Test bench for electronic information engineering specialty

Abstract

The invention relates to a test bed, in particular to a test bed for electronic information engineering specialty, which comprises a support frame, a placement table, guide plates, a test instrument and the like, the top of the support frame is connected with the placement table, the left side and the right side in the placement table are connected with the guide plates, the test instrument is arranged between the guide plates in a sliding manner, and the test instrument extends out of the top of the placement table. Test equipment can be inserted into an insertion hole in a test instrument for testing, a pushing frame is moved backwards, a rack can be driven to move backwards, the rack can drive a gear to rotate anticlockwise, a wire winding shaft winds a pull rope, the pull rope drives a wire spool to rotate, then a sliding shaft is driven to rotate, and the sliding shaft pushes a pushing plate to move forwards; the wire of the test apparatus is pushed out from the jack on the test instrument, and all the test apparatuses are pulled out at one time, so that the operation is more convenient.

Description

Technical Field

[0001] This invention relates to a test bench, and more particularly to a test bench for electronic information engineering. Background Technology

[0002] Electronic information engineering mainly studies the acquisition and processing of information, the design and application of electronic equipment and information systems, and conducts research, design, manufacturing, application and development of various electronic equipment and information systems. During their studies, students sometimes need to verify theoretical knowledge through experiments to determine whether the theoretical knowledge is correct.

[0003] Patent CN113134403A discloses a test bench for electronic information engineering, including a mounting base and a workbench mounted on the mounting base. A transmission mechanism is installed inside the mounting base. A surrounding plate is fixedly installed at the bottom of the workbench and is sleeved on the mounting base. Multiple connecting rods are fixedly installed at the bottom of the workbench and are connected to the transmission mechanism. The transmission mechanism includes a lifting component and a transmission component. A test device is fixedly installed on the workbench. The test device has a first partition and a second partition. Suction components are fixedly installed on both sides of the test device.

[0004] This patent involves inserting experimental equipment into a first or second area to conduct experiments. The experimental equipment required during the experiment is usually quite numerous. The equipment is inserted into the first or second area in sequence. After the experiment is completed, the equipment is removed one by one. Since there is a lot of equipment and the person needs to hold onto the workbench, it is quite troublesome to remove the equipment one by one. Summary of the Invention

[0005] To overcome the drawbacks of having many experimental devices and requiring operators to hold onto the workbench, which necessitates pulling out the devices one by one, the purpose of this invention is to provide an experimental platform for electronic information engineering that allows all experimental devices to be pulled out at once, making operation more convenient.

[0006] A test bench for electronic information engineering includes a support frame, a placement platform, guide plates, a test instrument, a clamping plate, a release mechanism, a push mechanism, and a push mechanism. The placement platform is connected to the top of the support frame. Guide plates are connected to the left and right sides of the placement platform. The test instrument is slidably mounted between the guide plates and extends from the top of the placement platform. A slot is opened on the lower front side of the test instrument. A clamping plate is slidably mounted on the top of the placement platform to hold the test instrument. The clamping plate is located in the slot. The test instrument is equipped with a release mechanism for pushing out the wires of the test instrument. The support frame is equipped with a push mechanism for pushing the test instrument out of the placement platform. The test instrument is equipped with a push mechanism.

[0007] More preferably, the disengagement mechanism includes a sliding sleeve, a sliding rod, a first elastic element, and a push-out plate. Sliding sleeves are connected to both the left and right sides of the testing instrument. Sliding rods are slidably installed inside the sliding sleeves. A first elastic element is connected between the sliding rods and the sliding sleeves. A push-out plate is connected between the sliding rods to push out the wires of the testing instrument. The push-out plate has multiple through holes for the wires of the testing instrument to pass through. The number of through holes is the same as the number of sockets on the testing instrument, and the through holes correspond one-to-one with the sockets on the testing instrument.

[0008] More preferably, the launching mechanism includes a sliding plate, a push plate, a rotating shaft, a push block, a second elastic element, and a push frame. Sliding plates are slidably provided on both the left and right sides of the bottom of the placement platform. Push plates are rotatably connected to the top of each sliding plate. A rotating shaft is rotatably connected between the push plates. A push block for launching the test instrument from the placement platform is connected to the middle of the rotating shaft. A second elastic element is connected between the rotating shaft and the push plate. A push frame for pushing the sliding plates is slidably provided at the bottom of the support frame. Guide openings are opened on the left and right sides of the push frame. The two sliding plates are located in the two guide openings respectively. The rear of the guide openings are inclined towards the push block.

[0009] More preferably, the pushing mechanism includes a winding shaft, gears, a third elastic element, racks, winding discs, sliding shafts, T-shaped plates, and pull ropes. The lower part of the guide plate is rotatably connected to the winding shafts, and gears are connected to the ends of the winding shafts that are far apart from each other. A third elastic element is connected between the guide plate and the gears. Two racks are connected to the rear side of the pushing frame. The racks are slidably connected to the placement platform. When the racks move, they mesh with the gears. The lower left and right sides of the testing instrument are rotatably connected to the winding discs, and pull ropes are wound on the winding discs. The pull ropes are wound on the winding shafts, and sliding shafts are connected to the ends of the winding discs that are far apart from each other. T-shaped plates are connected to the rear ends of the slide rods, and the T-shaped plates are slidably connected to the sliding shafts.

[0010] More preferably, it also includes a buffer mechanism, which includes an airbag, a venting tube, and a limiting plate. The airbag is connected between the slide plates, the top of the airbag is in contact with the bottom of the push plate, the venting tube is connected to the airbag, and two limiting plates are connected to the bottom of the placement platform to limit the airbag. The airbag is located between the two limiting plates.

[0011] More preferably, it also includes a limiting mechanism, which includes a connecting ring and a limiting sleeve. The connecting ring is connected to one side of the guide plate that is close to the other. The connecting ring and the winding shaft are rotatably connected. The top of the connecting ring is connected to the limiting sleeve, and the pull rope passes through the limiting sleeve.

[0012] More preferably, it also includes a seat and handles, with the seat connected to the lower part of the push frame and the handles connected to the seat.

[0013] More preferably, it also includes a placement box, which is connected to the front side of the placement platform.

[0014] The beneficial effects of this invention are as follows: 1. This invention allows the test equipment to be inserted into the sockets on the test instrument for testing. Moving the push frame backward can drive the rack to move backward, and the rack will drive the gear to rotate counterclockwise, causing the winding shaft to wind up the pull rope. The pull rope drives the winding disc to rotate, thereby driving the sliding shaft to rotate. The sliding shaft pushes the ejector plate forward, pushing the wire of the test equipment out of the sockets on the test instrument. All the test equipment can be pulled out at once, making the operation more convenient.

[0015] 2. Moving the pusher backward will cause the pusher block to move downward. The test instrument will move downward under its own weight and be placed into the placement platform. The placement platform can protect the test instrument from collisions with external objects and prevent dust from drifting into the sockets on the test instrument.

[0016] 3. When the slide plates move away from each other, the airbags inflate. The airbags can cushion the downward rotation of the push plate, thereby cushioning the downward movement of the testing instrument, reducing the vibration of the testing instrument, and preventing damage to the testing instrument.

[0017] 4. The pull rope passes through the limiting sleeve, which can limit the pull rope and prevent it from falling off the winding shaft.

[0018] 5. After the test is completed, the test equipment can be placed in the storage box. The storage box can store the test equipment for easy retrieval and use later. Attached Figure Description

[0019] Figure 1 This is a three-dimensional structural diagram of the present invention.

[0020] Figure 2 This is a three-dimensional structural diagram of the guide plate and the card plate of the present invention.

[0021] Figure 3 This is a three-dimensional structural diagram of the detachment mechanism of the present invention.

[0022] Figure 4 This is a schematic diagram of the first three-dimensional structure of the launching mechanism of the present invention.

[0023] Figure 5 This is a schematic diagram of a second three-dimensional structure of the ejection mechanism of the present invention.

[0024] Figure 6 This is a schematic diagram of the third three-dimensional structure of the ejection mechanism of the present invention.

[0025] Figure 7 This is a three-dimensional structural diagram of the actuating mechanism of the present invention.

[0026] Figure 8 This is an enlarged schematic diagram of part A of the present invention.

[0027] Figure 9 This is a three-dimensional structural diagram of the rack of the present invention.

[0028] Figure 10 This is a schematic diagram of the first three-dimensional structure of the buffer mechanism of the present invention.

[0029] Figure 11 This is a schematic diagram of a second three-dimensional structure of the buffer mechanism of the present invention.

[0030] Figure 12 This is a schematic diagram of the first three-dimensional structure of the limiting mechanism of the present invention.

[0031] Figure 13 This is a schematic diagram of a second three-dimensional structure of the limiting mechanism of the present invention.

[0032] Figure 14 This is a three-dimensional structural diagram of the seat, handle, and storage box of the present invention.

[0033] The markings in the diagram are as follows: 1: Support frame, 2: Placement platform, 3: Guide plate, 4: Test instrument, 5: Slot, 6: Card plate, 7: Release mechanism, 71: Sliding sleeve, 72: Sliding rod, 73: First elastic element, 74: Push plate, 75: Through hole, 8: Push mechanism, 81: Sliding plate, 82: Push plate, 83: Rotating shaft, 84: Push block, 85: Second elastic element, 86: Push frame, 87: Guide opening, 9: Push mechanism, 91: Winding shaft, 92: Gear, 93: Third elastic element, 94: Rack, 95: Winding disc, 96: Sliding shaft, 97: T-shaped plate, 98: Pull rope, 10: Buffer mechanism, 101: Airbag, 102: Vent pipe, 103: Limiting plate, 11: Limiting mechanism, 111: Connecting ring, 112: Limiting sleeve, 12: Seat, 13: Handle, 14: Placement box. Detailed Implementation

[0034] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the present invention.

[0035] Example 1

[0036] A test bench for electronic information engineering, such as Figures 1-9As shown, the device includes a support frame 1, a placement platform 2, a guide plate 3, a testing instrument 4, a clamping plate 6, a release mechanism 7, a push mechanism 8, and a push mechanism 9. The top of the support frame 1 is bolted to the placement platform 2. Guide plates 3 are bolted to both the left and right sides of the placement platform 2. The testing instrument 4 is slidably mounted between the guide plates 3 via a sliding groove. The testing instrument 4 extends from the top of the placement platform 2. The lower front side of the testing instrument 4 has clamping grooves 5 on both the left and right sides. The top front side of the placement platform 2 has a clamping plate 6 slidably mounted via a sliding groove. The clamping plate 6 is located in the clamping groove 5, thereby clamping the testing instrument 4. The testing instrument 4 is equipped with a release mechanism 7, which is used to push out the wires of the testing equipment. The support frame 1 is equipped with a push mechanism 8, which is used to push the testing instrument 4 out of the placement platform 2. The testing instrument 4 is equipped with a push mechanism 9.

[0037] like Figure 1 and Figure 3 As shown, the disengagement mechanism 7 includes a sliding sleeve 71, a sliding rod 72, a first elastic element 73, and a push-out plate 74. The lower left and right sides of the testing instrument 4 are bolted to the sliding sleeve 71. The sliding rod 72 is slidably provided inside the sliding sleeve 71. The first elastic element 73, which is a spring, is connected between the sliding rod 72 and the rear side of the sliding sleeve 71. The front end of the sliding rod 72 is connected to the push-out plate 74. The push-out plate 74 has multiple through holes 75. The number of through holes 75 is the same as the number of insertion holes on the testing instrument 4, and the through holes 75 correspond one-to-one with the insertion holes on the testing instrument 4. The wire of the testing equipment can pass through the through holes 75 and be inserted into the insertion hole on the testing instrument 4. The push-out plate 74 can push out the wire of the testing equipment by moving forward.

[0038] like Figure 1 , Figure 4 , Figure 5 and Figure 6As shown, the launching mechanism 8 includes a sliding plate 81, a push plate 82, a rotating shaft 83, a push block 84, a second elastic element 85, and a push frame 86. Sliding plates 81 are slidably mounted on the left and right sides of the bottom of the placement platform 2 via sliding grooves. Push plates 82 are rotatably connected to the top of each sliding plate 81. A rotating shaft 83 is rotatably connected between the push plates 82. A push block 84 is connected to the middle of the rotating shaft 83. A second elastic element 85 is fitted onto the front and rear of the rotating shaft 83. The two ends of the front second elastic element 85 are connected to the rotating shaft 83 and the push plate 82 on the left side, respectively. The rear second elastic element 85... The two ends of the elastic element 85 are connected to the rotating shaft 83 and the push plate 82 on the right side, respectively. The second elastic element 85 is a torsion spring. The lower part of the support frame 1 is provided with a push frame 86 in a sliding manner. The push frame 86 has guide openings 87 on the left and right sides. The two slide plates 81 are located in the two guide openings 87 respectively. The rear part of the guide opening 87 is inclined towards the push block 84. When the push frame 86 moves forward, it can push the slide plates 81 to move towards each other through the guide openings 87, thereby driving the push block 84 to move upward and push the test instrument 4 out of the placement table 2.

[0039] like Figure 1 , Figure 7 , Figure 8 and Figure 9 As shown, the pushing mechanism 9 includes a winding shaft 91, a gear 92, a third elastic element 93, a rack 94, a winding disc 95, a sliding shaft 96, a T-shaped plate 97, and a pull rope 98. The lower part of the guide plate 3 is rotatably connected to the winding shaft 91. The ends of the winding shaft 91 that are far apart from each other are connected to the gear 92 via keys. A third elastic element 93 is sleeved on the outside of each winding shaft 91. The two ends of the third elastic element 93 are connected to the guide plate 3 and the gear 92 respectively. The third elastic element 93 is a torsion spring. Racks 94 are connected to the left and right sides of the rear side of the pushing frame 86. The bottom left and right sides of the platform 2 have strip-shaped openings. The rack 94 can slide back and forth in the strip-shaped openings. When the rack 94 moves forward, it will mesh with the gear 92 and drive the gear 92 to rotate clockwise. The lower left and right sides of the test instrument 4 are rotatably connected to the winding reels 95. The winding reels 95 are all wound with pull ropes 98, which are wound on the winding shaft 91. The opposite sides of the winding reels 95 are connected to the sliding shafts 96. The rear end of the sliding rod 72 is connected to the T-shaped plate 97. The rear part of the T-shaped plate 97 has a slotted hole, which is slidably connected to the sliding shaft 96.

[0040] like Figure 1 and Figure 14 As shown, it also includes a seat 12 and a handle 13. The lower part of the push frame 86 is connected to the seat 12, and people can sit on the seat 12 to conduct experiments. The handle 13 is bolted to the upper front side of the seat 12.

[0041] like Figure 1 and Figure 14As shown, it also includes a placement box 14. The placement box 14 is bolted to the front side of the placement platform 2. The placement box 14 is used to place the test equipment.

[0042] Initially, the clamping plate 6 is locked in the clamping slot 5, securing the testing instrument 4. The second elastic element 85 is in a deformed state. People can pull the handle 13 forward, causing the seat 12 to move forward. The seat 12 then moves the pusher frame 86 forward. The pusher frame 86 pushes the sliding plate 81 towards each other through the guide opening 87. The sliding plate 81 causes the pusher plate 82 to rotate upward. The second elastic element 85 gradually returns to its original shape, providing assistance for the upward rotation of the pusher plate 82. The pusher plate 82 causes the pusher block 84 to move upward. The pusher frame 86 can also drive the rack 94 to move forward. When the rack 94 moves forward and meshes with the gear 92, the rack 94 will drive the gear 92 to rotate clockwise. The gear 92 will drive the winding shaft 91 to rotate clockwise, and the winding shaft 91 will pull the rope 98. Released, the third elastic element 93 deforms. When the rack 94 moves forward and disengages from the gear 92, the gear 92 rotates counterclockwise under the action of the third elastic element 93. The winding shaft 91 rotates counterclockwise accordingly, retracting the released pull rope 98. When the seat 12 moves forward to the appropriate position, stop pulling the handle 13, then sit on the seat 12, pass the wire of the test equipment through the through hole 75, and insert it into the socket on the test instrument 4 for testing. After the test is completed, continue pulling the handle 13 forward, pushing the block 84 to continue moving upward. When the pushing block 84 moves upward and contacts the bottom of the test instrument 4, stop pulling the handle 13, then pull the clamping plate 6 forward to remove it from the slot 5, releasing the test instrument 4. Pushing the handle 13 backward moves the seat 12 backward, which in turn moves the pusher 86 backward. The pusher 86 then moves the rack 94 backward. When the rack 94 moves backward and engages with the gear 92, it drives the gear 92 to rotate counterclockwise. The gear 92 then drives the winding shaft 91 to rotate counterclockwise, causing the third elastic element 93 to deform. The winding shaft 91 then winds up the pull rope 98, which is released from the winding reel 95, causing the reel 95 to rotate. The reel 95 then drives the sliding shaft 96 to rotate, pushing the T-shaped plate 97 forward. The T-shaped plate 97 then drives the sliding rod 72 forward, compressing the first elastic element 73. The sliding rod 72 then drives the ejector plate 74 forward, ejecting the wire of the test equipment from the socket on the test instrument 4 in one operation. With all the testing equipment removed, operation becomes more convenient. When the rack 94 moves backward and disengages from the gear 92, the gear 92 rotates clockwise under the action of the third elastic element 93, releasing the wound rope 98. As the rope 98 loosens, the slide bar 72 moves backward under the action of the first elastic element 73. The slide bar 72 drives the T-shaped plate 97 to move backward, which in turn pushes the slide shaft 96 to rotate in the opposite direction, thereby causing the winding reel 95 to rotate in the opposite direction and retracting the released rope 98. The pusher frame 86 moves backward and pushes the slide plate 81 in a direction away from each other through the guide opening 87. The slide plate 81 drives the pusher plate 82 to rotate downward, thereby causing the pusher block 84 to move downward. The second elastic element 85 deforms, and the testing instrument 4 moves downward under its own weight.When the test instrument 4 is fully moved into the placement platform 2, the handle 13 is stopped. The placement platform 2 protects the test instrument 4 from impacts by external objects and prevents dust from entering the sockets on the instrument 4. The test instrument can then be placed in the placement box 14 for storage and easy retrieval later. When the handle 13 is pulled forward, the push block 84 moves upward, pushing the test instrument 4 upward and pushing it out of the placement platform 2. When the slot 5 and the locking plate 6 align, the handle 13 is stopped, and the locking plate 6 is pushed backward to engage the slot 5, securing the test instrument 4.

[0043] Example 2

[0044] Based on Example 1, such as Figure 10 and Figure 11 As shown, it also includes a buffer mechanism 10, which includes an airbag 101, an air vent 102, and a limiting plate 103. The airbag 101 is connected between the slide plates 81. The top of the airbag 101 is in contact with the bottom of the push plate 82. The air vent 102 is connected to both the front and rear sides of the middle of the airbag 101. The limiting plate 103 is connected to both the front and rear sides of the bottom of the placement platform 2. The airbag 101 is located between the two limiting plates 103. The limiting plate 103 is used to limit the airbag 101.

[0045] When the skateboard 81 moves towards each other, it compresses the airbag 101, causing the airbag 101 to contract. The air inside the airbag 101 is then expelled through the vent pipe 102. The limiting plate 103 can limit the airbag 101 to prevent it from arching upwards. When the skateboard 81 moves away from each other, it stops compressing the airbag 101, causing it to inflate. Outside air enters the airbag 101 through the vent pipe 102. The airbag 101 can cushion the downward rotation of the push plate 82, thereby cushioning the downward movement of the testing instrument 4, reducing the vibration of the testing instrument 4, and preventing damage to the testing instrument 4.

[0046] like Figure 12 and Figure 13 As shown, it also includes a limiting mechanism 11, which includes a connecting ring 111 and a limiting sleeve 112. The connecting ring 111 is connected to one side of the guide plate 3 that is close to each other. The connecting ring 111 and the winding shaft 91 are rotatably connected. The top of the connecting ring 111 is connected to the limiting sleeve 112. The pull rope 98 passes through the limiting sleeve 112.

[0047] When the winding shaft 91 releases the pull rope 98, the limiting sleeve 112 can limit the pull rope 98 to prevent it from falling off the winding shaft 91.

[0048] The above embodiments are provided for those skilled in the art to implement or use the present invention. Those skilled in the art can make various modifications or changes to the above embodiments without departing from the inventive concept of the present invention. Therefore, the protection scope of the present invention is not limited to the above embodiments, but should be the maximum scope that conforms to the innovative features mentioned in the claims.

Claims

1. A test bench for electronic information engineering, comprising a support frame (1) and a placement platform (2), wherein the top of the support frame (1) is connected to the placement platform (2), characterized in that: It also includes a guide plate (3), a test instrument (4), a clamping plate (6), a release mechanism (7), a push mechanism (8), and a push mechanism (9). The left and right sides of the placement platform (2) are connected to the guide plate (3). The test instrument (4) is slidably arranged between the guide plates (3). The test instrument (4) extends from the top of the placement platform (2). The lower front part of the test instrument (4) has a slot (5). The top of the placement platform (2) is slidably provided with a clamping plate (6) for clamping the test instrument (4). The clamping plate (6) is located in the slot (5). The test instrument (4) is provided with a release mechanism (7) for pushing out the wire of the test equipment. The support frame (1) is provided with a push mechanism (8) for pushing the test instrument (4) out of the placement platform (2). The test instrument (4) is provided with a push mechanism (9).

2. The experimental platform for electronic information engineering as described in claim 1, characterized in that: The disengagement mechanism (7) includes a sliding sleeve (71), a sliding rod (72), a first elastic element (73), and a push-out plate (74). The left and right sides of the test instrument (4) are connected to the sliding sleeve (71). The sliding sleeve (71) is equipped with a sliding rod (72) in a sliding manner. The sliding rod (72) and the sliding sleeve (71) are connected by the first elastic element (73). The sliding rod (72) is connected by a push-out plate (74) for pushing out the wires of the test instrument. The push-out plate (74) has multiple through holes (75) for the wires of the test instrument to pass through. The number of through holes (75) is the same as the number of sockets on the test instrument (4), and the through holes (75) correspond one-to-one with the sockets on the test instrument (4).

3. The experimental platform for electronic information engineering as described in claim 2, characterized in that: The launching mechanism (8) includes a sliding plate (81), a push plate (82), a rotating shaft (83), a push block (84), a second elastic element (85), and a push frame (86). The bottom left and right sides of the placement platform (2) are slidably provided with sliding plates (81). The top of the sliding plates (81) is rotatably connected to the push plate (82). The push plates (82) are rotatably connected to the rotating shaft (83). The middle of the rotating shaft (83) is connected to the push block (84) for launching the test instrument (4) from the placement platform (2). The rotating shaft (83) and the push plate (82) are connected to the second elastic element (85). The lower part of the support frame (1) is slidably provided with a push frame (86) for pushing the sliding plates (81). The push frame (86) has guide openings (87) on the left and right sides. The two sliding plates (81) are located in the two guide openings (87) respectively. The rear part of the guide opening (87) is inclined towards the push block (84).

4. The experimental platform for electronic information engineering as described in claim 3, characterized in that: The driving mechanism (9) includes a winding shaft (91), a gear (92), a third elastic element (93), a rack (94), a winding disc (95), a sliding shaft (96), a T-shaped plate (97), and a pull rope (98). The lower part of the guide plate (3) is rotatably connected to the winding shaft (91). The ends of the winding shaft (91) that are far apart from each other are connected to the gear (92). The third elastic element (93) is connected between the guide plate (3) and the gear (92). Two racks (94) are connected to the rear side of the driving frame (86). The rack (94) and the placement platform (2) are slidably connected. The rack (94) moves and meshes with the gear (92). The lower left and right sides of the test instrument (4) are rotatably connected to the winding discs (95). The winding discs (95) are all wound with pull ropes (98). The pull ropes (98) are wound on the winding shaft (91). The winding discs (95) are all connected to the sliding shafts (96) on the opposite sides. The rear end of the sliding rod (72) is connected to the T-shaped plate (97). The T-shaped plate (97) and the sliding shaft (96) are slidably connected.

5. The experimental platform for electronic information engineering as described in claim 4, characterized in that: It also includes a buffer mechanism (10), which includes an airbag (101), a vent pipe (102) and a limiting plate (103). The airbag (101) is connected between the slide plates (81). The top of the airbag (101) is in contact with the bottom of the push plate (82). The vent pipe (102) is connected to the airbag (101). There are two limiting plates (103) connected to the bottom of the placement platform (2) for limiting the airbag (101). The airbag (101) is located between the two limiting plates (103).

6. The experimental platform for electronic information engineering as described in claim 5, characterized in that: It also includes a limiting mechanism (11), which includes a connecting ring (111) and a limiting sleeve (112). The connecting ring (111) is connected to the side of the guide plate (3) that is close to each other. The connecting ring (111) and the winding shaft (91) are rotatably connected. The top of the connecting ring (111) is connected to the limiting sleeve (112), and the pull rope (98) passes through the limiting sleeve (112).

7. The experimental platform for electronic information engineering as described in claim 6, characterized in that: It also includes a seat (12) and a handle (13), with the seat (12) connected to the lower part of the push frame (86) and the handle (13) connected to the seat (12).

8. The experimental platform for electronic information engineering as described in claim 7, characterized in that: It also includes a placement box (14), and the placement platform (2) is connected to the front of the placement box (14).

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