Energy device single-particle burning pulse measurement system and method
By combining femtosecond pulsed laser equipment and T-type bias, the problem of measuring high-frequency characteristics during the single-particle burn-out process of energy devices was solved, achieving high-precision transient feature capture and simultaneous acquisition of multiple parameters, thus improving the reliability and flexibility of the test.
Patent Information
- Application Number
- CN202511837235.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-08
- Publication Date
- 2026-02-27
AI Technical Summary
Existing technologies struggle to capture and analyze the transient pulse characteristics of energy devices during single-particle burn-out with high precision. Furthermore, traditional testing methods involve expensive equipment, long cycles, and difficult-to-control experimental conditions, creating a contradiction between power supply protection and device waveform stability.
A femtosecond pulsed laser device is used to trigger the single-event effect. Combined with a three-dimensional moving platform, probe station, DC bias power supply and bias and sampling network, a T-type biaser is used to maintain DC bias while isolating high-frequency backflow, providing a low-impedance transient circuit, and a data acquisition module is used to realize the synchronous acquisition of three currents and one voltage.
It achieves high-precision measurement of single-particle burn-out pulses of energy devices under high bandwidth, reduces electromagnetic interference, improves the versatility and flexibility of experiments, and provides detailed waveform data support.