Characterization method for crushing degree of tungsten carbide powder, electronic equipment and storage medium

Abstract

The invention relates to the technical field of material analysis, in particular to a characterization method and device for the crushing degree of tungsten carbide powder, electronic equipment and a storage medium, and the characterization method for the crushing degree of the tungsten carbide powder comprises the following steps: obtaining an X-ray diffraction pattern after the tungsten carbide powder is crushed; analyzing the X-ray diffraction pattern to obtain structural parameters reflecting crystal microstructure changes, wherein the structural parameters comprise lattice distortion parameters and / or diffraction peak broadening parameters; and determining the crushing degree of the tungsten carbide powder according to the structural parameters. Therefore, the limitation of monitoring indexes, such as particle size and morphology, only depending on physical properties traditionally is broken through; the method not only effectively makes up for the deficiency of the existing detection means in characterizing the crystal structure of the crushed tungsten carbide powder, but also can more accurately associate the crushing process with the inherent quality of the material, provides guidance for the regulation and control of the subsequent alloy sintering process, and provides reliable guarantee for the performance stability of the hard alloy.

Description

Technical Field

[0001] This invention relates to the field of materials analysis technology, specifically to a method for characterizing the degree of fragmentation of tungsten carbide powder, an electronic device, and a storage medium. Background Technology

[0002] WC-Co cemented carbide, due to its high hardness, strength, excellent fracture toughness, wear resistance, and corrosion resistance, is widely used in metal cutting tools, mechanical mold processing, mining, and other fields, and is known as the "teeth of industry." As a raw material, the quality control of tungsten carbide powder is one of the key aspects.

[0003] Currently, there are various quality indicators for tungsten carbide powder, covering aspects such as impurity content, particle size and particle size distribution, and carbon content, allowing for quality monitoring at each stage of production. However, quality monitoring of ball milling or crushing processes remains insufficient, meaning the coverage of testing indicators is inadequate. Typically, powder particle size and physical properties are controlled and determined only through FSSS (Fisher Sub-Sieve Sizer), bulk density, and Hall flow rate; or by observing powder morphology through metallography to determine the crushing method. However, relying solely on controlling powder physical properties to determine the quality of ball milling or crushing processes may introduce more uncertainties into subsequent processes such as alloy sintering. For example, powder particles with similar FSSS particle sizes may, from a crystal structure perspective, represent either powders with destroyed or relatively intact crystal structures. Their performance in the same sintering process may differ significantly; the former requires more growth driving force, while the latter experiences faster grain size growth, potentially leading to inhomogeneous alloy properties. Furthermore, some literature has used two types of tungsten carbide powders with Fisher particle sizes of 19.5 μm and 13.10 μm, respectively, and added W powder to adjust the carbon content to prepare alloys A and B. To make the average grain size of the cemented carbide similar, the average grain size was adjusted by the ball milling time of the mixture, with the former requiring two more hours of ball milling. However, alloy A showed abnormally large WC grains, presumably because the increased ball milling time resulted in a higher proportion of particles <2.0 μm, i.e., a greater number of fine grains. Monitoring indicators based solely on physical properties has limitations. Adding crystal structure indicators to determine the quality of breakage is necessary. Summary of the Invention

[0004] This invention provides a method, electronic device, and storage medium for characterizing the degree of crushing of tungsten carbide powder, in order to solve the technical problem that the detection indicators in the crushing process are not comprehensive enough and cannot reflect the crystal structure state.

[0005] In a first aspect, the present invention provides a method for characterizing the degree of fragmentation of tungsten carbide powder, comprising the following steps: obtaining an X-ray diffraction pattern of tungsten carbide powder after fragmentation; analyzing the X-ray diffraction pattern to obtain structural parameters reflecting the changes in the microstructure of the crystal after fragmentation of tungsten carbide powder, wherein the structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters; and determining the degree of fragmentation of tungsten carbide powder based on the structural parameters.

[0006] The method for characterizing the degree of tungsten carbide powder breakage provided by this invention obtains structural parameters reflecting the changes in the crystal microstructure after tungsten carbide powder breakage by analyzing X-ray diffraction patterns. The structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters, which can quantitatively reflect the changes in microscopic defects, strain, and grain size during the breakage process from the crystal structure level, breaking through the limitations of traditional methods that rely solely on physical properties, particle size, or morphology indicators. It not only effectively compensates for the shortcomings of existing detection methods in characterizing the crystal structure of tungsten carbide powder after breakage, but also more accurately correlates the breakage process with the intrinsic quality of the material, providing guidance for the subsequent alloy sintering process control and providing a reliable guarantee for the performance stability of cemented carbide.

[0007] In some optional embodiments, the lattice distortion parameter includes at least one of the following: deviation degree and dispersion degree; wherein the deviation degree is used to characterize the degree of deviation of the lattice constant of the tungsten carbide powder after breakage from the lattice constant of the tungsten carbide powder before breakage, and the dispersion degree is used to characterize the inconsistency of the lattice constant of the tungsten carbide powder after breakage between different diffraction regions.

[0008] This implementation method introduces the degree of deviation and / or the degree of dispersion as specific quantitative indicators of lattice distortion parameters, which can more precisely distinguish the differences in stress on tungsten carbide powder in different crystal axis directions during the crushing process, thereby realizing a multi-dimensional assessment of the microscopic damage state of tungsten carbide powder after crushing.

[0009] In some optional embodiments, analyzing the X-ray diffraction pattern to obtain the degree of deviation in the lattice distortion parameters includes: performing full-spectrum fitting of the X-ray diffraction pattern to obtain the detected values ​​of lattice parameter a and lattice parameter c of the tungsten carbide powder; determining the theoretical value of lattice parameter c before the tungsten carbide powder is broken based on the detected value of lattice parameter a; and determining the degree of deviation in the lattice distortion parameters of the tungsten carbide powder based on the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c.

[0010] This implementation method is based on the characteristic that the c-axis lattice parameter of tungsten carbide powder crystal is more prone to distortion than the a-axis during mechanical crushing. By comparing the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c, the degree of damage to the lattice structure is reflected. The larger the deviation, the greater the stress or the more defects the crystal is subjected to during crushing, and the higher the degree of crushing.

[0011] In some optional implementations, determining the theoretical value of lattice parameter c before tungsten carbide powder crushing based on the detected value of lattice parameter a includes: determining whether there are initial values ​​for lattice parameter a and lattice parameter c before tungsten carbide powder crushing; when initial values ​​for lattice parameter a and lattice parameter c exist, calculating the difference between the detected value of lattice parameter a and the initial value of lattice parameter a; determining whether the difference is less than a preset threshold; when the difference is less than the threshold, using the initial value of lattice parameter c as the theoretical value of lattice parameter c; when there are no initial values ​​for lattice parameter a and lattice parameter c, or when the difference is greater than or equal to the threshold, obtaining a preset lattice parameter database, wherein the database includes multiple standard values ​​for lattice parameter a and standard values ​​for lattice parameter c corresponding to each standard value of lattice parameter a; and determining the theoretical value of lattice parameter c using the detected value of lattice parameter a and the lattice parameter database.

[0012] This implementation prioritizes the use of lattice parameters measured before crushing from the same batch as a benchmark. When the a-axis change is not significant, it directly adopts the initial value of the lattice parameter c as a theoretical reference, effectively avoiding systematic biases introduced by material grade, preparation process, or batch differences, thus improving characterization accuracy. When pre-crushing data is lacking or the a-value shifts significantly, it automatically switches to a database constructed based on the pre-crushing a-values ​​and c-values ​​of a large number of standard tungsten carbide powder samples of various specifications. The theoretical value of the lattice parameter c is dynamically determined through interpolation, balancing the method's versatility and adaptability. This implementation not only enhances the robustness and operability of the algorithm in actual production but also more realistically reflects the crystal structure changes caused by crushing, thereby providing reliable support for the refined quality control of tungsten carbide powder.

[0013] In some optional implementations, analyzing the X-ray diffraction pattern to obtain the dispersion of the lattice distortion parameters includes: performing full-spectrum fitting on the X-ray diffraction pattern to obtain the detected values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken; acquiring multiple sets of crystal plane diffraction data from the X-ray diffraction pattern, wherein the multiple sets of crystal plane diffraction data belong to different diffraction angle ranges; performing local fitting on each set of crystal plane diffraction data to obtain multiple local values ​​of lattice parameter a and multiple local values ​​of lattice parameter c; determining the standard deviation of lattice parameter a after the tungsten carbide powder is broken based on the multiple local values ​​of lattice parameter a and the detected values ​​of lattice parameter a; determining the standard deviation of lattice parameter c after the tungsten carbide powder is broken based on the multiple local values ​​of lattice parameter c and the detected values ​​of lattice parameter c; and using the standard deviation of lattice parameter a and the standard deviation of lattice parameter c to determine the dispersion of the lattice constant distortion degree after the tungsten carbide powder is broken.

[0014] This implementation method obtains multiple local values ​​of lattice parameter a and lattice parameter c by locally fitting multiple sets of crystal plane data within different diffraction angle ranges of XRD patterns. The standard deviation is then calculated by combining this with the overall detection value obtained from full-spectrum fitting, thereby quantifying the spatial dispersion of the lattice constant. This not only reflects the overall lattice distortion level after tungsten carbide powder is broken, but also captures the dimensional inhomogeneities or local strain differences in different crystal orientations caused by breakage, avoiding the limitation of traditional full-spectrum fitting that easily overlooks microstructural inhomogeneities.

[0015] In some optional implementations, analyzing the diffraction peak broadening parameters of an X-ray diffraction pattern includes: selecting a characteristic diffraction peak in the X-ray diffraction pattern; obtaining a first lateral broadening value of the characteristic diffraction peak at a first intensity ratio position and a second lateral broadening value at a second intensity ratio position; and determining the diffraction peak broadening parameters based on the first and second lateral broadening values.

[0016] This implementation method effectively captures the asymmetric broadening characteristics of peaks caused by fine grains by analyzing the lateral broadening differences of characteristic diffraction peaks at different intensity ratios, thereby semi-quantitatively assessing the relative content of fine grains in tungsten carbide powder. Since higher degrees of fragmentation result in more fine grains and greater differences in diffraction peak broadening, this method can directly extract grain size distribution information closely related to the fragmentation process from XRD patterns, avoiding the limitations that may arise from relying solely on lattice distortion parameters. Because lattice distortion parameters represent the statistical results of most grains, the contribution of fine grains, which are much smaller than the average grain size, to the average peak position is relatively small. Ignoring fine grains outside the statistical scope may lead to inaccurate characterization results.

[0017] In a third aspect, the present invention provides an electronic device, including a memory and a processor, which are interconnected. The memory stores computer instructions, and the processor executes the computer instructions to perform the method for characterizing the degree of tungsten carbide powder crushing described in the first aspect or any corresponding embodiment.

[0018] Fourthly, the present invention provides a computer-readable storage medium storing computer instructions for causing a computer to execute the method for characterizing the degree of crushing of tungsten carbide powder as described in the first aspect or any corresponding embodiment thereof.

[0019] Fifthly, the present invention provides a computer program product, including computer instructions for causing a computer to execute the method for characterizing the degree of crushing of tungsten carbide powder as described in the first aspect or any corresponding embodiment. Attached Figure Description

[0020] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of an application scenario according to an embodiment of the present invention; Figure 2 This is a first flowchart of a method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention; Figure 3 This is a second flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the crystal structure of WC according to an embodiment of the present invention; Figure 5 This is a third flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention; Figure 6 This is a fourth flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention; Figure 7 This is the fifth flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to embodiments of the present invention; Figure 8 This is a schematic diagram of the fitting results of mixed powders with different grain sizes according to an embodiment of the present invention; Figure 9 This is a schematic diagram of the diffraction patterns of sample #1 before and after ball milling according to Embodiment 1 of the present invention; Figure 10 This is a schematic diagram of the diffraction patterns of sample #2 before and after manual crushing according to Embodiment 2 of the present invention; Figure 11 These are schematic diagrams of diffraction patterns obtained by different fragmentation methods according to embodiments of the present invention; Figure 12 This is a structural block diagram of a tungsten carbide powder crushing degree characterization device according to an embodiment of the present invention; Figure 13 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] It is understood that before using the technical solutions disclosed in the various embodiments of the present invention, users should be informed of the types, scope of use, and usage scenarios of the personal information involved in the present invention and their authorization should be obtained in accordance with relevant laws and regulations through appropriate means.

[0024] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0025] As an optional application scenario of this invention, such as Figure 1 As shown, the tungsten carbide powder fragmentation characterization system may include at least one terminal device and at least one server. Figure 1 The system is illustrated in the example, which includes a computer 101, a mobile terminal 102, and a server 103, and the terminal devices such as the computer 101 and the mobile terminal 102 are connected to the server 103 through a network 110.

[0026] Specifically, the terminal device can be a smartphone, tablet, laptop, PDA, desktop computer, game console, smart TV, smart wearable device, in-vehicle terminal, VR (Virtual Reality) device, AR (Augmented Reality) device, etc. Server 103 can be a standalone physical server, a server cluster, a distributed system, or a cloud server providing cloud services. Network 110 can be a wired or wireless network, examples of which include, but are not limited to, the Internet, corporate intranet, local area network, wide area network, mobile communication network, and combinations thereof.

[0027] Ball milling in WC (wax Cement) is primarily used to control powder particle size, recycle waste materials, and improve powder properties. For example, when the raw material particle size is too large, ball milling can refine it to the micron or even nanometer scale. For recycled WC waste, ball milling can effectively crush and optimize particle morphology, increasing its reuse value. Simultaneously, in the pretreatment stage before sintering, ball milling can reduce particle sharpness and improve surface condition, thereby enhancing powder activity and promoting densification. Furthermore, ball milling is also widely used in the preparation of WC-bonded metal (such as Co, Ni) composite powders, where intense impact and grinding action ensures thorough mixing of components and achieves uniform dispersion.

[0028] According to an embodiment of the present invention, a method for characterizing the degree of crushing of tungsten carbide powder is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0029] This embodiment provides a method for characterizing the degree of fragmentation of tungsten carbide powder, which can be used in computer equipment. Figure 2 This is a flowchart of the first method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention, as follows: Figure 2 As shown, the process includes the following steps: Step S201: Obtain the X-ray diffraction pattern of the tungsten carbide powder after it has been crushed.

[0030] Step S202: Analyze the X-ray diffraction pattern to obtain structural parameters that reflect the changes in the crystal microstructure after the tungsten carbide powder is broken, including lattice distortion parameters and / or diffraction peak broadening parameters.

[0031] Specifically, lattice distortion parameters include at least one of the following: degree of deviation, degree of dispersion.

[0032] The degree of deviation is used to characterize the degree of deviation of the lattice constant of tungsten carbide powder after breakage from the lattice constant of tungsten carbide powder before breakage, and the degree of dispersion is used to characterize the inconsistency of the lattice constant of tungsten carbide powder after breakage between different diffraction regions.

[0033] Step S203: Determine the degree of crushing of tungsten carbide powder based on structural parameters.

[0034] Specifically, the degree of fragmentation of tungsten carbide powder can be characterized by at least one of the following: deviation degree, dispersion degree, and diffraction peak broadening parameter. Specifically, the greater the deviation degree, the higher the degree of fragmentation of the tungsten carbide powder; the greater the dispersion degree, the more uneven the fragmentation of the tungsten carbide powder; and the greater the diffraction peak broadening parameter, the higher the degree of fragmentation of the tungsten carbide powder.

[0035] The method for characterizing the degree of tungsten carbide powder breakage provided in this embodiment obtains structural parameters reflecting the changes in the crystal microstructure after tungsten carbide powder breakage by analyzing X-ray diffraction patterns. The structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters, which can quantitatively reflect the changes in microscopic defects, strain, and grain size during the breakage process from the crystal structure level. This method breaks through the limitations of traditional methods that rely solely on physical properties, particle size, or morphology indicators. It not only effectively makes up for the shortcomings of existing detection methods in characterizing the crystal structure of tungsten carbide powder after breakage, but also more accurately correlates the breakage process with the intrinsic quality of the material, providing guidance for the subsequent alloy sintering process control and providing a reliable guarantee for the performance stability of cemented carbide.

[0036] This embodiment provides a method for characterizing the degree of fragmentation of tungsten carbide powder, which can be used in computer equipment. Figure 3 This is a second flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention, as shown below. Figure 3 As shown, the process includes the following steps: Step S301: Obtain the X-ray diffraction pattern of the tungsten carbide powder after it has been crushed.

[0037] Step S302: Perform full-spectrum fitting on the X-ray diffraction pattern to obtain the detection values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken.

[0038] Step S303: Determine the theoretical value of the lattice parameter c before the tungsten carbide powder is crushed based on the detected value of lattice parameter a.

[0039] Step S304: Determine the degree of deviation in the lattice distortion parameters of tungsten carbide powder based on the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c.

[0040] For example, the absolute value of the difference between the detected value of lattice parameter c and the theoretical value of lattice parameter c can be multiplied by 10000 to obtain a quantitative index P. The larger the index P is, the higher the degree of deviation of the actual lattice from its original state in the c-axis direction, indicating that the tungsten carbide powder suffers more severe lattice distortion during the crushing process, thus quantitatively characterizing its degree of crushing.

[0041] This is because, such as Figure 4As shown, tungsten carbide (WC) belongs to the hexagonal crystal system. During its crystal growth, the lattice constants a and b gradually increase, while c decreases accordingly. When the crystal integrity reaches a certain level, the a / c ratio tends to a relatively constant characteristic value. Therefore, the a / c ratio of tungsten carbide powder follows a specific variation law during its preparation and growth. However, under external forces such as ball milling or mechanical crushing, not only will the particle or grain size decrease, but its original crystal structure may also be destroyed. This structural damage manifests as: the size of the grains deviates from the "standard" value in different orientations, the crystal shape is distorted, the number of crystal defects increases, and thus the interplanar spacing changes. According to Bragg's formula 2dsinθ=nλ, the change in interplanar spacing d will cause the positions of the diffraction peaks of each crystal plane family in the X-ray diffraction pattern to shift to different degrees. Therefore, by analyzing the XRD pattern to obtain the actual lattice parameters and calculating their deviation from the state before crushing, the degree of crushing of tungsten carbide powder can be quantitatively characterized.

[0042] Step S305: Characterize the degree of fragmentation of tungsten carbide powder using the deviation in lattice distortion parameters. The method for characterizing the degree of fragmentation of tungsten carbide powder provided in this embodiment extracts the lattice parameters of the fragmented tungsten carbide powder using X-ray diffraction patterns and further calculates the lattice distortion parameters. This quantitatively reflects the changes in microscopic defects, strain, and grain size during the fragmentation process from the crystal structure level, overcoming the limitations of traditional methods that rely solely on physical properties, particle size, or morphology indicators. It not only effectively compensates for the shortcomings of existing detection methods in characterizing the crystal structure of fragmented tungsten carbide powder but also more accurately correlates the fragmentation process with the intrinsic quality of the material, providing guidance for subsequent alloy sintering process control and ensuring the reliable stability of cemented carbide performance.

[0043] This embodiment provides a method for characterizing the degree of fragmentation of tungsten carbide powder, which can be used in computer equipment. Figure 5 This is a third flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention, as shown below. Figure 5 As shown, the process includes the following steps: Step S501: Obtain the X-ray diffraction pattern of the tungsten carbide powder after it has been crushed.

[0044] Step S502: Perform full-spectrum fitting on the X-ray diffraction pattern to obtain the detection values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken.

[0045] Step S503: Determine the theoretical value of the lattice parameter c before the tungsten carbide powder is crushed based on the detected value of lattice parameter a.

[0046] Specifically, determining the theoretical value of the lattice parameter c before crushing tungsten carbide powder based on the detected value of lattice parameter a includes the following steps S5031 to S5035.

[0047] Step S5031: Determine whether there are initial values ​​for lattice parameter a and lattice parameter c before the tungsten carbide powder is crushed.

[0048] Specifically, the initial values ​​of lattice parameter a and lattice parameter c of tungsten carbide powder before crushing can be determined by measuring the X-ray diffraction pattern of the tungsten carbide powder before crushing.

[0049] Step S5032: When there are initial values ​​for lattice parameter a and lattice parameter c, calculate the difference between the detected value of lattice parameter a and the initial value of lattice parameter a.

[0050] Step S5033: Determine whether the difference is less than a preset threshold.

[0051] For example, determine whether the difference between the detected value of lattice parameter a and the initial value of lattice parameter a is less than 0.0002.

[0052] Step S5034: When the difference is less than the threshold, the initial value of the lattice parameter c is used as the theoretical value of the lattice parameter c.

[0053] In other words, if the difference between the detected value of lattice parameter 'a' and the initial value of lattice parameter 'a' is less than a preset threshold, such as 0.0002, then the broken sample is considered to have not undergone significant changes in the 'a' direction. Therefore, the initial value of lattice parameter 'c' determined before the tungsten carbide powder is broken can be directly used as the theoretical value of lattice parameter 'c'. This is because, ideally, the 'a' value of the uncrushed sample remains relatively constant, and any deviation from this constant value may be due to damage to the crystal structure. Therefore, when the change in the 'a' value is minute, the 'c' value can more accurately reflect the lattice parameter before breakage.

[0054] Steps S5031 to S5034 above effectively eliminate deviations introduced by differences in raw materials, sintering processes, or grades by comparing the lattice parameters of the same batch before and after crushing, significantly improving the accuracy of the characterization of the degree of crushing. At the same time, when the change in the lattice parameter a value is not significant (e.g., the difference is less than 0.0002), the known initial value of c can be directly used as the theoretical value, avoiding the complex steps of calling the database for interpolation calculation, thereby simplifying the calculation process and improving the efficiency of the algorithm. More importantly, this strategy conforms to the actual physical behavior of WC crystals during mechanical crushing, that is, the a-axis direction is relatively stable, while the c-axis is more susceptible to distortion by external forces. Therefore, using the stability of the a value as the criterion and the deviation of the c value as the core indicator can more realistically and reasonably reflect the lattice damage and degree of crushing of tungsten carbide powder.

[0055] Step S5035: When there are no initial values ​​for lattice parameter a and lattice parameter c, or when the difference is greater than or equal to a threshold, a preset lattice parameter database is obtained. This database includes multiple standard values ​​for lattice parameter a and the corresponding standard value for lattice parameter c. For example, a database as shown in Table 1 is established using the lattice constants of different grades of tungsten carbide powder that have not been ball-milled or crushed. The corresponding function curves for ac can be plotted based on this database.

[0056] Table 1. Lattice constants of tungsten carbide powders of different grades

[0057] Step S5036: Determine the theoretical value of lattice parameter c using the detected value of lattice parameter a and the lattice parameter database.

[0058] Specifically, determining the theoretical value of lattice parameter c using the detected value of lattice parameter a and the lattice parameter database includes: adding a preset correction value to the detected value of lattice parameter a to obtain a reference value of lattice parameter a; searching for the corresponding standard value of lattice parameter c in the lattice parameter database using the reference value of lattice parameter a; if no exact match is found, calculating the theoretical value of lattice parameter c by interpolation based on the reference value of lattice parameter a. The interpolation methods include, but are not limited to, linear interpolation, cubic spline interpolation, and nearest neighbor interpolation.

[0059] This is because the change in c value is usually more significant than that in a value, and is more conducive to reflecting the difference in lattice distortion. Therefore, the relatively stable a value is chosen as the anchoring reference.

[0060] For example, the reference value of lattice parameter a is obtained by adding 0.0001 to the detected value of lattice parameter a. This is because, in actual XRD measurements and analyses, the detected value of lattice parameter a after breakage may fluctuate due to instrument errors, sample preparation errors, etc. If the detected value of lattice parameter a is directly interpolated in the database, it may increase the fluctuation range of the theoretical value of lattice parameter c. Therefore, by applying a preset correction value to the detected value of lattice parameter a, the misjudgment of the degree of lattice distortion caused by fluctuations in the a value due to measurement errors can be avoided, thereby improving the accuracy of the method.

[0061] Specifically, the correction value is +0.00005 to +0.0002, which can improve the accuracy of the method.

[0062] Step S504: Determine the degree of deviation in the lattice distortion parameters of tungsten carbide powder based on the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c.

[0063] Step S505: Characterize the degree of fragmentation of tungsten carbide powder using the degree of deviation in the lattice distortion parameters.

[0064] The method for characterizing the degree of tungsten carbide powder breakage provided in this embodiment is based on the characteristic that the c-axis lattice parameter of tungsten carbide powder crystals is more prone to distortion than the a-axis during mechanical breakage. By comparing the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c, the degree of damage to the crystal structure is reflected. Furthermore, by prioritizing the use of the measured lattice parameters of the same batch before breakage as a benchmark, and directly using the initial value of lattice parameter c as a theoretical reference when the a-axis change is not significant, the method effectively avoids systematic deviations introduced by material grade, preparation process, or batch differences, thus improving the characterization accuracy. When there is a lack of data before breakage or the a-value shifts significantly, the method automatically switches to a database constructed based on a large number of standard samples of various specifications, and dynamically determines the theoretical value of lattice parameter c through interpolation, thus taking into account the versatility and adaptability of the method.

[0065] This embodiment provides a method for characterizing the degree of fragmentation of tungsten carbide powder, which can be used in computer equipment. Figure 6 This is a fourth flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to an embodiment of the present invention, as shown below. Figure 6 As shown, the process includes the following steps: Step S601: Obtain the X-ray diffraction pattern of the tungsten carbide powder after it has been crushed.

[0066] Step S602: Perform full-spectrum fitting on the X-ray diffraction pattern to obtain the detection values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken.

[0067] Step S603: Obtain multiple sets of crystal plane diffraction data in the X-ray diffraction pattern, wherein the multiple sets of crystal plane diffraction data belong to different diffraction angle ranges.

[0068] Specifically, representative sets of crystal plane diffraction data are selected from the X-ray diffraction patterns of tungsten carbide powder. Typically, 3 to 5 sets of crystal plane data from low, medium, and high diffraction angle ranges are selected, thereby enabling a comprehensive evaluation of the crystal structure's characteristics in different directions.

[0069] Step S604: Perform local fitting on each group of crystal plane diffraction data to obtain local values ​​of multiple lattice parameter a and multiple lattice parameter c.

[0070] In other words, for each set of crystal plane diffraction data, a separate local fitting process is required to obtain the corresponding local values ​​of lattice parameter a and lattice parameter c.

[0071] Step S605: Determine the standard deviation of lattice parameter a of tungsten carbide powder based on multiple local values ​​of lattice parameter a and the detected value of lattice parameter a.

[0072] Specifically, after obtaining multiple local values ​​of the lattice parameter 'a', the standard deviation of lattice parameter 'a' is calculated by combining the detected values ​​of lattice parameter 'a' obtained from full-spectrum fitting. The calculation of the standard deviation helps quantify the degree of size difference of grains along different crystal axis directions. For example, if the standard deviation Sa in the 'a' direction is large, it indicates that most grains have significant size differences along the 'a' axis.

[0073] Step S606: Determine the standard deviation of the lattice parameter c of the tungsten carbide powder based on multiple local values ​​of the lattice parameter c and the detected value of the lattice parameter c.

[0074] In other words, after obtaining multiple sets of crystal plane diffraction data and completing local fitting, in addition to obtaining multiple local values ​​of lattice parameter 'a', multiple local values ​​of lattice parameter 'c' are also obtained simultaneously. These local values ​​of lattice parameter 'c' are then compared with the detected values ​​of lattice parameter 'c' obtained from the full-spectrum fitting, and their standard deviation 'Sc' is calculated. This standard deviation reflects the degree of size dispersion exhibited by most grains along the c-axis direction.

[0075] Step S607: Determine the degree of dispersion in the lattice constant distortion of tungsten carbide powder using the standard deviation of lattice parameter a and the standard deviation of lattice parameter c.

[0076] This is because, in the hexagonal crystal system, *a* and *c* represent the lattice scale within and perpendicular to the basal plane, respectively, and their standard deviations directly relate to the structural consistency of the crystal in different spatial orientations. When *Sa* or *Sc* increases significantly, it indicates a clear size difference or structural damage in the corresponding direction, reflecting a higher degree of fragmentation or lower crystal integrity. This comprehensive criterion allows for an objective and quantitative characterization of the microstructure uniformity and processing damage of tungsten carbide powder.

[0077] Table 2. Lattice constants of tungsten carbide powder obtained by a certain crushing process

[0078] Table 3. Local deviations and standard deviations of lattice parameters of tungsten carbide powder obtained by a certain crushing process.

[0079] For example, the values ​​of a and c in the three diffraction angle regions I, II, and III are calculated based on the diffraction data of crystal plane group I, crystal plane group II, and crystal plane group III, as shown in Table 2; then the differences between these values ​​and the average lattice constants a and c, as well as the corresponding standard deviation (STD) values, are calculated, as shown in Table 3.

[0080] Step S608: Characterize the degree of fragmentation of tungsten carbide powder using the degree of dispersion in the lattice distortion parameters.

[0081] The method for characterizing the degree of tungsten carbide powder fragmentation provided in this embodiment obtains multiple local values ​​of lattice parameter a and lattice parameter c by locally fitting multiple sets of crystal plane data within different diffraction angle ranges of XRD patterns. The standard deviation is then calculated by combining the overall detection values ​​obtained from full-spectrum fitting, thereby quantifying the spatial dispersion of the lattice constant. This not only reflects the overall lattice distortion level but also captures the dimensional inhomogeneities or local strain differences in different crystal orientations caused by fragmentation, avoiding the limitation of traditional full-spectrum fitting that easily overlooks microstructural inhomogeneities.

[0082] This embodiment provides a method for characterizing the degree of fragmentation of tungsten carbide powder, which can be used in computer equipment. Figure 7 This is a fifth flowchart of the method for characterizing the degree of fragmentation of tungsten carbide powder according to embodiments of the present invention, as shown below. Figure 7 As shown, the process includes the following steps: Step S701: Obtain the X-ray diffraction pattern of the tungsten carbide powder after it has been crushed.

[0083] Step S702: Analyze the X-ray diffraction pattern to obtain the lattice parameter values ​​of the tungsten carbide powder after it has been broken.

[0084] Step S703: Determine the lattice distortion parameters of the tungsten carbide powder based on the lattice parameter detection values, so as to characterize the degree of fragmentation of the tungsten carbide powder using the lattice distortion parameters.

[0085] Among them, the lattice distortion parameters include the degree of deviation and the degree of dispersion.

[0086] Step S704: Select characteristic diffraction peaks in the X-ray diffraction pattern.

[0087] Specifically, such as Figure 8 As shown, in the XRD pattern of WC, a diffraction peak that is sensitive to changes in grain size and has a clear peak shape should be selected as the analysis object. For example, the diffraction peak corresponding to the (112) crystal plane can be selected because it has high intensity, moderate position, and significant diffraction peak broadening effect when fine grains are present, which facilitates subsequent quantitative analysis.

[0088] Step S705: Obtain the first lateral broadening value of the characteristic diffraction peak at the first intensity ratio position and the second lateral broadening value at the second intensity ratio position.

[0089] Specifically, the first intensity ratio position corresponds to a certain ratio height above 75% of the peak height of the characteristic diffraction peak, and the second intensity ratio position corresponds to a certain ratio height below 25% of the peak height of the characteristic diffraction peak.

[0090] The first lateral broadening value is defined as: the length of the line segment between the first point and the second point, where a first parallel line is drawn at the first intensity ratio position, intersecting the left / right peak contour of the characteristic diffraction peak at a first point and intersecting the peak position vertical line drawn through the peak apex at a second point. The second lateral broadening value is defined as: the length of the line segment between the third point and the fourth point, where a second parallel line is drawn at the second intensity ratio position, intersecting the left / right peak contour at a third point and intersecting the peak position vertical line at a fourth point.

[0091] Specifically, the first intensity ratio position corresponds to a certain ratio height above 75% of the peak height of the characteristic diffraction peak, and the second intensity ratio position corresponds to a certain ratio height below 25% of the peak height of the characteristic diffraction peak.

[0092] For example, such as Figure 8 As shown, taking the (112) crystal plane as the analysis object, the corresponding vertical line AB of its peak position is drawn. A line parallel to the back line at the height of the 7 / 8 peak of the diffraction peak is drawn, intersecting the left peak line and AB to form CD, with a length of k1; a line parallel to the back line at the height of the 1 / 8 peak of the diffraction peak is drawn, intersecting the left peak line and AB to form EF, with a length of k2. These two values ​​reflect the asymmetric broadening characteristics of the peak shape at different heights, especially reflecting the "tailing effect" caused by fine grains.

[0093] Step S706: Determine the diffraction peak broadening parameters based on the first and second lateral broadening values.

[0094] Example, diffraction peak broadening parameter D L Through D L = (k2 – k1) × 100 is calculated to obtain D. L The larger the value, the more pronounced the peak broadening and the higher the proportion of fine grains. Since the crushing process refines the grains, D... L The value D directly reflects the degree of fragmentation of tungsten carbide powder. L The higher the value, the greater the degree of breakage.

[0095] Step S707: Characterize the degree of fragmentation of tungsten carbide powder using lattice distortion parameters and diffraction peak broadening parameters.

[0096] The method for characterizing the degree of fragmentation of tungsten carbide powder provided in this embodiment effectively captures the asymmetric broadening characteristics of peaks caused by fine grains by analyzing the lateral broadening differences of characteristic diffraction peaks at different intensity ratios. This allows for a semi-quantitative assessment of the relative content of fine grains in tungsten carbide powder. Since higher fragmentation results in more fine grains and greater differences in diffraction peak broadening, this method can directly extract grain size distribution information closely related to the fragmentation process from XRD patterns, avoiding the limitations that may arise from relying solely on lattice distortion parameters. Because lattice distortion parameters represent the statistical results of most grains, the contribution of fine grains, which are much smaller than the average grain size, to the average peak position is relatively small. Ignoring fine grains outside the statistical scope may lead to inaccurate characterization results.

[0097] To illustrate the characterization method for the degree of fragmentation of tungsten carbide powder of the present invention more clearly, Examples 1 and 2 are given.

[0098] Example 1: 1. Sample preparation: Take a certain amount of powder and put it into the groove of the glass slide, then scrape it flat.

[0099] 2. Test conditions: Co target, scanning angle 10-150°, step size 0.03°, dwell time per step 20-50s. The test instrument is a Panalytical X'Pert Pro X-ray diffractometer. Parallel samples can be taken for analysis.

[0100] 3. Analysis: According to the above Figure 4 , Figure 5 and Figure 6 The provided method determines the degree of fragmentation of tungsten carbide powder.

[0101] like Figure 9 The diffraction patterns of sample #1 before and after ball milling show that the peaks are higher after milling than before. The analysis results are shown in Tables 4 and 5. Since the difference between the measured value of lattice parameter a after milling and the initial value of lattice parameter a before milling is 0.0001, which is less than the preset threshold of 0.0002, the initial value of lattice parameter c determined before the tungsten carbide powder was crushed was directly used as the theoretical value of lattice parameter c. The degree of powder crushing [J(P,Sa,Sc),D] L [(1,36,95),36].

[0102] Table 4 Comparison of lattice constants of sample #1 before and after ball milling

[0103] Table 5 D of sample #1 before and after ball milling L value

[0104] like Figure 10The diffraction patterns of sample #2 before and after manual crushing show that the peaks are much higher after crushing than before. The analysis results are shown in Tables 6 and 7. Since the difference between the measured lattice parameter *a* after ball milling and the initial value of *a* before ball milling is 0, which is less than the preset threshold of 0.0002, the initial value of lattice parameter *c* determined before crushing the tungsten carbide powder is directly used as the theoretical value of lattice parameter *c*. The degree of powder crushing [J(P,Sa,Sc),D] L [(5,32,100),59].

[0105] Table 6 Comparison of lattice constants of sample #2 before and after manual crushing

[0106] Table 7 D before and after manual crushing of sample #2 L value

[0107] The results above show that, compared to sample #2, sample #1 exhibits less fragmentation. The smaller P value indicates a less severe lattice fragmentation; D... L The smaller size indicates fewer small grains and a lower degree of fragmentation. The manual crushing force is significantly greater than that of the ball milling process, and the calculated data matches the theoretical data, demonstrating the accuracy and reliability of this method. Furthermore, the two crushing processes have different effects on Sa and Sc, resulting in opposite trends.

[0108] Example 2: like Figure 11 The diffraction patterns obtained by different crushing methods show that the peak feet of the diffraction lines after crushing are from high to low as 3#>4#>5#. The analysis results are shown in Tables 8 and 9. The difference method was used to calculate the degree of powder crushing of samples 3#, 4#, and 5# [J(P,Sa,Sc),D]. L The values ​​are [(1.6,57,129),53], [(1.8,53,136),38], and [(1.3,15,45),37], respectively. It can be seen that the three methods produce similar degrees of lattice fragmentation (since P is the result of a 10,000-fold amplification of the difference in the lattice constant c, P values ​​within 1 can be considered similar). However, the powder obtained by ball milling has a higher proportion of small grains; the powder obtained by disc milling shows similar size fluctuations in most grains along different crystal axes, with a lower proportion of small grains, resulting in the most ideal fragmentation effect.

[0109] Table 8 Comparison of lattice constants of samples with different crushing methods

[0110] Table 9. D values ​​of samples subjected to different crushing methods L value

[0111] This embodiment also provides a device for characterizing the degree of fragmentation of tungsten carbide powder. This device is used to implement the above embodiments and preferred embodiments, and details already described will not be repeated. As used below, the term "module" can refer to a combination of software and / or hardware that performs a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0112] This embodiment provides a device for characterizing the degree of fragmentation of tungsten carbide powder, such as... Figure 12 As shown, it includes: Module 1201 is used to acquire the X-ray diffraction pattern of tungsten carbide powder after it has been crushed. The X-ray diffraction analysis module 1202 is used to analyze the X-ray diffraction pattern to obtain structural parameters that reflect the changes in the crystal microstructure after the tungsten carbide powder is broken. The structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters. The characterization module 1203 is used to analyze X-ray diffraction patterns to obtain structural parameters that reflect the changes in the microstructure of tungsten carbide powder after it is broken. The structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters.

[0113] In some optional embodiments, the lattice distortion parameter includes at least one of the following: deviation degree and dispersion degree; wherein the deviation degree is used to characterize the degree of deviation of the lattice constant of the tungsten carbide powder after breakage from the lattice constant of the tungsten carbide powder before breakage, and the dispersion degree is used to characterize the inconsistency of the lattice constant of the tungsten carbide powder after breakage between different diffraction regions.

[0114] In some optional implementations, the spectrum analysis module 1202 is specifically used to: perform full-spectrum fitting on the X-ray diffraction pattern to obtain the detected values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken; determine the theoretical value of lattice parameter c before the tungsten carbide powder is broken based on the detected value of lattice parameter a; and determine the degree of deviation in the lattice distortion parameters of the tungsten carbide powder based on the deviation between the detected value of lattice parameter c and the theoretical value of lattice parameter c.

[0115] In some optional implementations, the spectral analysis module 1202 is specifically used to: determine whether there are initial values ​​for lattice parameter a and lattice parameter c before the tungsten carbide powder is crushed; when there are initial values ​​for lattice parameter a and lattice parameter c, calculate the difference between the detected value of lattice parameter a and the initial value of lattice parameter a; determine whether the difference is less than a preset threshold; when the difference is less than the threshold, use the initial value of lattice parameter c as the theoretical value of lattice parameter c; when there are no initial values ​​for lattice parameter a and lattice parameter c, or when the difference is greater than or equal to the threshold, obtain a preset lattice parameter database, wherein the database includes multiple standard values ​​for lattice parameter a and standard values ​​for lattice parameter c corresponding to each standard value of lattice parameter a; and determine the theoretical value of lattice parameter c using the detected value of lattice parameter a and the lattice parameter database.

[0116] In some optional implementations, the spectrum analysis module 1202 is specifically used for: performing full-spectrum fitting on the X-ray diffraction pattern to obtain the detection values ​​of lattice parameter a and lattice parameter c after the tungsten carbide powder is broken; acquiring multiple sets of crystal plane diffraction data in the X-ray diffraction pattern, wherein the multiple sets of crystal plane diffraction data belong to different diffraction angle ranges; performing local fitting on each set of crystal plane diffraction data to obtain multiple local values ​​of lattice parameter a and multiple local values ​​of lattice parameter c; determining the standard deviation of lattice parameter a of the tungsten carbide powder based on the multiple local values ​​of lattice parameter a and the detection values ​​of lattice parameter a; determining the standard deviation of lattice parameter c of the tungsten carbide powder based on the multiple local values ​​of lattice parameter c and the detection values ​​of lattice parameter c; and determining the degree of dispersion in the degree of lattice constant distortion of the tungsten carbide powder using the standard deviation of lattice parameter a and the standard deviation of lattice parameter c.

[0117] In some optional implementations, the spectrum analysis module 1202 is specifically used to: select characteristic diffraction peaks in the X-ray diffraction pattern; obtain a first lateral broadening value of the characteristic diffraction peak at a first intensity ratio position and a second lateral broadening value at a second intensity ratio position; and determine the diffraction peak broadening parameter based on the first lateral broadening value and the second lateral broadening value.

[0118] The tungsten carbide powder fragmentation characterization device provided in this embodiment of the invention can execute the tungsten carbide powder fragmentation characterization method provided in any embodiment of the invention, and has the corresponding functional modules and beneficial effects for executing the method. Further functional descriptions of the above modules and units are the same as in the corresponding embodiments described above, and will not be repeated here.

[0119] Figure 13 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention.

[0120] The following is a detailed reference. Figure 13This diagram illustrates a suitable structural schematic for implementing an electronic device according to embodiments of the present invention. The electronic device may include a processor (e.g., a central processing unit, graphics processor, etc.) 1301, which can perform various appropriate actions and processes according to a program stored in read-only memory (ROM) 1302 or a program loaded from memory 1308 into random access memory (RAM) 1303. The RAM 1303 also stores various programs and data required for the operation of the electronic device. The processor 1301, ROM 1302, and RAM 1303 are interconnected via a bus 1304. An input / output (I / O) interface 1305 is also connected to the bus 1304.

[0121] Typically, the following devices can be connected to I / O interface 1305: input devices 1306 including, for example, touchscreens, touchpads, keyboards, mice, cameras, microphones, accelerometers, gyroscopes, etc.; output devices 1307 including, for example, liquid crystal displays (LCDs), speakers, vibrators, etc.; memory devices 1308 including, for example, magnetic tapes, hard disks, etc.; and communication devices 1309. Communication device 1309 allows electronic devices to communicate wirelessly or wiredly with other devices to exchange data. Although Figure 13 Electronic devices with various devices are shown, but it should be understood that it is not required to implement or have all of the devices shown, and more or fewer devices may be implemented or have instead.

[0122] In particular, according to embodiments of the present invention, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of the present invention include a computer program product comprising a computer program carried on a non-transitory computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via a communication device 1309, or installed from a memory 1308, or installed from a ROM 1302. When the computer program is executed by the processor 1301, it performs the functions defined in the method for characterizing the degree of fragmentation of tungsten carbide powder according to embodiments of the present invention.

[0123] Figure 13 The electronic device shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments of the present invention.

[0124] This invention also provides a computer-readable storage medium. The methods described above according to embodiments of the invention can be implemented in hardware or firmware, or implemented as computer code that can be recorded on a storage medium, or implemented as computer code downloaded via a network and originally stored on a remote storage medium or a non-transitory machine-readable storage medium and then stored on a local storage medium. Thus, the methods described herein can be processed by software stored on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. The storage medium can be a magnetic disk, optical disk, read-only memory, random access memory, flash memory, hard disk, or solid-state drive, etc.; further, the storage medium can also include combinations of the above types of memory. It is understood that computers, processors, microprocessor controllers, or programmable hardware include storage components capable of storing or receiving software or computer code. When the software or computer code is accessed and executed by the computer, processor, or hardware, the method for characterizing the degree of tungsten carbide powder fragmentation shown in the above embodiments is implemented.

[0125] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and all such modifications and variations fall within the scope defined by the appended claims.

Claims

1. A method for characterizing the degree of fragmentation of tungsten carbide powder, characterized in that, The method includes: Obtain the X-ray diffraction pattern of tungsten carbide powder after it has been crushed; The X-ray diffraction pattern was analyzed to obtain structural parameters reflecting the changes in the crystal microstructure after the tungsten carbide powder was broken. The structural parameters include lattice distortion parameters and / or diffraction peak broadening parameters. The degree of fragmentation of the tungsten carbide powder is determined based on the structural parameters.

2. The method according to claim 1, characterized in that, The lattice distortion parameter includes at least one of the following: deviation degree and dispersion degree; wherein the deviation degree is used to characterize the degree of deviation of the lattice constant of the tungsten carbide powder after breakage from the lattice constant of the tungsten carbide powder before breakage, and the dispersion degree is used to characterize the inconsistency of the lattice constant of the tungsten carbide powder after breakage between different diffraction regions.

3. The method according to claim 2, characterized in that, The degree of deviation in the lattice distortion parameters obtained by analyzing the X-ray diffraction pattern includes: The X-ray diffraction pattern was fully fitted to obtain the lattice parameter a and lattice parameter c values ​​of the tungsten carbide powder after it was broken up. The theoretical value of the lattice parameter c before the tungsten carbide powder is determined based on the detected value of the lattice parameter a. The degree of deviation in the lattice distortion parameter of the tungsten carbide powder is determined based on the deviation between the detected value of the lattice parameter c and the theoretical value of the lattice parameter c.

4. The method according to claim 3, characterized in that, The step of determining the theoretical value of the lattice parameter c of the tungsten carbide powder before crushing based on the detected value of lattice parameter a includes: Determine whether there are initial values ​​for lattice parameter a and lattice parameter c before the tungsten carbide powder is crushed; When initial values ​​for lattice parameter a and lattice parameter c exist, calculate the difference between the detected value of lattice parameter a and the initial value of lattice parameter a; Determine whether the difference is less than a preset threshold; When the difference is less than the threshold, the initial value of the lattice parameter c is used as the theoretical value of the lattice parameter c; When there is no initial value for lattice parameter a and initial value for lattice parameter c, or when the difference is greater than or equal to the threshold, a preset lattice parameter database is obtained, wherein the database includes multiple standard values ​​for lattice parameter a and standard values ​​for lattice parameter c corresponding to each standard value for lattice parameter a; The theoretical value of lattice parameter c is determined using the detected value of lattice parameter a and the lattice parameter database.

5. The method according to claim 2, characterized in that, The degree of dispersion in the lattice distortion parameters obtained by analyzing the X-ray diffraction pattern includes: The X-ray diffraction pattern was fully fitted to obtain the lattice parameter a and lattice parameter c values ​​of the tungsten carbide powder after it was broken up. Multiple sets of crystal plane diffraction data are obtained from X-ray diffraction patterns, wherein the multiple sets of crystal plane diffraction data belong to different diffraction angle ranges; Local fitting was performed on each set of crystal plane diffraction data to obtain multiple local values ​​of lattice parameter a and multiple local values ​​of lattice parameter c; The standard deviation of the lattice parameter a after the tungsten carbide powder is determined based on multiple local values ​​of the lattice parameter a and the detected value of the lattice parameter a; The standard deviation of the lattice parameter c after the tungsten carbide powder is determined based on multiple local values ​​of the lattice parameter c and the detected value of the lattice parameter c. The degree of dispersion in the lattice constant distortion after the tungsten carbide powder is broken is determined using the standard deviation of lattice parameter a and the standard deviation of lattice parameter c.

6. The method according to claim 1, characterized in that, The method of analyzing the X-ray diffraction pattern to obtain the diffraction peak broadening parameters also includes: Select characteristic diffraction peaks from the X-ray diffraction pattern; Obtain the first lateral broadening value of the characteristic diffraction peak at the first intensity ratio position and the second lateral broadening value at the second intensity ratio position; The diffraction peak broadening parameters are determined based on the first lateral broadening value and the second lateral broadening value.

7. The method according to claim 6, characterized in that, The first intensity ratio position corresponds to a certain ratio height of 75% or more of the peak height of the characteristic diffraction peak, and the second intensity ratio position corresponds to a certain ratio height of 25% or less of the peak height of the characteristic diffraction peak; The first lateral expansion value is: a first parallel line drawn at the first intensity ratio position, the first parallel line intersects the left peak shape contour line / right peak shape contour line of the characteristic diffraction peak at a first point, and intersects the peak position vertical line drawn through the peak top at a second point, and the length of the line segment between the first point and the second point. The second lateral widening value is: a second parallel line is drawn at the second intensity ratio position, the second parallel line intersects the left peak contour line / the right peak contour line at a third point, and intersects the peak position vertical line at a fourth point, and the length of the line segment between the third point and the fourth point.

8. An electronic device, characterized in that, include: A memory and a processor are communicatively connected, the memory storing computer instructions, and the processor executing the computer instructions to perform the characterization method for the degree of crushing of tungsten carbide powder as described in any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to execute the characterization method for the degree of crushing of tungsten carbide powder as described in any one of claims 1 to 7.

10. A computer program product, characterized in that, Includes computer instructions for causing a computer to execute the characterization method for the degree of crushing of tungsten carbide powder as described in any one of claims 1 to 7.

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