Infrared imaging delay test target, test system and test method
By integrating an arc-shaped visible light scale and an infrared pointer onto an infrared imaging delay test target, and utilizing the rotation of the target body and camera imaging, the problems of non-intuitive and difficult-to-measure delay fluctuations in existing technologies are solved, achieving the effect of intuitive quantification and measurement of delay duration.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN GUIDE SENSMART TECH CO LTD
- Filing Date
- 2025-12-11
- Publication Date
- 2026-04-21
AI Technical Summary
Existing infrared imaging delay testing methods are not intuitive, their accuracy depends on high-speed cameras, and they are difficult to measure delay fluctuations.
An infrared imaging time delay test target is used, which integrates an arc-shaped visible light scale and an infrared pointer. The delay duration and fluctuation are calculated by rotating the target body and taking pictures with a camera.
It enables intuitive observation of delay duration, quantification of delay magnitude, and measurement of delay fluctuations, thus overcoming the shortcomings of existing technologies.
Smart Images
Figure CN121898616A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of infrared imaging technology, specifically relating to an infrared imaging delay test target, test system, and test method. Background Technology
[0002] Many applications of infrared imaging equipment have requirements for imaging latency, such as infrared night vision gun sights and infrared vehicle cameras. During the infrared imaging latency, running prey or moving cars will undergo significant displacement, causing the infrared imaging to lag behind the real scene. Therefore, infrared imaging equipment has very high requirements for the length of the imaging latency, and thus a method is needed to measure the infrared imaging latency.
[0003] To test the latency of infrared imaging, the key is to distinguish the time difference between the infrared image and the real scene. Existing technology uses the time difference between the frames of a high-speed camera to achieve this distinction. The specific method is as follows: use an infrared device to photograph a moving target object and image it, and then use a high-speed camera to simultaneously and continuously photograph the infrared image and the moving target object itself. When the high-speed camera captures the target object moving to a certain position, it is recorded as the first photo. When the high-speed camera captures the target object in the infrared image moving to the same position, it is recorded as the second photo. The difference in the number of frames between the first and second photos, multiplied by the frame period of the high-speed camera, is the latency of the infrared imaging.
[0004] However, the existing infrared imaging delay duration testing methods described above have the following drawbacks:
[0005] (1) Not intuitive: The high-speed camera captures the target object at different times through two optical paths: infrared imaging and direct shooting of the target object itself. The feedback on the high-speed camera is two different photos. The two images cannot be put together to intuitively observe how long the infrared imaging delay is.
[0006] (2) Accuracy depends on high-speed camera: The quantitative test of infrared delay duration is calculated by the frame difference and frame period of the high-speed camera, and the calculation result depends on the frame rate of the high-speed camera.
[0007] (3) Delay fluctuations cannot be measured: The delay time of infrared imaging is not fixed. It fluctuates randomly due to the influence of the software and hardware status. Existing delay testing technology can test the infrared imaging delay when the target object moves to a certain position, but it is difficult to measure the delay fluctuation value in the time period of a few seconds or even a few milliseconds before and after this moment. Summary of the Invention
[0008] The purpose of this invention is to provide an infrared imaging time delay test target, test system, and test method, which can at least solve some of the defects existing in the prior art.
[0009] To achieve the above objectives, the present invention adopts the following technical solution:
[0010] An infrared imaging delay test target includes a target body. The surface of the target body is provided with an arc-shaped visible light scale for providing a visible light imaging pattern and an infrared pointer for providing an infrared light imaging pattern. The arc-shaped visible light scale has a plurality of visible light scale lines arranged at equal intervals along its circumference. The extension line of the infrared pointer passes through the center of the arc-shaped visible light scale, and the infrared pointer is aligned with the starting visible light scale line on the arc-shaped visible light scale.
[0011] Furthermore, the surface of the target body is also provided with a dual-light positioning mark that can simultaneously provide infrared light imaging patterns and visible light imaging patterns, and the center of the dual-light positioning mark coincides with the center of the arc-shaped visible light scale.
[0012] Furthermore, the scale of each visible light scale line on the arc-shaped visible light scale is the angle between its center and the starting visible light scale line, and the scale of each visible light scale line increases sequentially in the opposite direction to the test rotation direction of the target body, and the scale difference between adjacent visible light scale lines matches the circumferential spacing of the scale lines.
[0013] Furthermore, the infrared pointer is a long strip with a certain width, and its two long sides are the pointer side and the non-pointer side, respectively. The pointer side is aligned with the starting visible light scale line on the arc-shaped visible light scale and its extension line passes through the center of the arc-shaped visible light scale. The non-pointer side is biased towards the side of the pointer side that is opposite to the rotation direction of the target body.
[0014] Furthermore, the target body is a circular plate made of FR4 material. The surface of the target body with an arc-shaped visible light scale and an infrared pointer is coated with a black solder resist coating. The infrared pointer is made using an immersion gold process, and the visible light scale lines are printed with white silkscreen.
[0015] Furthermore, the target body is a circular plate, and the surface of the target body with the arc-shaped visible light scale and infrared pointer is coated with a black coating. The infrared pointer adopts a penetrating hollow structure, and its hollow edge is printed with a circle of white silk screen. The visible light scale lines are printed with white silk screen or laser engraved.
[0016] In addition, the present invention also provides an infrared device, a camera, an optical path, a heating module, a rotation drive assembly, and the aforementioned infrared imaging delay test target; the heating module is arranged on the side of the target body facing away from the infrared pointer, the rotation drive assembly is used to drive the heating module and the target body to rotate synchronously, and the optical path is configured to guide the visible light imaging pattern on the target body to the camera, and at the same time guide the infrared light imaging pattern on the target body to the imaging pattern after being imaged by the infrared device to the camera.
[0017] Furthermore, the rotation drive assembly includes a drive motor and a support structure, the heating module and the target body are fixedly mounted on the support structure, and the support structure is connected to the movable end of the drive motor.
[0018] The present invention also provides an infrared imaging delay testing method, which uses the above-mentioned infrared imaging delay testing system and includes the following steps:
[0019] S1. The target body is stationary, and the infrared pointer and the arc-shaped visible light scale on the target body generate infrared and visible light imaging patterns. By adjusting the optical path, the infrared pointer image on the target body in the imaging pattern on the camera is aligned with the starting visible light scale line on the arc-shaped visible light scale.
[0020] S2. The rotation drive component drives the target body and the heating module to rotate synchronously at a uniform angular velocity ω. During the rotation, the camera randomly takes pictures.
[0021] S3. Calculate the angle difference θ between the visible light scale line corresponding to the infrared pointer in the photograph and the scale line of the initial visible light scale line, and calculate the delay time t of the infrared device when the photograph was taken using the formula t=θ / ω.
[0022] Furthermore, the above-mentioned infrared imaging delay test method also includes S4, where the camera continuously takes multiple photos within a certain period of time, and S3 calculates the delay duration corresponding to each photo, and compares it with the photo shooting time to obtain the delay duration fluctuation of the infrared device within this period of time.
[0023] Compared with the prior art, the beneficial effects of the present invention are as follows:
[0024] (1) The infrared imaging delay test target provided by the present invention integrates an arc-shaped visible light scale and an infrared pointer on the target body, thereby integrating the images of the target captured by the camera through infrared imaging and direct shooting of the real scene into the same photo, so as to achieve the purpose of intuitively observing the delay time.
[0025] (2) In this invention, when the target body is stationary, the infrared pointer points to the initial visible light scale line. After the target body rotates, the infrared pointer will lag behind the initial visible light scale line and point to a certain visible light scale line. Thus, the delay time can be observed intuitively by the size of the scale of the lag visible light scale line. The delay time can also be quantified by objectively combining the difference between the scale of the lag visible light scale line and the scale of the initial visible light scale line with the rotation speed of the target body. The test is intuitive and convenient.
[0026] (3) The present invention utilizes the fact that when a camera continuously takes multiple photos within a set time range, the delay of each photo can be combined to test the delay fluctuation of the infrared device within a certain time period, thus solving the problem that existing delay testing technologies are difficult to measure delay fluctuation.
[0027] The present invention will now be described in further detail with reference to the accompanying drawings. Attached Figure Description
[0028] Figure 1 This is a schematic diagram of the structure of the infrared imaging delay test target of the present invention;
[0029] Figure 2 This is a schematic diagram of the infrared imaging delay testing system of the present invention;
[0030] Figure 3 This is a schematic diagram of the structure of the infrared imaging delay test target in Embodiment 1 of the present invention;
[0031] Figure 4 This is a schematic diagram of the infrared imaging delay test target installation method in Embodiment 1 of the present invention;
[0032] Figure 5 This is a schematic diagram of camera imaging when the infrared imaging delay test target is stationary in Embodiment 1 of the present invention;
[0033] Figure 6 This is a schematic diagram of camera imaging during the rotation of the infrared imaging delay test target in Embodiment 1 of the present invention;
[0034] Figure 7 This is a schematic diagram of the infrared imaging delay test target in Embodiment 2 of the present invention;
[0035] Figure 8 This is a schematic diagram of the infrared imaging delay test target installation method in Embodiment 2 of the present invention;
[0036] Figure 9 This is a schematic diagram of camera imaging when the infrared imaging delay test target is stationary in Embodiment 2 of the present invention;
[0037] Figure 10 This is a schematic diagram of camera imaging during the rotation of the infrared imaging delay test target in Embodiment 2 of the present invention.
[0038] Explanation of reference numerals in the attached diagram: 1. Target body; 2. Infrared pointer; 3. Visible light scale line; 4. Dual-light positioning mark; 5. Rotation drive assembly; 6. Infrared device; 7. Camera; 8. Semi-transparent mirror; 9. Reflector; 10. Heating module; 11. Support structure; 12. Drive motor; 13. Conductive slip ring; 14. Infrared pointer imaging. Detailed Implementation
[0039] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0040] In the description of this invention, it should be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.
[0041] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation", "connection", and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, an abutting connection, or an integral connection. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.
[0042] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature; in the description of this invention, unless otherwise stated, "a plurality of" means two or more.
[0043] To address the problem that existing delay testing techniques cannot intuitively present the duration of infrared imaging delay, this invention provides an infrared imaging delay testing target that can distinguish the time difference between infrared imaging and the real scene; specifically, such as... Figure 1As shown, the infrared imaging time-lapse test target of the present invention includes a target body 1. The surface of the target body 1 is provided with an arc-shaped visible light scale and an infrared pointer 2. The arc-shaped visible light scale provides a visible light imaging pattern and has several visible light scale lines 3 arranged at equal intervals along its circumference. The infrared pointer 2 provides an infrared light imaging pattern, and the extension line of the infrared pointer 2 passes through the center of the arc-shaped visible light scale, and the infrared pointer 2 is aligned with the starting visible light scale line 3 on the arc-shaped visible light scale. In this invention, by integrating the arc-shaped visible light scale and the infrared pointer 2 onto the target body 1, images of the target captured by the camera through infrared imaging and direct shooting of the real scene can be integrated into a single image during the time-lapse test, achieving the purpose of intuitively observing the time-lapse duration.
[0044] Optionally, the target body 1 can be designed as a whole in a circular shape to ensure the stability of rotating the target body 1 during the time delay test. Visible light scale lines 3 are arranged at equal intervals around the circumference of the circular target body 1 near its edge.
[0045] In some embodiments, the scale of each visible light scale line 3 is designed as an angle. The initial visible light scale line 3 on the arc-shaped visible light scale is defined as the 0-degree line, and the scales of the remaining visible light scale lines 3 are the angles between the scale line and the 0-degree line. The scale range of the arc-shaped visible light scale can be freely defined within the range of (0°, 360°). For example, in this embodiment, the scale range of the arc-shaped visible light scale is designed to be 90°. Figure 1 As shown. The scale direction of the arc-shaped visible light scale can be determined according to the rotation direction of the time-delay test target during use. Preferably, the scale direction of the arc-shaped visible light scale is designed to increase sequentially in the opposite direction to the rotation direction of the target body 1 during use. That is, if the time-delay test target is set to rotate clockwise during use, the scale direction of the arc-shaped visible light scale is to gradually increase in the counterclockwise direction (e.g., Figure 1 As shown), and vice versa; thus, when the target body 1 rotates, the infrared pointer 2 lags behind the 0 mark and points to a certain visible light mark 3, which is the infrared delay rotation angle, and the size of the infrared imaging delay can be observed intuitively.
[0046] To facilitate observation of the infrared imaging pattern during the time-delay test, in some embodiments, the infrared pointer 2 is designed as a long strip with a certain width, and its two long sides are defined as the pointer side and the non-pointer side, respectively. The pointer side is aligned with the starting visible light scale line 3 (i.e., the 0 scale line) on the arc-shaped visible light scale, and the extension line of the pointer side passes through the center of the arc-shaped visible light scale (i.e., the center of the circular target body 1). The non-pointer side is located on the side of the pointer side that is biased towards the target body 1 and away from the direction of rotation, that is, the non-pointer side is on the side of the pointer side that is biased towards the increase of the scale.
[0047] To accurately position the target during time-delay testing, an optimized implementation method includes a dual-light positioning mark 4 on the surface of the target body 1, capable of simultaneously providing infrared and visible light imaging patterns. The dual-light positioning mark 4 has a centrally symmetrical structure, with its center coinciding with the center of the arc-shaped visible light scale. The dual-light positioning mark 4 calibrates the center position of the arc-shaped visible light scale, ensuring that the extended edge of the infrared pointer 2 accurately passes through the center of the arc-shaped visible light scale, while also assisting the optical path in aligning the image of the target body 1. Specifically, the shape of the dual-light positioning mark 4 can be, but is not limited to, a cross shape.
[0048] In addition, such as Figure 2 , Figure 4 and Figure 8 As shown, the present invention also provides an infrared imaging delay test system, including an infrared device 6, a camera 7, an optical path, a heating module 10, a rotation drive assembly 5, and the aforementioned infrared imaging delay test target; the heating module 10 is arranged on the side of the target body 1 facing away from the infrared pointer 2, and the infrared pointer 2 on the target body 1 is made to emit light through the heating module 10, so that an infrared light pattern can be presented; the rotation drive assembly 5 is used to drive the heating module 10 and the target body 1 to rotate synchronously, and the optical path is configured to guide the visible light imaging pattern (provided by an arc-shaped visible light scale) on the target body 1 to the camera 7, and at the same time guide the infrared light imaging pattern (provided by the infrared pointer 2) on the target body 1 to the camera 7 after being imaged by the infrared device 6.
[0049] In some embodiments, the optical elements of the optical path include a semi-transparent mirror 8 and a reflector 9. During assembly, the infrared imaging delay test target and the heating module 10 are mounted on the rotation drive assembly 5. The rotation drive assembly 5 can drive the target body 1 and the heating module 10 to rotate synchronously. The infrared device 6 is arranged facing the target body 1. The semi-transparent mirror 8 is located on one side of the imaging display screen of the infrared device 6 (i.e., the side away from the target body 1). The infrared light imaging pattern provided by the infrared pointer 2 is imaged by the infrared device 6 and then captured by the camera 7 through the semi-transparent mirror 8. The reflector 9 directly corresponds to the target body 1. The visible light imaging pattern provided by the arc-shaped visible light scale is captured by the camera 7 through the semi-transparent mirror 8 and the reflector 9 in sequence.
[0050] As one specific implementation method, such as Figure 4 and Figure 8 As shown, the rotation drive assembly 5 includes a drive motor 12 and a support structure 11. The heating module 10 and the target body 1 are fixedly installed on the support structure 11. The support structure 11 is connected to the movable end of the drive motor 12. The drive motor 12 drives the support structure 11 to rotate at a constant speed, thereby causing the heating module 10 and the target body 1 to rotate at a constant speed together.
[0051] Preferably, the heating wire of the heating module 10 is connected to an external power supply device through a conductive slip ring 13, which is sleeved on the rotating shaft of the drive motor 12, thereby preventing the heating wire from getting tangled during rotation.
[0052] The specific process for testing the imaging delay of infrared devices using the aforementioned infrared imaging delay testing system is as follows:
[0053] First, the target body 1 is stationary, and infrared pointer 2 and visible light scale line 3 on the target body 1 generate infrared and visible light imaging patterns, respectively. The infrared pointer 2 on the target body 1 is heated by heating module 10 to emit light and present an infrared imaging pattern, while visible light (such as natural light) illuminates the arc-shaped visible light scale on the target body 1 to present a visible light imaging pattern. The surface of the target body 1 is photographed using an infrared device, and the target body 1 surface itself and the imaging display screen of the infrared device 6 are simultaneously photographed by camera 6 through reflector 9 and semi-transparent mirror 8. By adjusting the position and angle of reflector 9, the infrared pointer imaging 14 in the target body 1 surface image photographed by camera 6 is aligned with the 0 scale line.
[0054] Preferably, the alignment of the infrared pointer image 14 with the 0 mark in the surface imaging of the target body 1 captured by the camera 7 can be achieved by using a dual-light positioning mark 4 on the target body 1 that can simultaneously provide infrared and visible light imaging patterns. Taking a dual-light crosshair as an example, the visible light crosshair in the dual-light positioning mark 4 is captured by the camera 7 after passing through the reflector 9 and the semi-transparent mirror 8 in sequence. The infrared crosshair in the dual-light positioning mark 4 is imaged by the infrared device 6, and its image is captured by the camera 7 after passing through the semi-transparent mirror 8. By adjusting the position and angle of the reflector 9, the imaging position of the visible light crosshair on the camera 7 can be adjusted. When the imaging of the two crosshairs (i.e., the visible light crosshair and the infrared light crosshair) on the camera 7 is adjusted to overlap, the infrared pointer 2 and the 0 mark are aligned on the camera 7.
[0055] Then, the target body 1 and the heating module are driven by the rotation drive component 5 to rotate at a constant angular velocity ω (° / ms). During the rotation, the camera 7 takes random photos. In the photos, the infrared pointer imaging 14 will lag behind the imaging of the 0 scale line and point to a corresponding visible light scale line. The angle difference θ (°) between the scale of the visible light scale line corresponding to the infrared pointer and the scale of the 0 scale line can be calculated by the formula t=θ / ω.
[0056] In this embodiment, the scale value 'a' of the visible light scale line corresponding to the infrared pointer edge in the captured photo can be read first. The absolute difference θ between 'a' and the scale value (0°) of the starting visible light scale line can be calculated (θ=|a-0°|, unit: °). Then, the delay time t of the infrared device when this photo was taken can be calculated using the formula t=θ / ω (unit: milliseconds, ms).
[0057] Furthermore, if the camera 7 is set to continuously take multiple photos within a certain period of time, the delay duration of the infrared device 6 corresponding to each photo can be calculated and compared with the photo shooting time to obtain the fluctuation of the delay duration of the infrared device 6 within this period of time.
[0058] In this embodiment, the camera continuously takes multiple photos within a preset time period and calculates the delay duration t corresponding to each photo. The delay duration t of each photo is associated with the shooting timestamp of the photo to form a correspondence table between delay duration and shooting time. By analyzing the range of t values in the correspondence table, the fluctuation of the delay duration of the infrared device within this preset time period can be obtained.
[0059] The following specific embodiments illustrate the process of testing the imaging delay of infrared devices using the infrared imaging delay testing system of the present invention.
[0060] Example 1:
[0061] This embodiment provides an infrared imaging time-delay test target, such as Figure 3 As shown, the target body 1 is made of FR4 material and is manufactured by PCB manufacturing process. The front surface is covered with black solder resist paint. The pattern area of the dual-light positioning mark 4 and infrared pointer 2 is covered with immersion gold. The visible light scale line 3 is printed with white silk screen. There are no requirements for the back and side surfaces of the target body 1.
[0062] When using the above-mentioned infrared imaging delay test target, such as Figure 4 As shown, the heating module 10 is directly attached to the back of the target body 1, and the target body 1 and the heating module 10 are then fixed together on the support structure 11. The support structure 11 is then rotated by the drive motor 12. The heating wires of the heating module 10 are connected through the conductive slip ring 13.
[0063] Thus, when camera 7 photographs the assembled infrared imaging time-lapse test target through mirror 9 and semi-transparent mirror 8, it can capture the black surface of the target body 1, the gold dual-light positioning mark 4, and the white visible light scale line 3. Simultaneously, when camera 7 photographs the assembled infrared imaging time-lapse test target through semi-transparent mirror 8 and infrared device 6, if infrared device 6 is set to black-hot mode, it can capture the black surface of the target body 1, the white dual-light positioning mark 4, and the white infrared pointer 2. It should be noted that because the magnification of the two optical paths is different, the image size will be different.
[0064] A schematic diagram of the image captured by the two optical paths on camera 7 when the infrared imaging time-delay test target is stationary is shown below. Figure 5 As shown, the infrared pointer image 14 coincides with the image of the 0 mark; when the infrared imaging delay test target rotates, the schematic diagram of the two optical paths jointly imaging on the camera is shown below. Figure 6 As shown, the infrared pointer image 14 lags behind the image of the 0-scale line and points to the image of another visible light scale line 3. This is achieved by reading... Figure 6 The readings on the visible light scale corresponding to the pointer edge of the mid-infrared pointer imaging 14 allow for a direct observation of the infrared imaging delay, and can also be used to calculate the specific delay duration; for example, from Figure 6 It can be clearly seen that the time delay rotation angle when this photo was taken in this embodiment is 26°.
[0065] Example 2:
[0066] This embodiment provides an infrared imaging time-delay test target, such as Figure 7As shown, the target body 1 is made of a circular plate, and the material can be freely chosen as a solid material such as metal or plastic. It is processed by machining process, and the surface is black when viewed from the front. The dual-light positioning mark 4 is a penetrating hollow cross mark, and a white silk screen or laser engraving is printed around the hollow edge of the hollow cross mark. The pattern area of the infrared pointer 2 is a penetrating hollow strip. The visible light scale line 3 is made of white silk screen printing or laser engraving. There are no requirements for the back surface and side surface of the target body 1.
[0067] When using infrared imaging time-lapse test targets, such as Figure 8 As shown, the heating module 10 is fixed on the support structure 11, and the target body 1 is fixed on the support structure 11, with a certain gap between the back of the target body 1 and the heating module 10. Then, the drive motor 12 drives the support structure 11 to rotate as a whole. The heating wire of the heating module 10 is connected through the conductive slip ring 13. The heating module 10 is self-heating and emits infrared radiation. The infrared radiation passes through the hollowed-out infrared pointer 2 to form an infrared light imaging pattern. The drive motor 12 drives the heating module 10 and the target body 1 to rotate synchronously.
[0068] Thus, when camera 7 photographs the assembled infrared imaging time-lapse test target through the semi-transparent mirror 8 and the reflector 9, it can capture the black surface of the target body 1, the white hollow dual-light positioning mark 4, and the white visible light scale line 3. Simultaneously, when camera 7 photographs the assembled infrared imaging time-lapse test target through the semi-transparent mirror 8 and the infrared device 6, if the infrared device 6 is set to incandescent mode, it can capture the black surface of the target body 1, the white dual-light positioning mark 4, and the white infrared pointer 2. It should be noted that because the magnification of the two optical paths is different, the image size will be different.
[0069] A schematic diagram of the image captured by the two optical paths on camera 7 when the infrared imaging time-delay test target is stationary is shown below. Figure 9 As shown, the infrared pointer image 14 coincides with the image of the 0 mark; when the infrared imaging delay test target rotates, the schematic diagram of the two optical paths jointly imaged on camera 7 is shown below. Figure 10 As shown, the infrared pointer image 14 lags behind the image of the 0-scale line and points to the image of another visible light scale line 3. This is achieved by reading... Figure 10 The reading on the visible light scale line 3 corresponding to the pointer edge of the mid-infrared pointer imaging 14 allows for a direct observation of the infrared imaging delay, and can also be used to calculate the specific delay duration; for example, from Figure 10 It can be clearly seen that the time delay rotation angle when this photo was taken in this embodiment is 26°.
[0070] The above examples are merely illustrative of the present invention and do not constitute a limitation on the scope of protection of the present invention. All designs that are the same as or similar to the present invention are within the scope of protection of the present invention.
Claims
1. An infrared imaging time-delay test target, characterized in that: The device includes a target body, the surface of which is provided with an arc-shaped visible light scale for providing a visible light imaging pattern and an infrared pointer for providing an infrared light imaging pattern. The arc-shaped visible light scale has a plurality of visible light scale lines arranged at equal intervals along its circumference. The extension line of the infrared pointer passes through the center of the arc-shaped visible light scale, and the infrared pointer is aligned with the starting visible light scale line on the arc-shaped visible light scale.
2. The infrared imaging delay test target as described in claim 1, characterized in that: The surface of the target body is also provided with a dual-light positioning mark that can simultaneously provide infrared and visible light imaging patterns. The center of the dual-light positioning mark coincides with the center of the arc-shaped visible light scale.
3. The infrared imaging delay test target as described in claim 1, characterized in that: The scale of each visible light scale line on the arc-shaped visible light scale is the angle between its center and the starting visible light scale line, and the scale of each visible light scale line increases sequentially in the opposite direction to the test rotation direction of the target body. The scale difference between adjacent visible light scale lines matches the circumferential spacing of the scale lines.
4. The infrared imaging delay test target as described in claim 1, characterized in that: The infrared pointer is a long strip with a certain width, and its two long sides are the pointer side and the non-pointer side, respectively. The pointer side is aligned with the starting visible light scale line on the arc-shaped visible light scale and its extension line passes through the center of the arc-shaped visible light scale. The non-pointer side is biased to the side opposite to the rotation direction of the target body of the pointer side.
5. The infrared imaging delay test target as described in claim 1, characterized in that: The target body is a circular plate made of FR4 material. The surface of the target body with an arc-shaped visible light scale and an infrared pointer is covered with a black solder resist coating. The infrared pointer is made using an immersion gold process, and the visible light scale lines are printed with white silkscreen.
6. The infrared imaging delay test target as described in claim 1, characterized in that: The target body is a circular plate. The surface of the target body with an arc-shaped visible light scale and an infrared pointer is coated with a black coating. The infrared pointer adopts a penetrating hollow structure, and its hollow edge is printed with a white silk screen. The visible light scale lines are printed with white silk screen or laser engraved.
7. An infrared imaging delay testing system, characterized in that: The device includes an infrared device, a camera, an optical path, a heating module, a rotation drive assembly, and an infrared imaging delay test target as described in any one of claims 1-6; the heating module is arranged on the side of the target body facing away from the infrared pointer, the rotation drive assembly is used to drive the heating module and the target body to rotate synchronously, and the optical path is configured to guide the visible light imaging pattern on the target body to the camera, and at the same time guide the infrared light imaging pattern on the target body to the imaging pattern after being imaged by the infrared device to the camera.
8. The infrared imaging delay testing system as described in claim 7, characterized in that: The rotation drive assembly includes a drive motor and a support structure. The heating module and the target body are fixedly mounted on the support structure, and the support structure is connected to the movable end of the drive motor.
9. A method for testing infrared imaging delay, characterized in that, The infrared imaging delay testing system according to claim 7 or 8 includes the following steps: S1. The target body is stationary, and the infrared pointer and the arc-shaped visible light scale on the target body generate infrared and visible light imaging patterns. By adjusting the optical path, the infrared pointer image on the target body in the imaging pattern on the camera is aligned with the starting visible light scale line on the arc-shaped visible light scale. S2. The rotation drive component drives the target body and the heating module to rotate synchronously at a uniform angular velocity ω. During the rotation, the camera randomly takes pictures. S3. Calculate the angle difference θ between the visible light scale line corresponding to the infrared pointer in the photograph and the scale line of the initial visible light scale line, and calculate the delay time t of the infrared device when the photograph was taken using the formula t=θ / ω.
10. The infrared imaging delay test method as described in claim 9, characterized in that, Also includes: S4. The camera takes multiple photos continuously over a period of time. The delay time corresponding to each photo is calculated according to S3, and compared with the photo shooting time to obtain the delay time fluctuation of the infrared device during this period.