Recording apparatus and method for generating 3D record of three-dimensional object

Abstract

The invention relates to a recording device (10) for generating a 3D recording of a three-dimensional object (11), the device comprises a light source (13) for generating a light beam (14) in a pattern plane (15), a first optical splitter (16) for separating an illumination light beam (17) from the light beam (14) and separating a recording light beam (18) from an observation light beam (19) reflected by an object (11), and a dispersion element (24) for focusing the illumination light beam (17) separated by the first optical splitter (16) onto a plurality of projection planes (12), the invention relates to a recording device (10) for recording a three-dimensional object (11), comprising a recording beam (18), a second beam splitter (25) for dividing the recording beam (18) into a first recording beam component (26) and a second recording beam component (27), an acquisition unit (31) with a first matrix sensor (36) and a second matrix sensor (38), and a calculation unit (40) for generating a 3D recording of the three-dimensional object (11).

Description

[0001] The present invention relates to a recording apparatus having the features described in independent patent claim 1 and a method having the features described in independent patent claim 14.

[0002] In many technological fields, generating 3D records has become a necessity. However, in some areas, the objects to be recorded are small and difficult to access, yet recording from various inaccessible angles is necessary to obtain 3D images. Simultaneously, the recording equipment cannot be too large and must be flexible, ideally portable. For example, in-situ 3D recording is required when analyzing components within a device or module without disassembling it. One application is recording the shape of machined or injection-molded components in their assembled state to determine assembly-related deformations.

[0003] EP 1084379 A1 discloses a photoelectric shape acquisition method using color difference encoding on an illumination plane, wherein the light reflected from the sample is subjected to spectral analysis. Its drawback is the requirement for spectral measurement.

[0004] A spectral confocal scanning device is known in US 20140043619 A.

[0005] DE 102020110298 A1 discloses an apparatus and method for optically measuring surface topography, wherein multiple single images are recorded at different wavelengths. A drawback of this method is its slow speed.

[0006] A spectral confocal measuring device for distance measurement is known in DE 102016211748 A1.

[0007] DE 102015210016 A1 discloses a method for determining the spatially resolved height information of a sample using a wide-field microscope. This method employs a modulation method to determine the height information pixel-by-pixel. A drawback of this method is its slow speed.

[0008] WO 2013 / 171309 A discloses an optical microscope and a method for recording images using the optical microscope, which operates using a galvanischer spiral. A drawback is the presence of moving parts.

[0009] WO 99 / 24786 A describes a photoelectric system based on spatial dispersion triangulation, which employs a prism-based spectrometer assembly. Its drawbacks include system complexity. Furthermore, the prism exhibits material-dependent dispersion characteristics.

[0010] A measuring device for three-dimensional measurement of an object is known in DE 102007019267 A1, which operates using a dot matrix illumination and a prism-based spectrometer assembly. Similar assemblies are also known from patent DE102009025815 A1.

[0011] DE 102020200214 A1 discloses a confocal measuring device for 3D measurement of an object surface, which operates using an aperture stop and a lens array.

[0012] An optical surface measuring apparatus having a longitudinal dispersion device is known in DE 3428593 A1.

[0013] A method and components for a fast and robust spectral confocal 3D measurement technique are known in DE 102006007170 A1, which uses a prism to spectrally decompose light.

[0014] WO 2019 / 176938 A1 discloses a wavelength detector and a confocal measurement device that requires a spectral analysis device.

[0015] DE 102013008582 A1 discloses a method and apparatus for spectral confocal multi-point measurement, wherein the distance is scanned point by point. The disadvantage of this method is its slow speed.

[0016] WO 95 / 00 871 A1 discloses a three-dimensional imaging device comprising a broadband light source, components for forming point light sources, a focusing element for focusing the light from each point light source onto an object, a beam splitter, a color filter unit, multiple light sensors, and an electronic processing unit for determining the positions of points on the object parallel to the axis of the focusing element. The focusing element exhibits axial dispersion characteristics. This device is suitable for three-dimensional inspection. However, this imaging device has a Nipkoff disk element, i.e., it has movable elements. Such imaging devices are relatively large, thus limiting their application range. Furthermore, the movable elements lead to structural complexity and a susceptibility to failure.

[0017] Therefore, the object of the present invention is to overcome at least part of the above-mentioned disadvantages. In particular, the object of the present invention is to provide a recording device that occupies little space, has a fast recording speed, and has no rotating or moving parts.

[0018] The aforementioned objective is achieved by a recording apparatus having the features described in independent patent claim 1 and a method having the features described in independent patent claim 14. Other features and details of the invention are derived from the dependent claims, the specification, and the drawings. Herein, the features and details described in connection with the recording apparatus according to the invention also apply to the method according to the invention, and vice versa, so that reference can always be made to each other in relation to the disclosure of each aspect of the invention.

[0019] A first aspect of the present invention is a recording apparatus for generating 3D recordings of three-dimensional objects, wherein the recording apparatus has a plurality of projection planes for illuminating the object, wherein the plurality of projection planes are capable of projecting onto the object, wherein each projection plane is separated from an intermediate projection plane of the plurality of projection planes by a wavelength-dependent distance, and the recording apparatus has:

[0020] - A light source used to generate light beams in the patterned plane;

[0021] - The first beam splitter is used to separate the illumination beam from the beam and the recording beam from the observation beam reflected by the object.

[0022] - The first beam splitter has: a first beam splitter input for receiving a beam, and

[0023] - The output of the first beam splitter used to output the illumination beam, and

[0024] - The second beam splitter input for receiving the observation beam, and

[0025] - The output of the second beam splitter used to output the recorded beam.

[0026] The input end of the second beam splitter corresponds to the output end of the first beam splitter;

[0027] - A dispersive element, used to focus the illumination beam separated by the first beam splitter onto the plurality of projection planes.

[0028] - The method is to make the pattern plane conjugate with each of the plurality of projection planes at a specific projection wavelength;

[0029] - A second beam splitter, used to divide the recording beam into a first recording beam component and a second recording beam component.

[0030] - The second beam splitter has: a third beam splitter input for receiving the recorded beam, and

[0031] - The output of the third beam splitter used to output the first recorded beam component, and

[0032] - The fourth beam splitter output terminal used to output the second recorded beam component;

[0033] - Acquisition unit, used to acquire a first image in a first image plane of a first recording beam component of an object, and to acquire a second image in a second image plane of a second recording beam component of an object.

[0034] The acquisition unit includes: a first matrix sensor for acquiring first intensity data of a first recording beam component in a two-dimensional manner in a first image plane as a first image, wherein the first matrix sensor is arranged downstream of the third beam splitter output of the second beam splitter relative to the beam direction of the first recording beam component.

[0035] - A second matrix sensor is used to acquire, in two dimensions, the second intensity data of the second recording beam component in the second image plane as a second image, wherein the second matrix sensor is arranged downstream of the fourth beam splitter output of the second beam splitter relative to the beam direction of the second recording beam component.

[0036] -In this image, the first image and the second image have corresponding image points, and these corresponding image points can be assigned to the same object points of the three-dimensional object respectively;

[0037] - A computing unit is used to calculate at least one longitudinal coordinate of each of multiple object points of an object based on corresponding image points of the first image and the second image, so as to generate a 3D record of the three-dimensional object.

[0038] A projection plane can be projected onto an object. This means that the recording device can be positioned such that the object is at least partially located within the projection plane. For a fixedly mounted recording device, the object can be placed within the projection plane so that it can be at least partially imaged onto the matrix sensor. Advantageously, the optical axis can intersect the object. Mathematically, the projection plane can be a family of projection planes, with the longitudinal coordinate zp along the optical axis as its parameter, where the longitudinal coordinate zp is a function of the projection wavelength λ.

[0039] The pattern plane is conjugate to each of the plurality of projection planes at a specific projection wavelength. This can be understood as the pattern plane being clearly projected onto the projection plane at a specific projection wavelength. Advantageously, for a given projection wavelength, the path between the pattern plane and the projection plane may not have any other conjugate planes (intermediate image planes). Due to the spectral bandwidth of the light beam, there are multiple projection planes, which can be perpendicular to the optical axis and parallel to each other, and each can be spaced apart from the intermediate projection plane. The intermediate projection plane can be a projection plane conjugate to the pattern plane at the average projection wavelength (i.e., the average wavelength of the light source).

[0040] If the surface of an object intersects a specific projection plane at a point or a line, that point or line can be clearly imaged onto the first and second matrix sensors at the projection wavelength corresponding to that projection plane. At all other wavelengths of the light source, the line cannot be clearly imaged onto the matrix sensors. Therefore, when a clear imaging wavelength is obtained for an image point or multiple image points located on a line, a projection plane containing the aforementioned intersection point or line can be determined.

[0041] The first and second images have corresponding image points, which can be assigned to the same object point of the three-dimensional object. The object can be imaged onto both matrix sensors simultaneously. Therefore, each imaged object point can correspond to an image point on the first sensor and an image point on the second sensor. The image point on the first sensor and the image point on the second sensor are the corresponding image points.

[0042] Two identical matrix sensors can be used and aligned in the same way. This way, corresponding image points can have the same index on both the first and second matrix sensors. However, the image on the second matrix sensor can also be mirrored relative to the first matrix sensor. Thus, the indices of corresponding image points can also be mirrored accordingly, and appropriate conversions can be performed to determine the corresponding image points.

[0043] A particularly advantageous feature is that the light beam extends planarly within the pattern plane. Here, planar extension means that the light beam can illuminate the entire sensor surface of both the first and second matrix sensors. Alternatively, mathematically speaking, this means that the dimensions of the illuminated surface of the light source, multiplied by the projection and imaging scales respectively, exceed the corresponding dimensions of the matrix sensors.

[0044] Here, the light source extends to the pattern plane. This means that the pattern plane is positioned in the optical path before the first beam splitter.

[0045] A pattern is arranged in a patterned plane, which is projected onto an object by a beam of light. Advantageously, the pattern in the patterned plane can alternately have at least one first pattern position and at least one second pattern position in at least one direction. Patterns with different luminous exitance at the first and second pattern positions can be primarily used, and the spectral distributions of the first and second pattern positions can be identical. Advantageously, the intensity of the second pattern position can ideally be zero, i.e., dark, meaning it blocks light or does not emit light. The pattern can represent local modulation of luminous exitance. Although there is local modulation of luminous exitance, the color temperature can be position-independent. Advantageously, the first and second images can be evaluated only at the bright image positions corresponding to the first pattern positions. If the pattern includes dark second pattern positions (ideally with zero intensity), these positions may appear dark on the image sensor. However, these positions in the image may contain background radiation and therefore may have non-zero intensity values. These background intensity values ​​can be used to correct the intensity values ​​present at the bright first image location, and in particular, the intensity values ​​at the first (bright) location can be corrected individually for each matrix sensor by utilizing the intensity values ​​at the corresponding adjacent second (dark) locations.

[0046] As a photometric quantity, luminous exitance can refer to the luminous flux emitted by the elements on the surface of a light source.

[0047] Matrix sensors can be designed, for example, as CCD or CMOS sensors for recording images pixel by pixel, or as vidicon-Röhren (light-guided camera tube). Here, spatially resolved light intensity values ​​can be recorded as images.

[0048] The input of the second beam splitter corresponds to the output of the first beam splitter. This means that the path of the observation beam incident into the first beam splitter is the same as the path of the illumination beam exiting, only in the opposite direction. If the first beam splitter is designed as a beam splitting cube, then the output of the first beam splitter and the input of the second beam splitter can be on the same side of the cube.

[0049] The second beam splitter is configured to divide the recording beam into a first recording beam component and a second recording beam component. The recording beam can be divided into two components according to a splitting ratio that is continuously and monotonically dependent on the wavelength. Therefore, the splitting ratio of the second beam splitter can have a second wavelength dependence. Thus, the wavelength can be derived from the intensity ratio of corresponding image points on the first and second matrix sensors.

[0050] A dispersive element can be understood as a transmission optical element whose focal length is strongly dependent on wavelength. Chromatic aberration can be particularly significant in a dispersive element compared to an achromatic lens. Advantageously, the focal length can be monotonically dependent on wavelength. Chromatic focus shift can be achieved through a wavelength-dependent focal length. This effect is generally undesirable and is referred to as longitudinal chromatic aberration in optical literature. However, this longitudinal chromatic aberration can be utilized within the scope of this invention. A dispersive element can have positive optical power and therefore can function as a converging lens. Positive optical power can be caused by light refraction at interfaces, light refraction due to internal refractive index gradients, and / or diffraction of light waves. Therefore, Fresnel zone plates can be used, for example, to focus light rays and, in the sense of this invention, are classified as having "positive optical power," although their focusing effect is produced by light diffraction.

[0051] The chromatic aberration focus shift of a dispersive element can be described by the longitudinal chromatic aberration constant. Ideally, the longitudinal chromatic aberration constant can be greater than 1 mm / 100 nm, particularly advantageously 10 mm / 250 nm, and best of all 10 mm / 150 nm.

[0052] Examples of dispersive elements include combinations of high-refractive-index lenses (Abbe number less than 45, ideally less than 25) and low-refractive-index lenses (Abbe number greater than 55, ideally greater than 80). Examples of lens combinations include H-ZF71 / N-LASF41 (double lens group) or S-NPH7 / LASFN31 / H-ZF71GT (triple lens group). Low-Abbe number lenses can be used as converging lenses in the combination, while high-Abbe number lenses can be used as diverging lenses, where the entire combination should have positive optical power.

[0053] According to the present invention, a computing unit is provided for calculating at least one longitudinal coordinate of each of a plurality of object points based on corresponding image points of a first image and a second image, to generate a 3D record of a three-dimensional object. As described above, an object point can only be clearly imaged onto a matrix sensor when it is located in a projection plane corresponding to a specific wavelength. The intensity of a clearly imaged object point in the image is higher than that of an unclearly imaged object point. The wavelength λ[x,y] of clear imaging can be determined based on the intensities of two image points corresponding to object point [x,y] in the first and second images. For example, it can be done according to the following formula:

[0054]

[0055] λ0 can be the average wavelength of the light source. The value k2 is a constant of the device, which can be determined through calibration. 传感器1 [x,y] represents the intensity of the image point on the first sensor, I 传感器2[x,y] represents the intensity of the image point on the second sensor. The longitudinal coordinate z[x,y] can be calculated from λ[x,y]. Each projection wavelength λ corresponds to a projection plane zp(λ). Its longitudinal coordinate zp(λ) can be expressed as z(x,y) = zp[λ(x,y)]. By substituting the dependencies, the longitudinal coordinate z can also be calculated directly from the intensity values. The dependency of the longitudinal coordinates of the projection plane zp(λ) can be calibrated, calculated based on the first wavelength dependency of the dispersive element, or determined through ray tracing simulation. By determining the longitudinal coordinates of multiple object points (ideally all imaged object points), a three-dimensional record of the object can be obtained; more precisely, a three-dimensional record of the object's surface. This method allows the creation of a 3D record in a single recording cycle (real-time image). This 3D record can exist as a set of spatial points [x,y,z] on the object's surface. This calculation can be performed using a computing unit.

[0056] In particular, if the second wavelength dependence (i.e., the wavelength dependence of the second beam splitter) is non-linear, a calibration function can be used instead of the above formula to calculate the wavelength of the associated sharp image based on the intensity value. Such a calibration function can be stored, for example, in the form of an analytical function or in the form of a look-up table.

[0057] The recording device allows for depth and difference calculations to generate a 3D record by imaging onto two sensors, where the depth calculations used to generate the 3D record are independent of the light intensity of the light source.

[0058] The structure of the recording device allows for the maximum utilization of available light.

[0059] Higher resolution can be achieved because a spectrometer can be eliminated, since there is no need to spectrally extend the sensor pixels.

[0060] Furthermore, this simplified structure allows the recording device to be designed as a mobile device. This enables, for example, recording of components within a device or module without disassembling it. Applications can also be envisioned for recording the detailed shape of bones in fossils. Additionally, the device can be used in the medical and dental fields for prosthesis fabrication, such as creating skeletal models for internal prostheses, or for creating three-dimensional models of teeth or tooth segments.

[0061] Advantageously, within the scope of this invention, the light source comprises a first divergent light emitter and a first collimating optics. The light emitter can be designed to be small in area, ideally a point light source, such as an LED. Through divergence, the light radiation can diffuse planarly within the patterned plane. The first collimating optics ensures that the radiation is oriented uniformly within the patterned plane.

[0062] The light source may include first pattern units having a first pattern, wherein the first pattern is arranged in a pattern plane. This facilitates the generation of patterns in the pattern plane. Simultaneously, because the pattern or pattern units are close to the light source, it ensures that the pattern is well mapped onto the object when it is illuminated. Or more precisely, it ensures that the pattern is well projected onto the plurality of projection planes. This enables the pattern planes to be clearly mapped onto the object at a projection wavelength that provides pixel-by-pixel clear imaging, thereby enabling the generation of clear 3D recordings.

[0063] At the same time, this is also an advantageous way to generate different light exit values, so as to use them for depth calculation and, in turn, for calculating the longitudinal coordinates necessary for generating 3D records of object points based on the corresponding image points.

[0064] Here, the divergent light emitter can be arranged in the light emitter plane, and there can be a plane conjugate to this light emitter plane, which is arranged between the first beam splitter and the object, particularly before the projection plane, or more precisely before the first projection plane among these projection planes. It is particularly advantageous that the plane conjugate to the light emitter plane can be arranged at the location of the dispersive element. The optical path described in this paragraph can be understood as another optical path intersecting with the projection optical path, such as the optical path known from Köhler illumination. The path between the light emitter and the projection plane can advantageously have exactly one plane conjugate to the light emitter plane.

[0065] Similarly, the light source can be a planar radiator, which can be directly arranged in the pattern plane. It is also conceivable that the pattern units are integrated into the light source.

[0066] Alternatively, it can be envisioned that the pattern unit has a second pattern, which is the reverse of the first pattern. This allows for the formation of a planar light distribution in the pattern plane. Advantageously, the first and second patterns can be provided sequentially. For this purpose, the pattern unit can be designed to be switchable. Particularly advantageously, the first pattern can be a checkerboard pattern, while the second pattern can be its reverse, i.e., the light and dark positions are interchanged.

[0067] Within the scope of this invention, it is conceivable that a first deflecting mirror is disposed between the light source and the first beam splitter to deflect the illumination beam at a specific angle, especially at an obtuse angle, and / or a second deflecting mirror is disposed between the dispersive element and the object to deflect the observation beam at a specific angle, especially at an obtuse angle.

[0068] By using a first deflector and / or a second deflector, the light beam can be deflected, specifically the illumination beam and the observation beam. This affects the beam path, allowing it to adapt to spatial constraints. Therefore, by using deflectors, the installation space of the recording device can be adjusted according to user needs or the application area. This is particularly advantageous for mobile applications.

[0069] Within the scope of this invention, it may be proposed that a second collimator be arranged between the light source and the first beam splitter, and / or a focusing optical device be arranged between the first beam splitter and the second beam splitter.

[0070] This allows the illumination beam to have a parallel beam segment at the second collimator and the observation beam at the first beam splitter.

[0071] Focusing optics focus the observation beam, thus reducing installation space. Furthermore, the positioning of the focusing optics has a positive impact on the generation of 3D records.

[0072] Alternatively, the recording device could be designed without rotating elements. This simplifies the device's structure, reducing mechanical complexity and consequently minimizing wear and downtime. Furthermore, moving parts increase cost and design effort, while eliminating them reduces these costs and workload.

[0073] It can also be envisioned that the dispersive element includes diffractive optical elements and / or Fresnel lenses and / or superlenses and / or combinations of flint glass positive lenses and crown glass negative lenses. The dispersive element can also be a Fresnel zone plate.

[0074] A diffractive optical element (DOE) is an optical component that manipulates light waves through a diffraction process. It consists of microstructures or patterns that can control the phase or amplitude of incident light.

[0075] A Fresnel lens is a compact optical component that uses a series of concentric grooves on its surface to converge light. Compared to traditional lenses, Fresnel lenses are constructed to require less material and are lighter in weight, making them ideal for applications where size and weight are critical, such as lighthouses, projectors, camera lenses, and in-situ probes.

[0076] Superlenses are a concept in physics and metamaterials science, where artificially manufactured materials are used to create novel optical devices. These metamaterials possess unique properties that allow them to manipulate light in unconventional ways, creating lenses with exceptional functionality. Unlike traditional refractive lenses, superlenses guide light through sub-wavelength structures, enabling ultra-compact, high-resolution imaging systems. The design and implementation of superlenses hold immense potential for revolutionizing a wide range of optical applications, including microscopy, imaging, and data communication.

[0077] Flint glass lenses are lenses made of optical glass characterized by their high refractive index and high dispersion. They are made from a special composition based on quartz and lead oxide, with an Abbe number of less than 50. The addition of lead oxide gives flint glass unique optical properties, making it suitable for manufacturing lenses and prisms used in optical instruments such as telescopes, microscopes, and camera lenses. The high refractive index of flint glass allows it to diffract light better, while its dispersive properties break light down into individual colors, which is crucial for correcting chromatic aberration in optical systems.

[0078] Crown glass lenses are lenses made of optical glass with a relatively low refractive index and low dispersion. They are made from a special composition based on quartz and potassium oxide, and have an Abbe number greater than 50.

[0079] In optical systems, crown glass lenses are commonly used to correct chromatic aberration because their refractive index differs from that of flint glass lenses. The combined use of crown and flint glass lenses helps reduce chromatic aberration and improves the overall optical performance of the system.

[0080] Within the scope of this invention, it is optional to provide a mask, especially a shadow mask (e.g., a structured black chrome plate) or a pixel-controllable TFT display or a pixel-controllable backlit LCD display, for generating a first pattern of the first pattern unit.

[0081] These designs can generate patterns with particular simplicity and reliability. Here, the pattern can be designed as a uniformly illuminated surface, or as an illuminated area that is advantageously arranged symmetrically in at least one direction, particularly advantageously in two linearly independent directions, and is surrounded by an unilluminated area.

[0082] Here, the mask, TFT display, or LCD display can generate the pattern as a striped pattern, checkerboard pattern, light and dark honeycomb pattern, or aperture grid pattern. Advantageously, the pattern can have a translational symmetry period length of 0.010 mm to 0.5 mm. Advantageously, the pattern period can be 10 to 1000.

[0083] In this regard, especially for displays, the period length or structure of the pattern can be easily and quickly adapted to changing application areas.

[0084] Furthermore, within the scope of this invention, it can be proposed that the second beam splitter includes a first filter and / or a second filter, wherein the first filter is disposed at the third beam splitter output of the second beam splitter for wavelength-dependent filtering of the first recorded beam component, and / or the second filter is disposed at the fourth beam splitter output of the second beam splitter for wavelength-dependent filtering of the second recorded beam component.

[0085] Wavelength-dependent filtering via a first and / or second filter offers numerous advantages for 3D recording acquisition. By simultaneously acquiring scene information at multiple wavelengths, depth information can be obtained, facilitating accurate 3D reconstruction. Spectral imaging can better distinguish different structures within a scene, resulting in more precise and detailed 3D representations. The use of these filters allows for the use of cost-effective, wavelength-independent beam splitter mirrors.

[0086] It is particularly advantageous here that the transmittance of the first filter monotonically increases with wavelength, and / or the transmittance of the second filter monotonically decreases with wavelength.

[0087] The monotonically increasing transmittance of an optical filter with wavelength means that the filter's transmittance increases continuously with increasing wavelength. In other words, the longer the wavelength of light, the more light passes through the filter. Therefore, this relates to filters whose transmittance increases with increasing wavelength. In this way, first and second recorded beam components with different wavelength dependencies can be filtered and received by a matrix sensor, allowing the wavelength of each pair of image points to be derived from the intensity ratio of the corresponding image points.

[0088] Equally advantageous is the ability to use a second beam splitter that inherently possesses a monotonically wavelength-dependent splitting ratio without the need for a filter. This can be achieved using a dielectric mirror layer with a reflectivity that varies continuously with wavelength. This offers the advantage of eliminating the need for filters, thus providing more light to the matrix sensor.

[0089] For the purposes of this invention, it can be proposed that the dispersive element has positive optical power, wherein the optical power has a first wavelength dependence, particularly a first monotonic wavelength dependence.

[0090] The positive optical power of a dispersive element means that the element is able to converge and focus a beam of light. It can have a convex shape and can be used to converge beams.

[0091] The advantage of a positive optical power dispersive element lies in its ability to selectively generate chromatic aberration in the illumination path and then compensate for it in the observation path. Chromatic aberration is a ubiquitous optical distortion that occurs when different colors of light are focused at different points. This distortion leads to color fringing and reduced image sharpness in photography, but in this case, especially in the form of longitudinal chromatic aberration, it can be intentionally utilized.

[0092] This characteristic is particularly advantageous for accurately reproducing patterns using recording devices to generate 3D records, such as when recording three-dimensional surface models to accurately reproduce the structure of an object. By generating chromatic aberration, the dispersive element can determine the longitudinal coordinates of the object's surface (i.e., the longitudinal coordinates along the optical axis).

[0093] Furthermore, it can be proposed that the splitting ratio of the first beam splitter is 80:20 to 20:80, preferably 70:30 to 30:70, and more preferably 60:40 to 40:60. The splitting ratio of the first beam splitter can be independent of wavelength. Here, the first beam splitter is used to separate the illumination beam from the beam and uniformly guide the observation beam onto the matrix sensor. The remaining portion of the illumination beam can be discarded as a residual beam.

[0094] The second beam splitter can have a second wavelength dependence, especially a second monotonic wavelength dependence.

[0095] The second beam splitter divides the recording beam into a first recording beam component and a second recording beam component based on wavelength. The spatially related wavelength information attached to the recording beam can be converted into spatially related intensity information, thus eliminating the need for a spectrometer to obtain the wavelength information.

[0096] Beam splitters offer versatility and efficiency in imaging systems, making them invaluable tools for acquiring and analyzing complex visual information in a variety of scientific, medical, and industrial applications.

[0097] Advantageously, within the scope of this invention, the first beam splitter and / or the second beam splitter may include a beam splitter plate or a beam splitter cube.

[0098] Here, the implementation of the first and second beam splitters can be selected based on the available installation space. This increases the flexibility of the recording device design.

[0099] Within the scope of this invention, it is conceivable that the light beam is a broadband spectral beam having a spectral bandwidth of at least 100 nm in the wavelength range of 400 nm to 1100 nm. Advantageously, the bandwidth can be at least 150 nm, and particularly advantageously at least 200 nm. Furthermore, selecting a bandwidth of less than 300 nm can help control artifacts, for example, caused by stray light or exceeding the specifications of the antireflective coating on the optical elements used, to a sufficiently low level.

[0100] The advantage of using broadband beams for 3D recording is that it can simultaneously acquire a wide wavelength range, thereby improving the accuracy and versatility of the acquired data.

[0101] Broadband beams offer higher depth resolution in 3D imaging because they encompass different wavelengths, allowing for more efficient measurement of diverse surface features. Increasing the beam bandwidth also expands the range of depths that can be acquired.

[0102] Using broadband beams can capture fine details and complex surface structures that narrowband light sources may not be able to capture.

[0103] With its wider wavelength range, broadband light helps to make accurate measurements of objects with different reflectivities and enables more comprehensive and reliable 3D recording of objects.

[0104] Within the scope of this invention, it can be proposed that the numerical aperture NA of the illumination point on the object has a range of NA = 0.05 to NA = 0.25, preferably NA = 0.08 to NA = 0.18, and more preferably NA = 0.10 to NA = 0.14. Preferably, the object can be illuminated by a telecentric illumination path formed between the dispersive element and the object, and / or the object can be acquired by a telecentric observation path formed between the dispersive element and the object. The telecentricity of the above-mentioned illumination path and / or observation path can reduce, and ideally eliminate, interfering lateral chromatic aberration. It is particularly advantageous that both of the above-mentioned telecentricities exist.

[0105] The numerical aperture of an object is a measurement of a recording device that indicates how much light the device can capture from a point on an object. It is determined by the numerical aperture of the illumination optics and the illumination source.

[0106] A larger numerical aperture for illumination allows more light to enter the recording device, thus revealing more detail and fine structures. A higher numerical aperture can improve the resolution and contrast of the recording device. The numerical aperture is also used to minimize interfering lateral chromatic aberration that may occur during object recording. However, excessively high numerical apertures can increase the size of the device and lead to image distortion. Therefore, an upper limit for the numerical aperture is suggested above, and a range proven effective is given.

[0107] A second aspect of the present invention is a method for generating 3D recordings of three-dimensional objects, particularly utilizing a recording apparatus according to a first aspect of the present invention, the method comprising the following steps:

[0108] - Arrange three-dimensional objects on multiple projection planes of the recording device;

[0109] - Illuminating a 3D object involves the following sub-steps:

[0110] - A light beam is generated in the pattern plane by a light source.

[0111] -The generated light beam is received at the input terminal of the first beam splitter.

[0112] -The illumination beam is separated from the beam by the first beam splitter.

[0113] -The separated illumination beam is output from the output terminal of the first beam splitter.

[0114] - The output illumination beam is focused onto the plurality of projection planes by a dispersive element, wherein the pattern plane is projected, and wherein the pattern plane is conjugate with each of the plurality of projection planes at a specific projection wavelength.

[0115] - Acquiring data from 3D objects involves the following sub-steps:

[0116] - Reflect the illumination beam as the observation beam using a three-dimensional object.

[0117] - Pass the observation beam through the dispersive element.

[0118] The observed beam is received through the second beam splitter input of the first beam splitter, wherein the second beam splitter input corresponds to the first beam splitter output.

[0119] -The recording beam is separated from the observation beam by the first beam splitter.

[0120] -The separated recording beam is output from the output terminal of the second beam splitter of the first beam splitter.

[0121] -The recorded beam is received at the input of the third beam splitter through the second beam splitter.

[0122] -The recording beam is divided, in particular, monotonically and wavelength-dependently, into a first recording beam component and a second recording beam component by a second beam splitter.

[0123] - The first recorded beam component is output through the output terminal of the third beam splitter of the second beam splitter, and

[0124] - The second recorded beam component is output from the output terminal of the fourth beam splitter of the second beam splitter.

[0125] -The first intensity data of the first recorded beam component is acquired in two dimensions using the first matrix sensor of the acquisition unit, and used as the first image of the first image plane.

[0126] - The second matrix sensor of the acquisition unit acquires the second intensity data of the second recorded beam component in two dimensions as the second image of the second image plane, wherein the first image and the second image have multiple corresponding image points, and these corresponding image points are respectively assigned to the object points of the illuminated object.

[0127] - By using a computing unit, at least one longitudinal coordinate of multiple object points of an object is calculated based on corresponding image points of the first image and the second image to generate a 3D record of the object.

[0128] Here, the object can be illuminated by a telecentric optical path formed between the dispersive element and the object. Alternatively or additionally, the object can be acquired by a telecentric optical path formed between the dispersive element and the object. This telecentricity can reduce, and ideally eliminate, interfering lateral chromatic aberration.

[0129] In this paper, an image point refers to a pixel or a cluster of pixels, where image points can be paired (i.e., one image point in the first image corresponds to one image point in the second image), so each pair of image points represents the imaging of the same object point. A cluster of pixels can be adjacent pixels in a sensor, which are combined using pixel binning techniques to, for example, improve the sensor's light sensitivity and / or image processing speed.

[0130] Reflecting an illumination beam into an observation beam can be achieved through reflection and / or light scattering.

[0131] It is also conceivable that the light source includes pattern units with a first pattern, wherein the first pattern is arranged in a pattern plane such that, at the assigned projection wavelength, the first pattern of the pattern plane is clearly projected onto the pattern-projection plane among the plurality of projection planes, while the projection on other projection planes at the same wavelength may be unclear.

[0132] Advantageously, the pattern can have a translational symmetry period length of 0.010 mm to 0.5 mm. Advantageously, the pattern period can be 10 to 1000.

[0133] This makes it advantageous to generate different light exitances for use in depth calculations and, consequently, for calculating the longitudinal coordinates necessary for generating 3D records of object points based on the corresponding image points.

[0134] Alternatively, it can be envisioned that multiple projection planes are conjugate with the first image plane and the second image plane to calculate the longitudinal coordinates.

[0135] Optionally, within the scope of this invention, the pattern in the pattern plane alternately has a first pattern position and a second pattern position in at least one direction, wherein the first pattern position has a first light exitance, and the second pattern position has a lower second light exitance, particularly zero light exitance, and the second pattern position produces a darkened image position in the first and second images, and the intensity value of the adjacent undarkened image position is corrected in the first and second images using the intensity value of the darkened image position before calculating the longitudinal coordinates. The first light exitance can remain constant at the first pattern position, i.e., independent of position and the same for all first pattern positions.

[0136] Different pattern positions can have different light emission levels, i.e., light and dark positions, which can be generated, for example, by a mask and have a checkerboard or striped pattern shape.

[0137] Different light exitance results in different intensity values ​​in the intensity data. Since these different intensities exist for a single image point and / or adjacent image points, they can be used to correct the longitudinal coordinates. This allows for the correction of systematic errors and / or the recorded intensity components caused by stray light and blurred imaging from other object regions at non-sharp imaging wavelengths before calculating the longitudinal coordinates.

[0138] Furthermore, within the scope of this invention, it can be proposed that the control unit controls the light source, wherein the light distribution of the light source is altered. In particular, a checkerboard pattern or stripe pattern can be used to generate a first 3D record of the object. In a subsequent step, a second 3D record of the object can be generated using a reversed checkerboard pattern or stripe pattern (i.e., the light and dark positions are interchanged compared to the first pattern). The first and second records can then be merged, for example, by a computing unit, to generate an improved 3D record of the object.

[0139] Control of light distribution can also calibrate the light source or light distribution according to the object to be illuminated and recorded, in order to improve the accuracy of 3D recording.

[0140] Other advantages, features, and details of the invention will become apparent from the following description of various embodiments of the invention with reference to the accompanying drawings. Here, features mentioned in the claims and specification may be essential to the invention individually or in any combination. The invention is illustrated in the following drawings:

[0141] Figure 1 A schematic diagram of a recording apparatus according to a first embodiment is shown.

[0142] Figure 2 A schematic diagram of a recording apparatus according to a second embodiment is shown.

[0143] Figure 3 A schematic diagram of a recording apparatus according to a third embodiment is shown.

[0144] Figure 4 A schematic diagram of the method according to the present invention is shown.

[0145] Figure 5 Dispersive elements are shown.

[0146] Figure 6 Another dispersive element is shown.

[0147] Figure 7 and Figure 8 The filter characteristic curve is shown as an example, and

[0148] Figure 9 The characteristic curves of the beam splitter are shown.

[0149] Figures 1 to 3 Recording apparatus 10 for generating 3D recordings of 130 three-dimensional objects 11 is shown. Here, recording apparatus 10 does not contain rotating elements. The recording apparatus 10 has a plurality of projection planes 12 for illuminating 120 objects 11, wherein the plurality of projection planes 12 can be projected onto the objects 11, and each projection plane 12 is separated from the intermediate projection plane 12 by a wavelength-dependent distance zp(λ).

[0150] Each recording device 10 includes a light source 13 for generating a beam 130 in the pattern plane 15. Figures 1 to 3 The light source 13 is a divergent light emitter 41, which includes a first collimating optics 42. Here, in... Figure 1 In this light emitter 41, the collimating optics 42 are integrated. Here, the light beam 14 is a broadband spectral beam 14, which has a spectral bandwidth of at least 100 nm in the wavelength range of 400 nm to 1100 nm.

[0151] exist Figure 2 and Figure 3 In the recording device 10, the light emitter 41 and the collimating optics 42 are two separate components, arranged spaced apart from each other. The corresponding distance zp(λ) can be adjusted according to the specific application. Besides the first collimating optics 42, Figure 2 and Figure 3 The recording device 10 also provides a second collimator 46, which is disposed between the light source 13 and the first beam splitter 16.

[0152] In addition, a first beam splitter 16, designed as a beam splitter 51, is provided to separate an illumination beam 17 from the beam 14 and a recording beam 18 from the observation beam 19 reflected by the object 11.

[0153] The first beam splitter 16 has a first beam splitter input 20 for receiving a 140 beam 14, a first beam splitter output 21 for outputting a 160 illumination beam 17, a second beam splitter input 22 for receiving a 140 observation beam 19, and a second beam splitter output 23 for outputting a 160 recording beam 18. Here, the second beam splitter input 22 corresponds to the first beam splitter output 21. Figures 1 to 3The first beam splitter 16 has a splitting ratio of 80:20 for the beam 14, such that 80% of the beam exits the first beam splitter 16 via the output terminal 21 as the illumination beam 17 for illuminating the object 11. The first beam splitter 16 also has a splitting ratio of 80:20 for the observation beam 19, such that 80% of the observation beam exits the first beam splitter 16 via the output terminal 23. In a variant of this embodiment, a beam splitter with a splitting ratio of 50:50 is used.

[0154] In order to focus the illumination beam 17 separated by the first beam splitter 16 onto the plurality of projection planes 12 Figures 1 to 3 Each of the recording devices 10 is equipped with a dispersive element 24 having positive optical power and a first monotonic wavelength dependence. This dispersive element focuses the illumination beam 17 such that the pattern plane 15 is conjugate with each of the plurality of projection planes 12 at a specific projection wavelength. Here, a Fresnel lens is provided in all embodiments. Fresnel lenses have a very compact structure and are suitable for recording devices 10 with limited installation space. Thus, the object 11 can be illuminated through the telecentric illumination path formed between the dispersive element 24 and the object 11, and acquired through the telecentric observation path formed between the dispersive element 24 and the object 11.

[0155] In the optical path of the recording beam 18, a second beam splitter 25, designed as a beam splitting cube 52, is subsequently provided to divide the recording beam 18 into a first recording beam component 26 and a second recording beam component 27.

[0156] The second beam splitter 25 provides a third beam splitter input 28 for receiving a 140-degree recording beam 18, a third beam splitter output 29 for outputting a 160-degree first recording beam component 26, and a fourth beam splitter output 30 for outputting a 160-degree second recording beam component 27. This second beam splitter exhibits a second monotonic wavelength dependence. Here, a first filter 49 is provided at the third beam splitter output 29 of the second beam splitter 25 for wavelength-dependent filtering of the first recording beam component 26, and a second filter 50 is provided at the fourth beam splitter output 30 of the second beam splitter 25 for wavelength-dependent filtering of the second recording beam component 27.

[0157] also, Figures 1 to 3The recording device 10 includes an acquisition unit 31 for acquiring a first image 32 in a first image plane 33 of a first recording beam component 26 of the object 11, and a second image 34 in a second image plane 35 of a second recording beam component 27 of the object. For this purpose, a first matrix sensor 36 is provided for acquiring first intensity data 37 of the first recording beam component 26 in two dimensions as the first image 32 in the first image plane 33. The first matrix sensor 36 is positioned downstream of the third beam splitter output 29 of the second beam splitter 25 relative to the beam direction of the first recording beam component 26. Furthermore, a second matrix sensor 38 is provided for acquiring second intensity data 39 of the second recording beam component 27 in two dimensions as the second image 34 in the second image plane 35. The second matrix sensor 38 is positioned downstream of the fourth beam splitter output 30 of the second beam splitter 25 relative to the beam direction of the second recording beam component 27. Here, the first image 32 and the second image 34 have corresponding image points, which can be assigned to the same object points of the three-dimensional object 11.

[0158] In order to calculate at least one longitudinal coordinate of each of the multiple object points of object 11 based on the corresponding image points of the first image and the second image, each recording device 10 has a calculation unit 40 for generating a 3D record of the three-dimensional object 11.

[0159] exist Figure 1 and Figure 3 In one embodiment, the corresponding recording device 10 provides a focusing optics 47 disposed between the first beam splitter 16 and the second beam splitter 25. This allows the separated recording beam 18 to be focused toward the direction of the third beam splitter input 28 of the second beam splitter.

[0160] Figure 1 , Figure 2 and Figure 3 Each has a first pattern unit 43 with a first pattern, wherein the first pattern 53 is arranged in the pattern plane 15. Here, Figure 1 The pattern units are also integrated into the light emitter 41, therefore the pattern plane 15 is the same as the radiation plane of the light emitter. Figure 2 and Figure 3 In this configuration, the pattern unit 43 is arranged in the optical path of the beam 14, located after the first collimating optical device 43. As the position of the first collimating optical device 42 changes, the position of the pattern plane 15 also shifts.

[0161] in, Figure 1 The first pattern in the image is generated by a pixel-by-pixel controllable backlit LCD display. Figure 2 and Figure 3In this example, pattern unit 43 provides a mask, which is a structured black chrome plate. It should be noted that patterns 53 and 54 in the figure are only schematic. They are actually planar patterns in pattern plane 15, i.e., perpendicular to the drawing plane.

[0162] Pattern 53 is transmitted together by the separated and reflected light beams, and therefore can be detected in the illumination beam 17, the observation beam 19, the recording beam 18, and the first recording beam component 26 and the second recording beam component 27. In this example, pattern 53 is a checkerboard pattern, thus having a first pattern position 54 with a first wavelength and / or light emissivity and a second pattern position 55 with a second wavelength and / or light emissivity. Using pattern 53 and the associated intensity data, the calculated longitudinal coordinates can be corrected, resulting in better 3D recording.

[0163] Figure 3 The recording device 10 has a small installation space. To achieve this without affecting the 3D recording quality, a first deflecting mirror 44 for deflecting the illumination beam 17 by a specific angle and a second deflecting mirror 45 for deflecting the observation beam 19 by a specific angle are provided. Here, the first deflecting mirror 44 is positioned between the light source 13 and the first beam splitter 16. Here, the first deflecting mirror 44 deflects the illumination beam 17 by an obtuse angle. The second deflecting mirror 45 is positioned between the dispersive element 24 and the object 11. Here, the second deflecting mirror 45 deflects the observation beam 19 by an obtuse angle.

[0164] Figures 1 to 3 The light source 13, the first collimating optics 42, the second collimator 46, and the Fresnel lens 48 are designed such that the numerical aperture NA of the illumination point on the object 11 has a range of NA = 0.05 to NA = 0.25.

[0165] exist Figure 2 In this embodiment, a divergent light emitter 13 is arranged within the light emitter plane. The optical path 62, intersecting with the projection light path, is represented by a dotted line. Within this intersecting optical path, there exists a plane 63 conjugate to the light emitter plane, which can be identified by the convergence of the dotted lines onto the optical axis 65. The plane 63 conjugate to the light emitter plane in the intersecting optical path 62 is located between the first beam splitter 16 and the object 11, in this example, before the first projection plane 12, i.e., before zp(λ1). In a variant not shown in this embodiment, the plane 63 conjugate to the light emitter plane may be arranged at the location of the dispersive element 24. The optical path described in this paragraph can be understood as another optical path intersecting with the projection light path, such as those known from Kohler illumination. The plane 63 conjugate to the light emitter plane is a plane perpendicular to the optical axis 65. For clarity, only the intersection of this plane and the optical axis 65 is shown here.

[0166] In addition, such as Figure 1 As shown, a control unit 61 is also provided, which controls the light source 13, thereby changing the light distribution of the light source.

[0167] Figure 4 A method 100 for generating 3D records of 130 three-dimensional objects 11 is shown, in particular utilizing according to Figures 1 to 3 One of the recording devices 10, the method includes the following steps:

[0168] - Arrange the three-dimensional object 11 110 in the multiple projection planes 12 of the recording device 10;

[0169] - Illuminate the 3D object 11 120, with the following sub-steps:

[0170] - A beam 130 is generated in the pattern plane 15 by the light source 13.

[0171] -The beam 14 generated by 140 is received through the first beam splitter input terminal of the first beam splitter 16.

[0172] -The illumination beam 17 is separated from the beam 14 by the first beam splitter 16.

[0173] -The illumination beam 17, separated by the first beam splitter output terminal 21 of the first beam splitter 16, is output at a distance of 160.

[0174] - The output illumination beam 17 is focused 170 onto the plurality of projection planes 12 by the dispersive element 24, wherein the pattern plane 15 is projected, and wherein the pattern plane 15 is conjugate with each of the plurality of projection planes 12 at a specific projection wavelength.

[0175] - To acquire data from 3D object 11, the following sub-steps are involved:

[0176] -The illumination beam 17 is reflected as the observation beam 19 by the three-dimensional object 11 210.

[0177] - Pass the observation beam 19 through the 220 dispersive element 24.

[0178] The observation beam 19 passing through 230 is received by the second beam splitter input terminal 22 of the first beam splitter, wherein the second beam splitter input terminal 22 corresponds to the first beam splitter output terminal 21.

[0179] -The recording beam 18 is separated from the observation beam 19 by the first beam splitter 16.

[0180] -The recording beam 18, separated by 25°, is output from the second beam splitter output terminal 23 of the first beam splitter 16.

[0181] -The recording beam 18 output from 230 is received through the third beam splitter input terminal 28 of the second beam splitter 25.

[0182] -The recording beam 18 is divided 270 times by the second beam splitter 25 into, in particular, monotonically wavelength-dependently divided into, a first recording beam component 26 and a second recording beam component 27.

[0183] - The first recorded beam component 26 is output through the third beam splitter output terminal 29 of the second beam splitter 25.

[0184] - The second recorded beam component 27 is output through the fourth beam splitter output terminal 30 of the second beam splitter 25.

[0185] - The first intensity data 37 of the first recorded beam component 26 is acquired in two dimensions by the first matrix sensor 36 of the acquisition unit 31 as the first image 32 of the first image plane 33, and

[0186] - The second intensity data 39 of the second recording beam component 27 is acquired in two dimensions by the second matrix sensor 38 of the acquisition unit 31 as the second image 34 of the second image plane 35. The first image 32 and the second image 34 have multiple corresponding image points, which are respectively assigned to the object points of the illuminated object 11.

[0187] - The calculation unit 40 calculates at least one longitudinal coordinate of a plurality of object points of object 11 based on the corresponding image points of the first image and the second image to generate a 3D record of object 11.

[0188] In the method 100 shown, the light source 13 has a pattern unit having a first pattern 53, wherein the first pattern 53 is arranged in a pattern plane 15 such that the first pattern 53 of the pattern plane 15 is clearly projected onto the pattern-projection plane 56 of the plurality of projection planes 12 at a clear imaging projection wavelength, while the projection on other projection planes is unclear.

[0189] Here, the plurality of projection planes 12 are conjugate with the first image plane 33 and the second image plane 35 in order to calculate the 300 longitudinal coordinates.

[0190] The pattern 53 in the pattern plane 15 alternately has at least one first pattern position 54 and at least one second pattern position 55 in at least one direction. Here, the at least one first pattern position 54 has a first wavelength, and the at least one second pattern position 55 has a second wavelength, wherein the at least one first pattern position 54 and the at least one second pattern position 55 of the pattern 53 located on the pattern plane 15 are conjugate to the corresponding wavelength-dependent pattern-projection planes 12, 56. This makes the corresponding wavelength-dependent pattern-projection planes 12, 56 conjugate to the first image plane 33 and the second image plane 35, respectively, so that the pattern can also be identified in the image.

[0191] The first intensity data 37 of the first image has at least one first intensity value 57 for the at least one first wavelength of the at least one first pattern position 54 and at least one second intensity value 58 for the at least one second wavelength of the at least one second pattern position 55. The second intensity data 39 has at least one third intensity value 59 for the at least one first wavelength of the at least one first pattern position 54 and at least one fourth intensity value 60 for the at least one second wavelength of the at least one second pattern position 55. Here, the at least one second intensity value 58 is used to correct the at least one first intensity value 57, and the at least one fourth intensity value 60 is used to correct the at least one third intensity value 59.

[0192] In addition, the light distribution of the light source 13 is changed by controlling the light source 13 through the control unit 61.

[0193] Figure 5 The dispersive element is shown as a double lens.

[0194] Figure 6 Another dispersive element is shown, designed as a diffractive Fresnel lens. It can be seen that the diffraction regions become more closely spaced closer to the lens edge. Meanwhile, the region on the lens side shown on the left has a sloping surface. This allows for more efficient light focusing compared to a Fresnel zone plate.

[0195] Figure 7 An exemplary spectral filtering characteristic curve of the first filter 49 is shown, and Figure 8 An exemplary spectral filtering characteristic curve of the second filter 50 is shown. Both filters can be used, for example, in the second beam splitter 25. The use of such filters allows the second beam splitter mirror to be implemented as wavelength independent.

[0196] Figure 9Characteristic curves for another embodiment of the second beam splitter are shown. This beam splitter is implemented using a dielectric mirror layer that has the reflectivity shown at an incident angle of 45°. Thus, ideally, the transmittance equals 1 minus the reflectivity. In this embodiment, the first and second filters can be omitted.

[0197] Figures 7 to 9 The idealized characteristic curves are shown, but in practical applications, nonlinear phenomena may occur due to technical limitations, especially at the upper and lower ends of the wavelength range. These nonlinear phenomena can be compensated for using appropriate correction functions, which must be obtained through calibration.

[0198] List of reference numerals

[0199] 10 Recording Devices

[0200] 11 objects

[0201] 12 projection planes

[0202] 13 light sources

[0203] 14 beams

[0204] 15 Pattern Plane

[0205] 16 First beam splitter

[0206] 17 lighting beams

[0207] 18 recording beams

[0208] 19. Observe the beam.

[0209] 20 First beam splitter input terminal

[0210] 21 First beam splitter output terminal

[0211] 22 Second beam splitter input terminal

[0212] 23 Second beam splitter output terminal

[0213] 24 dispersive elements

[0214] 25 Second beam splitter

[0215] 26 First recorded beam components

[0216] 27 Second recorded beam component

[0217] 28 Third beam splitter input terminal

[0218] 29 Third beam splitter output terminal

[0219] 30 Fourth beam splitter output terminal

[0220] 31 acquisition units

[0221] 32 First Image

[0222] 33 First Image Plane

[0223] 34 Second Image

[0224] 35 Second Image Plane

[0225] 36 First Matrix Sensor

[0226] 37 First Intensity Data

[0227] 38 Second Matrix Sensor

[0228] 39 Second Intensity Data

[0229] 40 computing units

[0230] 41 Divergent Radiation Light Emitter

[0231] 42 First collimating optical device

[0232] 43 First Pattern Unit

[0233] 44 First deflection mirror

[0234] 45 Second deflector

[0235] 46 Second collimator

[0236] 47 Focusing Optics

[0237] 48 Fresnel lens

[0238] 49 First Filter

[0239] 50 Second Filter

[0240] 51 beam splitter

[0241] 52-splitter cube

[0242] 53 patterns

[0243] 54 First Pattern Position

[0244] 55 Second Pattern Position

[0245] 56 Patterns - Projection Plane

[0246] 57 First strength value

[0247] 58 Second Intensity Value

[0248] 59 Third Intensity Value

[0249] 60 Fourth Intensity Value

[0250] 61 control unit

[0251] 62 interlaced optical paths

[0252] 63. Conjugate planes of interlaced optical paths

[0253] 65 optical axis

[0254] 100 methods

[0255] 110 deployment

[0256] 120 lighting

[0257] 130 generated

[0258] 140 received

[0259] 150 separation

[0260] 160 output

[0261] 170 Focus

[0262] 200 collections

[0263] 210 reflection

[0264] 220 passed

[0265] 230 received

[0266] 240 separation

[0267] 250 output

[0268] 260 Receive

[0269] 270 division

[0270] 280 output

[0271] 290 collections

[0272] 300 calculation

[0273] 310 conjugate

[0274] 320 calibration

[0275] zp(λ) distance.

Claims

1. A recording apparatus (10) for generating 3D recordings of a three-dimensional object (11), wherein the recording apparatus (10) has a plurality of projection planes (12) for illuminating the object (11), wherein the plurality of projection planes (12) are capable of projecting onto the object (11), wherein each of the projection planes (12) is separated from the intermediate projection plane (12) of the plurality of projection planes (12) by a wavelength-dependent distance (zp(λ)), the recording apparatus comprising: - Light source (13) for generating light beam (14) in pattern plane (15); - A first beam splitter (16) is used to separate the illumination beam (17) from the beam (14) and to separate the recording beam (18) from the observation beam (19) reflected by the object (11). - The first beam splitter (16) has: a first beam splitter input (20) for receiving the beam (14), and - The first beam splitter output (21) for outputting the illumination beam (17), and - The second beam splitter input (22) for receiving the observed beam (19), and - The second beam splitter output (23) is used to output the recording beam (18). The second beam splitter input terminal (22) corresponds to the first beam splitter output terminal (21). - Dispersion element (24) for focusing the illumination beam (17) separated by the first beam splitter (16) onto the plurality of projection planes (12) in such a way that the pattern plane (15) is conjugate with each of the plurality of projection planes (12) at a specific projection wavelength; - A second beam splitter (25) is used to divide the recording beam (18) into a first recording beam component (26) and a second recording beam component (27). - The second beam splitter (25) has: a third beam splitter input (28) for receiving the recorded beam (18), and - The third beam splitter output terminal (29) for outputting the first recorded beam component (26), and - The fourth beam splitter output terminal (30) for outputting the second recorded beam component (27); - Acquisition unit (31) is used to acquire a first image (32) in the first image plane (33) of the first recording beam component (26) of the object (11) and to acquire a second image (34) in the second image plane (35) of the second recording beam component (27) of the object (11). - The acquisition unit (31) has: a first matrix sensor (36) for acquiring first intensity data (37) of the first recording beam component (26) in two dimensions in the first image plane (33) as the first image (32), wherein the first matrix sensor (36) is arranged downstream of the third beam splitter output end (29) of the second beam splitter (25) relative to the beam direction of the first recording beam component (26). - A second matrix sensor (38) is used to acquire, in two dimensions, the second intensity data (39) of the second recording beam component (27) in the second image plane (35) as the second image (34), wherein the second matrix sensor (38) is arranged downstream of the fourth beam splitter output (30) of the second beam splitter (25) relative to the beam direction of the second recording beam component (27). - Wherein, the first image (32) and the second image (34) have corresponding image points, wherein the corresponding image points can be assigned to the same object points of the three-dimensional object (11); - Calculation unit (40) is used to calculate at least one longitudinal coordinate of each of a plurality of object points of the object (11) based on the corresponding image points of the first image and the second image, so as to generate a 3D record of the three-dimensional object (11).

2. The recording device (10) according to claim 1. Its features are, The light source (13) includes a first divergent light emitter (41) and a first collimating optics (42), and / or has a first pattern unit (43) with a first pattern (53) arranged in the pattern plane (15).

3. The recording device (10) according to claim 1 or 2. Its features are, A first deflector (44) is disposed between the light source (13) and the first beam splitter (16) to deflect the illumination beam (17) by a specific angle, particularly an obtuse angle, and / or A second deflector (45) is provided between the dispersive element (24) and the object (11) to deflect the observation beam (19) by a specific angle, especially an obtuse angle.

4. The recording device (10) according to any one of the preceding claims. Its features are, A second collimator (46) is arranged between the light source (13) and the first beam splitter (16), and / or a focusing optics (47) is arranged between the first beam splitter (16) and the second beam splitter (25).

5. The recording device (10) according to any one of the preceding claims. Its features are, The recording device (10) does not contain a rotating element.

6. The recording device (10) according to any one of the preceding claims. Its features are, The dispersive element (24) includes a diffractive optical element and / or a Fresnel lens (48) and / or a superlens and / or a combination of a flint glass positive lens and a crown glass negative lens and / or a Fresnel zone plate.

7. The recording device (10) according to any one of the preceding claims. Its features are, A mask, particularly a structured black chrome plate, or a pixel-controllable TFT display or a pixel-controllable backlit LCD display, is provided to generate the first pattern of the first pattern unit (43).

8. The recording device (10) according to any one of the preceding claims. Its features are, A first filter (49) is provided at the third beam splitter output (29) of the second beam splitter (25) for performing wavelength-dependent filtering on the first recorded beam component (26), and / or A second filter (50) is provided at the fourth beam splitter output (30) of the second beam splitter (25) for wavelength-dependent filtering of the second recorded beam component (27).

9. The recording device (10) according to any one of the preceding claims. Its features are, The dispersive element (24) has positive optical power, wherein the optical power has a first wavelength dependence, and in particular a first monotonic wavelength dependence.

10. The recording device (10) according to any one of the preceding claims. Its features are, The first beam splitter (16) has a splitting ratio of 80:20 to 20:80, preferably 70:30 to 30:70, more preferably 60:40 to 40:60, and / or The second beam splitter (25) has a second wavelength dependence, especially a second monotonic wavelength dependence.

11. The recording device (10) according to any one of the preceding claims. Its features are, The first beam splitter (16) and / or the second beam splitter (25) include a beam splitter plate (51) or a beam splitter cube (52).

12. The recording device (10) according to any one of the preceding claims. Its features are, The beam (14) is a broadband spectral beam (14) with a spectral bandwidth of at least 100 nm in the wavelength range of 400 nm to 1100 nm.

13. The recording device (10) according to any one of the preceding claims. Its features are, The numerical aperture NA of the illumination point on the object (11) has a range of NA = 0.05 to NA = 0.25, preferably NA = 0.08 to NA = 0.18, more preferably NA = 0.10 to NA = 0.14, and / or is able to illuminate the object (11) through a telecentric illumination optical path formed between the dispersive element (24) and the object (11), and / or is able to acquire the object (11) through a telecentric observation optical path formed between the dispersive element (24) and the object (11).

14. The recording device (10) according to any one of the preceding claims. Its features are, The light source (13) has a divergent light emitter, wherein the divergent light emitter (13) is arranged in the light emitter plane, and in the light path (62) intersecting with the projection light path, there is a plane (63) conjugate to the light emitter plane, which is arranged between the first beam splitter (16) and the first projection plane (12, zp(λ1)), especially at the position of the dispersive element (24).

15. A method (100) for generating (130) a 3D record of a three-dimensional object (11), particularly utilizing a recording device (10) according to any one of the preceding claims, the method comprising the following steps: - The three-dimensional object (11) is arranged (110) in multiple projection planes (12) of the recording device (10); - Illuminating the three-dimensional object (11) (120) involves the following sub-steps: - The light beam (14) is generated in the pattern plane (15) by the light source (13) (130). -The beam (14) generated by the first beam splitter (140) is received through the first beam splitter input terminal of the first beam splitter (16). -The illumination beam (17) is separated (150) from the beam (14) by the first beam splitter (16). -The illumination beam (17) is separated by the output (160) of the first beam splitter (16). - The output illumination beam (17) is focused (170) onto the plurality of projection planes (12) by a dispersive element (24), wherein a pattern plane (15) is projected, and wherein the pattern plane (15) is conjugate with each of the plurality of projection planes (12) at a specific projection wavelength. - Acquiring the three-dimensional object (11) (200) includes the following sub-steps: - The illumination beam (17) is reflected (210) as the observation beam (19) by the three-dimensional object (11). - Pass the observation beam (19) through the dispersive element (24) (220). - The observation beam (19) passing through the second beam splitter input (230) of the first beam splitter is received (230), wherein the second beam splitter input (22) corresponds to the first beam splitter output (21). -The recording beam (18) is separated (240) from the observation beam (19) by the first beam splitter (16). -The recording beam (18) separated by the output (250) of the second beam splitter output (23) of the first beam splitter (16). - The recording beam (18) output by the third beam splitter input (28) of the second beam splitter (25) is received (260). - The recording beam (18) is divided (270) by the second beam splitter (25) into, in particular, monotonically dependent on wavelength, a first recording beam component (26) and a second recording beam component (27). - The first recorded beam component (26) is output (280) through the third beam splitter output terminal (29) of the second beam splitter (25), and - The second recorded beam component (27) is output (280) through the fourth beam splitter output terminal (30) of the second beam splitter (25). - The first intensity data (37) of the first recorded beam component (26) is acquired (290) in two dimensions by the first matrix sensor (36) of the acquisition unit (31) as the first image (32) of the first image plane (33). - The second intensity data (39) of the second recorded beam component (27) is acquired (290) in two dimensions by the second matrix sensor (38) of the acquisition unit (31) as the second image (34) of the second image plane (35), wherein the first image (32) and the second image (34) have corresponding image points, and the corresponding image points are respectively assigned to the object points of the illuminated object (11). - The calculation unit (40) calculates (300) at least one longitudinal coordinate of a plurality of object points of the object (11) based on the corresponding image points of the first image and the second image to generate a 3D record of the object (11).

16. The method (100) according to claim 15. Its features are, The light source (13) has a pattern unit with a first pattern (53), wherein the first pattern (53) is arranged in the pattern plane (15) such that the first pattern (53) of the pattern plane (15) is projected onto the projection plane (12).

17. The method (100) according to any one of claims 15 to 16. Its features are, The plurality of projection planes (12) are conjugate with the first image plane (33) and the second image plane (35) to calculate (300) the longitudinal coordinates.

18. The method (100) according to any one of claims 15 to 17. Its features are, The pattern (53) in the pattern plane (15) alternately has a first pattern position (54) and a second pattern position (55) in at least one direction, wherein the first pattern position (54) has a first light emissivity and the second pattern position (55) has a lower second light emissivity, in particular a light emissivity of zero, and the second pattern position produces a darkened image position in the first image and the second image, and the intensity value of the adjacent undarkened image position is corrected in the first image and the second image using the intensity value of the darkened image position before calculating the longitudinal coordinate.

19. The method (100) according to any one of claims 15 to 18. Its features are, The control unit (61) controls the light source (13), wherein the light distribution of the light source (13) is changed.

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