Semiconductor device and preparation method thereof, and semiconductor equipment
By arranging memory cells in three dimensions on a substrate and using interconnect structures to couple transistors, the problem of planar NAND flash memory approaching its storage density limit has been solved, achieving higher storage density and smaller device size, while reducing costs and improving reliability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- YANGTZE MEMORY TECH CO LTD
- Filing Date
- 2024-10-31
- Publication Date
- 2026-05-01
AI Technical Summary
The storage density of existing 2D or planar NAND flash memory is nearing its limit. Planar processes and manufacturing technologies are costly and difficult to further increase storage density.
A three-dimensional memory structure is used to achieve higher storage density and control flexibility by arranging storage cells in three dimensions on a substrate and using interconnect structures to couple transistors to the semiconductor structure, including multiple interconnect structures and lead-out structures.
It increases storage density, reduces the size of semiconductor devices, lowers manufacturing costs, simplifies the process, and improves device reliability and stability.
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