Embedded general test system

Abstract

The invention belongs to the technical field of computer testing, and provides an embedded universal testing system which comprises a function testing module, an adapter, a bus backboard and a power supply, the adapter is electrically connected with a tested product, and the power supply supplies power to the function testing module and the adapter. The function test module, the adapter and the power supply are electrically connected through the bus backboard, and the function test module is used for realizing classified test of test requirements of tested products. Under the condition that a new product or a product technical state is changed, existing hardware resources can be quickly utilized to the maximum extent to build the embedded test system, waste and discard of test equipment resources can be avoided to the maximum extent, the research and development cost of test equipment is greatly reduced, the research and development period of the test equipment is greatly shortened, and the test efficiency is improved. And the maturity and the reliability of the test equipment and the test system are greatly ensured.

Description

Technical Field

[0001] This invention belongs to the field of computer testing technology, and specifically relates to an embedded general testing system. Background Technology

[0002] In recent years, with the continuous development of computer equipment, especially the constant upgrading of high-end, complex, and specialized computer platforms such as embedded systems, the testing of computer equipment products has become increasingly demanding. Testing methods for real-time computer products are limited, inefficient, and yield unsatisfactory results. There is a lack of universal systems for configuring parameters, test steps, and test processes. Traditionally, testing equipment or systems are often customized and specialized. When product upgrades or modifications occur, the old systems become obsolete, requiring the redesign of new specialized systems. This results in a waste of hardware resources and funds, hindering enterprise development. Furthermore, the design of general-purpose embedded testing systems encounters many problems, such as: hardware limitations in meeting the testing needs of different product types; poor configurability of hardware modules; difficulty in flexibly editing test parameters, test steps, and test processes; and low autofocus efficiency in machine vision image acquisition.

[0003] Traditional testing methods for computer equipment and products are limited, inefficient, and require specialized equipment. Once a product's technical specifications change, the entire testing system must be replaced, and a new system developed. Furthermore, traditional computer product testing systems are not conducive to improving the utilization rate of testing equipment resources. Summary of the Invention

[0004] To address the aforementioned technical problems, this invention proposes an embedded universal testing system, comprising a functional testing module, an adapter, a bus backplane, and a power supply. The adapter is electrically connected to the product under test (DUT), and the power supply provides power to the functional testing module and the adapter. The functional testing module, the adapter, and the power supply are electrically connected through the bus backplane. The functional testing module is used to perform categorized testing of the DUT to meet testing requirements.

[0005] Furthermore, the functional testing module is divided as follows: All test requirements are categorized according to digital signals, analog signals, and test coupling. Based on the classification of test requirements, the functional test module is divided into basic units, PCM simulation units, and extended units. The basic units, PCM simulation units, and extended units each provide some test functions to meet some test requirements.

[0006] Furthermore, the basic unit is used for functional testing of bus communication and discrete quantity control, the PCM simulation unit is used for functional testing of analog quantities and PCM code streams, and the extension unit is used for testing the remaining customized functions.

[0007] Furthermore, the basic unit meets 80% of the testing requirements, the PCM simulation unit meets 15% of the testing requirements, and the extended unit meets the remaining testing requirements.

[0008] Furthermore, both the basic unit and the PCM simulation unit are electrically connected to the adapter via a backplane bus, and the adapter is electrically connected to the product under test.

[0009] Furthermore, the expansion unit is directly electrically connected to the product under test. Furthermore, the basic unit transmits the test results and test data to the host computer via a communication bus, where the host computer displays and stores them.

[0010] Furthermore, the PCM simulation unit transmits test data and test results to the basic unit via the backplane bus, and the basic unit then uploads the test data and test results to the host computer for display and storage.

[0011] Furthermore, the expansion unit transmits test data and test results to the basic unit via the backplane bus, and the basic unit then uploads the test data and test results to the host computer for display and storage.

[0012] This invention maintains the universal setup and structure of functional test units when testing different products under test, allowing for the reuse of most test equipment resources in the embedded universal test bench. Electrical connection between the test system and the product under test can be established simply by replacing the adapter in the embedded universal test architecture, and product testing can be completed by calling modular functional test sequences. This maximizes the versatility of the embedded test system and reduces the software and hardware development costs and time required for the test system. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the principle architecture of the present invention. Detailed Implementation

[0014] To better understand the purpose, technical solution, and function of this invention, the invention will be described in further detail below with reference to the accompanying drawings. However, this invention can be implemented in many different ways as defined and covered by the claims. The accompanying drawings, which constitute a part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0015] To address the need for embedded universal test benches in circuit board assemblies and complete systems, this invention proposes an embedded universal test system, such as... Figure 1As shown, this invention fully utilizes the advantages of the bus backplane and the principle of maximizing the functional partitioning of the product under test (DUT), dividing the functional test modules in the test system into basic units, PCM simulation units, and expansion units. With the combination of these three functional test modules, and in conjunction with an adapter, electrical connections are established with the DUT, thereby enabling the testing of all DUT products.

[0016] In one specific embodiment of the present invention, the invention mainly includes a functional test module, an adapter, a bus backplane, and a power supply. The functional test module includes a basic unit, a PCM simulation unit, and an expansion unit. The power supply mainly powers the basic unit, PCM simulation unit, and expansion unit in the functional test module, as well as the adapter.

[0017] In a specific embodiment of the present invention, all test requirements can be classified according to digital signals, analog signals, and test coupling. Based on the classification of test requirements, the functional test module is divided into a basic unit, a PCM analog unit, and an extension unit. The basic unit, PCM analog unit, and extension unit each provide some test functions to meet some test requirements.

[0018] In a specific embodiment of the present invention, the basic unit can be used for functional testing of bus communication and discrete quantity control, the PCM simulation unit can be used for functional testing of analog quantities and PCM code streams, and the extension unit can be used for testing of remaining customized functions.

[0019] In a specific embodiment of the present invention, the basic unit mainly provides 80% of the testing functions required by the product under test, the PCM simulation unit mainly provides 15% of the testing functions required by the product under test, and the extension unit provides the remaining testing functions required by the product under test.

[0020] The adapter is mainly used to condition product signals and achieve electrical connection with the test system. Each unit module is electrically connected through a bus backplane.

[0021] All products under test are categorized according to their functional circuits, with circuits having the same function grouped into one category or functional module. After functional categorization, the types of product tests and the quantity of each functional type are statistically analyzed. Based on the frequency of occurrence of the test types and the specific quantity of each test type within the product, and considering the coupling between test types, test function requirements are divided. The final result allocates 80% and 15% of the commonly used test function requirements to the basic unit and PCM simulation unit, respectively, while the expansion unit provides test functions for the remaining individual test requirements.

[0022] The product under test is electrically connected to the basic unit and PCM simulation unit within the test system via an adapter and a backplane bus. The minimum embedded test system within the basic unit completes the corresponding product test and displays and stores the test results and test data on the host computer via the communication bus. The embedded test system within the PCM simulation unit completes the product test and transmits the test data to the basic unit via the backplane bus. The basic unit then uploads the data to the host computer for display and storage.

[0023] For the remaining functions that require expansion unit testing, the product under test is directly electrically connected to the expansion unit, and the product testing is completed in the embedded test system of the expansion unit. The test data is transmitted to the basic unit through the backplane bus, and the basic unit then uploads it to the host computer for display and storage.

[0024] The host computer general testing software displays and stores the product testing status and test data.

[0025] This invention divides the test requirements of the product under test into a requirement library, optimizes the test functions of the test equipment, and further divides and optimizes the test requirements of the product under test in detail. Based on the division and optimization results, it allocates specific functional modules of basic units, PCM simulation units, and expansion units, and realizes the construction of a minimal embedded test system in each unit. It realizes the construction of a general embedded test system and the interaction of information and instructions between unit modules within the system through a backplane bus. It meets the needs of different products under test for the generalization of test equipment and the maximization of resource utilization.

[0026] The purpose of this invention is to provide a modular and universal embedded testing system that can quickly set up the hardware environment of the testing system when the product's technical status changes, and maximize the utilization of the testing system's hardware resources. The testing function parameters of the basic unit and PCM simulation unit in the embedded testing equipment are optimized and reduced to meet the testing needs of over 95% of all product categories. Furthermore, expansion units are used to supplement specific product testing requirements, thereby satisfying the testing needs of all product categories and achieving universality of the embedded testing system. The adapter mainly implements the signal conditioning function between the product under test and the testing system. The adapter is designed according to the electrical interface requirements of each functional module of the product to meet the testing needs of different products.

[0027] In one specific embodiment of the present invention, compared with the traditional circuit board assembly and complete machine testing system, the embedded general-purpose testing system of the present invention divides the functional modules of basic unit, PCM simulation unit and expansion unit according to the testing requirements of circuit board assembly and complete machine, and builds the product testing system by using a minimized embedded testing system and backplane bus, thereby realizing the requirements of universalization of embedded testing equipment and maximization of hardware resource utilization.

[0028] In the event of a new product or a change in the technical status of a product, this invention can quickly and maximize the use of existing hardware resources to build an embedded test system, minimize the waste and discarding of test equipment resources, greatly reduce the R&D costs and development cycle of test equipment, and greatly ensure the maturity and reliability of test equipment and test systems.

[0029] The above embodiments are merely preferred embodiments of the present invention. Therefore, all equivalent changes or modifications made to the structure, features and principles described in the scope of the present invention are included within the scope of the present invention.

Claims

1. An embedded universal testing system, characterized in that, It includes a functional test module, an adapter, a bus backplane, and a power supply. The adapter is electrically connected to the product under test, and the power supply supplies power to the functional test module and the adapter. The functional test module, the adapter, and the power supply are electrically connected through the bus backplane. The functional test module is used to perform classified testing of the product under test according to the testing requirements.

2. The embedded universal testing system according to claim 1, characterized in that, The functional testing module is divided as follows: All test requirements are categorized according to digital signals, analog signals, and test coupling. Based on the classification of test requirements, the functional test module is divided into basic units, PCM simulation units, and extended units. The basic units, PCM simulation units, and extended units each provide some test functions to meet some test requirements.

3. The embedded universal testing system according to claim 2, characterized in that, The basic unit is used for functional testing of bus communication and discrete quantity control, the PCM simulation unit is used for functional testing of analog quantities and PCM code streams, and the extension unit is used for testing the remaining customized functions.

4. The embedded universal testing system according to claim 2, characterized in that, The basic unit meets 80% of the testing requirements, the PCM simulation unit meets 15% of the testing requirements, and the extended unit meets the remaining testing requirements.

5. The embedded universal testing system according to claim 2, characterized in that, Both the basic unit and the PCM simulation unit are electrically connected to the adapter via a backplane bus, and the adapter is electrically connected to the product under test.

6. The embedded universal testing system according to claim 2, characterized in that, The expansion unit is directly electrically connected to the product under test.

7. The embedded universal testing system according to claim 2, characterized in that, The basic unit transmits test results and test data to the host computer via a communication bus, where the host computer displays and stores the data.

8. The embedded universal testing system according to claim 2, characterized in that, The PCM simulation unit transmits test data and test results to the basic unit via the backplane bus, and then the basic unit uploads the test data and test results to the host computer for display and storage.

9. An embedded universal testing system according to claim 2, characterized in that, The expansion unit transmits test data and test results to the basic unit via the backplane bus, and the basic unit then uploads the test data and test results to the host computer for display and storage.

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