Computer memory bank aging test system

Abstract

The invention relates to the technical field of test equipment, in particular to a computer memory bank aging test system. The invention discloses a computer memory bank aging test system. Compared with the prior art, the computer memory bank aging test system has the beneficial effects that during testing, the clamping force of the clamping plates on the memory bank can be controlled, the clamping effect is guaranteed, meanwhile, damage to the memory bank caused by too large clamping force is avoided, the movement of the memory bank can be well guided, inclination and dislocation of the memory bank are avoided, and the service life of the memory bank is prolonged. According to the invention, the plug-in effect of the memory bank and the socket can be ensured, the force of the memory bank inserted into the socket can be controlled, the plug-in can be ensured, the damage to the memory bank during continuous plug-in after the plug-in can be avoided, the accuracy of the test result can be ensured, the socket can be opened during the test, and the socket can be sealed and protected after the test is completed, so that the test efficiency can be improved. Impurities such as water stains and dust are prevented from falling into the socket, and the service life and the accuracy of test results are ensured.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, specifically to a computer memory module aging test system. Background Technology

[0002] With the advent of big data, the widespread application of computers, and the use of machine automation, computers have a wide range of applications and various operating environments, which place high demands on the stable operation of computers. As one of the essential components of a computer, the stability of the memory module affects the stable operation of the computer, thus requiring the use of specialized memory testing equipment to perform aging tests.

[0003] Existing memory testing equipment requires testers to hold the memory module and insert it into the testing device's slot. This method is prone to causing the memory module to tilt or misalign during insertion, potentially damaging it. Furthermore, the force applied during insertion depends on the tester's control; insufficient force may result in incomplete insertion, while excessive force can also damage the memory module, affecting the accuracy of the test results. Additionally, the slot remains open, allowing dust, water, and other impurities to enter, impacting the memory's lifespan and the accuracy of the test results. Summary of the Invention

[0004] This invention addresses the technical problems existing in the prior art by providing a computer memory module aging test system. Existing memory testing equipment requires testers to manually hold the memory module and insert it into the testing device's slot. This method is prone to tilting and misalignment of the memory module during insertion, easily causing damage. Furthermore, the force applied during insertion depends on the tester's control; insufficient force leads to incomplete insertion, while excessive force damages the memory module, affecting the accuracy of the test results. Additionally, the slot remains open, allowing dust, water, and other impurities to easily enter, impacting the memory's lifespan and the accuracy of the test results.

[0005] The technical solution of the present invention to solve the above-mentioned technical problems is as follows: A computer memory module aging test system includes a test device body and a socket disposed on the top of the test device body. The top of the test device body is connected to a first movable frame through a lifting mechanism, and the lower side wall of the first movable frame is connected to a second movable frame through a first telescopic mechanism. A clamping mechanism for clamping and fixing the memory module is disposed in the second movable frame, and a protective mechanism for sealing and protecting the socket is disposed on the top of the test device body.

[0006] The beneficial effects of this invention are:

[0007] 1) By setting up a clamping mechanism, when the memory module needs to be tested, the memory module is placed in the limiting slot. Then, the second motor is started. The rotation of the second motor drives the rotation of the double-threaded rod with positive and negative threads, thereby causing the two first moving plates to move closer to each other synchronously. The second telescopic component drives the two clamping plates to move closer to each other synchronously. When the clamping plates abut against the memory module, they push the second T-shaped guide rod to move. At the same time, the second spring is compressed, causing the distance between the first and second moving plates to gradually decrease. The distance between the first and second moving plates is detected by the second distance sensor, which detects the compression of the second spring. When the required distance is reached, the second motor stops. This allows for control of the clamping force of the clamping plates on the memory module, ensuring the clamping effect while avoiding excessive clamping force that could damage the memory module, thus ensuring the accuracy of the test results.

[0008] 2) By setting up a moving mechanism, after the memory module is clamped and fixed, the first motor is started. The rotation of the first motor drives the rotation of the threaded rod. When the threaded rod rotates, it drives the first moving frame downward, and through the first telescopic component, it drives the second moving frame downward. This can effectively guide the movement of the memory module, preventing it from tilting or misaligning, ensuring its insertion into the socket, and guaranteeing the accuracy of the test results. Furthermore, when the memory module is inserted into the socket, the first T-shaped guide rod moves upward, the first spring is compressed, and the distance between the first and second moving frames gradually decreases. The first distance sensor detects the distance between the first and second moving frames, i.e., detects the compression of the first spring. When the required distance is reached, the first motor stops. This allows for control of the force required to insert the memory module into the socket, ensuring proper insertion and preventing damage to the memory module when continuing to insert it after it is properly inserted, thus ensuring the accuracy of the test results.

[0009] 3) By setting up protective mechanisms, when the memory module is moved downwards and inserted into the slot, the movement of the first moving frame drives the movement of the push plate. When the push plate abuts against the sealing plate, it pushes the sealing plate towards the support plate. At the same time, the third spring is compressed, exposing the slot and ensuring that the memory module can be inserted normally. After the sealing plate is in place, when the first moving frame continues to move downwards and inserts the memory module into the slot, the fourth T-shaped guide rod can move upwards, causing the fourth spring to contract and ensuring that the memory module can be inserted normally. After the test is completed, the first and second moving frames move upwards to pull the memory module out of the slot. After the push plate separates from the sealing plate, the sealing plate can move back to its original position under the action of the third spring, thereby sealing and protecting the slot and preventing water stains, dust and other impurities from falling into the slot, ensuring its service life and the accuracy of the test results.

[0010] Based on the above technical solution, the present invention can be further improved as follows.

[0011] Furthermore, the lifting mechanism includes a first L-shaped plate and a second L-shaped plate fixedly connected to the top of the test equipment body, and a threaded rod is rotatably connected between the first L-shaped plate and the top of the test equipment body. A first moving block is threadedly connected to the side wall of the threaded rod, and the first moving block is fixed to the side wall of the first moving frame. A fixed rod is fixedly connected between the second L-shaped plate and the top of the test equipment body, and a second moving block is sleeved on the side wall of the fixed rod. The second moving block is fixed to the side wall of the first moving frame. A first motor is fixedly connected to the upper side wall of the first L-shaped plate, and the output end of the first motor is fixed to the upper end of the threaded rod.

[0012] The beneficial effect of adopting the above-mentioned further solution is that when the first motor is started, the rotation of the first motor drives the rotation of the threaded rod. When the threaded rod rotates, it drives the first moving frame to move downward, and drives the second moving frame to move downward through the first telescopic component.

[0013] Furthermore, the first telescopic mechanism includes two symmetrically arranged third moving blocks fixedly connected to the side wall of the second moving frame, and two symmetrically arranged first T-shaped guide rods fixedly connected to the upper side wall of each third moving block. The first T-shaped guide rods are inserted into the upper side wall of the first moving frame, and a first spring is sleeved on the side wall of the first T-shaped guide rod. A first detection component is provided on the lower side wall of the first moving frame.

[0014] The beneficial effect of adopting the above-mentioned further solution is that when the memory module is inserted into the socket, the first T-shaped guide rod moves upward, the first spring is compressed, and at the same time, the distance between the first moving frame and the second moving frame gradually decreases. The first detection component detects the distance between the first moving frame and the second moving frame, that is, detects the compression of the first spring. When the required distance is reached, the first motor stops, thereby controlling the force of inserting the memory module into the socket to ensure that it can be inserted in place. At the same time, it avoids damage to the memory module when continuing to insert it after it is in place, and ensures the accuracy of the test results.

[0015] Furthermore, the first detection component includes a first mounting hole formed in the lower side wall of the first moving frame, a first distance sensor is fixedly inserted in the first mounting hole, and the first motor is electrically connected to the first distance sensor.

[0016] The advantage of adopting the above-mentioned further solution is that it facilitates the detection of the distance between the first moving frame and the second moving frame.

[0017] Furthermore, the clamping mechanism includes two symmetrically arranged first moving plates disposed within the second moving frame, and the first moving plates are connected to the side wall of the second moving frame via a moving mechanism. The opposite side walls of the two first moving plates are connected to two symmetrically arranged second moving plates via a second telescopic mechanism, and the opposite side walls of the two second moving plates are fixedly connected to two symmetrically arranged clamping plates. The opposite side walls of the two clamping plates are provided with two symmetrically arranged limiting grooves, and the side wall of the first moving plate is provided with a second detection component.

[0018] The beneficial effect of adopting the above-mentioned further solution is that when the memory module needs to be tested, the memory module is placed in the limiting slot, and then the two first moving plates move closer to each other synchronously through the moving mechanism, and the two clamping plates move closer to each other synchronously through the second telescopic component, thereby clamping and fixing the memory module.

[0019] Furthermore, the moving mechanism includes a double-threaded rod with positive and negative teeth rotatably connected to the inner side wall of the second moving frame, and a guide rod is fixedly connected to the inner side wall of the second moving frame. A fourth moving block is fixedly connected to the side wall of each of the first moving plates, and the fourth moving block is sleeved on the side wall of the guide rod. A fifth moving block is fixedly connected to the side wall of each of the first moving plates, and the fifth moving block is threadedly connected to the threaded part of the double-threaded rod with positive and negative teeth. A second motor is fixedly connected to the side wall of the second moving frame, and the output end of the second motor is fixed to one end of the double-threaded rod with positive and negative teeth.

[0020] The beneficial effect of adopting the above-mentioned further solution is that when the second motor is started, the rotation of the motor drives the rotation of the double-threaded rod with positive and negative teeth, thereby causing the two first moving plates to move closer to each other synchronously.

[0021] Furthermore, the second telescopic mechanism includes two symmetrically arranged second T-shaped guide rods inserted into the side walls of each of the first movable plates. One end of the second T-shaped guide rod is fixed to the side wall of the second movable plate, and a second spring is sleeved on the side wall of the second T-shaped guide rod.

[0022] The beneficial effect of adopting the above-mentioned further solution is that when the clamping plate abuts against the memory module, it pushes the second T-shaped guide rod to move. At the same time, the second spring is compressed, causing the distance between the first moving plate and the second moving plate to gradually decrease. The distance between the first moving plate and the second moving plate is detected by the second detection component, that is, the compression of the second spring is detected. When the required distance is reached, the second motor stops. This allows for control of the clamping force of the clamping plate on the memory module, ensuring the clamping effect while avoiding excessive clamping force that could damage the memory module, and ensuring the accuracy of the test results.

[0023] Furthermore, the second detection component includes a second mounting hole formed in the side wall of the first moving plate, a second distance sensor is fixedly inserted in the second mounting hole, and the second motor is electrically connected to the second distance sensor.

[0024] The advantage of adopting the above-mentioned further solution is that it facilitates the detection of the distance between the first moving plate and the second moving plate.

[0025] Furthermore, the protective mechanism includes a support plate fixedly connected to the top of the test equipment body, and two symmetrically arranged third T-shaped guide rods are inserted into the side wall of the support plate. A sealing plate is fixedly connected to one end of the third T-shaped guide rod, and a third spring is sleeved on the side wall of the third T-shaped guide rod. The sealing plate slides on the upper side wall of the insertion port, and the movement of the sealing plate is pushed by a pushing mechanism.

[0026] The beneficial effect of adopting the above-mentioned further solution is that when the memory module is moved downward and inserted into the socket, the pushing mechanism pushes the sealing plate to move closer to the support plate. At the same time, the third spring is compressed, exposing the socket and ensuring that the memory module can be inserted normally. After the test is completed, the first and second moving frames move upward, thereby pulling the memory module out of the socket. Furthermore, when the pushing plate separates from the sealing plate, the sealing plate can move and reset under the action of the third spring, thereby sealing and protecting the socket and preventing water stains, dust and other impurities from falling into the socket, ensuring its service life and the accuracy of the test results.

[0027] Furthermore, the pushing mechanism includes an inclined surface set on the top of the sealing plate, and two symmetrically arranged fourth T-shaped guide rods are inserted into the upper side wall of the first moving frame. The lower end of the fourth T-shaped guide rod is fixedly connected to a pushing plate, and the side wall of the pushing plate is provided with rounded corners. The side wall of the fourth T-shaped guide rod is sleeved with a fourth spring, and the pushing plate slides on the inclined surface.

[0028] The beneficial effect of adopting the above-mentioned further solution is that when the memory module is moved downward and inserted into the socket, the movement of the first moving frame drives the movement of the push plate. When the push plate abuts against the sealing plate, it pushes the sealing plate to move closer to the support plate. After the sealing plate is in place, when the first moving frame continues to move downward and drives the memory module into the socket, the fourth T-shaped guide rod can move upward, causing the fourth spring to contract and ensuring that the memory module can be inserted normally. Attached Figure Description

[0029] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0030] Figure 2 This is a three-dimensional structural schematic diagram from another perspective of the present invention;

[0031] Figure 3This is a partial cross-sectional view of the sealing plate in this invention;

[0032] Figure 4 This is a three-dimensional structural diagram of the second movable frame in this invention;

[0033] Figure 5 for Figure 1 Enlarged structural diagram at point A;

[0034] Figure 6 for Figure 2 Enlarged structural diagram at point B;

[0035] Figure 7 for Figure 4 A magnified structural diagram at point C.

[0036] The attached diagram lists the components represented by each number as follows:

[0037] 1. Test equipment body; 101. Socket; 201. First L-shaped plate; 202. Second L-shaped plate; 203. Threaded rod; 204. First moving block; 205. Fixed rod; 206. Second moving block; 207. First motor; 301. First T-shaped guide rod; 302. First spring; 303. Third moving block; 401. First moving plate; 402. Second moving plate; 403. Clamping plate; 404. Limiting groove; 501. Double-ended threaded rod with positive and negative threads; 502. Guide rod; 503. Fourth moving block; 504. 505. Fifth moving block; 601. Second motor; 602. Second T-shaped guide rod; 701. Second spring; 702. First mounting hole; 803. First distance sensor; 804. Second mounting hole; 805. Second distance sensor; 906. Support plate; 907. Third T-shaped guide rod; 908. Sealing plate; 909. Third spring; 1000. Inclined surface; 1001. Fourth T-shaped guide rod; 1002. Push plate; 1003. Rounded corner; 1004. Fourth spring; 11. First moving frame; 12. Second moving frame. Detailed Implementation

[0038] The principles and features of the present invention are described below with reference to the accompanying drawings. The examples given are only for explaining the present invention and are not intended to limit the scope of the present invention.

[0039] With the advent of big data, the widespread application of computers, and the use of machine automation, computers have a wide range of applications and various operating environments, which place high demands on the stable operation of computers. As one of the essential components of a computer, the stability of the memory module affects the stable operation of the computer. Therefore, after the memory module is manufactured, it needs to be tested using specialized memory testing equipment.

[0040] After in-depth investigation and research into the testing process of memory testing equipment, the inventors discovered that existing memory testing equipment requires testers to hold the memory module and insert it into the testing device's slot. This method is prone to causing the memory module to tilt or misalign during insertion, potentially damaging it. Furthermore, the force applied during insertion depends on the tester's control; insufficient force results in incomplete insertion, while excessive force leads to further damage even after proper insertion. This affects the accuracy of the test results. Additionally, the slot remains open, allowing dust, water, and other impurities to enter, impacting the memory's lifespan and the accuracy of the test results. To address these issues, the inventors proposed a computer memory module aging test system.

[0041] The present invention provides the following preferred embodiments.

[0042] like Figures 1-7 As shown, the computer memory module aging test system includes a test device body 1 and a socket 101 located on the top of the test device body 1. A first movable frame 11 is connected to the top of the test device body 1 via a lifting mechanism, and a second movable frame 12 is connected to the lower side wall of the first movable frame 11 via a first telescopic mechanism. A clamping mechanism for clamping and fixing the memory module is provided inside the second movable frame 12, and a protective mechanism for sealing and protecting the socket 101 is provided on the top of the test device body 1. During testing, when the memory module is inserted into the socket 101, the clamping force of the clamping plate 403 on the memory module can be controlled to ensure... While providing a clamping effect, it avoids excessive clamping force that could damage the memory module. It also guides the movement of the memory module effectively, preventing tilting and misalignment, and ensuring proper insertion into the slot 101. Furthermore, it controls the force required to insert the memory module into the slot 101, ensuring proper insertion and preventing damage from further insertions, thus guaranteeing accurate test results. Additionally, it allows the slot 101 to be opened during testing and sealed afterward to prevent water, dust, and other impurities from entering, ensuring its lifespan and the accuracy of test results.

[0043] In this embodiment, as Figures 1-3As shown, the lifting mechanism includes a first L-shaped plate 201 and a second L-shaped plate 202 fixedly connected to the top of the test equipment body 1. A threaded rod 203 is rotatably connected between the first L-shaped plate 201 and the top of the test equipment body 1. A first moving block 204 is threadedly connected to the side wall of the threaded rod 203, and the first moving block 204 is fixed to the side wall of the first moving frame 11. A fixed rod 205 is fixedly connected between the second L-shaped plate 202 and the top of the test equipment body 1. A second moving block 206 is sleeved on the side wall of the fixed rod 205, and the second moving block 206 is fixed to the side wall of the first moving frame 11. A first motor 207 is fixedly connected to the upper side wall of the first L-shaped plate 201, and the output end of the first motor 207 is fixed to the upper end of the threaded rod 203. When the first motor 207 is started, the rotation of the first motor 207 drives the rotation of the threaded rod 203. When the threaded rod 203 rotates, it drives the first moving frame 11 to move downward, and drives the second moving frame 12 to move downward through the first telescopic component.

[0044] In this embodiment, as Figure 5 and Figure 7 As shown, the first telescopic mechanism includes two symmetrically arranged third moving blocks 303 fixedly connected to the side wall of the second moving frame 12. Each third moving block 303 has two symmetrically arranged first T-shaped guide rods 301 fixedly connected to its upper side wall. The first T-shaped guide rods 301 are inserted into the upper side wall of the first moving frame 11, and a first spring 302 is sleeved on the side wall of the first T-shaped guide rod 301. A first detection component is provided on the lower side wall of the first moving frame 11. When the memory module is inserted into the slot 101, the first T-shaped guide rod 301 moves upward. A spring 302 is compressed, and at the same time, the distance between the first moving frame 11 and the second moving frame 12 gradually decreases. The first detection component detects the distance between the first moving frame 11 and the second moving frame 12, that is, it detects the compression of the first spring 302. When the required distance is reached, the first motor 207 stops, thereby controlling the force of inserting the memory module into the slot 101 to ensure that it can be inserted in place. At the same time, it avoids damage to the memory module when it is inserted in place and continues to be inserted, thus ensuring the accuracy of the test results.

[0045] In this embodiment, as Figure 5 As shown, the first detection component includes a first mounting hole 701 opened on the lower side wall of the first moving frame 11. A first distance sensor 702 is fixedly inserted into the first mounting hole 701, and the first motor 207 is electrically connected to the first distance sensor 702, so as to facilitate the detection of the distance between the first moving frame 11 and the second moving frame 12.

[0046] In this embodiment, as Figure 4 and Figure 7As shown, the clamping mechanism includes two symmetrically arranged first moving plates 401 disposed within the second moving frame 12. The first moving plates 401 are connected to the side wall of the second moving frame 12 via a moving mechanism. The opposite side walls of the two first moving plates 401 are connected to two symmetrically arranged second moving plates 402 via a second telescopic mechanism. The opposite side walls of the two second moving plates 402 are fixedly connected to two symmetrically arranged clamping plates 403. The opposite side walls of the two clamping plates 403 are provided with two symmetrically arranged limiting grooves 404. The side wall of the first moving plate 401 is provided with a second detection component. When the memory module needs to be tested, the memory module is placed in the limiting groove 404. Then, the moving mechanism causes the two first moving plates 401 to move closer to each other synchronously, and the second telescopic component drives the two clamping plates 403 to move closer to each other synchronously, thereby clamping and fixing the memory module.

[0047] In this embodiment, as Figure 4 and Figure 7 As shown, the moving mechanism includes a double-threaded rod 501 with positive and negative teeth rotatably connected to the inner side wall of the second moving frame 12, and a guide rod 502 fixedly connected to the inner side wall of the second moving frame 12. A fourth moving block 503 is fixedly connected to the side wall of each first moving plate 401, and the fourth moving block 503 is sleeved on the side wall of the guide rod 502. A fifth moving block 504 is fixedly connected to the side wall of each first moving plate 401, and the fifth moving block 504 is threadedly connected to the threaded part of the double-threaded rod 501 with positive and negative teeth. A second motor 505 is fixedly connected to the side wall of the second moving frame 12, and the output end of the second motor 505 is fixed to one end of the double-threaded rod 501 with positive and negative teeth. When the second motor 505 is started, the rotation of the second motor 505 drives the rotation of the double-threaded rod 501 with positive and negative teeth, thereby causing the two first moving plates 401 to move closer to each other synchronously.

[0048] In this embodiment, as Figure 7 As shown, the second telescopic mechanism includes two symmetrically arranged second T-shaped guide rods 601 inserted into the side walls of each of the first moving plates 401. One end of the second T-shaped guide rod 601 is fixed to the side wall of the second moving plate 402, and a second spring 602 is sleeved on the side wall of the second T-shaped guide rod 601. When the clamping plate 403 abuts against the memory module, it pushes the second T-shaped guide rod 601 to move. At the same time, the second spring 602 is compressed, so that the distance between the first moving plate 401 and the second moving plate 402 gradually decreases. The distance between the first moving plate 401 and the second moving plate 402 is detected by the second detection component, that is, the compression amount of the second spring 602 is detected. When the required distance is reached, the second motor 505 stops, thereby controlling the clamping force of the clamping plate 403 on the memory module, ensuring the clamping effect while avoiding excessive clamping force that could damage the memory module, and ensuring the accuracy of the test results.

[0049] In this embodiment, as Figure 7 As shown, the second detection component includes a second mounting hole 801 opened on the side wall of the first moving plate 401. A second distance sensor 802 is fixedly inserted into the second mounting hole 801, and the second motor 505 is electrically connected to the second distance sensor 802, so as to facilitate the detection of the distance between the first moving plate 401 and the second moving plate 402.

[0050] In this embodiment, as Figure 2 , Figure 3 and Figure 6 As shown, the protective mechanism includes a support plate 901 fixedly connected to the top of the test equipment body 1, and two symmetrically arranged third T-shaped guide rods 902 are inserted into the side wall of the support plate 901. A sealing plate 903 is fixedly connected to one end of the third T-shaped guide rod 902, and a third spring 904 is sleeved on the side wall of the third T-shaped guide rod 902. The sealing plate 903 slides on the upper side wall of the socket 101, and the movement of the sealing plate 903 is pushed by a pushing mechanism. When the memory module is moved downward and inserted into the socket 101, the pushing mechanism pushes the sealing plate 903 closer to the support plate. As spring 901 moves in the direction of the switch, the third spring 904 is compressed, exposing the socket 101 and ensuring that the memory module can be inserted normally. After the test is completed, the first moving frame 11 and the second moving frame 12 move upward to pull the memory module out of the socket 101. Furthermore, when the push plate 1003 separates from the sealing plate 903, the sealing plate 903 can move and reset under the action of the third spring 904, thereby sealing and protecting the socket 101 to prevent water stains, dust and other impurities from falling into the socket 101, ensuring its service life and the accuracy of the test results.

[0051] In this embodiment, as Figure 1 As shown, the pushing mechanism includes an inclined surface 1001 set on the top of the sealing plate 903, and two symmetrically arranged fourth T-shaped guide rods 1002 are inserted into the upper side wall of the first moving frame 11. The lower end of the fourth T-shaped guide rods 1002 is fixedly connected to a pushing plate 1003, and the side wall of the pushing plate 1003 is provided with a rounded corner 1004. A fourth spring 1005 is sleeved on the side wall of the fourth T-shaped guide rods 1002, and the pushing plate 1003 slides on the inclined surface 1001 to move the memory module downward. When the memory module is inserted into the socket 101, the movement of the first moving frame 11 drives the movement of the push plate 1003. When the push plate 1003 abuts against the sealing plate 903, it pushes the sealing plate 903 to move closer to the support plate 901. After the sealing plate 903 is in place, when the first moving frame 11 continues to move downward to drive the memory module into the socket 101, the fourth T-shaped guide rod 1002 can move upward, causing the fourth spring 1005 to contract, ensuring that the memory module can be inserted normally.

[0052] The specific steps for using this invention are as follows:

[0053] In use, firstly, when testing the memory module, place it in the limiting slot 404. Then, start the second motor 505. The rotation of the second motor 505 drives the rotation of the double-threaded rod 501, causing the two first moving plates 401 to move closer to each other synchronously. The second telescopic component drives the two clamping plates 403 to move closer to each other synchronously. When the clamping plates 403 come into contact with the memory module, they push the second T-shaped guide rod 601 to move. At the same time, the second spring 602 is compressed, causing the distance between the first moving plates 401 and the second moving plates 402 to gradually decrease. The second distance sensor 802 detects the distance between the first moving plates 401 and the second moving plates 402, i.e., detects the compression of the second spring 602. When the required distance is reached, the second motor 505 stops. This allows control of the clamping force of the clamping plates 403 on the memory module, ensuring the clamping effect while avoiding excessive clamping force that could damage the memory module, thus ensuring the accuracy of the test results.

[0054] After the memory module is clamped and secured, the first motor 207 is activated. The rotation of the first motor 207 drives the threaded rod 203 to rotate. When the threaded rod 203 rotates, it causes the first moving frame 11 to move downward, and through the first telescopic component, it causes the second moving frame 12 to move downward. This effectively guides the movement of the memory module, preventing it from tilting or misaligning, ensuring proper insertion into the socket 101, and guaranteeing the accuracy of the test results. Furthermore, when the memory module is inserted into the socket 101, the first T-shaped guide rod 301 moves upward. The first spring 302 is compressed, and at the same time, the distance between the first moving frame 11 and the second moving frame 12 gradually decreases. The distance between the first moving frame 11 and the second moving frame 12 is detected by the first distance sensor 702, that is, the compression of the first spring 302 is detected. When the required distance is reached, the first motor 207 stops, thereby controlling the force of inserting the memory module into the slot 101 to ensure that it can be inserted in place. At the same time, it avoids damage to the memory module when it is inserted in place and continues to be inserted, thus ensuring the accuracy of the test results.

[0055] Furthermore, during testing, when the memory module is moved downwards and inserted into slot 101, the movement of the first moving frame 11 drives the movement of the push plate 1003. When the push plate 1003 abuts against the sealing plate 903, it pushes the sealing plate 903 towards the support plate 901. Simultaneously, the third spring 904 is compressed, exposing slot 101 and ensuring the memory module can be inserted normally. After the sealing plate 903 is in place, when the first moving frame 11 continues to move downwards and inserts the memory module into slot 101, the fourth T-shaped guide rod 1... 002 can move upward, causing the fourth spring 1005 to retract, ensuring that the memory module can be inserted normally. After the test is completed, the first moving frame 11 and the second moving frame 12 move upward, thereby pulling the memory module out of the socket 101. After the push plate 1003 separates from the sealing plate 903, the sealing plate 903 can move and reset under the action of the third spring 904, thereby sealing and protecting the socket 101, preventing water stains and dust and other impurities from falling into the socket 101, ensuring its service life and the accuracy of the test results.

[0056] In summary, the beneficial effects of this invention are specifically reflected in the following aspects: During testing, when the memory module is inserted into the socket 101, the clamping force of the clamping plate 403 on the memory module can be controlled, ensuring the clamping effect while avoiding damage to the memory module due to excessive clamping force. It also provides excellent guidance for the movement of the memory module, preventing tilting and misalignment, and ensuring proper insertion into the socket 101. Furthermore, it controls the force required to insert the memory module into the socket 101, ensuring proper insertion and preventing damage to the memory module during subsequent insertions, thus ensuring the accuracy of the test results. Additionally, the socket 101 can be opened during testing and sealed after testing to prevent water stains, dust, and other impurities from falling into the socket 101, ensuring its service life and the accuracy of the test results.

[0057] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A computer memory bar aging test system, comprising a test device body (1) and a socket (101) arranged on the top of the test device body (1), characterized in that, The top of the test equipment body (1) is connected to a first movable frame (11) via a lifting mechanism, and the lower side wall of the first movable frame (11) is connected to a second movable frame (12) via a first telescopic mechanism. The second movable frame (12) is provided with a clamping mechanism for clamping and fixing memory modules, and the top of the test equipment body (1) is provided with a protective mechanism for sealing and protecting the socket (101).

2. The computer memory bank burn-in test system of claim 1, wherein, The lifting mechanism includes a first L-shaped plate (201) and a second L-shaped plate (202) fixedly connected to the top of the test equipment body (1), and a threaded rod (203) is rotatably connected between the first L-shaped plate (201) and the top of the test equipment body (1).

3. The computer memory bank burn-in test system of claim 2, wherein, The threaded rod (203) has a first moving block (204) threadedly connected to its side wall, and the first moving block (204) is fixed to the side wall of the first moving frame (11). A fixing rod (205) is fixedly connected between the second L-shaped plate (202) and the top of the test equipment body (1), and a second moving block (206) is sleeved on the side wall of the fixing rod (205). The second moving block (206) is fixed to the side wall of the first moving frame (11). A first motor (207) is fixedly connected to the upper side wall of the first L-shaped plate (201), and the output end of the first motor (207) is fixed to the upper end of the threaded rod (203). The first telescopic mechanism includes two symmetrically arranged third moving blocks (303) fixedly connected to the side wall of the second moving frame (12), and two symmetrically arranged first T-shaped guide rods (301) fixedly connected to the upper side wall of each third moving block (303). The first T-shaped guide rods (301) are inserted into the upper side wall of the first moving frame (11), and a first spring (302) is sleeved on the side wall of the first T-shaped guide rods (301). A first detection component is provided on the lower side wall of the first moving frame (11).

4. The computer memory bank burn-in test system of claim 3, wherein, The first detection component includes a first mounting hole (701) opened on the lower side wall of the first moving frame (11), a first distance sensor (702) is fixedly inserted in the first mounting hole (701), and the first motor (207) is electrically connected to the first distance sensor (702).

5. The computer memory bank burn-in test system of claim 3, wherein, The clamping mechanism includes two symmetrically arranged first moving plates (401) disposed in the second moving frame (12), and the first moving plates (401) are connected to the side wall of the second moving frame (12) through the moving mechanism. The opposite side walls of the two first moving plates (401) are connected to two symmetrically arranged second moving plates (402) through the second telescopic mechanism. The opposite side walls of the two second moving plates (402) are fixedly connected to two symmetrically arranged clamping plates (403). The opposite side walls of the two clamping plates (403) are provided with two symmetrically arranged limiting grooves (404). The side wall of the first moving plate (401) is provided with a second detection component. The moving mechanism includes a double-threaded rod (501) with positive and negative teeth rotatably connected to the inner side wall of the second moving frame (12), and a guide rod (502) is fixedly connected to the inner side wall of the second moving frame (12). A fourth moving block (503) is fixedly connected to the side wall of each of the first moving plates (401), and the fourth moving block (503) is sleeved on the side wall of the guide rod (502). A fifth moving block (504) is fixedly connected to the side wall of each of the first moving plates (401), and the fifth moving block (504) is threadedly connected to the threaded part of the double-threaded rod (501). A second motor (505) is fixedly connected to the side wall of the second moving frame (12), and the output end of the second motor (505) is fixed to one end of the double-threaded rod (501). The protective mechanism includes a support plate (901) fixedly connected to the top of the test equipment body (1), and two symmetrically arranged third T-shaped guide rods (902) are inserted into the side wall of the support plate (901). A sealing plate (903) is fixedly connected to one end of the third T-shaped guide rod (902), and a third spring (904) is sleeved on the side wall of the third T-shaped guide rod (902). The sealing plate (903) slides on the upper side wall of the socket (101), and the movement of the sealing plate (903) is driven by a pushing mechanism. The pushing mechanism includes an inclined surface (1001) set on the top of the sealing plate (903), and two symmetrically arranged fourth T-shaped guide rods (1002) are inserted into the upper side wall of the first moving frame (11). The lower end of the fourth T-shaped guide rod (1002) is fixedly connected to a pushing plate (1003), and the side wall of the pushing plate (1003) is provided with rounded corners (1004). The side wall of the fourth T-shaped guide rod (1002) is sleeved with a fourth spring (1005), and the pushing plate (1003) slides on the inclined surface (1001).

6. The computer memory bank burn-in test system of claim 5, wherein The second telescopic mechanism includes two symmetrically arranged second T-shaped guide rods (601) inserted into the side walls of each first movable plate (401).

7. The computer memory bank burn-in test system of claim 6, wherein, One end of the second T-shaped guide rod (601) is fixed to the side wall of the second movable plate (402), and the side wall of the second T-shaped guide rod (601) is fitted with a second spring (602).

8. The computer memory bank burn-in test system of claim 5, wherein, The second detection component includes a second mounting hole (801) opened on the side wall of the first moving plate (401), a second distance sensor (802) is fixedly inserted in the second mounting hole (801), and the second motor (505) is electrically connected to the second distance sensor (802).

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