Time delay test analysis method for A664 photoelectric converter
By constructing a self-loop test environment and conducting overall delay testing, and using the A664 opto-converter test equipment and an oscilloscope to measure the delay of the opto-converter, the accuracy problem of opto-interface delay testing was solved, achieving high-precision delay testing and structural integrity.
Patent Information
- Application Number
- CN202511965872.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-24
- Publication Date
- 2026-04-14
AI Technical Summary
Existing testing equipment cannot directly test the time delay between the optical and electrical interfaces of the A664 opto-converter, and it is difficult to achieve nanosecond-level testing accuracy. Furthermore, existing equipment cannot perform testing without altering the physical state of the device under test.
A self-loop test environment was constructed using an A664 optoelectronic converter test device and an oscilloscope. Data with nanosecond-level precision was obtained through the oscilloscope probes to measure the transmit and receive delay of the test device itself, and the data delay of the optoelectronic interface was calculated in the overall delay test environment.
High-precision delay testing between optoelectronic interfaces was achieved, ensuring the physical structural integrity of the device under test, improving testing accuracy, and providing accurate delay data for deterministic analysis of A664 networks.
Smart Images
Figure CN121864647A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of computer communication technology, and specifically to a delay test and analysis method for an A664 optoelectronic converter. Background Technology
[0002] The A664 opto-converter provides two 100Mbps optical interfaces and two 100Mbps electrical interfaces, enabling signal switching between the optical and electrical interfaces of the A664 device.
[0003] The A664 network is mainly used in civil aircraft. In order to ensure the determinism of the A664 network latency and accurately assess the latency of optical interface devices after they are connected to the A664 electrical interface network, it is necessary to conduct nanosecond-level testing and analysis on the latency of the A664 optoelectronic converter.
[0004] Because of the different physical media of an optical interface and an electrical interface, existing test equipment cannot directly test the latency between the two interfaces, and existing latency test boards or equipment are insufficient to meet the requirements for nanosecond-level latency testing. Therefore, there is an urgent need for a high-precision latency testing method that supports both optical and electrical interfaces, can measure the latency of the test equipment itself, and does not alter the physical state of the A664 opto-converter under test. Summary of the Invention
[0005] In view of this, embodiments of this application provide a delay test and analysis method for an A664 optoelectronic converter, so as to accurately test the data delay of the optoelectronic converter without damaging it.
[0006] This application provides the following technical solution: a time delay test and analysis method for an A664 opto-converter, used in a time delay test system for an A664 opto-converter, the time delay test system including an A664 opto-converter test device, an A664 opto-converter under test, and an oscilloscope; The A664 optoelectronic converter test equipment includes a test terminal system that supports the transmission and reception of A664 network data. It provides two 100Mbps Ethernet ports, A1 and A2. The test terminal system includes a transmit signal trigger test point and a receive signal trigger test point. These two test points are connected to two ports of an oscilloscope via oscilloscope probes to obtain nanosecond-level precision data on the trigger time of the two signals using the oscilloscope. The A664 photoelectric converter under test has two 100Mbps electrical ports: electrical port 1 and electrical port 2, and two 100Mbps optical ports: optical port 1 and optical port 2. The latency test and analysis method includes: S1. Interconnect the test terminal system electrical ports A1 and A2 of the A664 opto-converter test equipment to construct a self-loop test environment for the test equipment. Data is sent through the test terminal system via port A1 and received via port A2. The two probes of the oscilloscope are simultaneously pressed to trigger the test point for the transmitted signal and the test point for the received signal to obtain the transmit and receive delay Δt1 of the test equipment itself. After the test is completed, the interconnection between port A1 and port A2 is canceled. S2. Loop-connect optical ports 1 and 2 of the A664 opto-converter under test to establish an overall delay test environment for the A664 opto-converter. The delay Δt2 between electrical port A1 and electrical port A2 in the test terminal system is calculated by measuring the delay between electrical port to optical port and optical port to electrical port. S3. Based on the transmit / receive delay △t1 of the test device itself and the delay △t2, calculate the data delay of the photoelectric interface in the A664 photoelectric converter under test.
[0007] According to one embodiment of this application, in step S3, the data delay of the photoelectric conversion interface in the A664 photoelectric converter under test is specifically: △T = (△t2 - △t1) / 2; △T is the delay of the electrical port to optical port or optical port to electrical port conversion of the A664 photoelectric converter.
[0008] According to one embodiment of this application, the latency testing system further includes a debugging computer, which runs A664 terminal system application software, provides A664 network data sending and receiving functions, and performs serial port control and viewing of the test terminal system status of the A664 optoelectronic converter test equipment through the debugging serial port.
[0009] According to one embodiment of this application, the debugging computer is connected to the debugging serial port of the A664 optoelectronic converter test device via a serial cable, and the debugging serial port supports the debugging and operation of the test terminal system.
[0010] According to one embodiment of this application, in the delay test system, the power supply of the A664 opto-converter test equipment is connected to the A664 opto-converter under test, so as to provide convenient power excitation to the A664 opto-converter under test directly through the test equipment.
[0011] According to one embodiment of this application, the electrical port 1 of the A664 opto-converter under test is connected to the electrical port A1 of the test system, and the electrical port 2 of the A664 opto-converter under test is connected to the electrical port A2 of the test system via Ethernet cables.
[0012] According to one embodiment of this application, the optical port 1 and optical port 2 of the A664 photoelectric converter under test are connected in a loop via an optical jumper.
[0013] Compared with the prior art, the beneficial effects achieved by at least one of the above-mentioned technical solutions adopted in the embodiments of this specification include at least the following: the embodiments of the present invention solve the problem of latency testing between optical and electrical interfaces, ensuring no physical changes to the device under test (DUT), ensuring the physical structural integrity of the A664 opto-converter of the DUT, and enabling simultaneous latency testing of both the test device and the DUT. With a minimized test device architecture design, the accuracy of the opto-conversion latency test is significantly improved, providing accurate latency data for deterministic analysis of A664 networks. Attached Figure Description
[0014] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0015] Figure 1 This is the architecture of the A664 photoelectric converter delay test system according to an embodiment of the present invention; Figure 2 This is the connection architecture for self-loopback testing of the test equipment according to an embodiment of the present invention; Figure 3 This is the connection architecture for overall latency testing of the A664 optoelectronic converter according to an embodiment of the present invention. Detailed Implementation
[0016] The embodiments of this application will now be described in detail with reference to the accompanying drawings.
[0017] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. This application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0018] like Figure 1As shown, this embodiment of the invention provides a delay test and analysis method for an A664 optoelectronic converter, used in a delay test system for an A664 optoelectronic converter. The delay test system includes an A664 optoelectronic converter test device, an A664 optoelectronic converter under test, and an oscilloscope. The A664 optoelectronic converter test equipment includes a test terminal system that supports the transmission and reception of A664 network data. It provides two 100Mbps Ethernet ports, A1 and A2. The test terminal system includes a transmit signal trigger test point and a receive signal trigger test point. These two test points are connected to two ports of an oscilloscope via oscilloscope probes to obtain nanosecond-level precision data on the trigger time of the two signals using the oscilloscope. The A664 photoelectric converter under test has two 100Mbps electrical ports: electrical port 1 and electrical port 2, and two 100Mbps optical ports: optical port 1 and optical port 2. The latency test and analysis method includes: S1. Interconnect the test terminal system electrical ports A1 and A2 of the A664 opto-converter test equipment to construct a self-loop test environment for the test equipment. Data is sent through the test terminal system via port A1 and received via port A2. The two probes of the oscilloscope are simultaneously pressed to trigger the test point for the transmitted signal and the test point for the received signal to obtain the transmit and receive delay Δt1 of the test equipment itself. After the test is completed, the interconnection between port A1 and port A2 is canceled. S2. Loop-connect optical ports 1 and 2 of the A664 opto-converter under test to establish an overall delay test environment for the A664 opto-converter. The delay Δt2 between electrical port A1 and electrical port A2 in the test terminal system is calculated by measuring the delay between electrical port to optical port and optical port to electrical port. S3. Based on the transmit / receive delay △t1 of the test device itself and the delay △t2, calculate the data delay of the photoelectric interface in the A664 photoelectric converter under test.
[0019] This method analyzes the A664 optocoupler, constructs a delay test environment for the A664 optocoupler, and measures the transmit / receive delay introduced by the test equipment through a loopback test environment. Using the overall delay test environment of the A664 optocoupler, the nanosecond-level delays of the electrical-to-optical and optical-to-electrical conversions are measured and analyzed. This method ensures no physical alteration to the device under test (DUT) and maintains the physical structural integrity of the A664 optocoupler. With a minimized test equipment architecture design, it significantly improves the accuracy of photoelectric conversion delay testing.
[0020] In this embodiment, the A664 opto-converter delay test environment consists of an A664 opto-converter test device, an A664 opto-converter (device under test), an oscilloscope, a debugging computer, and connecting cables, as shown in the diagram. Figure 1 As shown.
[0021] To eliminate the impact of data transmission and reception delays inherent in the testing equipment itself, this embodiment of the invention constructs a loopback testing environment for the testing equipment (such as...). Figure 2 As shown in the figure, the transmission and reception delay of the measurement and testing equipment itself is measured.
[0022] Connect the two optical ports of the optoelectronic converter in a loop to establish an overall delay test environment for the A664 optoelectronic converter (e.g., ...). Figure 3 As shown in the figure, the delay of the A664 optoelectronic converter from electrical port to optical port and from optical port to electrical port is calculated by measuring the delay of the test device A1 sending to A2 receiving.
[0023] According to some embodiments of the present invention, in specific implementation, this method includes the following: The first step involves configuring the A664 optoelectronic converter delay test environment, which consists of the A664 optoelectronic converter test equipment, the A664 optoelectronic converter (DUT), an oscilloscope, a debugging computer, and connecting cables. See [link to test environment details]. Figure 1 ,in: A664 Photoconverter Test Equipment: Provides various interfaces for testing the A664 photoconverter, including: Test terminal system: An A664 terminal system with dual-redundant communication ports, supporting A664 network data transmission and reception functions, providing two 100Mbps Ethernet ports A1 and A2; Send signal to trigger test point: the transmit enable signal TXEN of port 1 of the test terminal system; Received signal triggers test point: Receive valid signal RXDV at port 2 of the test terminal system; One power supply provides convenient power excitation for the A664 opto-converter (device under test); 1-channel debug serial port: Supports debugging and running of the test system.
[0024] A664 Optical Transducer (DUT): The device under test has two 100Mbps electrical ports: Electrical 1 and Electrical 2, and two 100Mbps optical ports: Optical Port 1 and Optical Port 2; Oscilloscope: The two ports are connected to the transmit signal trigger test point and the receive signal trigger test point respectively through the oscilloscope probes to obtain nanosecond-level precision data for the trigger time of the two signals; Debugging computer: Run the A664 terminal system application software, which provides A664 network data sending and receiving functions, and manages and views the status of the test terminal system through the debugging serial port; Connecting cables: including oscilloscope probes for connecting the oscilloscope to the two signals, serial port cable for the test system, Ethernet cable, optical jumper cable, etc. The oscilloscope is connected to the transmit signal trigger test point and the receive signal trigger test point through the oscilloscope probes. The debugging computer is connected to the debugging serial port through the serial cable. The power supply is connected to the A664 opto-converter under test, forming the A664 opto-converter delay test environment.
[0025] The second step, to eliminate the impact of the test equipment's own data transmission and reception latency, is to construct a loopback test environment for the test equipment and measure the transmission and reception latency of the test equipment itself: Construct a self-loopback test environment for the test equipment, such as Figure 2 As shown, the test terminal system's A1 port and A2 port are interconnected; The test system A1 sends data and A2 receives data. The two probes of the oscilloscope simultaneously send and receive test points to obtain the transmission and reception delay Δt1 of the test equipment itself.
[0026] The third step is to connect the two optical ports of the optoelectronic converter in a loop to establish an overall delay test environment for the A664 optoelectronic converter. By measuring the delay of the signal sent from test device A1 to the receiver at A2, the delays for electrical port to optical port and optical port to electrical port are calculated. The electrical interface 1 of the photoelectric transceiver of the device under test (DUT) is connected to test system A1, and the electrical interface 2 is connected to test system A2 via Ethernet cables. The optical interfaces 1 and 2 of the DUT's photoelectric transceiver are connected via optical patch cables. See [link / details]. Figure 3 ; Test equipment A1 sends data and A2 receives data. The two probes of the oscilloscope are simultaneously placed at the sending and receiving test points to obtain the delay Δt2 from the sending from test equipment A1 to the receiving from test equipment A2. Considering the short cable length, the time delay introduced by the cable is negligible. The total delay for data entering from the electrical interface 1 of the A664 photoelectric converter, exiting to optical interface 1, then via optical interface 1 and optical interface 2, optical interface 2 to electrical interface 2, and finally transmitted via electrical interface 2 is as follows: △t = △t2 - △t1; Considering the relatively fast conversion rates between electrical and optical ports, the delay of the A664 optoelectronic converter from electrical to optical and from optical to electrical ports is approximately equal to half of the total delay. △Telectric to light conversion ≈ △Tlight to electricity conversion ≈ △t / 2 = (△t2 - △t1) / 2.
[0027] This invention constructs a latency test environment for the A664 optoelectronic converter. Through a loopback test environment, the transmit / receive latency introduced by the test equipment is measured. Using this overall latency test environment, the nanosecond-level latency of the A664 optoelectronic converter's electrical-to-optical and optical-to-electrical conversions is tested and analyzed. This method ensures no physical alteration to the device under test (DUT), maintains the physical structural integrity of the A664 optoelectronic converter, and significantly improves the accuracy of optical-to-electrical conversion latency testing with a minimized test equipment architecture, providing accurate latency data for deterministic analysis of A664 networks.
[0028] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.
Claims
1. A delay test and analysis method for an A664 optoelectronic converter, used in a delay test system for an A664 optoelectronic converter, characterized in that, The time delay testing system includes an A664 opto-converter testing device, an A664 opto-converter under test, and an oscilloscope; The A664 optoelectronic converter test equipment includes a test terminal system that supports the transmission and reception of A664 network data. It provides two 100Mbps Ethernet ports, A1 and A2. The test terminal system includes a transmit signal trigger test point and a receive signal trigger test point. These two test points are connected to two ports of an oscilloscope via oscilloscope probes to obtain nanosecond-level precision data on the trigger time of the two signals using the oscilloscope. The A664 photoelectric converter under test has two 100Mbps electrical ports: electrical port 1 and electrical port 2, and two 100Mbps optical ports: optical port 1 and optical port 2. The latency test and analysis method includes: S1. Interconnect the test terminal system electrical ports A1 and A2 of the A664 opto-converter test equipment to construct a self-loop test environment for the test equipment. Data is sent through the test terminal system via port A1 and received via port A2. The two probes of the oscilloscope are simultaneously pressed to trigger the test point for the transmitted signal and the test point for the received signal to obtain the transmit and receive delay Δt1 of the test equipment itself. After the test is completed, the interconnection between port A1 and port A2 is canceled. S2. Loop-connect optical ports 1 and 2 of the A664 opto-converter under test to establish an overall delay test environment for the A664 opto-converter. The delay Δt2 between electrical port A1 and electrical port A2 in the test terminal system is calculated by measuring the delay between electrical port to optical port and optical port to electrical port. S3. Based on the transmit / receive delay △t1 of the test device itself and the delay △t2, calculate the data delay of the photoelectric interface in the A664 photoelectric converter under test.
2. The delay test and analysis method for the A664 photoelectric converter according to claim 1, characterized in that, In step S3, the data delay of the photoelectric conversion interface in the A664 photoelectric converter under test is specifically: △T = (△t2 - △t1) / 2; △T is the delay of the electrical port to optical port or optical port to electrical port conversion of the A664 photoelectric converter.
3. The delay test and analysis method for the A664 photoelectric converter according to claim 1, characterized in that, The latency testing system also includes a debugging computer that runs A664 terminal system application software, providing A664 network data sending and receiving functions, and performing serial port control and viewing of the test terminal system status of the A664 optoelectronic converter test equipment through the debugging serial port.
4. The delay test and analysis method for the A664 photoelectric converter according to claim 3, characterized in that, The debugging computer is connected to the debugging serial port of the A664 optoelectronic converter test equipment via a serial cable. The debugging serial port supports the debugging and operation of the test system.
5. The delay test and analysis method for the A664 photoelectric converter according to claim 1, characterized in that, In the delay test system, the power supply of the A664 opto-converter test equipment is connected to the A664 opto-converter under test, so as to provide convenient power excitation to the A664 opto-converter under test directly through the test equipment.
6. The delay test and analysis method for the A664 photoelectric converter according to claim 1, characterized in that, The electrical port 1 of the A664 opto-converter under test is connected to the electrical port A1 of the test system, and the electrical port 2 of the A664 opto-converter under test is connected to the electrical port A2 of the test system via Ethernet cables.
7. The delay test and analysis method for the A664 photoelectric converter according to claim 1, characterized in that, The optical ports 1 and 2 of the A664 photoelectric converter under test are connected in a loop via an optical jumper.