Superconducting material magnetic field testing device and testing method

Abstract

The invention relates to the technical field of magnetic field testing, and discloses a superconducting material magnetic field testing device and method.The superconducting material magnetic field testing device comprises a testing table, a first support, a second support and a third support are fixedly installed on the testing table, the third support is located between the first support and the second support, and a horizontal magnetic field source is fixedly installed on the first support; through the turnover structure design of the low-temperature tank and the test cylinder, when one sample is tested in a magnetic field effective area of the horizontal magnetic field source, the other sample can be replaced in a discharging chamber area outside a magnetic field, and when the low-temperature tank and the test cylinder turn over and switch the samples, the low-temperature environment of the low-temperature tank does not need to be interrupted and the magnetic field does not need to be reconstructed; meanwhile, the electric air cylinder with the feeding assembly can be combined to synchronously complete feeding and discharging operation, the intermediate waiting time of batch sample testing is greatly shortened, the problems that in traditional testing, environment interruption, temperature returning waiting and magnetic field reconstruction are needed for sample replacement are solved, and the testing efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of magnetic field testing, and in particular to a superconducting material magnetic field testing device and testing method. BACKGROUND

[0002] The superconducting material magnetic field testing device is a professional equipment for superconducting material research and development, performance detection and application verification. In the testing process, a stable low-temperature environment and a controllable magnetic field need to be constructed to simulate the actual working scenario of the superconducting material, and through accurate data collection, the critical current, critical temperature and other key performance parameters of the superconducting material under different magnetic field strengths are analyzed. In actual testing operation, the traditional superconducting material magnetic field testing device has two major problems. First, the sample replacement process is time-consuming and inefficient. In the traditional testing device, sample replacement must wait for the magnetic field to be zeroed, which is to avoid the instantaneous release of energy causing equipment failure. Therefore, the magnetic field needs to be zeroed by slowly discharging energy through a special circuit. During this period, the testing system is completely stalled and cannot perform other testing tasks in parallel. Second, there are hidden dangers in operation safety and equipment protection. In the traditional device, the Hall detection head needs to be placed close to the test sample to ensure detection accuracy. During sample replacement, the sample taking and placing process is prone to collide with the Hall detection head, causing damage to the detection element and distortion of the test data. At the same time, superconducting material testing requires maintaining a very low temperature environment. In the traditional operation, personnel need to directly reach into the low-temperature cavity to take and place the sample. The low-temperature environment can easily cause hand frostbite, posing a significant risk to personal safety. Based on this, the present application provides a superconducting material magnetic field testing device and testing method that can quickly replace the sample without waiting for the magnetic field to be zeroed, and improves testing efficiency and operation safety. SUMMARY

[0003] The present application aims to overcome the deficiencies of the prior art and provide a superconducting material magnetic field testing device and testing method to solve the technical problems in the prior art.

[0004] The object of the present application can be achieved by the following technical solutions: A superconducting material magnetic field testing device, comprising: The utility model provides a test platform, first support, second support and third support are fixedly installed on the test platform, the third support is located between first support and second support, horizontal magnetic field source is fixedly installed on first support, the top of third support is connected with rotating frame, low temperature jar is rotatably installed at the bottom of rotating frame, low temperature jar is driven to rotate by first output source, and the rotation axis of low temperature jar is horizontally arranged, the test cylinder is through in low temperature jar, the test cylinder is fixedly connected with the inner wall of low temperature jar, the test cylinder in low temperature jar is in the magnetic field range of horizontal magnetic field source, the test cylinder is provided with support plate, the test cylinder is divided into test chamber and discharging chamber arranged in upper and lower by support plate, and test chamber is located above discharging chamber, the inlet and outlet are formed in both ends of test cylinder, limiting assembly and buffer assembly are arranged in each inlet and outlet, and two inlets and outlets are communicated with test chamber and discharging chamber respectively, The sample is connected with the buffer assembly, the sample is connected with the limiting assembly, when one sample is located on the support plate in the low temperature jar, the sample is located in the magnetic field range of the horizontal magnetic field source, at this time, another sample enters the discharging chamber through the inlet and outlet, at this time, the sample is located below the low temperature jar, thereby being located outside the magnetic field range of the horizontal magnetic field source, then the low temperature jar and the test cylinder are turned over by 180 degrees by the first output source, so that the discharging chamber is located above the test chamber, and the tested sample falls below the low temperature jar and is located at the inlet and outlet, and the sample to be tested falls on the support plate; The three-axis displacement assembly is arranged on the second support, the three-axis displacement assembly is used for driving the test instrument body connected with the Hall detection head to move, the Hall detection head faces the low temperature jar, and the Hall detection head is used for testing the sample on the support plate.

[0005] As a further scheme of the utility model: the rotating frame is rotatably installed on the third support, the rotating frame is driven to rotate by the second output source, the rotation axis of the rotating frame is perpendicular to the rotation axis of the low temperature jar, when testing the sample, the second output source drives the rotating frame to rotate, so that the rotating frame rotates away from the connecting line of the horizontal magnetic field source and the test instrument body, before driving the low temperature jar to turn over by 180 degrees, the second output source drives the rotating frame to rotate, so that the rotation axis of the low temperature jar is parallel to the connecting line of the horizontal magnetic field source and the test instrument body.

[0006] As a further scheme of the utility model: the limiting assembly includes a groove and a limiting plate, the grooves are formed in both ends of the test cylinder, the limiting plate is slidably installed in the groove, and the limiting plate is driven to lift and fall by the driving source, the two sides of the limiting plate corresponding to the inlet and outlet are provided with protrusions, when the driving source drives the limiting plate to fall and shrink into the groove, the sample is allowed to pass through the inlet and outlet, when the driving source drives the limiting plate to rise, the two protrusions make the area of the inlet and outlet decrease, so that the sample cannot pass through the inlet and outlet.

[0007] As a further scheme of the present application: the buffer assembly comprises a first sliding groove, a supporting plate and a first spring, the first sliding groove is arranged at both ends of the test cylinder, the supporting plate is slidably arranged in the first sliding groove, and the supporting plate is slidably connected to the test cylinder, the supporting plate is connected to the test cylinder through the first spring, and the pre-tightening force of the first spring enables the supporting plate to move towards the support plate; when the sample is placed on the supporting plate, the sample enables the supporting plate to descend to compress the first spring, and the supporting plate moves to the bottom end of the first sliding groove.

[0008] As a further scheme of the present application: the supporting plate is slidably arranged in the test cylinder, a second sliding groove is arranged in the test cylinder, the supporting plate is slidably connected to the second sliding groove at both ends, spring grooves are arranged at both ends of the second sliding groove, a buffer cylinder is slidably arranged in the spring grooves, the buffer cylinder is connected to the spring grooves through a second spring inside the buffer cylinder, the pre-tightening force of the second spring enables the buffer cylinder to move towards the supporting plate, in the initial state, the supporting plate is located on the buffer cylinder, when the sample is placed on the supporting plate, the sample and the supporting plate enable the buffer cylinder to descend, at this time, the second spring is compressed, and finally the buffer cylinder moves into the spring grooves, at this time, the supporting plate descends to the bottom end of the second sliding groove, and the sample is located at the center of the magnetic field range.

[0009] As a further scheme of the present application: the inlet and outlet are arranged in a penetrating manner, two symmetrical collecting ports are fixedly arranged on the test table, the two collecting ports respectively represent qualified and unqualified, and each collecting port has an electric cylinder corresponding thereto, the electric cylinder is fixedly arranged on the test table, the two electric cylinders are arranged in a symmetrical manner, and the two collecting ports are located between the two electric cylinders, when the cryogenic tank is turned by one hundred and eighty degrees to exchange the positions of the two samples, at this time, the electric cylinder is extended, and the electric cylinder pushes the sample to fall into the collecting port arranged on the opposite side of the electric cylinder through the inlet and outlet.

[0010] As a further scheme of the present application: the movable end of the electric cylinder is fixedly arranged with a feeding assembly, and the feeding assembly is used for putting the sample into the test cylinder through the inlet and outlet.

[0011] A superconducting material magnetic field test method, the method is applied to the superconducting material magnetic field test device, and the method comprises the following steps: Step S1: first, a sample is put into the test cylinder through the inlet and outlet, then the cryogenic tank is turned by one hundred and eighty degrees, so that the sample falls onto the supporting plate, at this time, the sample on the supporting plate is located in the magnetic field range of the horizontal magnetic field source; Step S2: the horizontal magnetic field source, the cryogenic tank, the test instrument body and the Hall detection head are started to run, the sample on the supporting plate is tested, and another sample is put into the test cylinder through the inlet and outlet; Step S3: when the sample test on the support plate is completed, the low-temperature tank is turned over by one hundred and eighty degrees, the tested sample falls to the lower part of the low-temperature tank and is located at the inlet and outlet, so as to be out of the magnetic field range of the horizontal magnetic field source, and the sample to be tested falls to the support plate; Step S4: the sample on the support plate is tested again, and the tested sample is discharged through the inlet and outlet, and the new sample is put into the test cylinder through the inlet and outlet; Step S5: steps S2-S4 are repeated, that is, the samples are alternately tested.

[0012] The beneficial effects of the present application are: 1. In the present application, through the design of the overturning mechanism of the low-temperature tank and the test cylinder, when one sample is tested in the magnetic field effective area of the horizontal magnetic field source, another sample can be replaced in the discharging chamber area outside the magnetic field, and the low-temperature environment of the low-temperature tank and the magnetic field are not interrupted when the low-temperature tank and the test cylinder are overturned to switch the samples, and the feeding and discharging operations can be completed synchronously by combining the electric cylinder with the feeding assembly, which greatly shortens the intermediate waiting time of batch sample testing, avoids the problems of interrupting the environment, waiting for temperature recovery and magnetic field reconstruction in traditional testing when replacing the samples, and significantly improves the overall testing efficiency; 2. In the present application, the buffer assembly composed of the first spring can effectively absorb the impact force of the sample when the sample falls to the supporting plate and the low-temperature tank, and further buffers the impact when the sample falls to the supporting plate, which avoids the problem that the sample is easily damaged by rigid collision in traditional testing, realizes effective protection of the sample, and reduces the material loss in the testing process; 3. In the present application, the second spring pushes the buffer cylinder to abut against the supporting plate, and after the sample is placed on the supporting plate, the gravity of the sample and the supporting plate drives the buffer cylinder to contract, and the supporting plate slides down to the bottom end of the second sliding groove, so that the sample is accurately located at the center of the magnetic field range of the horizontal magnetic field source, ensuring that the sample is always in a uniform magnetic field environment during testing. BRIEF DESCRIPTION OF DRAWINGS

[0013] The present application will be further described below with reference to the accompanying drawings.

[0014] Figure 1 is a schematic diagram of the overall structure of the present application; Figure 2 is a schematic diagram of the structure of the low-temperature tank in the present application; Figure 3 is a schematic diagram of the structure of the test cylinder in the present application; Figure 4 is a schematic diagram of the structure of the test cylinder in the present application; Figure 3 is a schematic diagram of the structure of the test cylinder in the present application; Figure 5 is a structural schematic diagram of the second chute in the application; Figure 6 is a structural schematic diagram of the application Figure 5 is a structural schematic diagram of the B part in the application; Figure 7 is a structural schematic diagram of the application in which the inlet and outlet are aligned with the collection port.

[0015] In the figure: 1, test bench; 2, first support; 3, second support; 4, horizontal magnetic field source; 5, test instrument body; 6, third support; 7, rotating frame; 8, cryogenic tank; 9, test cylinder; 10, sample; 11, support plate; 12, inlet and outlet; 13, groove; 14, limiting plate; 15, first chute; 16, supporting plate; 17, first spring; 18, second chute; 19, spring groove; 20, buffer cylinder; 21, second spring; 22, three-axis displacement assembly; 23, electric cylinder; 24, collection port; 25, feeding assembly; 26, Hall detection head; 27, test chamber; 28, discharging chamber. DETAILED DESCRIPTION

[0016] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by a person of ordinary skill in the art without creative labor fall within the protection scope of the application.

[0017] Please refer to Figures 1-7 , the application is a superconducting material magnetic field testing device, comprising: A test bench 1 is provided, and a first support 2, a second support 3 and a third support 6 are fixedly installed on the test bench 1, the third support 6 is located between the first support 2 and the second support 3, a horizontal magnetic field source 4 is fixedly installed on the first support 2, a rotating frame 7 is connected to the top end of the third support 6, a cryogenic tank 8 is rotatably installed at the bottom end of the rotating frame 7, the cryogenic tank 8 is driven to rotate by a first output source, and the rotating axis of the cryogenic tank 8 is horizontally arranged, a test cylinder 9 penetrates through the cryogenic tank 8, the test cylinder 9 is fixedly connected with the inner wall of the cryogenic tank 8, the test cylinder 9 in the cryogenic tank 8 is located in the magnetic field range of the horizontal magnetic field source 4, a support plate 11 is arranged in the test cylinder 9, the support plate 11 divides the test cylinder 9 into a test chamber 27 and a discharging chamber 28 arranged in an upper and lower manner, and the test chamber 27 is located above the discharging chamber 28, inlet and outlet ports 12 are formed at both ends of the test cylinder 9, a limiting assembly and a buffer assembly are arranged in each inlet and outlet port 12, and the two inlet and outlet ports 12 are respectively communicated with the test chamber 27 and the discharging chamber 28; Sample 10 is connected to the buffer assembly and the limiting assembly. When one sample 10 is located on the support plate 11 inside the cryogenic tank 8, the sample 10 is within the magnetic field range of the horizontal magnetic field source 4. At this time, another sample 10 enters the feeding chamber 28 through the inlet and outlet 12. At this time, the sample 10 is located below the cryogenic tank 8 and thus outside the magnetic field range of the horizontal magnetic field source 4. Subsequently, the first output source drives the cryogenic tank 8 and the test cylinder 9 to rotate 180 degrees, so that the feeding chamber 28 is above the test chamber 27. The tested sample 10 falls below the cryogenic tank 8 and is located at the inlet and outlet 12. The sample 10 to be tested falls onto the support plate 11. The triaxial displacement assembly 22 is mounted on the second support 3. The triaxial displacement assembly 22 is used to drive the tester body 5, which is connected to the Hall sensor head 26, to move. The Hall sensor head 26 faces the cryogenic tank 8 and is used to perform magnetic field testing on the sample 10 located on the support plate 11.

[0018] Specifically, the rotating frame 7 is rotatably mounted on the third support 6. The rotating frame 7 is driven to rotate by the second output source. The axis of rotation of the rotating frame 7 is perpendicular to the axis of rotation of the cryogenic tank 8. When testing sample 10, the second output source drives the rotating frame 7 to rotate, so that the rotating frame 7 rotates away from the line connecting the horizontal magnetic field source 4 and the test instrument body 5. Before driving the cryogenic tank 8 to rotate 180 degrees, the second output source drives the rotating frame 7 to rotate, so that the axis of rotation of the cryogenic tank 8 is parallel to the line connecting the horizontal magnetic field source 4 and the test instrument body 5.

[0019] In one embodiment, both the first and second output sources can be servo motors, servo motors, or other components capable of rotational motion. This embodiment does not impose specific limitations. It should be noted that the horizontal magnetic field source 4, the cryogenic tank 8, the tester body 5, the Hall sensor head 26, and the triaxial displacement component 22 described in this invention are all prior art. This invention does not improve them. Therefore, it is not necessary to disclose their specific mechanical and circuit structures, and this does not affect the integrity of this invention. The working principle of this invention: It should be noted that the horizontal magnetic field source 4 is a horizontal threaded pipeline, making the magnetic field direction horizontal. During operation, combined with... Figure 1 and Figure 3 As shown in the example, sample 10 in test chamber 27 is located within the magnetic field of horizontal magnetic field source 4, while sample 10 in unloading chamber 28 has just finished testing and is now outside the magnetic field range of horizontal magnetic field source 4. Therefore, sample 10 in unloading chamber 28 can be replaced simultaneously with magnetic field testing of sample 10 in test chamber 27. Replacing sample 10 requires operation through inlet / outlet 12. It should be noted that...Figure 1 As shown in the figure, when performing magnetic field testing on sample 10 in low-temperature tank 8 and test cylinder 9, it is necessary to ensure that the rotating frame 7 is rotated to the state shown in the figure, that is, the rotating frame 7 is far away from the line connecting the horizontal magnetic field source 4 and the test instrument body 5. This is to avoid the rotating frame 7 acting as an obstacle and affecting the test results. After the sample 10 test is completed and the sample 10 to be tested is prepared in the feeding chamber 28, the rotating frame 7 is first rotated as follows: Figure 7 In the state shown, after the axis of rotation of the cryogenic tank 8 is parallel to the line connecting the horizontal magnetic field source 4 and the test instrument body 5, the cryogenic tank 8 is rotated. Then, the test cylinder 9 will not collide with the Hall detection head 26 during the flipping process. After flipping, the tested sample 10 falls below the cryogenic tank 8 and is located at the inlet and outlet 12, leaving the magnetic field range of the horizontal magnetic field source 4. The sample 10 to be tested falls onto the support plate 11. Then, the above process can be repeated to alternately test the two samples 10. In summary, during the testing phase: one sample 10 is located in the effective area of ​​the magnetic field for testing, while the other sample 10 is at the bottom of the test cylinder 9, i.e. outside the magnetic field. This allows the sample 10 to be replaced during the testing process, thereby improving testing efficiency. During the replacement phase: After the test is completed, simply rotate the cryogenic tank 8 and the test cylinder 9. The tested sample 10 in the magnetic field falls to the bottom of the test cylinder 9 under the action of gravity, that is, outside the magnetic field. The pre-treated sample 10 at the bottom moves to the support plate 11 with the rotation and enters the effective area of ​​the magnetic field for testing. In this way, the sample 10 can be switched in a short time without interrupting the cryogenic environment of the cryogenic tank 8. Moreover, there is no need to wait for the temperature to recover and the magnetic field to be rebuilt before retesting, which greatly shortens the testing time of batch samples 10. Furthermore, there is no need to reach into the cryogenic environment when replacing sample 10.

[0020] like Figures 1-4 As shown, in a preferred embodiment of the present invention, the limiting component includes a groove 13 and a limiting plate 14. The test cylinder 9 has grooves 13 at both ends. The limiting plate 14 is slidably installed in the groove 13 and is driven to rise and fall by a driving source. The limiting plate 14 has protrusions on both sides corresponding to the inlet and outlet 12. When the driving source drives the limiting plate 14 to descend and retract into the groove 13, the sample 10 is allowed to pass through the inlet and outlet 12. When the driving source drives the limiting plate 14 to rise, the two protrusions reduce the passing area of ​​the inlet and outlet 12, making it impossible for the sample 10 to pass through the inlet and outlet 12.

[0021] Specifically, the buffer assembly comprises a first sliding groove 15, a supporting plate 16 and a first spring 17, the first sliding groove 15 is arranged at both ends of the test cylinder 9, the supporting plate 16 is slidingly arranged at both ends of the first sliding groove 15, and the supporting plate 16 is slidingly connected with the test cylinder 9, the supporting plate 16 is connected with the test cylinder 9 through the first spring 17, the pre-tightening force of the first spring 17 enables the supporting plate 16 to move towards the supporting plate 11, when the sample 10 is placed on the supporting plate 16, the sample 10 enables the supporting plate 16 to descend and compress the first spring 17, so that the supporting plate 16 moves to the bottom end of the first sliding groove 15, at this time, the sample 10 is aligned with the inlet and outlet 12.

[0022] In one case of the embodiment, the driving source can be selected from an electric telescopic rod and other components capable of realizing lifting movement, and the embodiment is not specifically limited herein.

[0023] In actual application, when the sample 10 needs to be sent into the test cylinder 9, the driving source is used to drive the limiting plate 14 to slide downwards along the groove 13 and shrink into the groove 13, at this time, the passageway of the inlet and outlet 12 is completely opened, and the sample 10 can smoothly pass through the inlet and outlet 12 and enter the test cylinder 9; if the sample 10 is in a testing or turning state in the test cylinder 9, the driving source is used to drive the limiting plate 14 to slide upwards along the groove 13, and the protrusions on both sides of the limiting plate 14 extend into the inlet and outlet 12, so that the effective passageway of the inlet and outlet 12 is greatly reduced, and the sample 10 is prevented from sliding off from the inlet and outlet 12 in an unintended state, thereby realizing the limiting protection of the sample 10. When the sample 10 falls into the test cylinder 9 through the inlet and outlet 12, the sample 10 first contacts the supporting plate 16, the supporting plate 16 slides downwards along the first sliding groove 15 under the action of gravity and compresses the first spring 17, the elastic force of the first spring 17 can buffer the impact force of the sample 10 falling, and the sample 10 is prevented from being damaged due to impact when the supporting plate 16 slides to the bottom end of the first sliding groove 15, the sample 10 is just in an aligned state with the inlet and outlet 12, thereby providing accurate positioning for the subsequent turning and transferring of the sample 10, and the problems that the sample 10 is easy to deviate and be damaged in the falling process are solved; more importantly, the first spring 17 can play a buffering role in the scene that the sample 10 falls from the supporting plate 11 to the supporting plate 16 after the low-temperature tank 8 and the test cylinder 9 are turned by one hundred and eighty degrees, and the impact of the sample 10 on the supporting plate 16 in the falling process can be effectively absorbed by the first spring 17, thereby playing a protection role. Secondly, the pushing force of the upper first spring 17 on the supporting plate 16 can assist the sample 10 to be tested to fall onto the supporting plate 11 after the low-temperature tank 8 and the test cylinder 9 are turned by one hundred and eighty degrees.

[0024] For example, Figures 1-6As shown, as a preferred embodiment of the present application, the support plate 11 is slidingly mounted in the test cylinder 9, a second sliding groove 18 is formed in the test cylinder 9, the two ends of the support plate 11 are slidingly connected with the second sliding groove 18, spring grooves 19 are formed at both ends of the second sliding groove 18, a buffer cylinder 20 is slidingly mounted in the spring grooves 19, the inside of the buffer cylinder 20 is connected with the spring grooves 19 through a second spring 21, the pre-tightening force of the second spring 21 makes the buffer cylinder 20 move towards the support plate 11, in the initial state, the support plate 11 is located on the buffer cylinder 20, when the sample 10 is placed on the support plate 11, the sample 10 and the support plate 11 make the buffer cylinder 20 descend, at this time the second spring 21 is contracted, finally the buffer cylinder 20 moves into the spring grooves 19, at this time the support plate 11 descends to the bottom end of the second sliding groove 18, and the sample 10 is located at the center of the magnetic field range.

[0025] In actual application, in the initial state, the pre-tightening force of the second spring 21 pushes the buffer cylinder 20 to extend out of the spring grooves 19, the support plate 11 is stably supported on the buffer cylinder 20, at this time the support plate 11 is at a higher position in the test cylinder 9, which is convenient for receiving the sample 10 falling from the inlet and outlet 12; after the sample 10 is placed on the support plate 11, the total weight of the sample 10 and the support plate 11 is greater than the pre-tightening force of the second spring 21, which pushes the buffer cylinder 20 to slide down along the spring grooves 19 and compresses the second spring 21, until the buffer cylinder 20 is completely contracted into the spring grooves 19; in this process, the support plate 11 synchronously slides down along the second sliding groove 18, and finally reaches the bottom end of the second sliding groove 18, at this time the sample 10 is just located at the center position of the magnetic field range of the horizontal magnetic field source 4, which ensures that the sample 10 is always in a uniform magnetic field environment during the test process, avoids the problem that the test data is inaccurate due to the position deviation of the sample 10, and effectively improves the precision of the magnetic field test. The design is mainly considered that in the process of turning the cryogenic tank 8 and the test cylinder 9 by one hundred and eighty degrees, when the inlet and outlet 12 falls from above to the support plate 11, the second spring 21 can effectively absorb the impact force, avoiding the problem that the sample 10 directly falls on the rigidly connected support plate 11, which is easy to cause damage to the sample 10; and after the cryogenic tank 8 and the test cylinder 9 are turned by one hundred and eighty degrees, the pre-tightening force of the second spring 21 is released, which can push the sample 10 to fall, and also plays a role in assisting the unloading process.

[0026] As Figures 1-7As shown, as a preferred embodiment of the present application, the inlet and outlet 12 is through arrangement, the test table 1 is fixedly installed with two symmetrically arranged collection ports 24, two collection ports 24 respectively represent qualified and unqualified, and each collection port 24 has a corresponding electric cylinder 23, the electric cylinder 23 is fixedly installed on the test table 1, two electric cylinders 23 are symmetrically arranged, and two collection ports 24 are located between two electric cylinders 23, when the low-temperature tank 8 is turned over by one hundred and eighty degrees to make two samples 10 positions exchange, at this time, the electric cylinder 23 extends, and the electric cylinder 23 pushes the sample 10 to fall into the collection port 24 arranged on the opposite side of the electric cylinder 23 through the inlet and outlet 12.

[0027] Specifically, one end of the electric cylinder 23 is fixedly installed with a feeding assembly 25, and the feeding assembly 25 is used for putting the sample 10 into the test cylinder 9 through the inlet and outlet 12.

[0028] In a case of the embodiment, the feeding assembly 25 can be a vacuum adsorption assembly, and can also be other mechanisms capable of feeding the sample 10 through the inlet and outlet 12, which is not limited in the embodiment.

[0029] In actual application, after the low-temperature tank 8 is turned over by one hundred and eighty degrees to complete the position exchange of the sample 10, the tested sample 10 is located at the inlet and outlet 12 below the low-temperature tank 8, if the sample 10 is qualified, the electric cylinder 23 corresponding to the qualified collection port 24 is started to extend, the movable end of the electric cylinder 23 pushes the sample 10 to move along the inlet and outlet 12, so that the sample 10 falls into the qualified collection port 24 through the inlet and outlet 12; if the sample 10 is unqualified, the electric cylinder 23 corresponding to one side of the unqualified collection port 24 is started to push the sample 10 into the unqualified collection port 24, so that the automatic classification and collection of the sample 10 are realized. When feeding, the electric cylinder 23 with the feeding assembly 25 is started, after the feeding assembly 25 adsorbs the sample 10 to be tested, the electric cylinder 23 extends to send the sample 10 into the specified area in the test cylinder 9 through the inlet and outlet 12, and when unloading the tested sample 10, the electric cylinder 23 with the feeding assembly 25 is needed to unload, so that the new sample 10 to be tested can be directly adsorbed by the feeding assembly 25, and then the electric cylinder 23 is extended to directly make the sample 10 to be tested enter the test cylinder 9 through the inlet and outlet 12, so that the tested sample 10 is pushed out of the test cylinder 9 and falls into the corresponding collection port 24, so that the feeding and unloading operations can be simultaneously completed, the waiting time in the test is further shortened, and the test efficiency is improved.

[0030] Please refer to Figures 1-7 As shown, the present application is a superconducting material magnetic field test method, the method is applied to the superconducting material magnetic field test device as described in the above embodiment, and the method comprises the following steps: Step S1: firstly, a sample 10 is put into the test cylinder 9 through the inlet and outlet 12, then the low-temperature tank 8 is turned by 180 degrees, so that the sample 10 on the support plate 11 is located in the magnetic field range of the horizontal magnetic field source 4; Step S2: the horizontal magnetic field source 4, the low-temperature tank 8, the tester body 5 and the Hall detection head 26 are started to run, the sample 10 on the support plate 11 is tested, and another sample 10 is put into the test cylinder 9 through the inlet and outlet 12; Step S3: when the sample 10 on the support plate 11 is tested, the low-temperature tank 8 is turned by 180 degrees, the tested sample 10 falls below the low-temperature tank 8 and is located at the inlet and outlet 12, so as to be out of the magnetic field range of the horizontal magnetic field source 4, and the sample 10 to be tested falls on the support plate 11; Step S4: the sample 10 on the support plate 11 is tested again, the tested sample 10 is discharged through the inlet and outlet 12, and the new sample 10 is put into the test cylinder 9 through the inlet and outlet 12; Step S5: steps S2-S4 are repeated, so that the samples 10 are alternately tested.

[0031] The above describes one embodiment of the present application in detail, but the content described is only the preferred embodiment of the present application, and cannot be considered as limiting the implementation range of the present application. Any equivalent changes and improvements made according to the application scope of the present application should still belong to the patent coverage range of the present application.

Claims

1. A magnetic field testing device for superconducting materials, characterized in that, include: A test stand (1) is fixedly mounted with a first bracket (2), a second bracket (3), and a third bracket (6). The third bracket (6) is located between the first bracket (2) and the second bracket (3). A horizontal magnetic field source (4) is fixedly mounted on the first bracket (2). A rotating frame (7) is connected to the top of the third bracket (6). A low-temperature tank (8) is rotatably mounted on the bottom of the rotating frame (7). The low-temperature tank (8) is driven to rotate by a first output source, and the rotation axis of the low-temperature tank (8) is horizontally arranged. A test cylinder (9) passes through the low-temperature tank (8). The test cylinder (9) is connected to... The inner wall of the cryogenic tank (8) is fixedly connected. The test cylinder (9) inside the cryogenic tank (8) is within the magnetic field range of the horizontal magnetic field source (4). A support plate (11) is provided inside the test cylinder (9). The support plate (11) divides the inside of the test cylinder (9) into a test chamber (27) and a discharge chamber (28) arranged vertically. The test chamber (27) is located above the discharge chamber (28). Both ends of the test cylinder (9) are provided with inlets and outlets (12). Each inlet and outlet (12) is provided with a limit component and a buffer component. The two inlets and outlets (12) are respectively connected to the test chamber (27) and the discharge chamber (28). Sample (10), the sample (10) is connected to the buffer assembly, the sample (10) is connected to the limiting assembly. When one of the samples (10) is located on the support plate (11) inside the cryogenic tank (8), the sample (10) is within the magnetic field range of the horizontal magnetic field source (4). At this time, another sample (10) enters the feeding chamber (28) through the inlet and outlet (12). At this time, the sample (10) is located below the cryogenic tank (8), thus outside the magnetic field range of the horizontal magnetic field source (4). Subsequently, the first output source drives the cryogenic tank (8) and the test cylinder (9) to rotate 180 degrees, so that the feeding chamber (28) is located above the test chamber (27). The tested sample (10) falls below the cryogenic tank (8) and is located at the inlet and outlet (12). The sample (10) to be tested falls onto the support plate (11). The triaxial displacement assembly (22) is mounted on the second bracket (3). The triaxial displacement assembly (22) is used to drive the tester body (5) connected with the Hall sensor head (26) to move. The Hall sensor head (26) faces the cryogenic tank (8). The Hall sensor head (26) is used to perform magnetic field testing on the sample (10) located on the support plate (11).

2. The magnetic field testing device for superconducting materials according to claim 1, characterized in that, The rotating frame (7) is rotatably mounted on the third bracket (6). The rotating frame (7) is driven to rotate by the second output source. The axis of rotation of the rotating frame (7) is perpendicular to the axis of rotation of the low temperature tank (8). When testing the sample (10), the second output source drives the rotating frame (7) to rotate, so that the rotating frame (7) rotates away from the line connecting the horizontal magnetic field source (4) and the test instrument body (5). Before driving the low temperature tank (8) to rotate 180 degrees, the second output source drives the rotating frame (7) to rotate, so that the axis of rotation of the low temperature tank (8) is parallel to the line connecting the horizontal magnetic field source (4) and the test instrument body (5).

3. The magnetic field testing device for superconducting materials according to claim 2, characterized in that, The limiting component includes a groove (13) and a limiting plate (14). The test cylinder (9) has grooves (13) at both ends. The limiting plate (14) is slidably installed in the groove (13) and is driven to rise and fall by a driving source. The limiting plate (14) has protrusions on both sides corresponding to the inlet and outlet (12). When the driving source drives the limiting plate (14) to descend and retract into the groove (13), the sample (10) is allowed to pass through the inlet and outlet (12). When the driving source drives the limiting plate (14) to rise, the two protrusions reduce the area through which the inlet and outlet (12) pass, making it impossible for the sample (10) to pass through the inlet and outlet (12).

4. The magnetic field testing device for superconducting materials according to claim 3, characterized in that, The buffer assembly includes a first groove (15), a tray (16), and a first spring (17). The test cylinder (9) has a first groove (15) at both ends. The tray (16) is slidably installed in the first groove (15) at both ends and is slidably connected to the test cylinder (9). The tray (16) is connected to the test cylinder (9) through the first spring (17). The preload of the first spring (17) causes the tray (16) to move toward the support plate (11). When the sample (10) is placed on the tray (16), the sample (10) causes the tray (16) to descend, thereby compressing the first spring (17) and causing the tray (16) to move to the bottom of the first groove (15). At this time, the sample (10) is aligned with the inlet and outlet (12).

5. The magnetic field testing device for superconducting materials according to claim 1, characterized in that, The support plate (11) is slidably installed inside the test cylinder (9). A second slide groove (18) is provided inside the test cylinder (9). Both ends of the support plate (11) are slidably connected to the second slide groove (18). Both ends of the second slide groove (18) are provided with spring grooves (19). A buffer cylinder (20) is slidably installed inside the spring groove (19). The buffer cylinder (20) is connected to the spring groove (19) through a second spring (21). The preload of the second spring (21) makes... The buffer cylinder (20) moves toward the support plate (11). In the initial state, the support plate (11) is located on the buffer cylinder (20). When the sample (10) is placed on the support plate (11), the sample (10) and the support plate (11) cause the buffer cylinder (20) to descend. At this time, the second spring (21) contracts, and finally the buffer cylinder (20) moves into the spring groove (19). At this time, the support plate (11) descends to the bottom of the second slide (18), and the sample (10) is located at the center of the magnetic field range.

6. The magnetic field testing device for superconducting materials according to claim 2, characterized in that, The inlet and outlet (12) are arranged through the entire process. Two symmetrically arranged collection ports (24) are fixedly installed on the test platform (1). The two collection ports (24) represent qualified and unqualified respectively. Each collection port (24) is equipped with an electric cylinder (23). The electric cylinder (23) is fixedly installed on the test platform (1). The two electric cylinders (23) are arranged symmetrically, and the two collection ports (24) are located between the two electric cylinders (23). When the low temperature tank (8) is rotated 180 degrees so that the positions of the two samples (10) are interchanged, the electric cylinder (23) extends and pushes the sample (10) through the inlet and outlet (12) into the collection port (24) arranged on the opposite side of the electric cylinder (23).

7. A magnetic field testing device for superconducting materials according to claim 6, characterized in that, A feeding assembly (25) is fixedly installed on the movable end of one of the electric cylinders (23), the feeding assembly (25) being used to put the sample (10) into the test tube (9) through the inlet and outlet (12).

8. A method for testing the magnetic field of superconducting materials, characterized in that, The method is applied to a superconducting material magnetic field testing device as described in any one of claims 1-7, and the method includes the following steps: Step S1: First, put a sample (10) into the test tube (9) through the inlet and outlet (12), then rotate the low temperature tank (8) by 180 degrees so that the sample (10) falls onto the support plate (11). At this time, the sample (10) on the support plate (11) is located within the magnetic field range of the horizontal magnetic field source (4). Step S2: Start the horizontal magnetic field source (4), the low temperature tank (8), the test instrument body (5) and the Hall detection head (26) to perform magnetic field testing on the sample (10) on the support plate (11), and at the same time put another sample (10) into the test tube (9) through the inlet and outlet (12); Step S3: After the sample (10) on the support plate (11) is tested, the low temperature tank (8) is flipped 180 degrees. The tested sample (10) falls below the low temperature tank (8) and is located at the inlet and outlet (12), thus getting out of the magnetic field range of the horizontal magnetic field source (4), while the sample (10) to be tested falls onto the support plate (11). Step S4: Test the sample (10) on the support plate (11) again, and at the same time, unload the tested sample (10) through the inlet and outlet (12) and put the new sample (10) into the test tube (9) through the inlet and outlet (12); Step S5: Repeat steps S2-S4 to alternately test sample (10).

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