Blind structure polarization modulation infrared thermal wave super-resolution imaging detection system and method
By employing pulse compression time-domain modulation, structured light spatial modulation, and polarization modulation techniques, the limitations of infrared thermal imaging detection systems in improving resolution have been overcome, enabling efficient detection of minute defects and complex edge defects, and making it applicable to a variety of materials.
Patent Information
- Application Number
- CN202511899286.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-16
- Publication Date
- 2026-04-03
- Estimated Expiration
- 2045-12-16
AI Technical Summary
Existing infrared thermal imaging detection technology is limited in terms of resolution improvement, making it difficult to effectively detect minute defects and complex edge defects, especially for materials with poor thermal conductivity and electrical conductivity.
By employing pulse compression time-domain modulation, structured light spatial modulation, and polarization modulation techniques, the spatial resolution of infrared thermal imaging detection is improved through image reconstruction of the instantaneous phase difference between thermal wave signals and linear frequency modulation signals under different spatial polarization phases.
This invention improves the spatial resolution of the infrared thermal imaging detection system, resulting in faster detection speed, higher detection efficiency, and significant image reconstruction effects. It is applicable to a variety of materials.