A data analysis-based solid-state battery performance testing method and system

By adaptively adjusting the wavelet basis shape by calculating the local transient response exponent and morphological matching degree, the problem of missed detection of micro short circuit signals in solid-state batteries is solved, and high-precision micro short circuit detection is achieved.

CN121633848BActive Publication Date: 2026-06-26DONGGUAN MAOSHENG NEW ENERGY TECH CO LTD
2 Cites 0 Cited by

Patent Information

Application Number
CN202511801117.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-12-02
Publication Date
2026-06-26
Estimated Expiration
2045-12-02

AI Technical Summary

Technical Problem

In existing technologies, fixed mother wavelets cannot achieve optimal matching with various types of fault signals, resulting in low signal-to-noise ratio for feature extraction of micro short-circuit signals from solid-state batteries, making them prone to missed detection and failing to meet the testing requirements for high safety levels.

Method used

By dynamically generating deformable wavelet basis functions through the calculation of local transient response exponent, and combining the shape matching degree to calculate micro-short circuit characteristic values, the shape of the wavelet basis is adaptively adjusted to improve signal matching capability. The deformable wavelet basis functions are generated by combining local transient response exponent with signal-to-noise ratio, and a penalty term is introduced to eliminate non-fault interference signals.

Benefits of technology

It significantly improves the ability to capture and detect micro-short-circuit signals, reduces the false alarm rate, and meets the testing requirements for high safety levels.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The present application relates to the technical field of data analysis, and more particularly, to a solid-state battery performance test method and system based on data analysis, comprising: obtaining voltage time series data of a solid-state battery, and removing a direct current component to obtain a fluctuating voltage sequence; based on a ratio of a second-order difference to a first-order difference of the fluctuating voltage sequence and a signal-to-noise ratio, calculating a local transient response index at each time, which is used to represent a local steepness of voltage fluctuation. The present application aims at the problem that solid-state battery micro-short circuit waveforms are diverse and easily covered by noise, and through constructing a local transient response index, the steepness of voltage fluctuation is quantified in real time, and a small deformation wavelet basis function highly matched with the current signal form is dynamically generated, and a feature value calculation method with a form proximity penalty term is introduced, so that precise matching and enhancement of weak short circuit signals are realized, non-fault interference is effectively eliminated, and the signal-to-noise ratio and accuracy of detection are significantly improved.
Need to check novelty before this filing date? Find Prior Art