Testability forward design method taking hierarchical fault mode as center

By adopting a testable forward design method centered on hierarchical failure modes, testable requirements are systematically identified and designed, solving the problem of missing failure modes in traditional testable design. This enables timely detection and isolation of product failures and improves the operability and coverage of product testable design.

CN121901102APending Publication Date: 2026-04-21XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
Filing Date
2025-12-24
Publication Date
2026-04-21

AI Technical Summary

Technical Problem

Traditional test design lacks a systematic approach and relies on experience, leading to the omission of critical failure modes, which affects product evaluation and production cycles, and increases operating costs.

Method used

We adopt a testable forward design approach centered on hierarchical failure modes, which decomposes product functions layer by layer, identifies potential failure modes, establishes test requirements, and forms a systematic test design scheme.

Benefits of technology

Ensure that potential failure modes are fully covered, achieve pre-failure detection and post-failure isolation, improve product testability, and reduce quality losses caused by design defects.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN121901102A_ABST
    Figure CN121901102A_ABST
Patent Text Reader

Abstract

The invention provides a testability forward design method taking a hierarchical fault mode as a center, and relates to the field of general quality characteristic design, which comprises the following steps: determining product functions according to user requirements, distributing the functions according to physical or logic composition, forming a product architecture design and a high-level product component list, and setting the product architecture design and the high-level product component list; performing multi-angle fault mode analysis on each function corresponding to the high-level product assembly, and performing testability demand analysis on each fault mode; the method comprises the following steps: firstly, carrying out multi-level product component analysis on each high-level product component, further carrying out detailed design and function distribution on each high-level product component to form a detailed product design and low-level product component list, carrying out multi-angle fault mode analysis on each sub-function corresponding to each low-level product component, and carrying out testability design analysis on each sub-fault mode. The method can solve the problem of insufficient systematicness and completeness of product testability design, and provides a specific and clear implementation path for product testability architecture design and testability detailed design.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This invention relates to the field of general quality characteristic design technology, and specifically to a testable forward design method centered on hierarchical failure modes. Background Technology

[0002] Testability is the ability of a product to determine its status (whether it is functional, inoperable, or degraded) in a timely and accurate manner, and to isolate its internal faults.

[0003] Traditional testability requirements analysis is mainly based on the allocation of quantitative indicators. However, the design of quantitative indicators does not focus on the potential failures of the product. Meeting the indicators does not mean that all potential failures are testable. Secondly, traditional testability design lacks a systematic design methodology and relies too much on the experience of designers. Especially for products with complex design mechanisms, it is easy to overlook the testability analysis and design of key failure modes. This results in a lack of detection and isolation methods when failures occur, causing great trouble for failure prevention, location and elimination, affecting product evaluation and production cycle, and leading to operating cost losses. Summary of the Invention

[0004] In view of this, embodiments of this application provide a testable forward design method centered on hierarchical failure modes. This method can realize hierarchical testable requirement identification and detailed solution design and implementation path, achieve systematic and structured testable design, ensure testable coverage of all potential failures of concern during the design process, and solve problems such as product failures not being detected in time, failure to be perceived by users after detection, and difficulty in isolating and repairing due to excessively large detection range.

[0005] This application provides the following technical solution: a testable forward design method centered on hierarchical failure modes, comprising: Step 1: Determine product functions based on user needs, allocate the product functions according to physical or logical components to form a product architecture design and a list of high-level product components; according to the product function succession relationship in the product architecture design, construct a main function list corresponding to each high-level product component in the list of high-level product components, so that the main function lists of all high-level product components are merged to fully realize all the functions of the product. Step 2: Conduct multi-angle failure mode analysis on each function in the main function list of each high-level product component to form a main function failure mode list corresponding to each function. Step 3: Conduct test requirement analysis for each failure mode in the main function failure mode list to form a main function failure mode test requirement list corresponding to the failure mode; Step 4: After completing Steps 2 and 3, merge and synthesize the test requirements list of all main functional failure modes formed for all high-level product components to form the product test architecture design. Step 5: Further refine the design and allocate functions for each high-level product component in the product architecture design to form a detailed product design and a list of low-level product components; according to the product function succession relationship in the detailed product design, construct a sub-function list corresponding to each low-level product component in the list of low-level product components, so that the sub-function lists of all low-level product components can be merged to fully implement all the functions in the main function list of the corresponding high-level product component; Step 6: Conduct multi-angle failure mode analysis for each function in the sub-function list of each low-level product component to form a sub-function failure mode list corresponding to each function. Step 7: Based on the impact of each sub-function failure mode on the failure of higher-level product components, establish the causal relationship between sub-function failure modes and main function failure modes. Step 8: With the goal of meeting the product testability architecture design and the testability requirements of the main functional failure modes with causal relationships, conduct sub-functional failure mode testability design analysis to form a detailed product testability design.

[0006] According to one embodiment of this application, depending on the complexity of the product, both the high-level product component and the low-level product component may include one or more layers.

[0007] According to one embodiment of this application, the product functions include a product function description, function indicators, standards, and regulatory requirements.

[0008] According to one embodiment of this application, in step two, a multi-angle failure mode analysis is performed on each function in the main function list of each high-level product component. The multi-angle failure mode analysis is to analyze the possible failure manifestations of each product function from multiple perspectives, including complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, delayed or premature effectiveness of function.

[0009] According to one embodiment of this application, in step three, test requirements analysis is carried out for each failure mode in the main function failure mode list. The test requirements analysis is to analyze the degree of failure impact on product users, manufacturers, environment, or upstream products of this product when each failure mode occurs, and determine the expected failure prevention and solutions based on the degree of failure impact, thus determining the test requirements of the failure mode from multiple perspectives.

[0010] According to one embodiment of this application, the test requirements for the failure mode are determined from four perspectives: test requirements, isolation requirements, storage requirements, and reporting requirements.

[0011] According to one embodiment of this application, the test requirements are used to determine whether test design is needed for the failure mode. If so, it is determined whether to monitor before the failure occurs to achieve the purpose of fault early warning, or to monitor the phenomenon after the failure occurs, and the monitoring objects and indicators need to be clearly defined. The isolation requirement is used to determine whether additional detection points are needed so that the fault location can be identified and narrowed down based on the performance of the detection point indicators when a fault occurs. The storage requirements are used to determine whether the data generated by testing and isolation requirements needs to be stored in a specified location at a specified time and in a specified format. The reporting requirement is used to determine whether the data generated by the testing and isolation requirements needs to be reported to the specified objects at the specified time, in the specified format, and in the specified manner.

[0012] According to one embodiment of this application, in step four, the testability requirements list of all main functional failure modes formed after completing steps two and three for all high-level product components is merged and synthesized to form a product testability architecture design, including: The test requirements corresponding to the main function failure mode list are classified, and the test requirements and isolation requirements are summarized and mapped to hardware test point requirements and software test point requirements. The storage requirements are mapped to test hardware storage resource requirements and test software recording requirements. The reporting requirements are mapped to test hardware communication requirements and test software communication requirements. With the goal of covering all test requirements, a product test architecture design scheme is formed.

[0013] Compared with the prior art, the beneficial effects that at least one technical solution adopted in the embodiments of this specification can achieve include at least: 1. The embodiments of the present invention establish a test requirement identification centered on failure modes, and carry out test design with the goal of failure prevention, failure detection and failure isolation. Compared with the previous test design aimed at test indicators, this method is more operable and has more practical value for product application.

[0014] 2. The embodiments of the present invention are a systematic and hierarchical method for identifying and transmitting testability requirements, ensuring that no potential failure modes are overlooked and guaranteeing the coverage of product failures by the testability design; the top-level testability requirements are broken down and closed-loop layer by layer, ensuring the uniformity of the product testability design scheme.

[0015] 3. The embodiments of the present invention analyze and design the testability requirements of "test-isolation-storage-reporting" for each failure mode, ensuring that the potential failure modes of the product have the ability to be perceived before the failure, isolated after the failure, reconstructed at the failure site, and responded to after the failure. The overall testability design is more detailed and comprehensive, improving the overall testability level of the product.

[0016] 4. In the embodiments of the present invention, testable forward design centered on hierarchical failure modes is carried out in the preliminary architecture design and detailed design stages of the product. The resources required for testability can be evaluated in the early stage of the design, and the product design can be revised. This avoids quality loss caused by insufficient design considerations, which may result in the product failures being undetectable before they occur or difficult to test or isolate after they occur. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the architecture of the testable forward design method according to an embodiment of the present invention; Figure 2 This is a product architecture according to an embodiment of the present invention; Figure 3 This is a product architecture tree diagram according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the architecture for hierarchically allocating product functions according to an embodiment of the present invention. Detailed Implementation

[0019] The embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0020] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. This application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0021] like Figure 1As shown, this embodiment of the invention provides a testability forward design method centered on hierarchical failure modes, applicable to the testability architecture design and detailed testability design of complex products. It includes: Step 1: Determine product functions based on user needs, allocate the product functions according to physical or logical components to form a product architecture design and a list of high-level product components; according to the product function succession relationship in the product architecture design, construct a main function list corresponding to each high-level product component in the list of high-level product components, so that the main function lists of all high-level product components are merged to fully realize all the functions of the product. Step 2: Conduct multi-angle failure mode analysis on each function in the main function list of each high-level product component to form a main function failure mode list corresponding to each function. Step 3: Conduct test requirement analysis for each failure mode in the main function failure mode list to form a main function failure mode test requirement list corresponding to the failure mode; Step 4: After completing Steps 2 and 3, merge and synthesize the test requirements list of all main functional failure modes formed for all high-level product components to form the product test architecture design. Step 5: Further refine the design and allocate functions for each high-level product component in the product architecture design to form a detailed product design and a list of low-level product components; according to the product function succession relationship in the detailed product design, construct a sub-function list corresponding to each low-level product component in the list of low-level product components, so that the sub-function lists of all low-level product components can be merged to fully implement all the functions in the main function list of the corresponding high-level product component; Step 6: Conduct multi-angle failure mode analysis for each function in the sub-function list of each low-level product component to form a sub-function failure mode list corresponding to each function. Step 7: Based on the impact of each sub-function failure mode on the failure of higher-level product components, establish the causal relationship between sub-function failure modes and main function failure modes. Step 8: With the goal of meeting the product testability architecture design and the testability requirements of the main functional failure modes with causal relationships, conduct sub-functional failure mode testability design analysis to form a detailed product testability design.

[0022] In this embodiment of the invention, a hierarchical product architecture is established during the initial product design phase, such as... Figure 1As shown, a list of high-level and low-level product components is formed. Product functions are then allocated hierarchically to each level of product components, forming a main function list for high-level product components and a sub-function list for low-level product components. The combined function lists of all high-level products ensure that all product functions are implemented; the combined sub-function lists of all low-level product components corresponding to each high-level product ensure that all functions of that high-level product are implemented, and establishes a corresponding relationship between the sub-function lists and the main function lists.

[0023] In some embodiments of the present invention, when the product is complex, it can be divided into product components with more than three layers, with each pair of layers serving as a high-level and a low-level component, and the above process is repeated. Test design is completed level by level. Depending on the complexity of the product, both the high-level and low-level product components can include one or more layers. The terms "high-level" and "low-level" are relative; the higher the level, the larger the granularity of the breakdown. The product functions of the high-level components are undertaken by the lower-level components with smaller granularity. The lower the level, the smaller the granularity of the breakdown, the more singular the function undertaken, and the more detailed the product design.

[0024] In some embodiments of the present invention, the product function refers to the role that the product or component performs as designed, including the product's functional description, functional indicators, standards and regulatory requirements.

[0025] In some embodiments of the present invention, in step two, a multi-angle failure mode analysis is performed on each function in the main function list of each high-level product component. The multi-angle failure mode analysis is to analyze the possible failure manifestations of each product function from multiple perspectives, including complete failure, partial failure, unexpected function, intermittent effectiveness, delayed or early effectiveness, i.e., failure mode.

[0026] Specifically, for each function in the main function list of each high-level product component, potential failure modes are identified from seven perspectives: "complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, and delayed or premature effectiveness of function," forming a main function failure mode list for high-level product components. For each main function failure mode, the degree of damage to product users, manufacturers, the environment, or the product above this level is determined based on the failure impact of each main function failure mode.

[0027] In some embodiments of the present invention, in step three, test requirements analysis is carried out for each failure mode in the main function failure mode list. The test requirements analysis is to analyze the degree of failure impact on product users, manufacturers, environment, or upstream products of this product when each failure mode occurs, and determine the expected failure prevention and solutions based on the degree of failure impact. The test requirements for the failure mode are determined from four perspectives: test requirements, isolation requirements, storage requirements, and reporting requirements.

[0028] The test requirements are used to determine whether test design is needed for the failure mode. If so, it is determined whether to monitor before the failure occurs to achieve the purpose of failure early warning, or to monitor the phenomenon after the failure occurs, and the monitoring objects and indicators need to be clearly defined. The isolation requirement is used to determine whether additional detection points are needed so that the fault location can be identified and narrowed down based on the performance of the detection point indicators when a fault occurs. The storage requirements are used to determine whether the data generated by testing and isolation requirements needs to be stored in a specified location at a specified time and in a specified format. The reporting requirement is used to determine whether the data generated by the testing and isolation requirements needs to be reported to the specified objects at the specified time, in the specified format, and in the specified manner.

[0029] In practical implementation, this embodiment conducts a "test-isolate-store-report" analysis of the failure mode based on the degree of damage, forming test requirements: (1) Determine whether testing is necessary: ​​When the impact of the fault is serious, monitoring is required before the fault occurs to achieve the purpose of fault early warning; when the impact of the fault is acceptable, or the fault cannot be warned before the fault occurs, monitoring is required after the fault occurs in order to facilitate fault troubleshooting. When the impact of the fault is minor, testing is not necessary.

[0030] (2) When testing is required, the monitoring objects and indicators need to be determined. When the monitoring objects and indicators need to be obtained through test points, test point requirements are formed. If the test points must be detected by external detection equipment, hardware test points should be formed. When the test points can be tested during product operation through software setting registers, software test points should be formed.

[0031] (3) Determine whether isolation is necessary: ​​When the fault range is too large or the fault object is difficult to determine, and it is necessary to narrow down the fault location, test points and indicators should be added to isolate the fault. (4) Determine if storage is necessary: ​​When it is necessary to record the monitoring objects and indicators before and after the fault to provide necessary information for fault diagnosis, the requirement for test storage should be increased. The timing of storage, the content to be stored, and the format of storage should be clearly defined; (5) Determine if reporting is necessary: ​​When test data needs to be reported to users or other devices, a test reporting requirement should be added. The timing, content, and format of the reporting should be clearly defined. All "test-isolation-storage-reporting" requirements identified from the list of failure modes for all main functions are categorized and summarized to form a test architecture design. If the current product architecture design resources do not meet the requirements, feedback is given to the product owner to increase hardware resources and software tasks, and to revise the product architecture design.

[0032] In this embodiment, for each function in the main function list of each low-level product component, potential failure modes are identified from seven perspectives: "complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, and delayed or premature effectiveness of function," forming a sub-function failure mode list for low-level product components. For each sub-function failure mode, its impact on the failure of high-level product components is analyzed, that is, the main function failure mode corresponding to the sub-function failure mode is identified, and the connection relationship between the sub-function failure mode and the main function failure mode is established.

[0033] In this embodiment, the testability requirements for identifying main function failure modes in testability architecture design are taken as the target, and a "test-isolation-storage-reporting" analysis of sub-function failure modes is carried out. That is, when the testability indicators of the main function failure mode are strongly correlated with a certain indicator of the sub-function failure mode, the "test-isolation-storage-reporting" of the corresponding indicator of the sub-function failure mode is carried out.

[0034] In this embodiment, after the analysis of all sub-function failure modes is completed, all "test-isolation-storage-reporting" requirements identified in the list of all sub-function failure modes are categorized and summarized to form a testable detailed design scheme. If the current product detailed design does not meet the requirements, feedback is given to the product manager to add test point layout, hardware and software resources, and software tasks to revise the product detailed design.

[0035] In some embodiments of the present invention, step four involves merging and synthesizing similar items from the main functional failure mode testability requirement lists formed after completing steps two and three for all high-level product components, to form a product testability architecture design, including: The test requirements corresponding to the main function failure mode list are classified, and the test requirements and isolation requirements are summarized and mapped to hardware test point requirements and software test point requirements. The storage requirements are mapped to test hardware storage resource requirements and test software recording requirements. The reporting requirements are mapped to test hardware communication requirements and test software communication requirements. With the goal of covering all test requirements, a product test architecture design scheme is formed.

[0036] In practical implementation, the hardware test points require external detection equipment (not from this product) to measure the indicators, while the electrical measurement points are reserved on the PCB board of this product for measurement. The software test points are measurement points that can be measured by software, and can be read periodically or in real-time, such as registers. The test hardware storage resource requirements include hardware memory sufficient to meet all storage needs of the test. The test software recording requirements include the storage task of writing test results into the hardware memory during software operation, including the timing, content, and format of recording. The test hardware communication requirements include communication channels established to meet test reporting requirements, including communication types and hardware transceivers matching the communication types. The test software communication requirements include the communication task of reporting test results externally during software operation, including communication protocols, communication timing, and communication content.

[0037] In one specific embodiment, such as Figure 2 The diagram shows a product architecture in this embodiment. A product consists of five main components: A, B, C, D, and E. Each of these five components is further composed of its internal components such as A1, A2, B1, and B2.

[0038] like Figure 3 As shown, it is to Figure 2 The product composition is displayed using a tree diagram. The five components AE form the high-level components of the product, while A1, A2, B1, B2, etc. form the low-level components of the product.

[0039] like Figure 4 As shown, product functions are allocated hierarchically. High-level components such as AE undertake and fully implement all functions of the product. The functions of high-level components such as AE form their respective high-level master function lists (yellow dashed boxes, such as the master function list of high-level component A containing function 1 and function 3). Low-level components such as A1-E2 undertake and fully implement all functions of their corresponding high-level components. The functions of low-level components such as A1-E2 form their respective low-level sub-function lists (green dashed boxes, such as the sub-function list of low-level component A1 containing function 11 and function 12, implementing part of the function 1 of component A).

[0040] First, identify the potential failure modes of each function in the main function list of high-level product components in turn, forming a main function failure mode list (red dashed box). That is, start identifying the potential failure modes of function 1 of component A in turn, and continue until the potential failure modes of function 9 of component E are identified.

[0041] When identifying failure modes, taking high-level product component D as an example, potential failure modes of function 4 are identified from seven aspects: "complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, and delayed or premature effectiveness of function". Then, potential failure modes of function 6 are identified from seven aspects: "complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, and delayed or premature effectiveness of function", thus forming a list of failure modes of the main functions of high-level component D.

[0042] Secondly, conduct failure impact analysis for all main function failure modes to assess the damage and acceptable level of damage to the product, people, and environment when the failure occurs. Based on this, decide whether the failure mode needs to be monitored, when to monitor continuously or periodically, whether the monitoring target is post-failure alarm or pre-failure alarm, the handling measures after alarm, and whether the monitoring results need to be stored. This will form the test requirements for the main function failure modes and refine them into test requirements.

[0043] Third, comprehensively consider the testability requirements of all main function failure modes, merge similar items, and form a testability architecture design.

[0044] Fourth, identify the potential failure modes of each function in the sub-function list of lower-level product components in turn, forming a sub-function failure mode list (purple dashed box). That is, start identifying the potential failure modes of function 11 of component A1 in turn, until the identification of the potential failure modes of sub-functions of component E2 is completed.

[0045] When identifying failure modes, taking low-level product component D1 as an example, the potential failure modes of function 41 are identified from five aspects: "complete failure", "partial failure", "unexpected function", "intermittent function" and "delayed function". Then, the potential failure modes of function 61 are identified from five aspects: "complete failure", "partial failure", "unexpected function", "intermittent function" and "delayed function", forming a list of failure modes of sub-functions of low-level component D1.

[0046] Fifth, conduct failure impact analysis on all sub-function failure modes, assess and match the corresponding high-level failure modes when the failure occurs, and establish the causal relationship between sub-function failure modes and main function failure modes. For example, the result of the complete failure of function 41 is the complete failure of function 4, and a causal relationship is established between the two.

[0047] Sixth, based on the main functional testability requirements in the testability architecture design, conduct sub-functional testability "test-isolate-store-report" design to form a detailed testability design scheme. For example, if function 41 completely fails, the result is that function 4 completely fails. Therefore, it is necessary to address the testing, isolation, storage, and reporting requirements for "complete failure of function 4" identified during the architecture design. Thus, the indicators related to the above requirements should be analyzed during the design process of function 41, and the requirements should be implemented through specific measures such as adding registers, hardware test points, and software interfaces, forming detailed testability design requirements for low-level sub-functional failure modes.

[0048] Seventh, summarize and categorize all detailed test design requirements to form a detailed test design scheme.

[0049] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A testable forward design method centered on hierarchical failure modes, characterized in that: include: Step 1: Determine product functions based on user needs, allocate the product functions according to physical or logical components to form a product architecture design and a list of high-level product components; according to the product function succession relationship in the product architecture design, construct a main function list corresponding to each high-level product component in the list of high-level product components, so that the main function lists of all high-level product components are merged to fully realize all the functions of the product. Step 2: Conduct multi-angle failure mode analysis on each function in the main function list of each high-level product component to form a main function failure mode list corresponding to each function. Step 3: Conduct test requirement analysis for each failure mode in the main function failure mode list to form a main function failure mode test requirement list corresponding to the failure mode; Step 4: After completing Steps 2 and 3, merge and synthesize the test requirements list of all main functional failure modes formed for all high-level product components to form the product test architecture design. Step 5: Further refine the design and allocate functions for each high-level product component in the product architecture design to form a detailed product design and a list of low-level product components; according to the product function succession relationship in the detailed product design, construct a sub-function list corresponding to each low-level product component in the list of low-level product components, so that the sub-function lists of all low-level product components can be merged to fully implement all the functions in the main function list of the corresponding high-level product component; Step 6: Conduct multi-angle failure mode analysis for each function in the sub-function list of each low-level product component to form a sub-function failure mode list corresponding to each function. Step 7: Based on the impact of each sub-function failure mode on the failure of higher-level product components, establish the causal relationship between sub-function failure modes and main function failure modes. Step 8: With the goal of meeting the product testability architecture design and the testability requirements of the main functional failure modes with causal relationships, conduct sub-functional failure mode testability design analysis to form a detailed product testability design.

2. The testable forward design method centered on hierarchical failure modes according to claim 1, characterized in that: Depending on the complexity of the product, both the high-level product components and the low-level product components may include one or more layers.

3. The testable forward design method centered on hierarchical failure modes according to claim 1, characterized in that: The product functions include the product's functional description, functional indicators, standards, and regulatory requirements.

4. The testable forward design method centered on hierarchical failure modes according to claim 1, characterized in that: In step two, a multi-angle failure mode analysis is conducted on each function in the main function list of each high-level product component. The multi-angle failure mode analysis is to analyze the possible failure manifestations of each product function from multiple perspectives, including complete loss of function, partial loss of function, functional degradation, excessive function, unexpected function, intermittent effectiveness, delayed or premature effectiveness of function.

5. The testable forward design method centered on hierarchical failure modes according to claim 1, characterized in that: In step three, test requirements analysis is carried out for each failure mode in the main function failure mode list. The test requirements analysis is to analyze the degree of failure impact on product users, manufacturers, environment, or upstream products when each failure mode occurs, and determine the expected failure prevention and solutions based on the degree of failure impact, thus determining the test requirements for the failure mode from multiple perspectives.

6. The testable forward design method centered on hierarchical failure modes according to claim 5, characterized in that: The test requirements for this failure mode are determined from four perspectives: testing requirements, isolation requirements, storage requirements, and reporting requirements.

7. The testable forward design method centered on hierarchical failure modes according to claim 6, characterized in that: The test requirements are used to determine whether test design is needed for the failure mode. If so, it is determined whether to monitor before the failure occurs to achieve the purpose of fault early warning, or to monitor the phenomenon after the failure occurs, and the monitoring objects and indicators need to be clearly defined. The isolation requirement is used to determine whether additional detection points are needed so that the fault location can be identified and narrowed down based on the performance of the detection point indicators when a fault occurs. The storage requirements are used to determine whether the data generated by testing and isolation requirements needs to be stored in a specified location at a specified time and in a specified format. The reporting requirement is used to determine whether the data generated by the testing and isolation requirements needs to be reported to the specified objects at the specified time, in the specified format, and in the specified manner.

8. The testable forward design method centered on hierarchical failure modes according to claim 7, characterized in that: In step four, the testability requirements lists for all main functional failure modes formed after completing steps two and three for all high-level product components are merged and synthesized to form the product testability architecture design, including: The test requirements corresponding to the main function failure mode list are classified, and the test requirements and isolation requirements are summarized and mapped to hardware test point requirements and software test point requirements. The storage requirements are mapped to test hardware storage resource requirements and test software recording requirements. The reporting requirements are mapped to test hardware communication requirements and test software communication requirements. With the goal of covering all test requirements, a product test architecture design scheme is formed.