Dual-pulse test device and test method based on modular design
The modularly designed dual-pulse test device, with its compatible interface units and locking structure, solves the problem that existing devices are difficult to adapt to the testing of different types of devices, achieving flexible connection and stable testing, and improving the adaptability and safety of the test device.
Patent Information
- Application Number
- CN202512030090.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-30
- Publication Date
- 2026-02-27
AI Technical Summary
Existing dual-pulse test equipment is difficult to adapt flexibly to the testing requirements of different types of power semiconductor devices. The connection method needs to be redesigned or fasteners need to be removed, which makes it difficult for the equipment to adapt flexibly to the testing requirements of different types of devices.
The modular dual-pulse test device allows for flexible connection and disconnection between modules by setting up compatible first and second interface units, achieving both physical fixation and electrical connection. It includes a battery core made of conductive material and a housing made of insulating material, combined with a locking structure and an anti-fragmentation structure to ensure the stability and reliability of the connection.
The test device can flexibly change the type of modules and connection objects according to the test requirements of different types of power semiconductor devices, simplify the connection operation, improve safety and stability, avoid the problem of loose connection, and ensure the reliability of the test.
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Figure CN121578083A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of double pulse test, in particular to a double pulse test device and test method based on modular design. BACKGROUND
[0002] With the rapid development of power electronics technology, power semiconductor devices such as insulated gate bipolar transistors (IGBT) or silicon carbide metal-oxide-semiconductor field effect transistors (SiC MOSFET) have become the core components in many power electronic systems. These devices are widely used in electric vehicles, power frequency converters, industrial equipment and other fields due to their high efficiency, high voltage resistance, low loss and other advantages. In these applications, the reliability evaluation of power devices is crucial to ensure their performance. Therefore, a series of tests must be performed on these devices to ensure that they can achieve the predetermined power handling capability during operation and do not fail prematurely during long-term operation.
[0003] Double pulse test technology is one of the core methods for evaluating the performance of these power devices, mainly used to measure key dynamic parameters such as device turn-on and turn-off losses, current carrying capacity, and can reflect the performance of the device under actual working conditions. The double pulse test method simulates the losses generated by power semiconductor devices during switching by applying two pulses, which can effectively evaluate the switching characteristics, temperature rise and thermal effects of the device.
[0004] In order to reduce the influence of parasitic inductance on test results, existing double pulse test devices mostly adopt integrated design, i.e. the structures used for testing need to be physically connected to each other, such as welding or connecting through fasteners, to avoid the use of wires, however, such connection forms are difficult to adapt to the testing needs of different types of devices in actual use. The disadvantage of this design is that when the test device needs to be replaced, the connection form and packaging form of each structure need to be redesigned, or a number of fasteners need to be removed to separate each structure, the above operations all make the current test device difficult to flexibly adapt to the testing needs of different types of power semiconductor devices. SUMMARY
[0005] The present application aims to solve the problem that the existing double pulse test device is difficult to flexibly adapt to the testing needs of different types of devices.
[0006] To solve the above problems, the present application provides a double pulse test device based on modular design, comprising a module group formed by connecting a plurality of modules, the plurality of modules are respectively a capacitor module, a test plate module, a driving module and a charge and discharge control module, and each of the modules is provided with a first interface unit and / or a second interface unit; wherein, in the module group, only the first interface unit and the second interface unit are adaptively connected.
[0007] In a possible implementation, only a single interface is arranged on the charge-discharge control module, such as only the first interface unit or the second interface unit, and the capacitor module is provided with an interface corresponding to the charge-discharge control module, if the single interface on the charge-discharge control module is the first interface unit, the corresponding interface on the capacitor module is the second interface unit, and vice versa, if the single interface on the charge-discharge control module is the second interface unit, the corresponding interface on the capacitor module is the first interface unit. Compared with the prior art, the double-pulse test device based on the modular design has the following beneficial effects, but is not limited thereto: By arranging the first interface unit and the second interface unit, the modules can be connected and removed as needed, and when connected, the first interface unit and the second interface unit can simultaneously physically fix and electrically connect the two modules, so that the test device can flexibly change the types of the modules and the connection objects according to the test requirements of different types of power semiconductor devices.
[0008] As a further scheme of the present application, the first interface unit has a first electrode and a first shell arranged outside the first electrode, the second interface unit has a second shell and a second electrode fixed in the second shell, and the first electrode and the second electrode are in a contact state, wherein the first electrode and the second electrode are made of conductive material, and the first shell and the second shell are made of insulating material, so as to realize electrical connection between the module corresponding to the first interface unit and the module corresponding to the second interface unit.
[0009] As a further scheme of the present application, the first interface unit and the second interface unit are provided with a locking structure, which is used to fix the first electrode in the first interface unit on the second electrode in the corresponding second interface unit.
[0010] As a further scheme of the present application, the first interface unit and the second interface unit are further provided with a false connection prevention structure, which is used to press the first electrode in the first interface unit against one side of the second electrode in the corresponding second interface unit.
[0011] As a further scheme of the present application, the contact state is that the second electrode is sleeved outside the corresponding first electrode, and the inner surface of the second electrode is in contact with the outer surface of the first electrode.
[0012] As a further scheme of the present application, the locking structure includes a locking groove formed on the second shell, and a locking piece movably arranged on the first shell, when the locking piece is partially located in the locking groove, the first electrode and the corresponding second electrode in the contact state cannot be separated.
[0013] As a further scheme of the present application: the anti-virtual connection structure comprises a groove formed on the first battery cell and a bending part formed on the second battery cell, when the first battery cell and the second battery cell form a contact state, the corresponding bending part abuts on one side of the groove, when the locking member moves, there is a moment when the locking member exerts pressure on the corresponding bending part towards the side of the groove.
[0014] As a further scheme of the present application: the locking member is rotatably arranged in the corresponding first housing, and when the locking member rotates, the outer edge thereof enters the radial depth between the first housing and the corresponding first battery cell.
[0015] As a further scheme of the present application: the locking member is provided with a positioning block, and a plurality of positioning holes are formed in the mounting cavity in the first housing and corresponding to the locking member, the positioning holes are arranged in a circle, and the positioning block can enter and move out of different positioning holes in sequence when the locking member rotates.
[0016] A dual-pulse testing method based on modular design, using the dual-pulse testing device based on modular design as described above, by connecting the first interface unit and the corresponding second interface unit, any module in the module group is fixed and electrically connected with the corresponding module. BRIEF DESCRIPTION OF DRAWINGS
[0017] The present application will be further described below with reference to the drawings.
[0018] Figure 1 is the overall structure schematic diagram when any two modules in the present application are connected; Figure 2 is the cross-sectional structure schematic diagram when any two modules in the present application are connected; Figure 3 is Figure 2 is the enlarged structure schematic diagram of A in the present application; Figure 4 is Figure 3 is the enlarged structure schematic diagram of B in the present application; Figure 5 is the cross-sectional enlarged structure schematic diagram when the first interface unit and the second interface unit in the present application are connected; Figure 6 is the enlarged structure schematic diagram of the locking member in the present application; Figure 7 is the cross-sectional enlarged structure schematic diagram of the first housing in the present application; Figure 8 is the structure schematic diagram of the module connection system in the present application.
[0019] In the figure: 1, a capacitor module; 2, a test board module; 3, a driving module; 4, a charge and discharge control module; 5, a first interface unit; 51, a first battery cell; 52, a first shell; 6, a second interface unit; 61, a second shell; 62, a second battery cell; 7, a locking structure; 71, a locking groove; 72, a locking piece; 73, a positioning block; 74, a positioning hole; 8, a false connection prevention structure; 81, a groove; 82, a curved portion. DETAILED DESCRIPTION
[0020] In order to make the objectives, technical solutions and advantages of the present application clearer, the following will combine the drawings to clearly and completely describe the technical solutions in the embodiments of the present application. It should be understood that the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments described in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort shall fall within the scope of protection of the present application.
[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the specification of the present application is only for the purpose of describing specific embodiments and is not intended to limit the present application; the terms "comprise", "contain", "have", "with", "include", "contain" and the like in the specification and claims of the present application and the above description of drawings are open-ended words. Therefore, a method or device "comprising", "containing", "having" one or more steps or elements has one or more steps or elements, but is not limited to only having the one or more elements. The terms "first", "second" and the like in the specification and claims of the present application or the above description of drawings are used to distinguish different objects, and are not used to describe a specific order or primary and secondary relationship. In addition, the terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with "first", "second" can explicitly or implicitly include one or more features. In the description of the present application, unless otherwise stated, the meaning of "multiple" is two or more.
[0022] In the description of the present application, it should be understood that the terms "up", "down", "left", "right", "front", "back" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the indicated device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present application.
[0023] In the description of the application, it should be explained that, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connecting", "attachment" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrally connected; it can be directly connected, or indirectly connected through an intermediate medium, or the internal communication of two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.
[0024] It should be emphasized that when the term "comprising / including" is used in the specification, it is used to explicitly indicate the presence of the features, integers, steps or components, but does not exclude the presence or addition of one or more other features, integers, steps, components or groups of features, integers, steps, components.
[0025] The term "and / or" in this application is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B can mean that A exists alone, A and B exist together, and B exists alone. In addition, the character " / " in this application generally represents that the front and rear associated objects have an "or" relationship.
[0026] As shown in Figure 1 and Figure 8 A double pulse test device based on modular design, comprising a module group formed by connecting a plurality of modules, the plurality of modules being a capacitor module 1, a test board module 2, a driving module 3 and a charge and discharge control module 4, respectively, and each module is provided with a first interface unit 5 and / or a second interface unit 6; wherein, in the module group, only the first interface unit 5 is adaptively connected with the second interface unit 6.
[0027] In a possible implementation, only a single interface is provided on the charge and discharge control module 4, such as only the first interface unit 5 or the second interface unit 6, and the capacitor module 1 is provided with an interface corresponding to the charge and discharge control module 4. If the single interface on the charge and discharge control module 4 is the first interface unit 5, the corresponding interface on the capacitor module 1 is the second interface unit 6; otherwise, if the single interface on the charge and discharge control module 4 is the second interface unit 6, the corresponding interface on the capacitor module 1 is the first interface unit 5. In a possible implementation, the first interface unit 5 and the second interface unit 6 are provided on the capacitor module 1 at the same time. When it is necessary to connect the test board module 2 and the charge and discharge control module 4 with the capacitor module 1, the interface units for connection on the test board module 2 and the charge and discharge control module 4 are not the same, for example, the interface on the test board module 2 for connecting with the capacitor module 1 is the first interface unit 5, and the interface on the charge and discharge control module 4 for connecting with the capacitor module 1 is the second interface unit 6. In summary, the interface on the module may have only the first interface unit 5 or the second interface unit 6, or it may have both the first interface unit 5 and the second interface unit 6.
[0028] The first interface unit 5 and the second interface unit 6 are adapted to each other, meaning that the two modules are physically and electrically connected at the same time after being connected through the first interface unit 5 and the second interface unit 6. The modules are designed with wiring that is electrically connected to the interface units.
[0029] In this embodiment, by providing a first interface unit 5 and a second interface unit 6 that are compatible with each other, the modules can be connected and disconnected as needed. When connecting, the first interface unit 5 and the second interface unit 6 can be combined to physically fix and electrically connect the two modules at the same time. This allows the test device to flexibly change the type of each module and the connection object according to the test requirements of different types of power semiconductor devices.
[0030] like Figures 1-4 As shown, optionally, the first interface unit 5 has a first battery cell 51 and a first housing 52 disposed outside the first battery cell 51, and the second interface unit 6 has a second housing 61 and a second battery cell 62 fixed inside the second housing 61, so that the first battery cell 51 and the second battery cell 62 are in contact. The first battery cell 51 and the second battery cell 62 are made of conductive materials, and the first housing 52 and the second housing 61 are made of insulating materials, so that an electrical connection is formed between the module corresponding to the first interface unit 5 and the module corresponding to the second interface unit 6.
[0031] In this embodiment, by making the first battery cell 51 and the second battery cell 62 with conductive materials, a conductive path can be formed between the two modules corresponding to the first interface unit 5 and the connected second interface unit 6 when they are in contact with each other. According to this design, when installing the first interface unit 5 / second interface unit 6 with the corresponding modules, such as by soldering, it is only necessary to ensure that the first battery cell 51 and the second battery cell 62 are connected to the corresponding circuit, thereby simplifying the connection operation and realizing the completion of both physical and electrical connection in one step. At the same time, the first housing 52 and the second housing 61 are both made of insulating materials, which can also protect the first battery cell 51 and the second battery cell 62 inside when the first interface unit 5 and the connected second interface unit 6 are combined / separated. It can be understood that the first battery cell 51 and the second battery cell 62 can be shorter than the height of the corresponding first housing 52 and the second housing 61 to prevent them from protruding outside the housing, thereby achieving a better protective effect and improving the safety of the testing device.
[0032] like Figures 1-4As shown, optionally, the first interface unit 5 and the second interface unit 6 are provided with a locking structure 7, which is used to fix the first battery cell 51 in the first interface unit 5 to the corresponding second battery cell 62 in the second interface unit 6.
[0033] In this embodiment, a locking structure 7 is provided, which prevents the first interface unit 5 and the second interface unit 6 from being easily disassembled after they are combined, thus ensuring the stability and reliability of the electrical connection.
[0034] like Figures 2-4 As shown, optionally, the first interface unit 5 and the second interface unit 6 are further provided with an anti-fragmentation structure 8, which is used to press the first battery cell 51 in the first interface unit 5 against one side of the corresponding second battery cell 62 in the second interface unit 6.
[0035] In this embodiment, due to the modular design, the corresponding connection interfaces will have frequent disassembly and assembly requirements. After long-term use, the corresponding interfaces may become loose or deformed. Therefore, the anti-loose connection structure 8 is used to ensure that when the first battery cell 51 is connected to the corresponding second battery cell 62, the connection between them can be ensured by external force, avoiding the problem of loose connection (poor contact) caused by long-term use or welding problems, and further ensuring the reliability of the connection between the first interface unit 5 and the second interface unit 6 and the stability after long-term use.
[0036] like Figures 1-4 As shown, optionally, the contact state is such that the second battery cell 62 is sleeved outside the corresponding first battery cell 51, and the inner surface of the second battery cell 62 is in contact with the outer surface of the first battery cell 51.
[0037] In this embodiment, by nesting the second battery cell 62 with the first battery cell 51, the contact area when they are in contact can be increased and the connection resistance can be reduced.
[0038] like Figure 4 and Figure 6 As shown, optionally, the locking structure 7 includes a locking groove 71 formed on the second housing 61, and a locking member 72 movably disposed on the first housing 52. When the locking member 72 is partially located in the locking groove 71, the first battery cell 51 and the corresponding second battery cell 62, which are in contact at this time, cannot be separated.
[0039] In this embodiment, when the locking member 72 is partially located in the locking groove 71, the portion of it located in the locking groove 71 will block the path of the second housing 61 from the first housing 52, preventing the second housing 61 from separating from the first housing 52. This ensures that the connection between the first battery cell 51 and the corresponding second battery cell 62 is tight and stable, and avoids disconnection.
[0040] likeFigures 1-4 As shown, optionally, the anti-fraud structure 8 includes a groove 81 formed on the outside of the first battery cell 51 and a bent portion 82 formed on the second battery cell 62. When the first battery cell 51 and the second battery cell 62 are in contact, the corresponding bent portion 82 abuts against one side of the groove 81. When the locking member 72 is active, there is a moment when the locking member 72 applies pressure to the corresponding bent portion 82 toward one side of the groove 81.
[0041] In this embodiment, the movable locking member 72 is used to apply radial compression to the bent portion 82, thereby causing the bent portion 82 to tend to elastically deform in the radial direction inward. This allows the bent portion 82 to be further pressed against one side of the groove 81, thus preventing the second battery cell 62 and the first battery cell 51 from having a gap between them after long-term cooperation or after the first battery cell 51 is inserted into the second battery cell 62 due to poor soldering, which would lead to poor contact.
[0042] like Figures 1-4 As shown, optionally, the locking member 72 is rotatably disposed within the corresponding first housing 52, and when the locking member 72 rotates, the radial depth of its outer edge entering the first housing 52 and the corresponding first cell 51 is different.
[0043] In this embodiment, rotating the locking member 72 allows the locking member 72 to be partially located within the corresponding locking groove 71. When the locking member 72 is only partially located within the locking groove 71 and does not contact the corresponding bent portion 82, the locking member 72 is only used to restrict the separation of the first battery cell 51 and the second battery cell 62. When the locking member 72 is not only partially located within the locking groove 71, but also contacts and presses the corresponding bent portion 82, the locking member 72 can also prevent the problem of incomplete connection when the first battery cell 51 and the second battery cell 62 are in contact.
[0044] One possible implementation is to construct the locking member 72 as a regular ring, and to make the rotation center of the locking member 72 non-concentric with the center of its ring profile; Another possible implementation is to construct the locking element 72 as an irregular ring, so that the radius of its outer contour is different at different locations; Another possibility is to combine the two possibilities mentioned above to determine the construction of the locking element 72.
[0045] In other embodiments, the locking member 72 may also be configured to slide within the corresponding first housing 52 and slide radially, or the radial depth between the edge of the locking member 72 entering the first housing 52 and the corresponding first cell 51 may be changed.
[0046] like Figures 4-7As shown, optionally, a positioning block 73 is provided on the locking member 72, and a plurality of positioning holes 74 are formed in the first housing 52 and in the mounting cavity corresponding to the locking member 72. The positioning holes 74 are arranged in a circle, and the positioning block 73 can enter / move out of different positioning holes 74 one after another when the locking member 72 rotates.
[0047] In this embodiment, a mounting chamber for mounting the locking member 72 is formed within the first housing 52. The axial height of the mounting chamber is less than the sum of the height of the positioning block 73 on the locking member 72 and the height of the locking member 72 itself. Therefore, when the locking member 72 is moved, the positioning block 73 will continuously rub against the adjacent wall of the mounting chamber, increasing the difficulty of moving the locking member 72. When the positioning block 73 enters one of the positioning holes 74, the friction between the positioning block 73 and the adjacent wall of the mounting chamber disappears, and it will be stuck in the positioning function, so that the locking member 72 is in place. If the current position is maintained, and it is necessary to move the locking member 72 again, the thrust must be increased sharply to cause the positioning block 73 to elastically deform and slide out from the corresponding positioning hole 74. The locking member 72 can be kept in the current state through the cooperation of this part. For example, after rotating the locking member 72 so that its edge contacts and squeezes the corresponding curved part 82, in order to maintain the pressure between the locking member 72 and the curved part 82, the positioning block 73 can be placed in one of the corresponding positioning holes 74 to ensure that the locking member 72 is in close contact with the curved part 82 at this time.
[0048] In other embodiments, the positioning holes 74 may also be radially distributed to accommodate the arrangement of the radially sliding locking member 72.
[0049] A modular dual-pulse testing method: Based on the type of the device under test (DUT), a suitable test board module 2 is selected. The DUT is fixed onto the test board module 2, and the test board module 2 is connected to the capacitor module 1 via an interface unit. Then, according to... Figure 8 The arrangement fixes and electrically connects the remaining modules to the corresponding modules through interface units, ensuring stable connection of all modules and normal operation of the equipment.
[0050] The charging and discharging control module 4 is connected to the capacitor module 1 to ensure that the circuit is charged and discharged correctly; the driving module 3 is connected to the upper and lower bridge devices of the test board module 2 to ensure that the devices can be turned on and off normally.
[0051] Next, test conditions are set, such as bus voltage, charging current, switching frequency, and pulse width, to ensure that the test process simulates real working conditions. The test system is then started, and the switching operation of the power devices is controlled by the drive module 3, while the charge / discharge control module 4 ensures that the bus voltage meets the test requirements.
[0052] After the test is started, the drive module 3 simulates the switching operation of the power device, the capacitor module 1 provides a stable bus voltage for the test, and the measurement port is connected through the test board module 2 to collect the electrical parameters of the device in real time. The measured voltage and current will be transmitted to the analysis system through the data acquisition module for performance evaluation and design optimization.
[0053] The system monitors the electrical parameters of power devices in real time using external equipment and processes and analyzes the data. The analysis system generates detailed test reports, evaluates the performance of the power devices, and proposes possible optimization suggestions. Through comprehensive analysis of the test data, users can accurately understand the performance of power devices under different operating conditions.
[0054] While the present invention has been disclosed above, its scope of protection is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, and all such changes and modifications will fall within the scope of protection of the present invention.
Claims
1. A dual pulse testing device based on a modular design, characterized by, The module group is formed by connecting a plurality of modules, the plurality of modules are respectively a capacitor module (1), a test plate module (2), a driving module (3) and a charge and discharge control module (4), and each of the modules is provided with a first interface unit (5) and / or a second interface unit (6); wherein, in the module group, only the first interface unit (5) is adaptively connected with the second interface unit (6).
2. The dual pulse test device based on modular design of claim 1, wherein, The first interface unit (5) has a first core (51) and a first shell (52) arranged outside the first core (51), and the second interface unit (6) has a second shell (61) and a second core (62) fixed in the second shell (61), so that the first core (51) and the second core (62) form a contact state, wherein the first core (51) and the second core (62) are made of conductive material, and the first shell (52) and the second shell (61) are made of insulating material, so as to realize the electrical connection between the module corresponding to the first interface unit (5) and the module corresponding to the second interface unit (6).
3. The dual pulse test device based on modular design of claim 2, wherein, The first interface unit (5) and the second interface unit (6) are provided with a locking structure (7), which is used for fixing the first core (51) in the first interface unit (5) on the second core (62) in the corresponding second interface unit (6).
4. The dual pulse test device based on modular design of claim 3, wherein, The first interface unit (5) and the second interface unit (6) are further provided with a false connection prevention structure (8), which is used for pressing the first core (51) in the first interface unit (5) to one side of the second core (62) in the corresponding second interface unit (6).
5. The dual pulse test device based on modular design of claim 4, wherein, The contact state is that the second core (62) is sleeved outside the corresponding first core (51), and the inner surface of the second core (62) is in contact with the outer surface of the first core (51).
6. The dual pulse test device based on modular design of claim 5, wherein, The locking structure (7) includes a locking groove (71) formed on the second shell (61), and further includes a locking piece (72) movably arranged on the first shell (52), when the locking piece (72) is partially located in the locking groove (71), the first core (51) and the corresponding second core (62) in the contact state cannot be separated.
7. The dual pulse test device based on modular design of claim 6, wherein, The false connection prevention structure (8) includes a groove (81) formed outside the first core (51) and a curved portion (82) formed on the second core (62), when the first core (51) and the second core (62) form the contact state, the corresponding curved portion (82) abuts one side of the groove (81), and when the locking piece (72) moves, there is a moment when the locking piece (72) exerts pressure on the corresponding curved portion (82) towards one side of the groove (81).
8. The dual pulse test device based on modular design of claim 7, wherein, The locking piece (72) is rotatably arranged in the corresponding first shell (52), and the radial depth of the outer edge of the locking piece (72) into the first shell (52) and the corresponding first core (51) is different when the locking piece (72) rotates.
9. The dual pulse test device based on modular design of claim 8, wherein, The locking member (72) is provided with a positioning block (73), and a plurality of positioning holes (74) are formed in the first shell (52) and correspond to the mounting cavity of the locking member (72), the positioning holes (74) are arranged in a circle, and the positioning block (73) can enter and move out of different positioning holes (74) in sequence when the locking member (72) rotates.
10. A dual pulse test method based on modular design, using the dual pulse test device based on modular design according to any one of claims 1-9, characterized in that, By connecting the first interface unit (5) and the corresponding second interface unit (6), any module in the module group is fixed and electrically connected with the corresponding module.