Method for measuring broadband high-temperature dielectric constant of non-magnetic object to be measured

Abstract

The invention discloses a broadband high-temperature dielectric constant measurement method for a non-magnetic object to be measured. The method comprises the following steps: establishing a dielectric constant measurement system; respectively acquiring voltage and current data at different temperatures and frequencies; and dielectric constants of the to-be-measured object at different frequencies and temperatures are calculated. According to the non-magnetic to-be-measured object broadband high-temperature dielectric constant measurement method, the key problems that in a traditional dielectric constant measurement method, an instrument is complex in structure, high in manufacturing cost and tedious in operation are effectively solved, a measurement system is built based on an RL series alternating current circuit, the composition of an experimental device is greatly simplified, the equipment investment cost is reduced, and the measurement efficiency is improved. Meanwhile, the operation process is simplified, measurement can be completed without complex professional skills, and the method is suitable for wide application scenes of conventional laboratories and industrial sites.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of dielectric constant measurement, and relates to a non-magnetic object broadband high-temperature dielectric constant measurement method. BACKGROUND

[0002] As a key physical parameter of dielectric materials, the dielectric constant is an important index for measuring the ability of a material to store electric energy under the action of an applied electric field, and directly reflects the strength of the internal polarization of the material. Generally speaking, the higher the dielectric constant value, the more electric charge the material can store under a unit electric field strength, that is, the more superior the electric storage performance. The response characteristics of this parameter under different frequencies and temperatures directly affect the actual application range and performance of materials in high-tech fields such as communication equipment, electronic components, aerospace, etc. However, the traditional dielectric constant measurement method generally has problems such as complex structure of test instrument, high equipment cost, and cumbersome operation process, which limits its wide application in conventional laboratories and industrial sites. SUMMARY

[0003] The purpose of the present application is to provide a non-magnetic object broadband high-temperature dielectric constant measurement method, which solves the problems of complex instrument structure, high cost and cumbersome operation in the prior art.

[0004] The technical solution adopted by the present application is a non-magnetic object broadband high-temperature dielectric constant measurement method, comprising: Step 1, building a dielectric constant measurement system; Step 2, collecting voltage and current data under different temperatures and frequencies respectively; Step 3, calculating the dielectric constant of the object under different frequencies and temperatures.

[0005] The present application also has the following characteristics: Step 1 includes connecting the resistance-inductance circuit with the signal generator, oscilloscope and the measured medium, and then calibrating the signal generator and oscilloscope.

[0006] Step 2 includes: Step 2.1, collecting voltage and current data at different frequencies at room temperature; Step 2.2, collecting voltage and current data at different frequencies at the first set temperature; Step 2.3, collecting voltage and current data at different frequencies at the second set temperature; Step 2.4, collecting voltage and current data at different frequencies at the third set temperature.

[0007] Step 2.1 includes: Under room temperature conditions, the signal generator frequency is set to start from a set initial frequency and gradually increase to a set termination frequency in steps of set intervals. At each frequency point, a set number of repeated measurements are performed, and the time difference obtained from each measurement is recorded in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0008] Step 2.2 includes: Adjust the temperature control device to raise the experimental environment to the first set temperature and hold it at that temperature for a set time. Then, set the signal generator frequency to start from the initial set frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0009] Step 2.3 includes: Adjust the temperature control device to raise the experimental environment to the second set temperature and hold it at that temperature for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0010] Step 2.4 includes: Adjust the temperature control device to raise the experimental environment to the third set temperature and hold it for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0011] The dielectric constant is calculated using the following formula: , in, It is the input impedance; It is the impedance modulus of the medium under test; It is the reference impedance; It is the relative permittivity; It is the imaginary unit; It's the speed of light; It is the frequency of the input signal; It is the thickness of the medium being measured.

[0012] The frequency of the input signal is obtained using the following formula:

[0013]

[0014]

[0015]

[0016] in, It is the period of the input signal; It is the frequency of the input signal; It is the angle between the medium under test and the input voltage; It is the time difference of the input signal waveform; It is the impedance angle of the medium being measured; It is the phase angle between the input voltage and the inductor; U 电感 It is the voltage across the inductor; U 输入 It is the input voltage of the circuit; U 待测 It is the voltage across the medium being measured.

[0017] The impedance modulus of the medium under test is obtained by the following formula:

[0018] Among them, U 输入 It is the input voltage of the circuit; I is the impedance modulus of the medium under test; I is the current in the circuit.

[0019] The beneficial effects of this invention are: This invention effectively solves the key pain points of traditional dielectric constant measurement methods, such as complex instrument structure, high cost, and cumbersome operation. By building a measurement system based on RL series AC circuit, the composition of the experimental device is greatly simplified, the equipment investment cost is reduced, and the operation process is simplified. Measurement can be completed without complicated professional skills, making it suitable for a wide range of application scenarios in conventional laboratories and industrial sites.

[0020] In terms of measurement range and applicability, this invention achieves full coverage measurement across a wide frequency band and from room temperature to high temperature, which can meet the dielectric constant testing requirements of non-magnetic test objects under different frequency and temperature conditions, fills the application gap of traditional methods in broadband high temperature scenarios, and provides comprehensive support for the performance evaluation of materials in multiple environments.

[0021] The reliability and stability of the measurement results are important advantages of this invention. By repeating the measurement multiple times to reduce random errors, and by combining the triangulation method to accurately calculate the impedance angle and fit the complex impedance, the high accuracy of the dielectric constant calculation is effectively guaranteed. Experimental data show that the dielectric constant of the test object fluctuates little within the test range, has weak frequency dependence, and good thermal stability. The measurement results have good repeatability and reliability.

[0022] Furthermore, this invention not only provides a solid theoretical basis and experimental support for the application of functional materials in high-tech fields such as communication equipment, electronic components, and aerospace, but also introduces a simple and reliable measurement method for teaching and research laboratories. Its flexibility and completeness help promote the popularization and in-depth study of the dielectric properties of non-magnetic media, and it has significant engineering application value and promotion prospects. Attached Figure Description

[0023] Figure 1 This is a flowchart illustrating the broadband high-temperature dielectric constant measurement method for non-magnetic test objects according to the present invention. Figure 2 This is a schematic diagram illustrating the principle of room temperature measurement in the broadband high-temperature dielectric constant measurement method for non-magnetic test objects of the present invention. Figure 3 This is a schematic diagram illustrating the principle of high-temperature measurement in the broadband high-temperature dielectric constant measurement method for non-magnetic test objects of the present invention. Figure 4 This is a schematic diagram showing the relationship between each component and voltage in the broadband high-temperature dielectric constant measurement method for non-magnetic test objects of the present invention; Figure 5 This is a graph showing the relationship between frequency and dielectric constant at room temperature in an embodiment of the present invention; Figure 6 This is a graph showing the relationship between frequency and dielectric constant at 50°C in an embodiment of the present invention; Figure 7This is a graph showing the relationship between frequency and dielectric constant at 100°C in an embodiment of the present invention; Figure 8 This is a graph showing the relationship between frequency and dielectric constant at 150°C in an embodiment of the present invention. Detailed Implementation

[0024] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments.

[0025] Broadband high-temperature dielectric constant measurement method for non-magnetic analytes, such as... Figure 1 As shown, it includes: Step 1: Set up a dielectric constant measurement system; Connect the resistor-inductor circuit to the signal generator, oscilloscope, and the medium under test. Connect the oscilloscope's receiving probe to the circuit input line and the two ends of the medium under test, respectively. Then, perform accuracy calibration on the signal generator and oscilloscope. In a measurement system operating at room temperature, a signal generator is used as the input source to input a specific signal. The initial phase of the oscilloscope is set to zero. The positive terminal of the power supply is connected to the I-shaped inductor via a wire, and then connected to the medium under test. The medium is then connected to the negative terminal of the power supply via a wire. Channel 1 and Channel 2 of the oscilloscope are connected to the positive terminal of the input terminal and the right side of the I-shaped inductor, respectively, forming a closed loop. The oscilloscope is connected with the negative terminal of the power supply as the zero potential energy point.

[0026] In measurement systems operating at high temperatures, a signal generator is used as the input source to input a specific signal. The initial phase of the oscilloscope is set to zero. The positive terminal of the power supply is connected to the I-shaped inductor via a wire, and then the medium under test is connected to it. The medium is then connected to the negative terminal of the power supply via a wire. Channel 1 and Channel 2 of the oscilloscope are connected to the positive terminal of the input terminal and the right side of the I-shaped inductor, respectively, forming a closed loop. The oscilloscope is connected with the negative terminal of the power supply as the zero potential energy point. Then the medium under test is placed on the heating platform to ensure that the medium under test is in full contact with the heating platform. Before using the heating platform, it needs to be preheated to provide a stable temperature value.

[0027] Step 2: Collect voltage and current data at different temperatures and frequencies; Step 2.1: Collect voltage and current data at different frequencies at room temperature; Under room temperature conditions, the signal generator frequency is set to start from a set initial frequency and gradually increase to a set termination frequency in steps of set intervals. At each frequency point, a set number of repeated measurements are performed, and the time difference obtained from each measurement is recorded in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance; Step 2.2: Collect voltage and current data at different frequencies under the first set temperature; Adjust the temperature control device to raise the experimental environment to the first set temperature and hold it at that temperature for a set time. Then, set the signal generator frequency to start from the initial set frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance; Step 2.3: Collect voltage and current data at different frequencies under the second set temperature; Adjust the temperature control device to raise the experimental environment to the second set temperature and hold it at that temperature for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance; Step 2.4: Collect voltage and current data at different frequencies under the third set temperature; Adjust the temperature control device to raise the experimental environment to the third set temperature and hold it for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance; Step 3: Calculate the dielectric constant of the test material at different frequencies and temperatures; The dielectric constant is calculated using the following formula: , in, It is the input impedance; It is the impedance modulus of the medium under test; It is the reference impedance; It is the relative permittivity; It is the imaginary unit; It's the speed of light; It is the frequency of the input signal; It is the thickness of the medium being measured;

[0028]

[0029]

[0030]

[0031]

[0032] in, It is the period of the input signal; It is the frequency of the input signal; It is the angle between the medium under test and the input voltage; It is the time difference of the input signal waveform; It is the impedance angle of the medium being measured; It is the phase angle between the input voltage and the inductor; U 电感 It is the voltage across the inductor; U 输入 It is the input voltage of the circuit; U 待测 It is the voltage across the medium being measured; I is the impedance modulus of the medium under test; I is the current in the circuit.

[0033] In an RL AC circuit, after a non-magnetic object is connected, the impedance of the circuit changes. The time difference is then obtained by using a given frequency. Input voltage U 输入 Inductor voltage U 电感 Voltage U of the object under test 待测 Given the current I in the circuit, the impedance parameter can be calculated using the following formula: phase angle : in, From waveform time difference To calculate ( , ), By first calculating the Law of Cosines ( Then, the inverse function is used to solve for the impedance magnitude. Based on the above, using software fitting, the formula is: Solve for the dielectric constant. Where c is the speed of light ( ), To measure frequency, The thickness of the object to be measured.

[0034] The measurement method based on RL series AC circuits offers a new technical approach for measuring the dielectric constant of broadband nonmagnetic materials due to its significant advantages such as simple instrument structure, convenient operation, and low cost. This invention constructs an RL circuit measurement platform to collect voltage and current signals in the circuit, analyzes the time difference and amplitude variation patterns between their waveforms, and accurately calculates the circuit's impedance angle using the triangulation method. Furthermore, it derives the complex impedance, ultimately achieving high-precision calculation of the dielectric constant. By systematically exploring the influence mechanism of frequency and temperature changes on the dielectric constant of nonmagnetic materials, this invention provides theoretical basis and experimental support for the application of related functional materials in engineering fields, while also introducing a simple and reliable method for measuring dielectric constants in teaching and research laboratories.

[0035] Figure 2 It is a series circuit consisting of a switch, an inductor L, and a resistor R. The three components form a loop with the "input" port. The switch is used to control the on / off state and serves as the basic series path to verify the dielectric properties of the medium under test. Figure 3 The switch was removed, and the structure of L and R connected in series for input was maintained. At the same time, R was placed on the heating stage. By adding a temperature control link for the medium under test, the effect of temperature change on the dielectric properties of the medium under test was studied, and the changes in circuit impedance, phase and other characteristics were observed when the temperature changed. Figure 4 It is a voltage phasor diagram of an AC circuit. R The voltage phasor across the resistor is in phase with the current flowing through it. L It is the voltage phasor that leads the current across the inductor by 90°. 输入 For the total input voltage phasor, 待测 It is the voltage phasor of the medium under test. The phase angle reflects the phase difference between voltage phasors. The angle is the impedance angle of the medium being measured; Figure 5 It uses Origin plotting software to illustrate the relationship between the frequency and dielectric constant of the medium under test at room temperature; Figure 6 The relationship between the frequency and dielectric constant of the medium under test is shown using Origin plotting software at a high temperature of 50°C. Figure 7 The relationship between the frequency and dielectric constant of the medium under test is shown using Origin plotting software at a high temperature of 100℃. Figure 8 The Origin plotting software is used to illustrate the relationship between the frequency and dielectric constant of the medium under test at a high temperature of 150℃.

[0036] Example 1 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Step 2: Collect voltage and current data at different temperatures and frequencies; Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0037] Example 2 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Connect the resistor-inductor circuit to the signal generator, oscilloscope, and the medium under test, and then calibrate the signal generator and oscilloscope.

[0038] Step 2: Collect voltage and current data at different temperatures and frequencies; Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0039] Example 3 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Step 2: Collect voltage and current data at different temperatures and frequencies; Step 2.1: Collect voltage and current data at different frequencies at room temperature; Step 2.2: Collect voltage and current data at different frequencies under the first set temperature; Step 2.3: Collect voltage and current data at different frequencies under the second set temperature; Step 2.4: Collect voltage and current data at different frequencies under the third set temperature.

[0040] Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0041] Example 4 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Step 2: Collect voltage and current data at different temperatures and frequencies; Step 2.1: Collect voltage and current data at different frequencies at room temperature; Under room temperature conditions, the signal generator frequency is set to start from a set initial frequency and gradually increase to a set termination frequency in steps of set intervals. At each frequency point, a set number of repeated measurements are performed, and the time difference obtained from each measurement is recorded in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0042] Step 2.2: Collect voltage and current data at different frequencies under the first set temperature; Step 2.3: Collect voltage and current data at different frequencies under the second set temperature; Step 2.4: Collect voltage and current data at different frequencies under the third set temperature.

[0043] Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0044] Example 5 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Step 2: Collect voltage and current data at different temperatures and frequencies; Step 2.1: Collect voltage and current data at different frequencies at room temperature; Step 2.2: Collect voltage and current data at different frequencies under the first set temperature; Adjust the temperature control device to raise the experimental environment to the first set temperature and hold it at that temperature for a set time. Then, set the signal generator frequency to start from the initial set frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0045] Step 2.3: Collect voltage and current data at different frequencies under the second set temperature; Adjust the temperature control device to raise the experimental environment to the second set temperature and hold it at that temperature for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0046] Step 2.4: Collect voltage and current data at different frequencies under the third set temperature.

[0047] Adjust the temperature control device to raise the experimental environment to the third set temperature and hold it for the set time. Then, set the signal generator frequency to start from the set initial frequency and gradually increase it in steps of set interval frequencies until the set termination frequency. At each frequency point, perform a set number of repeated measurements and record the time difference obtained from each measurement in detail. The data is read and recorded using an oscilloscope, showing the input voltage U at each frequency point. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0048] Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0049] Example 6 This embodiment proposes a broadband high-temperature dielectric constant measurement method for non-magnetic test objects, including: Step 1: Set up a dielectric constant measurement system; Step 2: Collect voltage and current data at different temperatures and frequencies; Step 3: Calculate the dielectric constant of the test object at different frequencies and temperatures.

[0050] The dielectric constant is calculated using the following formula: , in, It is the input impedance; It is the impedance modulus of the medium under test; It is the reference impedance; It is the relative permittivity; It is the imaginary unit; It's the speed of light; It is the frequency of the input signal; It is the thickness of the medium being measured.

[0051] The frequency of the input signal is obtained using the following formula:

[0052]

[0053]

[0054]

[0055] in, It is the period of the input signal; It is the frequency of the input signal; It is the angle between the medium under test and the input voltage; It is the time difference of the input signal waveform; It is the impedance angle of the medium being measured; It is the phase angle between the input voltage and the inductor; U 电感 It is the voltage across the inductor; U 输入 It is the input voltage of the circuit; U 待测 It is the voltage across the medium being measured.

[0056] The impedance modulus of the medium under test is obtained by the following formula:

[0057] Among them, U 输入 It is the input voltage of the circuit; I is the impedance modulus of the medium under test; I is the current in the circuit.

[0058] To investigate the dielectric properties of non-magnetic test objects (UTPs) under high-frequency and medium-high-temperature environments, the measurement device used in one embodiment of this invention includes an RLGOL DG1062Z function signal generator, the UTP, an I-shaped inductor, and a SIGLENT SDS2304X oscilloscope. The RLGOL DG1062Z function signal generator serves as the core signal source, accurately generating stable sinusoidal signals with a frequency range of 1 to 10.5 MHz. Simultaneously, the SIGLENT SDS2304X high-precision oscilloscope is used to measure and record the current values, voltage amplitudes, and time differences between various signal waveforms in real time. The entire measurement circuit mainly consists of the UTP and the I-shaped inductor forming a standard RL measurement loop. The surface of the non-magnetic test medium sample is precisely processed to achieve a highly flat and uniform state. Furthermore, the experiment is equipped with a precisely temperature-controlled heating platform, enabling stable and reliable temperature regulation over a wide temperature range from room temperature to a maximum of 150 degrees Celsius. Ultimately, these diverse devices are organically connected in a scientifically sound manner to construct a complete and fully functional experimental system. This invention obtains the dielectric constant by measuring the impedance angle in the 1-10.5MHz frequency band. Data shows that this measurement method is fast, simple, low-cost, flexible, and comprehensive, providing theoretical support for the application of non-magnetic materials at high frequencies.

[0059] The measurement method in one embodiment of the present invention is as follows: System setup: First, the experimental platform is set up, and the resistor-inductor (RL) circuit is correctly connected to key instruments such as the signal generator and oscilloscope to ensure that each interface is stable and reliable. Then, the signal generator and oscilloscope are calibrated to ensure the accuracy of the measurement data and the repeatability of the experiment.

[0060] Room temperature measurement: Under room temperature conditions, the medium under test is connected to the pre-built RL circuit. The signal generator frequency is set to start from 1MHz and gradually increase to 10.5MHz in steps of 0.5MHz. At each frequency point, six repeated measurements are performed to reduce random errors, and the time difference obtained from each measurement is recorded in detail. data.

[0061] Signal acquisition and voltage / current measurement: Connect the oscilloscope's receiving probe to the circuit input line and the two ends of the medium under test, respectively. Use the oscilloscope's built-in mathematical operation function (math) to accurately read and record the input voltage U. 输入 Voltage U across the inductor 电感 Voltage U across the medium under test 待测 And the value of the current I in the circuit, calculated based on the relationship between voltage and resistance.

[0062] High-temperature environment measurement: Adjust the temperature control device to raise the experimental environment to 50℃, 100℃ and 150℃ respectively, and keep it at each target temperature for 30 minutes to allow the system to reach thermal equilibrium; then, repeat the complete process from frequency scanning to multiple measurements at each temperature to obtain experimental data under different temperature conditions.

[0063] Data processing and analysis: Based on the recorded voltage and current data, calculate the values ​​at each test frequency. The impedance parameters were determined; further data fitting was performed using specialized software. The system analyzes the influence of frequency changes and temperature rises and falls on circuit properties and dielectric electromagnetic characteristics.

[0064] The dielectric constant is calculated using data from room temperature as an example.

[0065] Table 1 Relationship between frequency and time difference

[0066] Table 2 Relationship between frequency and voltage

[0067] Table 3 Relationship between frequency and impedance angle

[0068] Table 4 Relationship between frequency and current

[0069] Table 5 Relationship between frequency and impedance

[0070] Table 6 Relationship between frequency and dielectric constant

[0071] Similarly, the dielectric constant at high temperatures can be obtained as follows: Table 7. Relationship between frequency and dielectric constant at 750℃

[0072] Table 8. Relationship between frequency and dielectric constant at 100℃

[0073] Table 9. Relationship between frequency and dielectric constant at 150℃

[0074] Based on the above data, a graph showing the relationship between frequency and dielectric constant is obtained. Figure 5 , Figure 6 , Figure 7 , Figure 8 .

[0075] Combination Figure 5 , Figure 6 , Figure 7 , Figure 8 As shown, under various temperature conditions, the dielectric constant ε consistently fluctuates within the range of 2.2 to 2.5, exhibiting relatively small variations and weak frequency dependence. Analysis of the plotting results under four different conditions demonstrates that this dielectric material possesses highly stable dielectric properties across the entire test frequency range.

[0076] The effect of temperature on the dielectric constant ε exhibits a clear stage-wise variation: within the temperature range of room temperature to 50℃ε, the average dielectric constant gradually increases from 2.30 to 2.33, with an overall increase of approximately 0.03. This trend is mainly attributed to the fact that the increase in temperature intensifies the thermal motion of molecules within the dielectric, enhances molecular polarization, and thus causes a slight increase in the dielectric constant. Within the temperature range of 50-150℃ε, the dielectric constant remains relatively stable, with the average value consistently around 2.33 and a fluctuation range of less than 0.02. This indicates that within this temperature range, the influence of high-temperature environment on the polarization characteristics of the dielectric is significantly weakened, the polarization mechanism within the material tends to reach equilibrium, and its dielectric properties exhibit good thermal stability.

[0077] This invention constructs a nonmagnetic dielectric constant measurement system based on an RL circuit, applicable to the 1–10.5 MHz frequency band and the temperature range from room temperature to 150 ℃, and systematically evaluates the dielectric properties of the material. The results show that the dielectric constant ε of the nonmagnetic medium remains highly stable in the 2.2–2.5 range, exhibiting weak frequency correlation. Fluctuations within the measured frequency band are minimal, and no obvious dispersion characteristics are observed, indicating that its dielectric behavior is not sensitive to frequency changes. Temperature conditions have a relatively mild impact on its dielectric properties; the average dielectric constant is approximately 2.30 at room temperature, slightly increasing after heating to 50 ℃ and stabilizing around 2.33. Even in high-temperature environments of 50–150 ℃, it still exhibits good dielectric stability. Furthermore, the RL circuit-based measurement scheme is simple in structure, low in cost, and provides reliable and stable measurement results, meeting the needs for dielectric constant determination of nonmagnetic media under wide bandwidth and medium-to-high temperature conditions. This provides effective technical support for subsequent related engineering applications and the promotion of laboratory dielectric measurement methods.

Claims

1. A method for non-magnetic object broadband high temperature dielectric constant measurement, characterized in that, The application relates to a dielectric constant measurement method. Step 1, establishing a dielectric constant measurement system; Step 2, collecting voltage and current data under different temperatures and frequencies respectively; Step 3, calculating the dielectric constant of the measured object under different frequencies and temperatures.

2. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 1, wherein, The step 1 comprises the following steps: connecting a resistance-inductance circuit with a signal generator, an oscilloscope and a measured medium, and then calibrating the signal generator and the oscilloscope.

3. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 1, wherein, The step 2 comprises the following steps: Step 2.1, collecting voltage and current data under different frequencies at room temperature; Step 2.2, collecting voltage and current data under different frequencies at a first set temperature; Step 2.3, collecting voltage and current data under different frequencies at a second set temperature; Step 2.4, collecting voltage and current data under different frequencies at a third set temperature.

4. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 3, wherein, The step 2.1 comprises the following steps: At room temperature, the signal generator frequency is set to start from the initial frequency, and gradually increase to the set end frequency with a set interval frequency as a step; at each frequency point, a set number of repeated measurements are made, and the time difference obtained by each measurement is recorded in detail The data is read by an oscilloscope and recorded at each frequency point 输入 The voltage across the inductor U 电感 The voltage across the medium to be measured U 待测 , and the value of the current I in the circuit converted according to the relationship between voltage and resistance.

5. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 3, wherein, The step 2.2 comprises the following steps: Adjust the temperature control device, the experimental environment to the first set temperature after setting time, set signal generator frequency from the initial frequency, set interval frequency step gradually increase to the set end frequency; at each frequency point, set the number of repeated measurements, and detailed records of each measurement obtained time difference Data, by oscilloscope read and record the input voltage U at each frequency point 输入 , inductance voltage U 电感 , the measured medium voltage U 待测 , and the current I in the circuit according to the voltage and resistance relationship conversion value.

6. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 3, wherein, The step 2.3 comprises the following steps: Adjust the temperature control device, the experimental environment to the second set temperature after setting time, set signal generator frequency from the initial frequency set, set interval frequency step gradually increased to the set end frequency; at each frequency point, set the number of repeated measurements, and detailed records of each measurement obtained time difference Data, by oscilloscope read and record the input voltage U at each frequency point 输入 , inductance voltage U 电感 , the measured medium voltage U 待测 , and the conversion of the voltage and resistance relationship obtained in the circuit current I value.

7. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 3, wherein, The step 2.4 comprises the following steps: Adjust the temperature control device, the experimental environment to the third set temperature after setting time, set signal generator frequency from the initial frequency set, set interval frequency step gradually increased to the set end frequency; at each frequency point, set the number of repeated measurements, and detailed records of each measurement obtained time difference Data, by oscilloscope read and record the input voltage U at each frequency point 输入 , inductance voltage U 电感 , the medium to be measured both ends voltage U 待测 , and the current I in the circuit according to the voltage and resistance relationship conversion value.

8. The method of claim 1, wherein, The dielectric constant is calculated through the following formula: ， wherein, is the input impedance; is the impedance mode of the medium under test; is the reference impedance; is the relative permittivity; is the imaginary unit; is the speed of light; is the frequency of the input signal; is the thickness of the medium under test.

9. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 8, wherein, The frequency of the input signal is obtained through the following formula: wherein, is the period of the input signal; is the frequency of the input signal; is the angle between the input voltage and the medium under test; is the time difference of the input signal waveform; is the impedance angle of the medium under test; is the phase angle of the input voltage and the inductance;U 电感 is the voltage across the inductance;U 输入 is the input voltage of the circuit;U 待测 is the voltage across the medium under test.

10. The non-magnetic DUT broadband high temperature dielectric constant measurement method of claim 9, wherein, The impedance modulus of the measured medium is obtained through the following formula: wherein U 输入 is the input voltage of the circuit; is the impedance modulus of the medium under test; I is the current in the circuit.

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