Optical isolator performance comprehensive detection device

Abstract

The invention relates to the technical field of performance detection equipment, and discloses an optical isolator performance comprehensive detection device which comprises a marble vibration isolation base, side seats are arranged on the two sides of the top of the marble vibration isolation base, a rotatable sealing light shield is arranged between the two side seats, and an observation window is arranged in the middle of the front side of the sealing light shield. The sealing light shield and the marble vibration isolation base form a test cavity for carrying out performance detection on the optical isolator; and the aligning and clamping mechanism is arranged in the test cavity and is used for aligning, clamping and fixing the optical isolator to be detected before detection. By adding and arranging the full-wave testing mechanism, when the optical isolator is tested, on one hand, the mechanism outputs continuous light covering the working wave band of a device through a broadband light source, and the continuous light is matched with a polarization scrambler to convert fixed polarized light into full-polarization-state light, so that the polarization scene of actual application of the optical isolator is accurately simulated; the problem of parameter measurement distortion caused by a traditional fixed polarization test is solved.

Description

Technical Field

[0001] This invention relates to the field of performance testing equipment technology, specifically to a comprehensive performance testing device for optical isolators. Background Technology

[0002] An optical isolator is a key passive optical device whose core characteristic is that it allows optical signals to pass through in only one direction while effectively preventing them from traveling in the opposite direction. Essentially, it strictly restricts the direction of light transmission, achieving unidirectional conduction of optical signals. In various optical transmission systems, optical isolators play an indispensable role. They effectively isolate reflected light generated in fiber optic links, preventing reflected light from interfering with sensitive components in the system, thereby improving the quality of optical wave transmission, enhancing overall transmission efficiency, and ensuring the stable and reliable operation of the optical system.

[0003] To ensure that optical isolators meet practical application requirements, accurate testing of their various performance parameters is crucial. However, existing optical isolator testing methods have many shortcomings, the most prominent being the limitations of the testing methods themselves. Current tests mostly employ single-wavelength, fixed-polarization testing modes. This mode cannot cover the entire operating wavelength range of the optical isolator, making it difficult to comprehensively reflect the device's performance at different wavelengths. It is also prone to missing potential performance abrupt changes within the wavelength range, resulting in test results that do not accurately reflect the actual operating state of the optical isolator.

[0004] Furthermore, existing testing methods lack effective error compensation mechanisms, and the power of the light source is prone to drift during testing. This drift directly affects the accuracy of the test data, resulting in large test errors. These problems make it difficult for traditional testing methods to meet the requirements of high-precision and comprehensive testing, and they cannot provide reliable data support for the quality control and performance optimization of optical isolators. Therefore, those skilled in the art have proposed a comprehensive performance testing device for optical isolators to solve the aforementioned technical problems. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides a comprehensive testing device for optical isolators, which solves the problem that existing single-wavelength, fixed-polarization testing methods are insufficient for comprehensively testing the performance of optical isolators.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a comprehensive testing device for the performance of an optical isolator, comprising, Marble vibration isolation base, with side seats on both sides of the top of the marble vibration isolation base, and a rotatable sealed light shield between the two side seats. An observation window is set in the middle of the front side of the sealed light shield. The sealed light shield and the marble vibration isolation base constitute a test chamber for testing the performance of the optical isolator. The alignment and clamping mechanism is located inside the test chamber and is used to align and clamp the optical isolator to be tested before testing. The full-wavelength testing mechanism, located inside the testing cavity, is used to test the performance of the optical isolator using continuous light across the entire wavelength range. The optical path switching mechanism, located inside the test chamber, is used to test the performance of the optical isolator by means of automatic bidirectional optical path switching. The loading test mechanism, located inside the test chamber, is used to test the performance of the optical isolator using a power-gradual loading method.

[0007] Preferably, the alignment clamping mechanism includes a three-axis precision electric displacement stage. A three-axis precision electric displacement stage capable of three-axis displacement adjustment is provided at the bottom center of the inner side of the test cavity. A V-shaped positioning groove is provided at the top center of the three-axis precision electric displacement stage. A pigtail stress relief clamp is provided at the top center of one side of the three-axis precision electric displacement stage. Fiber optic position sensors are provided on both sides of the top center of the three-axis precision electric displacement stage.

[0008] Preferably, the alignment and clamping mechanism further includes a transverse mounting seat. A transverse mounting seat is provided on the upper inner side of the test cavity. The two ends of the transverse mounting seat are respectively connected to the corresponding positions of the two side seats. A movable seat is provided on the upper part of the three-axis precision electric displacement stage. Cylinders are provided on both sides of the bottom middle of the transverse mounting seat. The top ends of the cylinder rods are respectively connected to the top two sides of the movable seat. A silicone seat is provided at the bottom of the movable seat.

[0009] Preferably, the full-wavelength testing mechanism includes a broadband ASE light source. The broadband ASE light source is disposed in the middle of one side of the inner wall of the testing cavity. A polarization scrambler is disposed in the middle of one side of the testing cavity. An external light shield is disposed on the side of the polarization scrambler close to the broadband ASE light source. A connecting rod is fixedly connected to the middle of the bottom of the transverse mounting base, and the end of the connecting rod is connected to the corresponding position of the polarization scrambler. An optical splitter is disposed on the side of the polarization scrambler away from the broadband ASE light source.

[0010] Preferably, the full-wave testing mechanism further includes a right-angle mounting base. A right-angle mounting base is provided at the top center of the three-axis precision electric displacement stage near the optical splitter. A collimating lens is provided at the center of the right-angle mounting base, and a beam combiner is provided at the center of the side of the right-angle mounting base near the three-axis precision electric displacement stage.

[0011] Preferably, the full-wave testing mechanism further includes a coupling power sensor, with the coupling power sensor located at the top center of the right-angle mounting base, a spectrum analyzer located at the center of the side of the test cavity away from the broadband ASE light source, and a PLC controller located at the upper front of the side seat on one side.

[0012] Preferably, the optical path switching mechanism includes a high-speed mechanical optical switch, and a high-speed mechanical optical switch for automatically switching the test optical path in both directions is provided on one side of the top of the polarization scrambler. A calibration optical attenuator is provided between the polarization scrambler and the optical splitter to compensate for the inherent loss of the optical path after the optical path is switched. A data transmitter is provided in the middle of the front side of the right-angle mounting base.

[0013] Preferably, the loading test mechanism includes a high-power bandwidth light source, a high-power bandwidth light source is disposed in the middle of one side of the test cavity, a light decay regulator is disposed on the high-power bandwidth light source, and a cutoff protector is disposed on the side of the light decay regulator near the high-power bandwidth light source.

[0014] Preferably, the loading test mechanism further includes a high-definition monitoring camera. A high-definition monitoring camera is provided at the center of both sides of the movable base. A temperature sensor is provided at the center of the top of the horizontal mounting base. A display controller is provided at the center of the front end of one side base. An optical path power sensor is provided on the optical splitter.

[0015] Working Principle: When performing performance testing on an optical isolator, the clamping mechanism is first activated. The operator smoothly places the optical isolator under test into the V-shaped positioning groove on the three-axis precision electric displacement stage, ensuring the device is placed upright and without tilt. Then, the operator closes and resets the sealing light shield on the marble vibration isolation base. The sealing light shield effectively isolates external stray light interference and protects the internal testing mechanism and the device under test, providing a clean and stable environment for subsequent precise testing. The V-shaped positioning groove structure allows for rapid coarse positioning of the device. Its symmetrical limiting characteristics ensure that the central axis of the device is approximately coaxial with the test optical path, reducing the workload of subsequent fine-tuning. Subsequently, the operator slowly threads the fiber optic cable of the device under test through the three-axis precision electric displacement stage. The fiber optic stress relief clip on the displacement stage is used to carefully adjust the fiber optic cable's direction, ensuring there are no obvious bends or pulls. The output end of the fiber optic cable is precisely connected to the fiber optic flange adapter, and excess fiber is neatly organized in the fiber optic cable organizer to avoid signal interference caused by messy fiber optic cables. During this process, the fiber optic stress relief clip, through its flexible clamping structure, fits the fiber optic cable, effectively releasing its mechanical stress and preventing stress from being transmitted to the device's interior. This prevents misalignment of core components such as internal polarizers and Faraday rotators, thus eliminating isolation jumps and ensuring the stability of test data. After the optical isolator under test is placed, the cylinder on the horizontal mounting base receives the start command and begins to work. As the cylinder starts, its rod slowly and smoothly extends. During the process, the silicone base at the bottom of the device under test (DUT) is slowly lowered until it makes flexible and tight contact with the end face of the DUT. This achieves stress-free and secure clamping of the optical isolator within the V-shaped positioning groove. The clamping force of the silicone base can be pre-adjusted according to the size and material of the DUT, ensuring secure clamping and preventing the device from loosening during testing, while also avoiding damage to the device from rigid stress. This effectively protects the coating on the device's end face and its internal core components. Simultaneously, the coupling power sensor is activated, acquiring real-time coupling power data from the test optical path. This data is accurately transmitted to the PLC controller, providing data support for subsequent optical path alignment. After receiving the coupling power data, the PLC controller combines it with the position data transmitted by the fiber optic position sensor. According to the calculation, the optimal alignment position within the test cavity is precisely determined to ensure efficient transmission of the test optical signal. During this process, the PLC controller first issues fine-tuning commands based on the position data from the fiber optic position sensor, driving a three-axis precision electric displacement stage to perform micron-level precise adjustments in the X and Y directions. This gradually adjusts the horizontal position of the device under test (DUT) so that its central axis is perfectly coaxial with the test optical path. Subsequently, the PLC controller continues to issue commands, driving the three-axis precision electric displacement stage to fine-tune around the Z-axis, precisely adjusting the angle of the DUT to ensure that the device's end face is perpendicular to the test optical path. This effectively avoids optical signal reflection, refraction, and coupling loss caused by angular deviation, improving test accuracy. Throughout the fine-tuning process, the coupling power sensor continuously collects coupling power data.The PLC controller receives real-time feedback. When the PLC controller detects that the coupling power has reached its maximum value, it indicates that the device under test (DUT) and the test optical path are optimally aligned. At this point, fine-tuning is immediately stopped, and the three-axis precision electric displacement stage locks the current position of the three-axis displacement and the electric rotary stage to ensure the stability of the device position during subsequent testing. This completes the optical path alignment and clamping fixation of the optical isolator before performance testing, making full preparations for subsequent testing. Then, the full-wavelength test mechanism is started, and the PLC controller issues a start command to control the broadband ASE light source to start smoothly. After starting, the broadband ASE light source stably outputs a continuous optical signal covering the nominal operating wavelength of the optical isolator under test, and the output power remains constant to avoid power fluctuations affecting the test data. The fixed-polarization light output by the broadband ASE light source first passes through... After being protected by an external light shield, the light is effectively isolated from external stray light interference and then precisely enters the polarization scrambler. Under electronic control, the polarization scrambler quickly converts the fixed polarization light into random fully polarized light. This step can accurately simulate the arbitrary polarization input scenario faced by optical isolators in actual applications, effectively solving the problem of polarization correlation loss measurement distortion caused by traditional fixed polarization testing for polarization-independent optical isolators, and ensuring the accuracy and reliability of polarization correlation loss test data. After being scrambled, the fully polarized light signal smoothly enters the optical splitter. The optical splitter divides the light signal evenly into two paths according to the preset beam splitting ratio: one is the reference optical path, mainly used to compensate for light source power fluctuations in real time and ensure the stability of the test benchmark; the other is the test optical path, which is specifically used to test various performance parameters of the optical isolator under test. The beam splitter's splitting ratio has been pre-calibrated to ensure stable and consistent intensity of the two optical signals, guaranteeing accurate calculation of subsequent test data. The reference optical signal is directly incident on the optical power sensor, which quickly converts the received optical signal into a corresponding electrical signal and transmits it in real time to the data processing module. After converting the analog electrical signal into a digital signal, it is accurately fed back to the PLC controller. The PLC controller uses this digital signal as a power reference to monitor the fluctuation of the broadband ASE light source's output power in real time. When calculating subsequent test parameters, it automatically deducts the error caused by the light source power fluctuation, achieving real-time power compensation and effectively improving the repeatability and accuracy of the test data. The optical signal in the test path first enters precisely into the collimating lens on the right-angle mounting base. The collimating lens quickly converts the divergent light output from the optical fiber into parallel light. This step ensures that the optical signal is incident on the optical isolator under test as a parallel and uniform beam, effectively avoiding coupling loss caused by divergent light, reducing errors in insertion loss testing, and laying the foundation for accurate testing. The parallel light then passes through a beam combiner, which precisely compensates for losses caused by differences in the polarization characteristics of various optical components in the test optical path, ensuring the consistency of optical signal transmission in different polarization states, further improving the accuracy of polarization-dependent loss testing. The compensated parallel light is then precisely incident on the fiber optic flange adapter, which firmly secures the optical isolator under test.This achieves precise docking between the test optical path and the device under test (DUT). The optical signal smoothly enters the DUT in the forward direction, initiating the forward performance test. After forward transmission through the DUT, the optical signal smoothly exits from the isolator's output and is transmitted to the spectrum analyzer via low-loss fiber optic cable. The PLC controller issues a scanning command, controlling the spectrum analyzer to initiate a full-band synchronous scan. The scanning range precisely covers the nominal operating wavelength of the DUT. The scanning speed and sampling interval are preset according to the test accuracy requirements. The spectrum analyzer acquires spectral data from the DUT's output in real time, including key information such as optical power and polarization state distribution at different wavelengths. It quickly converts the acquired spectral data into electrical signals and accurately transmits them to the PLC controller. The PLC controller, combined with a reference light... The power compensation data of the optical isolator is processed in real time to complete the full-band continuous light test of the optical isolator, obtaining core performance parameters such as forward insertion loss, wavelength-dependent loss, and polarization-dependent loss. Then, the optical path switching mechanism is activated. Initially, the high-speed mechanical optical switch is in the forward optical path state. During the forward insertion loss test, the test procedure is completely consistent with that of the full-wavelength test mechanism, ensuring the continuity of the forward test data. After the forward insertion loss, wavelength-dependent loss, and polarization-dependent loss tests are completed, the PLC controller issues a switching command to activate the high-speed mechanical optical switch. The high-speed mechanical optical switch performs a millisecond-level rapid switching, accurately switching the optical path to the reverse test state without manual intervention, significantly improving performance. To improve testing efficiency and avoid errors and device damage caused by manual switching, the optical attenuation regulator is activated simultaneously. Based on the inherent loss of the reverse optical path, the regulator automatically and precisely adjusts the attenuation value to ensure that the optical power reference for the reverse test is completely consistent with that for the forward test. This step effectively avoids distortion in the reverse isolation test due to differences in loss between the forward and reverse optical paths, ensuring the accuracy of the reverse test data. After calibration, the optical attenuation regulator accurately feeds back the current attenuation state to the PLC controller. After the PLC controller confirms that the calibration is qualified, it starts the reverse test. At this time, the optical signal output from the broadband ASE light source is converted into fully polarized light by the polarization scrambler and then accurately transmitted to the optical coupler after entering the optical splitter. The optical coupler accurately couples the optical signal, ensuring... The optical signal, as a parallel and uniform beam, is incident in reverse from the output of the optical isolator under test, thus accurately simulating the reflected light scenario in actual applications and ensuring the authenticity of the reverse test. When the optical signal is transmitted in reverse through the optical isolator under test, it is blocked by high attenuation, with only a small amount of light passing through the isolator and exiting from its input. It then smoothly enters the collimating lens of the test optical path, and subsequently exits through the optical splitter. The optical power sensor in the optical path synchronously collects the reverse optical power data and transmits it to the PLC controller. The PLC controller then combines this data with the power reference data of the reference optical path to accurately calculate the reverse isolation: the difference between the optical power of the reference optical path and the output optical power of the reverse test optical path at a certain wavelength is the reverse isolation at that wavelength. After the full-band scan is completed...The PLC controller automatically calculates and outputs the maximum, minimum, and average values ​​of the reverse isolation, thereby completing the reverse optical path test of the optical isolator and obtaining the core reverse performance parameters. Afterwards, the test mechanism is started. First, the operator precisely adjusts the positions of the broadband ASE light source and the high-power bandwidth light source according to the test requirements, ensuring smooth and interference-free optical path switching. Then, the PLC controller issues a start command, controlling the high-power bandwidth light source to start smoothly. After the high-power bandwidth light source starts, it initially outputs a low-power continuous optical signal while simultaneously controlling the optical attenuator to be in maximum attenuation mode, effectively avoiding excessive initial power impacting the device under test. To protect the device from damage, the operator then adjusts the power according to a preset gradual rate using the display controller, gradually reducing the attenuation value of the optical attenuator. Simultaneously, the output power of the high-power bandwidth light source is adjusted to achieve a continuous gradual loading of optical power from low to high. This ensures that the device gradually adapts to the high-power environment, avoiding end-face ablation and damage to internal components caused by instantaneous high power. The high-power optical signal passes through the cutoff protector and optical attenuator in sequence, precisely connecting with the test optical path of the full-wave test mechanism. Then, it passes through the polarization scrambler and optical splitter, entering the reference optical path and test optical path respectively, ensuring stable and lossless optical signal transmission. The optical signal in the test optical path passes sequentially through the collimating lens and beam combiner on the right-angle mounting base, and is precisely incident on the optical isolator under test. After the optical signal is transmitted forward through the optical isolator under test, it exits from the output end, passes through the fiber optic flange adapter and low-loss fiber optic patch cord, and is transmitted to the spectrum analyzer. Simultaneously, the high-power photoelectric sensor at the output end collects output power data in real time, and the high-power photoelectric sensor at the input end collects input power data synchronously. Both power data are transmitted to the PLC controller in real time and with high accuracy. The PLC controller, combined with the power compensation data from the reference optical path, calculates the forward insertion loss under high power in real time, completing the high-power forward performance test. During the process, the high-definition monitoring camera on the mobile base is always pointed at the end face of the device under test, capturing its status in real time and transmitting clear image signals to the PLC controller. Operators can observe the end face for abnormalities such as burning, blackening, or hazy marks through the display controller, promptly identifying any device damage. Simultaneously, the temperature sensor on the horizontal mounting base collects temperature data from the temperature control chamber in real time and feeds it back to the PLC controller, preventing overheating that could lead to crystal demagnetization or coating damage. This ensures a safe and stable testing process, enabling the load testing of the optical isolator and comprehensively verifying the device's performance stability under high-power conditions.

[0016] This invention provides a comprehensive performance testing device for optical isolators. It has the following advantages: 1. This invention, by adding and setting an alignment clamping mechanism, first achieves rapid coarse positioning of the optical isolator under test through a V-shaped positioning groove before testing. Combined with a fiber optic stress relief clamp, it flexibly releases the mechanical stress of the fiber optic pigtail, preventing stress transmission that could cause displacement of the core components inside the device and eliminating abrupt changes in isolation. Simultaneously, the stress-free clamping of the silicone base can adapt to devices of different specifications, ensuring both clamping firmness and protecting the device's end face and internal components, preventing damage caused by rigid clamping. Secondly, relying on the precise fine-tuning of the three-axis precision electric displacement stage and the coordinated feedback from the coupling power sensor and fiber optic position sensor, the PLC controller can calculate and achieve optimal optical path alignment. The locked displacement stage ensures stable device position during testing, effectively reducing optical signal reflection and coupling loss, laying a precise and stable mechanical foundation for subsequent performance tests.

[0017] 2. This invention, by adding and setting up a full-wavelength testing mechanism, enables the testing of optical isolators. On one hand, this mechanism outputs continuous light covering the device's operating wavelength band through a broadband light source, and, in conjunction with a polarization scrambler, converts fixed-polarization light into fully polarized light, accurately simulating the polarization scenario of actual optical isolator applications. This solves the parameter measurement distortion problem caused by traditional fixed-polarization testing. At the same time, full-wavelength scanning can comprehensively reflect the device's performance at different wavelengths, avoiding the omission of performance abrupt changes within the band. On the other hand, the reference optical path split by the optical splitter can achieve real-time compensation for light source power fluctuations, eliminating test errors caused by light source drift. The collimating lens and beam combiner can also reduce optical path coupling loss and balance the transmission loss of light signals in different polarization states, significantly improving the accuracy and repeatability of core parameter tests such as insertion loss and polarization-dependent loss.

[0018] 3. By adding and setting an optical path switching mechanism, this invention enables millisecond-level automatic switching of the forward and reverse test optical paths during the testing of optical isolators using a high-speed mechanical optical switch. This eliminates the need for manual intervention throughout the process, significantly improving the overall efficiency of forward and reverse performance testing of optical isolators. It also avoids optical path connection errors caused by manual insertion, removal, and flipping of components, and prevents physical damage to the device interfaces and end faces caused by manual operation, ensuring the integrity of the device during testing. Furthermore, after optical path switching, the calibration optical attenuator can automatically compensate for the inherent loss of the reverse optical path, ensuring consistent power references for forward and reverse testing. This fundamentally avoids distortion in reverse isolation testing caused by differences in optical path loss. Simultaneously, the reverse optical path can accurately simulate reflected light scenarios in actual applications, making the reverse performance test data more closely reflect the actual working state of the device, ensuring the consistency and reliability of forward and reverse test results.

[0019] 4. By adding and setting a loading test mechanism, this invention gradually increases the power from low to target power during the testing of optical isolators through a power gradient loading method. This avoids the impact of instantaneous high-power optical signals on the optical isolators under test, effectively protecting the device's end-face coating and internal core components, and preventing irreversible damage such as ablation and demagnetization. At the same time, it can accurately collect various performance parameters of the device under high-power conditions, complete the special test of the high-power performance of the optical isolator, and make up for the limitations of traditional low-power testing. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the closed structure of the present invention; Figure 2 This is a schematic diagram of the open state structure of the present invention; Figure 3 For the present invention Figure 2 Enlarged schematic diagram of the structure at point A; Figure 4 This is a schematic diagram of one side of the three-axis precision electric displacement stage of the present invention; Figure 5 This is a schematic diagram of the other side of the three-axis precision electric displacement stage of the present invention; Figure 6 This is a partial structural diagram of the horizontal mounting base of the present invention; Figure 7 This is a partial structural diagram of the right-angle mounting base of the present invention; Figure 8 This is a partial structural diagram of the polarization scrambler of the present invention.

[0021] The components include: 1. Marble vibration isolation base; 2. Sealed light shield; 3. Side base; 4. PLC controller; 5. Display controller; 6. Observation window; 7. Polarization scrambler; 8. Calibration optical attenuator; 9. Optical splitter; 10. Right-angle mounting base; 11. Three-axis precision electric displacement stage; 12. V-shaped positioning groove; 13. Connecting rod; 14. Test chamber; 15. Spectrometer; 16. Silicone seat; 17. Moving seat; 18. Cylinder; 19. Lateral mounting base; 20. High-power bandwidth light source; 21. Cut-off protector; 22. Optical attenuation regulator; 23. Broadband ASE light source; 24. Fiber optic position sensor; 25. Pigtail stress relief clip; 26. Temperature sensor; 27. High-definition monitoring camera; 28. Coupled power sensor; 29. ​​Collimating lens; 30. Data transmitter; 31. Bundle compensator; 32. High-speed mechanical optical switch; 33. External optical shield; 34. Optical path optical power sensor. Detailed Implementation

[0022] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] Please see the appendix Figure 1 -Appendix Figure 2 This invention provides a comprehensive testing device for the performance of an optical isolator, including a marble vibration isolation base 1. Side seats 3 are provided on both sides of the top of the marble vibration isolation base 1. A rotatable sealing light shield 2 is provided between the two side seats 3. An observation window 6 is provided in the middle of the front side of the sealing light shield 2. The sealing light shield 2 and the marble vibration isolation base 1 constitute a test chamber 14 for testing the performance of the optical isolator. Please see the appendix Figure 4 -Appendix Figure 6 The alignment and clamping mechanism is located inside the test cavity 14 and is used to align and clamp the optical isolator to be tested before testing. The alignment and clamping mechanism includes a three-axis precision electric displacement stage 11. The bottom center of the test cavity 14 is provided with a three-axis precision electric displacement stage 11 that can be adjusted in three directions. A V-shaped positioning groove 12 is provided at the top center of the three-axis precision electric displacement stage 11. A fiber optic stress relief clamp 25 is provided at the top center of one side of the three-axis precision electric displacement stage 11. Fiber optic position sensors 24 are provided on both sides of the top center of the three-axis precision electric displacement stage 11.

[0024] When the clamping mechanism is activated, the operator places the optical isolator to be tested smoothly into the V-shaped positioning groove 12 on the three-axis precision electric displacement stage 11, ensuring that the device is placed upright and without tilt. Then, the operator closes and resets the sealing light shield 2 on the marble vibration isolation base 1. The sealing light shield 2 can effectively isolate external stray light interference and protect the internal testing mechanism and the device under test, providing a clean and stable environment for subsequent accurate testing.

[0025] The V-groove structure of the V-groove 12 can quickly achieve coarse positioning of the device. Relying on its symmetrical limiting characteristics, it ensures that the central axis of the device is approximately coaxial with the test optical path, reducing the amount of subsequent fine-tuning work. Subsequently, the operator slowly passes the pigtail of the device under test through the pigtail stress relief clamp 25 on the three-axis precision electric displacement stage 11, carefully adjusts the direction of the pigtail, ensures that the pigtail is not significantly bent or pulled, accurately connects the output end of the pigtail to the fiber optic flange adapter, and neatly organizes the excess pigtail in the fiber optic cable organizer to avoid signal interference caused by messy pigtails.

[0026] During this process, the fiber optic stress relief clip 25 adheres to the fiber optic tail through a flexible clamping structure, effectively releasing the mechanical stress of the fiber optic tail and preventing stress from being transmitted to the inside of the device through the fiber optic tail. This avoids the displacement of core components such as internal polarizers and Faraday rotators, thereby eliminating the phenomenon of isolation jump and ensuring the stability of test data.

[0027] The alignment and clamping mechanism also includes a transverse mounting base 19. The transverse mounting base 19 is provided in the upper middle part of the inner side of the test cavity 14. The two ends of the transverse mounting base 19 are respectively connected to the corresponding positions of the two side seats 3. The upper part of the three-axis precision electric displacement stage 11 is provided with a movable seat 17. The two sides of the bottom middle part of the transverse mounting base 19 are provided with cylinders 18. The top of the rod of the cylinder 18 is respectively connected to the top two sides of the movable seat 17. The bottom of the movable seat 17 is provided with a silicone seat 16.

[0028] After the optical isolator under test is placed, the cylinder 18 on the horizontal mounting base 19 receives the start command and starts working. At the same time as the cylinder 18 starts, its rod is slowly and smoothly pushed out. During the pushing out process, the rod of the cylinder 18 simultaneously drives the silicone seat 16 at its bottom to slowly move down until the silicone seat 16 is in flexible and tight contact with the end face of the device under test, thereby achieving stress-free and firm clamping of the optical isolator in the V-shaped positioning groove 12.

[0029] During this process, the clamping force of the silicone holder 16 can be pre-adjusted according to the size and material of the device under test. This ensures that the device is firmly clamped and does not loosen during the test, while also avoiding damage to the device caused by rigid stress. This effectively protects the coating on the end face of the device and its internal core components. At the same time, the coupling power sensor 28 is activated synchronously to collect the coupling power data of the test optical path in real time. The collected power data is accurately transmitted to the PLC controller 4 to provide data support for subsequent optical path alignment.

[0030] After receiving the coupling power data, the PLC controller 4, combined with the position data transmitted by the fiber optic position sensor 24, accurately calculates the optimal alignment position within the test cavity 14 to ensure efficient transmission of the test optical signal. During this process, the PLC controller 4 first issues a fine-tuning command based on the position data from the fiber optic position sensor 24, driving the three-axis precision electric displacement stage 11 to perform micron-level precise fine-tuning in the X and Y directions, gradually adjusting the horizontal position of the device under test so that the central axis of the device is completely coaxial with the test optical path. Subsequently, the PLC controller 4 continues to issue commands to drive the three-axis precision electric displacement stage 11 to fine-tune around the Z-axis, precisely adjusting the angle of the device under test to ensure that the device end face is perpendicular to the test optical path, effectively avoiding optical signal reflection, refraction, and coupling loss caused by angular deviation, and improving test accuracy.

[0031] Throughout the fine-tuning process, the coupling power sensor 28 continuously collects coupling power data and feeds it back to the PLC controller 4 in real time. When the PLC controller 4 detects that the coupling power has reached its maximum value, it indicates that the device under test and the test optical path have achieved optimal alignment. At this point, the fine-tuning is stopped immediately, and the three-axis precision electric displacement stage 11 locks the current position of the three-axis displacement and the electric rotary stage to ensure the stability of the device position during subsequent testing. This completes the optical path alignment and clamping and fixing of the optical isolator before performance testing, making full preparations for subsequent testing.

[0032] Please see the appendix Figure 7 -Appendix Figure 8 The full-wavelength testing mechanism, located inside the testing cavity 14, is used to test the performance of the optical isolator using continuous light across the entire wavelength range. The full-wave test mechanism includes a broadband ASE light source 23. The broadband ASE light source 23 is located in the middle of one side of the inner wall of the test cavity 14. A polarization scrambler 7 is located in the middle of one side of the test cavity 14. An external light shield 33 is located on the side of the polarization scrambler 7 closest to the broadband ASE light source 23. A connecting rod 13 is fixedly connected to the middle of the bottom of the horizontal mounting base 19, and the end of the connecting rod 13 is connected to the corresponding position of the polarization scrambler 7. An optical splitter 9 is located on the side of the polarization scrambler 7 away from the broadband ASE light source 23.

[0033] When the full-wave test mechanism is started, the PLC controller 4 issues a start command to control the broadband ASE light source 23 to start smoothly. After starting, the broadband ASE light source 23 stably outputs a continuous optical signal covering the nominal operating band of the optical isolator under test, and the output power remains constant to avoid power fluctuations affecting the test data. The fixed polarization light output by the broadband ASE light source 23 is first protected by the external optical shield 33 to effectively isolate external stray light interference, and then accurately enters the polarization scrambler 7. Under the action of electronic control, the polarization scrambler 7 quickly converts the fixed polarization light into random fully polarized light. This step can accurately simulate the arbitrary polarization input scenario faced by the optical isolator in actual applications, effectively solving the problem of polarization correlation loss measurement distortion of polarization-independent optical isolators caused by traditional fixed polarization testing, and ensuring the accuracy and reliability of polarization correlation loss test data.

[0034] The fully polarized optical signal, after being scrambled, smoothly enters the optical splitter 9. The optical splitter 9 divides the optical signal evenly into two paths according to a preset beam splitting ratio: one is a reference optical path, mainly used for real-time compensation of light source power fluctuations to ensure the stability of the test benchmark; the other is a test optical path, specifically used for testing various performance parameters of the optical isolator under test. The beam splitting ratio of the optical splitter 9 has been pre-calibrated to ensure stable and consistent intensity of the two optical signals, providing a guarantee for the accurate calculation of subsequent test data.

[0035] The optical signal from the reference optical path is directly incident on the optical power sensor 34. The optical power sensor 34 quickly converts the received optical signal into a corresponding electrical signal and transmits it to the data processing module in real time. After converting the analog electrical signal into a digital signal, it accurately feeds it back to the PLC controller 4. The PLC controller 4 uses this digital signal as a power reference to monitor the fluctuation of the output power of the broadband ASE light source 23 in real time. When calculating test parameters in the future, it automatically deducts the error caused by the power fluctuation of the light source, realizes real-time power compensation, and effectively improves the repeatability and accuracy of the test data.

[0036] The full-wave testing mechanism also includes a right-angle mounting base 10. The right-angle mounting base 10 is located at the top center of the three-axis precision electric displacement stage 11 near the optical splitter 9. A collimating lens 29 is located in the center of the right-angle mounting base 10. A beam combiner 31 is located in the center of the right-angle mounting base 10 near the three-axis precision electric displacement stage 11.

[0037] The optical signal in the test optical path first enters the collimating lens 29 on the right-angle mounting base 10 with precision. The collimating lens 29 quickly converts the divergent light output from the optical fiber into parallel light. This step ensures that the optical signal is incident on the optical isolator under test with a parallel and uniform beam, effectively avoiding coupling loss caused by divergent light, reducing the error of insertion loss test, and laying the foundation for accurate testing.

[0038] Parallel light passes through beam combiner 31, which precisely compensates for the loss caused by the differences in polarization characteristics of various optical components in the test optical path, ensuring the consistency of optical signal transmission in different polarization states and further improving the accuracy of polarization-related loss testing. The compensated parallel light is precisely incident on the fiber optic flange adapter, which firmly fixes the optical isolator under test and achieves precise docking between the test optical path and the device under test. At this time, the optical signal smoothly enters the optical isolator under test in the positive direction, and the positive performance test begins.

[0039] The full-wave testing mechanism also includes a coupling power sensor 28. The coupling power sensor 28 is located at the top center of the right-angle mounting base 10. A spectrum analyzer 15 is located at the center of the side of the test cavity 14 away from the broadband ASE light source 23. A PLC controller 4 is located at the upper front of the side seat 3.

[0040] After the optical signal is transmitted forward through the optical isolator under test, it is smoothly emitted from the output end of the isolator and transmitted to the spectrum analyzer 15 through a low-loss optical fiber. The PLC controller 4 issues a scanning command to control the spectrum analyzer 15 to start a full-band synchronous scan. The scanning range accurately covers the nominal operating wavelength of the device under test. The scanning speed and sampling interval are preset according to the test accuracy requirements. The spectrum analyzer 15 collects the spectral data at the output end of the optical isolator under test in real time, including key information such as optical power and polarization state distribution at different wavelengths. It quickly converts the collected spectral data into electrical signals and accurately transmits them to the PLC controller 4. The PLC controller 4 combines the power compensation data of the reference optical path and performs calculations in real time to complete the full-band continuous light test of the optical isolator and obtain core performance parameters such as forward insertion loss, wavelength-dependent loss, and polarization-dependent loss.

[0041] Please see the appendix Figure 2 and attached Figure 8 The optical path switching mechanism is located inside the test cavity 14 and is used to test the performance of the optical isolator by means of automatic bidirectional optical path switching. The optical path switching mechanism includes a high-speed mechanical optical switch 32. A high-speed mechanical optical switch 32 for automatically switching the test optical path in both directions is provided on one side of the top of the polarization scrambler 7. A calibration optical attenuator 8 for compensating for the inherent loss of the optical path after the optical path is switched is provided between the polarization scrambler 7 and the optical splitter 9. A data transmission device 30 is provided in the middle of the front side of the right-angle mounting base 10.

[0042] When the optical path switching mechanism is activated, the high-speed mechanical optical switch 32 is initially in the forward optical path state. During the forward insertion loss test, the test procedure is completely consistent with the test procedure of the full-wave test mechanism, ensuring the continuity of the forward test data. After the forward insertion loss, wavelength-dependent loss, and polarization-dependent loss tests are completed, the PLC controller 4 issues a switching command to control the high-speed mechanical optical switch 32 to start. The high-speed mechanical optical switch 32 performs a millisecond-level rapid switching, accurately switching the optical path to the reverse test state without manual intervention, greatly improving test efficiency, and avoiding errors and device damage caused by manual switching.

[0043] At this time, the optical attenuation regulator 22 is started synchronously. The optical attenuation regulator 22 automatically and accurately adjusts the attenuation value according to the inherent loss of the reverse optical path to ensure that the optical power reference of the reverse test is completely consistent with that of the forward test. This step can effectively avoid the distortion of the reverse isolation test due to the difference in loss between the forward and reverse optical paths, and ensure the accuracy of the reverse test data. After calibration, the optical attenuation regulator 22 accurately feeds back the current attenuation state to the PLC controller 4. After the PLC controller 4 confirms that the calibration is qualified, it starts the reverse test. At this time, the optical signal output by the broadband ASE light source 23 is converted into fully polarized light by the polarization scrambler 7. After entering the optical splitter 9, it is accurately transmitted to the optical coupler. The optical coupler accurately couples the optical signal to ensure that the optical signal is incident in reverse from the output end of the optical isolator under test as a parallel and uniform beam, thereby accurately simulating the reflected light scene in the actual application and ensuring the authenticity of the reverse test.

[0044] When the optical signal is transmitted in reverse through the optical isolator under test, the isolator performs high attenuation blocking, and only a small amount of optical signal passes through the isolator. It exits from the input end of the isolator and smoothly enters the collimating lens 29 of the test optical path. Then it is emitted through the optical splitter 9. The optical power sensor 34 of the optical path synchronously collects the reverse optical power data and transmits it to the PLC controller 4. Then, the PLC controller 4 combines the power reference data of the reference optical path to accurately calculate the reverse isolation degree: at a certain wavelength, the difference between the optical power of the reference optical path and the output optical power of the reverse test optical path is the reverse isolation degree at that wavelength. After the full-band scan is completed, the PLC controller 4 automatically calculates and outputs the maximum, minimum and average values ​​of the reverse isolation degree, thereby completing the reverse optical path test of the optical isolator and obtaining the core reverse performance parameters.

[0045] Please see the appendix Figure 2 -Appendix Figure 3 The loading test mechanism, which is set inside the test cavity 14, is used to test the performance of the optical isolator by using a power gradual loading method.

[0046] The loading test mechanism includes a high-power bandwidth light source 20. The high-power bandwidth light source 20 is located in the middle of one side of the test cavity 14. A light decay regulator 22 is installed on the high-power bandwidth light source 20. A cutoff protector 21 is installed on the side of the light decay regulator 22 close to the high-power bandwidth light source 20.

[0047] When the test setup is started, the operator first precisely adjusts the positions of the broadband ASE light source 23 and the high-power bandwidth light source 20 according to the test requirements to ensure smooth and interference-free optical path switching. Then, the PLC controller 4 issues a start command to control the high-power bandwidth light source 20 to start smoothly. After the high-power bandwidth light source 20 starts, it first outputs a low-power continuous optical signal, while controlling the optical attenuation regulator 22 to be in the maximum attenuation state, effectively avoiding the impact of excessive initial power on the device under test and protecting the device from damage. Subsequently, the operator adjusts the power according to the preset gradual rate through the display controller 5, gradually reducing the attenuation value of the optical attenuation regulator 22, while simultaneously adjusting the output power of the high-power bandwidth light source 20, to achieve a continuous gradual loading of optical power from low to high, ensuring that the device gradually adapts to the high-power environment and avoiding end-face ablation and internal component damage caused by instantaneous high power.

[0048] The loading test mechanism also includes a high-definition monitoring camera 27. High-definition monitoring cameras 27 are installed in the middle of both sides of the movable base 17. A temperature sensor 26 is installed in the middle of the top of the horizontal mounting base 19. A display controller 5 is installed in the middle of the front end of one side base 3. An optical path power sensor 34 is installed on the optical splitter 9.

[0049] The high-power optical signal passes sequentially through the cutoff protector 21 and the optical attenuation modulator 22, precisely connecting with the test optical path of the full-wavelength test mechanism. It then passes through the polarization scrambler 7 and the optical splitter 9, entering the reference optical path and the test optical path respectively, ensuring stable and lossless optical signal transmission. The optical signal in the test optical path passes sequentially through the collimating lens 29 and the beam combiner 31 on the right-angle mounting base 10, precisely incident on the optical isolator under test. After forward transmission through the optical isolator under test, the optical signal exits from the output end, passing through the fiber optic flange adapter and low-loss fiber optic patch cord to the spectrum analyzer 15. Simultaneously, the high-power photoelectric sensor at the output end collects output power data in real time, and the high-power photoelectric sensor at the input end synchronously collects input power data. Both power data are transmitted to the PLC controller 4 in real time and with precision. The PLC controller 4, combined with the power compensation data from the reference optical path, calculates the forward insertion loss under high power in real time, completing the high-power forward performance test.

[0050] During the test, the high-definition monitoring camera 27 on the mobile base 17 is always aimed at the end face of the device under test, capturing the end face status in real time and transmitting clear image signals to the PLC controller 4. The operator can observe in real time through the display controller 5 whether there are any abnormalities such as burning, blackening, or hazy marks on the end face, and promptly detect device damage. At the same time, the temperature sensor 26 on the horizontal mounting base 19 also collects the temperature data in the temperature control cavity in real time and feeds it back to the PLC controller 4 in real time to avoid excessive temperature causing crystal demagnetization and coating damage, ensuring the safety and stability of the test process. This enables the loading test processing of the optical isolator power and comprehensively verifies the performance stability of the device under high power environment.

[0051] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A comprehensive performance testing device for optical isolators, characterized in that, include, Marble vibration isolation base (1), with side seats (3) on both sides of the top of the marble vibration isolation base (1), and a rotatable sealing light shield (2) between the two side seats (3). An observation window (6) is provided in the middle of the front side of the sealing light shield (2). The sealing light shield (2) and the marble vibration isolation base (1) constitute a test chamber (14) for testing the performance of the optical isolator. The alignment clamping mechanism is located inside the test cavity (14) and is used to align and clamp the optical isolator to be tested before testing. The full-wavelength testing mechanism is set inside the testing cavity (14) and is used to test the performance of the optical isolator using continuous light across the entire wavelength range. The optical path switching mechanism is located in the test cavity (14) and is used to test the performance of the optical isolator by means of automatic bidirectional optical path switching. The loading test mechanism is set inside the test cavity (14) and is used to test the performance of the optical isolator by means of power gradual loading.

2. The optical isolator performance comprehensive testing device according to claim 1, characterized in that, The alignment clamping mechanism includes a three-axis precision electric displacement stage (11). The bottom center of the inner side of the test cavity (14) is provided with a three-axis precision electric displacement stage (11) that can be adjusted in three-axis direction. A V-shaped positioning groove (12) is opened at the center of the top of the three-axis precision electric displacement stage (11). A pigtail stress relief clamp (25) is provided at the center of the top of one side of the three-axis precision electric displacement stage (11). Fiber optic position sensors (24) are provided on both sides of the center of the top of the three-axis precision electric displacement stage (11).

3. The optical isolator performance comprehensive testing device according to claim 2, characterized in that, The alignment clamping mechanism also includes a transverse mounting base (19). The transverse mounting base (19) is provided in the upper middle part of the inner side of the test cavity (14). The two ends of the transverse mounting base (19) are respectively connected to the corresponding positions of the two side seats (3). The upper part of the three-axis precision electric displacement stage (11) is provided with a moving seat (17). The two sides of the bottom middle part of the transverse mounting base (19) are provided with cylinders (18). The top end of the cylinder (18) is respectively connected to the top two sides of the moving seat (17). The bottom of the moving seat (17) is provided with a silicone seat (16).

4. The optical isolator performance comprehensive testing device according to claim 3, characterized in that, The full-wave test mechanism includes a broadband ASE light source (23). The broadband ASE light source (23) is disposed in the middle of one side of the inner wall of the test cavity (14). A polarization scrambler (7) is disposed in the middle of one side of the test cavity (14). An external light shield (33) is disposed on the side of the polarization scrambler (7) close to the broadband ASE light source (23). A connecting rod (13) is fixedly connected to the middle side of the bottom end of the transverse mounting base (19), and the end of the connecting rod (13) is connected to the corresponding position of the polarization scrambler (7). An optical splitter (9) is disposed on the side of the polarization scrambler (7) away from the broadband ASE light source (23).

5. The optical isolator performance comprehensive testing device according to claim 4, characterized in that, The full-wave testing mechanism also includes a right-angle mounting base (10). The right-angle mounting base (10) is provided at the top center of the three-axis precision electric displacement stage (11) near the optical splitter (9). A collimating lens (29) is provided in the middle of the right-angle mounting base (10). A beam combiner (31) is provided in the middle of the right-angle mounting base (10) near the three-axis precision electric displacement stage (11).

6. The optical isolator performance comprehensive testing device according to claim 5, characterized in that, The full-wave test mechanism also includes a coupling power sensor (28). The coupling power sensor (28) is provided at the top center of the right-angle mounting base (10). A spectrum analyzer (15) is provided at the center of the side of the test cavity (14) away from the broadband ASE light source (23). A PLC controller (4) is provided at the upper front of the side seat (3) on one side.

7. A comprehensive performance testing device for optical isolators according to any one of claims 4 or 5, characterized in that, The optical path switching mechanism includes a high-speed mechanical optical switch (32). A high-speed mechanical optical switch (32) for automatically switching the test optical path in the forward and reverse directions is provided on one side of the top of the polarization scrambler (7). A calibration optical attenuator (8) for compensating for the inherent loss of the optical path after the optical path switching is provided between the polarization scrambler (7) and the optical splitter (9). A data transmission device (30) is provided in the middle of the front side of the right-angle mounting base (10).

8. The optical isolator performance comprehensive testing device according to claim 7, characterized in that, The loading test mechanism includes a high-power bandwidth light source (20). A high-power bandwidth light source (20) is provided in the middle of one side of the test cavity (14). A light decay regulator (22) is provided on the high-power bandwidth light source (20). A cutoff protector (21) is provided on the side of the light decay regulator (22) close to the high-power bandwidth light source (20).

9. The optical isolator performance comprehensive testing device according to claim 8, characterized in that, The loading test mechanism also includes a high-definition monitoring camera (27). A high-definition monitoring camera (27) is provided in the middle of both sides of the movable seat (17). A temperature sensor (26) is provided in the middle of the top of the horizontal mounting seat (19). A display controller (5) is provided in the middle of the front end of one side seat (3). An optical path power sensor (34) is provided on the optical splitter (9).

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