Static flying spot scanning method based on flying focus point x-ray source

Abstract

The invention discloses a static flying spot scanning method based on a flying focus point x-ray source, and belongs to the technical field of x-ray scanning, and the method comprises the following steps: S1, providing a flying focus point x-ray source; s2, providing a static restraint device; s3, controlling the focus of the flying focus x-ray source to move or switch according to a preset scanning mode, so that x-rays irradiate the scanned object point by point through a hole groove or a spiral gap in the static constraint device, and performing flying spot scanning on the scanned object; and S4, collecting a scattering x-ray signal of the scanned object by using a detector, converting the scattering x-ray signal into an electric signal, carrying out analog-to-digital conversion, and carrying out signal processing to generate a scanning image. According to the static flying spot scanning method based on the flying focus point x-ray source, a traditional combination of a fixed focus point and a high-speed mechanical device is replaced by the combination of the electrically-controlled x-ray source capable of changing the focus point and the static constraint device, and the scanning performance is improved.

Description

Technical Field

[0001] This invention relates to the field of X-ray scanning technology, and in particular to a static flying-point scanning method based on a flying-focus X-ray source. Background Technology

[0002] X-ray flying spot scanning technology is widely used in security inspection, industrial inspection and other fields. Its core principle is to scan the object being inspected point by point with X-rays, use a detector to collect the scattered X-rays and convert them into image signals, so as to realize the detection of the internal structure of the object.

[0003] Existing X-ray flying spot scanning technology relies on a high-speed rotating mechanical device. After the X-rays are constrained by the collimation slit to form a fan-shaped beam, they are then converted into a pencil-shaped fine beam by the flying spot device (such as a disc, wheel, or column structure). The fine beam moves up and down with the rotation of the flying spot device to complete the flying spot scanning. However, this traditional technology has many drawbacks: slow scanning speed: the scanning speed of the mechanical rotating device is limited by the mechanical motion limit, far lower than the response speed of electronically controlled scanning; long start-up time: the flying-spot device needs to accelerate from a standby position to a stable rotating state, which takes a long time. It usually needs to maintain low-speed rotation in standby mode to shorten the start-up time, increasing energy consumption; poor stability: high-speed rotation requires extremely high dynamic balance accuracy of the device, which is easily affected by vibration, wear and other factors, leading to a decrease in scanning stability; high maintenance cost: high-speed rotating mechanical parts are prone to damage and require regular inspection and replacement, increasing equipment maintenance costs and downtime; low image quality: the high-speed rotation of the mechanical device will produce motion blur, resulting in a decrease in the resolution of the scanned image and affecting the detection accuracy; high radiation dose: in order to ensure image quality, the X-ray radiation dose needs to be increased to compensate for the effects of motion blur, posing a potential hazard to operators and the environment.

[0004] Therefore, there is an urgent need for a flying-spot X-ray scanning method that does not require high-speed mechanical movement and has better performance, in order to solve the problems existing in the current technology. Summary of the Invention

[0005] The purpose of this invention is to provide a static flying-spot scanning method based on a flying-focus X-ray source. By combining an electrically controlled, variable-focus X-ray source with a static constraint device, the traditional combination of a fixed focus and a high-speed mechanical device can be replaced, thereby improving scanning performance.

[0006] To achieve the above objectives, the present invention provides a static flying-spot scanning method based on a flying-focus X-ray source, comprising the following steps: S1 provides a fly-focus X-ray source, which moves or switches the focal point by means of deflecting magnetic field, electric field control or switching control. S2 provides a static constraint device, which is made of heavy metal material and has a hole or groove or spiral slit structure inside. The hole or groove or spiral slit corresponds one-to-one with the focal point of the flying focal point X-ray source. X-rays emitted from the corresponding focal point can pass through the corresponding hole or groove or spiral slit structure. S3 controls the focal point of the fly-focus X-ray source to move or switch according to the preset scanning mode, so that the X-rays pass through the holes or spiral gaps on the static constraint device and irradiate the scanned object point by point, and perform fly-spot scanning on the scanned object. S4 uses a detector to collect scattered X-ray signals from the object being scanned, converts the scattered X-ray signals into electrical signals, performs analog-to-digital conversion, and then processes the signals to generate a scanned image.

[0007] Preferably, the control method of the deflection magnetic field and electric field is as follows: electrons bombard the target material to generate X-rays, the electron flight segment uses a deflection magnetic field or electric field to control the deflection direction and amplitude of the electrons, and the position of the electrons bombarding the target material is controlled by a pre-set voltage parameter to generate a movable X-ray source.

[0008] Preferably, the control method for switching is as follows: instead of a single electron emitter, multiple electron emitters are arranged in a certain way, and the electrons emitted by each emitter correspond to different positions of the target material. Each emitter is connected to an external electronic switch, and the electronic switch is controlled by programming so that the focus switches in a preset order.

[0009] Preferably, the flying-focus X-ray source in the switch-switching control method can be a carbon nanotube cold cathode X-ray source, which controls electron emission through pulse voltage. When the voltage applied to the carbon nanotube reaches the threshold, electrons are emitted instantaneously, and when the voltage falls below the threshold, emission stops instantaneously. The focus array shape in the switch switching control method includes rectangular surface, rectangular surface, linear, arc, and curved shape, which can be set according to the usage scenario.

[0010] Preferably, the heavy metal materials of the static restraint device include tungsten, copper, steel, and alloys, which can be manufactured using 3D printing.

[0011] Preferably, the arrangement of the holes and slots in the static constraint device includes a straight arrangement, a cross arrangement, and a honeycomb-like arrangement; The interior of the static constraint device can be hollowed out, retaining the two ends, the front segment, or the rear segment.

[0012] Preferably, the preset scanning methods include continuous scanning, static scanning, and non-isochronous static scanning. Continuous scanning mode: The focus moves continuously to scan the object point by point; Static scanning method: The process of the scanning point moving from one point to the next is not continuous. The scanning point stays at each point for the same amount of time until the last point, completing one column scan. Non-isochronous static scanning method: The process of the scanning point moving from the previous point to the next point is not continuous. The time the scanning point stays at each point is not necessarily the same until the last point, which completes a column scan. The scanning point stays for a longer time in the key scanning area.

[0013] Preferably, the sampling methods for flying point scanning include: conventional sampling and sparse sampling; Standard sampling: Sampling points densely cover the entire object being scanned, with no gaps between sampling points; Sparse sampling: Sampling points sparsely cover the entire scanned object, with gaps between sampling points.

[0014] The preferred sparse sampling process includes: Random number generation: Before sampling, the program generates a random number sequence, and the values ​​in the random number sequence represent the sampling positions; Random sparse sampling: During the scanning process, the position number is taken out sequentially from the random number sequence, and the focus corresponding to the hole groove or thread gap is found according to the number. The corresponding electronic switch is found according to the focus, and the electronic switch is turned on to emit rays. The position of the scanning point is determined by the random number sequence. One random number sequence completes one random sparse sampling. Data arrangement: The signals collected by the detector are in uncertain spatial locations. The signal values ​​are filled into the corresponding spatial locations according to a random number sequence, and the signal values ​​of the missing locations are all set to zero. Sparse reconstruction: After sparse sampling, some data is missing. Reconstruction methods are needed to restore the image from the sparsely sampled data. Convolutional neural networks can be used for reconstruction.

[0015] Preferably, the convolutional neural network can be a UNet neural network, using a batch of complete images as the target data for network training, randomly removing some pixels from the target data as the input data for training, training a sparse reconstruction network, and inputting the sparsely sampled data into the sparse reconstruction network for image restoration.

[0016] Therefore, the static flying-spot scanning method based on a flying-focus X-ray source described above, as used in this invention, has the following beneficial effects: 1. Increased Scanning Speed: Replacing traditional mechanical motion with electronic signal-controlled focus movement or switching results in faster response times. Combined with sparse sampling technology, high-speed scanning is possible. 2. Improved Image Resolution: Static and non-isochronous static scanning methods resolve motion blur effects. Combined with sparse reconstruction technology, scanned images are clearer, and detection accuracy is higher. 3. Enhanced Equipment Stability: Eliminating high-speed rotating mechanical devices reduces potential failure points, lowers the failure rate, and improves the stability and reliability of equipment operation. 4. Reduced Radiation Dose: Compared to traditional mechanical scanning methods, the radiation dose of this invention is significantly reduced at the same resolution. Combined with sparse sampling technology, the radiation dose can be further reduced, minimizing harm to operators and the environment, while also lowering protection costs. 5. Reduced Maintenance Costs: Eliminating the need to maintain high-speed rotating mechanical parts reduces the frequency of equipment inspection and replacement, lowering maintenance costs and downtime. 6. High Adaptability: The array shape of the flying focus, the arrangement of the slots in the static constraint device, the scanning method, and the sampling method can all be flexibly adjusted according to the application scenario, making it suitable for various fields such as security inspection and industrial testing.

[0017] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0018] Figure 1 This is a flowchart of a method according to an embodiment of the present invention; Figure 2 This is a schematic diagram of sparse sampling in an embodiment of the present invention. Figure 2 In the diagram, (a) represents uniform sparse sampling, and (b) represents random sparse sampling. Figure 3 This is a basic schematic diagram of an embodiment of the present invention; Figure 4 This is a schematic diagram of a static flying point device (circularly moving x-light source) according to an embodiment of the present invention. Figure 5 This is a schematic diagram of a static flying point device according to an embodiment of the present invention (an array of x-ray sources, with x-rays forming a straight line on the object being scanned). Figure 6 This is a schematic diagram of a static flying point device according to an embodiment of the present invention (an array of x-light sources, with x-rays forming staggered segmented straight lines on the object being scanned).

[0019] Attached icon number 1. Moving X-ray source; 2. Spiral slit one; 3. Slot one; 4. Object being scanned one; 5. Circularly moving X-ray source; 6. Static flying point constraint device one; 7. Detector one; 8. Object being scanned two; 9. Slot two; 10. Arrayed X-ray source; 11. Static flying point constraint device two; 12. Detector two; 13. Object being scanned three; 14. Slot three. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages disclosed in the embodiments of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the embodiments of the present invention and are not intended to limit the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments in this application without creative effort are within the scope of protection of this application. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout.

[0021] It should be noted that the terms “comprising” and “having”, and any variations thereof, are intended to cover non-exclusive inclusion, such that a process, method, system, product, or server that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such processes, methods, products, or devices.

[0022] Similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0023] In the description of this invention, it should be noted that the terms "upper," "lower," "inner," "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship in which the product of this invention is usually placed when in use. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0024] In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," and "connect" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0025] Example 1 like Figure 1 As shown, this embodiment provides a static flying-spot scanning method based on a flying-focus X-ray source, including the following steps: S1 provides a flyfocal X-ray source, which moves or switches the focal point by controlling the deflection magnetic field, electric field, or switching.

[0026] The specific control methods for the deflection magnetic field and electric field are as follows: electrons bombard the target material to generate X-rays. During the electron flight phase, the deflection direction and amplitude of the electrons are controlled by the deflection magnetic field or electric field. The position of the electrons bombarding the target material is controlled by the pre-set voltage parameters, thus generating a movable X-ray source.

[0027] The specific control method for switching is as follows: instead of a single electron emitter, multiple electron emitters are arranged in a certain way. The electrons emitted by each emitter correspond to different positions of the target material. Each emitter is connected to an external electronic switch, and the electronic switch is controlled by programming so that the focus switches in a pre-set order.

[0028] In the switching control method, the flying-focus X-ray source can be a carbon nanotube cold cathode X-ray source. Electron emission is controlled by pulse voltage. When the voltage applied to the carbon nanotube reaches the threshold, electrons are emitted instantaneously; when the voltage falls below the threshold, emission stops instantaneously.

[0029] The focus array shape in the switch switching control method includes rectangular surface, rectangular surface, linear, arc, and curved shape, which can be set according to the usage scenario.

[0030] S2 provides a static constraint device, which is made of heavy metal material and has a hole or spiral slit structure inside. The hole or spiral slit corresponds one-to-one with the focal point of the fly-focus X-ray source, and the X-rays emitted from the corresponding focal point can pass through the corresponding hole or spiral slit structure.

[0031] The heavy metal materials used in static restraint devices include tungsten, copper, steel, and alloys, and can be manufactured using 3D printing.

[0032] The arrangement of holes and slots in static constraint devices includes linear arrangement, cross arrangement, and honeycomb-like arrangement. The interior of the static constraint device can be hollowed out, retaining the two ends, the front segment, or the rear segment.

[0033] S3 controls the focal point of the fly-focus X-ray source to move or switch according to a preset scanning mode, so that the X-rays pass through the slots or spiral gaps on the static constraint device and irradiate the object being scanned point by point, thus performing fly-spot scanning on the object being scanned.

[0034] The preset scanning modes include continuous scanning, static scanning, and non-isochronous static scanning.

[0035] Continuous scanning mode: The focus moves continuously to scan the object point by point.

[0036] Static scanning method: The scanning point moves from one point to the next in a non-continuous sliding manner. The scanning point stays at each point for the same amount of time until the last point, completing a series of scans. This skip scanning method eliminates motion blur effects and can improve the device's resolution (clearer images) even with reduced dosage.

[0037] Non-isochronous static scanning method: The scanning point moves from one point to the next in a non-continuous sliding motion. The time a scanning point spends at each point is not necessarily the same until the last point, completing one scan. The scanning point spends more time in the key scanning area, which can improve the performance of the key area. In practical applications, the control method is basically the same as static scanning, except that the pulse width of the rectangular pulse signal is adjusted.

[0038] Sampling methods for flying point scanning include: conventional sampling and sparse sampling.

[0039] Standard sampling: Sampling points densely cover the entire object being scanned, with no gaps between the sampling points.

[0040] Sparse sampling: Sampling points sparsely cover the entire scanned object, with gaps between sampling points.

[0041] The sparse sampling process includes: Random number generation: Before sampling, the program generates a random number sequence. The values ​​in the random number sequence represent the sampling positions. With fewer position points, the sampling becomes sparser.

[0042] Random sparse sampling: During the scanning process, position numbers are sequentially extracted from a random sequence. The focal point corresponding to the hole, groove, or thread gap is located according to the sequence number. The corresponding electronic switch is then located based on the focal point, and the switch is activated to emit a ray. The position of the scanning point is determined by the random sequence; one random sequence completes one set of random sparse sampling. In practical applications, this can be easily implemented by simply setting a mapping table in the program. For example... Figure 2 As shown, this illustrates the comparison between uniform sparse sampling and random sparse sampling.

[0043] Data arrangement: The signals collected by the detector are in uncertain spatial locations. The signal values ​​are filled into the corresponding spatial locations according to a random number sequence, and the signal values ​​of the missing locations are all set to zero.

[0044] Sparse reconstruction: After sparse sampling, some data is missing. Reconstruction methods are needed to restore the image from the sparsely sampled data. Convolutional neural networks can be used for reconstruction.

[0045] Convolutional neural networks can employ the UNet neural network, using a batch of complete images as the target data for network training, randomly removing some pixels from the target data as the input data for training, training a sparse reconstruction network, and inputting the sparsely sampled data into the sparse reconstruction network for image restoration.

[0046] S4 uses a detector to collect scattered X-ray signals from the object being scanned, converts the scattered X-ray signals into electrical signals, performs analog-to-digital conversion, and then processes the signals to generate a scanned image.

[0047] like Figure 3 As shown, this illustrates the basic principle of how a moving X-ray source 1 scans an object 4 through a slot 3 or a spiral slit 2.

[0048] Example 2 like Figure 4 As shown, the circularly moving X-ray source 5: The X-ray source increases the deflection magnetic field so that the position of the electrons reaching the target material (usually tungsten) is a circle. The focal point moves rapidly along the circle. At any given moment, only one point on the circle emits rays. The direction of rotation (or the opposite direction) is as shown by the arrow.

[0049] Static flying point constraint device 16: It is placed close to the ray source between the ray emission position and the scanned object 28. It is generally made of tungsten material (which can be processed by 3D printing). The device has many holes and slots 29. Each hole and slot 29 allows only one ray emitted from the focal point on the ring to pass through and be projected onto the scanned object 28. Only two sets of holes and slots 29 are shown in the figure to illustrate the working principle.

[0050] Point-by-point scanning: When the focal point is rotated to the top, only the set of slots 29 shown in the figure (which is a straight long hole inside) can pass through the X-rays, while the other slots 29 cannot pass through. At this time, the bottom of the object 28 being scanned is irradiated by X-rays. When the focal point rotates along the direction shown in the figure, the irradiated point on the object moves upward accordingly. When the focal point rotates 1 / 4 arc, the irradiated point on the object moves to the top, completing one column of point-by-point scanning. The focal point rotates one revolution to complete 4 columns of scanning (4 columns is just one specific case).

[0051] Signal acquisition: When X-rays irradiate the object being scanned 8, they are scattered on the object being scanned 8. The returning rays reach the detector 7, are converted into analog electrical signals by the detector 7, and are then converted into digital signals by the ADC to complete signal acquisition.

[0052] Example 3 like Figure 5 , Figure 6 As shown, the array-configured x-ray source 10 generates an array focal point, which is the focal point of each light source. Each focal point is controlled by an independent switch (transistor switch). The timing and sequence of the emitted rays from the focal point are controlled by an coded program. This function can be achieved by using a carbon nanotube cold cathode x-ray source.

[0053] Static flying point constraint device 21: The straight slots 314 inside the device each uniquely correspond to a focal point. That is, when a certain focal point emits light, only the unique slot 314 corresponding to it can transmit light. The light spots transmitted through all the slots 314 form a straight line on the scanned object 313 (e.g., Figure 5 ), or it can form misaligned segmented straight lines on the scanned object 313 (such as Figure 6 This can reduce the horizontal illumination angle (the angles on both the left and right sides), and the misaligned images can be aligned during later image processing.

[0054] Point-by-point scanning: Electronic switches control each focal point to emit rays sequentially, completing a scan. The emission order is arbitrary, and the spatial order of the scan points can be restored as long as the order is recorded.

[0055] Signal acquisition: When X-rays irradiate the object being scanned, they are scattered on the object. The returning rays reach the detector, which converts them into analog electrical signals. These signals are then converted into digital signals by the ADC, thus completing the signal acquisition.

[0056] Therefore, the present invention adopts the above-mentioned static flying-spot scanning method based on a flying-focus X-ray source, which improves scanning performance by combining an electrically controlled variable-focus X-ray source with a static constraint device to replace the traditional combination of a fixed focus and a high-speed mechanical device.

[0057] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the technical solutions of the present invention, and these modifications or equivalent substitutions cannot cause the modified technical solutions to deviate from the spirit and scope of the technical solutions of the present invention.

Claims

1. A static flying-spot scanning method based on a flying-focus X-ray source, characterized in that: Includes the following steps: S1 provides a fly-focus X-ray source, which moves or switches the focal point by means of deflecting magnetic field, electric field control or switching control. S2 provides a static constraint device, which is made of heavy metal material and has a hole or groove or spiral slit structure inside. The hole or groove or spiral slit corresponds one-to-one with the focal point of the flying focal point X-ray source. X-rays emitted from the corresponding focal point can pass through the corresponding hole or groove or spiral slit structure. S3 controls the focal point of the fly-focus X-ray source to move or switch according to the preset scanning mode, so that the X-rays pass through the holes or spiral gaps on the static constraint device and irradiate the scanned object point by point, and perform fly-spot scanning on the scanned object. S4 uses a detector to collect scattered X-ray signals from the object being scanned, converts the scattered X-ray signals into electrical signals, performs analog-to-digital conversion, and then processes the signals to generate a scanned image.

2. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 1, characterized in that: The specific control methods for the deflection magnetic field and electric field are as follows: electrons bombard the target material to generate X-rays. During the electron flight phase, the deflection direction and amplitude of the electrons are controlled by the deflection magnetic field or electric field. The position of the electrons bombarding the target material is controlled by the pre-set voltage parameters, thus generating a movable X-ray source.

3. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 2, characterized in that: The specific control method for switching is as follows: instead of a single electron emitter, multiple electron emitters are arranged in a certain way. The electrons emitted by each emitter correspond to different positions of the target material. Each emitter is connected to an external electronic switch, and the electronic switch is controlled by programming so that the focus switches in a pre-set order.

4. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 3, characterized in that: In the switch-switching control method, the flying-focus X-ray source can be a carbon nanotube cold cathode X-ray source. Electron emission is controlled by pulse voltage. When the voltage applied to the carbon nanotube reaches the threshold, electrons are emitted instantaneously; when the voltage falls below the threshold, emission stops instantaneously. The focus array shape in the switch switching control method includes rectangular surface, rectangular surface, linear, arc, and curved shape, which can be set according to the usage scenario.

5. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 4, characterized in that: The heavy metal materials used in static restraint devices include tungsten, copper, steel, and alloys, and can be manufactured using 3D printing.

6. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 5, characterized in that: The arrangement of holes and slots in static constraint devices includes linear arrangement, cross arrangement, and honeycomb-like arrangement; The interior of the static constraint device can be hollowed out, retaining the two ends, the front segment, or the rear segment.

7. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 6, characterized in that: The preset scanning modes include continuous scanning, static scanning, and non-isochronous static scanning. Continuous scanning mode: The focus moves continuously to scan the object point by point; Static scanning method: The process of the scanning point moving from one point to the next is not continuous. The scanning point stays at each point for the same amount of time until the last point, completing one column scan. Non-isochronous static scanning method: The process of the scanning point moving from the previous point to the next point is not continuous. The time the scanning point stays at each point is not necessarily the same until the last point, which completes a column scan. The scanning point stays for a longer time in the key scanning area.

8. The static flying-spot scanning method based on a flying-focus X-ray source according to claim 7, characterized in that: Flying-spot scanning sampling methods include: conventional sampling and sparse sampling; Standard sampling: Sampling points densely cover the entire object being scanned, with no gaps between sampling points; Sparse sampling: Sampling points sparsely cover the entire scanned object, with gaps between sampling points.

9. A static flying-spot scanning method based on a flying-focus X-ray source according to claim 8, characterized in that: The sparse sampling process includes: Random number generation: Before sampling, the program generates a random number sequence, and the values ​​in the random number sequence represent the sampling positions; Random sparse sampling: During the scanning process, the position number is taken out sequentially from the random number sequence, and the focus corresponding to the hole groove or thread gap is found according to the number. The corresponding electronic switch is found according to the focus, and the electronic switch is turned on to emit rays. The position of the scanning point is determined by the random number sequence. One random number sequence completes one random sparse sampling. Data arrangement: The signals collected by the detector are in uncertain spatial locations. The signal values ​​are filled into the corresponding spatial locations according to a random number sequence, and the signal values ​​of the missing locations are all set to zero. Sparse reconstruction: After sparse sampling, some data is missing. Reconstruction methods are needed to restore the image from the sparsely sampled data. Convolutional neural networks can be used for reconstruction.

10. A static flying-spot scanning method based on a flying-focus X-ray source according to claim 9, characterized in that: Convolutional neural networks can employ the UNet neural network, using a batch of complete images as the target data for network training, randomly removing some pixels from the target data as the input data for training, training a sparse reconstruction network, and inputting the sparsely sampled data into the sparse reconstruction network for image restoration.

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