Elastic sheet pin test module
By designing a spring pin test module that includes a pin plate, a spring pin base, and a multi-faceted contact structure, the efficiency and compatibility issues of traditional testing methods are solved, achieving efficient and reliable connector testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-09
- Publication Date
- 2026-04-07
AI Technical Summary
In the existing technology, traditional B2B connector and spring pin testing methods are time-consuming, costly, and have poor repeatability. They are also difficult to be compatible with connectors with small pitch and asymmetrical designs, which affects the testing accuracy.
Design a spring pin test module including a pin plate, spring pin base, first and second spring pins, and spring pin top cover. It adopts a multi-faceted contact structure and has alignment guidance and buffering functions, and is suitable for testing various connectors.
It improves the reliability and reusability of testing, is compatible with multiple connectors, reduces alignment errors and scratch risks, and improves testing accuracy.
Smart Images
Figure CN121805644A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of product testing, and in particular to a spring pin testing module. Background Technology
[0002] Electronic products need to undergo various performance parameter tests before leaving the factory. This is typically done by connecting the product under test (DUT) to a testing device using probes. The testing device outputs a test signal and receives feedback from the DUT to confirm any defects. Current technology generally uses a male-female B2B connector, where the male connector is inserted into the female connector to complete the connection. This traditional connection method is very time-consuming. Alternatively, traditional spring-loaded pins are used for contact testing. For products with large production volumes, this can easily lead to insufficient production or wasted manpower and resources. Furthermore, repeatability is poor, and the lifespan of the male / female connector / spring-loaded pin is significantly reduced. Most current probes use a spring-loaded pin structure, including the connecting ends on both sides and the elastic part in the middle. These probes can generally only test connectors with regular symmetrical designs, and the corresponding connectors have a relatively large interlocking pitch. They have limitations in testing smaller pitch interfaces and asymmetrical B2B connector designs. When crimped into a connector, stress concentrates at a specific contact point. Reducing the thickness of the flat probe directly in the existing design can lead to single-point contact or broken pins, affecting test accuracy. Designing a simple, compatible spring-loaded pin test module with alignment guidance, buffering, and high repeatability can solve these problems. Summary of the Invention
[0003] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a spring pin test module with simple structure, compatibility with multiple test connector products, alignment guidance and buffering functions, and high repeatability.
[0004] The technical solution adopted in this invention is as follows: This invention includes a needle plate and a spring needle module. The spring needle module includes a spring needle base, a plurality of first spring needles, a plurality of second spring needles, and a spring needle top cover. The spring needle base is disposed on the upper surface of the needle plate. A plurality of first spring needles are arranged in an array on both sides of the end of the spring needle base. A plurality of second spring needles are arranged in an array on both sides of the middle part of the spring needle base. The spring needle top cover is disposed on the upper end of the spring needle base. The ribbon cable product interface end cooperates with the plurality of first spring needles and the plurality of second spring needles through the spring needle top cover.
[0005] Furthermore, the upper end of the first spring needle is provided with a first contact needle and a second contact needle. A first stop block is provided on the side of the first contact needle near the second contact needle. The end of the second contact needle is at the same height as the first stop block. The corresponding contact point of the ribbon cable product cooperates with the first stop block and the end of the second contact needle. The bottom of several first spring needles is connected and conductive to the needle plate.
[0006] Furthermore, the upper end of the second spring needle is provided with a third contact needle and a fourth contact needle. A second stop block is provided on the opposite side of the third contact needle and the fourth contact needle. The corresponding contact point of the ribbon cable product cooperates with the two sets of second stop blocks. The bottom of several second spring needles is connected to the needle plate for conduction.
[0007] Furthermore, the corresponding ends of the third and fourth contact needles, as well as the end of the first contact needle, are provided with guide arc structures, which cooperate with the contact end of the ribbon cable product.
[0008] Furthermore, the middle part of both the first and second spring needles is provided with a multi-layer bending structure, and the multi-layer bending structure in the middle part of both the first and second spring needles is provided with bending grooves.
[0009] Furthermore, the spring pin base is provided with a plurality of spring pin mounting slots, and the multi-layer bending structure of the first spring pin and the second spring pin are respectively positioned in the spring pin mounting slots.
[0010] Furthermore, the needle plate includes an upper needle plate and a lower needle plate, the spring needle base is connected to the upper surface of the lower needle plate, the upper needle plate is disposed on the upper surface of the lower needle plate and is limitedly engaged with the spring needle base, and the spring needle top cover is floatingly connected to the upper needle plate.
[0011] Furthermore, the top cover of the spring pin is provided with an interface contour groove structure, and the interface end of the ribbon cable product is limited and matched with the interface contour groove structure and connected to the lower pins of a plurality of first spring pins and a plurality of second spring pins on the spring pin base.
[0012] Furthermore, the spring needle top cover is floatingly engaged with the upper needle plate by a number of equal-height screws and a number of floating springs.
[0013] Furthermore, the needle plate is provided with several positioning pins.
[0014] The beneficial effects of this invention are as follows: The positioning of the spring pin in the X direction relies on the spring pin base within the core cavity. The distance from the edge of the spring pin to the core positioning groove on one side is 0.025mm. Positioning in the Y direction involves the shoulder of the spring pin fitting against the upper limit edge of the core. A pre-reserved distance at the lower end ensures the probe is in a relaxed state when not in operation. The top of the spring pin and the product's B2B connector have a contoured structure, unlike the point contact of a spring pin. This spring pin involves multi-faceted contact, resulting in higher reliability. A groove at the upper end of the probe ensures a certain degree of micro-opening capability. When the upper pin block is pressed down, the test end of the spring pin opens to contact the B2B, which can be simply understood as holding the gold fingers on both sides of the B2B. After the test, the upper pin block resets, and the probe groove also resets momentarily, causing a certain amount of vibration to clean debris / dirt that has fallen from the connector after multiple tests. The tail of the spring pin is a pointed cone structure, ensuring good contact with the test PCB even in extreme situations (such as uneven force or tilted spring pin). Attached Figure Description
[0015] Figure 1 This is a perspective view of the present invention; Figure 2 This is a perspective view of the invention with the spring pin top cover hidden; Figure 3 This is a perspective view of the present invention with the upper needle plate hidden. Figure 4 This is a plan view of the present invention; Figure 5 This is a cross-sectional view of the spring pin module; Figure 6 This is a plan view of the first spring pin; Figure 7 This is a plan view of the second spring pin. Detailed Implementation
[0016] like Figures 1 to 7As shown, in this embodiment, the present invention includes a needle plate 1 and a spring needle module 2. The spring needle module 2 includes a spring needle base 3, a plurality of first spring needles 4, a plurality of second spring needles 5, and a spring needle top cover 6. The spring needle base 3 is disposed on the upper end surface of the needle plate 1. A plurality of first spring needles 4 are arranged in an array on both sides of the end of the spring needle base 3. A plurality of second spring needles 5 are arranged in an array on both sides of the middle part of the spring needle base 3. The spring needle top cover 6 is disposed on the upper end of the spring needle base 3. The interface end of the ribbon cable product 7 cooperates with a plurality of first spring needles 4 and a plurality of second spring needles 5 through the spring needle top cover 6. Therefore, it can be seen that the probe tip has a contoured structure that makes contact with the product's B2B connector, unlike the point contact of a spring pin. This spring pin is a multi-faceted contact type, which offers higher reliability. A slot at the top of the probe ensures it has a certain degree of micro-opening capability. When the upper pin block is pressed down, the test end of the spring pin opens to contact the B2B connector, which can be simply understood as holding the gold fingers on both sides of the B2B connector. When the test is completed, the upper pin block resets, and the probe slot also resets. A slight vibration occurs momentarily to clean debris / dirt that has fallen from the connector after multiple tests. The tail of the spring pin has a pointed cone structure, which ensures good contact with the test PCB even in extreme conditions (such as uneven force or tilted spring pin).
[0017] like Figure 3 and Figure 6 As shown, in this embodiment, the upper end of the first spring needle 4 is provided with a first contact needle 41 and a second contact needle 42. A first stop block 43 is provided on the side of the first contact needle 41 near the second contact needle 42. The end of the second contact needle 42 is at the same height as the first stop block 43. The corresponding contact point of the ribbon cable product 7 cooperates with the first stop block 43 and the end of the second contact needle 42. The bottoms of several first spring needles 4 are connected and conductive to the needle plate 1. Therefore, the end of the second contact needle 42 is configured with a multi-point serrated needle structure, and the first spring needle 4 performs the needle insertion operation on the contact points on the ribbon cable product 7 that require multi-point support.
[0018] like Figure 3 and Figure 7 As shown, in this embodiment, the upper end of the second spring needle 5 is provided with a third contact needle 51 and a fourth contact needle 52. A second stop block 53 is provided on each side of the third contact needle 51 and the fourth contact needle 52. The corresponding contact point of the ribbon cable product 7 cooperates with the two sets of second stop blocks 53. The bottoms of several second spring needles 5 are connected and conductive to the needle plate 1. Therefore, the three contact needles 51 and the fourth contact needle 52 are symmetrically arranged, and the second stop blocks 53 can provide stable support from both sides, resulting in more uniform force distribution when in contact with the corresponding contact point of the ribbon cable product 7.
[0019] like Figure 6 and Figure 7 As shown, in this embodiment, the corresponding ends of the third contact needle 51 and the fourth contact needle 52, as well as the end of the first contact needle 41, are provided with guide arc structures. These guide arc structures cooperate with the contact ends of the ribbon cable product 7. Therefore, the guide arc structures provide guidance when the ribbon cable product 7 contacts, effectively preventing rigid contact during alignment that could scratch the ribbon cable product 7.
[0020] like Figure 6 and Figure 7 As shown, in this embodiment, both the first spring pin 4 and the second spring pin 5 are configured with multi-layer bending structures in the middle, and both multi-layer bending structures in the middle of the first spring pin 4 and the second spring pin 5 are provided with bending slots 8. Thus, the bending slots 8 divide the main body of the spring pin into two sets of slender bending structures, which, while ensuring overall strength, allows for greater downward stroke and elasticity, resulting in better downward cushioning.
[0021] like Figure 5 As shown, in this embodiment, the spring needle base 3 is provided with a plurality of spring needle mounting slots 31, and the multi-layer bending structures of the first spring needle 4 and the second spring needle 5 are respectively positioned in the spring needle mounting slots 31. Therefore, the positioning of the spring needle in the X direction relies on the spring needle mounting slots 31 on the spring needle base 3, and the distance from the edge of the spring needle to the positioning groove of the glue core is 0.025mm on one side. Positioning in the Y direction involves the shoulder of the spring needle fitting against the upper limit edge of the glue core, with a reserved distance at the lower end to ensure that the probe is in a relaxed state when not in operation.
[0022] like Figure 1 and Figure 2 As shown, in this embodiment, the needle plate 1 includes an upper needle plate 11 and a lower needle plate 12. The spring needle base 3 is connected to the upper surface of the lower needle plate 12. The upper needle plate 11 is disposed on the upper surface of the lower needle plate 12 and is in a limiting fit with the spring needle base 3. The spring needle top cover 6 is floatingly connected to the upper needle plate 11. Therefore, the upper needle plate 11 and the lower needle plate 12 are modular and separate, effectively fixing the spring needle base 3 and preventing it from loosening or shifting.
[0023] like Figure 1 and Figure 4As shown, in this embodiment, the spring pin top cover 6 is provided with an interface contouring groove structure. The interface end of the ribbon cable product 7 is limited and matched with the interface contouring groove structure and contacts and connects with a plurality of first spring pins 4 and a plurality of second spring pins 5 on the spring pin base 3. It can be seen that the spring pin top cover 6 is made of Trinitron material to prevent scratching the flexible ribbon cable and B2B. Its top inner cavity has a B2B contouring groove that can well position the B2B (enclosing the shape of the B2B, with a single-sided gap of 0.02mm). If testing other connectors, the positioning features and probe layout can be flexibly adjusted. Its top also has a pre-reserved clearance notch for the flexible ribbon cable.
[0024] like Figures 1 to 3 As shown, in this embodiment, the spring needle top cover 6 is floatingly engaged with the upper needle plate 11 by a plurality of equal-height screws 9 and a plurality of floating springs 10. Therefore, during the alignment and pressing process, the floating springs 10 provide a buffering effect, preventing scratches on the product due to misalignment.
[0025] like Figure 1 As shown, in this embodiment, the needle plate 1 is provided with a plurality of positioning pins 13. Therefore, the plurality of positioning pins 13 are used to position the entire module on the testing machine.
[0026] The working principle of this invention is as follows: Before the equipment is started, the connection end of the ribbon cable product 7 is positioned with the interface contour groove structure on the top cover of the spring pin 6. Then, the pressure head of the testing equipment presses down to vertically press down the ribbon cable product 7, and the top cover of the spring pin 6 descends synchronously. Several first spring pins 4 and several second spring pins 5 make contact with the corresponding contacts of the connection end of the ribbon cable product 7. The pressure continues to be applied to make the ribbon cable product 7 conduct through the pin. After the power-on test is completed, all components are reset, the ribbon cable product 7 to be tested is replaced, and the above steps are repeated to realize the multi-point pin test of the ribbon cable product.
[0027] Although the embodiments of the present invention are described with reference to actual solutions, they do not constitute a limitation on the meaning of the present invention. Modifications to the embodiments and combinations with other solutions based on this specification will be obvious to those skilled in the art.
Claims
1. A spring-loaded needle testing module, comprising a needle plate (1) and a spring-loaded needle module (2), characterized in that: The spring pin module (2) includes a spring pin base (3), a plurality of first spring pins (4), a plurality of second spring pins (5), and a spring pin top cover (6). The spring pin base (3) is disposed on the upper end face of the pin plate (1). A plurality of first spring pins (4) are arranged in an array on both sides of the end of the spring pin base (3). A plurality of second spring pins (5) are arranged in an array on both sides of the middle part of the spring pin base (3). The spring pin top cover (6) is disposed on the upper end of the spring pin base (3). The interface end of the ribbon cable product (7) cooperates with a plurality of first spring pins (4) and a plurality of second spring pins (5) through the spring pin top cover (6).
2. The spring pin testing module according to claim 1, characterized in that: The upper end of the first spring needle (4) is provided with a first contact needle (41) and a second contact needle (42). The first contact needle (41) is provided with a first stop block (43) on the side near the second contact needle (42). The end of the second contact needle (42) is at the same height as the first stop block (43). The corresponding contact point of the ribbon cable product (7) cooperates with the end of the first stop block (43) and the second contact needle (42). The bottom of several first spring needles (4) are connected to the needle plate (1) for conduction.
3. The spring pin testing module according to claim 2, characterized in that: The upper end of the second spring needle (5) is provided with a third contact needle (51) and a fourth contact needle (52). The third contact needle (51) and the fourth contact needle (52) are each provided with a second stop block (53) on their respective sides. The corresponding contact point of the ribbon cable product (7) cooperates with the two sets of second stop blocks (53). The bottom of several second spring needles (5) are connected to the needle plate (1) for conduction.
4. The spring pin testing module according to claim 3, characterized in that: The third contact needle (51) and the fourth contact needle (52) are provided with a guide arc structure on the opposite side end and the end of the first contact needle (41). The guide arc structure is matched with the contact end of the ribbon cable product (7).
5. A spring pin testing module according to claim 1, characterized in that: The middle part of the first spring needle (4) and the second spring needle (5) are both configured with a multi-layer bending structure, and the multi-layer bending structure in the middle part of the first spring needle (4) and the second spring needle (5) is provided with a bending groove (8).
6. The spring pin testing module according to claim 1, characterized in that: The spring needle base (3) is provided with a plurality of spring needle mounting slots (31), and the multi-layer bending structure of the first spring needle (4) and the second spring needle (5) are respectively connected to the spring needle mounting slots (31) at corresponding positions.
7. The spring pin testing module according to claim 1, characterized in that: The needle plate (1) includes an upper needle plate (11) and a lower needle plate (12). The spring needle base (3) is connected to the upper end face of the lower needle plate (12). The upper needle plate (11) is disposed on the upper end face of the lower needle plate (12) and is limited to the spring needle base (3). The spring needle top cover (6) is floatingly connected to the upper needle plate (11).
8. A spring-loaded pin testing module according to claim 1, characterized in that: The top cover (6) of the spring pin is provided with an interface contour groove structure. The interface end of the ribbon cable product (7) is limited and matched with the interface contour groove structure and contacts and connects with a plurality of first spring pins (4) and a plurality of second spring pins (5) on the spring pin base (3).
9. A spring pin testing module according to claim 7, characterized in that: The spring needle top cover (6) is floatingly engaged with the upper needle plate (11) by a number of equal height screws (9) and a number of floating springs (10).
10. A spring pin testing module according to claim 1, characterized in that: The needle plate (1) is provided with several positioning pins (13).