Component lead coplanarity optical detection system and method
The component lead coplanarity detection system designed using optical imaging technology solves the problems of high-cost laser equipment and reliance on specialized personnel, achieving low-cost, fast, and accurate detection and promoting the popularization of detection technology.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-24
- Publication Date
- 2026-04-03
AI Technical Summary
In existing technologies, the detection of coplanarity of electronic component leads relies on high-cost laser equipment and specialized personnel, creating cost barriers and talent bottlenecks, making it difficult to achieve universal access.
Design a component lead coplanarity detection system based on optical imaging. The system uses a detection base, standard gauges, and optical path deflection module, combined with optical amplification equipment, to achieve non-contact, accurate, and rapid detection.
It reduces testing costs by more than 95%, achieves an accuracy of ±5µm, has a testing time of less than 5 seconds, is easy to operate, and has wide applicability, realizing universal testing with low barriers to entry.
Smart Images
Figure CN121783053A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of optical precision measurement technology, and in particular to the detection direction of electronic component leads. It is a gull-wing type lead coplanarity detection system and method based on optical imaging. Background Technology
[0002] The coplanarity of electronic component leads is a crucial factor in ensuring the reliability of electronic products. Poor coplanarity can lead to risks such as poor soldering, stress concentration at solder joints, and abnormal signal transmission, directly impacting the yield, performance, and lifespan of electronic products. Its importance is even more pronounced in high-density, high-reliability scenarios (5G communication, aerospace, medical equipment, etc.). GJB 3243 requires that the coplanarity of electronic component leads be no greater than 0.1 mm, and the IPC-A-610 standard defines soldering defects caused by poor coplanarity of component leads. The coplanarity quality of electronic component leads is affected by numerous factors, including device design, manufacturing processes, material properties, transportation and storage, handling, and assembly, spanning the entire lifecycle of the component and involving packaging plants, processing plants, supply chain management, assembly plants, and end-user companies.
[0003] Currently, lead coplanarity testing in the electronics industry generally relies on laser equipment. Its high purchase price and long-term calibration and maintenance costs constitute a significant cost barrier for small and medium-sized enterprises. At the same time, its closed technical architecture and complex operation process have created the characteristics of "technical black box" and "skill monopoly", making the electronics industry rigidly dependent on equipment manufacturers and professional talents.
[0004] To address the needs of cost-sensitive enterprises, there is an urgent need to design a high-precision, low-cost, and low-barrier optical inspection solution for the coplanarity of component leads, in order to solve cost pain points, eliminate equipment dependence, overcome talent bottlenecks, and achieve universal access to inspection. Summary of the Invention
[0005] The purpose of this invention is to provide an optical inspection system and method for the coplanarity of component leads. Based on optical imaging, it enables accurate, fast, low-cost, and low-threshold non-contact measurement of the coplanarity of component leads, effectively reducing the cost of coplanarity inspection of component leads, eliminating the electronics industry's dependence on high-precision equipment and professional personnel, and realizing the democratization of inspection technology.
[0006] The objective of this invention is achieved through the following technical solution:
[0007] An optical inspection system for the coplanarity of component leads includes an inspection base, a standard gauge, and an optical path deflection module;
[0008] The testing base has a groove; the standard gauge has a specified width and is fitted tightly to the side of the optical path deflection module, and together they are assembled in the groove of the testing base. The optical path deflection module is an optical standard component that deflects the image of the component leads placed on the testing base, so that it overlaps with the standard gauge.
[0009] Preferably, the material of the testing base is aluminum alloy, cast iron, optical glass or marble, and the flatness of the table surface is ≤5um / m.
[0010] Preferably, the standard gauge is made of stainless steel with high-precision graduated grooves of the required width on its surface.
[0011] Preferably, the standard gauge is made of optical glass, and the surface of the optical glass standard gauge is screen-printed with scale lines of the required width.
[0012] Preferably, the optical path deflection module is a 45° prism.
[0013] Preferably, the optical inspection system for coplanarity of component leads also includes an optical magnification device placed directly in front of the deflection optical path to image the image of the component leads overlapping with the standard sample onto the inspection screen.
[0014] The detection method of the above-mentioned optical inspection system for coplanarity of component leads is as follows: the component to be inspected is placed on the inspection base, and one side of the component's lead is brought close to the standard measuring film. The image of the component's lead is reflected by the optical path deflection module and superimposed on the standard measuring film. The lead of the component with qualified coplanarity is displayed within the width set on the standard measuring film, while the lead of the component with unqualified coplanarity exceeds the width set on the standard measuring film.
[0015] The beneficial effects of this invention are as follows:
[0016] The optical inspection system for coplanarity of electronic component leads provided by this invention employs a combination of conventional optical components and standard gauges. Compared to laser inspection equipment, this system reduces manufacturing costs by over 95%, achieves an inspection accuracy of ±5µm, and reduces single-sided lead inspection time to less than 5 seconds. It is compatible with QFP and SOP packages, enabling precise and rapid non-contact measurement of the coplanarity of electronic component leads. The optical inspection method for coplanarity of electronic component leads designed in this invention greatly simplifies the inspection process, offering advantages such as simple operation, wide applicability, and low barrier to entry. This invention effectively reduces the cost of coplanarity inspection of electronic component leads, eliminates the electronics industry's reliance on high-precision equipment and specialized personnel, and democratizes inspection technology, possessing a wide range of applications and significant market potential. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of a component lead coplanarity optical detection system.
[0018] Figure 2 This is a schematic diagram of the testing base.
[0019] Figure 3 This is a schematic diagram of a standard measurement piece.
[0020] Figure 4 This is a schematic diagram of the optical path deflection module.
[0021] Figure 5 This is a schematic diagram of an optical magnification device. Detailed Implementation
[0022] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments.
[0023] See Figure 1 As shown in the figure, the optical detection system for coplanarity of component leads in this embodiment includes a detection base 1, a standard measuring plate 2, an optical path deflection module 3, and an optical amplification device 4. To clearly illustrate the specific implementation, an SOP chip 5 to be detected is added.
[0024] See Figure 2 As shown, the material of the detection base 1 is aluminum alloy, cast iron, optical glass or marble. The table surface has good flatness (≤5um / m) to ensure the accuracy of coplanarity detection. The table surface has grooves to support the optical path deflection module and standard gauges.
[0025] See Figure 3 As shown, the standard gauge 2 is made of stainless steel or optical glass. The stainless steel standard gauge has a high-precision scale groove of a specified width on its surface, and the optical glass standard gauge has scale lines of a specified width silkscreened on its surface (the width is selected according to the component model or different specifications, such as 0.1mm for conventional coplanarity testing).
[0026] See Figure 4 As shown, the optical path deflection module 3 can use optical standard components to deflect the horizontal optical path into a vertical optical path or an optical path at other angles. If a prism is used, the horizontal optical path can be deflected into a vertical optical path through the 45° prism plane, so that the image of the component lead placed horizontally on the detection base 1 can overlap with the vertical standard sample.
[0027] The standard gauge is attached to the side of the optical path deflection module and is assembled together in the groove of the test base platform to calibrate the coplanarity of the component leads.
[0028] See Figure 5 As shown, the optical magnification device 4 is placed directly in front of the optical path deflection module. It can deflect the image of the component lead wire on the horizontal optical path to the vertical optical path, and then display the image on the detection screen through the optical magnification device for quick and portable manual visual inspection.
[0029] The detection method of the optical inspection system for the coplanarity of the component leads is as follows:
[0030] Place the SOP chip 5 to be tested on the testing base 1, so that one of the lead wires of the component is close to the standard sample. The image of the component lead wire is reflected by the optical path deflection module and overlapped with the standard sample. The optical magnification device magnifies the overlapped image and displays it on the testing screen. The lead wires of the component with qualified coplanarity are displayed within the slot or silkscreen area of the standard sample. The lead wires of the component with unqualified coplanarity are outside the slot or silkscreen area. The unqualified coplanarity of the component lead wire can be quickly determined by manual visual inspection.
[0031] It is understood that those skilled in the art can make equivalent substitutions or modifications to the technical solution and inventive concept of the present invention, and all such substitutions or modifications should fall within the protection scope of the appended claims.
Claims
1. An optical detection system for the coplanarity of component leads, characterized in that... Includes a detection base, standard gauge, and optical path deflection module; The testing base has a groove; the standard gauge has a specified width and is fitted tightly to the side of the optical path deflection module, and together they are assembled in the groove of the testing base; the optical path deflection module is an optical standard component that deflects the image of the component leads placed horizontally on the testing base, so that they overlap with the standard gauge.
2. The optical detection system for the coplanarity of component leads as described in claim 1, characterized in that... The testing base is made of aluminum alloy, cast iron, optical glass, or marble, and the flatness of the tabletop is ≤5um / m.
3. The optical detection system for the coplanarity of component leads as described in claim 1, characterized in that... The standard gauge is made of stainless steel with high-precision graduated grooves of the required width on its surface.
4. The optical detection system for the coplanarity of component leads as described in claim 1, characterized in that... The standard gauge is made of optical glass, and the surface of the optical glass standard gauge is screen-printed with scale lines of the required width.
5. The optical detection system for the coplanarity of component leads according to claim 1, characterized in that... The optical path deflection module is a 45° prism.
6. The optical detection system for the coplanarity of component leads according to claim 1, characterized in that... It also includes an optical magnification device, placed directly in front of the deflection optical path, to magnify the image of the component leads and the standard sample overlapping onto the testing screen.
7. A detection method for a component lead coplanarity optical detection system according to any one of claims 1 to 6, characterized in that... The component to be tested is placed on the testing base, with one of its leads close to the standard sample sheet. The optical path deflection module reflects the image of the component lead sheet, which is then superimposed on the standard sample sheet. Component leads with acceptable coplanarity are displayed within the width set on the standard sample sheet, while component leads with unacceptable coplanarity exceed the width set on the standard sample sheet.