Acoustic impedance in-situ measurement method based on array center reflection coefficient optimization

By collecting sound pressure in a semi-open space using readily available sound sources and microphone arrays, and combining this with an array center reflection coefficient optimization algorithm, the problem of insufficient accuracy in acoustic impedance calculation under large aperture array arrangement is solved, realizing efficient and accurate in-situ measurement of material acoustic properties.

CN121633283APending Publication Date: 2026-03-10湖北东湖实验室
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-22
Publication Date
2026-03-10

AI Technical Summary

Technical Problem

In semi-open acoustic test fields with reflective boundaries, existing methods are not accurate enough in calculating acoustic impedance under large aperture array arrangements, and require specialized equipment and specific environments for measurement, making it difficult to reflect the acoustic performance of materials under actual installation conditions.

Method used

An in-situ acoustic impedance measurement method based on array center reflection coefficient optimization is adopted. The sound pressure distribution is collected using existing sound sources and microphone arrays in the test field. A mathematical model is established by superimposing the basis functions of half-space spherical waves, and the array center reflection coefficient is optimized to improve the measurement accuracy.

Benefits of technology

Without the aid of specialized equipment, it is possible to efficiently and accurately measure the acoustic impedance of material surfaces in practical engineering applications, truly reflecting their acoustic performance in the installed state, thus improving calculation accuracy and implementation efficiency.

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Abstract

The invention provides an acoustic impedance in-situ measurement method based on array center reflection coefficient optimization, which comprises the following steps: arranging a tested sound source in a semi-open space containing a reflection boundary, arranging a microphone array near the tested sound source to form a holographic sound pressure measurement surface, and arranging a reference microphone near the boundary; starting a tested sound source, and collecting sound pressure superposed by sound source radiation and boundary reflection through the microphone array and the reference microphone; describing a half-space sound pressure field by linear superposition of a half-space spherical wave basis function to obtain a half-space sound pressure field mathematical model taking an array center field point reflection coefficient as a variable; traversing all values in the value range of the field point reflection coefficient of the array center, solving a primary function coefficient, reconstructing the sound pressure at the reference microphone, and determining the optimal reflection coefficient of the array center by taking the minimum relative error between the reconstructed sound pressure and the measured sound pressure as a criterion; and calculating the boundary acoustic impedance rate according to the array center optimal reflection coefficient. And the calculation precision under the condition of a large-aperture array is improved.
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Citation Information

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  • Calculation method of sound impedance, and system

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