Electric power meter testing device

Abstract

The invention discloses an electric power instrument testing device which comprises a testing instrument, a measuring head piece and a contact pin head, wherein the measuring head piece and the contact pin head are electrically connected with the measuring head end of the testing instrument. The measuring head piece comprises an insulating sleeve head, a clamping part and a shaft rod which is rotatably mounted on the inner side of the insulating sleeve head, a static chuck and a movable chuck are arranged in the clamping part, through a thread and a spiral groove structure on the surface of the shaft rod, rapid adjustment of the clamping distance is realized under driving of an external shifting ring, and the measuring head piece is used for stably and rigidly clamping structures such as cable ends, tabs or copper bars. The contact head is electrically connected with the measuring head piece, and the surface of the contact head is provided with a gap clamping groove, a wire clamping hole and a meshing groove, so that elastic clamping or hanging of a contact, a wire and a needle-shaped electrode can be realized. Through the combined arrangement of the elastic contact pin and the adjustable rigid clamping structure, the test contact pin can adapt to test contacts of various shapes and specifications, the problems that a traditional contact pin is difficult to maintain and an alligator clip is easy to fall off are avoided, the stability and operation convenience of test connection are improved, and the test contact pin is suitable for complex power test working conditions.

Description

Technical Field

[0001] This invention relates to the field of power instrument testing technology, specifically to a power instrument testing device. Background Technology

[0002] Power meters are widely used in electrical equipment testing, line debugging, and operation and maintenance. The accuracy of their test results largely depends on the stability of the electrical connection between the testing device and the object under test. In current power meter testing processes, electrical connections are typically achieved using stylus-type test pens, alligator clips, or simple clamp-type probes for test contacts of different shapes and specifications.

[0003] In existing technologies, stylus-type test pens are mostly single needle-shaped or cone-shaped structures, relying on manual hand-holding to bring the stylus tip into contact with the point being tested. While this type of structure is suitable for instantaneous point testing or space-constrained testing scenarios, in actual use, the operator needs to apply continuous force to maintain the contact position. It is difficult to maintain stable contact during long-term testing or continuous monitoring. Even slight loosening may lead to changes in contact resistance or interruption of the test signal, affecting the reliability of the measurement results.

[0004] Furthermore, alligator clips, as a common clamping test structure, typically use springs to provide clamping force and are suitable for clamping wires or sheet terminals. However, the clamping angle and clamping spacing of alligator clips are basically fixed. For irregularly shaped cable ends, tabs, or copper busbars with large variations in thickness, it is often difficult to achieve a stable fit, which can easily lead to clamping misalignment, insufficient contact area, or even detachment under vibration or pulling. At the same time, alligator clips mostly rely on a single elastic structure to provide clamping force, and the elasticity decays after prolonged use, further reducing clamping reliability.

[0005] To address complex testing conditions, some existing testing devices attempt to improve connection stability using methods such as screw tightening and knob clamping. However, these structures typically require repeated tightening and adjustment, resulting in cumbersome operation, low clamping and release efficiency, and difficulty in rapid adjustment during testing. This makes it challenging to meet the practical needs of frequent switching between multiple test points and various specifications of objects on-site. Furthermore, traditional clamping structures are mostly single-clamping methods, making it difficult to accommodate multiple testing requirements such as point contact, elastic clamping, and rigid clamping, thus limiting their applicability.

[0006] Therefore, existing power instrument testing devices generally suffer from insufficient adaptability, difficulty in maintaining stable contact of the probes over long periods, easy detachment of elastic clamps such as alligator clips, and low clamping and adjustment efficiency. These issues make it difficult to meet the comprehensive requirements of diverse contact points, long-term monitoring, and ease of operation in complex power testing scenarios. There is an urgent need for a power instrument testing device that can simultaneously incorporate multiple clamping methods, operate quickly, and provide stable connections to overcome these shortcomings and improve the reliability and practicality of testing work. Summary of the Invention

[0007] This invention aims to solve the problems commonly found in existing power instrument testing processes, such as the difficulty in maintaining stable contact for extended periods with stylus-type testing devices, the easy detachment of elastic clamps like alligator clips, insufficient adaptability to test contacts of different shapes and specifications, and cumbersome clamping and adjustment operations. These problems make it difficult to meet the comprehensive requirements of reliability, versatility, and ease of operation under complex power testing conditions. This invention proposes a power instrument testing device to achieve stable connection and rapid switching of various test contacts.

[0008] The overall technical solution of the present invention is as follows: a power meter testing device is provided, which includes a testing instrument and a probe and a contact tip electrically connected to the probe end of the testing instrument; by combining the elastic contact tip structure with the adjustable rigid clamping structure, the device can flexibly use point contact, elastic clamping or rigid clamping methods to test various tested structures such as contacts, wires, cable ends, electrodes and copper busbars, thereby improving the stability and applicability of the test connection.

[0009] In a preferred embodiment, the probe is further configured such that it includes an insulating sleeve, a clamping part, and a shaft rotatably mounted inside the insulating sleeve. The clamping part is fixedly sleeved inside the insulating sleeve, providing operational protection through the insulating sleeve and providing a stable mounting base for the internal clamping and transmission structure.

[0010] In a preferred embodiment, the clamping part is further configured such that it includes a slide rail, a slide rod, a stationary clamp, and a movable clamp that is slidably sleeved on the surface of the slide rod. The stationary clamp and the movable clamp are arranged opposite to each other to form a clamping area, which can achieve stable rigid clamping of block or sheet-shaped test pieces such as cable ends, tabs, or copper busbars, and is suitable for long-term monitoring and testing.

[0011] In a preferred embodiment, the shaft is rotatably mounted on the inner side of the slide rail, and the surface of the shaft is provided with threads and a helical groove. The movable chuck is adapted to the thread, and the stationary chuck is adapted to the helical groove. When the shaft rotates, it realizes linear drive of the movable chuck relative to the stationary chuck, thereby completing the clamping or releasing action. The structure is compact and the transmission is reliable.

[0012] In a preferred embodiment, the insulating sleeve is further configured such that a groove is provided on its surface, and a slidable ring is slidably sleeved in the groove. The slidable ring is fixedly connected to a sliding block provided on the surface of the shaft. The operator only needs to move the slidable ring to drive the shaft to rotate, thereby realizing rapid adjustment of the clamping distance and improving on-site operation efficiency.

[0013] In a preferred embodiment, the opposing surfaces of the stationary and moving chucks are detachably equipped with electrode contacts, and the surface of the electrode contacts is provided with a corrugated tooth structure to increase the contact area and friction with the surface of the terminal being tested, improve the conductivity stability, and prevent loosening of the contact during the test.

[0014] In a preferred embodiment, the stylus tip is further configured to be electrically connected to the probe assembly, and the stylus tip has a conical needle-like structure, which can directly form reliable contact with point contacts or needle-like electrodes, making it suitable for fine-grained or space-constrained testing scenarios.

[0015] In a preferred embodiment, the probe tip is further configured to be made of an elastic metal material, and its surface has a V-shaped groove for clamping. By utilizing the elastic deformation of the probe tip, a clamping contact is formed with the wire or needle electrode, thereby achieving a rapid test connection without the need for additional clamps.

[0016] In a preferred embodiment, the probe tip surface is further configured with a plurality of wire clamp holes along the length direction to accommodate wires or needle electrodes of different diameters, thereby expanding the adaptability of the device to test objects of different specifications and improving the versatility of the test.

[0017] In a preferred embodiment, the surface of the stylus tip is further provided with a groove for attaching or locking the stylus tip onto a sheet-like or columnar test terminal, maintaining stable contact without continuous manual force, which is suitable for complex postures or long-term test conditions.

[0018] The beneficial effects achieved by this invention are as follows: 1. The present invention is equipped with probes and contact tips with various structural forms, enabling the device to adapt to test objects of different shapes and specifications. The probes and contact tips work together to achieve reliable contact with various tested structures such as contacts, cable ends, electrodes, and copper busbars, significantly improving the adaptability and versatility of the power instrument testing device in complex testing scenarios.

[0019] 2. This invention combines the elastic clamping method of the stylus tip with the rigid clamping method of the probe. In actual use, it can use the elastic deformation of the stylus tip itself to quickly clamp and test the wire and needle electrode, and can also use the clamping structure inside the probe to stably clamp the cable end, electrode lug or copper busbar, etc. It is flexible in operation and easy to switch, and can meet the different needs of short-term detection and long-term monitoring tests.

[0020] 3. In this invention, the threaded and helical groove structure on the shaft surface allows the operator to drive the shaft to rotate simply by moving the dial on the outside of the insulating sleeve. This quickly causes the moving chuck to clamp or release relative to the stationary chuck. The structure provides direct transmission and rapid response, reducing operational steps and improving clamping and adjustment efficiency as well as the reliability of the testing process. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of one embodiment of the present invention; Figure 2 This is a schematic diagram of the probe and stylus head structure according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the stylus head structure according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the internal clamping part and shaft structure of the insulating sleeve according to an embodiment of the present invention; Figure 5 This is a schematic diagram of the clamping part and shaft structure according to an embodiment of the present invention; Figure 6 This is an exploded view of the clamping part and shaft according to an embodiment of the present invention; Figure 7 This is a schematic diagram of the electrode tab surface gripping state according to an embodiment of the present invention; Figure 8 This is a schematic diagram of the wire clamping test state according to an embodiment of the present invention; Figure 9 This is a schematic diagram of the copper busbar clamping test state according to an embodiment of the present invention.

[0022] Figure label: 100. Testing instruments; 200. Probe; 210. Insulating sleeve; 220. Clamping part; 230. Shaft; 211. Slide groove; 212. Detachment ring; 221. Slide rail; 222. Slide rod; 223. Stationary chuck; 224. Moving chuck; 225. Electrode contact block; 231. Sliding sleeve block; 232. Thread; 233. Spiral groove; 300, contact tip; 301, gap clamp groove; 302, wire clamp hole; 303, bite groove. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to specific embodiments and accompanying drawings. It should be noted that, unless otherwise specified, the embodiments and features described herein can be combined with each other.

[0024] It should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the invention.

[0025] The following describes, with reference to the accompanying drawings, some embodiments of a power meter testing device provided by the present invention.

[0026] Combination Figures 1-9 As shown, the present invention provides a power meter testing device, including a testing instrument 100, a probe 200 and a contact tip 300 electrically connected to the probe end of the testing instrument 100. This device is used to reliably connect test contacts of different shapes and specifications to achieve stable testing of electrical parameters such as voltage, current, and resistance.

[0027] In this embodiment, the probe 200 includes an insulating sleeve 210, a clamping part 220, and a shaft 230 rotatably mounted inside the insulating sleeve 210. The insulating sleeve 210 serves as an external operating and protective structure, and is entirely made of insulating material to isolate the operator from conductive components, ensuring safety during the testing process. The clamping part 220 is fixedly sleeved inside the insulating sleeve 210 and forms a conductive connection with the testing instrument 100.

[0028] In this embodiment, the clamping part 220 includes a slide rail 221, a slide rod 222, a stationary clamp 223, and a movable clamp 224 slidably sleeved on the surface of the slide rod 222. The stationary clamp 223 is fixedly installed at one end of the slide rod 222, and the movable clamp 224 can move linearly relative to the stationary clamp 223 along the direction of the slide rod 222. The stationary clamp 223 and the movable clamp 224 are arranged opposite to each other to clamp the cable end, electrode lug, or copper busbar under test.

[0029] In this embodiment, the shaft 230 is rotatably mounted on the inner side of the slide rail 221, and a sliding sleeve block 231 is slidably fitted onto the surface of the shaft 230. The surface of the shaft 230 is provided with a thread 232 and a helical groove 233, and the inner sides of the stationary chuck 223 and the movable chuck 224 are respectively provided with threaded rib structures adapted to the helical groove 233 and the thread 232. When the shaft 230 rotates, the thread 232 drives the movable chuck 224 to move along the slide rail 222, while the helical groove 233 forms a limiting fit with the stationary chuck 223, keeping the stationary chuck 223 relatively stable, thereby realizing the clamping or releasing action of the movable chuck 224 relative to the stationary chuck 223.

[0030] In this embodiment, the shaft 230 is arranged along the axial direction of the insulating sleeve 210. A groove 211 is provided on the surface of the insulating sleeve 210, and a slidable ring 212 is slidably sleeved in the groove 211. The slid ring 212 is fixedly connected to the sliding block 231. The operator can manually move the slid block 231 axially by moving the slid ring 212, thereby driving the shaft 230 to rotate, thus quickly clamping or loosening the movable chuck 224 on the stationary chuck 223. The operation is intuitive and the response is rapid, making it suitable for quick on-site adjustment.

[0031] In this embodiment, electrode contacts 225 are detachably mounted on the opposite surfaces of the stationary clamp 223 and the moving clamp 224. The surface of the electrode contacts 225 is provided with a corrugated toothed surface structure, which is used to increase the contact area and friction when clamping cable ends, tabs or copper busbars, thereby improving contact stability and conductivity reliability, and is suitable for long-term monitoring and testing conditions.

[0032] In this embodiment, the probe tip 300 is electrically connected to the probe head 200, and one end of the probe tip 300 is fixed to the surface of the stationary clamp 223. The probe tip 300 has an overall conical needle-like structure with a pointed end, which can directly contact various point contacts or needle-like electrode surfaces, making it suitable for fine testing or measurements in space-constrained locations.

[0033] In this embodiment, the probe tip 300 is made of a flexible metal material, and its surface has a clamping groove 301. The clamping groove 301 is V-shaped and extends through the surface of the probe tip 300. When a wire or needle electrode is inserted into the clamping groove 301, the probe tip 300 deforms under elastic action, forming a clamping contact with the object being tested, thereby achieving a rapid test connection without the need for additional clamps.

[0034] In this embodiment, a plurality of wire clamp holes 302 are arranged sequentially along the length of the surface of the stylus tip 300. Different wire clamp holes 302 correspond to wires or needle electrodes of different diameters. The operator can select the appropriate wire clamp hole 302 to insert according to the size of the object being measured in order to obtain a stable clamping force and good conductivity.

[0035] In this embodiment, the surface of the probe tip 300 is also provided with a groove 303. The groove 303 is used to directly attach or clamp the probe tip 300 onto a sheet-like or columnar test terminal, such as a tab or a small copper busbar, so that the probe tip 300 can maintain stable contact in a vertical or inclined state, further expanding the testing methods.

[0036] Figure 7 This shows the state of the present invention during a bite test on the surface of the electrode. Figure 8 The image shows the state of the wire being clamped during the test. Figure 9 The diagram illustrates the state of the copper busbar being clamped for testing. Through the combination of the various structures described above, this invention allows for flexible selection of either the elastic clamping method of the probe tip 300 or the rigid clamping method of the probe head 200 under different testing conditions, enabling multi-mode testing of point contact, clamping contact, and hook contact.

[0037] Through the above specific implementation methods, the present invention can quickly establish stable and reliable electrical connections for diverse test contacts, overcoming the problems of traditional contact pins being difficult to maintain and alligator clips being easy to fall off, and significantly improving operational efficiency and test stability, making it suitable for widespread application in complex power testing environments.

[0038] Working principle and usage process of this invention: When using the power meter testing device of the present invention for testing, the probe 200 and the contact tip 300 are first electrically connected to the probe end of the test instrument 100, so that the test instrument 100 can form an electrical connection circuit with the object under test through the probe 200 and the contact tip 300.

[0039] 1. In single-point or irregular contact testing conditions, the contact tip 300 has a conical needle-like structure, and its pointed end can directly abut against the surface of the contact being tested, needle-like electrode or conductive terminal to achieve stable point-to-point contact, which is suitable for testing scenarios with limited space or small contact area.

[0040] 2. During the testing of wires or needle electrodes, the elastic properties of the probe tip 300 body, combined with the clamping groove 301 on its surface, allow the probe tip 300 to undergo elastic deformation after insertion into the wire or needle electrode, forming a clamping contact with the wire or needle electrode being tested. Simultaneously, multiple clamping holes 302 arranged along the length of the probe tip 300 surface can be inserted at corresponding positions according to the diameter of the wire being tested, achieving reliable adaptation to wires or needle electrodes of different specifications and ensuring stable contact area and contact pressure.

[0041] 3. In test conditions of planar or block-shaped conductive structures such as cable ends, electrode lugs, or copper busbars, the ring 212 on the surface of the insulating sleeve 210 can be manually moved to drive the internal sliding block 231 to move axially, thereby driving the shaft 230 to rotate. During the rotation of the shaft 230, the threads 232 and helical grooves 233 on its surface respectively cooperate with the threaded edges on the inner side of the moving chuck 224 and the stationary chuck 223, so that the moving chuck 224 slides relative to the stationary chuck 223 along the direction of the sliding rod 222, thereby adjusting the clamping distance between the stationary chuck 223 and the moving chuck 224.

[0042] As the stationary clamp 223 and the moving clamp 224 gradually approach and clamp the surface of the cable end, electrode lug, or copper busbar under test, the detachable electrode contact 225 between the two clamps forms multi-point contact with the surface of the device under test. Its corrugated tooth structure enhances the engagement effect, improving contact stability and conductivity reliability. This clamping structure can stably clamp the device under test without requiring continuous manual force, making it suitable for long-term, continuous electrical parameter monitoring and testing.

[0043] 4. Under other specific test conditions, the groove 303 provided on the surface of the probe 300 can also be used to directly attach or clamp the probe 300 onto the sheet-like or columnar test terminal, so that the device can maintain reliable contact in a vertical or tilted state, further expanding the applicability of the present invention in complex test environments.

[0044] After clamping or contact adjustment is completed, the test instrument 100 can detect parameters such as voltage, current, and resistance of the tested contact, cable end, electrode, or copper busbar through the probe 200 and contact tip 300. After the test is completed, by reversing the dial ring 212, the moving clamp 224 is moved away from the stationary clamp 223, the clamping state is released, and the test device can be removed to enter the next test condition.

[0045] Based on the above working principle and usage process, this invention can flexibly switch test modes for test contacts of various shapes and specifications, realize multi-mode testing of point contact, clamping contact and hanging contact, significantly improve the applicability, stability and ease of operation of power instrument testing, and is particularly suitable for long-term electrical performance monitoring under complex working conditions.

[0046] In the description of this specification, the terms "one embodiment," "some embodiments," "specific embodiment," etc., refer to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0047] Although embodiments of the invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.

Claims

1. A power meter testing device, characterized in that, Includes a test instrument (100) and a probe piece (200) and a probe tip (300) electrically connected to the probe end of the test instrument (100). The probe (200) includes an insulating sleeve (210), a clamping part (220), and a shaft (230) rotatably mounted inside the insulating sleeve (210). The clamping part (220) is fixedly sleeved inside the insulating sleeve (210). The clamping part (220) includes a slide rail (221), a slide rod (222), a stationary clamp (223), and a movable clamp (224) slidably sleeved on the surface of the slide rod (222). The shaft (230) is rotatably mounted on the inner side of the slide rail (221) and a slide block (231) is slidably sleeved on its surface. The stationary clamp (223) is fixed to one end of the slide rod (222), and the movable clamp (224) is threaded onto the surface of the shaft (230). The shaft (230) has a thread (232) and a helical groove (233) on its surface, and the inner sides of the stationary chuck (223) and the movable chuck (224) are respectively provided with thread ridges that are adapted to the surfaces of the helical groove (233) and the thread (232); The surface of the stylus tip (300) is provided with a gap clamping groove (301) and a plurality of wire clamping holes (302) located at one end of the gap clamping groove (301), and the surface of the stylus tip (300) is also provided with a bite groove (303), and one end of the stylus tip (300) is fixed to the surface of the stationary clamp (223).

2. The power meter testing device according to claim 1, characterized in that, The insulating sleeve (210) is a component made of insulating material, and the clamping part (220) and the probe tip (300) are both metal components, used to achieve a reliable electrical connection with the probe end of the test instrument (100).

3. The power meter testing device according to claim 1, characterized in that, Electrode contacts (225) can be detachably installed on the opposite surfaces of the stationary chuck (223) and the moving chuck (224), and the surface of the electrode contacts (225) is provided with corrugated convex teeth to improve the contact stability and conductivity reliability with the surface of the terminal being tested.

4. The power meter testing device according to claim 1, characterized in that, The shaft (230) is arranged along the axial direction of the insulating sleeve (210). The surface of the insulating sleeve (210) is provided with a sliding groove (211), and a dial ring (212) is slidably sleeved on the surface of the sliding groove (211). The dial ring (212) is fixedly connected to the surface of the sliding block (231) and is used to realize synchronous linkage operation of the internal sliding block (231) on the surface of the insulating sleeve (210).

5. The power meter testing device according to claim 1, characterized in that, Both the thread (232) and the helical groove (233) are helical structures, and the pitch and length of the helical groove (233) are greater than the pitch and length of the thread (232), which is used to control the different displacement strokes of the moving chuck (224) when the shaft (230) rotates.

6. The power meter testing device according to claim 1, characterized in that, The stylus tip (300) is a component made of elastic metal, and the gap groove (301) is V-shaped and extends through the surface of the stylus tip (300).

7. The power meter testing device according to claim 1, characterized in that, The clamp holes (302) are arranged sequentially along the length of the probe head (300) to accommodate the insertion test of wires of different specifications.

8. The power meter testing device according to claim 1, characterized in that, The probe (200) and the stylus (300) adopt a modular and detachable structure, so as to facilitate replacement or combination according to different test conditions.

Images