Electromagnetic function structure integrated testing device and method at high temperature

Abstract

The invention discloses an integrated testing device and method for an electromagnetic function structure at a high temperature, and relates to the technical field of microwave testing. The device comprises a rotating disc, a high-temperature-resistant base is detachably mounted on the rotating disc, a first clamp supporting arm and a second clamp supporting arm are detachably mounted on the top of the high-temperature-resistant base, mounting grooves are formed in the opposite sides of the first clamp supporting arm and the second clamp supporting arm correspondingly, and electromagnetic structural parts are detachably fixed in the mounting grooves; and a connecting arm is fixedly mounted on one side of the rotating disc. The test of the transmission coefficient and the reflection coefficient is integrated in the same set of equipment based on the free space method and the arch method, comprehensive test of the electromagnetic function structural member in the high-temperature environment is realized, the test efficiency is improved, the complexity and the cost of the test equipment are reduced, and the test efficiency is improved. And through the arrangement of the arc-shaped sliding rail and the movable receiving and transmitting antenna, the test of different incident angles can be realized, various test requirements are met, and more comprehensive electromagnetic performance data are provided.

Description

Technical Field

[0001] This invention relates to the field of microwave testing technology, specifically to an integrated testing device and method for electromagnetic functional structures at high temperatures. Background Technology

[0002] With the rapid development of modern technology, microwave electromagnetic functional structural components have been widely used in fields such as communications, radar, and aerospace. The electromagnetic performance of these components in high-temperature environments is crucial to their application effectiveness. For example, in radar systems, the transmission and reflection characteristics of electromagnetic functional structural components directly affect the radar's beam pointing accuracy and system sensitivity. Therefore, accurate measurement of the transmission and reflection coefficients of electromagnetic functional structural components in high-temperature environments is of great significance for the precise design, dynamic control, and reliability assessment of next-generation intelligent electromagnetic materials.

[0003] However, existing testing methods and devices have many limitations when measuring the transmission and reflection coefficients of electromagnetic functional structural components in high-temperature environments. While traditional free-space and bow-shaped methods have certain advantages at room temperature, they present numerous problems at high temperatures. For example, the existing technology "Performance Testing of Transmitting Materials Based on Free-Space Method" (by Yi Lei) uses the free-space method to design a testing system for testing transmittance and transmission phase shift parameters, meeting the testing requirements at different incident angles. However, it is only based on room temperature and cannot simulate the harsh thermal environment faced by hypersonic vehicles. Furthermore, the existing literature "Research on Reflection Loss Testing of Microwave Anechoic Chamber Mounted Absorbing Materials" (by Wang Guijuan) uses the bow-shaped method, demonstrating its advantages in testing absorbing materials through actual experimental tests. However, it is only used at room temperature and can only test reflection performance. All of these methods struggle to solve the problem of testing reflection and transmission coefficients in the same device and cannot meet the testing requirements of high-temperature environments. Therefore, this invention proposes an integrated testing device and method for electromagnetic functional structures at high temperatures. Summary of the Invention

[0004] The purpose of this invention is to provide an integrated testing device for electromagnetic functional structures at high temperatures, which can integrate the transmission coefficient and reflection coefficient into the same set of equipment for testing, and at the same time realize the measurement of the electrical performance parameters of electromagnetic functional structures under high temperature conditions.

[0005] According to a first aspect of the present invention, in order to achieve the above-mentioned objective, the present invention provides the following technical solution: a high-temperature electromagnetic functional structure integrated testing device, applied to microwave electromagnetic structural component testing, characterized in that it includes a rotating disk, on which a high-temperature resistant base is detachably mounted, and on the top of the high-temperature resistant base are detachably mounted a clamp arm one and a clamp arm two, and each of the clamp arm one and the clamp arm two has an installation groove on its opposite side, and an electromagnetic structural component is detachably fixed in the installation groove; A connecting arm is fixedly installed on one side of the rotating disk, and a quartz lamp heating component is detachably installed through the connecting arm. An arc-shaped slide rail is provided around the rotating disk. The arc-shaped slide rail is arranged concentrically with the rotating disk, and two sets of transceiver antennas are slidably connected on the arc-shaped slide rail. When the two sets of transceiver antennas are located at both ends of the arc-shaped slide rail, the transmission coefficient of the electromagnetic structure is tested. When the two sets of transceiver antennas are located in the middle of the arc-shaped slide rail, the reflection coefficient of the electromagnetic structure under different electromagnetic wave angles is tested.

[0006] Furthermore, a high-temperature resistant turntable is mounted below the rotating disk via ball bearings, and a groove adapted to the high-temperature resistant base is provided on the top of the rotating disk. The high-temperature resistant base is detachably installed in the groove via bolts.

[0007] Furthermore, one side of the clamp arm 1 and clamp arm 2 are connected to an insulation board by flame-retardant and high-temperature resistant adhesive.

[0008] Furthermore, a fixing plate is provided in the mounting groove, and multiple bolts are threadedly connected to the side of clamp arm one and clamp arm two away from the insulation plate. The bolts abut against the fixing plate to fix the electromagnetic structure component.

[0009] Furthermore, the width of the electromagnetic structure is adapted to the spacing between clamp arm one and clamp arm two, and the high-temperature resistant base is provided with multiple mounting holes for mounting clamp arm one and clamp arm two.

[0010] Furthermore, the thickness of the electromagnetic structural component is less than the width of the mounting groove.

[0011] Furthermore, the bottom of the quartz lamp heating assembly is fixedly connected to a mounting bracket, and the mounting bracket has a connecting groove adapted to the connecting arm. When the rotating disk rotates, the quartz lamp heating assembly and the electromagnetic structure remain relatively stationary.

[0012] Furthermore, the bottom of the arc-shaped slide rail is equipped with multiple support legs, and the top of the arc-shaped slide rail is provided with a slide groove. The bottom of the transceiver antenna is equipped with a slider that matches the slide groove, and the focal center of the transceiver antenna is at the same height as the center of the electromagnetic structure.

[0013] Furthermore, it also includes a controller and a vector network analyzer, which is connected to the transceiver antenna via a cable.

[0014] According to a second aspect of the present invention, the present invention provides a method for testing an integrated electromagnetic functional structure at high temperature, employing a testing device for an integrated electromagnetic functional structure at high temperature as described in the first aspect, comprising the following steps: S1. Measure the dimensions of the electromagnetic structure, including length, width and thickness, and install the electromagnetic structure in the mounting slot of the rotating disk using bolts and fixing plates; S2. Install the quartz lamp heating assembly on the connecting arm, and arrange the arc-shaped slide rail and transceiver antenna on the outside of the electromagnetic structure, and connect the transceiver antenna to the vector network analyzer; S3. Start the controller and vector network analyzer. When measuring the transmission coefficient, rotate the rotating disk to move the electromagnetic structure to an appropriate angle, and position the transmitting and receiving antennas at the two ends of the arc-shaped slide rail. When measuring the reflection coefficient, adjust the position of the transceiver antenna so that it is located in the middle of the arc-shaped slide rail, at a symmetrical angle with the center of the electromagnetic structure, and adjust the position of the quartz lamp heating component so that it maintains a certain distance from the electromagnetic structure. S4. Use a quartz lamp heating assembly to heat the electromagnetic structure, and remove the experimental site after heating is complete; S5. Record and export the vector network analyzer data, and calculate the corresponding transmission coefficient and reflection coefficient.

[0015] This invention has at least the following beneficial effects: 1. This invention, based on the free space method and the bow-shaped method, integrates the testing of transmission coefficient and reflection coefficient into the same set of equipment through innovative design, realizing comprehensive testing of electromagnetic functional structural components in high-temperature environments. This integrated design not only improves testing efficiency but also reduces the complexity and cost of testing equipment. Furthermore, through the set arc-shaped slide rail and movable transceiver antenna, it can achieve testing at different incident angles, meeting various testing needs and providing more comprehensive electromagnetic performance data.

[0016] 2. The present invention, through the cooperation of the clamp support arm one, clamp support arm two, mounting groove, fixing plate and other structures, can flexibly adjust the fixing position according to electromagnetic structural components of different sizes and shapes, thereby improving the versatility and adaptability of the device.

[0017] Of course, any product implementing this invention does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description

[0018] Figure 1 This is a three-dimensional schematic diagram of the overall structure of the present invention; Figure 2 This is a three-dimensional schematic diagram of the electromagnetic structure component of the present invention; Figure 3 This is a schematic diagram of the combination of the rotating disk and the quartz lamp heating assembly of the present invention; Figure 4 This is a schematic diagram showing the positions of the transmitting and receiving antennas during the transmission coefficient test in this invention; Figure 5 This is a schematic diagram showing the positions of the transmitting and receiving antennas during the reflection coefficient test in this invention.

[0019] Figure label: 1. High-temperature resistant turntable; 2. Rotating disk; 3. High-temperature resistant base; 4. Clamping arm one; 5. Clamping arm two; 6. Mounting slot; 7. Fixing plate; 8. Insulation board; 9. Electromagnetic structural component; 10. Bolt; 11. Connecting arm; 12. Mounting bracket; 13. Quartz lamp heating assembly; 14. Controller; 15. Vector network analyzer; 16. Transceiver antenna; 17. Arc-shaped slide rail. Detailed Implementation

[0020] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0021] Example 1: Please see Figure 1-5 The present invention provides a technical solution: an integrated testing device for electromagnetic functional structure under high temperature, applied to the testing of microwave electromagnetic structural component 9, including a rotating disk 2, a high temperature resistant base 3 detachably installed on the rotating disk 2, a clamp support arm 1 4 and a clamp support arm 2 detachably installed on the top of the high temperature resistant base 3, and an installation groove 6 is provided on the opposite side of the clamp support arm 1 4 and the clamp support arm 2 5, and an electromagnetic structural component 9 is detachably fixed in the installation groove 6; A connecting arm 11 is fixedly installed on one side of the rotating disk 2, and a quartz lamp heating assembly 13 is detachably installed through the connecting arm 11. An arc-shaped slide rail 17 is provided around the rotating disk 2. The arc-shaped slide rail 17 is arranged concentrically with the rotating disk 2, and two sets of transceiver antennas 16 are slidably connected on the arc-shaped slide rail 17. When the two sets of transceiver antennas 16 are located at both ends of the arc-shaped slide rail 17, the transmission coefficient of the electromagnetic structure 9 is tested. When the two sets of transceiver antennas 16 are located in the middle of the arc-shaped slide rail 17, the reflection coefficient of the electromagnetic structure 9 under different electromagnetic wave angles is tested.

[0022] Regarding the technical solution of this embodiment, a high-temperature resistant turntable 1 is installed below the rotating disk 2 via ball bearings, and a groove adapted to the high-temperature resistant base 3 is opened on the top of the rotating disk 2. The high-temperature resistant base 3 is detachably installed in the groove by bolts 10. The groove design allows the high-temperature resistant base 3 to be installed more stably on the rotating disk 2, avoiding shaking or displacement of the base during rotation. This structure can effectively reduce the positional changes of electromagnetic functional structural components caused by base instability, further ensuring the stability during the test process. Moreover, since the high-temperature resistant base 3 is installed in the groove of the rotating disk 2 by bolts 10, this detachable design makes the installation and disassembly of the base very convenient.

[0023] Regarding the technical solution of this embodiment, one side of the clamp support arm 4 and the clamp support arm 5 are connected to the insulation board 8 by flame-retardant and high-temperature resistant adhesive. In a high-temperature testing environment, the electromagnetic functional structural component needs to be heated to a high temperature (such as room temperature to 1200°C). The insulation board 8 can effectively block the rapid dissipation of heat to the surrounding environment, so that the heat is concentrated more in the electromagnetic functional structural component and its surrounding area. This helps to maintain the temperature stability of the testing environment, reduce temperature fluctuations caused by heat loss, and thus improve the accuracy and reliability of the test. Using flame-retardant and high-temperature resistant adhesive to connect the insulation board 8 can not only ensure the firmness of the insulation board 8 in a high-temperature environment, but also provide additional fire safety protection.

[0024] Regarding the technical solution of this embodiment, a fixing plate 7 is provided in the mounting groove 6. Multiple bolts 10 are threadedly connected to the side of the clamp support arm 1 4 and clamp support arm 2 5 away from the insulation plate 8. The bolts 10 abut against the fixing plate 7 to fix the electromagnetic structure component 9. The fixing plate 7 in the mounting groove 6 cooperates with the bolts 10. By the bolts 10 abutting against the fixing plate 7, the electromagnetic structure component 9 is uniformly clamped. This design avoids local stress concentration and ensures that the test piece does not shift or loosen during high temperature (room temperature to 1200℃) and rotation (such as the rotation of the rotating disk 2), thereby ensuring the accuracy of the transmission / reflection coefficient measurement. The bolts 10 are made of high temperature resistant ceramic material to avoid failure or deformation due to high temperature.

[0025] In practical use, by controlling the screw-in length of the bolt 10, the fixing plate 7 can be used to clamp and fix electromagnetic structural parts 9 of different thicknesses, which can improve the practicality of the device. At the same time, quick disassembly also facilitates the removal of the device from the test site later.

[0026] Regarding the technical solution of this embodiment, the width of the electromagnetic structural component 9 is adapted to the spacing between the first clamping arm 4 and the second clamping arm 5. The high-temperature resistant base 3 has multiple mounting holes for mounting the first clamping arm 4 and the second clamping arm 5. This adaptation ensures that the electromagnetic structural component 9 receives stable and uniform support between the clamping arms. This adaptability design effectively prevents the electromagnetic structural component 9 from shifting or tilting during testing, thereby ensuring the accuracy and reliability of the test results. The multiple mounting holes on the high-temperature resistant base 3 provide various options for mounting the clamping arms. The multiple positions of the mounting holes allow the mounting position of the clamping arms to be adjusted according to actual testing needs. For electromagnetic structural components 9 of different widths or thicknesses, the optimal fixing effect can be achieved by changing the mounting position of the clamping arms, further improving the flexibility and scalability of the device.

[0027] Regarding the technical solution of this embodiment, the thickness of the electromagnetic structural component 9 is less than the width of the mounting groove 6, and the heating area of ​​the quartz lamp heating assembly 13 is greater than that of the electromagnetic structural component 9. The thickness of the electromagnetic structural component 9 is less than the width of the mounting groove 6, which ensures that the electromagnetic structural component 9 can be easily placed into the mounting groove 6, facilitating installation and adjustment. The heating area of ​​the quartz lamp heating assembly 13 is greater than that of the electromagnetic structural component 9, which ensures that the electromagnetic structural component 9 is heated evenly throughout the heating process. This design can avoid the problem of local overheating or uneven heating caused by insufficient heating area, thereby improving heating efficiency and heating quality.

[0028] Regarding the technical solution of this embodiment, a mounting bracket 12 is fixedly connected to the bottom of the quartz lamp heating assembly 13, and a connecting groove adapted to the connecting arm 11 is provided on the mounting bracket 12. When the rotating disk 2 rotates, the quartz lamp heating assembly 13 and the electromagnetic structure 9 remain relatively stationary. The quartz lamp heating assembly 13 is fixedly connected through the mounting bracket 12, and the mounting bracket 12 is provided with a connecting groove adapted to the connecting arm 11. This design ensures the fixed stability of the heating assembly. The matching design of the mounting bracket 12 and the connecting groove can effectively prevent the heating assembly from loosening or shifting during rotation, thereby improving the structural stability of the entire device. Since the heating assembly and the electromagnetic structure 9 remain relatively stationary, heat can be transferred to the electromagnetic structure 9 more evenly, which helps to reduce the temperature gradient caused by uneven heating.

[0029] Regarding the technical solution of this embodiment, the bottom of the arc-shaped slide rail 17 is equipped with multiple support legs, and the top of the arc-shaped slide rail 17 is provided with a slide groove. The bottom of the transceiver antenna 16 is equipped with a slider that matches the slide groove. The focal center of the transceiver antenna 16 is at the same height as the center of the electromagnetic structure 9. The top of the arc-shaped slide rail 17 is provided with a slide groove, and the bottom of the transceiver antenna 16 is equipped with a slider that matches the slide groove. This design can ensure that the transceiver antenna 16 moves smoothly and steadily on the arc-shaped slide rail 17. The matching design of the slide groove and the slider reduces friction and shaking during the movement, and improves the accuracy and stability of the antenna position adjustment. Furthermore, the design of the curved slide rail 17 allows the transmitting and receiving antenna 16 to be tested at different angles. By moving the antenna on the slide rail, the angle between the antenna and the electromagnetic structure 9 can be easily adjusted, thereby enabling the measurement of the transmission coefficient and reflection coefficient at different incident angles. This design greatly improves the flexibility of testing and can meet a variety of testing needs; Furthermore, the focal center of the transceiver antenna 16 is aligned with the center height of the electromagnetic structure 9. This design ensures optimal alignment between the antenna and the electromagnetic structure 9. Precise alignment can reduce test errors caused by positional deviations and improve the accuracy and reliability of test results.

[0030] Furthermore, it also includes a controller 14 and a vector network analyzer 15, which is connected to a transceiver antenna 16 via a cable, enabling rapid acquisition and processing of test data.

[0031] In summary, this invention, based on the free space method and the bow method, integrates transmission coefficient and reflection coefficient testing through innovative design of the testing system. Using this invention, the transmission coefficient of microwave electromagnetic functional structures at incident angles of 0-60° and the reflection coefficient at 0-90° can be tested in environments ranging from room temperature to 1200°.

[0032] Example 2: This embodiment provides a method for testing an integrated electromagnetic functional structure at high temperatures, using a high-temperature integrated electromagnetic functional structure testing device described in Embodiment 1, and includes the following steps: S1. Measure the dimensions of the electromagnetic structure 9, including its length, width and thickness, and install the electromagnetic structure 9 into the mounting groove 6 of the rotating disk 2 using bolts 10 and fixing plate 7. S2. Install the quartz lamp heating assembly 13 on the connecting arm 11, and arrange the arc-shaped slide rail 17 and the transceiver antenna 16 on the outside of the electromagnetic structure 9, and connect the transceiver antenna 16 to the vector network analyzer 15. S3. Start the controller 14 and the vector network analyzer 15. When measuring the transmission coefficient, rotate the rotating disk 2 to move the electromagnetic structure 9 to an appropriate angle, and make the transceiver antenna 16 located at both ends of the arc-shaped slide rail 17. When measuring the reflection coefficient, adjust the position of the transceiver antenna 16 so that it is located in the middle of the arc-shaped slide rail 17, at a symmetrical angle with the center of the electromagnetic structure 9, and adjust the position of the quartz lamp heating assembly 13 so that it maintains a certain distance from the electromagnetic structure 9. S4. Use the quartz lamp heating assembly 13 to heat the electromagnetic structure 9, and remove the experimental site after heating is completed; S5. Record and export the data from the Vector Network Analyzer 15, and calculate the corresponding transmission coefficient and reflection coefficient.

[0033] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0034] For those skilled in the art, the specific meaning of the above terms in this invention can be understood according to the specific circumstances. When an element is referred to as being "assembled on," "mounted on," "fixed to," or "set on" another element, it may be directly on the other element or there may be an intermediate element present. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be an intermediate element present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible embodiments.

[0035] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

[0036] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this disclosure. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

Claims

1. A high-temperature electromagnetic function structure integrated testing device applied to microwave electromagnetic structure (9) testing, characterized in that, Including rotating disc (2), detachable high temperature resistant base (3) is installed on rotating disc (2), the top of high temperature resistant base (3) is detachably installed with clamp arm one (4) and clamp arm two (5), the opposite side of clamp arm one (4) and clamp arm two (5) is equipped with installation groove (6), and electromagnetic structural member (9) is detachably fixed in installation groove (6); One side of rotating disc (2) is fixedly installed with connecting arm (11), and quartz lamp heating assembly (13) is detachably installed through connecting arm (11), and arc-shaped slide rail (17) is arranged on the periphery of rotating disc (2), arc-shaped slide rail (17) is concentrically arranged with rotating disc (2), and two groups of transceiver antennas (16) are slidably connected on arc-shaped slide rail (17); When two groups of transceiver antennas (16) are located at both ends of arc-shaped slide rail (17), the transmission coefficient test of electromagnetic structural member (9) is realized, and when two groups of transceiver antennas (16) are located at the middle of arc-shaped slide rail (17), the reflection coefficient test of electromagnetic structural member (9) under different electromagnetic wave angles is realized.

2. The device of claim 1, wherein: The lower side of rotating disc (2) is installed with high temperature resistant rotary table (1) through ball bearing, and the top of rotating disc (2) is provided with recess matched with high temperature resistant base (3), and high temperature resistant base (3) is detachably installed in the recess through bolt (10).

3. The device of claim 2, wherein: One side of clamp arm one (4) and clamp arm two (5) is connected with heat insulation board (8) through fire-retardant high temperature resistant glue.

4. The device of claim 3, wherein: The installation groove (6) is provided with a fixed plate (7), and a plurality of bolts (10) are threadedly connected to the side of the clamp arm one (4) and the clamp arm two (5) away from the heat insulation board (8), the bolts (10) abut on the fixed plate (7), for fixing the electromagnetic structural member (9).

5. The device of claim 4, wherein: The width of the electromagnetic structural member (9) is matched with the spacing between the clamp arm one (4) and the clamp arm two (5), and a plurality of mounting holes for mounting the clamp arm one (4) and the clamp arm two (5) are formed on the high temperature resistant base (3).

6. The device of claim 5, wherein: The thickness of the electromagnetic structural member (9) is less than the width of the installation groove (6).

7. The device of claim 6, wherein: The bottom of the quartz lamp heating assembly (13) is fixedly connected with a mounting bracket (12), and the mounting bracket (12) is provided with a connecting groove matched with the connecting arm (11), and when the rotating disc (2) rotates, the quartz lamp heating assembly (13) and the electromagnetic structural member (9) remain relatively stationary.

8. The device of claim 7, wherein: A plurality of supporting legs are installed at the bottom of the arc-shaped slide rail (17), and a sliding groove is formed at the top of the arc-shaped slide rail (17), and a sliding block matched with the sliding groove is installed at the bottom end of the transceiver antenna (16), and the focal length center of the transceiver antenna (16) is consistent with the center height of the electromagnetic structural member (9).

9. The device of claim 8, wherein: It also includes a controller (14) and a vector network analyzer (15), and the vector network analyzer (15) is connected with the transceiver antenna (16) through a cable.

10. A method for testing electromagnetic function structure integration at high temperature, using the electromagnetic function structure integration testing device of any one of claims 1 to 9, characterized in that, The steps include: S1. Measure the size of the electromagnetic structural member (9), including length, width and thickness, install the electromagnetic structural member (9) in the installation groove (6) of the rotating disc (2) by using the bolt (10) and the fixed plate (7). S2. Install the quartz lamp heating assembly (13) on the connecting arm (11), and arrange the arc-shaped slide rail (17) and the transceiver antenna (16) outside the electromagnetic structure (9), and connect the transceiver antenna (16) with the vector network analyzer (15); S3. Start the controller (14) and the vector network analyzer (15), when measuring the transmission coefficient, rotate the rotating disc (2) to drive the electromagnetic structure (9) to move to the appropriate angle, and make the transceiver antenna (16) located at both ends of the arc-shaped slide rail (17); When measuring the reflection coefficient, adjust the position of the transceiver antenna (16) to be located at the middle position of the arc-shaped slide rail (17), which is symmetrically angled with the center of the electromagnetic structure (9), and adjust the position of the quartz lamp heating assembly (13) to keep a certain distance from the electromagnetic structure (9); S4. Heat the electromagnetic structure (9) with the quartz lamp heating assembly (13), and remove the experimental site after heating is completed; S5. Record and export the data of the vector network analyzer (15), and calculate the corresponding transmission coefficient and reflection coefficient.

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