Integrated electric propulsion plasma plume on-orbit diagnosis data processing method and system

Abstract

The invention provides an integrated electric propulsion plasma plume on-orbit diagnosis data processing method and system, and relates to the field of plasmas, the method is applied to an integrated electric propulsion plasma plume on-orbit diagnosis system, the diagnosis system comprises a probe module, a probe frame, a circuit module, a mechanical interface module and a signal transmission cable, the probe module is fixedly connected to the probe frame through threads, the probe frame is fixedly connected to the mechanical interface module through threads, and the circuit module is located in a spacecraft and electrically connected with the probe module through a signal transmission cable; the method comprises the following steps: acquiring probe measurement data of the thruster through a plurality of types of probes in a probe module; a measuring probe analog signal corresponding to probe measuring data is converted into a digital signal through a circuit module, real-time processing of the probe measuring data and real-time performance monitoring of a thruster are carried out through interface downloading data on the basis of the digital signal, and an electric propulsion plasma plume on-orbit diagnosis result is obtained.

Description

Technical Field

[0001] This application relates to the field of plasma technology, and in particular to an integrated electric propulsion plasma plume on-orbit diagnostic data processing method and system. Background Technology

[0002] Currently, to meet the mission requirements of deep space exploration, space electric propulsion technologies, represented by Hall thrusters, which offer long lifespan and high specific impulse, are developing rapidly. Hall thrusters are a type of space electric propulsion technology that uses orthogonal electromagnetic fields to ionize the working gas and generate thrust. They offer advantages such as long lifespan, simple and adjustable design, and precisely adjustable thrust, and have played a crucial role in space missions such as satellite orbit maintenance and main propulsion for deep space exploration. During the thruster's on-orbit operation, its plasma plume parameters (such as ion energy distribution and plume divergence angle) directly reflect the thruster's operating status, performance efficiency, and potential contamination effects on the spacecraft platform. Therefore, real-time and accurate plume diagnosis is essential. However, the accuracy of existing on-orbit diagnostic data for real-time plume diagnosis is relatively low. Summary of the Invention

[0003] The purpose of this invention is to provide an integrated electric propulsion plasma plume on-orbit diagnostic data processing method and system to solve the technical problem of low accuracy of existing on-orbit diagnostic data for real-time diagnosis of plasma plumes.

[0004] In a first aspect, this application provides an integrated on-orbit diagnostic data processing method for electric propulsion plasma plumes, applied to an integrated on-orbit diagnostic system for electric propulsion plasma plumes. The integrated on-orbit diagnostic system for electric propulsion plasma plumes includes a probe module, a probe frame, a circuit module, a mechanical interface module, and a signal transmission cable. The probe module is threadedly fixed to the probe frame, and the probe frame is threadedly fixed to the mechanical interface module. The circuit module is located inside the spacecraft and is electrically connected to the probe module via the signal transmission cable. The method includes: The thruster's probe measurement data is obtained through various types of probes in the probe module; The circuit module converts the analog signal of the probe corresponding to the probe measurement data into a digital signal, and based on the digital signal, it transmits data through the interface to perform real-time processing of the probe measurement data and real-time monitoring of the thruster's performance, thereby obtaining the on-orbit diagnostic results of the electric propulsion plasma plume.

[0005] In one possible implementation, the probe module is a detachable probe module, and the various types of probes in the probe module include erosion sensors, hindrance potential analyzers, planar Langmuir probes, Faraday probes, and spherical Langmuir probes; the planar Langmuir probe includes a first collecting electrode, an insulating ceramic, a first guard electrode, and a first upper and lower electrical connection assembly, wherein the first collecting electrode and the first guard electrode are simultaneously applied a scanning voltage of -20 to 80 V; the spherical Langmuir probe includes a second collecting electrode, an insulating assembly, a second guard electrode, a second upper and lower electrical connection assembly, an insulating connection, and a base, wherein the second collecting electrode and the second guard electrode are simultaneously applied a scanning voltage of -20 to 80 V. V-scanning voltage; the hysteresis potential analyzer includes an inlet grid, a shielding grid, a scanning grid, a collecting electrode, a positioning shaft, a positioning ring, a bias copper sheet, front and rear covers, and wire clamps, the wire clamps being used to fix the wires; the body of the erosion sensor includes a chromium oxide ceramic substrate and a corresponding silver plating layer on its surface; the various types of probes are probes of different types and / or different sizes selected according to different measurement tasks; the acquisition of thruster probe measurement data through the various types of probes in the probe module includes: The plasma parameters of the thruster's beam region are obtained through the planar Langmuir probe, wherein the plasma parameters of the beam region include at least one of the thruster's beam region plasma density, electron temperature, and space potential. The plasma parameters of the thruster's recirculation region are obtained through the spherical Langmuir probe, wherein the plasma parameters of the recirculation region include at least one of the thruster's recirculation region plasma density, electron temperature, and space potential; The beam current value and plume divergence half-angle of the thruster are obtained through the Faraday probe; The ion energy distribution function of the beam region of the thruster is obtained by the hindrance potential analyzer. The erosion sensor is used to diagnose the erosion rate of the spacecraft surface caused by the backflow of electric propulsion in response to the thruster by measuring the change in thin film resistance caused by sputtering of film surface material under ion bombardment.

[0006] In one possible implementation, the circuit module includes a power processing unit, a satellite overall control unit, and a signal measurement unit; the step of converting the analog signal of the probe measurement data corresponding to the probe measurement data into a digital signal through the circuit module, and performing real-time processing of the probe measurement data and real-time monitoring of the thruster performance based on the digital signal transmitted through an interface includes: The power processing unit converts the 28V bus voltage into the voltage required by each probe in the probe module and powers the probes. The signal measurement unit converts the analog signal of the probe corresponding to the probe measurement data into a digital signal, transmits the digital signal to the satellite overall control unit in real time, and performs real-time processing of the probe measurement data and real-time monitoring of the thruster performance by transmitting data down through the 1553B bus interface. The satellite overall control unit generates control signals, and the interface between the power processing unit and the satellite overall control unit includes level signals for controlling the power switches of each probe according to the control signals and analog and digital data paths for the probe measurement section to return measurement signals.

[0007] In one possible implementation, the power processing unit includes: a -30 V voltage generation unit, a 0.1 V voltage generation unit, a -20~80 V scanning voltage generation unit, and a 0~600 V scanning voltage generation unit; the method further includes: The -30 V voltage generation unit provides power to the collector, guard, RPA shielded gate, and the -20~80 V scanning voltage generation unit. A wide input voltage DC / DC controller chip is used to execute a flyback boost-buck topology. The coupling inductor is driven by an N-channel MOSFET. When the switch is on, energy is stored in the main winding of the inductor. When the switch is off, the energy is released to the load through the secondary winding and the DC blocking capacitor to convert 28 V to -30 V. The -20~80 V scanning voltage generation unit supplies power to the collector and protection terminals of PLP and SLP. The 1MHz crystal oscillator signal is divided to a specified value by a frequency divider and then input to the digital-to-analog converter chip via a specified bit counter to output a -1~4 V scanning voltage signal within a specified time period. The -1~4 V scanning voltage signal is then amplified by a signal amplification module composed of a power operational amplifier to generate a -20~80 V scanning voltage signal. The 0.1 V voltage generation unit powers the erosion sensor in the probe module, and the output is linearly adjustable using a constant 50 μA current source inside a low-dropout linear regulator and a programmable resistor to convert 28 V to 0.1 V. The 0~600 V scanning voltage generation unit supplies power to the RPA scanning gate. A low-dropout linear regulator is used to regulate and step down the power supply and generate an error amplifier reference voltage. The high-voltage capacitor charging controller chip controls the transformer to boost and rectify the voltage to charge the high-voltage capacitor and raise the output voltage. A portion of the output voltage is compared with the input 0~5 V control signal, amplified, and fed back to the FB pin of the high-voltage capacitor charging controller chip. The high-voltage capacitor charging controller chip switches between working, holding, and non-working states to make the output voltage follow the 0~5 V control signal for linear scanning.

[0008] In one possible implementation, the signal measurement unit includes: a PLP, an SLP, an FP current measurement circuit, an RPA collector current measurement circuit, and an erosion sensor loop current measurement circuit; the method further includes: The FP current measurement circuit converts currents from -1 mA to 40 mA into Δ-Σ modulator bit currents based on an isolation modulator. The RPA collector current measurement circuit converts a current of 0μA to 20μA into an analog signal of 0V to 1V based on an instrumentation amplifier. The current measurement circuit of the erosion sensor loop converts the 1mA~50mA current of the instrumentation amplifier into an analog signal of 0.02V~1V.

[0009] In one possible implementation, the probe frame is manufactured by 3D printing of aluminum alloy to have electromagnetic interference resistance; the four sides and bottom of the probe frame are provided with reinforcing ribs, which are used to improve rigidity and strength and enhance stability so as not to deform under the high-intensity shock and vibration during satellite launch. The probe frame has a groove in the middle of its bottom surface for fixing a standard electrical connector, so that the probe module and the signal transmission cable are electrically connected. The signal transmission cable is an aerospace standard information transmission bus standard. The probe frame has grooves on all five sides except the bottom for fixing the probe module; the erosion sensor, the hindrance potential analyzer, the planar Langmuir probe and the Faraday probe are fixed around the probe frame, and the spherical Langmuir probe is fixed at the top of the probe frame.

[0010] In one possible implementation, the base of the mechanical interface module is connected to the robotic arm and the spacecraft via a standard flange; the base is a motion platform for translational, rotational, or combined motion. The satellite overall control unit in the circuit module is used to control the movement of the base through commands and drive the robotic arm, the probe module and the probe frame to move through the base, so as to meet the position requirements in different probe missions through movement.

[0011] Secondly, this application provides an integrated on-orbit diagnostic data processing system for electric propulsion plasma plumes, applied to an integrated on-orbit diagnostic system for electric propulsion plasma plumes. The integrated on-orbit diagnostic system for electric propulsion plasma plumes includes a probe module, a probe frame, a circuit module, a mechanical interface module, and a signal transmission cable. The probe module is threadedly fixed to the probe frame, and the probe frame is threadedly fixed to the mechanical interface module. The circuit module is located inside the spacecraft and is electrically connected to the probe module via the signal transmission cable. The integrated on-orbit diagnostic data processing system for electric propulsion plasma plumes includes: The acquisition module is used to acquire probe measurement data of the thruster through various types of probes in the probe module; The monitoring module is used to convert the analog signal of the probe measurement data corresponding to the probe measurement data into a digital signal through the circuit module, and to perform real-time processing of the probe measurement data and real-time monitoring of the thruster performance based on the digital signal transmitted through the interface, so as to obtain the on-orbit diagnostic results of the electric propulsion plasma plume.

[0012] Thirdly, this application also provides an electronic device, including a memory and a processor, wherein the memory stores a computer program that can run on the processor, and the processor executes the computer program to implement the method described in the first aspect above.

[0013] Fourthly, this application also provides a computer-readable storage medium storing computer-executable instructions that, when invoked and executed by a processor, cause the processor to perform the method described in the first aspect above.

[0014] This application brings the following beneficial effects: This application provides an integrated on-orbit diagnostic data processing method and system for electric propulsion plasma plumes. The method is applied to an integrated on-orbit diagnostic system for electric propulsion plasma plumes. This system includes a probe module, a probe frame, a circuit module, a mechanical interface module, and a signal transmission cable. The probe module is threadedly fixed to the probe frame, and the probe frame is threadedly fixed to the mechanical interface module. The circuit module is located inside the spacecraft and is electrically connected to the probe module via the signal transmission cable. The method can acquire thrust probe measurement data through various types of probes in the probe module. The circuit module converts the analog signals corresponding to the probe measurement data into digital signals, and based on the digital signals, performs real-time processing of the probe measurement data and real-time monitoring of thrust performance through the interface. This approach obtains on-orbit diagnostic results for electric propulsion plasma plumes. The integrated on-orbit diagnostic system for electric propulsion plasma plumes utilizes probe modules, probe frames, circuit modules, mechanical interface modules, and signal transmission cables. The probe modules, containing various types of probes, acquire multi-faceted probe measurement data of the thruster. The circuit modules then convert the analog signals corresponding to the multi-faceted probe measurement data into digital signals. Based on these digital signals, data is transmitted via an interface for real-time processing of the probe measurement data and real-time monitoring of the thruster's performance. This provides highly economical, reliable, and scalable in-situ measurements for on-orbit diagnosis of electric propulsion plumes, improving the accuracy of on-orbit diagnostic data for real-time plume diagnosis and addressing the technical problem of low accuracy in existing on-orbit diagnostic data for real-time plume diagnosis.

[0015] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0017] Figure 1 A schematic flowchart illustrating the integrated electric propulsion plasma plume on-orbit diagnostic data processing method provided in this application embodiment; Figure 2 A top view of the detachable probe module and probe frame in the integrated electric propulsion plasma plume on-orbit diagnostic system provided in an embodiment of the present invention; Figure 3A schematic diagram of an integrated electric propulsion plasma plume on-orbit diagnostic system provided in an embodiment of the present invention; Figure 4 An isometric view of the detachable probe module and probe frame in the integrated electric propulsion plasma plume on-orbit diagnostic system provided in an embodiment of the present invention; Figure 5 The integrated electric propulsion plasma plume on-orbit diagnostic system provided for embodiments of the present invention includes a series of detachable probe modules comprising an erosion sensor, a hindrance potential analyzer, a planar Langmuir probe, a Faraday probe, and a spherical Langmuir probe. Figure 6 An isometric view of the probe frame in the integrated electric propulsion plasma plume on-orbit diagnostic system provided in an embodiment of the present invention; Figure 7 A system schematic diagram of the circuit module in the integrated electric propulsion plasma plume on-orbit diagnostic system provided in an embodiment of the present invention; Figure 8 A schematic diagram of an integrated electric propulsion plasma plume on-orbit diagnostic data processing system provided in this application embodiment; Figure 9 A schematic diagram of the structure of an electronic device provided in an embodiment of this application is shown. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0019] The terms "comprising" and "having," and any variations thereof, used in the embodiments of this application, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the steps or units listed, but may optionally include other steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices.

[0020] Currently, existing multi-probe on-orbit diagnostic systems include: the Heinrich Hertz mission-EPDP, the Express-A#2 & 3 mission-DRTs, the Deep Space mission, and the Stentor mission. Among them, the EPDP is primarily used to study the interaction between electric thruster backflow and the spacecraft surface. The satellite is equipped with a pair of HEMPT 3050 thrusters and a pair of SPT 100 Hall thrusters as redundancy. For the EPDP probe package used for thruster diagnostics, the main probe package contains a planar Langmuir probe and a hindrance potential analyzer, fixed to the spacecraft. An erosion sensor is also fixed separately to the spacecraft.

[0021] However, current integrated electric propulsion systems either carry a limited variety of probes or have low integration, resulting in highly dispersed and bulky probes. Furthermore, they are limited to single missions, leading to poor economic efficiency, and are generally fixed to the spacecraft surface with limited measurement points. Moreover, in existing technologies, low-integration probe systems occupy significant space within the spacecraft, reducing economic efficiency, and poorly designed multi-probe systems can increase system complexity, thereby decreasing reliability. Therefore, the accuracy of existing on-orbit diagnostic data for real-time plume monitoring is relatively low.

[0022] Based on this, the present application provides an integrated electric propulsion plasma plume on-orbit diagnostic data processing method and system, which can solve the technical problem of low accuracy of existing on-orbit diagnostic data of plasma plumes for real-time diagnosis.

[0023] The embodiments of the present invention will be further described below with reference to the accompanying drawings.

[0024] Figure 1 This is a flowchart illustrating an integrated electric propulsion plasma plume on-orbit diagnostic data processing method provided in an embodiment of this application. The method is applied to an integrated electric propulsion plasma plume on-orbit diagnostic system, such as... Figure 2 and Figure 3 As shown, the integrated electric propulsion plasma plume on-orbit diagnostic system includes a probe module 1, a probe frame 2, a circuit module 3, a mechanical interface module 4, and a signal transmission cable 5. The probe module 1 is threadedly fixed to the probe frame 2, and the probe frame 2 is threadedly fixed to the mechanical interface module 4. The circuit module 3 is located inside the spacecraft and is electrically connected to the probe module 1 via the signal transmission cable 5. Figure 1 As shown, the method includes: Step S110: Obtain probe measurement data of the thruster through various types of probes in the probe module.

[0025] In one possible implementation, probe module 1 is a detachable probe module. The probe module contains various types of probes, including an erosion sensor, a hindrance potential analyzer, a planar Langmuir probe, a Faraday probe, and a spherical Langmuir probe. The planar Langmuir probe includes a first collecting electrode, an insulating ceramic, a first guard electrode, and a first upper and lower electrical connection assembly. The first collecting electrode and the first guard electrode are simultaneously applied with a scanning voltage of -20 to 80 V. The spherical Langmuir probe includes a second collecting electrode, an insulating assembly, a second guard electrode, a second upper and lower electrical connection assembly, an insulating connection, and a base. The second collecting electrode and the second guard electrode are simultaneously applied with a scanning voltage of -20 to 80 V. The hindrance potential analyzer includes an inlet grid, a shielding grid, a scanning grid, a collecting electrode, a positioning shaft, a positioning ring, a bias copper sheet, front and rear covers, and a wire clamp. The wire clamp is used to fix the wires. The body of the erosion sensor includes a chromium oxide ceramic substrate and a corresponding silver plating layer on its surface. The aforementioned various types of probes are different types and / or different sizes of probes selected according to different measurement tasks. The acquisition of thruster probe measurement data through the various types of probes in the probe module may specifically include the following steps: The plasma parameters of the thruster's beam region are obtained by using a planar Langmuir probe. The plasma parameters of the beam region include at least one of the thruster's beam region plasma density, electron temperature, and space potential. The plasma parameters of the thruster's recirculation region are obtained using a spherical Langmuir probe. These parameters include at least one of the following: thruster recirculation region plasma density, electron temperature, and space potential. The thruster beam current and plume divergence half-angle were obtained using a Faraday probe; the ion energy distribution function in the thruster beam region was obtained using a hysteresis potential analyzer; and the erosion rate of the thruster on the spacecraft surface caused by the sputtering of film surface material under ion bombardment was diagnosed by measuring the change in film resistance using an erosion sensor.

[0026] For example, such as Figure 5The detachable probe modules shown all use aluminum alloy bases measuring 45 mm * 45 mm * 5 mm, which are fixed to the grooves of the probe frame via M4 threads. The electrodes of the detachable probe modules (erosion sensor, hindrance potential analyzer, planar Langmuir probe, Faraday probe, and spherical Langmuir probe) are all fabricated using magnetron sputtering technology to form a 1 μm titanium nitride coating on the surface of titanium alloy. This is because titanium alloy has advantages such as high conductivity, weak magnetism, high structural strength, and light weight. Compared to titanium alloy, titanium nitride coating has higher corrosion resistance, sputtering resistance, and a more uniform surface work function, hence this process is adopted. The planar Langmuir probe consists of a collector electrode, insulating ceramic, a guard electrode, and upper and lower electrical connection components. The collector electrode has a diameter of 4 mm, and it and the guard electrode are simultaneously subjected to a scanning voltage of -20 to 80 V (4 s). The guard ring is used to ensure the flatness of the sheath. This probe is used to acquire plasma parameters such as plasma density, electron temperature, and space potential in the thruster beam region. The spherical Langmuir probe consists of a collector electrode, insulating components, a guard electrode, upper and lower electrical connection components, insulating connections, and a base. The collector electrode has a diameter of 50 mm and is simultaneously subjected to a scanning voltage of -20 to 80 V (4 s) along with the guard electrode. The guard electrode is used to ensure the flatness of the sheath, and its insulation is made of PEEK. This probe is used to obtain plasma parameters such as plasma density, electron temperature, and space potential in the thruster's backflow region. The Faraday probe adopts the exact same structure as the planar Langmuir probe and can serve as a backup for each other. The collector electrode and guard electrode are simultaneously subjected to a voltage of -30 V. This probe is used to obtain the thruster beam current value, plume divergence half-angle, etc. The hysteresis potential analyzer includes an inlet grid, shielding grid, scanning grid, collector electrode, positioning shaft, positioning ring, bias copper sheet, front and rear covers, and wire clamps. The wire clamps are used to fix the wires to prevent them from breaking due to vibration and impact. This probe is used to obtain the ion energy distribution function in the thruster beam region. The erosion sensor consists of a chromium oxide ceramic substrate and a silver plating layer on its surface, with plating dimensions of 10 mm × 0.1 mm × 0.002 mm. This probe diagnoses the erosion rate of the spacecraft surface caused by electric propulsion backflow by measuring the change in thin film resistance caused by sputtering of the film surface material under high-energy ion bombardment. It should be noted that the dimensions of the various detachable probe modules provided in this embodiment can be modified according to different missions to meet the needs of Hall thruster plume plasma diagnostics. Figure 4 Five detachable probe modules are shown as examples only.

[0027] In one alternative embodiment, the probe frame is manufactured using aluminum alloy 3D printing to provide electromagnetic interference resistance. Reinforcing ribs are provided on the four sides and bottom of the probe frame to improve rigidity, strength, and stability, preventing deformation under high-intensity shocks during satellite launch. A groove is provided in the center of the bottom surface of the probe frame for fixing a standard electrical connector, enabling electrical connection between the probe module and the signal transmission cable, which is a standard aerospace information transmission bus. Grooves for fixing the probe module are provided on the five sides of the probe frame, excluding the bottom surface. An erosion sensor, a hindrance potential analyzer, a planar Langmuir probe, and a Faraday probe are fixed around the probe frame, while a spherical Langmuir probe is fixed to the top of the probe frame.

[0028] For example, such as Figure 6 The probe frame shown is entirely made of 3D-printed aluminum alloy, possessing excellent anti-electromagnetic interference capabilities to ensure the accuracy and reliability of signals within the probe system. Reinforcing ribs are designed on the four sides and bottom of the probe frame to improve rigidity and strength, enhance stability, and prevent deformation under the high-intensity shocks and impacts during satellite launch. A groove for an electrical connector is designed in the center of the bottom surface for fixing a standard electrical connector, thereby achieving electrical connection between the probe module and the signal transmission cable. The signal transmission cable uses an aerospace standard information transmission bus standard, such as 1553B. Small holes of 4.5 mm are opened around the bottom surface for fixing the probe frame to the robotic arm via threaded connections. Each of the five sides of the probe frame (excluding the bottom surface) has a 45 mm * 45 mm * 5 mm groove for fixing the detachable probe module. In this embodiment, the erosion sensor, hindrance potential analyzer, planar Langmuir probe, and Faraday probe are sequentially fixed around the probe frame, while the spherical Langmuir probe is fixed at the top.

[0029] The probe system utilizes a cubic frame with an electrical connector at the bottom. By fixing different probes to the sides of the cube, it can carry five different probes for multi-probe joint diagnostics, ensuring the reliability and comprehensiveness of the parameters measured in situ. Furthermore, the entire probe system envelope is less than 85 mm * 100 mm * 285 mm, featuring a compact structure and high integration of probes via bottom electrical connectors. Through combined diagnostics using Langmuir, Faraday, hindrance potential analyzers, and erosion sensors, it achieves integrated diagnostic measurement of microscopic plasma parameters and macroscopic erosion. The planar Langmuir and Faraday analyzers can serve as backups for each other, ensuring high reliability.

[0030] As an optional implementation, the mechanical interface module is connected to the robotic arm and the spacecraft via a standard flange; the base is a motion platform for translational, rotational or combined motion; the satellite overall control unit in the circuit module is used to control the movement of the base through commands and drive the robotic arm, probe module and probe frame to move through the base, so as to meet the position requirements in different probe missions through movement.

[0031] For example, such as Figure 3 The mechanical interface shown is connected to the robotic arm and the spacecraft via standard flanges. The base is a motion platform capable of translational, rotational, or combined movements. The satellite overall control unit in the circuit module can command the base to move, thereby driving the robotic arm, detachable probe module, and probe frame to meet the positional requirements of different probe missions.

[0032] The modular design of the probes, with each probe secured to the probe frame using a 45 mm x 45 mm base, facilitates easy installation and replacement. By modifying the probe dimensions according to the thruster's plume parameters, different space missions can be performed. The system is relatively complete, including a robotic arm interface module and a circuit module in addition to the probe system. By simply inputting a preset program (the robotic arm motion program covering probe measurement points, probe power supply, and data acquisition programs) into the overall control module of the circuit module, real-time monitoring of the thruster for different missions can be achieved. Since only probe dimensions and program input are required for different missions, it is highly economical and has a short development cycle. Furthermore, with the addition of the robotic arm module, the measurement points are no longer fixed, allowing coverage of the entire space area, facilitating subsequent mission requirements such as mapping three-dimensional space plasma parameters.

[0033] Step S120: The circuit module converts the analog signal of the probe measurement data into a digital signal, and the probe measurement data is processed in real time and the thruster performance is monitored in real time by transmitting data through the interface based on the digital signal, so as to obtain the on-orbit diagnostic results of the electric propulsion plasma plume.

[0034] As one possible implementation, the circuit module includes a power processing unit, a satellite overall control unit, and a signal measurement unit. The circuit module converts the analog signals of the probe measurement data into digital signals, and based on these digital signals, transmits data via an interface for real-time processing of the probe measurement data and real-time monitoring of the thruster's performance. Specifically, this may include the following steps: The power processing unit converts the 28V bus into the voltage required by each probe in the probe module and powers the probes; the signal measurement unit converts the analog signals of the probe measurement data into digital signals, transmits the digital signals to the satellite overall control unit in real time, and transmits data down through the 1553B bus interface in real time for real-time processing of probe measurement data and real-time monitoring of thruster performance. The control signal is generated by the satellite overall control unit. The interface between the power processing unit and the satellite overall control unit includes the level signal of the power switch of each probe controlled according to the control signal and the analog and digital data path of the probe measurement part returning the measurement signal.

[0035] For example, such as Figure 7 The diagram shows a system schematic of the circuit module. The power supply unit in the circuit module includes: a -30V voltage generation unit, a 0.1V voltage generation unit, a -20~80V scanning voltage generation unit, and a 0~600V scanning voltage generation unit, used to convert the 28V bus voltage into the voltage required by each probe to power it. The signal measurement unit in the circuit module is used to convert the measured probe analog signals into digital signals and transmit them in real time to the satellite overall control module (e.g., ...). Figure 7 The system is integrated into the overall control unit (BCU) and transmits data in real time via the 1553B bus interface to achieve real-time processing of probe data and real-time monitoring of thruster performance. Control signals are generated by the satellite overall control module. The interface between the power processing unit (PPU) and the satellite overall control module includes the level signals controlling the power switches of each probe and the analog and digital data paths for the measurement signals returned by the probe measurement section.

[0036] By setting up probe modules, probe frames, circuit modules, mechanical interface modules, and signal transmission cables in an integrated electric propulsion plasma plume on-orbit diagnostic system, and by acquiring multi-faceted probe measurement data of the thruster using probe modules containing various types of probes, and then converting the analog signals of the measurement probes corresponding to the multi-faceted probe measurement data into digital signals through the circuit module, and performing real-time processing of probe measurement data and real-time monitoring of thruster performance based on the digital signals transmitted through the interface, this system can provide highly economical, highly reliable, and scalable in-situ measurements for on-orbit electric propulsion plume diagnostics, thereby improving the accuracy of on-orbit plasma plume diagnostic data for real-time plume diagnosis.

[0037] In this embodiment, the detachable probe module facilitates easy disassembly and assembly, and allows for modification of probe size and configuration for different tasks. It offers good maintainability and expandability, and facilitates multi-probe joint diagnostics to achieve cross-validation and complementary in-situ measurements. Furthermore, the integrated electric propulsion plasma plume on-orbit diagnostic system is highly integrated and compact, with an overall envelope of 85 mm * 100 mm * 285 mm. Moreover, the main structural components of the integrated electric propulsion plasma plume on-orbit diagnostic system are made of aluminum alloy, while the probe electrodes and gates utilize a titanium alloy surface nitriding process. This reduces weight while ensuring minimal internal electromagnetic interference, uniform work function on the electrode surface, antigen oxygen content, corrosion resistance, and excellent strength. In addition, the integrated electric propulsion plasma plume on-orbit diagnostic system boasts high integrity and can be directly applied to acquire probe data and monitor thruster performance in real time during different on-orbit missions. A robotic arm can achieve full coverage of space measurement points.

[0038] In some embodiments, the power processing unit includes: a -30 V voltage generation unit, a 0.1 V voltage generation unit, a -20~80 V scanning voltage generation unit, and a 0~600 V scanning voltage generation unit; the method may further include the following steps: The -30 V voltage generation unit provides power to the collector and guard, RPA shielded gate, and -20~80 V scanning voltage generation unit. The wide input voltage DC / DC controller chip executes a flyback boost-buck topology. The coupled inductor is driven by an N-channel MOSFET. When the switch is on, energy is stored in the main winding of the inductor. When the switch is off, the energy is released to the load through the secondary winding and DC blocking capacitor to convert 28 V to -30 V. The collector and guard of PLP and SLP are powered by a -20~80 V scanning voltage generation unit. The 1MHz crystal oscillator signal is divided to a specified value by a frequency divider and then input to the digital-to-analog converter chip via a specified bit counter to output a -1~4 V scanning voltage signal within a specified time. The -1~4 V scanning voltage signal is then amplified by a signal amplification module composed of a power operational amplifier to generate a -20~80 V scanning voltage signal. The erosion sensor in the probe module is powered by a 0.1 V voltage generation unit, and the output is linearly adjustable by using a constant 50 μA current source inside a low dropout linear regulator and a programmable resistor to convert 28 V to 0.1 V. The RPA scanning gate is powered by a 0~600 V scanning voltage generation unit. A low-dropout linear regulator is used to regulate and step down the power supply and generate an error amplifier reference voltage. The transformer is controlled by a high-voltage capacitor charging controller chip to boost and rectify the voltage to charge the high-voltage capacitor and raise the output voltage. A portion of the output voltage is compared with the input 0~5 V control signal, amplified, and fed back to the FB pin of the high-voltage capacitor charging controller chip. The high-voltage capacitor charging controller chip switches between working, holding, and non-working states to make the output voltage follow the 0~5 V control signal for linear scanning.

[0039] As an example, the power processing unit includes: a -30 V voltage generation unit for powering the FP collector and guard ring, the RPA shielded gate, and a -20~80 V scan voltage generation unit. Figure 7 As shown, an LT3758 is used to implement a flyback boost-buck topology: an N-channel MOSFET drives a coupled inductor. When the switch is on, energy is stored in the inductor's main winding; when off, the energy is released to the load through the secondary winding and a DC blocking capacitor, achieving a 28V to -30V conversion. A -20~80V scanning voltage generation unit is used to power the collector and guard ring of the PLP and SLP, respectively. Figure 7 As shown, the 1MHz crystal oscillator signal is divided into 256 segments by a frequency divider and then input to the AD9764 digital-to-analog converter chip via a 14-bit counter to output a scan voltage signal of -1 to 4V within 4 seconds. This scan signal is then amplified by a signal amplification module (gain 20) composed of OP454 to generate a scan voltage signal of -20 to 80V. A 0.1V voltage generation unit is used to power the erosion sensor (ES). Figure 7 As shown, a linearly adjustable output is achieved using the LT3081's internal constant 50 μA current source and programmable resistors, converting 28 V to 0.1 V. The 0~600 V scan voltage generation unit powers the RPA scan gate. First, the LT3081 regulates and steps down the power supply to generate the error amplifier reference voltage. Then, the LT3751 (high-voltage capacitor charging controller chip) controls the transformer to boost and rectify the voltage, charging the high-voltage capacitor and raising the output voltage. 1 / 12 of the output voltage is compared with the input 0~5 V control signal, amplified, and fed back to the LT3751 FB pin. This controls the chip (the aforementioned LT3751 high-voltage capacitor charging controller chip) to switch between active / hold / inactive states, ensuring the output voltage follows the 0~5 V control signal for linear scanning.

[0040] In some embodiments, the signal measurement unit includes: PLP, SLP, FP current measurement circuit, RPA collector current measurement circuit, and erosion sensor loop current measurement circuit. The method may further include the following steps: The FP current measurement circuit converts currents from -1 mA to 40 mA into Δ-Σ modulator bit currents based on an isolation modulator; the RPA collector current measurement circuit converts currents from 0 μA to 20 μA into 0 V to 1 V analog signals based on an instrumentation amplifier; and the erosion sensor loop current measurement circuit converts currents from 1 mA to 50 mA into 0.02 V to 1 V analog signals based on an instrumentation amplifier.

[0041] It should be noted that the signal measurement unit includes: PLP, SLP, and FP current measurement circuits; the FP current measurement circuit is used to: convert -1 mA to 40 mA current into Δ-Σ modulator bit current based on the AMC3306 isolation modulator; the RPA collector current measurement circuit is used to: convert 0 μA to 20 μA current into 0 V to 1 V analog signal based on the AD8421 instrumentation amplifier; the erosion sensor loop current measurement circuit is used to: convert 1 mA to 50 mA current into 0.02 V to 1 V analog signal based on the AD8421 instrumentation amplifier.

[0042] Figure 8 A schematic diagram of an integrated on-orbit diagnostic data processing system for electric propulsion plasma plumes is provided. This system can be applied to integrated on-orbit diagnostic systems for electric propulsion plasma plumes. The integrated on-orbit diagnostic system includes a probe module, a probe frame, a circuit module, a mechanical interface module, and a signal transmission cable. The probe module is threadedly fixed to the probe frame, and the probe frame is threadedly fixed to the mechanical interface module. The circuit module is located inside the spacecraft and is electrically connected to the probe module via the signal transmission cable. Figure 8 As shown, the integrated electric propulsion plasma plume on-orbit diagnostic data processing system 800 includes: Acquisition module 801 is used to acquire probe measurement data of the thruster through various types of probes in the probe module; The monitoring module 802 is used to convert the analog signal of the probe measurement data corresponding to the probe measurement data into a digital signal through the circuit module, and to perform real-time processing of the probe measurement data and real-time monitoring of the thruster performance based on the digital signal transmitted through the interface, so as to obtain the on-orbit diagnostic results of the electric propulsion plasma plume.

[0043] The integrated electric propulsion plasma plume on-orbit diagnostic data processing system provided in this application embodiment has the same technical features as the integrated electric propulsion plasma plume on-orbit diagnostic data processing method provided in the above embodiment, so it can also solve the same technical problems and achieve the same technical effects.

[0044] An electronic device provided in this application embodiment, such as Figure 9 As shown, the electronic device 900 includes a processor 902 and a memory 901. The memory stores a computer program that can run on the processor. When the processor executes the computer program, it implements the steps of the method provided in the above embodiments.

[0045] See Figure 9 The electronic device also includes a bus 903 and a communication interface 904. The processor 902, the communication interface 904 and the memory 901 are connected via the bus 903. The processor 902 is used to execute executable modules, such as computer programs, stored in the memory 901.

[0046] The memory 901 may include high-speed random access memory (RAM) or non-volatile memory, such as at least one disk storage device. Communication between this system network element and at least one other network element is achieved through at least one communication interface 904 (which can be wired or wireless), such as the Internet, wide area network, local area network, metropolitan area network, etc.

[0047] Bus 903 can be an ISA bus, PCI bus, or EISA bus, etc. The bus can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 9 The symbol is represented by a single double-headed arrow, but this does not mean that there is only one bus or one type of bus.

[0048] The memory 901 is used to store programs. After receiving an execution instruction, the processor 902 executes the program. The method executed by the apparatus defined by the process disclosed in any of the preceding embodiments of this application can be applied to the processor 902 or implemented by the processor 902.

[0049] The processor 902 may be an integrated circuit chip with signal processing capabilities. In implementation, each step of the above method can be completed by the integrated logic circuitry in the hardware of the processor 902 or by instructions in software form. The processor 902 can be a general-purpose processor, including a Central Processing Unit (CPU), a Network Processor (NP), etc.; it can also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this application can be directly manifested as execution by a hardware decoding processor, or execution by a combination of hardware and software modules in the decoding processor. The software module can reside in a mature storage medium in the field, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, or registers. This storage medium is located in memory 901, and processor 902 reads the information from memory 901 and, in conjunction with its hardware, completes the steps of the above method.

[0050] Corresponding to the above-described integrated electric propulsion plasma plume on-orbit diagnostic data processing method, this application embodiment also provides a computer-readable storage medium storing computer-executable instructions. When the computer-executable instructions are invoked and executed by a processor, the computer-executable instructions cause the processor to perform the steps of the above-described integrated electric propulsion plasma plume on-orbit diagnostic data processing method.

[0051] The integrated electric propulsion plasma plume on-orbit diagnostic data processing system provided in this application embodiment can be specific hardware on the device or software or firmware installed on the device. The device provided in this application embodiment has the same implementation principle and technical effects as the foregoing method embodiments. For the sake of brevity, any parts not mentioned in the device embodiment can be referred to the corresponding content in the foregoing method embodiments. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can all be referred to the corresponding processes in the above method embodiments, and will not be repeated here.

[0052] In the embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. Furthermore, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Additionally, the displayed or discussed mutual couplings, direct couplings, or communication connections may be through some communication interfaces; indirect couplings or communication connections between devices or units may be electrical, mechanical, or other forms.

[0053] For example, the flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram and / or flowchart, and combinations of blocks in block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

[0054] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0055] In addition, the functional units in the embodiments provided in this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0056] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the integrated electric propulsion plasma plume on-orbit diagnostic data processing method described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0057] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In addition, the terms "first", "second", "third", etc. are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0058] Finally, it should be noted that the above-described embodiments are merely specific implementations of this application, used to illustrate the technical solutions of this application, and not to limit them. The protection scope of this application is not limited thereto. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features, within the scope of the technology disclosed in this application; and these modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application. All should be covered within the protection scope of this application. Therefore, the protection scope of this application should be determined by the protection scope of the claims.

Claims

1. A method for processing in-orbit diagnostic data of an integrated electric propulsion plasma plume, characterized in that, The application is applied to an integrated electric propulsion plasma plume on-orbit diagnosis system, which comprises a probe module, a probe frame, a circuit module, a mechanical interface module and a signal transmission cable, the probe module is fixedly connected to the probe frame through threads, the probe frame is fixedly connected to the mechanical interface module through threads, the circuit module is located in the interior of a spacecraft and is electrically connected between the probe module through the signal transmission cable; the method comprises: acquiring probe measurement data of a thruster through a plurality of types of probes in the probe module; converting measurement probe analog signals corresponding to the probe measurement data into digital signals through the circuit module, and performing real-time processing of the probe measurement data and real-time monitoring of the performance of the thruster based on the digital signals through interface data transmission to obtain electric propulsion plasma plume on-orbit diagnosis results.

2. The method of claim 1, wherein, The probe module is a detachable probe module, the plurality of types of probes in the probe module comprise an erosion sensor, a retarding potential analyzer, a planar Langmuir probe, a Faraday probe and a spherical Langmuir probe; the planar Langmuir probe comprises a first collecting electrode, an insulating ceramic, a first protection electrode and a first upper and lower electric connection assembly, the first collecting electrode and the first protection electrode are simultaneously applied with a scanning voltage of-20 to 80 V; the spherical Langmuir probe comprises a second collecting electrode, an insulating assembly, a second protection electrode, a second upper and lower electric connection assembly, an insulating connection and a base, the second collecting electrode and the second protection electrode are simultaneously applied with a scanning voltage of-20 to 80 V; the retarding potential analyzer comprises an inlet grid, a shielding grid, a scanning grid, a collecting electrode, a positioning shaft, a positioning ring, a bias copper sheet, front and rear covers and a wire clamp, the wire clamp is used for fixing a wire, and the main body of the erosion sensor comprises a chromium oxide ceramic base and a corresponding silver plating layer; the plurality of types of probes are different types and / or different sizes of probes selected according to different measurement tasks; the acquiring of the probe measurement data of the thruster through the plurality of types of probes in the probe module comprises: acquiring beam current area plasma parameters of the thruster through the planar Langmuir probe, wherein the beam current area plasma parameters comprise at least one of thruster beam current area plasma density, electron temperature and space potential; acquiring return current area plasma parameters of the thruster through the spherical Langmuir probe, wherein the return current area plasma parameters comprise at least one of thruster return current area plasma density, electron temperature and space potential; acquiring beam current values and plume divergence half angles of the thruster through the Faraday probe; acquiring beam current area ion energy distribution functions of the thruster through the retarding potential analyzer; diagnosing an erosion rate of the spacecraft surface corresponding to the electric propulsion return current of the thruster through the erosion sensor by measuring a thin film resistance change caused by film surface material sputtering under ion bombardment.

3. The method of claim 1, wherein, The circuit module includes a power supply processing unit, a satellite overall control unit and a signal measurement unit; the probe measurement data corresponding to the measurement probe analog signal is converted into a digital signal by the circuit module, and the real-time processing of the probe measurement data and the real-time monitoring of the performance of the thruster are carried out based on the digital signal and through the interface data transmission, including: The 28 V bus is converted into the voltage required by each probe in the probe module by the power supply processing unit, and the probe is powered; The probe measurement data corresponding to the measurement probe analog signal is converted into a digital signal by the signal measurement unit, the digital signal is transmitted to the satellite overall control unit in real time, and the real-time processing of the probe measurement data and the real-time monitoring of the performance of the thruster are carried out by the 1553B bus interface data transmission in real time; The satellite overall control unit generates a control signal, and the interface between the power supply processing unit and the satellite overall control unit includes a level signal for controlling the power supply switch of each probe and an analog and digital data path for returning the measurement signal of the probe measurement part according to the control signal.

4. The method of claim 3, wherein, The power supply processing unit includes a -30 V voltage generating unit, a 0.1 V voltage generating unit, a -20-80 V scanning voltage generating unit and a 0-600 V scanning voltage generating unit; the method further includes: The -30 V voltage generating unit provides power for the collector and the protection electrode, the RPA shield gate and the -20-80 V scanning voltage generating unit, and a wide input voltage DC / DC controller chip is used to perform a flyback boost-buck topology, and a N-channel MOSFET is used to drive a coupled inductance, so that energy is stored in the main winding of the inductance when the switch is turned on, and the energy is released to the load through the auxiliary winding and the DC blocking capacitor when the switch is turned off, so that the 28 V is converted to -30 V; The -20-80 V scanning voltage generating unit provides power for the collector and the protection electrode of the PLP and the SLP, and a frequency divider is used to divide the 1MHz crystal oscillator signal to a specified value, and then the signal is input to a digital-to-analog conversion chip through a specified bit counter, so that a scanning voltage signal of -1-4 V is output within a specified time, and the scanning voltage signal of -1-4 V is input to a signal amplification module composed of a power operational amplifier to generate a -20-80 V scanning voltage signal; The 0.1 V voltage generating unit provides power for the erosion sensor in the probe module, and a low-dropout linear regulator is used to perform linear adjustable output with a constant 50μA current source and a programmable resistor inside, so that the 28 V is converted to 0.1 V. The 0~600 V scanning voltage generation unit supplies power for RPA scanning grid, a low dropout linear regulator is used to stabilize and step down the power supply and generate error amplifier reference voltage, and a high voltage capacitor charging controller chip is used to control the transformer to step up and rectify the output voltage of the high voltage capacitor, part of the output voltage is compared with the input 0~5 V control signal and amplified, and then fed back to the FB pin of the high voltage capacitor charging controller chip, and the high voltage capacitor charging controller chip switches between working state, holding state and non-working state, so that the output voltage follows the 0~5 V control signal for linear scanning.

5. The method of claim 3, wherein, The signal measurement unit includes: PLP, SLP, FP current measurement circuit, RPA collector electrode current measurement circuit, and erosion sensor loop current measurement circuit, and the method further includes: The FP current measurement circuit converts -1 mA to 40 mA current into Δ-Σ modulator bit stream based on an isolation modulator; The RPA collector electrode current measurement circuit converts 0μA to 20μA current into 0V~1V analog signal based on an instrument amplifier; The erosion sensor loop current measurement circuit converts 1mA~50 mA current into 0.02 V~1 V analog signal based on the instrument amplifier.

6. The method of claim 2, wherein, The probe frame is made of aluminum alloy 3D printing to have anti-electromagnetic interference capability; four surfaces and the bottom of the probe frame are provided with reinforcing ribs for improving rigidity and strength and enhancing stability, so that deformation does not occur under the action of high-strength shock impact during satellite launch; A groove for fixing a standard electrical connector is arranged in the middle of the bottom surface of the probe frame to electrically connect the probe module and the signal transmission cable, which is a standard aerospace information transmission bus standard; Five surfaces of the probe frame except the bottom surface are provided with grooves for fixing the probe module; the erosion sensor, the retarding potential analyzer, the planar Langmuir probe and the Faraday probe are fixed around the probe frame, and the spherical Langmuir probe is fixed on the top of the probe frame.

7. The method of claim 3, wherein, The base of the mechanical interface module and the mechanical arm, and the base and the spacecraft are connected through standard flanges; the base is a motion platform for translational, rotational or combined motion; The satellite overall control unit in the circuit module is used to control the base motion through instructions and drive the mechanical arm, the probe module and the probe frame to move through the base, so as to meet the position requirements in different probe tasks through motion.

8. An integrated electric propulsion plasma plume on-orbit diagnostic data processing system, characterized by, The application is applied to an integrated electric propulsion plasma plume on-orbit diagnosis system, which comprises a probe module, a probe frame, a circuit module, a mechanical interface module and a signal transmission cable, the probe module is fixedly connected to the probe frame through screw threads, the probe frame is fixedly connected to the mechanical interface module through screw threads, and the circuit module is located in the interior of a spacecraft and is electrically connected with the probe module through the signal transmission cable. The integrated electric propulsion plasma plume on-orbit diagnosis data processing system comprises: An acquisition module is configured to acquire probe measurement data of a thruster through various types of probes in the probe module. A monitoring module is configured to convert measurement probe analog signals corresponding to the probe measurement data into digital signals through the circuit module, perform real-time processing of the probe measurement data and real-time monitoring of the performance of the thruster based on the digital signals and interface data transmission, and obtain electric propulsion plasma plume on-orbit diagnosis results.

9. An electronic device comprising a memory, a processor, the memory having stored therein a computer program executable on the processor, characterized in that, The processor executes the computer program to implement the steps of the method of any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores computer executable instructions, and when the computer executable instructions are called and executed by the processor, the computer executable instructions cause the processor to execute the method of any one of claims 1 to 7.

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