Case inspection method and device and storage medium

Abstract

According to the case inspection method and device and the storage medium provided by the invention, the next inspection time of each defect case in the defect case set is obtained in response to the triggering of the inspection, and the target subset corresponding to the inspection is determined from the defect case set based on the next inspection time; polling each defect case in the target subset to obtain the polling result of each defect case; and updating the next polled time of the corresponding defect case in the defect case set based on the current polling result of each defect case in the target subset. The updating operation enables the next polled time of the first type of defect cases to be later than the next polled time of the second type of defect cases, the first type of defect cases comprise defect cases with multiple continuous polling results being repaired, and the second type of defect cases comprise defect cases with the polling results being not repaired; therefore, the inspection frequency of the repaired defect case is reduced, and the computing resource of inspection is saved.

Description

Technical Field

[0001] This specification relates to the field of data processing, and in particular to a case inspection method, device, and storage medium. Background Technology

[0002] Case inspection primarily involves inspecting abnormal cases. This refers to the on-demand re-observation, verification, or evaluation of the current status of a case to determine whether it remains abnormal or has returned to normal. Examples include inspecting defective dialogue in human-computer interaction models, inspecting faulty equipment in equipment maintenance, and inspecting abnormal behavior in user behavior monitoring.

[0003] Case inspection requires significant computational resources; therefore, a case inspection method is needed that can conserve computational resources.

[0004] The information in the background section is merely information known only to the inventor and does not imply that such information had entered the public domain before the date of this application, nor does it imply that it can be considered prior art in this disclosure. Summary of the Invention

[0005] The inspection methods, equipment, and storage media provided in this manual can save computational resources for inspection.

[0006] Firstly, this specification provides a case inspection method, comprising: in response to the current inspection being triggered, obtaining the next inspection time of each defect case in a defect case set; based on the next inspection time of each defect case in the defect case set, determining a target subset corresponding to the current inspection from the defect case set; inspecting each defect case in the target subset to obtain the current inspection result of each defect case; and updating the next inspection time of the corresponding defect case in the defect case set based on the current inspection result of each defect case in the target subset, wherein the update operation causes the next inspection time of a first type of defect case to be later than the next inspection time of a second type of defect case, the first type of defect case including defect cases whose consecutive inspection results are all repaired, and the second type of defect case including defect cases whose current inspection result is not repaired. In some embodiments, the update operation further causes the time interval between two adjacent inspections of the first type of defect case to gradually increase as the number of times it is continuously inspected as repaired increases.

[0007] In some embodiments, the gradual increase is an exponential increase. In some embodiments, based on the current inspection results of each defect case in the target subset, the next inspection time of the corresponding defect case in the defect case set is updated, including: determining the number of intervals between the next inspection of the defect case and the current inspection based on the current inspection results of each defect case in the target subset, wherein the number of intervals corresponding to the repaired defect cases in the current inspection results is greater than the number of intervals corresponding to the unrepaired defect cases in the current inspection results; and determining the next inspection time of the corresponding defect case based on the number of intervals corresponding to each defect case in the target subset.

[0008] In some embodiments, based on the current inspection result of each defect case in the target subset, determining the number of interval periods between the next inspection of the defect case and the current inspection includes: for any target defect case in the target subset, if the current inspection result of the target defect case is that it has been repaired, then determining the number of interval periods between the next inspection of the target defect case and the current inspection as NK, where N is a preset integer and K is the number of times the target defect case has been continuously inspected as repaired.

[0009] In some embodiments, based on the current inspection result of each defect case in the target subset, determining the number of interval periods between the next inspection of the defect case and the current inspection includes: for any target defect case in the target subset, if the current inspection result of the target defect case is unrepaired, then determining the number of interval periods between the next inspection of the target defect case and the current inspection to be 1.

[0010] In some embodiments, determining the next inspection time for a corresponding defect case based on the number of intervals corresponding to each defect case in the target subset includes: obtaining information on the percentage of defect cases whose current inspection result is repaired; determining that the percentage information is greater than a preset percentage information, reducing the number of intervals corresponding to the defect cases in the target subset; and determining the next inspection time for the corresponding defect case based on the reduced number of intervals.

[0011] In some embodiments, determining the target subset corresponding to the current inspection from the defect case set based on the next inspection time of each defect case in the defect case set includes: adding defect cases whose next inspection time matches the current inspection time to the target subset based on the next inspection time of each defect case in the defect case set; and inspecting each defect case in the target subset to obtain the current inspection result of each defect case, including: obtaining the number of defect cases in the target subset, scheduling computing resources corresponding to the number of defect cases to inspect each defect case in the target subset, and obtaining the current inspection result of each defect case.

[0012] In some embodiments, based on the next inspection time of each defect case in the defect case set, a target subset corresponding to the current inspection is determined from the defect case set, including: predicting the number of cases to be inspected this time based on the most recent inspection result of each defect case in the defect case set, and the number of times each defect case whose most recent inspection result is repaired has been continuously inspected as repaired; and if the number of cases to be inspected this time is greater than a preset number of cases, based on the next inspection time of each defect case in the defect case set, determining a candidate set in the defect case set whose next inspection time matches the current inspection time, and selecting the preset number of defect cases from the candidate set to form the target subset according to a preset priority rule.

[0013] In some embodiments, based on the most recent inspection result of each defect case in the defect case set, and the number of times each defect case whose most recent inspection result was "repaired" has been continuously inspected as "repaired", the number of cases to be inspected this time is predicted, including: predicting the number of cases to be inspected this time based on the following formula: , wherein The number of cases to be inspected in this inspection. The number of defect cases that were not repaired in the most recent inspection. The number of defect cases that were repaired in the most recent inspection. The number of times the i-th defect case, whose most recent inspection result was repaired, has been continuously inspected and confirmed as repaired.

[0014] In some embodiments, the preset priority rules include: the priority of defect cases whose most recent inspection result is unrepaired is higher than that of defect cases whose most recent inspection result is repaired; and for defect cases whose most recent inspection result is all repaired, the fewer times they are continuously inspected as repaired, the higher the priority.

[0015] Secondly, this specification also provides a case inspection device, comprising: at least one storage medium storing at least one instruction set for implementing case inspection; and at least one processor communicatively connected to the at least one storage medium, wherein when the device is running, the at least one processor reads the at least one instruction set and implements the method described in any one of the first aspects.

[0016] Thirdly, this specification also provides a computer-readable non-transitory storage medium, wherein the computer-readable non-transitory storage medium stores at least one instruction set, which, when executed by at least one processor, implements the method as described in any one of the first aspects.

[0017] As can be seen from the above technical solutions, the case inspection method, equipment, and storage medium provided in this specification, in response to the triggering of this inspection, obtain the next inspection time for each defect case in the defect case set, and determine the target subset corresponding to this inspection from the defect case set based on the next inspection time, thereby inspecting each defect case in the target subset to obtain the inspection result for each defect case in this inspection; furthermore, based on the inspection results of each defect case in the target subset, the next inspection time for the corresponding defect case in the defect case set is updated. The update operation makes the next inspection time of the first type of defect case later than the next inspection time of the second type of defect case. The first type of defect case includes defect cases whose consecutive inspection results are all repaired, and the second type of defect case includes defect cases whose current inspection result is not repaired, that is, reducing the inspection frequency of repaired defect cases, thereby saving inspection computational resources.

[0018] Additional features of the case inspection methods, devices, and storage media provided in this specification will be partially listed in the following description. The figures and examples described below will be readily apparent to those skilled in the art. The inventive aspects of the case inspection methods, devices, and storage media provided in this specification can be fully understood through practice or use of the methods, apparatus, and combinations described in the detailed examples below. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this specification, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this specification. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 A schematic diagram of a case inspection scenario provided according to some embodiments of this specification is shown; Figure 2 A hardware structure diagram of a computing device provided according to some embodiments of this specification is shown; Figure 3 A flowchart of a case inspection method provided according to some embodiments of this specification is shown; Figure 4 A schematic diagram of a case inspection process according to some embodiments of this specification is shown; and Figure 5 A schematic diagram is shown of a subset of defect cases corresponding to an inspection, provided according to some embodiments of this specification. Detailed Implementation

[0021] The following description provides specific application scenarios and requirements for this specification, intended to enable those skilled in the art to make and use the contents of this specification. Various partial modifications to the disclosed embodiments will be apparent to those skilled in the art, and the general principles defined herein can be applied to other embodiments and applications without departing from the spirit and scope of this specification. Therefore, this specification is not limited to the embodiments shown, but rather to the widest scope consistent with the claims.

[0022] The terminology used herein is for the purpose of describing particular exemplary embodiments only and is not restrictive. For example, unless the context clearly indicates otherwise, the singular forms “a,” “an,” and “the” as used herein may also include the plural forms. When used in this specification, the terms “comprising,” “including,” and / or “containing” mean that the associated integers, steps, operations, elements, and / or components are present, but do not exclude the presence of one or more other features, integers, steps, operations, elements, components, and / or groups, or that other features, integers, steps, operations, elements, components, and / or groups may be added to the device / method.

[0023] Considering the following description, these and other features of this specification, as well as the operation and function of the related components of the structure, and the economy of assembly and manufacture of the parts, can be significantly improved. All of these form part of this specification with reference to the accompanying drawings. However, it should be clearly understood that the drawings are for illustrative and descriptive purposes only and are not intended to limit the scope of this specification. It should also be understood that the drawings are not drawn to scale.

[0024] The flowcharts used in this specification illustrate operations implemented by a device according to some embodiments of this specification. It should be clearly understood that the operations in the flowcharts may not be implemented in a sequential order. Instead, the operations may be implemented in reverse order or simultaneously. Furthermore, one or more additional operations may be added to the flowcharts. One or more operations may be removed from the flowcharts.

[0025] In this specification, "X includes at least one of A, B, or C" means that X includes at least A, or X includes at least B, or X includes at least C. That is, X may include only one of A, B, and C, or any combination of A, B, and C, as well as other possible content / elements. The arbitrary combination of A, B, and C can be A, B, C, AB, AC, BC, or ABC.

[0026] In this specification, unless explicitly stated otherwise, the relationships between structures can be direct or indirect. For example, when describing "A is connected to B," unless it is explicitly stated that A and B are directly connected, it should be understood that A can be directly connected to B or indirectly connected to B. Similarly, when describing "A is on top of B," unless it is explicitly stated that A is directly above B (AB is adjacent and A is above B), it should be understood that A can be directly above B or indirectly above B (AB is separated by other elements, and A is above B). And so on.

[0027] First, the following explanations will be provided for the terms that will be used in this instruction manual.

[0028] bad case: In a large model, a dialogue case in which the response is not as expected; Inspection: In large-scale human-computer dialogue scenarios, this refers to periodically and automatically initiating reasoning to verify the answers.

[0029] Next, the application scenarios of this manual will be introduced.

[0030] The case inspection method provided in this document can be applied to human-computer dialogue model scenarios. Users can engage in human-computer dialogue through the model; for example, a user asks a question, and the model generates an answer to resolve the user's doubts. The human-computer dialogue model may be a large text-based model. However, bad cases may occur, meaning the model's answer may contain errors or fail to meet preset quality standards, requiring repair. To verify the repair effect, the case inspection method described above can be used to inspect the bad cases to determine if the problem has been successfully resolved. During inspection, the original question from the bad case can be input back into the model, and the model's new answer can be validated to determine whether it is correct or meets the aforementioned preset quality standards.

[0031] The inspection methods provided in this guide can be applied to equipment maintenance scenarios. Equipment can be physical or virtual, such as servers, switches, sensors, industrial robots, and power equipment. Inspecting equipment can verify whether faulty devices have been repaired or have returned to normal operation. During inspection, the condition of the equipment can be verified by reading its current operating indicators. For example, if a server has been repaired after a fault, the inspection can determine whether it has returned to normal operation by verifying whether the server's I / O (input / output) performance is normal.

[0032] The case study inspection methods provided in this document can be applied to user behavior monitoring scenarios. User behavior can be a sequence of user actions, such as clickstream, search history, transaction behavior, and conversation content. Inspecting user behavior can verify whether abnormal / high-risk behaviors can be blocked (i.e., whether they have been corrected). For example, if an e-commerce platform discovers a batch of accounts engaging in "coupon-grabbing" behavior, after updating its anti-fraud rules, the system performs "inspection-style replay" of the historical behavior of these accounts to verify whether the new rules can accurately identify and block similar behaviors.

[0033] The case inspection methods provided in this guide can reduce the inspection frequency of some cases and save computing resources. Computing resources can include various hardware and software resources in a computer system that can be used to execute programs and process data. Hardware resources can include CPU (Central Processing Unit), GPU (Graphics Processing Unit), TPU (Tensor Processing Unit), memory (RAM), storage (hard disk / SSD), network bandwidth, etc. Software / virtual resources can include virtual machines (VMs), containers (such as Docker), processes, threads, computing queues, etc.

[0034] It should be noted that the above example scenarios are just a few of the many application scenarios provided in this specification. The case inspection methods, devices, and storage media provided in this specification can be applied not only to the above scenarios but also to other scenarios. Those skilled in the art should understand that the case inspection methods, devices, and storage media described in this specification applied to other application scenarios are also within the scope of protection of this specification.

[0035] Figure 1 A schematic diagram of a case inspection scenario 001 provided according to some embodiments of this specification is shown. For example... Figure 1 As shown, scenario 001 may include user 100, terminal 200, server 300 and network 400.

[0036] When the case inspection method is applied in different scenarios, the role of User 100 may differ. In a human-computer dialogue model scenario, User 100 is the user engaging in dialogue using the human-computer dialogue model on Terminal 200. In a device maintenance scenario, User 100 is the administrator managing the device through Client 200. In a user behavior monitoring scenario, User 100 can implement various user behaviors on Terminal 200.

[0037] In some embodiments, the terminal 200 can display various interfaces for the user 100 to view and trigger, thereby realizing human-computer interaction. The triggering can be click-triggered, voice-triggered, image-triggered, etc. It should be noted that the user data obtained in this specification has been authorized by the user and does not involve user privacy.

[0038] The case inspection method described herein can be executed on a computing device. In some embodiments, the computing device may be a terminal 200. In this case, the terminal 200 may store data or instructions for executing the case inspection method described herein, and may execute or be used to execute the data or instructions. In some embodiments, the terminal 200 may include a hardware device with data information processing capabilities and the necessary programs required to drive the hardware device to work.

[0039] In some embodiments, terminal 200 may include a mobile device, tablet computer, laptop computer, built-in device in a motor vehicle or similar content, vending machine, vending cabinet, or any combination thereof. In some embodiments, the mobile device may include a smart home device, smart mobile device, virtual reality device, augmented reality device, or similar device, or any combination thereof. In some embodiments, the smart home device may include a smart TV, desktop computer, etc., or any combination thereof. In some embodiments, the smart mobile device may include a smartphone, personal digital assistant, gaming device, navigation device, etc., or any combination thereof. In some embodiments, the virtual reality device or augmented reality device may include a virtual reality headset, virtual reality glasses, virtual reality patch, augmented reality headset, augmented reality glasses, augmented reality patch, or similar content, or any combination thereof. For example, the virtual reality device or the augmented reality device may include smart glasses, head-mounted display, VR, etc. In some embodiments, the built-in device in the motor vehicle may include an in-vehicle computer, in-vehicle TV, etc. In some embodiments, terminal 200 may include an image acquisition device for acquiring biometric images, such as a facial image of user 100. In some embodiments, the image acquisition device may be a two-dimensional image acquisition device (such as an RGB camera), or a two-dimensional image acquisition device (such as an RGB camera) and a depth image acquisition device (such as a 3D structured light camera, a laser detector, etc.). In some embodiments, the terminal 200 may be a device with positioning technology for locating the position of the terminal 200. In some embodiments, the terminal 200 may have one or more of the following functions: NFC (Near Field Communication), WIFI (Wireless Fidelity), 3G / 4G / 5G, POS (Point of Sale) card swiping function, QR code scanning function, barcode scanning function, Bluetooth, infrared, SMS (Short Message Service), and MMS (Multimedia Message Service).

[0040] In some embodiments, terminal 200 may have one or more applications (APPs) installed. The APPs provide user 100 with the ability and interface to interact with the outside world via network 400. The APPs include, but are not limited to: web browser APPs, search APPs, chat APPs, shopping APPs, video APPs, financial management APPs, instant messaging tools, email terminals, social media platform software, etc. In some embodiments, a target APP may be installed on terminal 200. The target APP can collect a set of defect cases for terminal 200. In some embodiments, the target APP can also perform case inspection. The target APP can accept and respond to inspection requests, executing case inspection methods.

[0041] like Figure 1 As shown, terminal 200 can communicate with server 300. In some embodiments, server 300 can communicate with multiple terminals 200. In some embodiments, terminal 200 can interact with server 300 through network 400 to receive or send messages, etc. Server 300 can be a server that provides various services, such as a backend server that supports the pages displayed by the target APP on terminal 200.

[0042] In some embodiments, the computing device may be a server 300. In this case, the server 300 may store data or instructions for executing the case inspection method described herein, and may execute or be used to execute said data or instructions. In some embodiments, the server 300 may include hardware devices with data processing capabilities and the necessary programs required to drive the hardware devices.

[0043] Network 400 serves as a medium to provide a communication connection between terminal 200 and server 300. Network 400 facilitates the exchange of information or data. For example... Figure 1As shown, terminal 200 and server 300 can connect to network 400 and transmit information or data to each other through network 400. In some embodiments, network 400 can be any type of wired or wireless network, or a combination thereof. For example, network 400 may include cable networks, wired networks, fiber optic networks, telecommunications networks, intranets, the Internet, local area networks (LANs), wide area networks (WANs), wireless local area networks (WLANs), metropolitan area networks (MANs), public switched telephone networks (PSTNs), Bluetooth networks, ZigBee networks, near field communication (NFC) networks, or similar networks. In some embodiments, network 400 may include one or more network access points. For example, network 400 may include wired or wireless network access points, such as base stations or Internet switching points, through which one or more components of terminal 200 and server 300 can connect to network 400 to exchange data or information.

[0044] It should be understood that Figure 1 The number of terminals 200, servers 300, and networks 400 shown is merely illustrative. Depending on implementation needs, there can be any number of terminals 200, servers 300, and networks 400.

[0045] It should be noted that the case inspection method described above can be executed entirely on terminal 200, entirely on server 300, or partially on terminal 200 and partially on server 300.

[0046] Figure 2 A hardware structure diagram of a computing device 600 according to some embodiments of this specification is shown. The computing device 600 can execute the case inspection method described in this specification. The case inspection method is described in other parts of this specification. The computing device 600 can be a device of the terminal 200, a device of the server 300, or other computing devices, or even any combination of the above devices.

[0047] like Figure 2 As shown, the computing device 600 may include at least one storage medium 630 and at least one processor 620. In some embodiments, the computing device 600 may also include a communication port 650 and an internal communication bus 610. Additionally, the computing device 600 may include I / O components 660.

[0048] The internal communication bus 610 can connect different components, including storage medium 630, processor 620 and communication port 650.

[0049] I / O component 660 supports input / output between computing device 600 and other components.

[0050] Communication port 650 is used for data communication between computing device 600 and external sources. For example, communication port 650 can be used for data communication between computing device 600 and network 400. Communication port 650 can be a wired communication port or a wireless communication port.

[0051] Storage medium 630 may include a data storage device. The data storage device may be a non-transitory storage medium or a temporary storage medium. For example, the data storage device may include one or more of a disk 632, a read-only storage medium (ROM) 634, or a random access storage medium (RAM) 636. Storage medium 630 may store at least one instruction set for implementing case inspection. The instructions are computer program code, which may include programs, routines, objects, components, data structures, processes, modules, etc., that execute the case inspection method provided in this specification. Storage medium 630 may also store a case inspection model for implementing the case inspection method, such as storing a case inspection model. In this case, the model may be one or more instruction sets stored in storage medium 630 that execute corresponding instructions, and is executed by processor 620 in computing device 600. Of course, the model may also be a part of the circuitry, hardware device, or module in computing device 600. For example, the case inspection model may be a hardware device / module in computing device 600 that implements case inspection. At this time, the processor 620 may store at least one set of instructions for controlling one or more of the models.

[0052] At least one processor 620 can be communicatively connected to at least one storage medium 630 and a communication port 650 via an internal communication bus 610. The at least one processor 620 is used to execute the at least one instruction set described above. When the computing device 600 is running, the at least one processor 620 can read the at least one instruction set and, according to the instructions of the at least one instruction set, execute the case inspection method provided in this specification. The processor 620 can execute all the steps included in the case inspection method. The processor 620 can be in the form of one or more processors. In some embodiments, the processor 620 may include one or more hardware processors, such as a microcontroller, microprocessor, reduced instruction set computer (RISC), application-specific integrated circuit (ASIC), application-specific instruction set processor (ASIP), central processing unit (CPU), graphics processing unit (GPU), physical processing unit (PPU), microcontroller unit, digital signal processor (DSP), field-programmable gate array (FPGA), advanced RISC machine (ARM), programmable logic device (PLD), any circuit or processor capable of performing one or more functions, or any combination thereof. For illustrative purposes only, only one processor 620 is described in this specification for the computing device 600. However, it should be noted that the computing device 600 in this specification may also include multiple processors. Therefore, the operation and / or method steps disclosed in this specification may be executed by one processor as described in this specification, or they may be executed jointly by multiple processors. For example, if the processor 620 of the computing device 600 in this specification executes steps A and B, it should be understood that steps A and B may also be executed jointly or separately by two different processors 620 (e.g., the first processor executes step A, the second processor executes step B, or the first and second processors jointly execute steps A and B).

[0053] Figure 3 A flowchart of a case inspection method P100 according to some embodiments of this specification is shown. As previously described, computing device 600 can execute the case inspection method P100 described in this specification. Figure 3 As shown, method P100 may include: S120: In response to the current inspection being triggered, obtain the next inspection time for each defect case in the defect case set.

[0054] Inspections can periodically or on demand, automatically re-observing or testing the current status of cases to determine if problems remain or if previous fixes are still effective. During inspections, the computing device 600 can replay / retest cases, such as re-calling the model with the original user question and obtaining new answers, reading the device's current operating metrics, and reviewing recent user behavior for any abnormal patterns. Through methods such as rules, model scoring, and manual annotation, it can determine if the current output / status of the case meets expectations. Based on the inspection results, the status of the case is updated and decisions are made. For example, if the problem persists, it is marked as "unfixed"; if the case returns to normal, it is marked as "fixed successfully," and the next inspection interval is adjusted; if the case recurs, it is re-entered into the high-priority monitoring queue. This manual demonstrates that inspections can verify the effectiveness of case fixes, prevent problem recurrence, optimize resource allocation (e.g., reducing the inspection frequency for stable cases to save computing power / manpower), and build a feedback loop.

[0055] Inspections can be periodic, with cycles ranging from hours, days, weeks, and months. Inspections can also be non-periodic, such as case-driven inspections, triggered when a case's designated inspection time is reached. Each case has a "next inspection time," and the computing device 600 can find the earliest inspection time among all cases' "next inspection times" and trigger the inspection at that earliest time.

[0056] A case can refer to the smallest unit of problem or event instance in a specific scenario that has an independent identifier, an observable state, and needs to be monitored or verified, such as a dialogue between a user and a model, a device, or user behavior. A dialogue can be between a user and a large language model, a large multimodal model, or a user and a general large model or a large model specific to a particular domain (such as a large medical model).

[0057] The defect case set includes one or more bad cases. A bad case refers to a typical instance during system operation where the actual output or behavior fails to meet expected standards, contains errors, deficiencies, or risks. Defect cases can also be called abnormal cases or failure cases. A bad case can be a case that was previously identified as a defect, and even if subsequently fixed, it remains a defect case. Alternatively, after a sufficient number of successful inspections, it can be determined that it is no longer a defect case and is reclassified as a normal case. Whenever a problem is detected in a case, such as failing to meet expected standards, the computing device can add that case to the defect case set. Staff can manually or the computing device can automatically fix the bad cases, aiming to bring them up to the expected standards after fixing. For example, after fixing a model dialogue, it is expected that the large model's responses will conform to preset standards.

[0058] The next inspection time for a defect case can be expressed in several ways. The next inspection time can be a specific time (date / time). It can also be the inspection round (round N). For example, for periodic inspections, if a certain case is included in round N, then the next inspection time for that case will be round N. The next inspection time can also be a relative time, such as 1 day later, 2 days later, or 1 hour later; that is, the next inspection will occur after a fixed period of time from the current time (or the time the last inspection was completed).

[0059] S140: Based on the next inspection time of each defect case in the defect case set, determine the target subset corresponding to this inspection from the defect case set.

[0060] Each inspection may cover some or all of the defect case sets. The target subset is the set of cases that need to be inspected during this inspection.

[0061] The target subset can be determined based on the next inspection time of each defect case. The computing device 600 can add defect cases whose next inspection time matches the current inspection time to the target subset based on the next inspection time of each defect case in the defect case set. Here, "next inspection time matches the current inspection time" means that the next inspection time and the current inspection time are the same when converted to the same time dimension. For example, if the next inspection time of a case is one day later, and the current inspection time is December 1, 2025, and the specific time of the case one day later is also December 1, 2025, then it is determined that the next inspection time of that case matches the current inspection time. By adding all defect cases with matching times to the target subset, the completeness of case inspection can be ensured.

[0062] The target subset can be determined based on the predicted inspection volume corresponding to this inspection and the next inspection time for each defect case.

[0063] For predicting the inspection quantity, the computing device 600 can predict the number of cases to be inspected this time based on the most recent inspection result of each defect case in the defect case set, and the number of times each defect case whose most recent inspection result was "repaired" has been continuously inspected and marked as "repaired". The predicted inspection quantity corresponding to this inspection can be the number of cases to be inspected this time. The number of cases to be inspected this time can be the sum of the predicted quantity of defect cases whose most recent inspection result was "unrepaired" and the predicted quantity of defect cases whose most recent inspection result was "repaired". The predicted quantity of unrepaired defect cases can be the number of cases. The predicted quantity of repaired defect cases can be determined based on the number of times they have been continuously inspected and marked as "repaired". For example, there is a negative correlation between the predicted quantity of repaired defect cases and the number of times they have been continuously inspected and marked as "repaired" (such as exponential negative correlation or linear negative correlation), that is, the greater the number of times a case has been continuously inspected and marked as "repaired", the smaller its predicted quantity.

[0064] The computing device can predict the number of cases to be inspected in this inspection based on the following formula:

[0065] in, This represents the number of cases to be inspected in this round. This represents the number of defect cases that were not fixed in the most recent inspection. This represents the total number of defect cases that were repaired in the most recent inspection. This represents the number of times the i-th defect case, which was last inspected and found to be repaired, has been continuously inspected and found to be repaired. For the i-th defect case, in this inspection... The contribution weight.

[0066] While fixed cases theoretically don't need to participate in every round of inspections, they can still be included based on probability or weight to prevent recurrence. The more consecutive successful inspections a fixed case has, the lower its corresponding weight. By weighting the "inspection value" of fixed cases, we can assess how many fixed cases constitute the "equivalent workload" of this inspection.

[0067] The number of cases to be inspected this time may be independent of the time interval between the next inspection for a repaired case and this inspection. In some cases, when the time interval for a repaired case increases exponentially, the number of cases to be inspected this time can be calculated using the above formula. For example, when the interval number for a repaired case is 2... K The number of cases to be inspected in this round can be calculated using the formula above. In some cases, when the interval number corresponding to the repaired cases is N... K When, in the above formula It can be changed to Assuming the interval period is in days, This indicates the estimated probability that a repaired case will be included in this inspection. The time interval and number of intervals are described below.

[0068] The computing device 600 can also calculate the predicted inspection quantity in other ways. For example, for each defect case whose most recent inspection result is that it has been repaired, its predicted quantity is the inverse of the number of consecutive inspections that have been repaired; the predicted quantity for defect cases whose most recent inspection result is that they have not been repaired is the number of cases, and the number of cases to be inspected this time is the sum of the two.

[0069] If the number of cases to be inspected in this inspection is greater than the preset number of cases, the computing device 600 can determine a candidate set in the defect case set whose next inspection time matches the current inspection time based on the next inspection time of each defect case in the defect case set, and select the preset number of defect cases in the candidate set to form the target subset according to the preset priority rules.

[0070] The preset number of cases can be the maximum number of cases that can be inspected in this inspection cycle. For example, each inspection cycle can be pre-allocated computing resources, and the preset number of cases is the maximum number of cases that can be inspected with the allocated computing resources. When the predicted inspection volume for this cycle is too large and exceeds the capacity of this cycle, defect cases that match the inspection time can be identified, and then the preset number of defect cases can be selected from the time-matching defect cases to perform this inspection. The computing device 600 can determine the priority of each case in the candidate set according to a preset priority rule, and then select the top-ranked preset number of defect cases in descending order of priority to form the target subset for this inspection. By conducting inspections based on priority, limited computing resources can be allocated to the cases most likely to have problems, maximizing resource utilization.

[0071] The preset priority rules include: the priority of defect cases whose most recent inspection result is "not fixed" is higher than that of defect cases whose most recent inspection result is "fixed"; for defect cases whose most recent inspection result is "fixed", the fewer times they are continuously inspected as "fixed", the higher their priority.

[0072] The computing device 600 can prioritize handling unrepaired cases and recently repaired cases. If a case was determined to be unrepaired in the previous round of inspections, it means that the problem still exists, and its priority is higher than cases determined to be repaired in the previous round of inspections. Among multiple defect cases determined to be repaired in the previous round of inspections, the stability of newly repaired cases is questionable; they may only be correct by chance or effective under specific conditions, so they need to be given priority. Cases that have been repaired in multiple consecutive inspections indicate that the repair effect is stable and the risk of recurrence is low, so their priority is lower. For example, a case that has just been repaired and has only been successfully repaired 1-2 times has a higher priority than a case that has been successfully repaired 5 times or more. In other words, the more unstable and recently repaired a case is, the more priority it needs to be given; the more stable and consistently good-performing a case is, the less attention it needs to receive.

[0073] In some cases, the computing device 600 may also randomly select a preset number of defective cases from the candidate set to form the target subset, which is not limited in this specification.

[0074] S160: Conduct a routine inspection of each defect case in the target subset to obtain the inspection results for each defect case.

[0075] The computing device 600 can perform inspections on each defect case in the target subset to verify whether each defect case is in an unrepaired or repaired state. That is, the inspection result can be either unrepaired or repaired.

[0076] The computing resources used in this inspection can be dynamically allocated. The computing device 600 can obtain the number of defect cases in the target subset, and schedule computing resources corresponding to that number to inspect each defect case in the target subset, obtaining the inspection result for each defect case. In other words, the computing device can count the number of defect cases in this inspection and dynamically allocate appropriate computing resources as needed to perform the inspection, avoiding resource waste or insufficient resources.

[0077] The computing resources used for this inspection can be pre-allocated. The computing device 600 can determine the maximum number of cases to be inspected based on the pre-allocated computing resources, which will be used as the aforementioned preset number of cases. Then, it can select cases not exceeding the preset number of cases for inspection.

[0078] S180: Based on the inspection results of each defect case in the target subset, update the next inspection time of the corresponding defect case in the defect case set. The update operation makes the next inspection time of the first type of defect case later than the next inspection time of the second type of defect case. The first type of defect case includes defect cases whose inspection results are all repaired in multiple consecutive inspections. The second type of defect case includes defect cases whose inspection results are not repaired in this inspection.

[0079] The next inspection time for each defect case in the defect case set can be dynamically updated. For each defect case in the target subset, the computing device 600 can update the next inspection time for that case based on the current inspection results, thus providing a basis for the next inspection.

[0080] The computing device can differentiate the next inspection time for each defect case. For the first type of defect case, multiple consecutive inspection results all indicate that it has been repaired, including the current inspection result. The first type of defect case is a consistently repaired case, and its next inspection time is later than that of unrepaired cases. By delaying the next inspection time for the first type of defect case, the inspection frequency can be reduced, thereby saving computing resources.

[0081] In some cases, the time interval between two consecutive inspections of a Type I defect case is related to the number of times it has been consecutively inspected as repaired. For example, the time interval between two consecutive inspections of a Type I defect case gradually increases as the number of consecutive inspections of a case as repaired increases. For instance, for a Type I defect case where the previous inspection result was repaired, and it was the first repair, and the current inspection result is also repaired, if the next inspection result for this case is also repaired, then the time interval between this inspection and the next inspection is greater than the time interval between the previous inspection and the current inspection. Furthermore, the time interval between the next inspection and the inspection after that is greater than the time interval between this inspection and the next inspection.

[0082] If the first repair of this case is recorded as the first successful inspection (i.e., the inspection result is repaired) or the first successful inspection, starting from the first successful inspection, the time interval between the first successful inspection and the second successful inspection is less than the time interval between the second successful inspection and the third successful inspection; the time interval between the second successful inspection and the third successful inspection is less than the time interval between the third successful inspection and the fourth successful inspection; the time interval between the third successful inspection and the fourth successful inspection is less than the time interval between the fourth successful inspection and the fifth successful inspection, and so on.

[0083] In this context, "first successful inspection" refers to the first inspection within the most recent consecutive successful inspections. In some cases, certain cases, from the moment they are added to the defect case set or after the start of inspections, consistently show as "repaired." In such cases, the inspection results for some cases may fluctuate. For example, after several consecutive inspections showing "repaired," an unrepaired result appears, followed by several more consecutive inspections showing "repaired." That is, some cases may have multiple consecutive successful inspections, or multiple consecutive successful inspection counts (the number of times they are consecutively inspected as "repaired"). When determining the time interval between two adjacent inspections after this current inspection, it is only related to the most recent consecutive successful inspection; the "first successful inspection" here refers to the first inspection within the most recent consecutive successful inspection.

[0084] Through the above embodiments, for cases with stable repairs, the time interval between two consecutive inspections increases with the number of successful inspections, rather than remaining constant. The more stable the case repair (the more consecutive successful inspections), the lower the risk. Therefore, the interval between two inspections can be lengthened, reducing the inspection frequency and thus saving computing resources.

[0085] In some cases, the time interval between two consecutive inspections of a first-type defect case may be the same, but it will always be greater than the time interval between two consecutive inspections of an unrepaired case. In some cases, the time interval between two consecutive inspections of a first-type defect case increases gradually, but this can also be independent of the number of consecutive inspections that indicate it has been repaired, and can be a pre-set gradually increasing time interval. This specification does not limit this aspect in the embodiments.

[0086] For the first type of defect case, the time interval between two consecutive inspections gradually increases as the number of consecutive inspections showing the defect as repaired increases. This gradual increase is exponential. After each successful inspection, the time interval before the next inspection can grow exponentially. This exponential increase quickly reduces the inspection frequency of stable cases, thereby rapidly reducing resource consumption. Exponential increase also balances early intensive verification and long-term stability confirmation; that is, the interval between two consecutive inspections is short in the early stages, allowing for high-frequency verification, while the interval between two consecutive inspections is long in later stages, allowing for low-cost confirmation of the long-term reliability of cases. This exponential increase achieves a balance between "verification sufficiency" and "resource efficiency." In some cases, the exponential increase can be a multi-level backoff strategy. After implementing multi-level backoff according to exponential increase, the time interval between two consecutive inspections is fixed, such as a fixed time interval after three levels of backoff. In some cases, the gradual increase can also be other increasing methods, such as linear increase or step increase; this specification does not limit these methods in the embodiments.

[0087] For updating the next inspection time, the computing device 600 can determine the number of interval periods between the current inspection and the next inspection of each defect case in the target subset, based on the inspection results of the current inspection for each defect case. Furthermore, based on the number of interval periods corresponding to each defect case in the target subset, the computing device determines the next inspection time for the corresponding defect case. The computing device can determine the next inspection time as the time elapsed since the current inspection time. For example, if the number of interval periods is 2 days, the next inspection time is 2 days after the current inspection time.

[0088] The number of intervals corresponding to a repaired defect in this inspection can differ from the number of intervals corresponding to an unrepaired defect in this inspection. For example, the number of intervals corresponding to a defect case that is repaired in this inspection is greater than the number of intervals corresponding to a defect case that is unrepaired in this inspection. A defect case that is repaired in this inspection can be a case that has been repaired at least twice consecutively, including this inspection. A defect case that is repaired in this inspection can also be a case that is being repaired for the first time in an inspection.

[0089] In some cases, the number of intervals is preset based on the inspection results. For example, for cases where the inspection result is that the problem has been repaired, the corresponding number of intervals is the first preset number of intervals. For cases where the inspection result is that the problem has not been repaired, the corresponding number of intervals is the second preset number of intervals. The first preset number of intervals is greater than the second preset number of intervals.

[0090] In some cases, the interval number is calculated based on the inspection results and an index. For example, for any target defect case in the target subset, if the current inspection result for the target defect case is "repaired," then the interval number between the next inspection and the current inspection for the target defect case is determined to be N. K Where N is a preset integer and K is the number of times the target defect case has been continuously inspected and deemed repaired.

[0091] Where N can be a positive integer greater than 1, such as 2, 3, 4, etc. K can be a positive integer greater than 0, such as 1, 2, 3, etc. When K=1, it indicates that this inspection is the first successful inspection of the target defect case, and its "number of times it has been continuously inspected as repaired" is 1. As mentioned before, when a case has multiple "number of times it has been continuously inspected as repaired", K is the most recent "number of times it has been continuously inspected as repaired". Taking N=2 as an example, when K=1, that is, when the target defect case has been successfully inspected 1 time, the interval is 2. When K=2, that is, when the target defect case has been successfully inspected 2 times, the interval is 4. When K=3, that is, when the target defect case has been successfully inspected 3 times, the interval is 8. And so on. By N K Setting the interval to the above number of periods allows for a longer interval after the first successful verification, resulting in faster resource savings. This approach can be applied in scenarios where resources are extremely limited or in low-risk / non-core situations, such as when the flaws in the case are format errors, redundant answers, or other issues that do not affect the core functionality.

[0092] In some cases, if the current inspection result for the target defect case is that it has been repaired, then the interval between the next inspection and the current inspection for the target defect case is determined to be N. K-1 Here, the meanings of N and K can be found in the definitions above. Taking N=2 as an example, when K=1, meaning the target defect case has been successfully inspected once consecutively, the interval is 1 cycle. When K=2, meaning the target defect case has been successfully inspected twice consecutively, the interval is 2 cycles. When K=3, meaning the target defect case has been successfully inspected three times consecutively, the interval is 4 cycles. And so on. By using N... K-1 Setting the interval to the above-mentioned number of cycles allows for high-frequency verification even after the initial successful verification (e.g., a second inspection immediately after one day), meaning a second confirmation is performed immediately after the initial fix to ensure that the initial fix was not a coincidence. This approach can be applied in high-risk / core scenarios, scenarios where models are frequently updated and old problems are prone to recurrence, or in quality assurance systems requiring high reliability (such as in the financial and medical fields).

[0093] For any target defect case in the target subset, if the current inspection result for that target defect case is "unrepaired," then the interval between the next inspection and the current inspection for that target defect case is determined to be 1. If the inspection is periodic, the interval between two adjacent rounds of inspection is 1; for example, if one round of inspection is performed daily, then the interval between two adjacent rounds of inspection is 1 day. For unrepaired cases, verification can continue in the next round of inspection until they are marked as repaired, after which inspection is performed according to the interval for repaired cases, such as in an exponentially increasing manner. High-frequency inspection of unrepaired cases ensures that problems are discovered and addressed as early as possible, preventing problems from remaining hidden for a long time.

[0094] The computing device 600 can obtain the percentage information of defect cases that have been repaired in the current inspection; determine that the percentage information is greater than the preset percentage information, reduce the number of interval cycles corresponding to the defect cases in the target subset; and determine the next inspection time for the corresponding defect case based on the reduced number of interval cycles.

[0095] The percentage information can be the ratio between the number of defect cases that have been repaired in this inspection and the total number of defect cases in the target subset. A larger percentage indicates a higher repair success rate; a smaller percentage indicates a lower success rate. Since the inspection frequency of repaired cases is relatively low, a higher success rate (i.e., more repaired cases) can save significant computing resources (the computing resources for each inspection can be pre-allocated). These saved computing resources can be used to increase the inspection density of defect cases in the target subset, i.e., reduce the corresponding interval number, thereby balancing resource allocation and reducing resource waste.

[0096] In one scenario, the saved computing resources can be used to increase the inspection density of unrepaired cases in the target subset, such as shortening the interval between unrepaired cases. For example, if the original interval between unrepaired cases was 1, it can be adjusted to 0.5 based on the proportion information. In another scenario, the saved computing resources can be used to increase the inspection density of newly repaired cases in the target subset, such as shortening the interval between newly repaired cases. For example, if the original interval between newly repaired cases was 2, it can be adjusted to 1 based on the proportion information.

[0097] In one scenario, when the percentage information is determined to be greater than a preset percentage information, the computing device 600 can increase the preset number of cases for the next inspection, allowing more cases to be inspected in the next inspection. For example, if the preset number of cases was originally 500, it can be increased to 1000 when the percentage information is large.

[0098] Figure 4 A schematic diagram of a case inspection process provided according to some embodiments of this specification is shown.

[0099] like Figure 4 As shown, when a defect case occurs, the user can report the defect case to the computing device 600, and the computing device 600 can also automatically mark the defect case. The reported / marked defect cases can form a use case center, that is, a defect case set.

[0100] The computing device 600 can perform an initial inspection (i.e., initial patrol) on each defect case in the defect case set. The initial patrol can be the first patrol in a periodic patrol. The subset of defect cases corresponding to the initial patrol can include all defect cases in the defect case set. The initial patrol determines whether each defect case has been repaired or not. The initial patrol result can be used to determine the next patrol time for each defect case in the subset of defect cases corresponding to the initial patrol.

[0101] If the initial inspection result is "unrepaired," cases with an initial "unrepaired" result can be added to the inspection case (or defect case subset) of the next round of inspections (or the next inspection after the initial inspection) to perform continuous inspections on unrepaired cases. That is, the next inspection time for an unrepaired case is the next round of inspections in the periodic inspection schedule after the initial inspection. For example, the interval between the next inspection of the unrepaired case and the current inspection is 1 period. Figure 4 The “Current Inspection Cases” in the text refer to the subset of defect cases corresponding to the next round of inspections after the initial inspection.

[0102] If the initial inspection result indicates that the issue has been repaired, an initial time interval can be set for that repaired case. This interval is the time between the first and next inspections for that repaired case, such as T=1 day. Of course, the initial time interval can also be other interval numbers, such as N mentioned above. K When N is 2, the initial time interval T = 2 days. T can represent the time interval between any two inspections. Therefore, the next inspection time for a repaired case is the time elapsed since the first inspection, after the initial time interval.

[0103] When the time for the next round of inspection after the initial inspection is reached, the computing device 600 can designate the next round of inspection as the current round of inspection. Before triggering the execution of this round of inspection, inspection configuration and scheduling can be performed. Inspection configuration refers to configuring the next inspection time for each defect case from the initial inspection based on the results of the initial inspection. Inspection scheduling refers to determining the subset of defect cases corresponding to this round of inspection based on the next inspection time for each defect case from the initial inspection. Thus, the execution of this round of inspection (i.e.,...) is triggered. Figure 4 (Triggered inspection in the process). During this round of inspection, computing device 600 can perform resource allocation and scheduling, that is, schedule computing resources corresponding to the defect case subset to inspect each defect case in the defect case subset, thereby obtaining the inspection results for each defect case in this round. The inspection results of this round can be used to determine the next inspection time for each defect case in the defect case subset corresponding to this round of inspection.

[0104] If the result of this round of inspection is that the defect case is not repaired, that is, the inspection of the defect case fails, the next inspection time of the unrepaired case can be set to the next round of inspection after this round of inspection in the periodic inspection. For example, the interval between the next inspection of the unrepaired case and this inspection is 1 cycle.

[0105] If the result of this round of inspection is that the defect has been repaired, meaning the defect case inspection was successful, then the time interval between this inspection and the next inspection for that repaired case is set to T = T * 2, meaning the current time interval is twice the previous adjacent time interval. Therefore, the next inspection time for a repaired case is the time elapsed since the start of this inspection, based on the initial time interval.

[0106] For cases where the initial inspection result indicates the issue has been resolved, the following inspection strategy can be adopted after the initial resolution. For each consecutive inspection following the initial result, an exponentially increasing inspection time interval can be used; for example, the time interval between two consecutive inspections can be 2 cycles. K-1 K represents the number of times a case has been continuously inspected and marked as repaired. Accordingly, the time for the first inspection of this case after the initial inspection result can be one interval period from the first inspection, such as one day, i.e., the first day after the first repair. The time for the second inspection of this case after the initial inspection result can be two interval periods from the first inspection, such as two more days, i.e., the third day after the first repair. The time for the third inspection of this case after the initial inspection result can be four interval periods from the second inspection, such as four more days, i.e., the seventh day after the first repair. The time for the fourth inspection of this case after the initial inspection result can be eight interval periods from the third inspection, such as eight more days, i.e., the fifteenth day after the first repair. And so on. Of course, the time interval between any two adjacent inspections after the initial inspection result can also be 2. K This specification does not specify which exponential increment method should be used in the embodiments.

[0107] Figure 5 A schematic diagram is shown of a subset of defect cases corresponding to an inspection, provided according to some embodiments of this specification.

[0108] Each round of inspections includes a subset of defect cases (such as the target subset for this round of inspections) that contains defect cases whose next inspection time matches the current round's inspection time. These time-matching defect cases may originate from defect cases added between the current and previous rounds of inspections. The next inspection time for newly added defect cases can be the most recent next round of inspections. These time-matching defect cases may originate from the subset of defect cases corresponding to their previous round of inspections, or they may originate from the subset of defect cases corresponding to earlier inspections.

[0109] For example, the subset of defect cases corresponding to each round of inspection includes cases that were not repaired in the previous round of inspection, and / or cases that were repaired in the previous round of inspection and are being repaired for the first time. Another example is that the subset of defect cases corresponding to each round of inspection includes cases that have been stopped K times. Cases that have been stopped K times are those that were all repaired in their corresponding K consecutive inspections prior to this round of inspection. For example, for periodic inspections, assume that the time interval between two adjacent inspections corresponding to the first type of defect case is 2... K Calculations show that the subset of defect cases corresponding to the 7th round of inspections includes cases that stopped twice. These cases were identified as repaired in both the 1st and 3rd rounds of inspections, meaning they were repaired in both consecutive inspections. Similarly, the subset of defect cases corresponding to the 15th round of inspections includes cases that stopped three times. These cases were identified as repaired in the 1st, 3rd, and 7th rounds of inspections, meaning they were repaired in all three consecutive inspections.

[0110] like Figure 5 As shown, each round of inspection cases (defect case subset) may include newly added defect cases between the current round of inspection and the previous round of inspection (represented by white circles), defect cases in the defect case subset corresponding to the previous round of inspection (represented by black circles), cases that have stopped twice (represented by dark gray circles), and cases that have stopped more than once (represented by light gray circles).

[0111] In summary, the case inspection method, equipment, and storage media provided in this specification ensure that the next inspection time for the first type of defect case is later than that for the second type of defect case. The first type of defect case includes defect cases that have been repaired in multiple consecutive inspections, while the second type of defect case includes defect cases that have not been repaired in the current inspection. This reduces the inspection frequency of repaired defect cases, thereby saving computational resources for inspection. Furthermore, by using an exponential backoff strategy (i.e., the inspection interval for continuously repaired cases increases exponentially), redundant inspections are reduced, decreasing the total inspection workload by approximately 50%. It also ensures daily coverage of unrepaired cases to avoid backlog, while repaired cases are retained for a long time but with a decreasing inspection frequency. Moreover, the inspection strategy can be adaptively adjusted based on repair rate fluctuations (e.g., shortening the inspection interval for unrepaired cases when the repair rate is >80%). Finally, a probability-weighted formula is introduced to quantify the total inspection volume, ensuring system scalability.

[0112] This specification, in another aspect, provides a non-transitory storage medium storing at least one set of executable instructions for performing case inspection. When the executable instructions are executed by a processor, they instruct the processor to implement the steps of the case inspection method P100 described in this specification. In some possible embodiments, various aspects of this specification can also be implemented as a program product comprising program code. When the program product is run on a case inspection device, the program code causes the case inspection device to perform the steps of the case inspection method P100 described in this specification. The program product for implementing the above method may employ a portable compact disc read-only memory (CD-ROM) containing program code and may run on a case inspection device. However, the program product of this specification is not limited thereto. In this specification, a readable storage medium may be any tangible medium containing or storing a program that may be used by or in conjunction with an instruction execution device. The program product may employ any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of readable storage media include: electrical connections having one or more wires, portable disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. The computer-readable storage medium may include data signals propagated in baseband or as part of a carrier wave, carrying readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A readable storage medium may also be any readable medium other than a readable storage medium that can send, propagate, or transmit a program for use by or in connection with an instruction execution device, apparatus, or apparatus. The program code contained on the readable storage medium may be transmitted using any suitable medium, including but not limited to wireless, wired, optical fiber, RF, etc., or any suitable combination thereof. Program code for performing the operations described herein can be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java and C++, and conventional procedural programming languages ​​such as C or similar languages. The program code can be executed entirely on the test case inspection device, partially on the test case inspection device, as a standalone software package, partially on the test case inspection device and partially on a remote computing device, or entirely on a remote computing device.

[0113] The foregoing has described specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be performed in a different order than that shown in the embodiments and may still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are possible or may be advantageous.

[0114] In summary, after reading this detailed disclosure, those skilled in the art will understand that the foregoing detailed disclosure is presented by way of example only and is not restrictive. Although not explicitly stated herein, those skilled in the art will understand that this specification requires various reasonable changes, improvements, and modifications to the embodiments. These changes, improvements, and modifications are intended to be made by this specification and are within the spirit and scope of the exemplary embodiments described herein.

[0115] Furthermore, certain terms in this specification have been used to describe embodiments of this specification. For example, "an embodiment," "an embodiment," and / or "some embodiments" mean that a particular feature, structure, or characteristic described in connection with that embodiment may be included in at least one embodiment of this specification. Therefore, it is to be emphasized and understood that two or more references to "an embodiment" or "an embodiment" or "alternative embodiment" in various parts of this specification do not necessarily refer to the same embodiment. Moreover, specific features, structures, or characteristics may be suitably combined in one or more embodiments of this specification.

[0116] It should be understood that in the foregoing description of the embodiments in this specification, various features are combined in a single embodiment, drawing, or description for the purpose of simplifying the description and aiding in the understanding of a feature. However, this does not mean that the combination of these features is necessary, and those skilled in the art may readily identify some of the devices as separate embodiments when reading this specification. That is, the embodiments in this specification can also be understood as an integration of multiple secondary embodiments. It is also valid when each secondary embodiment contains fewer than all the features of a single foregoing disclosed embodiment.

[0117] Every patent, patent application, publication of a patent application, and other material such as articles, books, specifications, publications, documents, articles, etc., cited herein, except for any related historical prosecution documents, any identical ones that may be inconsistent with or conflict with this document, or any identical historical prosecution documents that may have a limiting effect on the widest scope of the claims, may be incorporated herein by reference and used for all purposes now or hereafter in connection with this document. Furthermore, in the event of any inconsistency or conflict between the description, definition, and / or use of terms related to any included material and those related to this document, the terminology used herein shall prevail.

[0118] Finally, it should be understood that the embodiments disclosed herein are illustrative of the principles of the embodiments described in this specification. Other modified embodiments are also within the scope of this specification. Therefore, the embodiments disclosed in this specification are merely examples and not limitations. Those skilled in the art can implement the applications described in this specification using alternative configurations based on the embodiments in this specification. Therefore, the embodiments in this specification are not limited to the embodiments precisely described in the applications.

Claims

1. A case inspection method, comprising: In response to the triggering of this inspection, obtain the next inspection time for each defect case in the defect case set; Based on the next inspection time of each defect case in the defect case set, the target subset corresponding to this inspection is determined from the defect case set; Each defect case in the target subset is inspected to obtain the inspection results for each defect case. as well as Based on the inspection results of each defect case in the target subset, the next inspection time of the corresponding defect case in the defect case set is updated. The update operation makes the next inspection time of the first type of defect case later than the next inspection time of the second type of defect case. The first type of defect case includes defect cases whose inspection results are all repaired in multiple consecutive inspections, and the second type of defect case includes defect cases whose inspection results are not repaired in this inspection.

2. The method as described in claim 1, wherein, The update operation also causes the time interval between two adjacent inspections of the first type of defect case to gradually increase as the number of times it is continuously inspected as repaired increases.

3. The method as described in claim 2, wherein, The gradual increase method is an exponential increase.

4. The method of claim 1, wherein, Based on the inspection results of each defect case in the target subset, the next inspection time for the corresponding defect case in the defect case set is updated, including: Based on the current inspection result of each defect case in the target subset, the interval number between the next inspection of the defect case and the current inspection is determined, wherein the interval number corresponding to a repaired defect case is greater than the interval number corresponding to an unrepaired defect case; and Based on the number of intervals corresponding to each defect case in the target subset, the next inspection time for the corresponding defect case is determined.

5. The method of claim 4, wherein, Based on the inspection results of each defect case in the target subset, determine the number of intervals between the next inspection of the defect case and the current inspection, including: For any target defect case in the target subset, if the current inspection result of the target defect case is "repaired", then the number of interval periods between the next inspection and the current inspection of the target defect case is determined to be N. K Where N is a preset integer and K is the number of times the target defect case has been continuously inspected and deemed repaired.

6. The method of claim 4, wherein, Based on the inspection results of each defect case in the target subset, determine the number of intervals between the next inspection of the defect case and the current inspection, including: For any target defect case in the target subset, if the current inspection result of the target defect case is unrepaired, then the interval period between the next inspection and the current inspection of the target defect case is determined to be 1.

7. The method of claim 4, wherein, The step of determining the next inspection time for a corresponding defect case based on the number of intervals corresponding to each defect case in the target subset includes: Obtain the percentage of defect cases that have been repaired as determined in this inspection; If the percentage information is determined to be greater than the preset percentage information, the number of interval periods corresponding to the defect cases in the target subset is reduced; and The next inspection time for the corresponding defect case is determined based on the reduced interval number.

8. The method of claim 1, wherein, Based on the next inspection time of each defect case in the defect case set, a target subset corresponding to this inspection is determined from the defect case set, including: Based on the next inspection time of each defect case in the defect case set, defect cases whose next inspection time matches the current inspection time are added to the target subset; Each defect case in the target subset is inspected, and the inspection results for each defect case are obtained, including: The number of defect cases in the target subset is obtained, and the computing resources corresponding to the number of defect cases are scheduled to inspect each defect case in the target subset to obtain the inspection result of each defect case.

9. The method of claim 1, wherein, Based on the next inspection time of each defect case in the defect case set, a target subset corresponding to this inspection is determined from the defect case set, including: Based on the most recent inspection result of each defect case in the defect case set, and the number of times each defect case whose most recent inspection result was "repaired" has been continuously inspected as "repaired," the number of cases to be inspected this time is predicted; and If the number of cases to be inspected this time is greater than the preset number of cases, based on the next inspection time of each defect case in the defect case set, a candidate set in the defect case set whose next inspection time matches the current inspection time is determined, and the preset number of defect cases are selected from the candidate set according to the preset priority rules to form the target subset.

10. The method of claim 9, wherein, Based on the most recent inspection result of each defect case in the defect case set, and the number of times each defect case whose most recent inspection result was "repaired" has been continuously inspected as "repaired", the number of cases to be inspected this time is predicted, including: Based on the following formula, the number of cases to be inspected this time is predicted: Among them, the The number of cases to be inspected in this inspection. The number of defect cases that were not repaired in the most recent inspection. The number of defect cases that were repaired in the most recent inspection. The number of times the i-th defect case, whose most recent inspection result was repaired, has been continuously inspected and confirmed as repaired.

11. The method of claim 9, wherein, The preset priority rules include: The priority of defect cases whose most recent inspection result was "unrepaired" is higher than that of defect cases whose most recent inspection result was "repaired"; and For defect cases where the most recent inspection result is that the defect has been repaired, the fewer times it has been continuously inspected and found to be repaired, the higher its priority.

12. A case inspection device, comprising: At least one storage medium stores at least one instruction set for implementing case inspection; as well as At least one processor is communicatively connected to the at least one storage medium. When the device is running, the at least one processor reads the at least one instruction set and implements the method of any one of claims 1-11.

13. A computer-readable non-transitory storage medium, wherein, The computer-readable non-transitory storage medium stores at least one set of instructions, which, when executed by at least one processor, implement the method as described in any one of claims 1-11.

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