Test system and method of OCT imaging equipment, control device and storage medium

By constructing a test system for planar optical discs and OCT conduits, and using the Rayleigh criterion to compare signal intensity, the accuracy problem of OCT equipment in determining air gap thickness and calculating axial resolution was solved, achieving higher determination and calculation accuracy.

CN121829356APending Publication Date: 2026-04-10NANJING FORSSMANN MEDICAL TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-11-05
Publication Date
2026-04-10

AI Technical Summary

Technical Problem

Existing OCT equipment has accuracy issues in determining axial resolution, especially when the air gap is small, making it difficult to meet the Rayleigh criterion. Furthermore, existing methods cannot intuitively obtain axial resolution indicators that conform to the definition in YY/T 1895-2023.

Method used

The testing system consists of a first-plane crystal, a second-plane crystal, and an OCT conduit. By adjusting the orientation of the crystal and the conduit, the air gap to be tested is formed, and the polar coordinate display of the XZ plane scan is obtained. The validity of the air gap thickness is determined by comparing the signal intensity value with the Rayleigh criterion, and the axial resolution is calculated.

Benefits of technology

This improves the accuracy of air gap thickness determination and the calculation precision of axial resolution, avoids human error, and ensures the objectivity and accuracy of the determination results.

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Abstract

The invention discloses a test system and method of OCT imaging equipment, a control device and a storage medium. Finding a feature pixel point with the strongest surface signal of the first plane optical flat from the Bscan; converting the Bscan into an Ascan, and obtaining a y coordinate value of a feature pixel point from the Ascan as a feature value; respectively finding a first pixel point, a second pixel point and a third pixel point from the Ascan according to the characteristic values; respectively obtaining a corresponding first signal intensity value, a second signal intensity value and a third signal intensity value, and comparing the values with a Rayleigh criterion threshold value; and if yes, determining that the current air gap thickness is effective. Due to the high flatness of the surface of the planar optical flat, the method can depend on the AScan with the strongest signal, and errors are effectively prevented from being increased artificially. When the thickness of a small air gap is judged, the method can select from two conclusions that one pixel air gap is distinguished and the air gap cannot be distinguished, and the judgment result is more accurate and objective.
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Description

Technical Field

[0001] This invention relates to the field of testing technology for OCT imaging equipment, and specifically to a testing system and method, control device and storage medium for OCT imaging equipment. Background Technology

[0002] Currently, medical optical coherence tomography (OCT) systems are mainly divided into two categories: the first category uses optical galvanometers to achieve two-dimensional planar tissue imaging, generally used in ophthalmic examinations. The second category uses a rotating motor to drive a guidewire to achieve circumferential scanning of the image, used for the detection of luminal organoid tissues, such as the cardiovascular system, trachea, and digestive tract.

[0003] The second type of OCT image acquisition method described above generally utilizes a rotary motor to drive a guide wire, which in turn drives a scanning probe to acquire data through circumferential scanning and display it in a two-dimensional image constructed in polar coordinates. The angle of rotation of the scanning probe determines the polar coordinates of the image. Optical coherence data constitutes the polar radius coordinates of the image. The optical coherence data in the polar radius coordinates corresponds to images of tissues at different depths detected by the OCT system. The resolution of the tissue image in the polar radius coordinates reflects the axial resolution of the OCT equipment.

[0004] To address this, existing technology CN106880340A designs a method that uses cross roller guides to adjust the relative distance between the moving side slide and the fixed side slide, resulting in greater precision and stability. This allows the minimum distance between the moving side slide and the fixed side slide to characterize the axial resolution of the OCT equipment used, while still being able to distinguish between them.

[0005] The aforementioned prior art CN106880340A has the following problems: Firstly, the device uses the minimum resolvable distance between two glass plates to characterize the axial resolution of the OCT equipment used. This requires certain conversions and additional improvements to obtain the axial resolution index defined in "YY / T 1895-2023 Intravascular Optical Coherence Tomography Imaging Equipment".

[0006] Secondly, it is very easy for the same BScan (XZ plane scan) to show that some AScan (XY plane scan) have fewer pixels corresponding to the air gap between the glass plates, while others have more pixels corresponding to the air gap. As a result, it is not possible to intuitively obtain the axial resolution value defined in "YY / T 1895-2023 Intravascular Optical Coherence Tomography Imaging Equipment".

[0007] Thirdly, when the air gap is small, there may be cases where the air gap data obtained by AScan and the peak data corresponding to the glass plate surface meet the Rayleigh criterion, while the data corresponding to AScan do not meet the Rayleigh criterion. Summary of the Invention

[0008] The main objective of this invention is to propose a testing system and method, control device and storage medium for OCT imaging equipment, aiming to improve the accuracy of minimum air gap thickness determination and axial resolution calculation.

[0009] To achieve the above objectives, the present invention proposes a testing method for an OCT imaging device, including a determination operation for the effectiveness of air gap thickness, wherein the determination operation for the effectiveness of air gap thickness includes: Provides a first planar optical disc, a second planar optical disc, and an OCT conduit; The orientations of the first planar crystal, the second planar crystal, and the OCT conduit are adjusted to form the air gap thickness to be measured; Open the OCT catheter and obtain a polar coordinate display image of the XZ plane scan; Find the feature pixel with the strongest signal on the first plane flat surface from the polar coordinate display diagram of the XZ plane scan; The polar coordinate display map of the XZ plane scan is converted into an XY plane scan display map, and the y coordinate value of the feature pixel is obtained from the XY plane scan map as the feature value; According to the feature values, find the first pixel point located in the air gap at the signal peak on the first plane flat surface, the second pixel point located at the signal peak on the second plane plane surface, and the third pixel point located at the signal valley between the two signal peaks from the XY plane scan display image. The first signal strength value of the first pixel, the second signal strength value of the second pixel, and the third signal strength value of the third pixel are obtained respectively. The smaller of the first signal strength value and the second signal strength value, and the ratio between the smaller value and the third signal strength value, are compared with the threshold of the Rayleigh criterion; If the ratio is not less than the threshold of the Rayleigh criterion, the current corresponding air gap thickness is confirmed to be valid.

[0010] Optionally, the step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal and the second planar flat crystal are arranged at least partially at intervals to define air gaps at the intervals; The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. Adjust at least one of the first planar flat crystal, the second planar flat crystal, and the OCT conduit until the air gap thickness at the light-emitting area of ​​the OCT conduit meets the preset test value, thus forming the air gap thickness to be measured.

[0011] Optionally, the step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal and the second planar flat crystal are arranged facing each other at intervals to define an air gap of uniform thickness at the intervals. The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. At least one of the first planar flat crystal and the second planar flat crystal is moved closer to or further away from the other until the air gap thickness at the light emission area of ​​the OCT conduit meets the preset test value, thus forming the air gap thickness to be measured.

[0012] Optionally, the step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal is arranged at an angle relative to the second planar flat crystal to define air gaps of varying thicknesses at the intervals. The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. The OCT guide tube is moved along the surface of the first planar flat crystal until the air gap thickness at the light emission area of ​​the OCT guide tube meets the preset measurement value, thus forming the air gap thickness to be measured.

[0013] Optionally, the step of opening the OCT catheter and obtaining the polar coordinate display image of the corresponding XZ plane scan includes: Open the OCT catheter and obtain the corresponding raw scan image; The original scan image is converted to obtain a polar coordinate display image of the XZ plane scan.

[0014] Optionally, it also includes: Obtain multiple measured values ​​of the air gap thickness; The validity determination operation of the air gap thickness is performed sequentially according to each of the measured values, and multiple valid air gap thicknesses are obtained; The minimum air gap thickness is determined from the effective air gap thicknesses, and the axial resolution is calculated based on the minimum air gap thickness.

[0015] Optionally, the step of sequentially performing the determination operation of the validity of the air gap thickness based on each of the measured values, and obtaining multiple valid air gap thicknesses, includes: Select one of the measured values ​​as the first measured value, and perform the determination operation of the effectiveness of the air gap thickness based on the first measured value; If the ratio is not less than the threshold of the Rayleigh criterion, the current corresponding air gap thickness is confirmed to be valid and counted as a valid air gap thickness. Then, one of the remaining test values ​​is selected as the new first test value. If the ratio is less than the threshold of the Rayleigh criterion, the corresponding air gap thickness is confirmed to be invalid. The remaining test values ​​that are less than the first test value are removed, and one of the remaining test values ​​that are greater than the first test value is selected as the new first test value. Based on the new first test value, continue to perform the determination operation of the validity of the air gap thickness until all valid air gap thicknesses are obtained.

[0016] Optionally, the calculation steps for the axial resolution include: Obtain the physical thickness and group refractive index of the first planar flat crystal; Obtain the group refractive index of a preset tissue within an OCT imaging device; The x-coordinate values ​​of the feature pixel, the first pixel, the second pixel, and the third pixel corresponding to the minimum air gap thickness are obtained from the XY plane scan display image, and the number of pixels corresponding to the first plane flat crystal thickness and the number of pixels corresponding to the minimum air gap thickness are calculated. The axial resolution is calculated using the following formula: ; Where Rz is the axial resolution, Lg is the physical thickness of the first planar flat crystal, Pa is the number of pixels corresponding to the minimum air gap thickness, and P g n is the number of pixels corresponding to the thickness of the first planar flat crystal. g Let n be the group refractive index of the first planar flat crystal. t The group refractive index of a pre-defined tissue within the OCT imaging device.

[0017] In addition, to achieve the above-mentioned technical objectives, the present invention also provides a control device, including a memory, a processor, and a test program for an OCT imaging device stored in the memory and executable on the processor, wherein the test program for the OCT imaging device is configured to implement the steps of the test method for the OCT imaging device as described above.

[0018] Furthermore, to achieve the above-mentioned technical objectives, the present invention also provides a testing system for an OCT imaging device, comprising: OCT imaging equipment includes an OCT conduit, wherein the OCT conduit is provided with a light-emitting window, and the plane in which the light-emitting window is located constitutes a light-emitting surface; The testing apparatus includes a first planar optical flat and a second planar optical flat; and, The control device described above is electrically connected to the OCT conduit.

[0019] Optionally, at least one of the OCT conduit, the first planar flat crystal, and the second planar flat crystal is movably configured relative to the remaining two, such that, during its movement, the thickness of the air gap located between the first planar flat crystal and the second planar flat crystal at the light-emitting region corresponding to the OCT conduit is adjustable.

[0020] Optionally, the testing system of the OCT imaging device further includes a display module electrically connected to the control device to display preset images related to the test program of the OCT imaging device.

[0021] In addition, to achieve the above-mentioned technical objectives, the present invention also provides a storage medium storing a test program for an OCT imaging device, wherein when the test program for the OCT imaging device is executed by a processor, the test program for the OCT imaging device implements the steps of the test method for the OCT imaging device as described above.

[0022] The testing fixture provided by this invention consists of a first planar flat crystal and a second planar flat crystal, and the processing technology is simpler and easier to obtain.

[0023] Since the surface of the planar flat crystal itself has high flatness, the test method provided in this application can rely on only the AScan (XY plane scan display) with the strongest signal when determining whether the air gap thickness is effective, without the need for manual selection of AScan, thereby effectively avoiding human error.

[0024] When judging the thickness of a small air gap, the test method provided in this application can at least choose between two conclusions: being able to distinguish an air gap of one pixel and being unable to distinguish an air gap at all. This makes the judgment result more accurate and objective. Attached Figure Description

[0025] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0026] Figure 1 A three-dimensional schematic diagram of a first embodiment of the test system for the OCT imaging device provided by the present invention; Figure 2 A perspective view of the mounting bracket in a second embodiment of the testing device provided by the present invention; Figure 3 This is an assembly diagram of the first embodiment of the planar flat crystal and support component in the testing device provided by the present invention. Figure 4 for Figure 3 A schematic diagram showing the reduced air gap in the middle section; Figure 5 This is an assembly diagram of a second embodiment of the planar flat crystal and support component in the testing device provided by the present invention. Figure 6 for Figure 5 Top view of the mid-plane flat crystal and support components; Figure 7 A schematic diagram of the hardware operating environment of an embodiment of the control device provided by the present invention; Figure 8 A flowchart illustrating an embodiment of the testing method for the OCT imaging device provided by the present invention; Figure 9 For the corresponding Figure 8 The original scan image obtained in the first embodiment of step S300; Figure 10 For the corresponding Figure 8 The polar coordinate display diagram of the XZ plane scan obtained in the first embodiment of step S300; Figure 11 For the corresponding Figure 8 The region where the feature pixels found in the first embodiment of step S400 are located; Figure 12 For the corresponding Figure 8 The feature pixels found in the first embodiment of step S400; Figure 13 For the corresponding Figure 8 The first pixel found in the first embodiment of step S500 to S700; Figure 14For the corresponding Figure 8 The second pixel found in the first embodiment of steps S500 to S700; Figure 15 For the corresponding Figure 8 The third pixel found in the first embodiment of steps S500 to S700; Figure 16 This is a schematic diagram of the interface for obtaining the group refractive index of a preset tissue within an OCT imaging device in this invention. Figure 17 For the corresponding Figure 8 The original scan image obtained in the second embodiment of step S300; Figure 18 For the corresponding Figure 8 The polar coordinate display diagram of the XZ plane scan obtained in the second embodiment of step S300; Figure 19 For the corresponding Figure 8 The feature pixels found in the second embodiment of step S400; Figure 20 For the corresponding Figure 8 The first pixel found in the second embodiment of step S500 to S700; Figure 21 For the corresponding Figure 8 The second pixel found in the second embodiment of steps S500 to S700; Figure 22 For the corresponding Figure 8 The first third pixel found in the second embodiment of steps S500 to S700; Figure 23 For the corresponding Figure 8 The second third pixel point found in the second embodiment of steps S500 to S700.

[0027] Explanation of icon numbers: 110 First planar crystal flat; 120 Second planar crystal flat; 130 Air gap; 200 Support; 300 Mounting bracket; 310 Base frame; 320 Suspension; 321 Third frame; 322 Fourth frame; 323 Lug; 324 Socket; 330 Connecting bracket; 331 First frame; 332 Second frame; 340 Adjustment bracket; 341 Fifth frame; 342 Sixth frame; 500 OCT conduit; 600 Control device; 610 Processor; 620 Communication bus; 630 User interface; 640 Network interface; 650 Memory.

[0028] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0029] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0030] It should be noted that if the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0031] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the meaning of "and / or" throughout the text includes three parallel solutions; for example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0032] Please see Figures 1 to 7 This invention provides a testing system for an OCT imaging device. The testing system includes an OCT imaging device, a testing apparatus, and a control device 600.

[0033] The OCT imaging device includes an OCT catheter. The OCT catheter has a light-emitting window. The plane containing the light-emitting window constitutes the light-emitting surface.

[0034] The testing apparatus is primarily used to test and evaluate at least some of the imaging performance of OCT imaging devices.

[0035] To better understand the structure of the testing device, the following embodiments will use examples where the testing device has two or more perpendicular or nearly perpendicular vertical, horizontal, and longitudinal axes. In practical applications, the vertical, horizontal, and longitudinal axes can be characterized by any suitable absolute direction. However, generally, specific examples... Figures 1 to 6As shown in the structure, the vertical direction can correspond to the direction of gravity, with opposite directions of upward and downward. The horizontal plane is a plane that is perpendicular or nearly perpendicular to the vertical direction. The horizontal and vertical directions are any two directions on the horizontal plane.

[0036] Based on this, the testing device provided by the present invention can be used in conjunction with an OCT catheter. The OCT catheter is generally a long, thin tube, and the light-emitting window is typically formed on the side wall of the OCT catheter. This light-emitting window allows the internal scanning light to exit. Therefore, the plane containing this light-emitting window essentially constitutes the light-emitting surface.

[0037] Of course, to make the entire testing process more visualized and intelligent, the testing device provided by this invention can be additionally set up on its own or used in conjunction with an externally fixed control system. In this case, the control system can selectively include a power supply device, a control device 600, and a display device. The power supply device provides the necessary power for the entire testing process. The display device can visualize data that may be involved in the testing process, such as image data. The control device 600 can be electrically connected to the aforementioned power supply device, display device, OCT conduit, etc., thereby providing the necessary control commands and communication for the entire testing process.

[0038] Therefore, please first combine Figure 1 The testing device provided by the present invention includes two planar flat crystals, a support frame, and a mounting frame 300.

[0039] Two planar flat crystals are at least partially spaced apart vertically to define an air gap 130 at the interval.

[0040] The support member 200 is clamped between two planar flat crystals.

[0041] Mounting bracket 300 includes a base frame 310 for mounting two planar optical discs, a suspension bracket 320 for suspending OCT conduits on one vertical side of the two planar optical discs, and a connecting bracket 330 for connecting the base frame 310 and the suspension bracket 320.

[0042] The connecting frame 330 includes a first frame 331 and a second frame 332 connected vertically in sequence. The second frame 332 is vertically movable relative to the first frame 331, so that the distance between the suspension 320 and the base frame 310 can be adjusted.

[0043] In the technical solution provided by this invention, the support member 200 can form a more stable air gap 130 between the two planar optical discs, thereby facilitating more stable acquisition of data from the air gap 130 using an OCT conduit. The mounting bracket 300 helps to strengthen the assembly stability between the two planar optical discs and the OCT conduit, and by adjusting the relative movement of the first bracket 331 and the second bracket 332, the orientation of the OCT conduit relative to the air gap 130 can be flexibly adjusted, which helps to improve the overall versatility and adaptability.

[0044] Furthermore, due to the high flatness of the planar optical disc surface, the testing device provided in this application can accurately determine whether the 130mm air gap thickness is effective. For example, the Rayleigh criterion comparison can be performed using only the information data from the strongest AScan (XY plane scan display). This eliminates the need for manual selection of AScans, effectively avoiding human error and making the determination results more accurate and objective.

[0045] The testing device provided in this application has a simpler overall structure, is easier to mold, and is more convenient to operate and more reliable in use.

[0046] A planar optical flat is a high-precision optical measuring instrument. Planar optical flats are generally made of optical glass (such as K4 or K9) or quartz glass. A planar optical flat typically has one or two optical measuring planes. The surface roughness and flatness errors of these optical measuring planes are extremely small.

[0047] In this application, the suspension 320 is equivalent to being suspended vertically above the base frame 310. At least partially, the two planar optical planes are arranged sequentially at intervals along the vertical direction. Therefore, the two planar optical planes can be specifically configured with their vertically facing surfaces as the aforementioned optical measurement planes. This, in turn, helps to improve the accuracy and objectivity of the entire testing process, as described above.

[0048] like Figures 3 to 6 As shown, for ease of understanding, in the following embodiments, the one closer to the suspension 320 among the two planar flat crystals is designated as the first planar flat crystal 110, and the one closer to the base frame 310 is designated as the second planar flat crystal 120.

[0049] At this point, the arrangement of the first planar flat crystal 110 and the second planar flat crystal 120 is not restricted: In a specific scheme, such as Figures 3 to 4As shown, the first planar flat crystal 110 and the second planar flat crystal 120 can be arranged vertically opposite each other. That is, the extension directions of the first planar flat crystal 110 and the second planar flat crystal 120 are parallel or nearly parallel. The first planar flat crystal 110 and the second planar flat crystal 120 are spaced apart at any point. This creates a uniformly thick air gap 130 between the first planar flat crystal 110 and the second planar flat crystal 120. In other words, the thickness of this air gap 130 remains substantially the same or nearly the same along any horizontal direction.

[0050] Or in another specific solution, such as Figures 5 to 6 As shown, the first planar flat crystal 110 extends at an angle relative to the second planar flat crystal 120. That is, the extension directions of the first planar flat crystal 110 and the second planar flat crystal 120 intersect. At this time, the thickness of the air gap 130 formed between the first planar flat crystal 110 and the second planar flat crystal 120 varies along its extension direction (e.g., laterally), and the whole is roughly wedge-shaped.

[0051] To form the wedge-shaped air gap 130, in one specific embodiment, a lateral segment (e.g., a proximal segment) of the first planar flat crystal 110 can be directly overlapped on the second planar flat crystal 120, while another lateral segment (e.g., a offset segment) of the first planar flat crystal 110 and the second planar flat crystal 120 remain spaced apart. In this case, the support member 200 can be positioned at any location on the offset segment.

[0052] Alternatively, in another specific embodiment, the first planar flat crystal 110 is suspended above the second planar flat crystal 120, but a lateral segment of the first planar flat crystal 110 (e.g., the proximal segment) is closer to the second planar flat crystal 120 than another lateral segment of the first planar flat crystal 110 (e.g., the offset segment). In this case, the support member 200 can be positioned at any location of the proximal segment and / or the offset segment.

[0053] In the above scheme, the support member 200 is sandwiched between the first planar flat crystal 110 and the second planar flat crystal 120 to ensure that the relative positions of the first planar flat crystal 110 and the second planar flat crystal 120 are fixed, thereby ensuring that the thickness of the air gap 130 remains stable and basically does not change, at least during the test.

[0054] The aforementioned support member 200 can be configured as one or at least two. The total vertical projection of the support member 200 generally does not excessively occupy the space occupied by the first planar flat 110 and the second planar flat 120, thus reserving sufficient space for the air gap 130. Furthermore, the support member 200 is generally preferred to be positioned near the edges of the first planar flat 110 and the second planar flat 120.

[0055] When multiple support members 200 are used, the structure of each support member 200 should be adapted as closely as possible to the thickness and shape of the air gap 130 at its location. For example, in... Figures 3 to 4 In the structure shown, the support member 200 is configured as a prism or cylinder with substantially parallel upper and lower surfaces. And in... Figures 5 to 6 In the structure shown, the support member 200 is configured as a wedge or trapezoid that adapts to the shape of its location.

[0056] In determining the axial resolution of an OCT imaging device, it is necessary to first determine the minimum air gap thickness 130. This requires, throughout the testing process, to successively find and confirm the effective and minimum air gap thickness 130 between the first planar crystal 110 and the second planar crystal 120. In other words, different air gap thicknesses 130 need to be formed between the first planar crystal 110 and the second planar crystal 120.

[0057] Based on this, in, for example Figures 3 to 4 In the structure shown, it is necessary to replace the support member 200 with one of different thicknesses to achieve the purpose of forming an air gap 130 with different thicknesses between the first planar flat crystal 110 and the second planar flat crystal 120. At this time, the orientation of the OCT conduit relative to the first planar flat crystal 110 can remain basically unchanged (the OCT conduit may have a vertical position change depending on the support member 200 with different thicknesses).

[0058] Or in, for example Figures 5 to 6 In the structure shown, based on the support member 200 of the same thickness, a wedge-shaped air gap 130, as described above, is directly formed between the first planar flat crystal 110 and the second planar flat crystal 120. Moving along the extension direction of the wedge-shaped air gap 130 (e.g., laterally) to different positions results in different thicknesses of the air gap 130. At this time, a relative movement is formed between the OCT conduit and the wedge-shaped air gap 130 along its extension direction. During this relative movement, for example, moving from the closer section to the farther section, a gradually increasing thickness of the air gap 130 is obtained. Conversely, moving from the farther section to the closer section, a gradually decreasing thickness of the air gap 130 is obtained.

[0059] Of course, in Figures 3 to 6 In the structure, the support member 200 can include multiple support portions, and the thickness of each support portion is set to be different. In actual operation, each support portion can be selectively clamped in the region between two planar flat crystals, so that the thickness of the air gap 130 between the two planar flat crystals can be adjusted.

[0060] For example, the support member 200 may include five support portions. The thicknesses of the five support portions are 0.5 mm, 1 mm, 1.5 mm, 2 mm, and 2.5 mm, respectively. When a 0.5 mm air gap 130 thickness is required, a support portion with a thickness of 0.5 mm can be inserted alone between two planar flats. When a 1 mm air gap 130 thickness is required, a support portion with a thickness of 1 mm can be inserted alone between two planar flats. When a 3 mm air gap 130 thickness is required, a support portion with a thickness of 0.5 mm and a support portion with a thickness of 2.5 mm can be stacked and inserted between two planar flats. In this way, at least five types of air gaps 130 can be formed between the first planar flat 110 and the second planar flat 120.

[0061] As mentioned above, the support member 200 is set to at least two, which means that the support part of the same thickness can be set to at least two according to actual needs.

[0062] When the support member 200 as described above includes multiple support portions, each support portion can be separately configured. When needed, only one support portion needs to be selected and sandwiched between the first planar flat 110 and the second planar flat 120. The remaining support portions can be disposed of arbitrarily. This makes the storage, transfer, and use of each support portion more independent and flexible.

[0063] Alternatively, the support components can be connected sequentially to form a single unit. For example, the support components can be connected sequentially along a line. By adjusting the different support components sandwiched between two planar flats, the air gap 130 of corresponding thickness between the two planar flats can be adjusted. In this case, the remaining support components are located outside the air gap 130 and basically do not contact the first planar flat 110 and the second planar flat 120. In this way, the same support component 200 can form different support thicknesses, and the individual support components are easier to find and less likely to be lost.

[0064] In practical applications, the shape, size, material, etc. of the first planar flat crystal 110 and the second planar flat crystal 120 are not limited and can be adjusted according to actual needs.

[0065] Specifically, for example, the thickness of the first planar crystal flat 110 is generally set to no more than 5 mm. Further, the thickness of the first planar crystal flat 110 can preferably be 2 mm or close to 2 mm. It is understood that within a certain range, the thicker the planar crystal flat, the easier it is to process and shape, but this can easily lead to an increase in overall mass and a risk of deformation, ultimately reducing measurement accuracy. Conversely, the thinner the planar crystal flat, the more difficult it is to process, and it is prone to deformation or breakage due to insufficient mechanical strength, affecting measurement stability. It may also cause interference fringes to be distorted due to poor substrate rigidity, reducing the reliability of flatness detection. Setting the thickness of the first planar crystal flat 110 to around 2 mm is more practical. Furthermore, the thickness of the second planar crystal flat 120 can be set to be greater than the thickness of the first planar crystal flat 110. Specifically, for example, the thickness of the second planar crystal flat 120 can be set to approximately 5 mm. This simplifies the processing of the second planar crystal flat 120 and makes it easier to obtain. It also ensures that the second planar crystal flat 120 has sufficient structural strength to stably support the first planar crystal flat 110 and even the OCT conduit.

[0066] During assembly, the two planar flat crystals 120 are directly or indirectly mounted on the base frame 310. After the second planar flat crystal 120 is directly or indirectly assembled onto the base frame 310 via a structure, the base frame 310 may be further equipped with an interference structure. The interference structure acts directly on the second planar flat crystal 120, or directly on the structure, to restrict the movement of the second planar flat crystal 120. It should be noted that this restriction mainly refers to keeping the relative orientation between the second planar flat crystal 120 and the first planar flat crystal 110 as fixed as possible during the testing process of the OCT molding equipment. Limiting the second planar flat crystal 120 via the base frame 310 can also achieve the above objective to some extent.

[0067] There are various solutions for the limiting structure, including but not limited to opening a limiting groove, protruding limiting ribs, and setting a rough surface.

[0068] The suspension 320 can be used for the fixed installation of OCT catheters. There are no restrictions on the specific installation method, for example... Figures 1 to 2 As shown, the suspension 320 protrudes towards the base frame 310 to form lugs 323. At least two lugs 323 are spaced apart. Each lug 323 has a recess 324 extending along its spacing direction. The recess 324 is used for inserting and installing the OCT conduit. The spacing direction of the lugs 323, i.e., the arrangement direction of the recesses 324, is not limited, as long as it is perpendicular or nearly perpendicular to the vertical. In this way, when the OCT conduit is inserted into each recess 324, it can be securely installed on the suspension 320, ensuring that the light-emitting surface of the OCT conduit is substantially downward, directly facing the adjacent side surface of the first planar flat crystal 110.

[0069] Lug 323 can be integrally formed with suspension 320. Alternatively, lug 323 and suspension 320 can be separately formed and then connected in a detachable or non-detachable manner.

[0070] When the two components are set up separately, their connection method can be either a connection with a basically fixed orientation, or a movable connection with an adjustable orientation. This orientation includes the orientation of the light-emitting surface and its position along the vertical, longitudinal, and transverse directions.

[0071] For example, one end of the lug 323 is rotatably mounted on the suspension 320 about the longitudinally extending axis, so that during its rotation, the arrangement direction of the insertion holes 324 and the installation position of the OCT catheter can be adjusted.

[0072] Based on one or more of the above embodiments, it can be understood that the first frame 331 and the second frame 332 have a relative vertical travel. During this process, the second frame 332 can drive the suspension 320 to move vertically closer to or further away from the base frame 310. That is, it can also drive the light-emitting surface of the OCT guide tube to move vertically closer to or further away from the first planar flat screen 110. When moving away, the OCT guide tube and the first planar flat screen 110 can be fully separated, thereby facilitating the disassembly and replacement of the first planar flat screen 110, the support member 200, and the second planar flat screen 120. When moving closer, the relative orientation between the OCT guide tube and the first planar flat screen 110 can be adjusted accordingly, so that the light-emitting surface of the OCT guide tube can be aligned with the target side surface of the first planar flat screen 110.

[0073] The movement between the first frame 331 and the second frame 332 is not limited: for example, the first frame 331 may be fixed relative to the base frame 310, while the second frame 332 may be able to move vertically. Alternatively, one frame may be fixed relative to the base frame 310, while the second frame 332 may move spirally around an axis extending vertically.

[0074] The testing device also includes a drive mechanism. Correspondingly, the specific design of the drive mechanism can be adjusted accordingly. For example, when the second frame 332 moves vertically, the drive mechanism may include, for example, a linear cylinder. Alternatively, the drive mechanism may include, for example, a motor and a transmission assembly. This transmission assembly is mainly used to convert the rotational output of the motor into a linear output. This transmission assembly may be, but is not limited to, a rack and pinion mechanism, a lead screw and nut mechanism, a rocker-slider mechanism, etc. Similarly, when the second frame 332 moves along a helical trajectory, the drive mechanism may include, for example, a combination of a linear cylinder and a lead screw and nut mechanism, without limitation.

[0075] When the testing apparatus, as described above, also includes a drive mechanism, a mounting cavity can be defined within the first frame 331. The mounting cavity forms an upward-facing opening. The drive mechanism can be housed within the mounting cavity. The second frame 332 can be partially inserted into the mounting cavity via the opening and is drivenly connected to the drive mechanism. In this way, the drive mechanism can be housed within the internal space of the first frame 331, contributing to a compact overall structure and a more streamlined and aesthetically pleasing appearance.

[0076] When the first planar flat crystal 110 and the second planar flat crystal 120 are arranged as follows Figures 5 to 6 As shown, after forming a wedge-shaped air gap 130, as can be seen from the above, different air gap 130 thicknesses can be obtained by moving the OCT conduit along the extension direction of the wedge-shaped air gap 130 (that is, the direction of thickness variation of the air gap 130, such as the transverse direction listed in the above embodiments).

[0077] To achieve the relative movement between the OCT conduit and the wedge-shaped air gap 130 along its extension direction as described above: In one specific embodiment, the position of the suspension 320 relative to the base frame 310 can be fixed (in a non-vertical direction). This also fixes the position of the OCT conduit (in a non-vertical direction). The first planar crystal 110 and the second planar crystal 120 can then move.

[0078] Specifically, such as Figure 1 As shown, the mounting bracket 300 also includes an adjustment bracket 340. The adjustment bracket 340 is disposed between the base frame 310 and the two planar crystal flats. The adjustment bracket 340 is fixedly connected to the two planar crystal flats. The adjustment bracket 340 is movably disposed along the plane of the base frame 310 so that the position of the planar crystal flats can be adjusted accordingly.

[0079] The adjustment frame 340 may include a fifth frame 341 and a sixth frame 342. The fifth frame 341 is fixedly mounted on the base frame 310. The sixth frame 342 is used to mount the first planar crystal 110 and the second planar crystal 120, respectively. The sixth frame 342 is movable relative to the fifth frame 341 along the extending direction of the wedge-shaped air gap 130.

[0080] More specifically, the sixth frame 342 may have a mounting groove formed on its upper surface. The first planar flat 110 and the second planar flat 120 are at least partially received within the mounting groove. Alternatively, the sixth frame 342 may directly provide a relatively smooth mounting surface. The first planar flat 110 and the second planar flat 120 are directly mounted on this mounting surface.

[0081] Furthermore, depending on actual needs, the sixth frame 342 can also move relative to the fifth frame 341 in other directions. These other directions are those intersecting the extension direction of the wedge-shaped air gap 130. When the extension direction of the wedge-shaped air gap 130 is transverse, these other directions can be, but are not limited to, longitudinal or vertical. This helps to further enrich the adjustment functions of the adjustment frame 340.

[0082] Of course, in order to achieve the goal of having a relative travel distance between the OCT catheter and the wedge-shaped air gap 130 along its extension direction, in another specific embodiment, the positions of the first planar optical disc 110 and the second planar optical disc 120 relative to the base frame 310 can be fixed. The position of the OCT catheter moves along the extension direction of the wedge-shaped air gap 130.

[0083] Specifically, the suspension 320 includes a third frame 321 and a fourth frame 322 connected sequentially in the lateral direction. The third frame 321 is connected to the second frame 332. The fourth frame 322 is used for the installation of the OCT catheter. The fourth frame 322 is movably arranged in the lateral direction relative to the third frame 321 to allow the lateral position of the OCT catheter to be adjusted.

[0084] Among them, the third frame 321 and the fourth frame 322 can be at least partially connected, just like the first frame 331 and the second frame 332, so as to realize the extension and retraction adjustment of the third frame 321 and the fourth frame 322 in the connection direction.

[0085] The relative movement between the third frame 321 and the fourth frame 322 can be achieved directly by manual operation. Alternatively, similar to the first frame 331 and the second frame 332, the testing device also includes a power unit. The power unit is connected to the fourth frame 322 to enable the fourth frame 322 to move relative to the third frame 321.

[0086] Furthermore, the support member 200 and the mounting bracket 300 described in any of the above embodiments can be configured separately. That is, they are different independent products, which do not restrict or interfere with each other.

[0087] Alternatively, in a further embodiment, the support member 200 and the mounting bracket 300 are linked together. In this case, the support member 200 is movably mounted on the mounting bracket 300. Furthermore, during the movement of the support member 200, it causes each support component to move sequentially through the area between the two planar flat wafers.

[0088] Specifically, for example, the support member 200 includes a plurality of support portions as described above. When the plurality of support portions are arranged linearly in the direction approaching and away from the air gap 130, the support member 200 as a whole can be moved in the direction approaching and away from the air gap 130 by operating it, so that each support portion can be moved sequentially into the region between the two planar flat crystals.

[0089] Alternatively, when multiple support parts are arranged in a ring around the side of the air gap 130, the support 200 can be rotated around the central axis of the ring to sequentially drive each support part into the area between the two planar flat crystals.

[0090] However, it should be noted that, as far as possible, after any support moves to the area between the two planar flat crystals, no other support will cause undesirable obstruction to the air gap 130, especially the air gap 130 to be tested.

[0091] In addition, please refer to Figure 7 , Figure 7 This is a schematic diagram of the control device 600 for the hardware operating environment involved in the embodiment of the present invention.

[0092] like Figure 7 As shown, the control device 600 may include: a processor 610, such as a central processing unit (CPU), a communication bus 620, a user interface 630, a network interface 640, and a memory 650. The communication bus 620 is used to enable communication between these components. The user interface 630 may include a display screen and an input unit such as a keyboard; optionally, the user interface 630 may also include a standard wired interface or a wireless interface. The network interface 640 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 650 may be a high-speed random access memory (RAM) or a stable non-volatile memory (NVM), such as a disk drive. Optionally, the memory 650 may also be a storage device independent of the aforementioned processor 610.

[0093] Those skilled in the art will understand that Figure 7 The structure shown does not constitute a limitation on the control device 600, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0094] like Figure 7 As shown, the memory 650, which serves as a storage medium, may include an operating system, a network communication module, a user interface 630 module, and test programs for the OCT imaging device.

[0095] exist Figure 7In the control device 600 shown, the network interface 640 is mainly used for data communication with the network server; the user interface 630 is mainly used for data interaction with the user; the processor 610 and memory 650 in the control device 600 of the present invention may, but are not limited to, be set in the test device. The control device 600 calls the test program of the OCT imaging device stored in the memory 650 through the processor 610 and executes the test method of the OCT imaging device provided in the embodiment of the present invention.

[0096] This invention provides a testing method for an OCT imaging device, referring to... Figure 8 , Figure 8 This is a flowchart illustrating an embodiment of a testing method for an OCT imaging device according to the present invention.

[0097] As described above, the testing method for OCT imaging equipment generally includes two steps: first, finding the effective and minimum air gap thickness of 130; and second, obtaining the axial resolution of the minimum air gap thickness of 130.

[0098] First, the steps for finding the effective and minimum air gap thickness of 130 will be described in detail below (see steps A100 to A200 below): Step A100: Obtain multiple test values ​​for the thickness of the air gap 130.

[0099] In this embodiment, multiple test values ​​for the thickness of the air gap 130 need to be determined in advance.

[0100] The set value of the measured value is not limited and can be determined in any suitable way. It can be, but is not limited to, being set sequentially by the operator according to preset differences. The preset differences can be regular and arithmetic progressions: for example, based on a difference of 0.2mm, they can be set as 0.2mm, 0.4mm, 0.6mm, etc. Of course, the preset differences can also be random and set randomly by the operator: for example, they can be set as 0.2mm, 0.5mm, 0.6mm, 0.8mm, etc.

[0101] There is no limit to the number of values ​​to be measured, and they can be adjusted arbitrarily according to actual needs.

[0102] Once the specific value and quantity of the test value are determined, the validity of each test value needs to be determined separately. Specifically, step A200 is executed: according to each test value, the validity determination operation of the air gap 130 thickness is performed, and multiple valid air gap 130 thicknesses are obtained.

[0103] In this embodiment, the validity determination of the air gap 130 thickness can be performed on all the test values ​​separately and in an orderly manner. Alternatively, according to preset rules, the validity determination of the air gap 130 thickness can be performed on a portion of the test values, and the result of this operation can determine whether the portion of the test values ​​is valid, and incidentally, it can also determine whether the remaining test values ​​are valid.

[0104] The determination of the effectiveness of the air gap 130 thickness specifically includes the following steps (see steps S100 to S900 for details): Step S100: Provide a first planar optical disc 110, a second planar optical disc 120, and an OCT conduit.

[0105] In this embodiment, it is first necessary to obtain the testing device as described in any of the above embodiments.

[0106] Next, suitable first planar crystal flat 110 and second planar crystal flat 120 need to be selected. For example, the thickness, shape, and mass of the first planar crystal flat 110 and the second planar crystal flat 120 need to be determined. Figures 1 to 2 In the structure shown, the first planar flat crystal 110 can be selected with a thickness of approximately 2 mm. The second planar flat crystal 120 can be selected with a thickness of approximately 5 mm. Furthermore, during this process, it is necessary to ensure that the surfaces of the first planar flat crystal 110 and the second planar flat crystal 120 are clean and their shapes are regular with minimal deformation.

[0107] Next, select the OCT catheter to be tested. The OCT catheter must at least be fully functional and in good working order.

[0108] Step S200: Adjust the orientation of the first planar flat crystal 110, the second planar flat crystal 120 and the OCT conduit to form the thickness of the air gap 130 to be measured.

[0109] Once the first planar optical flat 110, the second planar optical flat 120, and the OCT conduit are all selected in place... The first planar optical disc 110 and the second planar optical disc 120 need to be assembled to the base frame 310 respectively. And the OCT conduit needs to be assembled to the suspension 320.

[0110] As described above, this application requires testing at least two values ​​to be measured. This necessitates adjusting the thickness of the air gap 130 between the first planar flat crystal 110 and the second planar flat crystal 120 according to at least two values ​​to be measured. The adjustment method for each value to be measured can be repeated with reference to the following steps.

[0111] Specifically, step S200 may include: Step S210: At least a portion of the first planar flat crystal 110 and the second planar flat crystal 120 are arranged at intervals to define an air gap 130 at the intervals.

[0112] In this embodiment, the relative positions between the first planar flat crystal 110 and the second planar flat crystal 120 are first adjusted to form the air gap 130 required for the target. The first planar flat crystal 110 and the second planar flat crystal 120 are arranged sequentially along the vertical direction, and at least locally between the first planar flat crystal 110 and the second planar flat crystal 120 are spaced apart, so that the air gap 130 required for the target can be formed at the intervals.

[0113] And please combine Figures 3 to 4 In one specific embodiment of the structure shown, the first planar flat crystal 110 and the second planar flat crystal 120 can be arranged opposite each other at intervals to define an air gap 130 of uniform thickness at the interval.

[0114] In other words, the first planar optical disc 110 and the second planar optical disc 120 are completely vertically separated. The first planar optical disc 110 extends and unfolds roughly along a horizontal plane, as does the second planar optical disc 120. Thus, the air gap 130 formed between the first and second planar optical discs 110 and 120 has a uniform and stable thickness value at all points in both the transverse and longitudinal directions. This obviously helps to expand the measurement range of the air gap 130 to a certain extent, thereby helping to appropriately reduce the requirements for the installation orientation of the OCT conduit relative to the first planar optical disc 110, making the overall operation simpler.

[0115] In actual operation, the support member 200 between the first planar flat crystal 110 and the second planar flat crystal 120 can be set to one or at least two. When set to at least two, the thickness (i.e., the vertical dimension) of each support member 200 is basically the same. And each support member 200 is set as close as possible to the edge area of ​​the air gap 130 so as to reserve enough space in the central area of ​​the air gap 130 for the light-emitting surface of the OCT guide tube to be aligned and adjusted.

[0116] Or please combine Figures 5 to 6 In another specific embodiment of the structure shown, the first planar flat crystal 110 can be arranged at an angle relative to the second planar flat crystal 120 to define air gaps 130 of varying thicknesses at the intervals.

[0117] In other words, it can be understood that the first planar flat crystal 110 and the second planar flat crystal 120 are locally spaced vertically. Specifically, for example, the first planar flat crystal 110 extends and unfolds roughly along a horizontal plane. Meanwhile, the second planar flat crystal 120 is appropriately tilted relative to the first planar flat crystal 110. Or as... Figures 5 to 6 As shown, the second planar flat crystal 120 extends and unfolds roughly along the horizontal plane. At the same time, the first planar flat crystal 110 is appropriately tilted relative to the second planar flat crystal 120.

[0118] Thus, the air gap 130 formed between the first planar crystal flat 110 and the second planar crystal flat 120 will have different thickness values ​​at various locations along the transverse, longitudinal, or other directions on the horizontal plane. Furthermore, this air gap 130 is approximately wedge-shaped. Therefore, based on the same assembly state of the first planar crystal flat 110 and the second planar crystal flat 120, more than two thickness values ​​can be found in the wedge-shaped air gap 130. This eliminates the need for repeated installation operations between the first planar crystal flat 110 and the second planar crystal flat 120, further simplifying the overall operation.

[0119] Similarly, in actual operation, the support member 200 between the first planar flat crystal 110 and the second planar flat crystal 120 can be set to one or at least two. When set to one, the thickness of the support member 200 should be as large as possible, and it should be set as close as possible to the edge region of the air gap 130. In this way, the area of ​​the air gap 130 closer to the support member 200 will have a larger corresponding thickness; conversely, the area farther away from the support member 200 will have a smaller corresponding thickness.

[0120] Next, based on any of the above specific solutions, in step S220: the OCT conduit is positioned on the side of the first planar crystal 110 that faces away from the second planar crystal 120, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar crystal 110. This ensures that the light emitted from the OCT conduit is directly facing and enters the air gap 130.

[0121] Then, in step S230: adjust at least one of the first planar flat crystal 110, the second planar flat crystal 120 and the OCT conduit until the thickness of the air gap 130 located in the light-emitting area of ​​the OCT conduit meets the preset test value, thus forming the thickness of the air gap 130 to be measured.

[0122] Specifically, as in Figures 3 to 4 In the structure shown, that is, in the scheme where the thickness of the air gap 130 is uniform throughout, when the relative positions of the first planar flat crystal 110, the second planar flat crystal 120 and the OCT conduit are adjusted to the correct position, the thickness of the air gap 130 generally corresponds to a value to be measured, that is, it constitutes a thickness of the air gap 130 to be measured.

[0123] When it is necessary to switch to the next test value, at least one of the first planar flat crystal 110 and the second planar flat crystal 120 needs to be moved closer to or further away from the other until the thickness of the air gap 130 located in the light-emitting area of ​​the OCT guide tube meets the preset next test value, thus forming the next test air gap 130 thickness.

[0124] For example, after the second planar crystal 120 is fixed on the base frame 310, the first planar crystal 110 can be moved vertically closer to the second planar crystal 120 to reduce the thickness of the air gap 130. Conversely, the first planar crystal 110 can be moved vertically away from the second planar crystal 120 to increase the thickness of the air gap 130.

[0125] Alternatively, for example, once the position of the first planar flat crystal 110 relative to the base frame 310 is fixed, the second planar flat crystal 120 can be moved vertically closer to the first planar flat crystal 110 to reduce the thickness of the air gap 130. Conversely, the second planar flat crystal 120 can be moved vertically away from the first planar flat crystal 110 to increase the thickness of the air gap 130.

[0126] Of course, the first flat crystal 110 and the second flat crystal 120 can both be moved relative to the base frame 310, which can also achieve the purpose of increasing or decreasing the thickness of the air gap 130.

[0127] And specifically in such Figures 5 to 6 In the structure shown, that is, in the scheme where the thickness of the air gap 130 is different at various points, when the relative positions of the first planar flat crystal 110, the second planar flat crystal 120 and the OCT conduit are adjusted in place, the thickness of the air gap 130 can generally correspond to more than two values ​​to be measured, that is, constitute more than two air gap 130 thicknesses to be measured.

[0128] When it is necessary to switch to the next measurement value, the OCT guide tube can be moved along the surface of the first planar flat crystal 110 until the thickness of the air gap 130 in the light-emitting area of ​​the OCT guide tube meets the preset measurement value, thus forming the thickness of the air gap 130 to be measured.

[0129] That is, when the OCT conduit moves along the direction in which the thickness of the wedge-shaped air gap 130 gradually increases, the thickness of the air gap 130 can be gradually increased. Conversely, when the OCT conduit moves along the direction in which the thickness of the wedge-shaped air gap 130 gradually decreases, the thickness of the air gap 130 can be gradually decreased.

[0130] It is understood that, in the above steps, if it is necessary to adjust the relative position of the OCT conduit and the first planar crystal 110 in the vertical direction, it can be achieved by operating the relative vertical movement between the first frame 331 and the second frame 332.

[0131] If it is necessary to adjust the relative position of the OCT catheter and the first planar crystal 110 in the longitudinal and / or transverse directions, it can be achieved by operating the relative movement between the third frame 321 and the fourth frame 322 in the suspension 320, and / or the relative movement between the fifth frame 341 and the sixth frame 342 in the adjustment frame 340.

[0132] By performing the operations described above, it can be ensured that the relative position between the OCT conduit and the first planar flat crystal 110 is more accurate to meet the testing requirements. This confirms that the testing device and the OCT conduit are properly assembled and that the light-emitting surface of the OCT conduit is aligned with the thickness of the air gap 130 to be measured.

[0133] Next, step S300 is executed: the OCT catheter is opened, and the polar coordinate display diagram of the XZ plane scan is obtained.

[0134] In this embodiment, after ensuring the testing device is properly assembled as described above, and adjusting the air gap 130 between the first planar flat crystal 110 and the second planar flat crystal 120 to the target-to-measure spatial gap thickness, the OCT conduit can be opened directly or automatically through, for example, a preset program of the control device 600. The OCT conduit emits light through its light-emitting surface toward the first planar flat crystal 110, the air gap 130, and the second planar flat crystal 120 to form the desired scanning image.

[0135] Based on existing technology, the control device 600 and the display module will automatically generate and display the scanned image.

[0136] In one specific embodiment, the scanned image can be directly set as a polar coordinate graph of Bscan (i.e., a polar coordinate display graph of the XZ plane scan). In this way, the operation of step S400 below can be directly continued based on this Bscan.

[0137] Alternatively, in another specific embodiment, upon activation of the OCT catheter, the control device 600 and display module first generate and display other scan images. These other scan images can be, but are not limited to, other coordinate graphs from Bscan. Or, as... Figure 9 The original scan image shown.

[0138] At this point, an additional step is required: converting other scanned images, such as the original scanned image. This conversion process yields an image like... Figures 10 to 11 The polar coordinates of Bscan are shown below.

[0139] Next, step S400 is executed: the feature pixel point with the strongest signal on the surface of the first plane flat crystal 110 is found from the polar coordinate display diagram of the XZ plane scan.

[0140] In this embodiment, several feature regions can be easily identified from the polar coordinate plot of Bscan. For example... Figure 11 As indicated by the circled markings, the first signal region located on the surface of the first plane flat crystal 110 can be found from the polar coordinate diagram of Bscan. The second signal region located throughout the entire air gap 130 can also be found from the polar coordinate diagram of Bscan.

[0141] For example Figure 11 As shown, the first signal region and the second signal region are generally located within the same linear region. For example, approximately located within... Figure 11 In the same horizontal axis direction shown.

[0142] Next, please combine Figure 12 We can find the pixel with the strongest signal intensity from the first signal region and use that pixel as the feature pixel.

[0143] Next, step S500 is executed: the polar coordinate display map of the XZ plane scan is converted into an XY plane scan display map, and the y coordinate value of the feature pixel is obtained from the XY plane scan display map as the feature value.

[0144] In this embodiment, firstly, using existing technology, the polar coordinate graph of Bscan is converted into an Ascan graph (i.e., an XY plane scan display graph). Then, as... Figure 13 As shown, the feature pixels identified in the preceding steps are located in the Ascan image. Basic information about these feature pixels is then read from the Ascan image.

[0145] The specific content of this basic information can be adjusted according to actual needs. For example, for feature pixels, the basic information should at least include their y-coordinate value in the Ascan image. Figure 13 As shown, the y-coordinate of the feature pixel is 376. This y-coordinate value, 376, can then be used as the feature value in the following embodiments.

[0146] Furthermore, optionally, depending on actual needs, the basic information of the feature pixels can also include their x-coordinate value in the Ascan image. For example... Figure 13 As shown, the x-coordinate of the feature pixel is 233.

[0147] Furthermore, the basic information of feature pixels can also include their signal strength values ​​in the Ascan image. For example... Figure 13 As shown, the signal strength value of the feature pixel is 30.

[0148] Next, step S600 is executed: according to the feature value, the first pixel point located at the signal peak on the surface of the first planar flat crystal 110 in the air gap 130, the second pixel point located at the signal peak on the surface of the second planar plane, and the third pixel point located at the signal valley between the two signal peaks are respectively found from the XY plane scan display image.

[0149] In this embodiment, as Figures 14 to 16 As shown, based on the eigenvalue 376, the second signal region can be found from the Ascan plot: and as... Figure 14 As shown, the first pixel is located at the signal peak (i.e., the highest signal strength) on the surface of the first planar flat crystal 110; as Figure 15 As shown, the second pixel is located at the signal peak (i.e., the highest signal strength) on the surface of the second planar flat crystal 120; and as shown... Figure 16 As shown, the third pixel is located at the valley (i.e., the lowest signal strength value) between the two signal peaks mentioned above.

[0150] Obviously, signal peak and signal valley values ​​are relatively extreme values, making them easier to determine and select, which in turn helps to improve the operability, accuracy and objectivity of step S600.

[0151] Next, step S700 is executed: the first signal strength value of the first pixel, the second signal strength value of the second pixel, and the third signal strength value of the third pixel are obtained respectively.

[0152] In this embodiment, similarly to the above, it is possible to... Figure 14 The basic information of the first pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 14 As shown, the x-coordinate of the first pixel is 533. And the first signal strength value of the first pixel in the Ascan image. For example... Figure 14 As shown, the first signal strength value of the first pixel is 14.

[0153] From Figure 15 The basic information of the second pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 15 As shown, the x-coordinate of the second pixel is 539. And the second signal strength value of the second pixel in the Ascan image. For example... Figure 15 As shown, the second signal strength value of the second pixel is 13.

[0154] From Figure 16The basic information of the third pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 16 As shown, the x-coordinate of the third pixel is 536. And the third pixel's signal strength value in the Ascan image. For example... Figure 16 As shown in the figure, the third signal strength value of the third pixel is 2.

[0155] Next, step S800 is executed: the smaller of the first signal strength value and the second signal strength value is compared with the ratio between the smaller value and the third signal strength value and the threshold of the Rayleigh criterion.

[0156] In this embodiment, the first signal strength value is first compared with the second signal strength value. For example, the first signal strength value 14 is compared with the second signal strength value 13. The smaller value, 13, is obtained.

[0157] Next, the ratio between the smaller value 13 and the aforementioned third signal strength value 2 is obtained as 13:2.

[0158] According to the query, the threshold of the Rayleigh criterion is 1:0.735.

[0159] Next, step S900 is executed: if the ratio is not less than the threshold of the Rayleigh criterion, the thickness of the corresponding air gap 130 is confirmed to be valid.

[0160] In this embodiment, since the calculated ratio 13:2 is greater than the Rayleigh criterion threshold of 1:0.735, the thickness of the air gap 130 can be determined to be effective and can constitute an effective air gap 130 thickness.

[0161] Of course, in other embodiments, for example Figures 17 to 23 As shown, Figure 17 The original scan image was obtained as shown, and then... Figure 18 As shown, the first signal region located on the surface of the first plane flat crystal 110 and the second signal region located throughout the air gap 130 are found from the polar coordinate diagram of Bscan.

[0162] For example Figure 19 As shown, the pixel with the strongest signal strength can be found from the first signal region and designated as the feature pixel. Furthermore, after converting the Bscan polar coordinate map to an Ascan map, this feature pixel is located within the Ascan map. Basic information about this feature pixel is then obtained, such as... Figure 19As shown, the y-coordinate of the feature pixel is 473. This y-coordinate value, 473, can then be used as the feature value in the following embodiment. The x-coordinate of the feature pixel is 290. The signal strength value of the feature pixel is 59.

[0163] like Figures 20 to 23 As shown, based on the eigenvalue 473, the second signal region can be found from the Ascan plot: and as... Figure 20 As shown, the first pixel is located at the signal peak (i.e., the highest signal strength) on the surface of the first planar flat crystal 110; as Figure 21 As shown, the second pixel is located at the signal peak (i.e., the highest signal strength) on the surface of the second planar flat crystal 120; and as shown... Figures 22 to 23 As shown, the third pixel is located at the valley (i.e., the lowest signal strength) between the two signal peaks mentioned above. In this embodiment, there are two third pixels.

[0164] From Figure 20 The basic information of the first pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 20 As shown, the x-coordinate of the first pixel is 592. Furthermore, the first signal strength value of this first pixel in the Ascan image is 21.

[0165] From Figure 21 The basic information of the second pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 21 As shown, the x-coordinate of the second pixel is 595. Furthermore, the second signal strength value of this second pixel in the Ascan image is 19.

[0166] From Figures 22 to 23 The basic information of the third pixel is obtained from the image. This basic information may include, but is not limited to, its x-coordinate value in the Ascan image. For example... Figure 22 As shown, the x-coordinate of one of the third pixels is 593. Furthermore, the third signal strength value of this third pixel in the Ascan image is 17. Another third pixel is shown... Figure 23 As shown, the x-coordinate of the third pixel is 594. Furthermore, the third signal strength value of this third pixel in the Ascan image is 17.

[0167] First, compare the first signal strength value with the second signal strength value. For example, compare the first signal strength value 21 with the second signal strength value 19. The smaller value, 19, is obtained.

[0168] Next, the ratio between the smaller value 19 and the aforementioned third signal strength value 17 is obtained as 19:17.

[0169] According to the query, the threshold of the Rayleigh criterion is 1:0.735.

[0170] Since the ratio 19:17 obtained from the above calculation is less than the Rayleigh criterion threshold of 1:0.735, it can be determined that the thickness of the air gap 130 is invalid and cannot constitute a valid air gap 130 thickness.

[0171] In the technical solution provided by the present invention, the test fixture used is composed of a first planar flat crystal 110 and a second planar flat crystal 120, and the processing technology is simpler and easier to obtain.

[0172] Since the surface of the planar flat crystal itself has high flatness, the test method provided in this application can rely on only the AScan (XY plane scan display) with the strongest signal when determining whether the 130mm air gap thickness is effective, without the need for manual selection of AScan, thus effectively avoiding human error.

[0173] When judging the thickness of a small air gap 130, the test method provided in this application can at least choose between two conclusions: being able to distinguish one pixel of air gap 130 and not being able to distinguish air gap 130 at all. This makes the judgment result more accurate and objective.

[0174] Step A100 above pertains to the validity determination of each test value. It also explains, from the perspective of the testing device, how to implement the switching operation for each test value.

[0175] Therefore, the switching order of the various acquired test values ​​is not restricted in this application: For example, step A200 includes: Step A210: Select one from the values ​​to be measured as the first value to be measured, and perform the determination of the effectiveness of the air gap 130 thickness based on the first value to be measured; Step A220: If the ratio is not less than the threshold of the Rayleigh criterion, confirm that the current corresponding air gap 130 thickness is valid and count it as a valid air gap 130 thickness. Continue to select one from the remaining test values ​​as the new first test value. Step A230: If the ratio is less than the threshold of the Rayleigh criterion, the corresponding air gap thickness of 130 is confirmed to be invalid. The remaining test values ​​that are less than the first test value are removed, and one of the remaining test values ​​that are greater than the first test value is selected as the new first test value. Step A240: Based on the new first test value, continue to perform the determination operation of the validity of the air gap 130 thickness until all valid air gap 130 thicknesses are obtained.

[0176] In this embodiment, all the test values ​​can be pre-sorted in order of size, for example. Then, step A200 is executed sequentially from smallest to largest or from largest to smallest. That is, the smallest test value can be used as the first test value, and then the remaining test values ​​are selected sequentially in ascending order. Alternatively, the largest test value can be used as the first test value, and then the remaining test values ​​are selected sequentially in descending order.

[0177] Of course, depending on the actual needs, step A200 can also be executed starting from one of the values ​​to be tested. For example, starting from the median of the values ​​to be tested, this can be taken as the first value to be tested, and step A210 can be executed on this first value to be tested.

[0178] If the situation meets the requirements of step A220, then two new first test values ​​are selected from the vicinity of the original first test value. One of the two new first test values ​​is greater than the original first test value, and the other is less than the original second test value. Then, step A210 is repeated.

[0179] Conversely, if the situation meets the requirements of step A230, a new first test value is selected from the nearest neighbor to the original first test value. This new first test value must be greater than the original first test value. Then, step A210 is repeated.

[0180] Next, step A300 is performed: the minimum air gap 130 thickness is determined from the effective air gap 130 thicknesses, and the axial resolution is calculated based on the minimum air gap 130 thickness.

[0181] In this embodiment, once all effective air gap 130 thicknesses are determined, the minimum air gap 130 thickness can be obtained very easily. Then, the following axial resolution calculation steps are performed on this minimum air gap 130 thickness: Step B100: Obtain the physical thickness and group refractive index of the first planar flat crystal 110; Step B200: Obtain the group refractive index of a preset tissue within the OCT imaging device; Step B300: Obtain the x-coordinate values ​​of the feature pixel point, the first pixel point, the second pixel point, and the third pixel point corresponding to the minimum air gap 130 thickness from the XY plane scan display image, and calculate the number of pixels corresponding to the thickness of the first plane flat crystal 110 and the number of pixels corresponding to the minimum air gap 130 thickness. Step B1400: Calculate the axial resolution using the following formula: ; Where Rz is the axial resolution, Lg is the physical thickness of the first planar flat crystal 110, Pa is the number of pixels corresponding to the minimum air gap 130 thickness, Pg is the number of pixels corresponding to the thickness of the first planar flat crystal 110, ng is the group refractive index of the first planar flat crystal 110, and nt is the group refractive index of the preset tissue in the OCT imaging device.

[0182] Specifically, as Figures 9 to 16 For example, the physical thickness Lg of the first planar optical disc 110 can be obtained by measurement, for example, 2035.50 μm. The minimum air gap thickness 130 corresponds to a pixel count Pa of 5. The pixel count Pg corresponding to the thickness of the first planar optical disc 110 is 300. The first planar optical disc 110 is made of H-K9L material, and its tissue group refractive index ng is, for example, 1.51685. The group refractive index nt of the preset tissue in the OCT imaging device is 1.449.

[0183] Therefore, according to the formula described above, the result can be calculated. Figures 9 to 16 The effective example shown corresponds to an axial resolution Rz of 35.51um.

[0184] It should be noted that the above method can be implemented by first finding the effective and smallest air gap thickness of 130, and then calculating the axial resolution for that effective and smallest air gap thickness of 130. Alternatively, after determining that the air gap thickness of 130 is effective, the axial resolution can be calculated randomly for that effective air gap thickness of 130. Then, the steps are repeated to find the smallest air gap thickness of 130, and finally the axial resolution corresponding to the effective and smallest air gap thickness of 130 is obtained.

[0185] In other words, the above steps in this application do not constitute a restriction on the order of operations. Where permitted, the order of some steps may be appropriately changed according to actual needs.

[0186] The above description is only a preferred embodiment of the present invention and does not limit the patent scope of the present invention. All equivalent structural transformations made under the inventive concept of the present invention using the contents of the present invention specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A testing method for an OCT imaging device, characterized in that, The method includes a determination of the effectiveness of the air gap thickness, wherein the determination of the effectiveness of the air gap thickness includes: Provides a first planar optical disc, a second planar optical disc, and an OCT conduit; The orientations of the first planar crystal, the second planar crystal, and the OCT conduit are adjusted to form the air gap thickness to be measured; Open the OCT catheter and obtain a polar coordinate display image of the XZ plane scan; Find the feature pixel with the strongest signal on the first plane flat surface from the polar coordinate display diagram of the XZ plane scan; The polar coordinate display map of the XZ plane scan is converted into an XY plane scan display map, and the y coordinate value of the feature pixel is obtained from the XY plane scan map as the feature value; According to the feature values, find the first pixel point located in the air gap at the signal peak on the first plane flat surface, the second pixel point located at the signal peak on the second plane plane surface, and the third pixel point located at the signal valley between the two signal peaks from the XY plane scan display image. The first signal strength value of the first pixel, the second signal strength value of the second pixel, and the third signal strength value of the third pixel are obtained respectively. The smaller of the first signal strength value and the second signal strength value, and the ratio between the smaller value and the third signal strength value, are compared with the threshold of the Rayleigh criterion; If the ratio is not less than the threshold of the Rayleigh criterion, the current corresponding air gap thickness is confirmed to be valid.

2. The testing method for the OCT imaging device as described in claim 1, characterized in that, The step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal and the second planar flat crystal are arranged at least partially at intervals to define air gaps at the intervals; The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. Adjust at least one of the first planar flat crystal, the second planar flat crystal, and the OCT conduit until the air gap thickness at the light-emitting area of ​​the OCT conduit meets the preset test value, thus forming the air gap thickness to be measured.

3. The testing method for the OCT imaging device as described in claim 1, characterized in that, The step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal and the second planar flat crystal are arranged facing each other at intervals to define an air gap of uniform thickness at the intervals. The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. At least one of the first planar flat crystal and the second planar flat crystal is moved closer to or further away from the other until the air gap thickness at the light emission area of ​​the OCT conduit meets the preset test value, thus forming the air gap thickness to be measured.

4. The testing method for the OCT imaging device as described in claim 1, characterized in that, The step of adjusting the orientation of the first planar crystal, the second planar crystal, and the OCT conduit to form the air gap thickness to be measured includes: The first planar flat crystal is arranged at an angle relative to the second planar flat crystal to define air gaps of varying thicknesses at the intervals. The OCT conduit is placed on the side of the first planar flat crystal that is opposite to the second planar flat crystal, and the light-emitting surface of the OCT conduit is adjusted to face the surface of the first planar flat crystal. The OCT guide tube is moved along the surface of the first planar flat crystal until the air gap thickness at the light emission area of ​​the OCT guide tube meets the preset measurement value, thus forming the air gap thickness to be measured.

5. The testing method for the OCT imaging device as described in claim 1, characterized in that, The steps of opening the OCT catheter and obtaining the polar coordinate display image of the corresponding XZ plane scan include: Open the OCT catheter and obtain the corresponding raw scan image; The original scan image is converted to obtain a polar coordinate display image of the XZ plane scan.

6. The test method for the OCT imaging device as described in any one of claims 1 to 5, characterized in that, Also includes: Obtain multiple measured values ​​of the air gap thickness; The validity determination operation of the air gap thickness is performed sequentially according to each of the measured values, and multiple valid air gap thicknesses are obtained; The minimum air gap thickness is determined from the effective air gap thicknesses, and the axial resolution is calculated based on the minimum air gap thickness.

7. The testing method for the OCT imaging device as described in claim 6, characterized in that, The step of sequentially performing the determination operation of the validity of the air gap thickness based on each of the measured values, and obtaining multiple valid air gap thicknesses, includes: Select one of the measured values ​​as the first measured value, and perform the determination operation of the effectiveness of the air gap thickness based on the first measured value; If the ratio is not less than the threshold of the Rayleigh criterion, the current corresponding air gap thickness is confirmed to be valid and counted as a valid air gap thickness. Then, one of the remaining test values ​​is selected as the new first test value. If the ratio is less than the threshold of the Rayleigh criterion, the corresponding air gap thickness is confirmed to be invalid. The remaining test values ​​that are less than the first test value are removed, and one of the remaining test values ​​that are greater than the first test value is selected as the new first test value. Based on the new first test value, continue to perform the determination operation of the validity of the air gap thickness until all valid air gap thicknesses are obtained.

8. The testing method for the OCT imaging device as described in claim 6, characterized in that, The calculation steps for the axial resolution include: Obtain the physical thickness and group refractive index of the first planar flat crystal; Obtain the group refractive index of a preset tissue within an OCT imaging device; The x-coordinate values ​​of the feature pixel, the first pixel, the second pixel, and the third pixel corresponding to the minimum air gap thickness are obtained from the XY plane scan display image, and the number of pixels corresponding to the first plane flat crystal thickness and the number of pixels corresponding to the minimum air gap thickness are calculated. The axial resolution is calculated using the following formula: ; Wherein, Rz is the axial resolution, Lg is the physical thickness of the first planar flat crystal, Pa is the number of pixels corresponding to the minimum air gap thickness, Pg is the number of pixels corresponding to the thickness of the first planar flat crystal, ng is the group refractive index of the first planar flat crystal, and nt is the group refractive index of the preset tissue in the OCT imaging device.

9. A control device, characterized in that, The device includes a memory, a processor, and a test program for an OCT imaging device stored in the memory and executable on the processor, the test program for the OCT imaging device being configured to implement the steps of the test method for the OCT imaging device as claimed in any one of claims 1 to 8.

10. A testing system for an OCT imaging device, characterized in that, include: OCT imaging equipment includes an OCT conduit, wherein the OCT conduit is provided with a light-emitting window, and the plane in which the light-emitting window is located constitutes a light-emitting surface; The testing apparatus includes a first planar optical flat and a second planar optical flat; and, The control device as described in claim 9 is electrically connected to the OCT conduit.

11. The testing system for the OCT imaging device as described in claim 10, characterized in that, At least one of the OCT conduit, the first planar flat crystal, and the second planar flat crystal is movable relative to the remaining two, such that, during its movement, the thickness of the air gap located between the first planar flat crystal and the second planar flat crystal at the light-emitting region corresponding to the OCT conduit is adjustable.

12. The testing system for the OCT imaging device as described in claim 10, characterized in that, The testing system of the OCT imaging device also includes a display module, which is electrically connected to the control device to display preset images related to the test program of the OCT imaging device.

13. A storage medium, characterized in that, The storage medium stores a test program for an OCT imaging device, which, when executed by a processor, implements the steps of the test method for the OCT imaging device as described in any one of claims 1 to 8.

Citation Information

Patent Citations

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    CN106880340A