting and analyzing foreign substances in a cathode (C) according to an embodiment of the present disclosure.

[0080] Referring to Figure 3 It can further include a first conveying module 80 for moving the second camera 20 to a position capable of photographing a foreign substance in a predetermined area. Alternatively, referring to Figure 4 It can further include a second conveying module 90 for moving the cathode (C) in the predetermined area to a position at which it can be photographed by the second camera 20.

[0081] In an embodiment, the first conveying module 80 can move in a width direction and / or a length direction of the cathode (C).

[0082] In particular, when the first conveying module 80 can move in the width direction of the cathode (C), the cathode (C) having a predetermined width direction size and a length direction size is conveyed in the length direction so that the second camera 20 can capture an image of a foreign substance by moving in the width direction of the cathode (C) and then capturing an image when the foreign substance is located in a direction in which the second camera 20 faces.

[0083] Here, the speed at which the cathode (C) is conveyed needs to be considered. That is, when a position of a foreign substance is designated in a predetermined area photographed by the first camera 10, since the cathode (C) is continuously moved in the length direction, it is necessary to photograph the foreign substance at a time point at which the foreign substance is located in the FOV (B) of the second camera 20.

[0084] The position of the second camera 20 can be moved by the data processing processor 50. More specifically, by coordinating a foreign substance with position data of the foreign substance designated via the image processing processor 30, receiving data about the speed at which the cathode (C) is conveyed and considering a change in the position of the coordinates, it is possible to control the second camera 20 to photograph a foreign substance at a time point at which the foreign substance is conveyed to a position at which the second camera 20 can photograph the foreign substance.

[0085] The second transport module 90 is configured to move the cathode (C) containing the foreign object to the location where the second camera 20 is located. This is a device that facilitates the collection of a sample of the cathode (C) containing the foreign object, and when the location where the foreign object is formed is specified by processing the image of the predetermined area taken by the first camera 10, the cathode (C) containing the foreign object can be transported in a direction other than one direction. In an embodiment, the other direction is a direction that forms a predetermined angle with the one direction (preferably a perpendicular direction), and the cathode (C) can be separated in this direction. The portion of the separated cathode (C) where the foreign object is located can be taken by the second camera 20.

[0086] Hereinafter, the results of the spectral analysis performed on the foreign object location detection image captured by the first camera 10 of the device 1 for detecting and analyzing foreign objects in a cathode according to an embodiment of the present disclosure and the foreign object image captured by the second camera 20 are described.

[0087] Figure 5 An image of a predetermined area taken by a visual camera as the first camera 10 in the device 1 for detecting and analyzing foreign objects in a cathode according to an embodiment of the present disclosure is shown. When the predetermined area of the cathode (C) transported in one direction is taken and image-processed, if there is a foreign object in the cathode (C), the foreign object can be detected, as shown in Figure 5 the location of the detected foreign object is specified and the location data is transmitted to the data processing processor 50, and data on the speed at which the cathode (C) is transported in one direction is also transmitted to the data processing processor 50. After receiving the data, the data processing processor 50 moves the hyperspectral imaging camera as the second camera 20, and takes the foreign object using the hyperspectral imaging camera.

[0088] Figure 6 An image of a foreign object taken by a hyperspectral imaging camera as the second camera 20 in the device 1 for detecting and analyzing foreign objects in a cathode according to an embodiment of the present disclosure is shown. When the foreign object in the cathode (C) is taken by the hyperspectral imaging camera, it can be identified, as shown in Figure 6 However, in order to analyze the composition of the foreign object, it is necessary to analyze the spectral signal of the foreign object image.

[0089] Figure 7The spectral signals of foreign matters in the apparatus 1 for detecting and analyzing foreign matters in a cathode according to the embodiments of the present disclosure are shown. The foreign matters exhibit different spectral sizes according to their types, according to predetermined wavelengths. For example, it can be seen that in the case of aluminum, the width and wavelength of the spectrum vary greatly at a wavelength of 425 or more and 676 or less, in the case of stainless steel (SUS), the spectral width is maintained gently at a wavelength of 447 or more and 583 or less, in the case of copper, the spectral width increases significantly at a wavelength of 699, and in the case of brass, the spectral width does not change significantly.

[0090] Finally, by identifying the positions of foreign matters through the visual camera and analyzing the spectral signals of the foreign matters photographed by the hyperspectral imaging camera, it is possible to more effectively analyze the positions and components of the foreign matters present on the cathode (C).

[0091] Meanwhile, the method (S1) for detecting and analyzing foreign matters in a cathode according to the embodiments of the present disclosure can include the following steps: (S10) dividing a cathode (C) conveyed in one direction into a predetermined area, and photographing the predetermined area using a first camera 10; (S20) processing an image of the predetermined area photographed by the first camera 10 to designate a position at which a foreign matter is formed; (S30) photographing the designated foreign matter using a second camera 20; and (S40) analyzing a spectral signal of an image of the foreign matter photographed by the second camera 20 to classify a component of the foreign matter.

[0092] The step (S10) of photographing using the first camera 10 is a step of photographing a cathode (C) conveyed in one direction. Here, the "predetermined area" can be an area within the FOV range (A) of the first camera 10. In addition, the first camera 10 can be a visual camera.

[0093] When photographing the predetermined area of the cathode (C) using the first camera 10, the method can further include the following step (S11): irradiating light within a wavelength band that can be photographed by a visual camera toward the predetermined area of the cathode. This is a step of more easily finding a foreign matter formed in the predetermined area.

[0094] The step (S20) of designating the position of the foreign matter is a step of designating the position of the foreign matter on the cathode (C) by processing an image of the predetermined area photographed by the first camera 10. Since the FOV (B) of the second camera 20 is smaller than the FOV (A) of the first camera 10, it is necessary to more specifically designate the position of the foreign matter.

[0095] When the position of the foreign matter is specified, the following step (S21) can also be included: moving the second camera 20 to a position capable of photographing the foreign matter in the specified predetermined area. Alternatively, the following step (S22) can also be included: moving the cathode (C) in which the foreign matter is located to a position at which it can be photographed by the second camera 20.

[0096] The step (S30) of photographing using the second camera 20 is a step of photographing the foreign matter using the second camera 20 when the position of the foreign matter is specified. The position of the foreign matter can be formed within the FOV (B) range of the second camera 20. In addition, the second camera 20 can be a hyperspectral imaging camera or a multispectral imaging camera.

[0097] When the foreign matter is photographed using the second camera 20, the method can further include the following step (S31): irradiating light within a wavelength band that can be photographed by the hyperspectral imaging camera or the multispectral imaging camera toward the foreign matter. This is a step of more easily classifying the composition of the foreign matter.

[0098] In particular, when the foreign matter is photographed using the second camera 20, the method can further include the following step (S32): receiving data regarding the position of a specific predetermined area and data regarding the speed at which the cathode is transported, and controlling the second camera to photograph the foreign matter when the foreign matter is transported to a position at which the second camera can photograph the foreign matter.

[0099] The step (S40) of classifying the composition of the foreign matter is a step of classifying the composition of the foreign matter by analyzing the spectral signal of the image of the foreign matter photographed by the second camera 20.

[0100] The method (S1) for detecting and analyzing a foreign matter in a cathode according to the embodiment of the disclosure can include all the technical features and contents of the device 1 for detecting and analyzing a foreign matter in a cathode according to the embodiment of the disclosure as described above.

[0101] While the disclosure has been described above by way of limited embodiments, the disclosure is not limited thereto, and it is obvious that those skilled in the art to which the disclosure pertains can make various modifications and changes within the technical idea of the disclosure and the equivalent scope of the claims to be described below.

Claims

1. An apparatus for detecting and analyzing foreign matter in a cathode, the apparatus comprising: A first camera device is used to divide a cathode transported in one direction into a predetermined area and photograph the predetermined area; An image processing processor is used to process an image of the predetermined area captured by the first camera device to specify the location where the foreign object is formed; A second camera device is used to capture images of the foreign object specified by the image processing processor; as well as A spectral processing processor is used to analyze the spectral signal of an image of the foreign object captured by the second camera device in order to classify the components of the foreign object.

2. The apparatus according to claim 1, wherein, The first camera device is a visual camera device.

3. The apparatus of claim 2 further includes a first light source for irradiating the predetermined region of the cathode with light within a wavelength band capable of being captured by the visual imaging device.

4. The apparatus according to claim 1, wherein, The second camera device is a hyperspectral imaging camera device or a multispectral imaging camera device.

5. The apparatus of claim 4 further includes a second light source for irradiating the foreign object with light within a wavelength band that can be captured by the hyperspectral imaging camera or the multispectral imaging camera.

6. The apparatus according to claim 1, further comprising a first conveying module, the first conveying module being configured to move the second camera device to a position capable of capturing the foreign object in the predetermined area when the position of the foreign object is specified by the image processing processor.

7. The apparatus according to claim 6, wherein, The first conveying module moves the second camera device in the width direction of the cathode, which has a predetermined width dimension and extends in the length direction and is conveyed along the length direction.

8. The apparatus of claim 6 or 7 further comprises a data processing processor configured to: receive data about the location of the foreign object specified by the image processing processor and data about the speed at which the cathode is conveyed, and control the second camera device to photograph the foreign object when the foreign object is located at a position where it can be photographed by the second camera device.

9. The apparatus of claim 1 further includes a second conveying module, the second conveying module being configured to move the cathode containing the foreign object to a position where the second camera device can capture the cathode when the position of the foreign object is specified by the image processing processor.

10. A method for detecting and analyzing foreign matter in a cathode, the method comprising the following steps: The cathode, which is transported in one direction, is divided into predetermined areas, and the predetermined areas are photographed using a first camera device; The image of the predetermined area captured by the first camera device is processed to specify the location where the foreign object is formed; Use a second camera device to photograph the designated foreign object; as well as The spectral signals of the image of the foreign object captured by the second camera device are analyzed to classify the composition of the foreign object.

11. The method according to claim 10, wherein, In the step of using the first camera device to take pictures, the first camera device is a visual camera device.

12. The method of claim 11, further comprising the step of using the visual imaging device to capture the predetermined area of ​​the cathode: Light within a wavelength band that can be captured by the visual camera device is irradiated toward the predetermined area.

13. The method according to claim 10, wherein, In the step of taking pictures using the second camera device, the second camera device is a hyperspectral imaging camera device or a multispectral imaging camera device.

14. The method according to claim 13, further comprising the following step when using the hyperspectral imaging camera or the multispectral imaging camera to photograph the foreign object: Irradiate the foreign object with light within the wavelength band that can be captured by the hyperspectral imaging camera or the multispectral imaging camera.

15. The method of claim 10, further comprising the step of moving the second camera device to a position capable of capturing images of foreign objects in a specific predetermined area.

16. The method of claim 15, further comprising the step of: Receive data about the location of the specific predetermined area and data about the speed at which the cathode is transported, and control the second camera device to photograph the foreign object when the foreign object is transported to a location where it can be photographed by the second camera device.

17. The method of claim 10, further comprising the step of: The cathode containing the foreign object is moved to a position where it can be photographed by the second camera device, so as to photograph the specific foreign object.

Images