一种用于校准弱辐射传感器的放射性阳性样本制备方法

The set of preparation process parameters generated by Monte Carlo simulation and reverse derivation solves the problem of the disconnect between simulation parameters and process implementation in traditional methods, realizes reliable calibration and high-precision preparation of radioactive positive samples, and improves the monitoring accuracy of nuclear radiation sensors.

CN121583417BActive Publication Date: 2026-07-17TIANJIN CUSTOMS IND PROD SAFETY TECH CENT
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
TIANJIN CUSTOMS IND PROD SAFETY TECH CENT
Filing Date
2025-11-27
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In existing technologies, there is a lack of effective correlation between the optimized parameters obtained from computer simulations and the actual sample preparation process parameters. This leads to deviations between the radiation characteristics of the prepared positive samples and the simulation expectations, affecting the calibration basis of nuclear radiation sensors and the accuracy of on-site monitoring data.

Method used

The target distribution parameters and energy spectrum parameters are obtained through Monte Carlo simulation. A set of candidate preparation process parameters is generated by reverse derivation. Combining the energy spectrum distortion threshold and the safe operating range of the process parameters, the fine energy spectrum structure data is decomposed into source term features and matrix modulation features. A matrix effect compensation evaluation index is established, and the optimal set of preparation process parameters is selected.

Benefits of technology

A closed-loop feedback mechanism from theoretical design to experimental verification was implemented, ensuring the controllability and repeatability of the radiation characteristics of radioactive positive samples and improving the monitoring accuracy of weak radiation sensors.

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Abstract

本发明公开了一种用于校准弱辐射传感器的放射性阳性样本制备方法,具体涉及辐射监测与传感器校准技术领域,用于解决计算机模拟参数与实际制备工艺参数缺乏有效关联导致阳性样本辐射特性偏差大的问题;是通过蒙特卡洛模拟获得目标样本基质中放射性源的目标分布参数和目标能谱参数,根据能谱畸变阈值和工艺参数安全操作范围生成多个候选制备工艺参数集合,制备实验样本并测量特定能区范围内的精细能谱结构数据,将能谱数据分解为表征放射性源本身特征的源项特征和表征基质调制效应的基体调制特征,基于分离度建立基体效应补偿评估指标以筛选最优制备工艺参数集合,最终校准弱辐射传感器的放射性阳性样本,实现样本辐射特性与模拟预期一致。
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