Interference test method and system, electronic equipment and storage medium

Abstract

The invention discloses an interference test method and system, electronic equipment and a storage medium, and belongs to the technical field of signal test. The method is applied to an interference test system, and the interference test system comprises a signal generator, a first tested optoelectronic device, a second tested optoelectronic device, a signal attenuator, a first reference optoelectronic device, a second reference optoelectronic device and a signal analysis device which are sequentially cascaded. The method comprises the following steps: controlling a first analog signal in a signal generator to sequentially pass through first tested photoelectric equipment, second tested photoelectric equipment and a signal attenuator to obtain a first test signal, and sending the first test signal to a signal analysis device; and one path continuously passes through the first reference photoelectric equipment and the second reference photoelectric equipment to obtain a first reference signal, and then the first reference signal is sent to the signal analysis device. By adopting the interference test system which is cascaded in sequence, the test link is simple, the error of background noise during test can be reduced, and the transmission characteristic of a unidirectional transmission signal can be adapted.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of signal testing, in particular to an interference test method and system, an electronic device, and a storage medium. BACKGROUND

[0002] In traditional electromagnetic compatibility (EMC, Electromagnetic Compatibility) tests, analog signals such as vehicle lamp PWM need to be transmitted in and out of an EMC darkroom through photoelectric devices. Referring to Figure 1 , the related art usually adopts a four-photoelectric-transceiver method to transmit analog signals. This method uses four photoelectric devices to form a loop. Two photoelectric transceivers inside the darkroom represent the photoelectric device and the measured object, and the two photoelectric transceivers outside the darkroom are connected to the auxiliary device and the sample, respectively. This four-photoelectric-isolation scheme increases the background noise error during testing due to the complex test link, and is only applicable to bidirectional synchronous communication signals and cannot adapt to the transmission characteristics of unidirectional transmission signals. SUMMARY

[0003] The embodiments of the present application provide an interference test method and system, an electronic device, and a storage medium. By using a cascaded interference test system, the test link is simple, the error of the background noise during testing can be reduced, and the transmission characteristics of unidirectional transmission signals can be adapted.

[0004] In a first aspect, the embodiments of the present application provide an interference test method applied to an interference test system. The interference test system includes a signal generator, a first measured photoelectric device, a second measured photoelectric device, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device, which are cascaded in sequence. The method includes: generating a first analog signal by the signal generator; The first analog signal is output after sequentially passing through the first measured photoelectric device, the second measured photoelectric device, and the signal attenuator, to obtain a first measured signal. The first analog signal is a unidirectional transmission analog signal. The first analog signal is output after sequentially passing through the first measured photoelectric device, the second measured photoelectric device, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device, to obtain a first reference signal. receiving the first measured signal and the first reference signal by the signal analysis device, and determining an interference test result according to the first measured signal and the first reference signal; The interference test result includes: the damage level of the first measured photoelectric device and the second measured photoelectric device, and / or the background noise in the first analog signal test process.

[0005] Optionally, before the first analog signal passes through the first optical device under test, the method further includes: determining the initial damage level of the first and second optical devices under test based on a preset grading strategy.

[0006] Optionally, the preset grading strategy includes the correspondence between grading parameter values ​​and damage levels; determining the initial damage levels of the first and second photoelectric devices under test based on the preset grading strategy includes: Determine the initial grading parameters of the test signal after it passes through the first and second photoelectric devices under test; The initial damage level of the first and second photoelectric devices under test is determined based on the initial grading parameters and the preset grading strategy.

[0007] Optionally, determining the interference test result of the first analog signal based on the first tested signal and the first reference signal includes: The first graded parameter of the first analog signal is determined based on the first measured signal and the first reference signal; The first damage level of the first and second photoelectric devices under test is determined based on the first grading parameters.

[0008] Optionally, the method further includes: The damage levels corresponding to the first and second photoelectric devices under test are adjusted from the initial damage level to the first damage level.

[0009] Optionally, the first classification parameter includes the duty cycle offset of the first analog signal.

[0010] Optionally, the method further includes: The first classification parameter and the first noise parameter of the first analog signal are determined based on the first measured signal and the first reference signal; Obtain the environmental noise parameters of the first simulated signal during the interference test process; Based on the first classification parameter, the first noise parameter, and the environmental noise parameter, determine whether the background noise during the first analog signal test process meets the preset conditions. The first classification parameter includes the duty cycle offset of the first analog signal, the first noise parameter includes the total harmonic distortion value of the first analog signal, and the environmental noise parameter includes the background noise margin. The step of determining whether the background noise during the first analog signal test process meets preset conditions based on the first classification parameter, the first noise parameter, and the environmental noise parameter includes: If the duty cycle offset of the first analog signal is less than or equal to a preset offset threshold, the total harmonic distortion of the first analog signal is less than or equal to a preset distortion threshold, and the background noise margin is greater than or equal to a preset noise margin threshold, then the background noise corresponding to the first analog signal is determined to meet the preset conditions.

[0011] Secondly, embodiments of the present invention also provide an interference testing system, comprising a signal generator, a first photoelectric device under test, a second photoelectric device under test, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device, which are cascaded in sequence. The signal generator is used to generate a first analog signal; The first analog signal is output after passing through the first photoelectric device under test, the second photoelectric device under test, and the signal attenuator in sequence to obtain the first measured signal; the first analog signal is a unidirectional transmission analog signal; The first analog signal is sequentially passed through the first photoelectric device under test, the second photoelectric device under test, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device before being output to obtain the first reference signal; The signal analysis device is used to receive the first test signal and the first reference signal, and to determine the interference test result based on the first test signal and the first reference signal; The interference test results include: The damage level of the first and second photoelectric devices under test, and / or the background noise during the first analog signal test.

[0012] Thirdly, embodiments of the present invention also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program or instructions, and the computer program, when executed by the processor, implements the interference testing method as described above.

[0013] Fourthly, embodiments of the present invention also provide a computer-readable storage medium having a computer program stored thereon, the computer program being loaded by a processor to perform the steps in the interference testing method described above.

[0014] The interference testing system provided in this application includes a signal generator, a first photoelectric device under test, a second photoelectric device under test, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device, all cascaded together. During interference testing, the signal generator generates a first analog signal. The first analog signal passes sequentially through the first photoelectric device under test, the second photoelectric device under test, and the signal attenuator before being output to obtain a first test signal. The first analog signal is a unidirectional transmission analog signal. The first analog signal passes sequentially through the first photoelectric device under test, the second photoelectric device under test, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device before being output to obtain a first reference signal. The signal analysis device receives the first test signal and the first reference signal and determines the interference test result based on the first test signal and the first reference signal. The interference test result includes the damage level of the first photoelectric device under test and the second photoelectric device under test, and / or the background noise during the first analog signal testing process. The embodiments of this application employ a cascaded interference testing system. Compared with the four-electro-optical transceiver method in the prior art, the test link is simpler, which can reduce the error of background noise during testing and can also adapt to the transmission characteristics of unidirectional transmission signals. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a schematic diagram of a four-electro-optical transceiver method disclosed in the prior art; Figure 2 This is a schematic diagram of the structure of an anti-interference testing system provided in an embodiment of this application; Figure 3 A flowchart of an interference testing method provided in an embodiment of this application; Figure 4 An example diagram of an analog signal transmission path provided in an embodiment of this application; Figure 5 An example diagram of an interference testing method provided in an embodiment of this application; Figure 6 A schematic diagram of device pre-classification management provided for an embodiment of this application; Figure 7 This is a schematic diagram of a dynamic degradation mechanism for a device under test provided in an embodiment of this application. Detailed Implementation

[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0018] In the description of this application, features marked with "first" or "second" may explicitly or implicitly include one or more features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0019] "A and / or B" includes the following three combinations: A only, B only, and a combination of A and B.

[0020] The use of "applies to" or "configured to" in this application implies open and inclusive language, which does not preclude applicability to or configuration to devices performing additional tasks or steps. Furthermore, the use of "based on" implies openness and inclusivity, because processes, steps, calculations, or other actions "based on" one or more conditions or values ​​may in practice be based on additional conditions or values ​​beyond those conditions.

[0021] In this application, the term "exemplary" is used to mean "used as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is provided to enable any person skilled in the art to make and use this application. Details are set forth in the following description for purposes of explanation. It should be understood that those skilled in the art will recognize that this application can be made without using these specific details. In other instances, well-known structures and processes are not described in detail to avoid obscuring the description of this application with unnecessary detail. Therefore, this application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

[0022] On one hand, this embodiment provides an interference testing method applied to an interference testing system. The interference testing system in this application is a four-terminal unidirectional testing system used to perform interference testing on unidirectional transmitted analog signals. Please refer to... Figure 2 The anti-interference test system in this application embodiment includes a signal generator, a first photoelectric device under test, a second photoelectric device under test, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device, which are cascaded in sequence.

[0023] The signal generator is used to output unidirectional analog signals to be tested, such as pulse width modulation (PWM) signals for vehicle lights, analog audio signals, linear current loop signals, DC voltage dimming signals, and thermocouple signals.

[0024] The first and second photoelectric devices under test can be analog signal photoelectric converters or digital signal photoelectric converters, used to simulate the photoelectric conversion link in actual EMC testing, and to perform photoelectric conversion and signal transmission on the analog signal output by the signal transmitter.

[0025] Signal attenuators are used to simulate transmission loss during signal transmission. For example, when the test signal is a vehicle headlight PWM signal, the signal attenuator can simulate the attenuation effect during signal transmission based on the length of the headlight wiring harness, thereby improving test accuracy.

[0026] The first and second reference optoelectronic devices can be analog signal optoelectronic converters or digital signal optoelectronic converters. During interference testing, the first and second reference optoelectronic devices can be placed inside a Faraday box, free from electromagnetic interference, to reconstruct the received test signal and provide an undisturbed original analog signal as a reference.

[0027] The signal analysis device is used to receive a first test signal and a first reference signal, and to calculate the analysis and test results of the first analog signal based on the first test signal and the first reference signal. For example, the signal analysis device in this embodiment can be a high-speed oscilloscope.

[0028] See further Figure 3 An interference testing method provided in this application includes the following steps: S110, Generate the first analog signal through the signal generator.

[0029] S120, the first analog signal is output after passing through the first photoelectric device under test, the second photoelectric device under test, and the signal attenuator in sequence to obtain the first measured signal; the first analog signal is a unidirectional transmission analog signal.

[0030] S130, the first analog signal is output after passing through the first photoelectric device under test, the second photoelectric device under test, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device in sequence to obtain the first reference signal.

[0031] S140. Receive the first test signal and the first reference signal through the signal analysis device, and determine the interference test result based on the first test signal and the first reference signal; the interference test result includes: the damage level of the first and second tested optoelectronic devices, and / or, the background noise during the first analog signal test.

[0032] Please see Figure 4 , Figure 4 This is an example diagram of an analog signal transmission path provided in an embodiment of this application. When the first analog signal is tested by an interference testing system, the signal transmission of the first analog signal is divided into two paths. One path passes through a first tested optoelectronic device, a second tested optoelectronic device, and a signal attenuator to obtain a first tested signal, which is then transmitted to the first channel of the signal analysis device. The other path passes through the first tested optoelectronic device, the second tested optoelectronic device, a signal attenuator, a first reference optoelectronic device, and a second reference optoelectronic device in sequence to obtain a first reference signal, which is then transmitted to the second channel of the signal analysis device.

[0033] The interference test results in this application embodiment may include the damage level of the first and second tested optoelectronic devices after the interference test, and the background noise during the first analog signal test. The above test results can be calculated by parameters such as the duty cycle offset, total harmonic distortion, and signal-to-noise ratio of the first analog signal after the test.

[0034] For example, the larger the duty cycle offset corresponding to the first analog signal, the greater the corresponding equipment damage and the greater the corresponding background noise.

[0035] The interference testing system provided in this application includes a cascaded signal generator, a first photoelectric device under test (PTD), a second PTD, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device. The signal generator generates a first analog signal. The first analog signal passes sequentially through the first PTD, the second PTD, and the signal attenuator before being output to obtain a first test signal. The first analog signal is a unidirectional transmission analog signal. The first analog signal passes sequentially through the first PTD, the second PTD, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device before being output to obtain a first reference signal. The signal analysis device receives the first test signal and the first reference signal and determines the interference test result based on them. Compared with the four-electro-optical transceiver method in the prior art, this application's cascaded interference testing system simplifies the test link, reduces background noise errors during testing, and is adaptable to the transmission characteristics of unidirectional signals.

[0036] In some embodiments, before the first analog signal is transmitted, the method further includes: determining the initial damage level of the first and second photoelectric devices under test based on a preset grading strategy.

[0037] Determining the initial damage level can clarify the initial damage level of the device under test, avoiding the use of devices that are already in a state of obsolescence.

[0038] Specifically, the preset grading strategy includes the correspondence between grading parameter values ​​and damage levels; determining the initial damage levels of the first and second tested optoelectronic devices based on the preset grading strategy includes: Determine the initial grading parameters of the test signal after passing through the first and second photoelectric devices under test; The initial damage levels of the first and second photoelectric devices under test are determined based on the initial grading parameters and the preset grading strategy.

[0039] In this embodiment, the initial damage level is used to represent the damage state of the current device. In this embodiment, the damage level of the device can be set to four levels: L1, L2, L3 and L4, and the corresponding grading parameter is the duty cycle offset ΔDuty.

[0040] The preset grading strategy includes different damage levels, and each damage level corresponds to a grading parameter value range. For example, the value range of the grading parameter corresponding to different damage levels can be: L1: ΔDuty≤1%; L2: 1%<ΔDuty≤2%; L3: 2%<ΔDuty≤4%; L4: ΔDuty>4%; Wherein, when ΔDuty>4%, it indicates that the damage to the first and second tested photoelectric devices is relatively serious, reaching the scrapping standard and prohibiting their use.

[0041] For example, if a device under test is subjected to 10 Bulk Current Injection (BCI) tests and the calculated ΔDuty is 3.5%, then the initial damage level of the device is marked as L3, and the device is limited to non-destructive testing.

[0042] The technical solution of this application embodiment pre-classifies the device under test by adopting a preset pre-classification strategy and determines the initial damage level of the device under test. The initial damage level can clearly indicate the damage state of the device under test, avoiding the use of devices under test that are already in a scrapped state, thereby improving testing efficiency.

[0043] After EMC radiation interference testing, the tested optoelectronic equipment will be damaged to a certain extent or be in a state of being scrapped. Using the equipment after it has expired will cause the background noise during the test to exceed the standard. Scrapping the equipment before it is damaged will waste noise resources. Therefore, this application embodiment also provides a method for evaluating the damage level of the equipment, which determines the damage level of the tested equipment based on the grading parameters corresponding to the first model signal.

[0044] In some embodiments, determining the interference test result of the first analog signal based on the first measured signal and the first reference signal includes: The first hierarchical parameters of the first analog signal are determined based on the first measured signal and the first reference signal; The first damage level of the first and second tested optoelectronic devices is determined based on the first classification parameters.

[0045] The first classification parameter includes the duty cycle offset of the first analog signal. The duty cycle offset is used to measure the accuracy loss of the analog signal in the time dimension. The calculation formula in this embodiment can be:

[0046] in, For the high-level duration of the output signal, It is a periodicity.

[0047] Specifically, the duty cycle offset of the first analog signal is compared with the preset range of damage grading parameters, and the damage levels of the first and second tested optoelectronic devices are adjusted based on the comparison results.

[0048] In this embodiment, the preset damage rating can be set to different levels according to the degree of damage to the device, and the preset damage rating parameter value range is the value range of the duty cycle offset corresponding to different damage levels.

[0049] For example, the preset damage classification and the parameter value range corresponding to each damage classification in this application are the same as the preset classification management strategy mentioned above, and will not be repeated here.

[0050] After conducting EMC radiation interference tests, the damage to the tested optoelectronic equipment will be more severe than the initial damage level. Therefore, it is necessary to dynamically adjust the damage level of the tested optoelectronic equipment based on the test results.

[0051] Based on this, the embodiments of this application further include: adjusting the damage level corresponding to the first and second photoelectric devices under test from the initial damage level to the first damage level.

[0052] For example, if the initial damage level of the first and second photoelectric devices under test is L1, and the duty cycle offset of the first analog signal is 3% after the interference test, the damage level of the first and second photoelectric devices under test is adjusted to L2 according to the preset parameter value range.

[0053] The technical solution of this application establishes a device damage level classification standard with duty cycle offset as the core. Based on this classification standard, the damage level of the tested optoelectronic device can be dynamically adjusted according to the duty cycle offset in the test results, thereby achieving accurate prediction of the lifespan of the tested device. This can avoid the situation where the device has reached the scrap condition but is still in use, and avoid the situation where the device that has not reached the scrap condition is scrapped in advance, thus avoiding the waste of test resources.

[0054] Based on the above embodiments, the method further includes: The first graded parameter and the first noise parameter of the first analog signal are determined based on the first measured signal and the first reference signal; Obtain the environmental noise parameters of the first simulated signal during the interference test; Based on the first classification parameter, the first noise parameter, and the environmental noise parameter, determine whether the background noise during the first analog signal test process meets the preset conditions.

[0055] The first grade parameter is the duty cycle offset, and the specific calculation method is described in the above embodiment.

[0056] The first noise parameter is the total harmonic distortion (THD) value, which measures the loss of purity of an analog signal in the frequency dimension. The formula for calculating THD in this embodiment is as follows:

[0057] in, v 1 represents the fundamental frequency amplitude. v n The amplitude is the nth harmonic, and the integration frequency band is from 150KHz to 5MHz.

[0058] The environmental noise parameter is the background noise margin, which can be directly measured.

[0059] Before conducting EMC radiated interference tests, it is necessary to measure and record the background noise level of the test system. This level must be lower than the noise margin corresponding to EMC standards (such as CISPR 25) to ensure that the current test environment meets the test requirements. However, current background noise testing of analog signals lacks a quantitative evaluation system for waveform distortion, making it impossible to correlate the mathematical relationship between equipment damage and noise margin attenuation. This may mask the true radiation of the device under test, leading to inaccurate measurement and quantification of the radiated emission value, resulting in inaccurate test results or test failure. This application provides a background noise evaluation standard by calculating the duty cycle offset and total harmonic distortion value of the analog signal, combined with the background noise margin.

[0060] Specifically, based on the first classification parameter, the first noise parameter, and the environmental noise parameter, it is determined whether the background noise during the first analog signal test process meets the preset conditions, including: If the duty cycle offset of the first analog signal is less than or equal to a preset offset threshold, the total harmonic distortion of the first analog signal is less than or equal to a preset distortion threshold, and the background noise margin is greater than or equal to a preset noise margin threshold, then the background noise corresponding to the first analog signal is determined to meet the preset conditions.

[0061] For example, in this application embodiment, the preset offset threshold is 4%, the preset distortion threshold is 8%, and the preset noise margin threshold is set to 6dB according to the requirements of CISPR 25 standard. Therefore, the qualified conditions for background noise in this application embodiment can be: ΔDuty≤4% and THD≤8% and noise margin≥6dB.

[0062] The technical solution of this application establishes a background noise evaluation standard that correlates waveform distortion and noise margin by combining duty cycle offset and total harmonic distortion value. This ensures that interference testing is carried out under qualified background noise conditions, realizes the rational and efficient use of equipment and laboratory resources, and improves the testing efficiency of EMC testing.

[0063] Based on the above embodiments, this embodiment of the invention uses a standard PWM signal as the first analog signal, a first photoelectric device under test as a photoelectric converter under test A, a second photoelectric device under test as a photoelectric converter under test B, an adjustable attenuator as the signal attenuator, a first reference photoelectric device as a reference photoelectric converter C, and a second reference photoelectric device as a reference photoelectric converter D as examples to illustrate the interference test method.

[0064] The functional and technical parameter requirements of each component in the interference testing device are shown in the table below:

[0065] Please see Figure 5 , Figure 5 This is an example diagram illustrating an interference testing method provided in an embodiment of this application. The transmission path of the signal under test is as follows: Signal generator → Photoelectric converter under test A → Fiber optic cable → Photoelectric converter under test B → Adjustable attenuator → First channel of high-speed oscilloscope.

[0066] The transmission path of the reference signal is: Signal generator → Detected photoelectric converter A → Fiber optic cable → Detected photoelectric converter B → Adjustable attenuator → Reference photoelectric converter C → Fiber optic cable → Reference photoelectric converter D → Second channel of high-speed oscilloscope.

[0067] In this embodiment, the attenuator is placed after the photoelectric sensor being tested to simulate the signal attenuation effect of a real vehicle headlight wiring harness.

[0068] Furthermore, the interference testing method provided in this application embodiment may specifically include the following steps: S510, performing pre-classification management on the device under test.

[0069] See also Figure 6 , Figure 6 This illustration shows a pre-classification management method for devices provided in this application. By performing a BCI test on the optoelectronic device under test and calculating the corresponding duty cycle offset, pre-classification management of the device is achieved based on the parameter range corresponding to the duty cycle offset. The optoelectronic devices under test are opto-converter A and opto-converter B in the interference testing device.

[0070] For example, if ΔDuty≤1%, the corresponding device under test is marked as L1 level; if 1%<ΔDuty≤2%, the corresponding device under test is marked as L2 level; if 2%<ΔDuty≤4%, the corresponding device under test is marked as L3 level; and if Δduty>4%, the corresponding device under test needs to be forcibly scrapped and cannot be used for subsequent interference testing.

[0071] S520 performs anti-interference tests on analog signals.

[0072] In this embodiment, the signal generator outputs a standard PWM signal with a frequency of 1kHz, a duty cycle of 30%, and a rise time of 50ns. The analog signal first passes through the photoelectric converter under test A (TX photoelectric A) and the photoelectric converter under test B (RX photoelectric B). During transmission, device damage and transmission loss are superimposed. The specific transmission process may include the following steps: S521 and TX Optoelectronic A convert analog signal input electrical signals into optical signals. The specific conversion formula is as follows:

[0073] in: I in For the input electrical signal; η A The electro-optical conversion efficiency is initially set at 0.8 W / A; λ is the laser aging factor, which increases by 15% after BCI testing. t The rising time.

[0074] Among these, the damage accumulation manifests as follows: duty cycle drift will lead to a decrease in rise time due to carrier mobility decay. t The extended rise time is t r The calculation formula is:

[0075] in, N stress The number of stress tests; k The fitted value is 0.03.

[0076] S522 and RX photoelectric B convert the optical signal transmitted from TX photoelectric A into an electrical signal. The specific process is as follows:

[0077] in, P out = P in , R B Photoresponsivity, initial value 0.9 A / W; σ The coefficient is the temperature drift coefficient, which rises to 0.05% / ℃ after aging; ΔT is the relative time. Next, the transmission loss is modeled, and the adjustable attenuator compensation function is:

[0078] in: α The fiber loss coefficient; l This is the equivalent length of the vehicle headlight wiring harness; typically, 5 meters corresponds to 20dB. Δ L aging Additional losses due to aging, such as ≥2dB for L3 level equipment.

[0079] S523, with an attenuator applying 20dB loss, simulates a 5-meter cable harness.

[0080] S524 The test signal is output to the first channel of the high-speed oscilloscope after the adjustable attenuator of the signal under test. The reference photoelectric converter C (TX photoelectric C) and the reference photoelectric converter D (RX photoelectric D) output reference signals to the oscilloscope.

[0081] S530. Evaluate the interference noise based on the test results.

[0082] The duty cycle offset and total harmonic distortion (THD) values ​​are calculated based on the test and reference signals. Damage-noise correlation analysis is then performed using these values, with the specific mapping relationships shown in the table below.

[0083] See also Figure 7 , Figure 7 This is a schematic diagram of a dynamic degradation mechanism for a device under test provided in an embodiment of this application.

[0084] For example, if the initial state of the device under test is marked as L1 (ΔDuty=0.8%), after performing 3 BCI tests, ΔDuty=1.7%, at which point the device under test is downgraded to L2; after performing 5 ESD tests, ΔDuty=4.2%, and the device under test is forcibly scrapped.

[0085] The technical solution of this application presents a cascaded four-terminal unidirectional test topology to replace the bidirectional architecture in the prior art. This solution eliminates the need for bidirectional signal transmission, and the relatively simple link reduces background noise errors. Furthermore, this application provides a damage grading standard based on duty cycle offset, establishing a correlation model between waveform distortion and background noise margin to evaluate background noise. This enables the rational and efficient use of equipment and laboratory resources, improving the efficiency of EMC testing and remediation.

[0086] This application embodiment also provides an interference testing system, including a signal generator, a first photoelectric device under test, a second photoelectric device under test, a signal attenuator, a first reference photoelectric device, a second reference photoelectric device, and a signal analysis device, which are cascaded in sequence. The signal generator is used to generate a first analog signal; The first analog signal is output after passing through the first photoelectric device under test, the second photoelectric device under test, and the signal attenuator in sequence to obtain the first measured signal; the first analog signal is a unidirectional transmission analog signal; The first analog signal is sequentially passed through the first photoelectric device under test, the second photoelectric device under test, the signal attenuator, the first reference photoelectric device, and the second reference photoelectric device before being output to obtain the first reference signal; The signal analysis device is used to receive the first test signal and the first reference signal, and to determine the interference test result based on the first test signal and the first reference signal; The interference test results include: The damage level of the first and second photoelectric devices under test, and / or the background noise during the first analog signal test.

[0087] In some embodiments, the system further includes: The damage level determination module is used to determine the initial damage level of the first and second photoelectric devices under test based on a preset grading strategy.

[0088] The preset grading strategy includes the correspondence between grading parameter values ​​and damage levels; determining the initial damage levels of the first and second photoelectric devices under test based on the preset grading strategy includes: Determine the initial grading parameters of the test signal after it passes through the first and second photoelectric devices under test; The initial damage level of the first and second photoelectric devices under test is determined based on the initial grading parameters and the preset grading strategy.

[0089] The damage level determination module is also used for: Determining the interference test result of the first analog signal based on the first tested signal and the first reference signal includes: The first graded parameter of the first analog signal is determined based on the first measured signal and the first reference signal; The first damage level of the first and second photoelectric devices under test is determined based on the first grading parameters.

[0090] The first classification parameter includes the duty cycle offset of the first analog signal.

[0091] In some embodiments, the system further includes: The damage level adjustment module is used to adjust the damage level of the first tested optoelectronic device and the second tested optoelectronic device from the initial damage level to the first damage level.

[0092] In some embodiments, the system further includes: The background noise detection module is used for: The first classification parameter and the first noise parameter of the first analog signal are determined based on the first measured signal and the first reference signal; Obtain the environmental noise parameters of the first simulated signal during the interference test process; Based on the first classification parameter, the first noise parameter, and the environmental noise parameter, determine whether the background noise during the first analog signal test process meets the preset conditions. The first classification parameter includes the duty cycle offset of the first analog signal, the first noise parameter includes the total harmonic distortion value of the first analog signal, and the environmental noise parameter includes the background noise margin.

[0093] Specifically, determining whether the background noise during the first analog signal testing process meets preset conditions based on the first classification parameter, the first noise parameter, and the environmental noise parameter includes: If the duty cycle offset of the first analog signal is less than or equal to a preset offset threshold, the total harmonic distortion of the first analog signal is less than or equal to a preset distortion threshold, and the background noise margin is greater than or equal to a preset noise margin threshold, then the background noise corresponding to the first analog signal is determined to meet the preset conditions.

[0094] This embodiment also provides an electronic device, including a memory and a processor. The memory stores a computer program or instructions, and when the computer program is executed by the processor, it implements the method of any of the above embodiments.

[0095] This embodiment also provides a computer-readable storage medium having a computer program stored thereon, the computer program being loaded by a processor to perform the steps of any of the methods in the above embodiments.

[0096] In the embodiments of this application, the storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM), etc.

[0097] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0098] The interference testing method, system, electronic device, and storage medium provided in the embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method of interference testing, characterized by, The method is applied to an interference test system, and the interference test system comprises, in sequence, a signal generator, a first to-be-tested optoelectronic device, a second to-be-tested optoelectronic device, a signal attenuator, a first reference optoelectronic device, a second reference optoelectronic device, and a signal analysis device; the method comprises the following steps: generating a first analog signal by the signal generator; the first analog signal is output after sequentially passing through the first to-be-tested optoelectronic device, the second to-be-tested optoelectronic device, and the signal attenuator, to obtain a first to-be-tested signal; the first analog signal is a unidirectional transmission analog signal; the first analog signal is output after sequentially passing through the first to-be-tested optoelectronic device, the second to-be-tested optoelectronic device, the signal attenuator, the first reference optoelectronic device, and the second reference optoelectronic device, to obtain a first reference signal; receiving the first to-be-tested signal and the first reference signal by the signal analysis device, and determining an interference test result according to the first to-be-tested signal and the first reference signal; the interference test result comprises: damage levels of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device, and / or background noise in a test process of the first analog signal.

2. The method of claim 1, wherein, Before the first analog signal passes through the first to-be-tested optical device, the method further comprises the following step: determining initial damage levels of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device based on a preset grading strategy.

3. The method of claim 2, wherein, The preset grading strategy comprises a corresponding relationship between grading parameter values and damage levels; the step of determining the initial damage levels of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device based on the preset grading strategy comprises the following steps: determining initial grading parameters of a test signal after the test signal passes through the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device; determining the initial damage levels of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device corresponding to the initial grading parameters and the preset grading strategy.

4. The method of claim 2, wherein, The step of determining the interference test result of the first analog signal based on the first to-be-tested signal and the first reference signal comprises the following steps: determining a first grading parameter of the first analog signal based on the first to-be-tested signal and the first reference signal; determining a first damage level of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device based on the first grading parameter.

5. The method according to claim 4, wherein: the first grading parameter comprises a duty cycle offset of the first analog signal.

6. The method of claim 4, wherein, The method further comprises the following step: adjusting the damage levels of the first to-be-tested optoelectronic device and the second to-be-tested optoelectronic device from the initial damage levels to the first damage levels.

7. The method of claim 2, wherein, The method further comprises the following steps: determining a first grading parameter and a first noise parameter of the first analog signal based on the first to-be-tested signal and the first reference signal; obtaining an environmental noise parameter of the first analog signal in an interference test process; determining whether background noise in the test process of the first analog signal meets a preset condition based on the first grading parameter, the first noise parameter, and the environmental noise parameter; The first grading parameter comprises a duty cycle offset of the first analog signal, the first noise parameter comprises a total harmonic distortion value of the first analog signal, and the ambient noise parameter comprises a background noise margin; The determining whether the background noise in the first analog signal test process satisfies the preset condition based on the first grading parameter, the first noise parameter, and the ambient noise parameter comprises: In a case where the duty cycle offset of the first analog signal is less than or equal to a preset offset threshold, the total harmonic distortion value of the first analog signal is less than or equal to a preset distortion threshold, and the background noise margin is greater than or equal to a preset noise margin threshold, it is determined that the background noise corresponding to the first analog signal satisfies the preset condition.

8. An interference test system, characterized by The interference test device comprises a signal generator, a first measured optoelectronic device, a second measured optoelectronic device, a signal attenuator, a first reference optoelectronic device, a second reference optoelectronic device, and a signal analysis device, which are sequentially connected in series. The signal generator is configured to generate a first analog signal. The first analog signal is sequentially transmitted through the first measured optoelectronic device, the second measured optoelectronic device, and the signal attenuator, and is output to obtain a first measured signal. The first analog signal is sequentially transmitted through the first measured optoelectronic device, the second measured optoelectronic device, the signal attenuator, the first reference optoelectronic device, and the second reference optoelectronic device, and is output to obtain a first reference signal. The signal analysis device is configured to receive the first measured signal and the first reference signal, and determine an interference test result based on the first measured signal and the first reference signal. The interference test result comprises: The damage levels of the first measured optoelectronic device and the second measured optoelectronic device, and / or the background noise in the first analog signal test process.

9. An electronic device, comprising: The interference test device comprises a memory and a processor, and the memory stores a computer program or instructions.

10. A computer-readable storage medium, characterized in that, The computer program is loaded by the processor to execute the steps in the interference test method of any one of claims 1 to 7.

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